Patent application number | Description | Published |
20110214843 | Systems and Methods for Thermal Control of Integrated Circuits During Testing - Thermal control units (TCU) for maintaining a set point temperature on an IC device under test (DUT) are provided. The units include a pedestal assembly comprising a heat-conductive pedestal, a fluid circulation block, a thermoelectric module (Peltier device) between the heat-conductive pedestal and the block for controlling heat flow between the pedestal and fluid circulation block, and a force distribution block for controllably distributing a z-axis force between different pushers of the TCU. Alternatively, instead of a thermoelectric module, a heater can provide heat to the DUT. Optionally, a swivelable temperature-control fluid inlet and outlet arms may be provided to reduce instability of the thermal control unit due to external forces exerted on the TCU such as by fluid lines attached to the fluid inlet and outlet arms. Also optionally, an integrated means for abating condensation on surfaces of the TCU during cold tests may be provided. | 09-08-2011 |
20130021049 | Systems and Methods for Conforming Device Testers to Integrated Circuit Device Profiles - A device tester for an IC device under test (DUT), the DUT having a substrate and an attached die. The device tester includes a thermal control unit and a test socket assembly which conforms to the DUT's profile. The thermal control unit includes a pedestal assembly, a heater having a fuse coupled to a heating element, a substrate pusher, and a force distributor for distributing force between the pedestal assembly and the substrate pusher. The test socket assembly includes a socket insert that supports and also conforms to the DUT's profile. | 01-24-2013 |
20130271170 | Systems and Methods for Conforming Device Testers to Integrated Circuit Device Profiles with Feedback Temperature Control - An integrated circuit (IC) device tester maintains a set point temperature on an IC device under test (DUT) having a die attached to a substrate. The tester includes a thermal control unit and a fluid management system configured to supply the thermal control unit with fluids for pneumatic actuation, cooling, and condensation abating. The tester can includes a box enclosing the thermal control unit thereby providing a substantially isolated dry environment during low humidity testing of the DUT. The heat exchange plate may include an inner structure for thermal conductivity enhancement. | 10-17-2013 |
20140015556 | SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCUIT DEVICE PROFILES WITH COMPLIANT PEDESTALS - A test socket assembly, useful in association with a thermal control unit used to maintain a set point temperature on an IC device under test, has at least one compliant pedestal is configured to facilitate the testing of integrated circuits where the device under test comprises a substrate having multiple IC chips with different heights and testing requirements. | 01-16-2014 |
20140021972 | SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCUIT DEVICE PROFILES WITH SOCKETS HAVING SECURED AND REPLACEABLE BUSHINGS - A test socket assembly, useful in association with a thermal control unit (TCU) used to maintain a set point temperature on an IC device under test, has alignment holes with bushings that are secured within the alignment holes by using retaining pins. The retaining pins can be easily screwed in and out of the socket. This provision allows the bushings to be replaced easily as they get worn out or deformed from repeated testing. | 01-23-2014 |
20140055154 | SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCUIT DEVICE PROFILES WITH EJECTION MECHANISMS - A test pusher assembly, useful in association with a thermal control unit used to maintain a set point temperature on an integrated circuit device under test, is provided with ejection mechanisms configured to facilitate the disengagement of the DUT at the end of the test. One example of the ejection mechanisms is to provide the substrate pusher assembly with spring-loaded pins that can push the substrate of the DUT away from the pedestal at the end of the test. Another example of the ejection mechanisms is to use a pressurized fluid that can push the substrate of the DUT away from the pedestal at the end of the test. | 02-27-2014 |
20140232426 | SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCUIT DEVICE PROFILES WITH CONVEX SUPPORT STRUCTURE - A convex testing stack useful in association with a thermal control unit (TCU) that may be used to maintain a set point temperature for testing of a convex IC device under test (DUT) is configured to preserve the convex shape of the DUT. | 08-21-2014 |
20150022226 | SYSTEMS AND METHODS FOR CONFORMING TEST TOOLING TO INTEGRATED CIRCUIT DEVICE PROFILES WITH COAXIAL SOCKET - A coaxial socket useful in association with an integrated circuit (IC) device tester and having a conducting pin surrounded by an insulating layer and embedded in a conducting base. This coaxial pin configuration allows for good thermal conductivity and better electrical signal transmission specially for testing high-speed integrated circuits. | 01-22-2015 |
20150109009 | Systems and Methods for Conforming Device Testers to Integrated Circuit Device With Pressure Relief Valve - The present invention relates to systems and methods for preventing over pressurization in a fluid management system used in an integrated circuit (IC) device tester. The prevention of the over pressurization in the fluid management system is based on the use of a pressure relief valve coupled to the fluid management system. | 04-23-2015 |
Patent application number | Description | Published |
20080224032 | Micromachined field asymmetric ion mobility filter and detection system - A micromechanical field asymmetric ion mobility filter for a detection system includes a pair of spaced substrates defining between them a flow path between a sample inlet and an outlet; an ion filter disposed in the path and including a pair of spaced filter electrodes, one electrode associated with each substrate; and an electrical controller for applying a bias voltage and an asymmetric periodic voltage across the ion filter electrodes for controlling the paths of ions through the filter. | 09-18-2008 |
20090189064 | ULTRA COMPACT ION MOBILITY BASED ANALYZER APPARATUS, METHOD, AND SYSTEM - An ultra compact ion mobility based analyzer in a multilayered chip assembly employing various features such as a ion flow generator to propel ions through an ion mobility based filter and, thereby, reduce analyzer size, cost, and power requirements. | 07-30-2009 |
20100282961 | Differential mobility spectrometer pre-filter assembly for a mass spectrometer - A pre-filter assembly including a differential mobility spectrometer (DMS) that is configured to be in-line with a mass spectrometer (MS) such that the MS continuously receives carrier flow from the DMS when the DMS filtering fields are removed. | 11-11-2010 |
20110042561 | METHODS AND APPARATUS FOR ENHANCED ION BASED SAMPLE DETECTION USING SELECTIVE PRE-SEPARATION AND AMPLIFICATON - The invention relates generally to ion mobility based systems, methods and devices for analyzing samples and, more particularly, to sample pre-separation and amplification. | 02-24-2011 |
20110101214 | COUPLING DIFFERENTIAL MOBILITY BASED AMBIENT PRESSURE ION PREFILTERING AND ION FOCUSING AT LOW FLOW RATES FOR A PORTABLE MASS SPECTROMETER - A sample analysis apparatus and system including an ion inlet, an ion detector and an ion focusing assembly for converging a plurality of ion streams from the ion inlet into at least one focused ion stream. | 05-05-2011 |
20110133076 | TANDEM DIFFERENTIAL MOBILITY SPECTROMETERS AND MASS SPECTROMETER FOR ENHANCED ANALYSIS - The invention relates generally to systems, methods and devices for analyzing samples and, more particularly, to systems using a differential mobility spectrometer in combination with a mass analyzer to enhance the analysis process of constituents of a sample. | 06-09-2011 |
20120025070 | METHOD AND APPARATUS FOR ENHANCED ION MOBILITY BASED SAMPLE ANALYSIS USING VARIOUS ANALYZER CONFIGURATIONS - A ion mobility-based analyzer system including a first ion mobility-based filter for passing selected ions through a time-varying field where the time-varying field being compensated by an adjustable compensation setting. The analyzer also includes a second ion mobility-based filter for receiving a first portion of ions from the first ion mobility-based filter. The second ion mobility-based filter includes a voltage gradient for separating ions of the first portion of ions where the ions have associated retention times based on their times of flight through the voltage gradient. The second ion mobility-based filter includes a detector for detecting the ions at their retention times. The analyzer system further includes a display that displays the detected ions in a plot relating the retention times of the ions in the second ion mobility-based filter with compensation settings of the first ion mobility-based filter. | 02-02-2012 |
20120160997 | Non-radioactive ion sources with ion flow control - An ion-based analyzer including a non-radioactive ion source, an ion generation chamber for generating ions, a sample ionization chamber and a controller for employing ion flow control, an ion-based filter, and a detector for analyzing a sample. | 06-28-2012 |
Patent application number | Description | Published |
20100279112 | SILK FIBROIN MATERIALS AND USE THEREOF - The present invention provides processes for producing porous silk fibroin scaffold material. The porous silk fibroin scaffold can be used for tissue engineering. The porosity of the silk fibroin scaffolds described herein can be adjusted as to mimic the gradient of densities found in natural tissue. Accordingly, methods for engineering of 3-dimensional tissue, e.g. bone and cartilage, using the silk fibroin scaffold material are also provided. | 11-04-2010 |
20130158131 | SILK FIBROIN MATERIALS AND USE THEREOF - The present invention provides processes for producing porous silk fibroin scaffold material. The porous silk fibroin scaffold can be used for tissue engineering. The porosity of the silk fibroin scaffolds described herein can be adjusted as to mimic the gradient of densities found in natural tissue. Accordingly, methods for engineering of 3-dimensional tissue, e.g. bone and cartilage, using the silk fibroin scaffold material are also provided. | 06-20-2013 |
20140094410 | SILK FIBROIN MATERIALS AND USE THEREOF - The present invention provides processes for producing porous silk fibroin scaffold material. The porous silk fibroin scaffold can be used for tissue engineering. The porosity of the silk fibroin scaffolds described herein can be adjusted as to mimic the gradient of densities found in natural tissue. Accordingly, methods for engineering of 3-dimensional tissue, e.g. bone and cartilage, using the silk fibroin scaffold material are also provided. | 04-03-2014 |