Patent application number | Description | Published |
20080197477 | Flip-Chip Grid Ball Array Strip and Package - The present disclosure relates to an improved integrated circuit package with a encapsulant retention structure located adjacent to a packaged integrated chip on a substrate. The structure allows for the placement and retention of a larger quantity of encapsulant to seep under the packaged integrated chip. The retention wall placed on the substrate alternatively serves as substrate stiffener able to maintain mechanical properties to be used with a more desirable thinner substrate. In one embodiment, the use of openings and recesses in a stiffener layer of an integrated circuit package houses a passive electronic component to maintain mechanical properties when a thinner substrate is used. The use of either a retention wall or a stiffener allows for the manufacture of these integrated circuit package using strip, matrix, or array technology where a larger board with a plurality of integrated circuit packages is produced industrially and then cut to individual units. The use of a retention wall of a stiffener layer over an expensive substrate layer allows for the use of disposable edges around the strip including indexing holes or other holding mechanisms. What is also contemplated is a method of manufacture of a compact strip, matrix, or array comprised of a plurality of integrated circuit packages where no waste or additional cuts are needed to produce individual integrated circuit packages. | 08-21-2008 |
20090032940 | Conductor Bump Method and Apparatus - Various semiconductor die conductor structures and methods of fabricating the same are provided. In one aspect, a method of manufacturing is provided that includes forming a conductor structure on a conductor pad of a semiconductor die. The conductor layer has a surface. A polymeric layer is formed on the surface of the conductor layer while a portion of the surface is left exposed. A solder structure is formed on the exposed portion of the surface and a portion of the polymeric layer. | 02-05-2009 |
20090032941 | Under Bump Routing Layer Method and Apparatus - Various semiconductor chip conductor structures and methods of fabricating the same are provided. In one aspect, a method of manufacturing is provided that includes forming a conductor structure on a semiconductor chip. The conductor structure has a first site electrically connected to a first redistribution layer structure and a second site electrically connected to a second redistribution layer structure. A solder structure is formed on the conductor structure. | 02-05-2009 |
20090278264 | Semiconductor Chip Bump Connection Apparatus and Method - Various semiconductor chip packages and methods of making the same are disclosed. In one aspect, a method of manufacturing is provided that includes coupling a solder bump to a side of a semiconductor chip and bringing the solder bump into contact with a conductor pad coupled to a substrate and positioned in an opening of a solder mask on the substrate. The conductor pad has a first lateral dimension and the opening has a second lateral dimension that is larger than the first lateral dimension. A metallurgical bond is established between the solder bump and the conductor pad. | 11-12-2009 |
20100001399 | Semiconductor Chip Passivation Structures and Methods of Making the Same - Various semiconductor chip passivation structures and methods of making the same are disclosed. In one aspect, a method of manufacturing is provided that includes applying a polymeric passivation layer to a side of a semiconductor chip. The side of the semiconductor chip includes plural conductor pads. Plural openings are formed in the polymeric passivation layer to expose the plural conductor pads. Plural conductor structures are formed on the plural conductor pads. | 01-07-2010 |
20100044884 | INTEGRATED CIRCUIT PACKAGE EMPLOYING PREDETERMINED THREE-DIMENSIONAL SOLDER PAD SURFACE AND METHOD FOR MAKING SAME - An integrated circuit package employs a solder pad that includes a predetermined three dimensional surface that is adapted to receive solder. In one example, the predetermined three dimensional surface includes at least one predetermined hill or protruding portion and a valley portion, such as a lower portion, having a predetermined relative height between the hill portion and a valley portion. The predetermined three dimensional surface can be configured in any suitable configuration and may include contoured patterns, non-patterns, or any other suitable configuration as desired. A related method is also described. | 02-25-2010 |
20100102457 | Hybrid Semiconductor Chip Package - Various apparatus and method of packaging semiconductor chips are disclosed. In one aspect, a method of manufacturing is provided that includes placing a semiconductor chip package into a mold. The semiconductor chip package includes a substrate that has a side and a first semiconductor chip coupled to the side in spaced apart relation to define a space between the first semiconductor chip and the side. A second semiconductor chip is mounted on the first semiconductor chip. At least one conductor wire is electrically coupled to the second semiconductor chip and the substrate. A molding material is introduced into the mold to flow into the space and establish an underfill and encapsulate the first semiconductor chip and the second semiconductor chip. | 04-29-2010 |
20100140798 | SEMICONDUCTOR CHIP BUMP CONNECTION APPARATUS AND METHOD - Various semiconductor chip packages and methods of making the same are disclosed. In one aspect, a method of manufacturing is provided that includes coupling a solder bump to a side of a semiconductor chip and bringing the solder bump into contact with a conductor pad coupled to a substrate and positioned in an opening of a solder mask on the substrate. The conductor pad has a first lateral dimension and the opening has a second lateral dimension that is larger than the first lateral dimension. A metallurgical bond is established between the solder bump and the conductor pad. | 06-10-2010 |
20100155938 | FACE-TO-FACE (F2F) HYBRID STRUCTURE FOR AN INTEGRATED CIRCUIT - An integrated circuit (IC) product includes a redistribution layer (RDL) having at least one conductive layer configured to distribute electrical information from one location to another location in the IC. The RDL also includes a plurality of wire bond pads and a plurality of solder pads. The plurality of solder pads each includes a solder wettable material that is in direct electrical communication with the RDL. | 06-24-2010 |
20100314759 | SEMICONDUCTOR CHIP PASSIVATION STRUCTURES AND METHODS OF MAKING THE SAME - Various semiconductor chip passivation structures and methods of making the same are disclosed. In one aspect, a method of manufacturing is provided that includes applying a polymeric passivation layer to a side of a semiconductor chip. The side of the semiconductor chip includes plural conductor pads. Plural openings are formed in the polymeric passivation layer to expose the plural conductor pads. Plural conductor structures are formed on the plural conductor pads. | 12-16-2010 |
20110049725 | Semiconductor Chip with Contoured Solder Structure Opening - Methods and apparatus to inhibit cracks and delaminations in a semiconductor chip solder bump are disclosed. In one aspect, a method of manufacturing is provided that includes forming a first dielectric layer over a first conductor structure of a semiconductor chip and forming a first opening in the first dielectric layer to expose at least a portion of the conductor structure. The first opening defines an interior wall that includes plural protrusions. A solder structure is coupled to the first conductor structure such that a portion of the solder structure is positioned in the first opening. | 03-03-2011 |
20110057307 | Semiconductor Chip with Stair Arrangement Bump Structures - Various semiconductor chip input/output structures and methods of making the same are disclosed. In one aspect, a method of manufacturing is provided that includes forming a first conductor structure on a first side of a semiconductor chip and forming a second conductor structure in electrical contact with the first conductor structure. The second conductor structure is adapted to be coupled to a solder structure and includes a stair arrangement that has at least two treads. | 03-10-2011 |
20110133338 | CONDUCTOR BUMP METHOD AND APPARATUS - Various semiconductor die conductor structures and methods of fabricating the same are provided. In one aspect, a method of manufacturing is provided that includes forming a conductor structure on a conductor pad of a semiconductor die. The conductor layer has a surface. A polymeric layer is formed on the surface of the conductor layer while a portion of the surface is left exposed. A solder structure is formed on the exposed portion of the surface and a portion of the polymeric layer. | 06-09-2011 |
20110221065 | METHODS OF FORMING SEMICONDUCTOR CHIP UNDERFILL ANCHORS - Various semiconductor chips and methods of making the same are disclosed. In one aspect, a method of manufacturing is provided that includes forming a first opening in an insulating layer applied to a side of a semiconductor chip. The first opening does not extend through to the side. A second opening is formed in the insulating layer that exposes a portion of the side. | 09-15-2011 |
20110222256 | CIRCUIT BOARD WITH ANCHORED UNDERFILL - Various circuit boards and methods of manufacturing using the same are disclosed. In one aspect, a method of manufacturing is provided that includes applying a solder mask to a side of a circuit board and forming at least one opening in the solder mask leading to the side. An underfill is placed on the solder mask so that a portion thereof projects into the at least one opening. | 09-15-2011 |
20120012987 | METHODS OF FORMING SEMICONDUCTOR CHIP UNDERFILL ANCHORS - Various semiconductor chips and methods of making the same are disclosed. In one aspect, a method of manufacturing is provided that includes forming a first opening in an insulating layer applied to a side of a semiconductor chip. The first opening does not extend through to the side. A second opening is formed in the insulating layer that exposes a portion of the side. | 01-19-2012 |
20120127689 | INTEGRATED PACKAGE CIRCUIT WITH STIFFENER - The present disclosure relates to an improved integrated circuit package and method with a encapsulant retention structure located adjacent to a packaged integrated chip on a substrate. The structure allows for the placement and retention of a larger quantity of encapsulant to seep under the packaged integrated chip. The retention wall placed on the substrate alternatively serves as substrate stiffener able to maintain mechanical properties to be used with a more desirable thinner substrate. In one embodiment, the use of openings and recesses in a stiffener layer of an integrated circuit package houses a passive electronic component to maintain mechanical properties when a thinner substrate is used. The use of either a retention wall or a stiffener allows for the manufacture of these integrated circuit package using strip, matrix, or array technology where a larger board with a plurality of integrated circuit packages is produced industrially and then cut to individual units. | 05-24-2012 |
20120241985 | SEMICONDUCTOR CHIP WITH SUPPORTIVE TERMINAL PAD - Various semiconductor chip input/output structures and methods of making the same are disclosed. In one aspect, a method of manufacturing is provided that includes providing a semiconductor chip that has a first conductor pad and a passivation structure. A second conductor pad is fabricated around but not in physical contact with the first conductor pad to leave a gap. The second conductor pad is adapted to protect a portion of the passivation structure. | 09-27-2012 |
20120261812 | SEMICONDUCTOR CHIP WITH PATTERNED UNDERBUMP METALLIZATION - Various semiconductor chip solder bump and underbump metallization (UBM) structures and methods of making the same are disclosed. In one aspect, a method is provided that includes providing a semiconductor chip that has a conductor pad and a passivation structure over the conductor pad. A first metallic layer is applied on the passivation structure and in electrical contact with the conductor pad. The first metallic layer covers a first portion but not a second portion of the passivation structure. A second metallic layer is applied to the first metallic layer. A polymer layer is applied to the second metallic layer. The polymer layer includes a first opening in alignment with the first metallic layer that exposes a portion of the second layer. A conducting solder barrier layer is applied to the exposed portion of the second metallic layer. | 10-18-2012 |
20120326299 | SEMICONDUCTOR CHIP WITH DUAL POLYMER FILM INTERCONNECT STRUCTURES - Various semiconductor chip input/output structures and methods of making the same are disclosed. In one aspect, a method of manufacturing is provided that includes applying a first polymer film to a side of a semiconductor chip and forming a first underbump metallization structure with at least a portion on the first polymer film. A second polymer film is applied on the first polymer film with an opening exposing a portion of the first underbump metallization structure. | 12-27-2012 |
20130049190 | METHODS OF FABRICATING SEMICONDUCTOR CHIP SOLDER STRUCTURES - Various semiconductor chip solder bump and underbump metallization (UBM) structures and methods of making the same are disclosed. In one aspect, a method is provided that includes depositing a layer of a first metallic material on a semiconductor chip. The first layer has a first physical quantity. A layer of a second metallic material is deposited on the layer of the first metallic material. The second layer has a second physical quantity. The first and second layers are reflowed to form a solder structure with a desired ratio of the first metallic material to the second metallic material. | 02-28-2013 |
20130062786 | SOLDER MASK WITH ANCHOR STRUCTURES - Various substrates or circuit boards for receiving a semiconductor chip and methods of processing the same are disclosed. In one aspect, a method of manufacturing is provided that includes forming a first opening in a solder mask positioned on a side of a substrate. The first opening does not extend to the side. A second opening is formed in the solder mask that extends to the side. The first opening may serve as an underfill anchor site. | 03-14-2013 |
20130113084 | SEMICONDUCTOR SUBSTRATE WITH MOLDED SUPPORT LAYER - Various semiconductor substrates and methods of processing the same are disclosed. In one aspect, a method of manufacturing is provided that includes mounting a first semiconductor chip on a side of a first substrate. The first substrate has at least one thru-silicon-via. An insulating layer is molded on the side of the first substrate. The insulating layer provides a support structure to enable handling of the first substrate. | 05-09-2013 |
20130147026 | HEATSINK INTERPOSER - According an embodiment, a package-on-package heatsink interposer for use between a top package and a bottom package of a package-on-package device, may include a top heatsink below the top package; an interposer substrate below the top heatsink; a bottom heatsink below the interposer substrate; a first interposer substrate metal layer between the interposer substrate and the top heatsink; a second interposer substrate metal layer between the interposer substrate and the bottom heatsink; and interposer solder balls between the second interposer substrate metal layer and the bottom package. | 06-13-2013 |
20130256871 | SEMICONDUCTOR CHIP DEVICE WITH FRAGMENTED SOLDER STRUCTURE PADS - Methods and apparatus to inhibit cracks and delaminations in a semiconductor chip solder bump and to reduce pad parasitic capacitance are disclosed. In one aspect, a method of manufacturing is provided that includes forming a first insulating layer over plural conductor pads of a semiconductor chip and forming an opening over each of the conductor pads. An individual solder structure is coupled to the insulating layer. The solder structure has a projection in each of the openings and in electrical contact with one of the plural conductor pads. | 10-03-2013 |