Patent application number | Description | Published |
20080307193 | Semiconductor integrated circuit - A semiconductor integrated circuit (chip) includes a primary TAP controller and a secondary TAP controller. The primary TAP controller interprets a bit string of n bits included in the group 1 having an m-bit length (m≧2) and less than the total number of m bits as an instruction that carries out a processing for a control object and interprets each bit string having an m-bit length as an instruction that carries out no processing for the control object. The m-bit length is obtained by adding a predetermined single bit string to each bit string included in the group 1 consisting of at least two or more bit strings having an n-bit length, respectively. The secondary TAP controller extracts a single bit string denoting an instruction that has an n-bit length and carries out no processing for the control object from each bit string interpreted by the primary TAP controller as an instruction that carries out a processing for the control object, then interprets the single bit string. | 12-11-2008 |
20090083712 | Semiconductor integrated circuit - An object of the present invention is to solve a problem that, if the state of a macro that is a debug target changes by a factor other than a debugger while the debugger debugs the macro as a target, the debugger becomes unable to continue debugging and the debugging terminates abnormally. In order to solve the aforementioned problem, disclosed is a semiconductor integrated circuit including a first register that stores a value indicating that the macro is in a reset state in response to a reset signal received during debugging of the macro, and a second register that stores a value indicating whether or not the macro has been in the reset state in the past by receiving a reset signal. | 03-26-2009 |
20100174956 | Semiconductor integrated circuit and method of saving and restoring internal state of the same - A semiconductor integrated circuit includes a scan chain which includes: first flip-flops contained in a first circuit and second flip-flops contained in a second circuit, wherein the first flip-flops and the second flip-flops are connected in a series connection in a scan path test mode to operate as a shift register, and a first selecting circuit configured to selectively output a test data in the scan path test mode and internal state data indicating an internal state of the first flip-flops and read from a memory circuit in a restoring operation in a normal mode to the series connection. The semiconductor integrated circuit further includes a backup control circuit configured to control the scan chain in a saving operation in the normal mode such that the internal state data is stored in the memory circuit without passing through the second flip-flops, in the restoring operation in the normal mode such that the internal state data from the first selecting circuit is set in the first flip-flops without passing through the second flip-flops, and in the scan path test mode such that the test data is shifted in the series connection. | 07-08-2010 |
20100308876 | SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF SAVING AND RECOVERING INTERNAL STATE THEREOF - A semiconductor integrated circuit includes: a first circuit; and a second circuit configured to control supply of a first power to the first circuit. The first circuit includes: a third circuit comprising a group of flip-flops, whose internal state is erased in response to stop of the supply of the first power; and a fourth circuit in which an internal state of the fourth circuit is saved in retention flip-flops before the supply of the first power is stopped and recovered from the retention flip-flops in response to restart of the supply of the first power. | 12-09-2010 |
20100321071 | Semiconductor integrated circuit - A resume signal hold circuit holds an assertion of a resume signal instructed while the circuit block is in a stand-by mode. A resume signal mask circuit is provided between the circuit block and the resume signal hold circuit, and masks the signals while the circuit block is in the stand-by mode so that no signal can be input to the circuit block. A power saving control circuit causes the resume signal hold circuit to hold the assertion of the event signal and causes the resume signal mask circuit to mask the signals while the circuit block is in a stand-by mode. The power saving control circuit also causes the resume signal hold circuit to cancel the holding of the assertion of the resume signal after the completion of the resume setting of the circuit block and cancelling of the signal masking by the resume signal mask circuit. | 12-23-2010 |
20110185126 | MULTIPROCESSOR SYSTEM - When a processor has transitioned to an operation stop state, it is possible to reduce the power consumption of a cache memory while maintaining the consistency of cache data. A multiprocessor system includes first and second processors, a shared memory, first and second cache memories, a consistency management circuit for managing consistency of data stored in the first and second cache memories, a request signal line for transmitting a request signal for a data update request from the consistency management circuit to the first and second cache memories, an information signal line for transmitting an information signal for informing completion of the data update from the first and second cache memories to the consistency management circuit, and a cache power control circuit for controlling supply of a clock signal and power to the first and second cache memories in accordance with the request signal and the information signal. | 07-28-2011 |