Masao Takahashi
Masao Takahashi, Kyoto JP
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20090078935 | SEMICONDUCTOR DEVICE - Electrode pads respectively have a probe region permitting probe contact and a non-probe region. In each of the electrode pads arranged zigzag in two or more rows, a lead interconnect for connecting another electrode pad with an internal circuit is not placed directly under the probe region but placed directly under the non-probe region. | 03-26-2009 |
20090200677 | SEMICONDUCTOR DEVICE - A semiconductor device includes at least three or more wiring layers stacked in an interlayer insulating film on a semiconductor substrate, a seal ring provided at the outer periphery of a chip region of the semiconductor substrate and a chip strength reinforcement provided in part of the chip region near the seal ring. The chip strength reinforcement is made of a plurality of dummy wiring structures and each of the plurality of dummy wiring structures is formed to extend across and within two or more of the wiring layers including one or none of the bottommost wiring layer and the topmost wiring layer using a via portion. | 08-13-2009 |
20100148173 | SEMICONDUCTOR DEVICE AND FABRICATION METHOD FOR THE SAME - A semiconductor device includes: a semiconductor element ( | 06-17-2010 |
20110095430 | SEMICONDUCTOR DEVICE - A semiconductor device includes at least three or more wiring layers stacked in an interlayer insulating film on a semiconductor substrate, a seal ring provided at the outer periphery of a chip region of the semiconductor substrate and a chip strength reinforcement provided in part of the chip region near the seal ring. The chip strength reinforcement is made of a plurality of dummy wiring structures and each of the plurality of dummy wiring structures is formed to extend across and within two or more of the wiring layers including one or none of the bottommost wiring layer and the topmost wiring layer using a via portion. | 04-28-2011 |
20110266540 | SEMICONDUCTOR DEVICE - Electrode pads respectively have a probe region permitting probe contact and a non-probe region. In each of the electrode pads arranged zigzag in two or more rows, a lead interconnect for connecting another electrode pad with an internal circuit is not placed directly under the probe region but placed directly under the non-probe region. | 11-03-2011 |
20120080780 | SEM ICONDUCTOR DEVICE HAVING PADS AND WHICH MINIMIZES DEFECTS DUE TO BONDING AND PROBING PROCESSES - A semiconductor device includes: a semiconductor substrate; a first interlayer insulating film formed over the semiconductor substrate; a pad formed above the first interlayer insulating film; and a plurality of first interconnects spaced apart from each other in a portion of the first interlayer insulating film located below the pad. Below the pad, the first interconnects are formed in quadrangular plan shapes. | 04-05-2012 |
20130075727 | SEMICONDUCTOR DEVICE - Electrode pads respectively have a probe region permitting probe contact and a non-probe region. In each of the electrode pads arranged zigzag in two or more rows, a lead interconnect for connecting another electrode pad with an internal circuit is not placed directly under the probe region but placed directly under the non-probe region. | 03-28-2013 |
Masao Takahashi, Fukaya-Shi JP
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20110079880 | SEMICONDUCTOR DEVICE - A serially-connected diode pair made of diodes having a high withstand voltage and a low on-resistance is formed based on a high withstand voltage vertical PNP bipolar transistor process technology. Two of the diode pairs are connected in parallel to form a bridge so that there is formed a high-efficiency full-wave rectifier circuit that is free from a leakage current due to a parasitic transistor. The serially-connected diode pair is formed by connecting a diode composed of a P type semiconductor substrate, that makes an anode, and an N type buried layer, that makes a cathode, and a diode composed of a P+ type conductive layer, that makes an anode, and an N type epitaxial layer, that makes a cathode, in series with an electrode AC | 04-07-2011 |
Masao Takahashi, Fujisawa-Shi JP
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20110049372 | PARTICLE BEAM IRRADIATION APPARATUS AND PARTICLE BEAM IRRADIATION METHOD - The particle beam irradiation apparatus according to the present invention comprises: a beam generation unit; a beam emission control unit which controls emission of the particle beam; a beam scanning indication unit which two-dimensionally indicates a position of the particle beam in series for each of slices obtained by dividing an affected area to be irradiated in an axial direction of the particle beam; a beam scanning unit which two-dimensionally scans the particle beam based on an indication signal from the beam scanning indication unit; a phosphor film which is provided between the beam scanning unit and a patient and emits light in an amount corresponding to a particle dose of the particle beam transmitting therethrough; an imaging unit which images the phosphor film for each slice; and a display unit which obtains an irradiation dose distribution of each slice from image data imaged by the imaging unit and displays the obtained irradiation dose distribution associated with a scanning position of the particle beam. | 03-03-2011 |
Masao Takahashi, Aichi JP
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20110002563 | SLIDING BEARING - A sliding bearing | 01-06-2011 |
Masao Takahashi, Kanagawa JP
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20100109642 | OPTICAL VOLTAGE TRANSFORMER - An optical voltage transformer is connected with an external electric device and includes a primary electrode to which a measured voltage is applied by the external electric device, a first secondary electrode provided oppositely to the primary electrode, an insulation layer provided between the primary and first secondary electrodes and constituting an insulation cylinder integrally formed with the primary and first secondary electrodes, a ground layer provided on an outer circumference of the insulation cylinder and around the first secondary electrode for securing a capacitance by interposing the insulation layer between the ground layer and the first secondary electrode, and an electro-optic element for measuring a voltage between the first secondary electrode and the ground layer. According to the optical voltage transformer, measurement of the measured voltage can be done with high accuracy without affected by its surrounding environment and its downsizing can be achieved by reducing the number of its components. | 05-06-2010 |
20100315621 | PHASE MODULATOR, PHASE MODULATOR ASSEMBLY, AND PHOTOSENSOR - The present invention provides a photosensor that uses a phase modulation technique for optical detection and conducts a highly accurate measurement. The photosensor uses a phase change difference of light propagated through a polarization preserving fiber with respect to tensile stress and employs proper polarization preserving fibers for a phase modulator | 12-16-2010 |
20110234202 | OPTICAL VOLTAGE SENSOR - A polarizing optical system ( | 09-29-2011 |
Masao Takahashi, Osaka JP
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20100313176 | DELAY LIBRARY, DELAY LIBRARY CREATION METHOD, AND DELAY CALCULATION METHOD - A timing window (TW) representing a time zone where a signal transition possibly occurs in a time axis is generated for each of input signals in input terminals in a multi-input logic cell based on a signal transition timing in each of the input terminals. An overlap between the timing windows (TW) of input signals is detected, and a circuit delay time is calculated by selectively using one of a synchronous transition time and an asynchronous transition time in accordance with the overlap between the timing windows (TW). These processing steps are sequentially repeated to eliminate an optimistic or pessimistic analysis in the calculation of delay times in the multi-input logic cell. | 12-09-2010 |
Masao Takahashi, Toyota-Shi JP
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20100247011 | Bearing device - In a bearing device | 09-30-2010 |
Masao Takahashi, Tokyo JP
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20090052039 | OPTICAL DEVICE - An optical device comprises a first optical system, a second optical system, a shading unit, and a diffraction grating. The first optical system transforms incident light to parallel light. The second optical system transforms incident light to parallel light. An optical axis of the second optical system is different from an optical axis of the first optical system. The shading unit has transmission areas having slit forms and shading areas having strip forms. The transmission areas and the shading areas are alternately arranged. The diffraction grating deflects the light transmitted by the transmission areas in a predetermined direction. Part of the incident light through the first optical system passes through the transmission areas, and the rest are shaded by the shading areas. Part of the incident light through the second optical system passes through the transmission areas, and the rest are shaded by the shading areas. | 02-26-2009 |
20090244260 | ENDOSCOPE MEASURING 3-D PROFILE - An endoscope system has a scanner, a projector, and a measurement processor. The scanner is configured to scan light that passes through an optical fiber over a target by directing the light emitted from the distal end of an endoscope. The projector is configured to project a pattern on the target by switching on and off the light during scanning. Then, the measurement processor acquires a three dimensional (3-D) profile of the target on the basis of the shape of the pattern projected on the target. | 10-01-2009 |
20150029570 | OPTICAL SCANNING ENDOSCOPE - An optical scanning endoscope with an optical fiber, and a fiber driving unit with a plurality of actuators which bend side surfaces of the optical fiber by applying a pressing force. A mounting member is a substantially cylindrical MID component which supports the fiber driving unit. A control circuit supplies driving signals to each of the actuators to control the bending amount and direction of the optical fiber. A wiring member electrically connects wiring patterns on the mounting member with the control circuit. The mounting member has a planar surface section at one proximal-end-surface side of the cylindrical outer-peripheral surface. The wiring patterns include at least first patterns having one end portion disposed on the planar surface section to form soldering lands The other end portions are electrically connected to the actuators on the proximal-end surface of the mounting member. The wiring member is connected to the soldering lands. | 01-29-2015 |
Masao Takahashi, Saitama JP
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20090206376 | SEMICONDUCTOR DEVICE - A conventional semiconductor device has a problem that, when a vertical PNP transistor as a power semiconductor element is used in a saturation region, a leakage current into a substrate is generated. In a semiconductor device of the present invention, two P type diffusion layers as a collector region are formed around an N type diffusion layer as a base region. One of the P type diffusion layers is formed to have a lower impurity concentration and a narrower diffusion width than the other P type diffusion layer. In this structure, when a vertical PNP transistor is turned on, a region where the former P type diffusion layer is formed mainly serves as a parasite current path. Thus, a parasitic transistor constituted of a substrate, an N type buried layer and a P type buried layer is prevented from turning on, and a leakage current into the substrate is prevented. | 08-20-2009 |
Masao Takahashi, Kanagawa-Ken JP
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20110141478 | SAGNAC INTERFEROMETER-TYPE FIBER-OPTIC CURRENT SENSOR - In one embodiment, a Sagnac interferometer-type fiber-optic sensor includes a synchronous detection circuit to carry out synchronous detection of detected light signal with a phase modulation angular frequency of a phase modulator. A signal processing circuit calculates and outputs the magnitude of current to be measured using the signal detected in the synchronous detection circuit. A phase modulator driving circuit controls the driving of the phase modulator. The phase modulator driving circuit controls a phase modulation depth of the phase modulator so that the amplitude of the second-order harmonics and the fourth-order harmonics obtained by carrying out the synchronous detection of the detected light signal with the phase modulation angular frequency becomes the same. | 06-16-2011 |
20140061434 | SOLID-STATE IMAGING DEVICE - In an embodiment, each of first and second pixel rows has pixels. A first transfer gate is arranged between the first and second pixel rows. Second transfer gates are arranged adjacently to odd-numbered pixels of the second pixel row, respectively. Third transfer gates are arranged adjacently to even-numbered pixels of the second pixel row, respectively. A first CCD register is arranged adjacently to the second transfer gates and third transfer gates. Fourth transfer gates are arranged adjacently to odd-numbered accumulation gates of the first CCD register. A second CCD register is arranged adjacently to the fourth transfer gates. An output portion converts transferred charges into a voltage signal. A clear gate controls draining of the charges accumulated in the first pixel row to a first drain portion. A switch gate controls draining of charges transferred in a row direction in the second CCD register to a second drain portion. | 03-06-2014 |
20140347671 | SAGNAC INTERFEROMETER-TYPE FIBER-OPTIC CURRENT SENSOR - In one embodiment, a Sagnac interferometer-type fiber-optic sensor includes a synchronous detection circuit to carry out synchronous detection of detected light signal with a phase modulation angular frequency of a phase modulator. A signal processing circuit calculates and outputs the magnitude of current to be measured using the signal detected in the synchronous detection circuit. A phase modulator driving circuit controls the driving of the phase modulator. The phase modulator driving circuit controls a phase modulation depth of the phase modulator so that the amplitude of the second-order harmonics and the fourth-order harmonics obtained by carrying out the synchronous detection of the detected light signal with the phase modulation angular frequency becomes the same. | 11-27-2014 |
Masao Takahashi, Hachioji-Shi JP
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20130285954 | OPERATION DISPLAY APPARATUS, OPERATION DISPLAY METHOD AND TANGIBLE COMPUTER-READABLE RECORDING MEDIUM - Disclosed in an operation display apparatus including: a display unit; a touch panel to detect a touch position on which a display face of the display unit is touched; and a control unit to control display contents of the display unit and to switch a specific area provided in a part of the display face, between an operable state in which display of information and a detection of a touch action for the touch panel are operated and a non-operable state in which the display and the detection are not operated, wherein the control unit sets a part of the specific area, which is arranged in a boundary with another operation display apparatus disposed with the operation display apparatus side by side, to the operable state. | 10-31-2013 |
Masao Takahashi, Fuchu-Shi JP
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20150193109 | OBJECT STOP POSITION CONTROL METHOD, ACTION INDICATING DEVICE, AND PROGRAM - An object stop position control method includes: when a movement instruction as to an object displayed on a display unit is received by a first operation method, moving the object in accordance with the movement instruction, stopping the movement of the object based on the movement instruction when the object moves past a predetermined stop position, and causing the object to automatically stop at the stop position; and, when the movement instruction is received by a second operation method, not causing the object to automatically stop, but moving the object in accordance with the movement instruction. | 07-09-2015 |
20150193110 | OBJECT STOP POSITION CONTROL METHOD, OPERATION DISPLAY DEVICE AND NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM - Disclosed is an object stop position control method, including: moving an object displayed on a display unit in accordance with a movement instruction for moving the object, in case that the movement instruction is received from a user; and stopping a movement of the object, which is carried out in accordance with the movement instruction, to stop the object at a predetermined stop position, in case that it is judged that the object passes the predetermined stop position in the movement of the object. | 07-09-2015 |