Antonio A.
Antonio A. Do Bento Vieira, Carrollton, TX US
Patent application number | Description | Published |
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20100297841 | Method for providing a redistribution metal layer in an integrated circuit - A system and method is disclosed for providing a redistribution metal layer in an integrated circuit. The redistribution metal layer is formed from the last metal layer in the integrated circuit during manufacture of the integrated circuit before final passivation is applied. The last metal layer provides sites for solder bump pads used in flip chip interconnection. The redistribution metal layer can be (1) a flat layer deposited over the next to last metal layer through an opening in a dielectric layer, or (2) deposited over an array of vias connected to the next to last metal layer. Space between the solder bump pads is deposited with narrower traces for connecting active circuit areas below. A final passivation layer is deposited to ensure product reliability. | 11-25-2010 |
Antonio A. Garcia, Chandler, CA US
Patent application number | Description | Published |
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20090078326 | LIGHT-DRIVEN MICROFLUIDIC DEVICES AND AMPLIFICATION OF STIMULUS-INDUCED WETTING - Disclosed are compositions and methods for producing movement of liquid across surfaces. | 03-26-2009 |
Antonio A. Gellineau, Stanford, CA US
Patent application number | Description | Published |
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20140130213 | INTERFEROMETRIC ATOMIC-FORCE MICROSCOPY DEVICE AND METHOD - A high-bandwidth AFM probe having a diffraction grating characterized by a diffraction characteristic that monotonically changes along the length of the diffraction grating is disclosed. AFM probes in accordance with the present invention are capable of high-sensitivity performance over a broad range of operating conditions, such as operating wavelength and measurement media. A method for estimating at least one physical property of a surface based on high-frequency signal components in the output signal from a high-bandwidth AFM probe is also disclosed. The method enables determination of tip-surface interaction forces based on the relationship between a first motion of the base of the AFM probe and a second motion of the tip of the AFM probe. | 05-08-2014 |
20140130214 | MONOLITHIC INTERFEROMETRIC ATOMIC FORCE MICROSCOPY DEVICE - A fiber-facet AFM probe enabling high-resolution, high sensitivity measurement of a sample surface is presented. AFM probes in accordance with the present invention include an optically resonant cavity that is defined by two mirrors, at least one of which is a photonic-crystal mirror. One of the mirrors is movable and is mechanically coupled with an AFM tip such that a force imparted on the tip by an interaction with the sample surface induces a change in the cavity length of the optically resonant cavity and, therefore, its reflectivity. | 05-08-2014 |