Ho-Hui
Ho-Hui Hsieh, Taoyuan County TW
Patent application number | Description | Published |
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20140140478 | APPARATUS FOR X-RAY PHOTOGRAPHY - An apparatus for X-ray photography includes a first X-ray source, a first driving device, and an image detecting device. The first X-ray source has a light emitting end, provided with a block element. The first X-ray source generates an X-ray beam, and the block element is used for constraining a projection field of the X-ray beam, so that the X-ray beam has a first boundary. The X-ray beam is cast onto an object, and the object has a reference center and an imageable area. The first driving device is used for driving the first X-ray source to rotate around the object within an angle range with the reference center of the object as a center, so that when the first X-ray source is located at a first position, the first boundary passes through the reference center | 05-22-2014 |
Ho-Hui Hsieh, Longtan Township TW
Patent application number | Description | Published |
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20150115143 | TOMOGRAPHIC SCANNING APPARATUS - A tomographic scanning apparatus for scanning an object under test and retrieving projection-related data of the object with a light/radiation source and a detector operating in conjunction therewith includes an object carrier, a light/radiation source carrier, a detector carrier, a control module, a processing module, and a rail system (or rotating arm). The object carrier is disposed at a center of the rail system or a center of rotating tracks of the rotating arm. The light/radiation source carrier and the detector carrier move along a rail of the rail system or along the rotating tracks of the rotating arm. The carriers have a rotating mechanism, moving mechanism, and/or height adjusting mechanism for performing rotation, horizontal movement, and/or height adjustment. Accordingly, the tomographic scanning apparatus operates in various ways to suit various applications, respectively. | 04-30-2015 |
Ho-Hui Lin, Hsinchu Hsiang TW
Patent application number | Description | Published |
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20090009198 | PROBING DEVICE - A probing device includes a rack that has an outer support member supporting a circuit layer and a center support member supporting a probe assembly. When the tester touching down the circuit layer of the probing device from the top side, the outer support member of the rack bears this touchdown stress. When the probes of the probe holder touching down the electronic components of an IC wafer under test, the center support member of the rack bears the reaction force from the IC wafer. | 01-08-2009 |
20100253378 | PROBE FOR HIGH FREQUENCY SIGNAL TRANSMISSION - A probe for high frequency signal transmission includes a metal pin, and a metal line spacedly arranged on and electrically insulated from the metal pin and electrically connected to grounding potential so as to maintain the characteristic impedance of the probe upon transmitting high frequency signal. The maximum diameter of the probe is substantially equal to or smaller than two times of the diameter of the metal pin. Under this circumstance, a big amount of probes can be installed in a probe card for probing a big amount of electronic devices, so that a wafer-level electronic test can be achieved efficiently and rapidly. | 10-07-2010 |