Patent application number | Description | Published |
20110284735 | SYSTEM AND METHOD FOR EXTRACTING A SAMPLE FROM A SURFACE - A system and method is disclosed for extracting a sample from a sample surface. A sample is provided and a sample surface receives the sample which is deposited on the sample surface. A hydrophobic material is applied to the sample surface, and one or more devices are configured to dispense a liquid on the sample, the liquid dissolving the sample to form a dissolved sample material, and the one or more devices are configured to extract the dissolved sample material from the sample surface. | 11-24-2011 |
20120043473 | ELECTROSPRAY ION SOURCE WITH REDUCED ANALYTE ELECTROCHEMISTRY - An electrospray ion (ESI) source and method capable of ionizing an analyte molecule without oxidizing or reducing the analyte of interest. The ESI source can include an emitter having a liquid conduit, a working electrode having a liquid contacting surface, a spray tip, a secondary working electrode, and a charge storage coating covering partially or fully the liquid contacting surface of the working electrode. The liquid conduit, the working electrode and the secondary working electrode can be in liquid communication. The electrospray ion source can also include a counter electrode proximate to, but separated from, said spray tip. The electrospray ion source can also include a power system for applying a voltage difference between the working electrodes and a counter-electrode. The power system can deliver pulsed voltage changes to the working electrodes during operation of said electrospray ion source to minimize the surface potential of the charge storage coating. | 02-23-2012 |
20120079894 | SYSTEMS AND METHODS FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION FOR CHEMICAL ANALYSIS - Systems and methods are described for laser ablation of an analyte from a specimen and capturing of the analyte in a dispensed solvent to form a testing solution. A solvent dispensing and extraction system can form a liquid microjunction with the specimen. The solvent dispensing and extraction system can include a surface sampling probe. The laser beam can be directed through the surface sampling probe. The surface sampling probe can also serve as an atomic force microscopy probe. The surface sampling probe can form a seal with the specimen. The testing solution including the analyte can then be analyzed using an analytical instrument or undergo further processing. | 04-05-2012 |
20120304747 | ENHANCED SPOT PREPARATION FOR LIQUID EXTRACTIVE SAMPLING AND ANALYSIS - A method for performing surface sampling of an analyte, includes the step of placing the analyte on a stage with a material in molar excess to the analyte, such that analyte-analyte interactions are prevented and the analyte can be solubilized for further analysis. The material can be a matrix material that is mixed with the analyte. The material can be provided on a sample support. The analyte can then be contacted with a solvent to extract the analyte for further processing, such as by electrospray mass spectrometry. | 12-06-2012 |
20130294971 | SURFACE SAMPLING CONCENTRATION AND REACTION PROBE - A method of analyzing a chemical composition of a specimen is described. The method can include providing a probe comprising an outer capillary tube and an inner capillary tube disposed co-axially within the outer capillary tube, where the inner and outer capillary tubes define a solvent capillary and a sampling capillary in fluid communication with one another at a distal end of the probe; contacting a target site on a surface of a specimen with a solvent in fluid communication with the probe; maintaining a plug volume proximate a solvent-specimen interface, wherein the plug volume is in fluid communication with the probe; draining plug sampling fluid from the plug volume through the sampling capillary; and analyzing a chemical composition of the plug sampling fluid with an analytical instrument. A system for performing the method is also described. | 11-07-2013 |
20140096624 | BALL ASSISTED DEVICE FOR ANALYTICAL SURFACE SAMPLING - A system for sampling a surface includes a sampling probe having a housing and a socket, and a rolling sampling sphere within the socket. The housing has a sampling fluid supply conduit and a sampling fluid exhaust conduit. The sampling fluid supply conduit supplies sampling fluid to the sampling sphere. The sampling fluid exhaust conduit has an inlet opening for receiving sampling fluid carried from the surface by the sampling sphere. A surface sampling probe and a method for sampling a surface are also disclosed. | 04-10-2014 |
20140216177 | METHOD AND SYSTEM FOR FORMATION AND WITHDRAWAL OF A SAMPLE FROM A SURFACE TO BE ANALYZED - A method and system for formation and withdrawal of a sample from a surface to be analyzed utilizes a collection instrument having a port through which a liquid solution is conducted onto the surface to be analyzed. The port is positioned adjacent the surface to be analyzed, and the liquid solution is conducted onto the surface through the port so that the liquid solution conducted onto the surface interacts with material comprising the surface. An amount of material is thereafter withdrawn from the surface. Pressure control can be utilized to manipulate the solution balance at the surface to thereby control the withdrawal of the amount of material from the surface. Furthermore, such pressure control can be coordinated with the movement of the surface relative to the port of the collection instrument within the X-Y plane. | 08-07-2014 |
20140238155 | SYSTEMS AND METHODS FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION FOR CHEMICAL ANALYSIS - Systems and methods are described for laser ablation of an analyte from a specimen and capturing of the analyte in a dispensed solvent to form a testing solution. A solvent dispensing and extraction system can form a liquid microjunction with the specimen. The solvent dispensing and extraction system can include a surface sampling probe. The laser beam can be directed through the surface sampling probe. The surface sampling probe can also serve as an atomic force microscopy probe. The surface sampling probe can form a seal with the specimen. The testing solution including the analyte can then be analyzed using an analytical instrument or undergo further processing. | 08-28-2014 |
20140326872 | AFM FLUID DELIVERY/LIQUID EXTRACTION SURFACE SAMPLING/ELECTROSTATIC SPRAY CANTILEVER PROBE - An electrospray system comprises a liquid extraction surface sampling probe. The probe comprises a probe body having a liquid inlet and a liquid outlet, and having a liquid extraction tip. A solvent delivery conduit is provided for receiving solvent liquid from the liquid inlet and delivering the solvent liquid to the liquid extraction tip. An open liquid extraction channel extends across an exterior surface of the probe body from the liquid extraction tip to the liquid outlet. An electrospray emitter tip is in liquid communication with the liquid outlet of the liquid extraction surface sampling probe. A system for analyzing samples, a liquid junction surface sampling system, and a method of analyzing samples are also disclosed. | 11-06-2014 |
Patent application number | Description | Published |
20100000338 | Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure using a laser sensor - A system and method utilizes distance-measuring equipment including a laser sensor for controlling the collection instrument-to-surface distance during a sample collection process for use, for example, with mass spectrometric detection. The laser sensor is arranged in a fixed positional relationship with the collection instrument, and a signal is generated by way of the laser sensor which corresponds to the actual distance between the laser sensor and the surface. The actual distance between the laser sensor and the surface is compared to a target distance between the laser sensor and the surface when the collection instrument is arranged at a desired distance from the surface for sample collecting purposes, and adjustments are made, if necessary, so that the actual distance approaches the target distance. | 01-07-2010 |
20100002905 | Control of the positional relationship between a sample collection instrument and a surface to be analyzed during a sampling procedure with image analysis - A system and method utilizes an image analysis approach for controlling the collection instrument-to-surface distance in a sampling system for use, for example, with mass spectrometric detection. Such an approach involves the capturing of an image of the collection instrument or the shadow thereof cast across the surface and the utilization of line average brightness (LAB) techniques to determine the actual distance between the collection instrument and the surface. The actual distance is subsequently compared to a target distance for re-optimization, as necessary, of the collection instrument-to-surface during an automated surface sampling operation. | 01-07-2010 |
20100072357 | ELECTROSPRAY ION SOURCE WITH REDUCED ANALYTE ELECTROCHEMISTRY - An electrospray ion (ESI) source and method capable of ionizing an analyte molecule without oxidizing or reducing the analyte of interest. The ESI source can include an emitter having a liquid conduit, a working electrode having a liquid contacting surface, a spray tip, a secondary working electrode, and a charge storage coating covering partially or fully the liquid contacting surface of the working electrode. The liquid conduit, the working electrode and the secondary working electrode can be in liquid communication. The electrospray ion source can also include a counter electrode proximate to, but separated from, said spray tip. The electrospray ion source can also include a power system for applying a voltage difference between the working electrodes and a counter-electrode. The power system can deliver pulsed voltage changes to the working electrodes during operation of said electrospray ion source to minimize the surface potential of the charge storage coating. | 03-25-2010 |
20100072394 | PULSED VOLTAGE ELECTROSPRAY ION SOURCE AND METHOD FOR PREVENTING ANALYTE ELECTROLYSIS - An electrospray ion source and method of operation includes the application of pulsed voltage to prevent electrolysis of analytes with a low electrochemical potential. The electrospray ion source can include an emitter, a counter electrode, and a power supply. The emitter can include a liquid conduit, a primary working electrode having a liquid contacting surface, and a spray tip, where the liquid conduit and the working electrode are in liquid communication. The counter electrode can be proximate to, but separated from, the spray tip. The power system can supply voltage to the working electrode in the form of a pulse wave, where the pulse wave oscillates between at least an energized voltage and a relaxation voltage. The relaxation duration of the relaxation voltage can range from 1 millisecond to 35 milliseconds. The pulse duration of the energized voltage can be less than 1 millisecond and the frequency of the pulse wave can range from 30 to 800 Hz. | 03-25-2010 |
20100224013 | Method and system for formation and withdrawal of a sample from a surface to be analyzed - A method and system for formation and withdrawal of a sample from a surface to be analyzed utilizes a collection instrument having a port through which a liquid solution is conducted onto the surface to be analyzed. The port is positioned adjacent the surface to be analyzed, and the liquid solution is conducted onto the surface through the port so that the liquid solution conducted onto the surface interacts with material comprising the surface. An amount of material is thereafter withdrawn from the surface. Pressure control can be utilized to manipulate the solution balance at the surface to thereby control the withdrawal of the amount of material from the surface. Furthermore, such pressure control can be coordinated with the movement of the surface relative to the port of the collection instrument within the X-Y plane. | 09-09-2010 |
20110269166 | SEALING SURFACE SAMPLING PROBE APPLIED TO BLOOD SPOTS AND TISSUES - A sample assembly includes a stack of a sample and a hydrophobic elastic layer located on the back side surface thereof or a filter layer. The sample may include a biological material or a chemical, and can include an absorptive material. The filter layer includes an absorptive material in which a sample material is embedded. A sealing surface sampling probe including a knife edge lands on an area of interest in the sample or the filter layer. The hydrophobic elastic layer or the substrate in conjunction with the knife edge provides a complete sealing of a confined portion of the sample or the filter layer to prevent inclusion of any other material from outside the confined volume and to enhance the precision and sensitivity of the analysis. | 11-03-2011 |
20120074306 | SPATIALLY RESOLVED THERMAL DESORPTION/IONIZATION COUPLED WITH MASS SPECTROMETRY - A system and method for sub-micron analysis of a chemical composition of a specimen are described. The method includes providing a specimen for evaluation and a thermal desorption probe, thermally desorbing an analyte from a target site of said specimen using the thermally active tip to form a gaseous analyte, ionizing the gaseous analyte to form an ionized analyte, and analyzing a chemical composition of the ionized analyte. The thermally desorbing step can include heating said thermally active tip to above 200° C., and positioning the target site and the thermally active tip such that the heating step forms the gaseous analyte. The thermal desorption probe can include a thermally active tip extending from a cantilever body and an apex of the thermally active tip can have a radius of 250 nm or less; | 03-29-2012 |
20120080589 | SYSTEM AND METHOD FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION FOR CHEMICAL ANALYSIS - A system and method for laser desorption of an analyte from a specimen and capturing of the analyte in a suspended solvent to form a testing solution are described. The method can include providing a specimen supported by a desorption region of a specimen stage and desorbing an analyte from a target site of the specimen with a laser beam centered at a radiation wavelength (λ). The desorption region is transparent to the radiation wavelength (λ) and the sampling probe and a laser source emitting the laser beam are on opposite sides of a primary surface of the specimen stage. The system can also be arranged where the laser source and the sampling probe are on the same side of a primary surface of the specimen stage. The testing solution can then be analyzed using an analytical instrument or undergo further processing. | 04-05-2012 |
20120083045 | SURFACE SAMPLING CONCENTRATION AND REACTION PROBE - A method of analyzing a chemical composition of a specimen is described. The method can include providing a probe comprising an outer capillary tube and an inner capillary tube disposed co-axially within the outer capillary tube, where the inner and outer capillary tubes define a solvent capillary and a sampling capillary in fluid communication with one another at a distal end of the probe; contacting a target site on a surface of a specimen with a solvent in fluid communication with the probe; maintaining a plug volume proximate a solvent-specimen interface, wherein the plug volume is in fluid communication with the probe; draining plug sampling fluid from the plug volume through the sampling capillary; and analyzing a chemical composition of the plug sampling fluid with an analytical instrument. A system for performing the method is also described. | 04-05-2012 |
20130298701 | SYSTEMS AND METHODS FOR LASER ASSISTED SAMPLE TRANSFER TO SOLUTION FOR CHEMICAL ANALYSIS - Systems and methods are described for laser ablation of an analyte from a specimen and capturing of the analyte in a dispensed solvent to form a testing solution. A solvent dispensing and extraction system can form a liquid microjunction with the specimen. The solvent dispensing and extraction system can include a surface sampling probe. The laser beam can be directed through the surface sampling probe. The surface sampling probe can also serve as an atomic force microscopy probe. The surface sampling probe can form a seal with the specimen. The testing solution including the analyte can then be analyzed using an analytical instrument or undergo further processing. | 11-14-2013 |
Patent application number | Description | Published |
20090077042 | METHOD AND SYSTEM OF UNIFYING DATA - A system, method and database design is provided for unifying data from a plurality of heterogeneous databases, each having business-context related data and a data access mechanism. A database is created (e.g., the UniDimNet) which contains a node for each dimension of an industry. For each data source which is accessible via the system, a set of data source specific dimensions is created and mapped to the corresponding industry business context dimension(s). A set of templates (e.g., UniViews) is created to query the data sources. Each UniView contains a specific question for a specific dimension designed for a specific data source. UniViews query the database they are associated with by using the data access mechanism of the associated database. A central server coordinates the system and facilitates use of the system through an interface (e.g., the UniViewer). The UniViewer allows a user to query the data sources by identifying an industry business context dimension, a dimension instance and at least one UniView. Multiple UniViews can be combined, cached and saved to facilitate complex queries. | 03-19-2009 |
20130073590 | METHOD AND SYSTEM OF UNIFYING DATA - A system, method and database design is provided for unifying data from a plurality of databases, each having business-context related data and a data access mechanism. A database is created which contains a node for each dimension of an industry. For each data source accessible via the system, a set of data source specific dimensions is created and mapped to the corresponding industry business context dimension(s). A set of templates (e.g., UniViews) is created to query the data sources. Each UniView contains a specific question for a specific dimension designed for a specific data source. A central server coordinates the system and facilitates use of the system through an interface (e.g., the UniViewer). UniViewer allows a user to query the data sources by identifying an industry business context dimension, a dimension instance and at least one UniView. Multiple UniViews can be combined, cached and saved to facilitate complex queries. | 03-21-2013 |
Patent application number | Description | Published |
20120295431 | METHOD FOR ETCHING GATE STACK - A method for etching a metal gate stack is provided. The method includes forming a gate stack on a substrate, where the gate stack includes a metal gate. A wet etch process is performed on the gate stack. The wet etch process includes submersing the substrate with the gate stack in an aqueous solution composed of a wet etchant and an oxidizer, removing the substrate from the solution and rinsing the solution from the etched gate stack. | 11-22-2012 |
20120329235 | WET ETCH AND CLEAN CHEMISTRIES FOR MoOx - A method of removing non-noble metal oxides from material (e.g., semiconductor material) used to make a microelectronic device includes providing the material comprising traces of the conducting non-noble metal oxides; applying a chemical mixture (or chemical solution) to the material; removing the traces of the non-noble metal oxides from the material; and removing the chemical mixture from the material. The non-noble metal oxides comprise MoO | 12-27-2012 |
20130149201 | SPRAY CLEANER ACCESSORY FOR REACTOR COMPONENT CLEANING - A reactor assembly including a first block having an array of reactors defined therein and a second block having an array of nozzles. The array of nozzles extends from a surface of the second block, the array of nozzles substantially aligned with the array of reactors so that each reactor is associated with a corresponding nozzle extending into a processing region of each reactor in the array of reactors when the surface of the second block is placed on a surface of the first block. Each nozzle of the array of nozzles has a plurality of openings disposed over a surface of the nozzle for dispersing fluid into the corresponding reactor. The array of nozzles is in fluid communication with a fluid source through a network of channels defined within the second block. | 06-13-2013 |
20130285159 | METHOD FOR ETCHING GATE STACK - A method for etching a metal gate stack is provided. The method includes forming a gate stack on a substrate, where the gate stack includes a metal gate. A wet etch process is performed on the gate stack. The wet etch process includes submersing the substrate with the gate stack in an aqueous solution composed of a wet etchant and an oxidizer, removing the substrate from the solution and rinsing the solution from the etched gate stack. | 10-31-2013 |
20140127974 | Combinatorial Tool for Mechanically-Assisted Surface Polishing and Cleaning - Polishing and cleaning techniques are combinatorially processed and evaluated. A polishing system can include a reactor assembly having multiple reaction chambers, with at least a reaction chamber including a rotatable polishing head, slurry and chemical distribution, chemical and water rinse, and slurry and fluid removal. Different downward forces can be applied to the polishing heads for evaluating optimum process conditions. Channels in the polishing pads can redistribute slurry and chemical to the polishing area. | 05-08-2014 |
20140179082 | Selective Etching of Hafnium Oxide Using Non-Aqueous Solutions - Provided are methods for processing semiconductor substrates having hafnium oxide structures as well as one or more of silicon nitride, silicon oxide, polysilicon, and titanium nitride structures. Selected etching solution compositions and processing conditions provide high etching selectivity of hafnium oxide relative to these other materials. As such, hafnium oxide structures may be partially or completely removed without significant damage to other exposed structures made from these other materials. In some embodiments, the etching rate hafnium oxide is two or more times greater than the etching rate of silicon oxide and/or twenty or more times greater that the etching rate of polysilicon. The etching rate of hafnium oxide may be one and half times greater than the etching rate of silicon nitride and/or five or more times greater than the etching rate of titanium nitride. | 06-26-2014 |
20140273497 | Wet Processing Systems and Methods with Replenishment - Embodiments provided herein describe systems and methods for processing substrates. A substrate having a plurality of site-isolated regions defined thereon is provided. A plurality of wet processes is simultaneously performed. Each of the plurality of wet processes is performed on one of the plurality of site-isolated regions defined on the substrate. The simultaneously performing includes exposing each of the plurality of site-isolated regions to one of a plurality of wet processing formulations. Each of the plurality of wet processing formulations includes a component. The respective component is added to at least some of the plurality of wet processing formulations during the exposing. A processing condition is varied between at least two of the plurality of wet processes in a combinatorial manner. | 09-18-2014 |