Patent application number | Description | Published |
20090190246 | METHOD OF READING DATA STORED IN A DATA STORAGE DEVICE AND DATA STORAGE DEVICE THAT PERFORMS A DATA READ RETRY OPERATION - A disk drive includes a disk having a track that includes a data sector divided by a servo sector so that a first data sector portion is on a first side of the servo sector, and a second data sector portion is on a second side of the servo sector. The disk drive reads data by: positioning the head at a first offset position with respect to the track and reading data from the data sector. When a read error occurs between the first and second data sector portions, the disk drive: stores the data from the first data sector portion in memory, moves the head to a second offset position with respect to the track, reads data from the second data sector portion with the head at the second offset position, and stores the data read from the second data sector portion in the memory. | 07-30-2009 |
20090252012 | DEFECT INSPECTION METHOD AND DISK DRIVE USING SAME - Provided are a disk defect inspection method and apparatus. The defect inspection method includes; determining an independent recording density value for disk defect detection in relation to disk drive component factors excepting a disk of the disk drive, and performing a disk defect inspection using the independent recording density value for disk defect detection. | 10-08-2009 |
20110194205 | METHOD AND APPARATUS FOR MANAGING DEFECTS OF RECORDING MEDIUM - A method of managing defects of a recording medium of a data storage device includes performing a quality test related to occurrence of errors for each data sector in the recording medium; classifying a quality of each data sector according to evaluation criteria corresponding to quality classifications based on the quality test; determining a number of data sectors in each quality classification; and defect-processing the data sectors of the quality classifications that range from a lowest quality classification to a highest quality classification within a defect management limitation of the data storage device. | 08-11-2011 |