Patent application number | Description | Published |
20080215941 | Double-edge triggered scannable pulsed flip-flop for high frequency and/or low power applications - A design structure embodied in a machine readable medium used in a design process, includes a circuit for data storage. The circuit includes a double edge clock generation circuit for generating a pulse clock signal having first and second clock pulses for each clock cycle of a system clock; a scan clock generation circuit for generating first and second scan clock signals; a scannable pulse flip-flop circuit having a data input and a data output that are connected with an internal storage node, the scannable pulse flip-flop circuit including a scan input and a scan output connected with the internal storage node, and receptive to the pulse clock signal and the scan clock signals. The scannable pulse flip-flop circuit is configured to be operable in a function mode of operation and a scan mode of operation. | 09-04-2008 |
20080219063 | SYSTEM AND METHOD OF SELECTIVE ROW ENERGIZATION BASED ON WRITE DATA - A system and method of selective row energization based on write data, with a selective row energization system including a storage array | 09-11-2008 |
20080229260 | STRUCTURE FOR AUTOMATED TRANSISTOR TUNING IN AN INTEGRATED CIRCUIT DESIGN - A design structure for tuning an integrated circuit design holds a reference clock signal constant across the integrated circuit design and, while the reference clock signal is held constant, optimizes transistors forming a register within the integrated circuit design and thereafter optimizes transistors forming one or more clock buffers coupled to the reference clock signal. | 09-18-2008 |
20080265957 | Self-Resetting Phase Frequency Detector with Multiple Ranges of Clock Difference - A phase detector which provides a dynamic output signal and which automatically resets if a reference clock signal and a feedback clock signal align after an output pulse is generated. With the phase detector in accordance with the present invention, when there is a difference between the positive clock edges of the reference clock signal and the feedback clock signal, the phase detector generates output pulse. The output is used to correct the feedback clock signal. In the next cycle, if the feedback signal is corrected so that both the reference clock signal and feedback clock signal are aligned, then the output signals are reset to zero. The ability to reset advantageously prevents an unexpected correction that can occur in certain phase detector designs. | 10-30-2008 |
20080267341 | High Performance, Low Power, Dynamically Latched Up/Down Counter - A high performance, low power up/down counter is set forth. The counter presented is controlled by two clock pulses, an up pulse and a down pulse, and updates all bits of the counter in parallel. These bits are then latched using a scannable pulsed limited output switching dynamic logic latch. By using a limited switch dynamic logic latch, the counter is able to utilize the speed of dynamic logic without requiring the traditional dynamic logic power. The area saved and speed gained by using a dynamic latch is significant compared to a typical edge-triggered flip-flop. Additionally, by computing all the next count state bits in parallel, the counter reduces an overall count computation delay by eliminating the counter ripple. | 10-30-2008 |
20080303553 | METHOD AND APPARATUS FOR A CONFIGURABLE LOW POWER HIGH FAN-IN MULTIPLEXER - A configurable, low power high fan-in multiplexer (MUX) is disclosed. The MUX circuit includes multiple current control elements, which each include multiple inverters coupled to a transmission gate. Each current control element receives a data signal and a select signal that corresponds to the data signal. If a select signal exceeds a threshold value (e.g., a logical “1”), the select signal deactivates a pull-up transistor (e.g., a p-type field effect transistor), and the transmission gate enables the corresponding data signal to provide input to a logic gate (e.g., a NAND gate) coupled to the output of the MUX. If the select signal does not exceed the threshold value, the select signal activates the pull-up transistor, and the transmission gate prevents the corresponding data signal from providing input to the logic gate. | 12-11-2008 |
20080303554 | STRUCTURE FOR A CONFIGURABLE LOW POWER HIGH FAN-IN MULTIPLEXER - A configurable, low power high fan-in multiplexer (MUX) and design structure thereof are disclosed. The MUX circuit includes multiple current control elements, which each include multiple inverters coupled to a transmission gate. Each current control element receives a data signal and a select signal that corresponds to the data signal. If a select signal exceeds a threshold value (e.g., a logical “1”), the select signal deactivates a pull-up transistor (e.g., a p-type field effect transistor), and the transmission gate enables the corresponding data signal to provide input to a logic gate (e.g., a NAND gate) coupled to the output of the MUX. If the select signal does not exceed the threshold value, the select signal activates the pull-up transistor, and the transmission gate prevents the corresponding data signal from providing input to the logic gate. | 12-11-2008 |
20090072863 | Transmission Gate Multiplexer - A technique for operating a multiplexer includes selecting, from multiple transmission gate groups, a transmission gate group. A transmission gate is selected from the selected transmission gate group. Finally, a data signal associated with the selected transmission gate is provided at an output of the multiplexer. | 03-19-2009 |
20090096486 | Structure for Transmission Gate Multiplexer - A technique and design structure for operating a multiplexer includes selecting, from multiple transmission gate groups, a transmission gate group. A transmission gate is selected from the selected transmission gate group. Finally, a data signal associated with the selected transmission gate is provided at an output of the multiplexer. | 04-16-2009 |
20090102509 | REDUCED AREA ACTIVE ABOVE-GROUND AND BELOW-SUPPLY NOISE SUPPRESSION CIRCUITS - A method and apparatus for noise suppression. A circuit has a noise detection unit, a noise suppression unit, and a control unit. The noise suppression unit has an input and an output, wherein the input of the noise detection unit is connected to a signal and generates a signal change at the output if a change in the signal is detected. The noise suppression unit has an input and an output, wherein the input of the noise suppression unit is connected to the output of the noise detection unit and generates a correction to the signal in response to detecting the signal change at the output of the noise detection unit. The control unit has an input and an output, wherein input to the control unit is connected to the signal and turns off the noise suppression unit if a state change is detected in the signal. | 04-23-2009 |
20090106708 | Structure for Reduced Area Active Above-Ground and Below-Supply Noise Suppression Circuits - A design structure for noise suppression. A design structure has a noise detection unit, a noise suppression unit, and a control unit. The noise suppression unit has an input and an output, wherein the input of the noise detection unit is connected to a signal and generates a signal change at the output if a change in the signal is detected. The noise suppression unit has an input and an output, wherein the input of the noise suppression unit is connected to the output of the noise detection unit and generates a correction to the signal in response to detecting the signal change at the output of the noise detection unit. The control unit has an input and an output, wherein input to the control unit is connected to the signal and turns off the noise suppression unit if a state change is detected in the signal. | 04-23-2009 |
20090108874 | Limited Switch Dynamic Logic Cell Based Register - A circuit that has a limited switch dynamic logic gate having a front end logic circuit and a latch. The output of the front end logic circuit is connected to an input of the latch, and the front end logic circuit evaluates a set of input signals applied to the front end logic circuit to generate an output signal. The latch receives and holds the output signal. The circuit also has a logic circuit having an output connected to a clock input in the front end logic circuit. The logic circuit generates a modified clock signal in response to receiving a clock signal from a clock source, and the modified clock signal has a duration that provides a minimum period of time for the front end logic to evaluate the set of input signals and generate the output signal. | 04-30-2009 |
20090108875 | Structure for a Limited Switch Dynamic Logic Cell Based Register - A design structure for a circuit that has a limited switch dynamic logic gate having a front end logic circuit and a latch. The output of the front end logic circuit is connected to an input of the latch, and the front end logic circuit evaluates a set of input signals applied to the front end logic circuit to generate an output signal. The latch receives and holds the output signal. The circuit also has a logic circuit having an output connected to a clock input in the front end logic circuit. The logic circuit generates a modified clock signal in response to receiving a clock signal from a clock source, and the modified clock signal has a duration that provides a minimum period of time for the front end logic to evaluate the set of input signals and generate the output signal. | 04-30-2009 |
20090114913 | TEST STRUCTURE AND METHODOLOGY FOR THREE-DIMENSIONAL SEMICONDUCTOR STRUCTURES - A plurality of peripheral test structure substrate (PTSS) through vias is formed within a peripheral test structure substrate. A peripheral test structure layer and at least one functional layer are formed on one side of the plurality of the PTSS through vias. The other side of the plurality of the PTSS through vias is exposed throughout fabrication of the peripheral test structure layer and the at least one functional layer to provide access points for testing functionality of the various layers throughout the manufacturing sequence. C | 05-07-2009 |
20120262197 | TEST STRUCTURE AND METHODOLOGY FOR THREE-DIMENSIONAL SEMICONDUCTOR STRUCTURES - A plurality of peripheral test structure substrate (PTSS) through vias is formed within a peripheral test structure substrate. A peripheral test structure layer and at least one functional layer are formed on one side of the plurality of the PTSS through vias. The other side of the plurality of the PTSS through vias is exposed throughout fabrication of the peripheral test structure layer and the at least one functional layer to provide access points for testing functionality of the various layers throughout the manufacturing sequence. C4 bonding may be performed after manufacture of all of the at least one functional layer is completed. A 3D assembly carrier or a C4 carrier substrate is not required since the peripheral test structure substrate has sufficient mechanical strength to support the peripheral test structure layer and the at least one functional layer. | 10-18-2012 |
20120264241 | TEST STRUCTURE AND METHODOLOGY FOR THREE-DIMENSIONAL SEMICONDUCTOR STRUCTURES - A plurality of peripheral test structure substrate (PTSS) through vias is formed within a peripheral test structure substrate. A peripheral test structure layer and at least one functional layer are formed on one side of the plurality of the PTSS through vias. The other side of the plurality of the PTSS through vias is exposed throughout fabrication of the peripheral test structure layer and the at least one functional layer to provide access points for testing functionality of the various layers throughout the manufacturing sequence. C4 bonding may be performed after manufacture of all of the at least one functional layer is completed. A 3D assembly carrier or a C4 carrier substrate is not required since the peripheral test structure substrate has sufficient mechanical strength to support the peripheral test structure layer and the at least one functional layer. | 10-18-2012 |