Takahaski
Rikiya Takahaski, Tokyo JP
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20130179380 | PREDICTION METHOD, PREDICTION SYSTEM AND PROGRAM - A method for predicting an output variable from explanatory values provided as sets of combinations of discrete variables and continuous variables includes receiving input data that contains the explanatory variables to predict the output variable; searching for each element in the combinations for elements in a plurality of sets with matching discrete variables using training data which the output variable has been observed; applying a function giving the degree of similarity between two sets weighed by a scale variable to each element in the input data, and to one or more elements found in the elements of the input data to calculate function values, and calculating the sum of the function values for all of the elements in the input data; and applying the calculated sum for each element to a prediction equation for predicting the output variable to calculate a prediction value of the output variable for each element. | 07-11-2013 |
Takeshi Takahaski, Osaka JP
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20110192161 | Engine - An engine ( | 08-11-2011 |
Yoshikazu Takahaski, Kanagawa JP
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20100201390 | PROBE CARD, METHOD FOR MANUFACTURING PROBE CARD, AND PROBER APPARATUS - Embodiments of the present invention provide a probe card in which the positional shift of the tip of a probe can be compensated for in response to a change in the temperature, and a wafer test in a wide range of temperatures can be performed. More specifically, the probe card includes a substrate, a probe composed of a first metallic material having a first thermal expansion coefficient, a base of the probe being joined to the substrate, a tip of the probe coming into contact with a connection terminal of an electronic device, and a thermal compensation member composed of a second metallic material having a second thermal expansion coefficient that is higher than the first thermal expansion coefficient, a base of the thermal compensation member being fixed to the substrate, a tip of the thermal compensation member coming into contact with the probe at an intermediate portion between the base of the probe and the tip of the probe. | 08-12-2010 |