Patent application number | Description | Published |
20130249616 | SWITCHING ARRANGEMENT, INTEGRATED CIRCUIT COMPRISING SAME, METHOD OF CONTROLLING A SWITCHING ARRANGEMENT, AND RELATED COMPUTER PRORAM PRODUCT - There is disclosed a switching arrangement comprising a switch with a plurality of individually controllable elementary switches connected in parallel between a first supply rail and a second supply rail. Each of the elementary switches can be in either one of a closed state and an open state independently of the others. A controller is adapted to dynamically control the closing or opening of the elementary switches, depending on the intensity of a current flowing through the switch. The number of elementary switches in the closed state is variable. The higher is the intensity of the current, the higher the number of elementary switches in the closed state. Thus, the impedance of the switch decreases when the current increases, and vice versa, and the voltage drop across the switch may be kept substantially constant. | 09-26-2013 |
20130308409 | INTEGRATED CIRCUIT DEVICE, POWER MANAGEMENT MODULE AND METHOD FOR PROVIDING POWER MANAGEMENT - An integrated circuit device comprising at least one memory module comprising a plurality of memory sub-modules, and at least one power management module arranged to provide power management for the at least one memory module. The at least one power management module is arranged to determine when content of at least one memory sub-module is redundant, and place the at least one memory sub-module into a powered-down state upon determining that content of the at least one memory sub-module is redundant. | 11-21-2013 |
20140002160 | INTEGRATED CIRCUIT AND METHOD FOR REDUCING AN IMPACT OF ELECTRICAL STRESS IN AN INTEGRATED CIRCUIT | 01-02-2014 |
20140021557 | APPARATUS FOR FORWARD WELL BIAS IN A SEMICONDUCTOR INTEGRATED CIRCUIT - There is provided a semiconductor Integrated Circuit device having forward well biasing, in which at least one protection device is connected between a supply voltage and a forward well bias voltage. | 01-23-2014 |
20140032139 | ELECTRONIC DEVICE AND METHOD - An electronic device comprises one or more functional units, each functional unit being clocked by a respective clock signal. The electronic device further comprises a monitoring unit for providing a real-time estimate of an electrical current consumed by the functional units. The monitoring unit provides the real-time estimate on the basis of characteristic signals. The characteristic signals may comprise one or more of said clock signals, or one or more clock generating signals used to generate said clock signals. The electronic device may further comprise a power regulator responsive to the real-time estimate. A method of estimating in real-time an electrical current consumed by one or more functional units is also described. | 01-30-2014 |
20140077598 | VOLTAGE REGULATING CIRCUIT AND METHOD - A voltage regulating circuit is provided for regulating an output voltage in order to minimize an absolute difference between a level of said output voltage and a reference level. The voltage regulating circuit comprises a voltage regulator and a reference level generator. The reference level generator generates an internal reference level on the basis of said output voltage level and said reference level such that said internal reference level does not exceed said output voltage level by more than a maximum allowed increment. The voltage regulator regulates said output voltage in order to minimize an absolute difference between said output voltage level and said internal reference level. A method of regulating an output voltage is also disclosed. | 03-20-2014 |
20140097884 | INTEGRATED CIRCUIT DEVICE AND METHOD OF IMPLEMENTING POWER GATING WITHIN AN INTEGRATED CIRCUIT DEVICE - An integrated circuit device comprises at least one power gating arrangement, including at least one gated power domain and at least one power gating component operably coupled between at least one node of the at least one gated power domain and at least a first power supply node. The at least one power gating component is arranged to selectively couple the at least one node of the at least one gated power domain to the at least first power supply node. | 04-10-2014 |
20140115358 | INTEGRATED CIRCUIT DEVICE AND METHOD FOR CONTROLLING AN OPERATING MODE OF AN ON-DIE MEMORY - An integrated circuit device comprising at least one instruction processing module, at least one memory comprising at least one memory bank configurable to operate in a first functional mode and at least one further, lower-power mode, and at least one memory mode control module arranged to control switching of the at least one memory bank between the first functional mode and the at least one further, lower-power modes. | 04-24-2014 |
20140155027 | ELECTRONIC DEVICE AND A COMPUTER PROGRAM PRODUCT - An electronic device comprises a secured module arranged to store secured data. A component outside the secured module has a normal operating mode with a normal mode operating voltage. An interface is arranged to provide access to the secured module. A voltage monitoring unit is connected to the component and arranged to monitor an operating voltage Vsup of the component. An interface control unit is connected to the voltage monitoring unit and the interface. The interface control unit is arranged to inhibit access to the secured module through the interface when the operating voltage is below a predetermined secure access voltage level, the secure access voltage being higher than the normal mode operating voltage. | 06-05-2014 |
20140176220 | INTEGRATED CIRCUIT DEVICE, VOLTAGE REGULATOR MODULE AND METHOD FOR COMPENSATING A VOLTAGE SIGNAL - An integrated circuit device comprising at least one voltage supply module arranged to receive at an input thereof at least one control signal and to provide at an output thereof a voltage signal in accordance with the received at least one control signal, and at least one control module comprising at least one feedback loop between the output of the at least one voltage supply module and the input of the at least one voltage supply module, and arranged to generate the at least one control signal based at least partly on the voltage level of the voltage signal output by the at least one voltage supply module. The at least one control module is further arranged to receive at an input thereof at least one instantaneous indication of a load current at the output of the at least one voltage supply module, and apply a compensation to the at least one control signal provided to the at least one voltage supply module based at least partly on the received at least one indication of the load current. | 06-26-2014 |
20140253204 | CLOCK SIGNAL GENERATOR MODULE, INTEGRATED CIRCUIT, ELECTRONIC DEVICE AND METHOD THEREFOR - A clock signal generator module arranged to generate at least one clock signal for at least one functional module is described. The clock signal generator module comprises a first clock source component associated with at least one functional module, at least one further clock source component associated with the at least one functional module, and at least one management unit arranged to controllably enable signal generation by the first and at least one further clock source components in accordance with at least one operating characteristic of the at least one functional module associated therewith. | 09-11-2014 |
20140303804 | METHOD OF CONTROLLING A THERMAL BUDGET OF AN INTEGRATED CIRCUIT DEVICE, AN INTEGRATED CIRCUIT, A THERMAL CONTROL MODULE AND AN ELECTRONIC DEVICE THEREFOR - A method of controlling a thermal budget of an integrated circuit device is described. The method comprises obtaining a first junction temperature measurement value for the integrated circuit device at a first time instant, and a further junction temperature measurement value for the integrated circuit device at a further time instant. The method further comprises calculating a prospective junction temperature value for the integrated circuit device at a future time instant based at least partly on the first and further junction temperature measurement values; and configuring an operating condition of the integrated circuit device based at least partly on the calculated prospective junction temperature value. | 10-09-2014 |
20140325183 | INTEGRATED CIRCUIT DEVICE, ASYMMETRIC MULTI-CORE PROCESSING MODULE, ELECTRONIC DEVICE AND METHOD OF MANAGING EXECUTION OF COMPUTER PROGRAM CODE THEREFOR - An asymmetric multi-core processing module is described. The asymmetric multi-core processing module comprises at least one processing core of a first type, at least one processing core of at least one further type, and at least one core identifier configuration component. The at least one core identifier configuration component is arranged to enable dynamic configuration of a value of a core identifier of at least one of the processing cores of the first and at least one further types. | 10-30-2014 |
20140351781 | METHOD FOR PLACING OPERATIONAL CELLS IN A SEMICONDUCTOR DEVICE - There is provided a method of placing a plurality of operational cells of a semiconductor device within a semiconductor layout, comprising determining timing data for each of the plurality of operational cells, determining switching activity from RTL or design constraints for each of the plurality of operational cells, determining power grid switch locations relative to each of the plurality of operational cells, deriving a cost function based upon the determined timing data, determined switching activity from RTL/design constraints and determined relative power grid switch locations and initially placing the plurality of operational cells according to the derived cost function. | 11-27-2014 |
20150015240 | METHOD OF DETECTING IRREGULAR CURRENT FLOW IN AN INTEGRATED CIRCUIT DEVICE AND APPARATUS THEREFOR - A method of detecting irregular high current flow within an integrated circuit (IC) device is described. The method comprises obtaining infrared (IR) emission information for the IC device, identifying at least one functional component within the IC device comprising a high current flow, based at least partly on the obtained IR emission information, obtaining IR emission information for at least one reference component within the IC device, and determining whether the high current flow of the at least one functional component comprises an irregular high current flow based at least partly on a comparison of respective IR emission information for the at least one functional component and the at least one reference component. | 01-15-2015 |
20150084417 | ELECTRONIC DEVICE AND METHOD FOR OPERATING A POWER SWITCH - An electronic device comprising a first power switch connectable or connected between a first voltage source and a load is proposed. The first power switch assumes a conductive state in response to a power-on request and a non-conductive state in response to a power-off request, for energizing and deenergizing the load, so that a voltage across the first power switch tends to a positive high level when the first power switch is in the non-conductive state and to a positive low level when the first power switch is in the conductive state. The device further comprises a second power switch connectable or connected between a second voltage source and the load. The second power switch assumes a conductive state in response to the power-on request and a non-conductive state when the voltage across the first power switch is below a defined switch-off threshold lower than the high level. The second voltage source thus assists the first voltage source in powering up the load. A method of operating the electronic device is also described. | 03-26-2015 |
20150091607 | SEQUENTIAL LOGIC CIRCUIT AND METHOD OF PROVIDING SETUP TIMING VIOLATION TOLERANCE THEREFOR - A sequential logic circuit comprising a first latch component comprising a data input arranged to receive an input signal, a data output arranged to output a current logical state of the first latch component and a clock input arranged to receive a clock signal; the first latch component being arranged to comprise a transparent state upon the clock signal received thereby comprising a first logical state, and to comprise a latched state upon the clock signal received thereby comprising a second logical state, and a second latch component comprising a data input arranged to receive an input signal, a data output operably coupled to an output of the sequential logic circuit and arranged to output a current state of the second latch component and a clock input arranged to receive a clock signal; the second latch component being arranged to comprise a transparent state upon the clock signal received thereby comprising a second logical state, and to comprise a latched state upon the clock signal received thereby comprising a first logical state. The sequential logic circuit is arranged to operate in at least a first operating mode in which the data input of the first latch component and the data input of the second latch component are operably coupled to a first input of the sequential logic circuit, and in which the clock signals provided to the first and second latch components are such that a transition of the second latch component from a transparent state to a latched state is delayed relative to a corresponding transition of the first latch component from a transparent state to a latched state for a time period for receiving late data. | 04-02-2015 |
20150095525 | INTEGRATED CIRCUIT COMPRISING AN IO BUFFER DRIVER AND METHOD THEREFOR - An integrated circuit for bias stress condition removal comprising at least one input/output (IO) buffer driver circuit comprising at least one input signal is described. A primary buffer driver stage receives the at least one input signal and providing an output signal in a first time period; and a secondary buffer driver stage receives the at least one input signal and providing an output signal in a second time period. The primary buffer driver stage and the secondary buffer driver stage cooperate and an operational mode of the primary buffer driver stage and an operational mode of the secondary buffer driver stage is varied to produce a varying output signal. | 04-02-2015 |
20150098540 | CLOCK DISTRIBUTION MODULE, SYNCHRONOUS DIGITAL SYSTEM AND METHOD THEREFOR - A clock distribution module for a digital synchronous system is described. The clock distribution module comprising a first node arranged to comprise a clock signal comprising a propagation delay relative to a reference clock signal, at least one further node arranged to comprise a clock signal comprising a propagation delay relative to the reference clock signal corresponding to that of the first node, and a clock configuration module. The clock configuration module is arranged to receive at least one indication of clock skew between the first node and at least one further node of the clock distribution module, and to selectively couple the first node to the at least one further node based at least partly on the at least one indication of clock skew there between. | 04-09-2015 |
20150145556 | IO DRIVER IMPEDANCE CALIBRATION - An IO driver for an integrated circuit and a method for calibrating such an IO driver are provided. The IO driver comprises a plurality of IO driver cells, a plurality of IO partial driver cells and an external resistor. The IO driver cells control IO operations for a corresponding plurality of data channels of the integrated circuit. The IO partial driver cells are coupled to respective cells of the plurality of IO driver cells. The external resistor provides a reference impedance. The reference partial driver cell is coupled to the external resistor and is arranged to determine the reference impedance and to provide information depending on the reference impedance to the IO partial driver cells. The IO partial driver cells are arranged to calibrate the respective IO driver cells based on the provided information. | 05-28-2015 |
20150162818 | SYSTEM ON A CHIP, APPARATUS AND METHOD FOR VOLTAGE RIPPLE REDUCTION ON A POWER SUPPLY LINE OF AN INTEGRATED CIRCUIT DEVICE OPERABLE IN AT LEAST TWO MODES - An apparatus for voltage ripple reduction on a power supply line of an integrated circuit device is provided to be operable in at least two modes. The apparatus includes: one or more clamping devices connectable to the power supply line; a clamp control unit; and a mode change detection unit arranged to monitor an interface of the integrated circuit device for one or more information indicating an upcoming mode change of the integrated circuit device and to provide a mode change signal to the clamp control unit when the one or more information is detected. The clamp control unit is arranged to connect at least one of the one or more clamping devices to the power supply line when receiving the mode change signal. | 06-11-2015 |
20150180475 | INPUT/OUTPUT DRIVER CIRCUIT, INTEGRATED CIRCUIT AND METHOD THEREFOR - An input/output (IO) driver circuit is described. The IO buffer driver circuit comprises: at least one input for receiving an input signal and at least one output for providing at least one output signal; and a plurality of switches arranged to provide a variable voltage level between a low voltage value and a high voltage value to the at least one output. The at least one first switch of the plurality of switches is arranged to initiate a voltage change to an intermediate voltage level between the low voltage value and the high voltage value in a first time period. The at least one second switch of the plurality of switches is arranged to continue the voltage change to the low voltage value or the high voltage value in a second time period. | 06-25-2015 |
20150199468 | METHOD AND APPARATUS FOR SELECTING DATA PATH ELEMENTS FOR CLONING - A method and apparatus for selecting data path elements for cloning within an integrated circuit (IC) design is described. The method comprises performing timing analysis of at least one data path within the IC design to determine at least one timing slack value for the at least one data path, calculating at least one annotated delay value for cloning a candidate element within the at least one data path, calculating at least one modified slack value for the at least one data path in accordance with the at least one calculated annotated delay value, and validating the cloning of the candidate element based at least partly on the at least one modified slack value. | 07-16-2015 |
20150204917 | System and method for on-die voltage difference measurement on a pass device, and integrated circuit - A system for on-die voltage difference measurement on a pass device comprises a first voltage controlled oscillator circuit having a first voltage control input connectable to a first terminal of the pass device; a second voltage controlled oscillator circuit having a second voltage control input connectable to a second terminal of the pass device; a first counter circuit arranged to count oscillation periods of a first output signal from the first voltage controlled oscillator circuit and to provide a stop signal when a predefined number of the oscillation periods of the first output signal is counted; and a second counter circuit arranged to count oscillation periods of a second output signal from the second voltage controlled oscillator circuit and to stop counting depending on the stop signal. | 07-23-2015 |
20150206559 | REGISTER FILE MODULE AND METHOD THEREFOR - A register file module comprising at least one register array comprising a plurality of latch devices is described. The plurality of latch devices is arranged to individually provide memory bit-cells when the register file module is configured to operate in a first, functional operating mode, and at least one clock control component is arranged to receive a clock signal and to propagate the clock signal to the latch devices within the at least one register array. The register file module is configurable to operate in a second, scan mode in which the latch devices within the at least one register array are arranged into at least one scan chain. The at least one clock control component is arranged to propagate the clock signal to the latch devices within the at least one register array such that alternate latch devices within the at least one scan chain receive an inverted form of the clock signal. | 07-23-2015 |
20150242544 | METHOD OF SIMULATING A SEMICONDUCTOR INTEGRATED CIRCUIT, COMPUTER PROGRAM PRODUCT, AND DEVICE FOR SIMULATING A SEMICONDUCTOR INTEGRATED CIRCUIT - A There is proposed a method and device for simulating a semiconductor IC is provided, which comprises generating a high level description of the IC, generating a low level description of the IC comprising a plurality of instances describing the operation of the IC, conducting a low level function analysis of the IC based on metrics values associated with the instances, and performing a design optimization scheme. The scheme comprises mapping the metric values of instances describing functional units different from standard cells, to standard cells logically connected to said instances, by dividing each of the instance metrics values between a group of standard cells logically connected to the corresponding instance and adding each resulting portion of said instance metric value to the metric value of each of the group of standard cells, respectively. | 08-27-2015 |
20150247899 | SCAN TEST SYSTEM - A method generates scan patterns for testing an electronic device called DUT having a scan path. A scan tester is arranged for executing a scan shift mode and a capture mode. A scan test interface has a clock control unit for stretching a shift cycle of the scan clock in dependence of a scan clock pattern. The method determines at least one power shift cycle which is expected to cause a voltage drop of a supply voltage exceeding a predetermined threshold during respective shift cycles of the scan shift mode, and generates, in addition to the scan pattern, a scan clock pattern indicative of stretching the power shift cycle. Advantageously, a relatively high scan shift frequency may be used while avoiding detrimental effects of said voltage drop by extending the respective power shift cycle, whereby test time and yield loss are reduced. | 09-03-2015 |
20150248924 | METHOD AND APPARATUS FOR MAINTAINING AN ACCURATE I/O CALIBRATION CELL - An integrated circuit includes an input/output “I/O” cell arranged to drive an output signal and an activity analysis unit arranged to generate an activity factor based on the output signal. The activity factor represents a switching activity intensity of the I/O cell. The switching activity intensity is associated with an ageing effect of the I/O cell. The circuit further includes a calibration unit arranged to generate a switching pattern signal based on the generated activity factor and an I/O calibration cell arranged to be driven by the switching pattern signal, wherein the switching pattern signal emulates the ageing effect of the I/O cell. | 09-03-2015 |
20150270259 | INTEGRATED CIRCUIT, INTEGRATED CIRCUIT PACKAGE AND METHOD OF PROVIDING PROTECTION AGAINST AN ELECTROSTATIC DISCHARGE EVENT - An integrated circuit comprising a power supply node, a ground node and a gated domain coupled between the power node and the ground node. A Charged Device Model electrostatic discharge protection module is provided for shunting electrical energy of a CDM ESD event away from the gated domain. A gating switch makes an electrical connection in a connected state between the gated domain and at least one of the power node and the ground node. ESD gating control circuitry is coupled to the CDM ESD protection module and controls shunting of energy away from the gated domain by the CDM ESD protection module, thereby avoiding the energy flowing through the gated domain. The ESD gating control circuitry inhibits actuation of the CDM ESD protection module to prevent response to CDM ESD events when the gating domain is powered-up. | 09-24-2015 |
20150276869 | METHOD AND APPARATUS FOR AT-SPEED SCAN SHIFT FREQUENCY TEST OPTIMIZATION - There is provided an integrated circuit comprising at least one logic path, comprising a plurality of sequential logic elements operably coupled into a scan chain to form at least one scan chain under test, at least one IR drop sensor operably coupled to the integrated circuit power supply, operable to output a first logic state when a sensed supply voltage is below a first predefined value and to output a second logic state when the sensed supply voltage is above the first predefined value, at least one memory buffer operably coupled to a scan test data load-in input and a scan test data output of the at least one scan chain under test, and control logic operable to gate logic activity including the scan shift operation inside the integrated circuit for a single cycle when the at least one IR drop sensor outputs the first logic state and to allow normal scan test flow when the at least one IR drop sensor outputs the second logic state. There is also provided an associated method of performing at-speed scan testing of an integrated circuit. | 10-01-2015 |
20150276870 | METHOD AND APPARATUS FOR PERFORMING STATE RETENTION FOR AT LEAST ONE FUNCTIONAL BLOCK WITHIN AN IC DEVICE - A method of performing state retention, for example during power gating, for at least one functional block within an integrated circuit device. The method comprises enabling at least one scan chain within the at least one functional block, scanning out a set of scan chain values from the at least one scan chain, a subset of the set of scan chain values comprising validation values, and writing the set of scan chain values to at least one memory element. The method further comprises retrieving the set of scan chain values from the at least one memory element, and validating the validation values within the retrieved set of scan chain values. | 10-01-2015 |
20150301828 | PROCESSOR CORE ARRANGEMENT, COMPUTING SYSTEM AND METHODS FOR DESIGNING AND OPERATING A PROCESSOR CORE ARRANGEMENT - The invention relates to a method of designing a processor core arrangement which comprises a first processor core for operation at a first operation frequency and having an associated first leakage and a second processor core for operation at a second operation frequency lower than the first operation frequency and having an associated second leakage lower than the first leakage. The processor core arrangement is capable of switching from the first processor core to the second processor core and vice versa. | 10-22-2015 |
20150310152 | METHOD AND APPARATUS FOR CALCULATING DELAY TIMING VALUES FOR AN INTEGRATED CIRCUIT DESIGN - A method of calculating at least one delay timing value for at least one setup timing stage within an integrated circuit design includes applying Negative/Positive Bias Temperature Instability (N/PBTI) compensation margins to delay values for elements within the at least one setup timing stage, and calculating the at least one delay timing value for the at least one setup timing stage based at least partly on the N/PBTI compensated delay values. The method further includes identifying at least partially equivalent elements within parallel timing paths of the at least one setup timing stage, and applying reduced N/PBTI compensation margins to delay values for the identified at least partially equivalent elements within parallel timing paths of the at least one setup timing stage. | 10-29-2015 |
20150316952 | CLOCK SOURCE, METHOD FOR DISTRIBUTING A CLOCK SIGNAL AND INTEGRATED CIRCUIT - The present invention provides a clock source for an integrated circuit, comprising a primary oscillator adapted to generate a primary clock signal based on a reference control signal, at least one secondary oscillator each secondary oscillator being adapted to generate a secondary clock signal based on the reference control signal, wherein for each secondary oscillator a frequency correction unit is provided and adapted to adjust the reference control signal for the associated secondary oscillator based on the primary clock signal and the secondary clock signal of the associated secondary oscillator such that the clock frequency of the secondary clock signal of the associated secondary oscillator essentially equals the clock frequency of the primary clock signal. The present invention furthermore provides a method for providing a clock signal, and an integrated circuit. | 11-05-2015 |
20150324287 | A METHOD AND APPARATUS FOR USING A CPU CACHE MEMORY FOR NON-CPU RELATED TASKS - There is provided a processor for use in a computing system, said processor including at least one Central Processing Unit (CPU), a cache memory coupled to the at least one CPU, and a control unit coupled to the cache memory and arranged to obscure the existing data in the CPU cache memory, and assign control of the CPU cache memory to at least one other entity within the computing system. There is also provided a method of using a CPU cache memory for non-CPU related tasks in a computing system. | 11-12-2015 |
20150331047 | A METHOD AND APPARATUS FOR SCAN CHAIN DATA MANAGEMENT - Processing logic circuit for use in a computing system has State Retention Power Gating logic circuit including at least two scan chains having different lengths and operable to collect state information about at least a portion of the processing logic circuit before the at least a portion of the processing logic circuit is placed from a first state into a second, different, state. The processing logic circuit includes a memory operable to store collected state information about the at least a portion of the processing logic circuit, and logic circuit operable to rearrange the collected state information data for scan chains shorter than a longest scan chain within the at least a portion of the processing logic circuit, to enable valid return of the collected state information data, for the scan chains shorter than a longest scan chain, to the at least a portion of the processing logic circuit when the at least a portion of the processing logic circuit returns to the first state. | 11-19-2015 |
20150333754 | METHOD AND CONTROL DEVICE FOR RECOVERING NBTI/PBTI RELATED PARAMETER DEGRADATION IN MOSFET DEVICES - The invention provides a method for recovering NBTI/PBTI related parameter degradation in MOSFET devices. The method includes operating the at least one MOSFET device in a standby mode, exiting the at least one MOSFET device from the standby mode, holding the at least one MOSFET device in an active state for a predetermined time span after exiting the standby mode, and operating the at least one MOSFET device in an operational mode after the predetermined time span has elapsed. | 11-19-2015 |
20150338460 | METHOD AND CONTROL DEVICE FOR LAUNCH-OFF-SHIFT AT-SPEED SCAN TESTING - The invention provides a method for launch-off-shift at-speed scan testing for at least two scan chains of an integrated circuit comprises iteratively shifting set values for functional elements of a first one of the scan chains clocked with a shift clock, iteratively shifting set values for functional elements of a second one of the scan chains clocked with the shift clock, launching an at-speed scan test clocked with a functional clock for the first one of the scan chains at a last shift cycle of the first one of the scan chains, delaying the last shift cycle for the second one of the scan chains for a predetermined time span, launching an at-speed scan test clocked with a functional clock for the second one of the scan chains at the last shift cycle of the second one of the scan chains, capturing the sample values of the functional elements of the first and second scan chains after the last shift cycle of the scan chains. | 11-26-2015 |
20150338464 | METHOD AND APPARATUS FOR SAMPLING A SIGNAL - There is provided a method, apparatus and integrated circuit for measuring a signal, the apparatus comprising a plurality of sample stages arranged in series, each sample stage comprising a delay element, and a sample element, wherein an input of the sample element is coupled to an output of the delay element, and a strobe line for controlling a sample time of the sample elements, the strobe line comprising a plurality of strobe delay elements arranged in series, wherein an output of each strobe delay element is coupled to one or more sample elements. | 11-26-2015 |
20150339413 | METHOD AND APPARATUS FOR PERFORMING LOGIC SYNTHESIS - A method of performing logic synthesis of at least a part of an integrated circuit design. The method comprises identifying a first and at least one further module within the IC design that are mutually exclusive, selecting at least one register element within the first identified module and at least one register element within the at least one further identified module to be shared, and merging the first and at least one further mutually exclusive modules such that at least one common register element is shared between the first and at least one further mutually exclusive modules for the register elements selected to be shared. | 11-26-2015 |
20150346277 | ELECTRONIC DEVICE AND METHOD FOR STATE RETENTION - An electronic device includes a set of two or more scan chains and a buffer chain. Each of the scan chains includes a sequence of stateful elements connected in series, and each of the scan chains is arranged to hold a string having a length identical to the length of the ( | 12-03-2015 |
20150347653 | METHOD AND APPARATUS FOR CALCULATING DELAY TIMING VALUES FOR AN INTEGRATED CIRCUIT DESIGN - A method and apparatus for calculating delay timing values for at least a part of an integrated circuit design. The method comprises applying a first Negative/Positive Bias Temperature Instability compensation margin to delay values for elements within the at least part of the IC design, identifying at least one lower-rate switching element within the at least part of the IC design, and applying at least one further, increased N/PBTI compensation margin to the delay value(s) for the at least one identified lower-rate switching element. | 12-03-2015 |
20150348514 | A METHOD AND APPARATUS FOR ADAPTIVE GRAPHICS COMPRESSION AND DISPLAY BUFFER SWITCHING - There is provided a multimedia computing apparatus for processing and displaying video data with overlay graphic data, said multimedia computing apparatus comprising a compression unit arranged to compress graphic overlay data prior to storage of said compressed overlay graphic data in a compressed display buffer, and a control unit arranged to determine when to compress the overlay graphic data dependent upon a refresh parameter of the overlay graphic data. There is also provided a method of adaptively compressing graphics data in a multimedia computing system comprising dynamically controlling compression of graphic overlay data in a display buffer dependent upon a refresh parameter of the graphic overlay data. | 12-03-2015 |