Fulwood
Clayton Fulwood, Austin, TX US
Patent application number | Description | Published |
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20130193537 | SYSTEM AND METHOD FOR DETECTING PARTICLES WITH A SEMICONDUCTOR DEVICE - Systems and methods are described herein for detecting particles emitted by nuclear material. The systems comprise one or more semiconductor devices for detecting particles emitted from nuclear material. The semiconductor devices can comprise a charge storage element comprising several layers. A non-conductive charge storage layer enveloped on top and bottom by dielectric layers is mounted on a substrate. At least one top semiconductor layer can be placed on top of the top dielectric layer. A reactive material that reacts to particles, such as neutrons emitted from nuclear material, can be incorporated into the top semiconductor layer. When the reactive material reacts to a particle emitted from nuclear material, ions are generated that can alter the charge storage layer and enable detection of the particle. | 08-01-2013 |
John L. Fulwood, Stockton, NJ US
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20090140460 | Hinged pointer pottery sizing guide - In embodiments of the present invention improved capabilities are described for reproducing the size of a first ceramic ware in the making of a second ceramic ware. In embodiments, the first ceramic ware may be received on a pottery wheel. A hinged pointer may then be presented to a position on the first ceramic ware, where the hinged pointer may include a pointer connected to a supporting structure by way of a hinge. The first ceramic ware may then be removed from the pottery wheel, and material for the making of the second ceramic ware may be placed on the pottery wheel. The process of making the second ceramic ware may then progress, where the making includes sizing the second ceramic ware to the position of the hinged pointer. | 06-04-2009 |
John Louis Fulwood, Stockton, NJ US
Patent application number | Description | Published |
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20110031639 | Hinged pointer pottery sizing guide - In embodiments of the present invention improved capabilities are described for reproducing the size of a first ceramic ware in the making of a second ceramic ware. In embodiments, the first ceramic ware may be received on a pottery wheel. A hinged pointer may then be presented to a position on the first ceramic ware, where the hinged pointer may include a pointer connected to a supporting structure by way of a hinge. The first ceramic ware may then be removed from the pottery wheel, and material for the making of the second ceramic ware may be placed on the pottery wheel. The process of making the second ceramic ware may then progress, where the making includes sizing the second ceramic ware to the position of the hinged pointer. | 02-10-2011 |
Lionel Fulwood, St. George, UT US
Patent application number | Description | Published |
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20100193674 | Lamp system producing uniform high intensity ultraviolet light for exposure of photolithographic and other light polymerizable materials - A lamp exposure system producing uniform, high intensity ultraviolet light includes a plurality of lamps generating light in an ultraviolet spectrum range, a separate reflector associated with and covering each of the plurality of lamps, forming distinct lamp and reflector pairs, such that each lamp reflector pair has a generally separate reflective light path to a surface of a substrate, at least one capacitor connected to each lamp to store energy to energize the lamp, and a triggering and control circuit to trigger the at least one capacitor connected to each lamp independently, such that each lamp can be controlled separately with respect to illumination time and intensity. A method for exposing substrates to ultraviolet light, and a method for calibrating the lamp exposure system are also disclosed. | 08-05-2010 |
20100195083 | Automatic substrate transport system - An automatic substrate transport system having adjustable mechanisms to guide and float substrates on a film of air along a sloped path, permits smooth movement with significantly reduced contact and abrasion damage to imaged surfaces on the substrates. This allows for the transportation of any substrates including those coated with somewhat tacky coatings, thus reducing machine downtime associated with clearing line blockages, as well as transport mechanism cleaning. | 08-05-2010 |