Patent application number | Description | Published |
20090109071 | SERIAL DATA ANALYSIS IMPROVEMENT - A method for improving performance and flexibility of serial data analysis in test instruments, is independent of data bit rate, encoding scheme or communication protocol embodied in the serial data. The serial data is input to a transmitter section, where it is demultiplexed into a plurality of multi-bit lanes, such as n bits for each of N lanes. The N lanes are then encoded into characters, the encoded N lanes having m bits per lane where m>n. Bit stuffing is used to adjust the data rate and/or to insert qualifiers. The stuffed, encoded N lanes are then multiplexed into N serial lanes, which are output from the transmitter section for input to a receiver section at a data rate that is optimal for the receiver section. In the receiver section the N lanes are deserialized, decoded and input to a word recognizer to generate a trigger event signal. | 04-30-2009 |
20090122852 | EYE VIOLATION AND EXCESS JITTER TRIGGER - An eye violation and excess jitter trigger for a digital signal uses a mask within a unit interval of the digital signal, such as a rectangular mask having corners defined by a high threshold, a low threshold, an early clock and a late clock, the early and late clocks being derived from a reference clock. The reference clock may be a recovered clock derived from the digital signal or from high and low threshold comparator outputs, or may be an external clock. For the excess jitter trigger, which is a special case of the eye violation trigger, the high and low thresholds are essentially equal. A status of the digital signal with respect to the mask is determined using the high and low thresholds and the early and late clocks, and a violation signal is output when the status indicates that a portion of the digital signal crossed into the mask. The violation signal may then be used to trigger data acquisition or for other purposes. | 05-14-2009 |
20100182048 | MULTIFUNCTION WORD RECOGNIZER ELEMENT - A circuit includes a load; a first differential pair coupled to the load and responsive to input data; a second differential pair coupled to the load and responsive to the input data; a third differential pair coupled to the first differential pair and the second differential pair and responsive to a first control signal and a second control signal; a bias circuit configured to pull a node coupled to both the first differential pair and the second differential pair to a predetermined state; and a current source coupled to the third differential pair and the bias circuit. | 07-22-2010 |
20110074389 | Signal Acquisition System Having Probe Cable Termination in a Signal Processing Instrument - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable with the signal cable coupled to a signal processing instrument via an input node. The input node is coupled to an input current amplifier via input circuitry. The input circuitry provides at least one of resistive and capacitive termination of the resistive center conductor signal cable. The termination of the resistive center conductor signal cable in the signal processing instrument provides a signal acquisition system where the capacitive loading of a device under test at higher frequencies is reduced by reducing the input capacitance of the probe tip circuitry resulting in an increase in the signal acquisition system bandwidth. | 03-31-2011 |
20110074390 | Signal Acquisition System Having Reduced Probe Loading of a Device Under Test - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 03-31-2011 |
20110074391 | Signal Acquisition System Having a Compensation Digital Filter - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a compensation digital filter providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 03-31-2011 |
20110074392 | Signal Acquisition System Having Reduced Probe Loading of a Device Under Test - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a shunt pole-zero pair coupled to the input circuitry providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 03-31-2011 |
20110074441 | Low Capacitance Signal Acquisition System - A low capacitance signal acquisition system has a signal acquisition probe having a low capacitance input circuit coupled to a compensation amplifier in a signal processing instrument via a signal cable. The low capacitance input circuit, the signal cable and the signal processing instrument input have mismatched time constants with the compensation amplifier having feedback loop circuitry providing adjustable gain and pole-zero pairs for maintaining flatness over the low capacitance signal acquisition system frequency bandwidth. | 03-31-2011 |
20110148456 | Method and Device for Measuring Inter-chip Signals - A method and device for measuring a signal of a die to be placed within a package is disclosed. At least one die as a Device Under Test (DUT) is mounted on a substrate and a chip-type measurement instrument is mounted on the substrate, or embedded into the substrate, wherein the instrument analyzes and/or processes the signal of the DUT and may provide stimulus signal to the DUT. The substrate having the DUT and the measurement instrument is mounted on a circuit board that has plural electrodes to be connected to the signal paths of the DUT and the instrument. An electrode is coupled to a standard interface port to provide the signal of the chip-type instrument to an external instrument. | 06-23-2011 |
20120194169 | dF/dT TRIGGER SYSTEM AND METHOD - A dF/dT trigger system and method includes instantaneously triggering on a frequency deviation of a data signal, which can be associated with an SSC signal. After receiving a signal at an input terminal of a test and measurement instrument, the signal is low-pass filtered and transmitted to trigger circuitry. When a frequency deviation rate in the filtered signal exceeds or crosses one or more thresholds, a trigger event is produced. Also disclosed is a test and measurement instrument including an input terminal to receive the signal, input circuitry to receive and process the signal, and dF/dT trigger circuitry configured to receive the signal and produce a trigger event when a frequency deviation in the signal exceeds or crosses one or more thresholds. | 08-02-2012 |
20120268140 | Signal Acquisition System Having a Compensation Digital Filter - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a compensation digital filter providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 10-25-2012 |
20120299579 | TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRONOUS TIME-INTERLEAVED DIGITIZER USING HARMONIC MIXING - A test and measurement instrument including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signal; a plurality of harmonic mixers, each harmonic mixer configured to mix an associated split signal of the plurality of split signals with an associated harmonic signal to generate an associated mixed signal; and a plurality of digitizers, each digitizer configured to digitize a mixed signal of an associated harmonic mixer of the plurality of harmonic mixers. A first-order harmonic of at least one harmonic signal associated with the harmonic mixers is different from an effective sample rate of at least one of the digitizers. | 11-29-2012 |
20130022133 | Wideband Balun Structure - A balun structure is disclosed having positive and negative going signal paths coupled to a ninety degree hybrid. The positive signal path has a circuit trace and a phase shaper structure that provides three hundred and sixty degrees of phase shift at Port 1 of the hybrid. The negative going signal path has a circuit trace and a second order phase shaper that provides four hundred and fifty degrees of phase shift at Port 2 of the hybrid. Port 1 is coupled to Port 3 of the hybrid and functions as an output port. The first order phase shaper and the second order phase shaper compensate for the signal loss caused by a signal cable coupled to the output port and provide a frequency band from DC to at least 15 GHz and a transient response having less than ten percent pre-shoot. | 01-24-2013 |
20130134999 | Signal Acquisition System Having Reduced Probe Loading of a Device Under Test - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a shunt pole-zero pair coupled to the input circuitry providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 05-30-2013 |
20130221985 | SIGNAL ACQUISITION SYSTEM HAVING REDUCED PROBE LOADING OF A DEVICE UNDER TEST - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 08-29-2013 |
20130278291 | MULTIFUNCTION WORD RECOGNIZER ELEMENT - A circuit includes a load; a first differential pair coupled to the load and responsive to input data; a second differential pair coupled to the load and responsive to the input data; a third differential pair coupled to the first differential pair and the second differential pair and responsive to a first control signal and a second control signal; a bias circuit configured to pull a node coupled to both the first differential pair and the second differential pair to a predetermined state; and a current source coupled to the third differential pair and the bias circuit. | 10-24-2013 |
20140002292 | ALMOST REAL-TIME SAMPLING FOR GROUND-PENETRATING RADAR IMPULSES | 01-02-2014 |
20140049328 | RING OSCILLATOR TIMER CIRCUIT - A ring oscillator timer circuit can include a plurality of electrical components arranged in a cascaded combination of delay stages connected in a closed loop chain. The timer circuit can begin oscillation a programmable number of gate delays after receiving a start signal. In some examples, the number of gate delays can be programmed to fractional values. In further examples, the ring oscillator timer circuit can include a counter having an input electrically coupled to an output of a reset component. | 02-20-2014 |
20140103951 | AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES - A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid. | 04-17-2014 |
20140354344 | TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRONOUS TIME-INTERLEAVED DIGITIZER USING HARMONIC MIXING - A test and measurement instrument including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signal; a plurality of harmonic mixers, each harmonic mixer configured to mix an associated split signal of the plurality of split signals with an associated harmonic signal to generate an associated mixed signal; and a plurality of digitizers, each digitizer configured to digitize a mixed signal of an associated harmonic mixer of the plurality of harmonic mixers. A first-order harmonic of at least one harmonic signal associated with the harmonic mixers is different from an effective sample rate of at least one of the digitizers. | 12-04-2014 |
20150084656 | TWO PORT VECTOR NETWORK ANALYZER USING DE-EMBED PROBES - A test and measurement system including a device under test, two de-embed probes connected to the device under test, and a test and measurement instrument connected to the two de-embed probes. The test and measurement instrument includes a processor configured to determine the S-parameter set of the device under test based on measurements from the device under test taken by the two de-embed probes. | 03-26-2015 |
20150084660 | TIME-DOMAIN REFLECTOMETER DE-EMBED PROBE - A de-embed probe including an input configured to connect to a device under test, a memory, a signal generator connected to the input, the signal generator configured to generate a test signal, and a controller connected to the signal generator and configured to control the signal generator. The de-embed probe may be used in a test and measurement system. The test and measurement system also includes a test and measurement instrument including a processor connected to the controller of the de-embed probe, the processor configured to provide instructions to the controller, and a test and measurement input to receive an output from the de-embed probe. | 03-26-2015 |