Seong-Heon
Seong-Heon Jeong, Seongnam City KR
Patent application number | Description | Published |
---|---|---|
20110103518 | DC OFFSET SUPPRESSION CIRCUIT FOR A COMPLEX FILTER - The present invention relates to a direct current (DC) offset suppression circuit to suppress DC offsets occurring when a communication circuit where a complex filter is adopted performs self-mixing. The DC offset is suppressed by a DC feedback circuit adopted by a filter which is substituted for a complex filter in the communication circuit. But, the DC offset cannot be suppressed when a complex filter is used in the communication circuit. It is because phase changes of the complex filter cause output signal fed back to the input of the complex filter to generate phase differences. The present invention includes a phase compensation unit and a DC feedback unit. The phase compensation unit compensates a change in frequency between input and output of the complex filter for phase compensation. The DC feedback unit inverses and feeds back the compensated phase to an input of the complex filter. | 05-05-2011 |
Seong-Heon Jeong, Seoul City KR
Patent application number | Description | Published |
---|---|---|
20090209221 | RECEIVER WITH LOW POWER CONSUMPTION - The present invention provides a receiver with low power consumption. The receiver with low power consumption adjusts the gain of the programmable gain amplifier based on the automatic gain controller and further optimizes the gain bandwidth product by current-adjusting unit. The current-adjusting unit thus adjusts the current provided for the programmable gain amplifier, e.g. operational amplifier. Therefore, the gain bandwidth product of the programmable gain amplifier is optimized and the power consumption of the receiver is effectively decreased. | 08-20-2009 |
20100308789 | BAND GAP REFERENCE VOLTAGE GENERATOR - A band gap reference voltage generator with low working voltage is disclosed. The band gap reference voltage generator can stably operates that the unexpected balance status does not occur due to the manufacturing process inaccuracy or the offset voltage. The band gap reference voltage generator comprises a thermal voltage generation circuit, a voltage level optimizing circuit and a band gap reference voltage generating circuit. The thermal voltage generating circuit provides a first voltage and a second voltage. The first voltage is for generating a current component increased with temperature rising. The second voltage is for generating a current component decreased with temperature rising. The voltage level optimizing circuit optimizes the voltage level of the second voltage to generate a third voltage. The band gap reference voltage generating circuit generates the reference voltage with a specific voltage level corresponding to the first voltage and the third voltage irrelevant with the temperature. | 12-09-2010 |
Seong-Heon Kim, Yongin-Si KR
Patent application number | Description | Published |
---|---|---|
20090002081 | MEASUREMENT APPARATUS FOR IMPROVING PERFORMANCE OF STANDARD CELL LIBRARY - Disclosed herein is a measurement apparatus for improving performances of standard cells in a standard cell library when verifying performance of the standard cell library through a ring oscillator among various test element groups (TEGs). A built-in circuit is used to measure and verify performance of the standard cell library through a TEG. Therefore, it is possible to effectively improve performances of the standard cells in the standard cell library. Particularly, it is possible to not only remove human errors or internal errors of equipment, but also perform the measurement more readily, rapidly and accurately. Further, it is possible to curtail the use of high-performance equipment or manpower and time required in a measurement process. | 01-01-2009 |
20100169045 | MEASUREMENT APPARATUS FOR IMPROVING PERFORMANCE OF STANDARD CELL LIBRARY - Disclosed herein is a measurement apparatus for improving performances of standard cells in a standard cell library when verifying performance of the standard cell library through a ring oscillator among various test element groups (TEGs). The measurement apparatus includes a ring oscillator block activated in response to an enable signal externally inputted thereto for outputting measurement result values, a decoder for selectively outputting one or more of the measurement result values from the ring oscillator block, and a statistics assistor for receiving output values from the decoder for a predetermined period and outputting a maximum value, a minimum value and an average value of the received values. The ring oscillator block includes a pulse generator for generating a pulse in response to the enable signal, a pulse stable unit for synchronizing the pulse generated by the pulse generator with a system clock pulse, a clock enable unit for outputting the system clock pulse according to a state of the pulse outputted from the pulse stable unit, a counter operating at any one of a rising edge and falling edge of the system clock pulse outputted from the clock enable unit, and a captured data storage unit responsive to the enable signal for receiving an output of the counter and storing a final count value or outputting it to the decoder. | 07-01-2010 |