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Tom Waayers
SINT MICHIELSGESTEL, NL
1. 20090077438 CIRCUIT INTERCONNECT TESTING ARRANGEMENT AND APPROACH THEREFOR 03-19-20092. 20090003424 Ic Testing Methods and Apparatus - method is provided for testing an integrated circuit comprising multiple cores with at least two cores having 01-01-2009
3. 20080290878 Ic Testing Methods and Apparatus - testing circuit has a shift register circuit for storing instruction data for the testing of an integrated circuit 11-27-2008
4. 20080288842 Ic Testing Methods and Apparatus - testing circuit has scan chain segments defined between parallel inputs and respective parallel outputs 11-20-2008
5. 20080265906 Ic Testing Methods and Apparatus - method and apparatus for testing an integrated circuit core or circuitry external to an integrated circuit core using 10-30-2008
6. 20080255780 Ic Testing Methods and Apparatus - shift register circuit is provided for storing instruction data for the testing of an integrated circuit core 10-16-2008