Patent application number | Description | Published |
20090140685 | Method and Device for Positioning a Movable Part in a Test System - The invention relates to a method and a device for the positioning of a displaceable component in an examining system, particularly a measuring or an analytic system wherein, during the process, the displaceable component is displaced with the support of an actuating element coupled to the displaceable component from a home position into an end position, wherein the actuating element is moved by means of a drive force and the displaceable component is impacted with a fixation force fixating the displaceable component in the end position by way of a fixation component connected to the displaceable component, where the fixation component is submerged at least partially in a reservoir of a medium and is fixated in the medium by means of the transformation of the medium from a liquid state into a solidified state, wherein the medium is transformed from the liquid state into the solidified state by means of the impact-application with a manipulating variable. | 06-04-2009 |
20090300807 | Method for providing a probe for a probe-microscopic analysis of a test sample in a probe microscope and arrangement with a probe microscope - The present invention relates to a method for providing a measuring probe ( | 12-03-2009 |
20100251437 | Method and Apparatus for Characterizing a Sample with Two or More Optical Traps - The present invention relates to a method for investigating a sample using scanning probe photon microscopy or optical force microscopy, and to an apparatus which is designed accordingly. The method or the apparatus provides for two optical traps which can be moved in a local region of the sample, wherein in at least one of the two traps a probe is held. The sample is scanned using the two traps and the measured data from the two traps are captured separately and evaluated by correlation. In particular interference signals resulting from an interaction between sample and light trap can be eliminated by the method. | 09-30-2010 |
20100263096 | MEASURING PROBE DEVICE FOR A PROBE MICROSCOPE, MEASURING CELL AND SCANNING PROBE MICROSCOPE - The invention relates to a measuring probe device for a probe microscope, in particular a scanning probe microscope, with a measuring probe holder and a measuring probe arranged on the measuring probe holder, which is set up for a probe microscopic investigation of a sample, wherein on the measuring probe holder, a measuring probe chamber is formed, which receives the measuring probe at least partially and is open on a side away from the measuring probe holder, and is configured to receive a liquid surrounding the measuring probe. The invention also relates to a measuring cell for receiving a liquid sample for a probe microscope, a scanning probe microscope with a measuring probe device and a scanning probe microscope with a measuring cell. | 10-14-2010 |
20100263098 | METHOD AND APPARATUS FOR THE COMBINED ANALYSIS OF A SAMPLE WITH OBJECTS TO BE ANALYZED - The invention relates to a method for the combined analysis of a sample with objects to be analysed, in particular a sample with biological objects, in which measurement results for one or more of the objects to be analysed in the sample are obtained by analysing the one or more objects to be analysed by an imaging method of measurement, probe-microscopic measurement results are obtained for the one or more objects to be analysed by analysing the one or more objects to be analysed by a probe-microscopic method of measurement, and the measurement results and the probe-microscopic measurement results are assigned to one another, after optional prior intermediate processing. Furthermore, the invention relates to an apparatus for carrying out combined analysis of a sample with objects to be investigated, in particular a sample with biological objects. | 10-14-2010 |
20110302676 | Method and Device for Examining a Sample with a Probe Microscope - The invention relates to a method for examining a sample by using probe microscopy, in particular scanning probe microscopy in which a sample is examined by way of a probe microscope with a multi-part measuring probe comprising a probe element and a guide clement guiding the probe element during the probe microscopy examination with the method furthermore comprising the following steps: capturing of noise measuring signals for the measuring probe in a non measuring configuration in which the probe clement is arranged separately from the guide element, capturing of measuring signals for the measuring probe in a measuring configuration in which the probe element is guided by the guide element, and analysing the measuring signals by at least partially assigning the measuring signals to the noise measuring signals. Further, the invention relates to a device for examining a sample with a probe microscope. | 12-08-2011 |
Patent application number | Description | Published |
20100258935 | Power Semiconductor Module Comprising A Connection Device With Internal Contact Spring Connection Elements - A power semiconductor module comprises at least one power semiconductor component and a connection device which makes contact with the power semiconductor component. The connection device is composed of a layer assembly having at least one first electrically conductive layer facing the power semiconductor component and forming at least one first conductor track, and an insulating layer following in the layer assembly, and a second layer following further in the layer assembly and forming at least one second conductor track, the second layer being remote from the power semiconductor component. The power semiconductor module has at least one internal connection element, wherein the internal connection element is embodied as a contact spring having a first and a second contact section and a resilient section. The first contact section has a common contact area with a first or a second conductor track of the connection device. | 10-14-2010 |
20110001244 | Method for Producing a Power Semiconductor Module, and Power Semiconductor Module Comprising a Connection Device - A method for making a power semiconductor module and a module produced by that method, wherein the module includes a substrate, a connection device and load terminal elements, wherein power semiconductor components are arranged on a conductor track of the substrate and connected to one of the load terminal element by the connection device. The power semiconductor module has auxiliary contact pads which can be connected to an external printed circuit board. The primary production step in this case is cohesively connecting respective first contact areas of the first conductor tracks to at least one second contact area of a power semiconductor component and at least one third contact area of a load terminal element; afterwards, the assemblage composed of at least one power semiconductor component of a connection device and load terminal elements is arranged to form a housing of the power semiconductor module. | 01-06-2011 |
20130271916 | Modular liquid-cooled power semiconductor module, and arrangement therewith - A power semiconductor module, and an arrangement using the module. The module has a basic parallelepipedal shape with opposed pairs of main, longitudinal and narrow sides, a cooling device which is capable of carrying a flow of a cooling fluid, having a power electronics switch and a housing. The cooling device has a cooling volume with at least one cooling face and four connection devices which are arranged in pairs on the main sides. In addition, the connection devices carry the cooling fluid and are designed as a flow inflow and a flow outflow and as a return inflow and a return outflow, respectively. The power electronics switch has load input connection devices and load output connection devices which are arranged on one or both longitudinal sides and a control connection device which is arranged on a narrow side of the module. | 10-17-2013 |
20130271917 | Liquid-cooled arrangement having modular power semiconductor modules and at least one capacitor device, and power semiconductor module therefor - An arrangement having a cooling circulation, a plurality of modular power semiconductor modules and at least one capacitor, wherein a power semiconductor module has a power electronics switch and a cooling device, which is capable of carrying a flow of a cooling fluid, for cooling the switch, the cooling device having at least one cooling face, and four connection devices for the cooling fluid. The connection devices are arranged in pairs on main sides of the power semiconductor module. The power semiconductor modules have their main sides strung together modularly by connecting corresponding connection devices on successive power semiconductor modules. To this end, at least two successive power semiconductor modules have a capacitor arranged between them which, for its part, is cooled by means of the cooling circulation of the cooling fluid as provided by the arrangement. | 10-17-2013 |
Patent application number | Description | Published |
20090294535 | DATA CARRIER WITH A CHIP AND A PLURALITY OF SENSORS - The invention relates to a data carrier ( | 12-03-2009 |
20100291392 | METHOD FOR PRODUCING A POLYCARBONATE LAYERED COMPOSITE - The invention relates to a method for making a structure with at least a first polymer layer and a second polymer layer, each made from a polycarbonate polymer based on bisphenol A, and in between the first polymer layer and the second polymer layer an intermediate layer being arranged, comprising the following steps: a) the intermediate layer is applied at least on a partial region of the first polymer layer, b) optionally the intermediate layer is dried, c) the first polymer layer is coated on the side, on which the intermediate layer is arranged, with a liquid preparation comprising a solvent or a mixture of solvents and a polycarbonate derivative based on a geminally disubstituted dihydroxydiphenyl cycloalkane, the preparation covering the intermediate layer, d) optionally a drying step is made after step c), e) after step c) or step d), the second polymer layer is placed on the first polymer layer, covering the intermediate layer, f) the first polymer layer and the second polymer layer are laminated with each other under pressure, at a temperature from 120° C. to 230° C. and for a defined time. | 11-18-2010 |
20110274883 | LATENT-REACTIVELY GLUED TPU/PC LAYER MATERIALS - The invention relates to a security and/or valuable document ( | 11-10-2011 |
Patent application number | Description | Published |
20080266659 | Lens for evanescent wave illumination and corresponding microscope - The invention relates to a lens ( | 10-30-2008 |
20080297787 | Optical Array for the Spectrally Selective Identification of Light of a Light Beam - Disclosed is an optical array ( | 12-04-2008 |
20080304146 | Microscope System for Fcs Measurements - A microscope system for conducting FCS measurements. The system includes an illuminating light source configured to emit an illuminating light at an illuminating wavelength. A target light source is provided and configured to emit a target light for marking an FCS volume in a sample volume at a target wavelength. The target wavelength differs from the illuminating wavelength. The system further includes a plurality of optical elements configured to direct the illuminating light and the target light onto the sample volume. | 12-11-2008 |
20090073555 | SCANNING MICROSCOPE AND METHOD FOR MANIPULATING SAMPLES BY MEANS OF A MANIPULATING LIGHT BEAM IN A SCANNING MICROSCOPE - A scanning microscope for manipulating a sample, the microscope, having a first light source, a second light source, a beam deflector, and an optical device. The first light source is configured to emit an illuminating light beam that follows an illuminating beam. A second light source is configured to produce a manipulating light beam which has a manipulating beam focus and follows a manipulating beam path. The beam deflection device is configured to guide the illuminating light beam and the manipulating beam focus over or through the sample. The optical device is disposed downstream of the second light in the manipulating beam and is configured to modify the size of the manipulating beam focus. | 03-19-2009 |
20090213456 | Illumination Module for Evanescent Illumination and Microscope - A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample includes an adjustment mechanism with which the polarization of the illumination light beam may be changed. | 08-27-2009 |
20110226963 | METHOD AND APPARATUS FOR PERFORMING MULTIPOINT FCS - A method of performing fluorescence correlation spectroscopy with a fluorescence microscope includes selecting an illumination area of a sample, generating an illumination light beam and splitting the illumination light beam into at least three partial beams. The partial light beams are focused onto the selected illumination area using a microscope optical system of the fluorescence microscope so as to excite fluorescent dye particles in the illumination area to fluoresce. Fluorescent light emitted by the dye particles is detected and at least one diffusion coefficient representative of a diffusibility of the fluorescent dye particles is determined based on the detected fluorescent light. | 09-22-2011 |
20110299156 | METHOD FOR FCS MEASUREMENTS - A method for conducting FCS measurements includes providing a sample volume, emitting a target light having a first wavelength from a target light source, and marking an FCS volume in the sample volume with the target light by directing the target light onto the sample volume. An illuminating light having a second wavelength is emitted from an illuminating light source, the second wavelength being different than the first wavelength, and the illuminating light is directed onto the sample volume. | 12-08-2011 |
20120098949 | SPIM MICROSCOPE WITH A STED LIGHT SHEET - A STED-SPIM-microscope (Selective Plane Imaging Microscopy) having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. By optionally turning on a STED deactivation light beam the light sheet can optionally be made thinner and therefore the optical resolution can be increased. | 04-26-2012 |
20120099190 | SPIM Microscope with a sequential light sheet - A SPIM-microscope (Selective Plane Imaging Microscopy) having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. By an illumination optics having a zoom optics that is provided in the beam path of the illumination light beam the focal length of the illumination light beam can be varied. | 04-26-2012 |
20120320438 | Scanning Microscope and Method for Light-Microscopic Imaging of an Object - A scanning microscope includes a light source, illumination optics, and a scanning device for moving the illumination focus across a target region and doing so by varying the direction of incidence in which the illuminating beam enters an entrance pupil of the illumination optics. To incline the illumination focus relative to the optical axis of the optics, the scanning device directs the illuminating beam onto a portion of the entrance pupil that is offset from the center of the pupil and, in order to move the illumination focus across the target region, the scanning device varies the direction of incidence of the illuminating beam within said portion. An observation objective is provided which is spatially separated from the illumination optics and disposed such that its optical axis (O | 12-20-2012 |
20130034913 | Method for Investigating a Specimen Containing Fluorescing Dyes with the Aid of a Microscope - In order to investigate a specimen ( | 02-07-2013 |
20130094016 | METHOD AND APPARATUS FOR IDENTIFYING AND CORRECTING SPHERICAL ABERRATIONS IN A MICROSCOPE IMAGING BEAM PATH - A method and apparatus provide identification of a spherical error of a microscope imaging beam path in a context of microscopic imaging of a sample using a microscope having an objective. A coverslip that carries or covers the sample is arranged in the imaging beam path. A measurement beam is guided through the objective onto the sample in a decentered fashion that is outside an optical axis of the objective. The measurement beam is reflected at an interface of the coverslip with the sample and the reflected measurement beam is guided through the objective onto a detector. An intensity profile of the reflected measurement beam is detected with the detector and a presence of a spherical error from the intensity profile is determined qualitatively and/or quantitatively. | 04-18-2013 |
20130107358 | METHOD AND SYSTEM FOR ILLUMINATING A SAMPLE | 05-02-2013 |
20130335818 | Scanning Microscope, and Method for Light Microscopy Imaging of a Specimen - A scanning microscope is described, having an illumination unit for emitting an illumination light beam, an objective for generating an elongated illumination focus in a specimen to be imaged, and a scanning apparatus for moving the illumination focus over a target region of the specimen to be illuminated by modifying the direction of incidence in which the illumination light beam is incident into an entrance pupil of the objective. The scanning apparatus directs the illumination light beam onto a sub-region of the entrance pupil offset from the pupil center in order to incline the illumination focus relative to the optical axis of the objective, and modifies the direction of incidence of the illumination light beam within that sub-region in order to move the illumination focus over the target region to be illuminated. | 12-19-2013 |
20140300958 | ARRANGEMENT FOR USE IN THE ILLUMINATION OF A SPECIMEN IN SPIM MICROSCOPY - An arrangement for use in illuminating a sample in SPIM microscopy includes an illumination objective configured to receive and focus a light strip or a quasi-light strip. The quasi-light strip is made up of a light bundle continuously moved back and forth in a light-strip plane. A deflection apparatus is configured to deflect the light strip or the quasi-light strip, after the light strip or the quasi-light strip has passed through the illumination objective, in such a way that the light strip or the quasi-light strip propagates at an angle different from zero degrees with respect to an optical axis of the illumination objective. The illumination objective and the deflection apparatus are arranged movably relative to one another. | 10-09-2014 |
20150338628 | SPIM MICROSCOPE WITH A SEQUENTIAL LIGHT SHEET - A SPIM-microscope (Selective Plane Imaging Microscopy) having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. By an illumination optics having a zoom optics that is provided in the beam path of the illumination light beam the focal length of the illumination light beam can be varied. | 11-26-2015 |