Nodari
Nodari Jojua, Rustari GE
Patent application number | Description | Published |
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20100150717 | Variable-Diameter Rotor with Centrifugal Forces Compensation Mechanism - A variable-diameter rotor comprises a hub with a shaft and rotor blades, wherein each of the rotor blades comprises a radially internal blade part and a radially external blade part. In each of the rotor blades, a jackscrew mechanism is arranged therein and includes a jackscrew arranged in the radially internal blade part and a nut connected with the radially external blade part, the nut cooperating with the jackscrew for radially moving the radially external blade part with respect to the radially internal blade part. The rotor further comprises an energy storage system, including a compressed-gas accumulator. The compressed-gas accumulator comprises a volume of gas and a piston for compressing and expanding the volume of pressurized gas. The energy storage system also includes a means for converting a radial motion of the radially external blade part into a motion of the piston of the compressed-gas accumulator and vice-versa. | 06-17-2010 |
Nodari Rizun, Los Angeles, CA US
Patent application number | Description | Published |
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20130280291 | Mineral Pitch Resin manufactured under a safe and low temperature procedure. - The invention claims a manufacturing method of the Mineral Pitch Resin also known as shilajit, silajit, mumije, mumie, momie, moomie, mumio, momia, brashgun, etc., and product variations thereof. The method produces genuine Mineral Pitch Resin, under a predetermined controlled method. Such method results into the Resin, which is verifiably free from harmful contaminants and is safe for humans to consume as a healing, tonifying and adaptogenic substance. Such resin passes authenticity tests, is of consistent quality and has preserved heat sensitive biologically active substances innate to raw material used to manufacture the Mineral Pitch. | 10-24-2013 |
Nodari Sitchinava, San Mateo, CA US
Patent application number | Description | Published |
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20080294955 | Dynamically Reconfigurable Shared Scan-In Test Architecture - A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time. | 11-27-2008 |
20080301510 | Dynamically Reconfigurable Shared Scan-In Test Architecture - A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time. | 12-04-2008 |
20090271673 | Dynamically Reconfigurable Shared Scan-In Test Architecture - A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time. | 10-29-2009 |
20090313514 | Dynamically Reconfigurable Shared Scan-In Test Architecture - A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time. | 12-17-2009 |
20100031101 | Dynamically Reconfigurable Shared Scan-In Test Architecture - A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time. | 02-04-2010 |
20100223516 | Dynamically Reconfigurable Shared Scan-In Test Architecture - A low overhead dynamically reconfigurable shared scan-in test architecture is provided. This test architecture advantageously allows for changing scan inputs during the scan operation on a per shift basis. The flexibility of reconfiguring the scan input to scan chain mapping every shift cycle can advantageously reduce both test data volume and test application time. | 09-02-2010 |