Patent application number | Description | Published |
20080265251 | STRUCTURE AND METHOD FOR DETERMINING A DEFECT IN INTEGRATED CIRCUIT MANUFACTURING PROCESS - The present invention discloses a structure and method for determining a defect in integrated circuit manufacturing process, wherein the structure comprises a plurality of normal active areas formed in a plurality of first arrays and a plurality of defective active areas formed in a plurality of second arrays. The first arrays and second arrays are interlaced, and the defect is determined by monitoring a voltage contrast from a charged particle microscope image of the active areas. | 10-30-2008 |
20090080763 | METHOD AND SYSTEM FOR THE VISUAL CLASSIFICATION OF DEFECTS - A method and system for the classifying of defects in a device is disclosed. The method and system comprises directly classifying samples based upon a feature space; and creating knowledge from the samples of a feature group within the feature space for a supervised classifier. Finally, the method and system includes selecting features to create a best feature group from the feature space for a particular classification of defects. A visual classifier in accordance with the present invention is utilized in three different ways to improve speed and accuracy of the classification. First, the visual classifier directly classifies data. Second, the visual classifier can help to create knowledge about the defects quickly and correctly. Third, a feature selection process is also performed by the visual classifier in accordance with the present invention. | 03-26-2009 |
20120083055 | STRUCTURE AND METHOD FOR DETERMINING A DEFECT IN INTEGRATED CIRCUIT MANUFACTURING PROCESS - The present invention discloses a structure and method for determining a defect in integrated circuit manufacturing process, wherein the structure comprises a plurality of normal active areas formed in a plurality of first arrays and a plurality of defective active areas formed in a plurality of second arrays. The first arrays and second arrays are interlaced, and the defect is determined by monitoring a voltage contrast from a charged particle microscope image of the active areas. | 04-05-2012 |
Patent application number | Description | Published |
20090080479 | METHOD AND SYSTEM FOR OPERATING AN ATOMIC CLOCK USING A SELF-MODULATED LASER WITH ELECTRICAL MODULATION - A polarization gain medium such as an emitting laser diode provides the optical pumping. An atomic vapor cell is positioned in the laser cavity providing spontaneous push-pull optical pumping inside the laser cavity. This causes the laser beam to be modulated at hyperfine-resonance frequency. A clock signal is obtained from electrical modulation across the laser diode. | 03-26-2009 |
20100084284 | Method and system for electrolytic fabrication of atomic clock cells - The present invention relates to a method and system for electrolytic fabrication of cells. A cell can be formed of a silicon layer (cathode) sandwiched between layers of glass. One or more holes are formed in the silicon layer. An alkali metal enriched glass material is placed in or associated with the one or more holes. Electrolysis is used to make the alkali metal ions in the alkali metal enriched glass material combine with electrons from the silicon cathode to form neutral alkali metal atoms in the one or more holes. | 04-08-2010 |
20100156547 | METHOD FOR SUPPRESSING LIGHT SHIFT IN OPTICAL PUMPING SYSTEMS - The present invention relates to a method and system to suppress or eliminate light shift in an optical pumping system, such as an atomic clock. The method uses modulation of a radiation source, such as a radio frequency or microwave source, to simultaneously lock the frequency of the radiation source to an atomic resonance and lock the frequency of the optical pumping source in order to suppress or eliminate light shift. In one embodiment, the method of the present invention directly utilizes the out-of-phase channel of a lock-in amplifier to additionally lock an optical pumping source to a zero-light-shift frequency, where the in-phase channel is used to lock the frequency of the radiation source to an atomic resonance. | 06-24-2010 |
20100301853 | POLARIZING NUCLEI IN SOLIDS VIA SPIN TRANSFER FROM AN OPTICALLY-PUMPED ALKALI VAPOR - The present invention relates to a method and system for polarizing a solid compound of interest via spin transfer from an optically-pumped alkali vapor. In one embodiment, the method provides a cell which contains a solid compound as well as pure alkali metal and some amount of buffer gas. The cell is heated to vaporize some of the pure alkali. Resonant laser light is passed through the cell to polarize the atomic vapor, a process known as “optical pumping.” Optical pumping can transfer order from photons to atoms, causing a buildup of vapor atoms in one angular momentum state. This vapor polarization is then transferred through the surface of the solid compound in order to polarize the nuclei in the bulk of the compound. This can produce nuclear polarizations in the sample many times larger than the limit set by thermal equilibrium. The method can be used in nuclear magnetic resonance (NMR) or magnetic resonance imaging (MRI). | 12-02-2010 |