Patent application number | Description | Published |
20090030799 | System comprising a consumer good and server and a method to bestow an advantage with a monetary value - A system comprising a consumer good, especially a packet of cigarettes or packet of pharmaceutical products, and a server has a consumer good fitted with a concealed code, wherein the code is associated with an advantage having a monetary value and can be transmitted to a server via a telecommunication link, the server being used to check whether the code is registered as valid, and depending on the result of this test, an advantage with a monetary value is credited by the server to the telecommunication number of the caller. | 01-29-2009 |
20100102117 | SYSTEM CONSISTING OF CONSUMER ITEM, DETECTION DEVICE FOR CODING IN CONSUMER ITEM, AND SERVER, AND PROCESS FOR CARRYING OUT AUTHENTICATION - The system disclosed includes at least a consumer item, such as a cigarette box, medication package or piece of clothing, and a detection device that can be operated by a buyer of the consumer item, which is configured for the detection of a coding in the consumer item, and a server, wherein the coding is hidden in the consumer item, but can be accessed by the buyer of the consumer item, so that the coding can be detected by means of a detection device and be transmitted to the manufacturer via a telecommunications connection to the server, wherein the server verifies if the coding is registered as valid, and wherein, depending upon the verification of the coding, a monetary benefit in favor of the telecommunications number of the buyer is credited by means of the server, and/or the server is configured for transmission of information to the buyer. | 04-29-2010 |
Patent application number | Description | Published |
20090110260 | Inspection System and a Method for Detecting Defects Based Upon a Reference Frame - A method for inspecting objects and an inspection system, the system includes: an image acquisition unit adapted to acquire multiple images, according to a predefined image acquisition scheme, of multiple portions of a diced wafer that comprises multiple dice; and a processor adapted to locate multiple unique features within the multiple images, at least partially during the acquisition of images; associate multiple unique features with multiple dice, at least partially during the location of multiple unique features; determine multiple transformations between multiple die coordinate systems and a global coordinate system, in response to a locations of unique features and their associations with multiple dice, at least partially during an association between multiple unique features with multiple dice; and detect defects in response to a comparison between dice and corresponding reference dice, in response to the transformations, at least partially during the determination of the multiple transformations. | 04-30-2009 |
20090116726 | Method and system for inspecting a diced wafer - A method for inspecting a diced object that comprises multiple dies, the method includes: acquiring multiple images of multiple portions of the diced object, starting from a first portion that comprises an alignment area and continuing through adjacent portions of the diced object; assigning a die index to each die of the multiple dies of the diced object, starting from a die of the first portion and continuing through adjacent portions of the diced object; associating between dies of the diced object and a dies of a reference object in response to the assigned indexes and locations of the dies of the diced object; wherein the reference object is not diced; and comparing between a die of the diced object and another die while taking into account an association between the die of the diced object and a reference object die. | 05-07-2009 |
20090290782 | METHOD AND A SYSTEM FOR ESTABLISHING AN INSPECTION-RECIPE - A method and a system for establishing a wafer testing recipe are disclosed. According to the present invention the system is comprised of a camera for acquiring images of a number of dice from a produced wafer; and a dedicated software that operative for using at least part of the images and composes a reference-image to be used as testing reference of a typical die image; defining on the reference-image single and/or repeatable elements of a die pattern as a “zone of interest; determining the Detection-Policy for each of the zone of interest or for a group of similar zones of interest and determining the algorithm that will be used by each of the Detection-Policy; determining the parameters of each of the Detection-Policy's algorithms; determining the Reporting-policy by defining a set of specific names of defect classes that could be used during inspection of a specific lot of wafers; determining the Inspection-policy defining behavior of inspection system as a set of pre-defined logical rules; and creating a “wafer testing recipe” by integrating of the testing reference of a typical die image, the defined zones of interest, the determined Detection-Policies, the parameters of the determined Detection-Policies' algorithms, the determined Reporting-Policies and the determined Inspection-Policies. | 11-26-2009 |
20090304260 | INSPECTION SYSTEM AND A METHOD FOR DETECTING DEFECTS BASED UPON A REFERENCE FRAME - A wafer inspection system and a method for inspecting a wafer. The method includes: acquiring multiple frames that cover a first area that comprises a die and a first surrounding area that surrounds the die; wherein the frames partially overlap to provide overlap areas; and processing a sequence of decomposed images of overlap areas such as to align mutually misaligned frames and generating a die reference image. | 12-10-2009 |
20100194877 | METHOD AND SYSTEM FOR IMAGING AN ELECTRICAL CIRCUIT - A system and a method for imaging an electrical circuit, the method includes: selectively activating an image sensor and introducing a mechanical movement between the electrical circuit and the image sensor so as to acquire multiple mutually parallel strips of elongated irregular hexagonal frames of portions of the electrical circuit; wherein two elongated edges of each elongated irregular hexagonal frame are substantially longer than other edges of the elongated irregular hexagonal frame. | 08-05-2010 |
20100245566 | SYSTEM AND METHOD FOR INSPECTION - Method and inspection system. The inspection system includes: (i) a stage, for supporting an inspected object and for moving the inspected object by a movement that is characterized by speed variations; (ii) a signal generator, for generating triggering pulses at a fixed frequency regardless of the speed variations; (iii) a stage location generator, for providing location information indicative of a location of the stage at points of time that are determined by the triggering pulses; (iv) a strobe illuminator for illuminating areas of the inspected object in response to the triggering pulses; (v) a camera for acquiring images of areas of the inspected object in response to the triggering pulses; wherein overlaps between the images of the areas of the inspected object are characterized by overlap variations; and (vi) a processor for associating location information to the acquired images. | 09-30-2010 |
20110164129 | METHOD AND A SYSTEM FOR CREATING A REFERENCE IMAGE USING UNKNOWN QUALITY PATTERNS - A method and a system for preparing a pattern's reference-model to be used for automatic inspection of surface are disclosed. The system according to the present invention is comprised of an imaging device that captured images of plurality of the patters; a dedicated software that uses dedicated algorithms to correct and align the captured images; and a controller operative for collecting the same located and same coincident pixel of each of the images; choosing, according to predetermined criteria, one of the collected pixels; creating a new image with same dimensions as the captured images and locating the chosen pixel in the same place corresponding to the place of the collected pixels in the origin images; repeating the process as defined above for each pixel of the captured images; and providing the new created image as a reference model for inspecting the pattern. | 07-07-2011 |
20120057773 | INSPECTION RECIPE GENERATION AND INSPECTION BASED ON AN INSPECTION RECIPE - System, computer readable medium and method. The system includes (i) a data obtaining module arranged to obtain data about at least one portion of an inspected article; and (ii) a processor arranged to perform at least one processing operation of the data out of: (a) processing the data to provide the inspection recipe; and (b) processing the data, while utilizing the inspection recipe, to detect defects; wherein the inspection recipe comprises multiple zones of multiple types of zones; wherein a zone of a first type of zones differs from a zone of a second type of zone. | 03-08-2012 |
20140362208 | HIGH THROUGHPUT AND LOW COST HEIGHT TRIANGULATION SYSTEM AND METHOD - A triangulation system comprising an area camera, a communication interface, a first image processing module, a second image processing module; wherein the area camera is arranged to obtain, at an acquisition rate, a stream of images of illuminated regions of an object; wherein the area camera is prevented from performing height calculations; wherein the communication interface is arranged to convey, in real time thereby in correspondence to the acquisition rate, the stream of images from the area camera to the first image processing module; wherein the first image processing module is arranged to process, in real time, the stream of images to provide first compressed information; wherein the second image processing module is arranged to process, at a non-real time image processing rate, the first compressed information to provide height information indicative of heights of at least the illuminated regions of the object. | 12-11-2014 |