Patent application number | Description | Published |
20110308319 | Measuring probes for measuring and taking samples with a metal melt - A measuring probe is provided for measuring and taking samples in a metal melt. The probe has a measuring head arranged on a lance, wherein the measuring head carries at least a temperature sensor and a sampling chamber, and wherein the sampling chamber is surrounded, at least partially, by the measuring head and includes an intake duct that extends through the measuring head. The intake duct includes an inner section, which extends in the measuring head and has a length L and a minimum diameter D at least at one site in the inner section. The ratio L/D | 12-22-2011 |
20120082183 | DROP-IN PROBE - A drop-in probe is provided for determining phase changes of a sample removed from a molten steel by thermal analysis. The probe includes a measurement head that has an immersion end and in which is arranged a sample chamber having an inlet opening and a thermocouple projecting with its hot solder joint into the sample chamber and having a cable bushing for signal cables of the thermocouple. The cable bushing emerges from the measurement head out of a discharge opening on an end of the measurement head opposite the immersion end. A straight line between the immersion end and the discharge opening forms a longitudinal axis of the measurement head, and a theoretical plane through the hot solder joint and through a part of the inlet opening farthest away from the immersion end is formed perpendicular to the longitudinal axis. The probe is characterized by either a) the measurement head has a density of at least 7 g/cm | 04-05-2012 |
20120293798 | Sampler for Taking Samples from Melts Having a Melting Point Higher Than 600.degree.C and Method for Taking Samples - A sampler is provided for taking samples from melts having a melting point higher than 600° C., in particular for metal or cryolite melts. The sampler includes a carrier tube having an immersion end and having a sample chamber assembly arranged on the immersion end of the carrier tube. The assembly has an inlet opening and a sample cavity for the melt and is arranged at least partly inside the carrier tube. The sample chamber assembly has on a part of its outer surface a coupling device, arranged inside the carrier tube, for coupling a carrier lance. A method is also provided for taking samples using such a sampler. | 11-22-2012 |
20130098173 | DEVICE FOR MEASURING PARAMETERS OR FOR TAKING SAMPLES IN MOLTEN IRON OR STEEL - A device is provided for measuring parameters or for taking samples in molten iron or steel and for taking samples of slag resting on the melt. The device includes a carrier tube having an immersion end, a lateral circumferential surface, and a measuring head arranged on the immersion end. At least one sensor or inlet opening for a sample chamber present inside the device is arranged at the immersion end of the measuring head. The lateral circumferential surface of the carrier tube or measuring head has an inlet opening extending through an inlet channel to merge in a pre-chamber arranged inside the carrier tube or measuring head. The pre-chamber has, at its end facing away from the immersion end, an entry opening that merges into a slag sample chamber on the side of the pre-chamber facing away from the immersion end. | 04-25-2013 |
20140053647 | MEASURING PROBE FOR SAMPLING MELTED METALS - A measuring probe for sampling melted metals, in particular melted steel, includes a measuring head arranged on an immersion end of a support tube. The measuring head includes at least one sample chamber. The sample chamber includes a feed channel having one end which opens into the sample chamber and a second end with a feed opening that projects from the front face of the measuring head facing away from the support tube and is covered by a protective cap. A protective shield is arranged outside of the feed channel upstream of the feed opening in a feed direction at a distance from the feed opening. The protective shield covers the feed opening and the protective shield does not fully surround the feed channel laterally. | 02-27-2014 |
20140119404 | MEASURING PROBE FOR MEASUREMENTS IN MOLTEN METAL OR SLAG - A measuring probe is provided for taking measurements in molten metal or slag, the probe including a measuring head having an immersion end and a rear end. At least one electrochemical sensor, one thermocouple, and one bath contact of the electrochemical sensor are arranged at the immersion end, and the thermocouple and electrochemical sensor each protrude from the immersion end adjacent to each other. The bath contact is formed from a strip of metal arranged around and between the thermocouple and the electrochemical sensor in appropriate manner, such that two chambers are formed that are open at the immersion end. The thermocouple is arranged in one chamber and the electrochemical sensor is arranged in the other chamber and both are held by fixation material. | 05-01-2014 |
Patent application number | Description | Published |
20130179043 | HARVESTER CRUISE CONTROL - A method of cruise control for a harvester automatically monitors certain operating conditions of the harvester and responsively sets an engine speed value adequate to meet predicted torque demand, and, but not necessarily, automatically varies a propulsion speed of the harvester as required to match the torque demand to the available torque to increase efficiency, and has particular applicability to a sugar cane harvester. Monitored conditions can include certain characteristics or parameters of a pump or pumps powering fluid operated systems of the harvester, in particular, propulsion and harvesting systems. Other conditions can include intake air temperature, coolant, and hydraulic fluid temperature. Rate of change of one or more of the conditions can be used for setting the engine speed and to predict the torque demand. | 07-11-2013 |
20150233855 | Moisture Sensor for a Forage Harvester - A moisture sensor for a forage harvester is described, the moisture sensor comprising a sensing device, a processing unit and an output terminal. The sensing device is configured to sense an electrical characteristic of a harvested crop and generate a sensor signal representative of the electrical characteristic. The processing unit is configured to receive the sensor signal from the sensing device and to process the sensor signal to derive a moisture level of the harvested crop. The output terminal is connected to the processing unit for outputting an output signal representative of the moisture level as derived by the processing unit. Each operating mode for the sensing device having a different moisture level sensitivity characteristic, and receiving an operating parameter and selecting an operating mode of the plurality of operating modes for the sensing device, based on the operating parameter. | 08-20-2015 |
Patent application number | Description | Published |
20090011604 | PHOTON INDUCED REMOVAL OF COPPER - Preferred embodiments provide a method for removing at least part of a copper comprising layer from a substrate, the substrate comprising at least a copper comprising surface layer. The method comprises in a first reaction chamber converting at least part of the copper comprising surface layer into a copper halide surface layer and in a second reaction chamber removing at least part of the copper halide surface layer by exposing it to a photon comprising ambient, thereby initiating formation of volatile copper halide products. During exposure to the photon comprising ambient, the method furthermore comprises removing the volatile copper halide products from the second reaction chamber to avoid saturation of the volatile copper halide products in the second reaction chamber. The method according to preferred embodiments may be used to pattern copper comprising layers. For example, the method according to preferred embodiments may be used to form copper comprising interconnect structures in a semiconductor device. | 01-08-2009 |
20090173359 | PHOTON INDUCED CLEANING OF A REACTION CHAMBER - The present invention provides a method for in-situ cleaning of walls of a reaction chamber, e.g. reactive ion etching chamber, to remove contamination, e.g. copper comprising contamination from the walls. The method comprises converting the contamination, e.g. copper comprising contamination into a halide compound, e.g. copper halide compound and exposing the halide compound, e.g. copper halide compound to a photon comprising ambient, thereby initiating formation of volatile halide products, e.g. volatile copper halide products. The method furthermore comprises removing the volatile halide products, e.g. volatile copper halide products from the reaction chamber to avoid saturation of the volatile halide products, e.g. volatile copper halide products in the reaction chamber in order to avoid re-deposition of the volatile halide products, e.g. volatile copper halide products to the walls of the reaction chamber. | 07-09-2009 |
20120107550 | PHOTON INDUCED FORMATION OF METAL COMPRISING ELONGATED NANOSTRUCTURES - The preferred embodiments provide a method for forming at least one metal comprising elongated nanostructure on a substrate. The method comprises exposing a metal halide compound surface to a photon comprising ambient to initiate formation of the at least one metal comprising elongated nanostructure. The preferred embodiments also provide metal comprising elongated nanostructures obtained by the method according to preferred embodiments. | 05-03-2012 |
20130149461 | ELECTROLESS COPPER DEPOSITION - A method for providing electroless plating is provided. An amorphous carbon barrier layer is formed over the low-k dielectric layer by providing a flow a deposition gas, comprising a hydrocarbon, H | 06-13-2013 |
20140154406 | WET ACTIVATION OF RUTHENIUM CONTAINING LINER/BARRIER - Methods and systems are provided for preparing a ruthenium containing liner/barrier for metal deposition, and are useful in the manufacture of integrated circuits. In accordance with one embodiment, a borohydride solution having a pH greater than 12 is mixed with DI water at the place of application to form a pretreatment solution. The pretreatment solution is applied to reduce a ruthenium-containing surface of a substrate. Following reduction of the ruthenium containing surface, copper deposition may be initiated. | 06-05-2014 |
20150037973 | METHOD FOR CAPPING COPPER INTERCONNECT LINES - A method of forming a capping layer over copper containing contacts in a dielectric layer with a liner comprising a noble metal liner around the copper containing contacts is provided. An electroless deposition is provided to deposit a deposition comprising copper on the noble metal liner and the copper containing contacts. A capping layer is formed over the deposition comprising copper. | 02-05-2015 |
Patent application number | Description | Published |
20100119229 | METHOD AND SYSTEM FOR MULTIPLEXER WAVEGUIDE COUPLING - An optical device for optically multiplexing or demultiplexing light of different predetermined wavelengths is provided, the optical device comprising at least one first waveguide ( | 05-13-2010 |
20100189402 | Method for Effective Refractive Index Trimming of Optical Waveguiding Structures and Optical Waveguiding Structures - A method for trimming an effective refractive index of optical waveguiding structures made for example in a high refractive index contrast material system. By compaction of cladding material in a compaction area next to patterns or ridges that are formed in the core material for realizing an optical waveguiding structure, the effective index of refraction of the optical waveguiding structure can be trimmed. Thus, the operating wavelength of an optical component comprising such an optical waveguiding structure can be trimmed. An optical waveguide structure thus obtained is also disclosed. | 07-29-2010 |
20100278484 | Waveguide Coupling Probe and Methods for Manufacturing Same - A waveguide coupling probe ( | 11-04-2010 |
20100322555 | Grating Structures for Simultaneous Coupling to TE and TM Waveguide Modes - Disclosed are an integrated optical coupler, and a method of optically coupling light, between an optical element and at least one integrated optical waveguide. The optical coupler includes a grating structure and is adapted for coupling light to waveguide modes with different polarization with low polarization dependent loss. For example, polarization dependent loss may be smaller than 0.5 dB. The waveguide modes may include a Transverse Electric (TE) waveguide mode and a Transverse Magnetic (TM) waveguide mode. The optical coupler may further include a two-dimensional grating structure adapted for providing polarization splitting for a first optical signal of a first predetermined wavelength and for coupling both polarizations forward or backward. | 12-23-2010 |
20110013874 | Method for Effective Refractive Index Trimming of Optical Waveguiding Structures and Optical Waveguiding Structures - A method for trimming an effective refractive index of optical waveguiding structures made for example in a high refractive index contrast material system. By compaction of cladding material in a compaction area next to patterns or ridges that are formed in the core material for realizing an optical waveguiding structure, the effective index of refraction of the optical waveguiding structure can be trimmed. Thus, the operating wavelength of an optical component comprising such an optical waveguiding structure can be trimmed. An optical waveguide structure thus obtained is also disclosed. | 01-20-2011 |
20110075970 | Integrated Photonics Device - The present invention relates to an integrated photonic device ( | 03-31-2011 |
20120063717 | METHOD OF PRODUCING A PHOTONIC DEVICE AND CORRESPONDING PHOTONIC DEVICE - Method of producing a photonic device including at least one light source and at least one photodetector on a structure including a waveguide layer, this method comprising the following steps: a) growing successively on a substrate ( | 03-15-2012 |
20120320939 | LASER LIGHT COUPLING INTO SOI CMOS PHOTONIC INTEGRATED CIRCUIT - A hybrid laser for generating radiation includes an optical passive material and an optical active material. The laser includes a first optical waveguide and optical laser components with reflectors in the optical passive material. The first optical waveguide is adapted for coupling out radiation from the hybrid laser. The laser also includes a second optical waveguide defined in the optical active material. The optical laser components include reflectors defining a cavity and furthermore are adapted for providing laser cavity confinement in the first optical waveguide and the second optical waveguide. The second optical waveguide thereby is positioned at least partly over the first optical waveguide so that an evanescent coupling interface is defined between the second optical waveguide and the first optical waveguide and the evanescent coupling interface is positioned within the laser cavity. | 12-20-2012 |
20150268419 | METHOD FOR OPTICAL COUPLING BETWEEN A PHOTONIC INTEGRATED CIRCUIT AND AN EXTERNAL OPTICAL ELEMENT - The present disclosure generally relates to a method of optically coupling a photonic integrated circuit and an external optical component. In one aspect, a method comprises: providing a photonic integrated circuit comprising at least one integrated optical waveguide, the photonic integrated circuit having a cover layer; providing at least one optical component external to the photonic integrated circuit, the at least one optical component having an optical coupling facet and configured to be optically coupled to the at least one integrated optical waveguide, thereby forming an assembly; determining a position of the optical coupling facet of the at least one optical component in the assembly; determining a position of the at least one integrated optical waveguide; designing an optical interface pattern between the optical coupling facet of the at least one optical component in the assembly and the at least one integrated optical waveguide; and writing the interface pattern in the cover layer of the photonic integrated circuit by means of a femtosecond laser, thereby forming an optical interface for optically coupling the optical coupling facet and the at least one integrated optical waveguide. | 09-24-2015 |
20150333481 | Hybrid Waveguide Lasers and Methods for Fabricating Hybrid Waveguide Lasers - The present disclosure relates to a method for integrating a sub-micron III-V waveguide laser on a semiconductor photonics platform as well as to a corresponding device/system. The method comprises providing on a semiconductor substrate an electrically insulating layer, etching a trench having a width in the range between 50 nm and 800 nm through the electrically insulating layer, thereby locally exposing the silicon substrate, providing a III-V layer stack in the trench by local epitaxial growth to form a channel waveguide, and providing a light confinement element for confining radiation in the local-epitaxial-grown channel waveguide. | 11-19-2015 |