Patent application number | Description | Published |
20100031868 | TEMPERATURE-SENSITIVE INDICATOR - To provide a temperature-sensitive indicator which, when using the temperature-sensitive indicator having a capsule packed with a heat-sensitive material, enables easy rupture of the capsule, without being affected by the temperature of a finger of a user. The indicator includes: a base; a concave portion formed in the base; a capsule accommodated in the concave portion and packed with a heat-sensitive material; an absorbing member placed on the capsule; pressing means which is arranged above the absorbing member, and which is formed of a transparent heat insulating material; and a cover which covers at least the capsule and the absorbing member. By pressing on the capsule using the pressing means | 02-11-2010 |
20100043696 | TEMPERATURE-SENSITIVE INDICATOR - To provide a temperature sensitive indicator that is capable of easily control the temperature of the temperature sensitive indicator itself and is not affected by the temperature of a finger when the temperature sensitive indicator is operated. In the temperature sensitive indicator that has: a base body; a capsule placed on the base body and filled with a heat-sensitive material; an absorbent member placed on an upper part of the capsule; a cover covering at least the capsule and the absorbent member; and capsule breaking means formed therein with a space through which the base body and the cover are inserted, the base body and the cover are pulled out through the space of the capsule breaking means, whereby the capsule is broken by the capsule breaking means. | 02-25-2010 |
20110168079 | TEMPERATURE SENSING INDICATOR AND TEMPERATURE SENSING INDICATOR DEVICE - A temperature sensing indicator that allows a capsule therein to be broken readily and that can be used without being affected by the temperature of a user's finger, when using a temperature sensing indicator provided with a capsule encasing a temperature sensing material. | 07-14-2011 |
20110280775 | TEMPERATURE-SENSITIVE INDICATOR - Provided is a temperature sensitive indicator, which can be held in a desired state and is not affected by temperature of a finger at the time of an operation of the temperature sensitive indicator. The temperature sensitive indicator includes: a member base ( | 11-17-2011 |
Patent application number | Description | Published |
20090265597 | SIGNAL OUTPUT DEVICE, SIGNAL DETECTION DEVICE, TESTER, ELECTRON DEVICE, AND PROGRAM - There is provided a signal output apparatus for outputting a pattern signal. The signal output apparatus includes a pattern generating section that generates waveform data of the pattern signal to be generated, a timing generating section that generates timing signals in accordance with an expected pattern cycle time of the pattern signal, a timing control section that receives the waveform data output from the pattern generating section, and controls output timings of the timing signals to be output from the timing generating section, in accordance with the waveform data, and a waveform shaping section that generates the pattern signal corresponding to data values of the waveform data output from the pattern generating section, in accordance with the timing signals output from the timing generating section. | 10-22-2009 |
20100039078 | LOAD FLUCTUATION CORRECTION CIRCUIT, ELECTRONIC DEVICE, TESTING DEVICE, AND LOAD FLUCTUATION CORRECTION METHOD - Provided is a load fluctuation compensation circuit for compensating a power source voltage supplied to an operation circuit, the load fluctuation compensation circuit including: a periodic signal changing section that receives a power source voltage from a power source shared with the operation circuit, and outputs a changed signal resulting from changing a supplied periodic signal according to the power source voltage; a phase comparator that compares a phase of the periodic signal with a phase of the changed signal outputted from the periodic signal changing section; an initializing section that generates a bias voltage supplied to the periodic signal changing section and adjusts a phase difference between the periodic signal and the changed signal to a preset value, based on the comparison result of the phase comparator; a controller that holds the bias voltage outputted from the initializing section when the phase difference between the periodic signal and the changed signal has become the preset value; a power current consumption circuit that shares a power source with the operation circuit; and a fluctuation compensation section that controls an amount of a power current supplied to the power current consumption circuit, based on the comparison result outputted from the phase comparator while the bias voltage of the initializing section is kept on hold. | 02-18-2010 |
20110125308 | APPARATUS FOR MANUFACTURING SUBSTRATE FOR TESTING, METHOD FOR MANUFACTURING SUBSTRATE FOR TESTING AND RECORDING MEDIUM - A test substrate manufacturing apparatus comprising a test circuit database that stores circuit data of a plurality of types of test circuits in association with a plurality of types of testing content; a definition information storing section that stores definition information defining arrangements of device pads of devices under test and testing content to be performed for each of the device pads; and a lithography data generating section that generates lithography data for the test substrate by (i) selecting, from the test circuit database, circuit data of each test circuit to be connected to a device pad based on the testing content defined by the definition information stored in the definition information storing section and (ii) determining positions on the test substrate where the test circuits corresponding to the selected circuit data are formed using lithography, based on the arrangements of the device pads as defined by the definition information. | 05-26-2011 |
20110231128 | TEST APPARATUS, MEASUREMENT APPARATUS, AND ELECTRONIC DEVICE - A test apparatus that judges pass/fail of a signal under measurement, comprising a frequency counter that repeatedly performs a counting step of counting the number of pulses of a reference signal whose period is known and the number of pulses of the signal under measurement in parallel within the same measurement period; an average period calculating section that calculates, for each counting step, an average period of the signal under measurement within the measurement period, based on a period of the reference signal and a ratio between the number of pulses of the signal under measurement and the number of pulses of the reference signal counted within the same measurement period; a noise calculating section that calculates spread of the average periods calculated by the average period calculating section; and a judging section that judges pass/fail of the signal under measurement based on the spread of the average periods. | 09-22-2011 |
20120262215 | TIMING GENERATOR AND TEST APPARATUS - A timing generator that outputs a timing signal obtained by delaying an input signal, comprising first and second period delay sections that each output a rate signal obtained by delaying the input signal by a delay amount corresponding to an integer multiple of a period of an operation clock supplied thereto; a first high-accuracy delay section that outputs the timing signal obtained by delaying a signal input thereto by a delay amount that is less than the period of the operation clock; and a mode switching section that switches between a low-speed mode, in which the rate signal output by the first period delay section is input to the first high-accuracy delay section, and a high-speed mode, in which a signal obtained by interleaving the rate signals output by the first period delay section and the second period delay section is input to the first high-accuracy delay section. | 10-18-2012 |
Patent application number | Description | Published |
20080232130 | LIGHT SOURCE DEVICE OF ENDOSCOPE SYSTEM - A light source device of an endoscope system comprises a light source and a light-source controller. The light source emits in a flash-emitting mode that the light source flashes in a flash interval longer than a field period of an imaging sensor for the endoscope system and for a flash period shorter than the field period. The light-source controller controls the light source so that the light source emits in the flash-emitting mode within an imaging period that is a period excluding a reading period within the field period. The flash interval is defined as a period from when the flash of the light source commences to when the next flash of the light source commences. The flash period is defined as a period from when the flash of the light source commences to when the flash of the light source is completed. | 09-25-2008 |
20080232131 | LIGHT SOURCE DEVICE OF ENDOSCOPE SYSTEM - A light source device of an endoscope system comprises a light-source unit, a light-sensitive element, and a driving unit. The light-source unit emits light and supplies light to the photographic subject through an electronic scope. The light-sensitive element receives light emitted from the light-source unit. The driving unit adjusts the driving intensity of the light-source unit on the basis of a first information regarding an emitting-light intensity of the light-source unit output from the light-sensitive element. | 09-25-2008 |
20090062609 | ENDOSCOPE SYSTEM - The scope has an imaging sensor, a memory, an image signal-processing unit, and a scope controller having a timer. The image signal-processing unit performs a primary image-processing operation on an image signal output from the imaging sensor. The timer counts an elapsed time. The processor has a video signal-processing unit and a time-hold unit. The video signal-processing unit performs a secondary image-processing operation on the image signal on which the primary image signal processing operation is made. The time-hold unit keeps date data and outputting the date data to the scope controller. The scope controller measures a command-received time when a setting for the primary image-processing operation in the image signal-processing unit is changed on the basis of the elapsed time that is counted by the timer and the date data, and stories a record indicating that the setting has changed and the command-received time to the memory. | 03-05-2009 |
20090062612 | ENDOSCOPE SYSTEM - An endoscope system comprises a scope, a first processor, and a first measuring device. The scope has an imaging sensor, a memory, and a reference signal output unit that outputs a reference signal instead of an image signal from the imaging sensor in a first operation for generating an analysis data. The first processor performs an image-processing operation of the image signal in a normal use, and performs the image-processing operation of the reference signal in the first operation. The first measuring device is connected to the first processor and measures a first characteristic of an image encoded by the reference signal on which the image-processing operation is carried out, in the first operation. The first processor transmits a measurement result by the first measuring device to the scope as the analysis data. The memory stores the analysis data when the measurement result is input to the first processor. | 03-05-2009 |
20090290016 | ENDOSCOPE SYSTEM - An endoscope system comprises a scope and a processor. The scope has an imaging sensor, a first image-processing unit that performs primary image processing, a first memory, and a second memory. The first and second memories are non-volatile. The processor has a second image-processing unit that performs secondary image processing, and a processor memory that is non-volatile. The first memory stores an system data that includes parameters for the primary and secondary image processing. The processor memory stores the system data. The second memory is used for storing the system data stored in the processor memory when it is determined that the system data stored in the first memory is older than the system data stored in the processor memory. The system data stored in the second memory is overwritten onto the first scope memory after the system data is stored in the second memory. | 11-26-2009 |