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Steven F. Oakland
COLCHESTER, VT US
1. 20090055696 MICROCONTROLLER FOR LOGIC BUILT-IN SELF TEST (LBIST) 02-26-20092. 20080288841 SYSTEM AND METHODS OF BALANCING SCAN CHAINS AND INSERTING THE BALANCED-LENGTH SCAN CHAINS INTO HIERARCHICALLY DESIGNED INTEGRATED CIRCUITS. 11-20-2008
3. 20080284459 Testing Using Independently Controllable Voltage Islands 11-20-2008
4. 20080256405 COMPILABLE MEMORY STRUCTURE AND TEST METHODOLOGY FOR BOTH ASIC AND FOUNDRY TEST ENVIRONMENTS 10-16-2008