Patent application number | Description | Published |
20110220069 | Injector Drive Circuit - The present invention realizes an injector drive circuit capable of providing high output power of a boost convertor while suppressing increases in size and cost thereof. An injector energizing circuit | 09-15-2011 |
20110222202 | Electromagnetic Valve Driving Circuit - Disclosed is an electromagnetic valve driving circuit capable of reducing a load of a booster circuit. | 09-15-2011 |
20110295492 | Internal Combustion Engine Controller - At the time of drop of an injector current of an internal combustion engine controller, the drop is performed quickly while heat generation of a drive circuit is suppressed, and valve closing response speed of the injector is enhanced. The internal combustion engine controller includes a drive circuit which drives an injector current, and a boost circuit which boosts a battery voltage, and includes a peak current path for guiding a boost voltage of the boost circuit to an upstream side of the injector via a boost side switching element and a boost side protection diode, a holding current path for guiding the battery voltage to the upstream side of the injector via a battery side switching element and a battery side protection diode, a ground current path which is connected to a power supply ground from a downstream side of the injector via a downstream side switching element, and a regenerating circuit which allows the boost circuit to regenerate electric energy of the injector from the downstream side of the injector via a current regenerating diode, wherein the regenerating path is provided with a voltage regulating section in series with the current regenerating diode, and the drive circuit controls drive of the switching element. | 12-01-2011 |
Patent application number | Description | Published |
20080277583 | Charged particle beam apparatus - Electrification affected on a surface of a sample which is caused by irradiation of a primary charged particle beam is prevented when plural frames are integrated to obtain an image of a predetermined area of the sample in a charged particle beam apparatus. The predetermined area of the sample is scanned with a primary electron beam from an electron gun, and plural frames are generated and integrated while detecting generated secondary electrons with a detector to obtain the image of the predetermined area. If it is determined by a detection signal of the detector that an electrification amount at the predetermined area becomes a specified value when generating plural frames, an electricity removal voltage is applied to a boosting electrode to remove or reduce the electrification, prior to generation of the next frame. Accordingly, the signal-to-noise ratio of the image obtained by integrating plural frames can be improved. | 11-13-2008 |
20090140143 | CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREFOR - Potentials at a plurality of points on a diameter of a semiconductor wafer | 06-04-2009 |
20090214122 | Image processing apparatus for analysis of pattern matching failure - Information indicating the reason for a failure of template matching is provided. Difference information between a first image, which is referred to as a template, and a third image that is selected by the operator from a second image and that is larger than the template is displayed. | 08-27-2009 |
20090272899 | Method for Detecting Information of an Electric Potential on a Sample and Charged Particle Beam Apparatus - An object of the present invention is to provide a method and apparatus for measuring a potential on a surface of a sample using a charged particle beam while restraining a change in the potential on the sample induced by the charged particle beam application, or detecting a compensation value for a change in a condition for the apparatus caused by the sample being electrically charged. In order to achieve the above object, the present invention provides a method and apparatus for applying a voltage to a sample so that a charged particle beam does not reach the sample (hereinafter, this may be referred to as “mirror state”) in a state in which the charged particle beam is applied toward the sample, and detecting information relating to a potential on the sample using signals obtained by that voltage application. | 11-05-2009 |
20100038535 | Sample dimension measuring method and scanning electron microscope - The present invention suppresses decreases in the volumes of the patterns which have been formed on the surfaces of semiconductor samples or of the like, or performs accurate length measurements, irrespective of such decreases. In an electrically charged particle ray apparatus by which the line widths and other length data of the patterns formed on samples are to be measured by scanning the surface of each sample with electrically charged particle rays and detecting the secondary electrons released from the sample, the scanning line interval of said electrically charged particle rays is set so as not to exceed the irradiation density dictated by the physical characteristics of the sample. Or measured length data is calculated from prestored approximation functions. | 02-18-2010 |
20110057101 | CHARGED PARTICLE BEAM SYSTEM - A charged particle beam system wherein the output of the secondary electron detector is detected while the retarding voltage is varied between the values for which the secondary electrons do not reach the sample and the values for which the secondary electrons reach the sample, and the surface potential of the sample is determined on the basis of the relationship between the retarding voltage and the detected output of the secondary electron detector. | 03-10-2011 |
20110284759 | METHOD FOR ADJUSTING OPTICAL AXIS OF CHARGED PARTICLE RADIATION AND CHARGED PARTICLE RADIATION DEVICE - Provided are a method for adjusting the optical axis of a charged particle beam and a device therefor, wherein an artificial criterion is quantified, and whether or not the adjustment of the axis of a charged particle beam is necessary is judged on the basis of the quantified criterion. In the method for adjusting the optical axis and the device therefor, the conditions for adjusting an optical element for adjusting a charged particle beam are changed; a plurality of images are captured under the changed conditions; images the qualities of which are allowed or images the qualities of which are not allowed are selected from the captured images; a first image quality evaluation value is obtained on the basis of the selected images; the obtained first image quality evaluation value is compared with a second image quality evaluation value obtained from images obtained by scanning an object using the charged particle beam; and the optical axis is adjusted when the second image quality evaluation value is equal to or below the first image quality evaluation value. | 11-24-2011 |
20120119085 | SPECIMEN POTENTIAL MEASURING METHOD, AND CHARGED PARTICLE BEAM DEVICE - The present invention has an object to perform specimen charge measurement or focusing at a high speed and with high precision also for a specimen in which fixed charge and induced charge may be mixedly present. | 05-17-2012 |
Patent application number | Description | Published |
20080255729 | Steering Assist System and Vehicle Mounted with the Same - An object of the present invention is to provide a steering assist system capable of showing a driver an appropriate direction of steering operation in advance and correctly, and without impairing safety, and shortening an operation time during collision avoidance, in particular, reducing an idle running time. It is another object of the present invention to provide a vehicle mounted with such a steering assist system. | 10-16-2008 |
20090195056 | Brake Controller, Brake System Provided with the Same, and Vehicle Provided with the Same Brake System - A brake controller for controlling a plurality of actuators for driving braking members of a plurality of brakes is disclosed, where the controller includes a performance setting unit for setting desired performance required of the brakes; a braking force calculating unit for calculating a desired braking force to be produced by each brake; a drive ratio calculating unit for calculating drive ratios at which the actuators operate to achieve the desired performance and to make the plurality of brakes produce a braking force equal to or nearly equal to the desired braking force; and a drive signal output unit for providing the actuators drive signals corresponding to the drive ratios for the actuators. | 08-06-2009 |
20090236903 | BRAKE CONTROL SYSTEM - A brake control system for a vehicle includes a first controller having a first brake operation quantity sensor and a second controller executing a different control from that of the first controller and having a second operation quantity sensor. The second controller may include a master pressure acquisition unit for acquiring a master pressure and a failure detection unit for detecting a failure of the first controller on the basis of the brake operation quantity detected by the second brake operation quantity sensor and the master pressure acquired by the master pressure acquisition unit. | 09-24-2009 |
20100062897 | Brake Control System - Provided is a brake control apparatus for a vehicle which detects an amount of brake-pedal operation by means of an electric signal, and then calculates a braking force demanded by a driver from the electric signal, and thereby generates the demanded braking force. A control mode for a braking force is switched from a normal control mode to a stationary-vehicle control mode, if a determination that the vehicle is in a stationary state is followed by another determination that an electric signal corresponding to an actual braking force exceeds a command value for a stationary-vehicle braking force while the vehicle is in the stationary state. The control mode for a braking force is switched from the stationary-vehicle control mode to the normal control mode, if it is determined that the demanded braking force becomes smaller than the command value for the stationary-vehicle braking force. In addition, in the stationary-vehicle control mode, a braking force generated by a means for braking is equal to the command value for the stationary-vehicle braking force, whereas, in the normal control mode, the braking force generated by the means for braking is equal to the braking force demanded by the driver. | 03-11-2010 |
20110066345 | Brake System - Fluctuations in a braking force and a deceleration during regenerative cooperative control are suppressed. A brake system includes a master pressure generating device | 03-17-2011 |
20110072841 | Thermodynamic cycle system for moving vehicle - A thermodynamic cycle system for a moving vehicle, including a refrigeration cycle system through which a refrigerant flows, a first heat-transferring system through which a heat-transferring medium flows, the heat-transferring medium being used for adjusting temperatures of heat-liberation components, a second heat-transferring system through which a heat-transferring medium flows, the heat-transferring medium being used for adjusting an indoor air state, an intermediate heat exchanger provided between the refrigeration cycle system and the first heat-transferring system, an intermediate heat exchanger provided between the refrigeration cycle system and the second heat-transferring system, an indoor heat exchanger provided in the first heat-transferring system, and an indoor heat exchanger provided in the second heat-transferring system. | 03-31-2011 |