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Oliver D. Patterson
POUGHKEEPSIE, NY US
1. 20090146211 GROUNDING FRONT-END-OF-LINE STRUCTURES ON A SOI SUBSTRATE 06-11-20092. 20090096461 TEST STRUCTURE AND METHOD FOR RESISTIVE OPEN DETECTION USING VOLTAGE CONTRAST INSPECTION 04-16-2009
3. 20080237586 Semiconductor Integrated Test Structures For Electron Beam Inspection of Semiconductor Wafers 10-02-2008
4. 20080225284 METHOD, APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR OPTIMIZING INSPECTION RECIPES USING PROGRAMMED DEFECTS 09-18-2008
5. 20080217612 STRUCTURE AND METHOD OF MAPPING SIGNAL INTENSITY TO SURFACE VOLTAGE FOR INTEGRATED CIRCUIT INSPECTION 09-11-2008