Kishio Hidaka
Kishio Hidaka, Hitachiota JP
Patent application number | Description | Published |
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20080315747 | Electron emitting element, electron gun, and electron beam applied equipment using the same - An electron emitting element having a cap portion | 12-25-2008 |
20100193687 | FIELD EMISSION TYPE ELECTRON GUN COMPRISING SINGLE FIBROUS CARBON ELECTRON EMITTER AND OPERATING METHOD FOR THE SAME - Means for achieving the purpose of the present invention includes an field emission type cathode composed of a single fibrous carbon substance and a conductive substrate supporting the same; an extraction apparatus for causing field emission of electrons; and an accelerator for accelerating electrons, wherein the aforementioned field emission type electron gun is further contains means for heating the aforementioned field emission cathode, and means for applying the voltage of the polarity that does not allow the aforementioned field emission type cathode to field-emit electrons. | 08-05-2010 |
20100258724 | Tip-sharpened carbon nanotubes and electron source using thereof - An electron microscope comprising an electron emitting cathode equipped with a carbon nanotube and an extraction unit to field-emit electrons. The carbon nanotube contains a sharp portion which is approximately conical shape at tip thereof closed at the electron-emitting cathode. | 10-14-2010 |
20100325761 | Scanning Probe Microscope and Method of Observing Sample Using the Same - Optical information and topographic information of the surface of a sample are measured at a nanometer-order resolution and with high reproducibility without damaging a probe and the sample by combining a nanometer-order cylindrical structure with a nanometer-order microstructure to form a plasmon intensifying near-field probe having a nanometer-order optical resolution and by repeating approach/retreat of the probe to/from each measurement point on the sample at a low contact force. | 12-23-2010 |
20100331166 | CARBON/SILICON CARBIDE SYSTEM COMPOSITE MATERIAL - An object of the present invention is to produce a heat-resistant carbon/silicon carbide system composite material having a high density without deteriorating the mechanical properties such as toughness of carbon fiber. | 12-30-2010 |
20110100773 | DISC BRAKE - A rotor main body | 05-05-2011 |
20120204297 | Scanning Probe Microscope and Method of Observing Sample Using the Same - Optical information and topographic information of the surface of a sample are measured at a nanometer-order resolution and with high reproducibility without damaging a probe and the sample by combining a nanometer-order cylindrical structure with a nanometer-order microstructure to form a plasmon intensifying near-field probe having a nanometer-order optical resolution and by repeating approach/retreat of the probe to/from each measurement point on the sample at a low contact force. | 08-09-2012 |
Kishio Hidaka, Hitachioota JP
Patent application number | Description | Published |
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20100218287 | SCANNING PROBE MICROSCOPE AND METHOD OF OBSERVING SAMPLE USING THE SAME - In a scanning probe microscope, a nanotube and metal nano-particles are combined together to configure a plasmon-enhanced near-field probe having an optical resolution on the order of nanometers as a measuring probe in which a metal structure is embedded, and this plasmon-enhanced near-field probe is installed in a highly-efficient plasmon exciting unit to repeat approaching to and retracting from each measuring point on a sample with a low contact force, so that optical information and profile information of the surface of the sample are measured with a resolution on the order of nanometers, a high S/N ratio, and high reproducibility without damaging both of the probe and the sample. | 08-26-2010 |
Kishio Hidaka, Hitachi JP
Patent application number | Description | Published |
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20100064396 | SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME - In a near-field scanning microscope using an aperture probe, the upper limit of the aperture formation is at most several ten nm in practice. In a near-field scanning microscope using a scatter probe, the resolution ability is limited to at most several ten nm because of the external illuminating light serving as background noise. Moreover, measurement reproducibility is seriously lowered by a damage or abrasion of a probe. Optical data and unevenness data of the surface of a sample can be measured at a nm-order resolution ability and a high reproducibility while damaging neither the probe nor the sample by fabricating a plasmon-enhanced near-field probe having a nm-order optical resolution ability by combining a nm-order cylindrical structure with nm-order microparticles and repeatedly moving the probe toward the sample and away therefrom at a low contact force at individual measurement points on the sample. | 03-11-2010 |
20130145507 | SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME - In a near-field scanning microscope using an aperture probe, the upper limit of the aperture formation is at most several ten nm in practice. In a near-field scanning microscope using a scatter probe, the resolution ability is limited to at most several ten nm because of the external illuminating light serving as background noise. Moreover, measurement reproducibility is seriously lowered by a damage or abrasion of a probe. Optical data and unevenness data of the surface of a sample can be measured at a nm-order resolution ability and a high reproducibility while damaging neither the probe nor the sample by fabricating a plasmon-enhanced near-field probe having a nm-order optical resolution ability by combining a nm-order cylindrical structure with nm-order microparticles and repeatedly moving the probe toward the sample and away therefrom at a low contact force at individual measurement points on the sample. | 06-06-2013 |