Patent application number | Description | Published |
20150097931 | CALIBRATION OF 3D SCANNING DEVICE - Various examples related to calibration of a scanning device are disclosed. In one example, among others, a system includes a calibration pattern, a sensing device, and a calibration control system to control positioning of the calibration pattern with respect to the sensing device. Tracking sensors of the sensing device capture images of the calibration pattern during calibration of the sensing device. In another example, a method includes determining an estimated pose of the scanning device using an image of a calibration pattern, determining an error between a projected location of an artifact of the calibration pattern and an actual location of the artifact, and adjusting a tracking parameter using the error. In another example, a method includes determining an association between a pixel of an image sensor of a scanning device and a point in scanner space using pixel information corresponding to light reflected by an illuminated calibration pattern. | 04-09-2015 |
20150097968 | INTEGRATED CALIBRATION CRADLE - Various examples related to calibration of a scanning device are disclosed. In one example, among others, a calibration cradle includes a calibration pattern positioned within the calibration cradle and recesses to support a scanning device in a fixed position relative to the calibration pattern. In another example, a method includes positioning a scanning device in a calibration cradle, obtaining an image of a calibration pattern with a tracking sensor of the scanning device, determining an estimated pose of the scanning device, and determining an error associated with the calibration pattern using the estimated pose. In another example, a method includes capturing an image of a cone mirror a probe of a scanning device, determining a centroid of the cone mirror image, and determining an error associated with the cone mirror using the centroid. | 04-09-2015 |
Patent application number | Description | Published |
20100332429 | SYSTEM AND METHOD FOR OPTIMIZING A SEQUENTIAL ARRANGEMENT OF ITEMS - A system optimizing a sequence according to an algorithm includes: an initiator; a tracker; a generator; a measurer; a regulator; and an output. The initiator provides initial sequences to the tracker. The tracker stores and effects a statistical treatment of the initial sequences. The generator employs the statistical treatment to present a new sequence. The measurer evaluates the new sequence according to the algorithm. The measurer provides the new sequence to the tracker when the evaluating indicates so, and provides the new sequence and a quality indicator to the regulator. The regulator employs the indicator to store at least a best-sequence-yet-received, and responds to a criterion to order the generator to present a new sequence or to present the best-sequence-yet-received at the output. | 12-30-2010 |
20140025610 | BENCHMARKING PROGRESSIVE SYSTEMS FOR SOLVING COMBINATORIAL PROBLEMS - A system is provided for benchmarking a progressive combinatorial solver. The system may initialize a parametric model collector, and perform a plurality of parametric trials associated with respective numbers of sub-part iterations of the progressive combinatorial solver. For each of the plurality of parametric trials, the system may initialize a statistical data collector. The system may perform a plurality of randomized executions of the progressive combinatorial solver, and add data including metric values for respective solutions of the executions to the statistical data collector. The system may then determine statistical parameter(s) of data in the statistical data collector, and add data including an indication of the respective number of sub-part iterations, a cost of finding the metric values for the respective solutions, and the statistical parameters of the trial to the parametric data collector. And the system may determine a best-fit model from data in the parametric data collector. | 01-23-2014 |
20140379401 | BENCHMARKING PROGRESSIVE SYSTEMS FOR SOLVING COMBINATORIAL PROBLEMS - A system is provided for benchmarking a progressive combinatorial solver. The system may initialize a parametric model collector, and perform a plurality of parametric trials associated with respective numbers of sub-part iterations of the progressive combinatorial solver. For each of the plurality of parametric trials, the system may initialize a statistical data collector. The system may perform a plurality of randomized executions of the progressive combinatorial solver, and add data including metric values for respective solutions of the executions to the statistical data collector. The system may then determine statistical parameter(s) of data in the statistical data collector, and add data including an indication of the respective number of sub-part iterations, a cost of finding the metric values for the respective solutions, and the statistical parameters of the trial to the parametric data collector. And the system may determine a best-fit model from data in the parametric data collector. | 12-25-2014 |