Horai
Hiroshi Horai, Tokyo JP
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20100171048 | ION IMPLANTING APPARATUS - In an ion implanting apparatus | 07-08-2010 |
Hiroshi Horai, Yokkaichi JP
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20140091672 | METHOD OF MANUFACTURING STATOR CORE AND THE STATOR CORE - A method of manufacturing a stator core includes die-cutting iron core materials from a band-shaped magnetic steel sheet, each iron core material being formed into an annular shape and having m number of interconnecting lugs protruding radially outward from an annular outer circumference of the magnetic steel sheet when m is equal to or larger than 2, and stacking a number of the iron core materials. In the die-cutting, parts of the magnetic steel sheet to be die-cut as the iron core material are arranged in n number of rows in a widthwise direction of the magnetic steel sheet when n is an integer equal to or larger than 2. Each one of the iron core materials included in one of n number of rows is located between the iron core materials lengthwise adjacent to each other in the row next to the one row. | 04-03-2014 |
Izuo Horai, Odawara JP
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20090009753 | INSPECTION METHOD AND INSPECTION DEVICE - An inspection method and an inspection device, or apparatus each capable of conducting composition analysis of a defect detected by elastic or stokes scattered light, an inspection surface or defect on the surface of the inspection surface, or a defect on the surface of the inspection object and its internal composition. A surface inspection method for optically detecting elastic or stokes scattering or inelastic or anti-stokes scattered light from inside the surface of the inspection object, for detecting existence of defects of the inspection object and features of the defects, for detecting positions of the detected defects on the surface of the inspection object, classifying and analyzing the detected defects in accordance with their features on the basis of the positions of the defects and the features of the defects or the classification result of the defects. | 01-08-2009 |
20100271626 | INSPECTION METHOD AND INSPECTION DEVICE - An inspection method and an inspection device, or apparatus each capable of conducting composition analysis of a defect detected by elastic or stokes scattered light, an inspection surface or defect on the surface of the inspection surface, or a defect on the surface of the inspection object and its internal composition. A surface inspection method for optically detecting elastic or stokes scattering or inelastic or anti-stokes scattered light from inside the surface of the inspection object, for detecting existence of defects of the inspection object and features of the defects, for detecting positions of the detected defects on the surface of the inspection object, classifying and analyzing the detected defects in accordance with their features on the basis of the positions of the defects and the features of the defects or the classification result of the defects. | 10-28-2010 |
20130010281 | INSPECTION METHOD AND INSPECTION DEVICE - An inspection method and an inspection device, or apparatus each capable of conducting composition analysis of a defect detected by elastic or stokes scattered light, an inspection surface or defect on the surface of the inspection surface, or a defect on the surface of the inspection object and its internal composition. A surface inspection method for optically detecting elastic or stokes scattering or inelastic or anti-stokes scattered light from inside the surface of the inspection object, for detecting existence of defects of the inspection object and features of the defects, for detecting positions of the detected defects on the surface of the inspection object, classifying and analyzing the detected defects in accordance with their features on the basis of the positions of the defects and the features of the defects or the classification result of the defects. | 01-10-2013 |
Izuo Horai, Adawara JP
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20120176493 | INSPECTION APPARATUS AND INSPECTION METHOD - Disclosed are an inspection apparatus and an inspection method capable of stably acquiring image data of a wafer having a high contrast at alignment marks and the peripheral portions even when a film is formed on a surface of the wafer. Specifically disclosed is a flaw inspecting apparatus which comprises an alignment measuring device including a light source serving as an illuminating light, an imaging optical system that emits light beams from the light source to an object and that collects and focuses the reflected light beams, a camera that is disposed on a converging point in the imaging optical system and that captures images of the object, and an image processing function that processes the captured images. The images are captured using the reflected light beams in at least two different spectral bands, and image information of the object corresponding to the reflected light beams is appropriately computed so that the contrast of alignment marks is increased. | 07-12-2012 |
Masako Horai, Matsumoto-Shi JP
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20080216684 | Printing control apparatus and printing apparatus - In an aspect, a first ink amount relating to the yellow ink is smaller than both a second ink amount relating to the cyan ink and a third ink amount relating to the magenta ink. | 09-11-2008 |
Yukio Horai, Tokyo JP
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20100105738 | EXTENDED RELEASE FORMULATIONS OF A PROTON PUMP INHIBITOR - The invention provides extended release formulations of proton pump inhibitor, such as an extended release formulation of rabeprazole, comprising an amount of rabeprazole between 30 and 90 mg rabeprazole and having an AUC of between 900 and 1750 ng*hr/mL and other properties. | 04-29-2010 |