Masaaki Ito
Masaaki Ito, Ohtake-Shi JP
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20100261926 | SURFACE-MODIFIED NANODIAMOND AND ITS PRODUCING METHOD - A surface-modified nanodiamond includes a base nanodiamond, and at least one polyglycerol-chain-containing group present on at least a surface portion of the base nanodiamond, in which the polyglycerol-chain-containing group is represented by following Formula (1): | 10-14-2010 |
Masaaki Ito, Mie JP
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20100168323 | PROPYLENE-BASED POLYMER AND METHOD FOR PRODUCING THE SAME, AND PROPYLENE-BASED RESIN COMPOSITION - A propylene-based polymer comprising the following component (A) insoluble in p-xylene at 25° C. and component (B) soluble in p-xylene at 25° C., wherein (i) the weight average molecular weight (Mw) measured with GPC is 100,000 to 1,000,000, (ii) the content of the component insoluble in hot p-xylene is 0.3% by weight or lower, and (iii) the degree of strain hardening (λ max) in measurement of elongational viscosity is 2.0 or higher; and a method for producing the same, along with a resin composition comprising a propylene-ethylene copolymer (Z) in an amount of 50.0 to 99.9% by weight and a propylene-based polymer (M) in an amount of 0.1 to 50.0% by weight. | 07-01-2010 |
20100227987 | PROPYLENE-BASED POLYMER, PRODUCTION METHOD THEREFOR, COMPOSITION USING THE SAME, AND APPLICATION THEREOF - A propylene-based polymer which is suitably applicable to foam molding, sheet molding, blow molding or the like, because of having good flow characteristics, high melt tension, high swell ratio and thus good molding workability. | 09-09-2010 |
Masaaki Ito, Hitachinaka-Shi JP
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20100106443 | Defect Inspection Apparatus and Defect Inspection Method - A defect inspection apparatus includes: stages each mounting an inspecting object on which a circuit pattern having a group of parallel lines is formed, and each running perpendicular or parallel to the group of lines; an illumination optical system which illuminating a surface of the inspecting object with a slit beam being slit light so that a longitudinal direction of the slit beam is substantially perpendicular to the running directions of the stages, and which has a first inclined angle formed by the direction of the group of lines and a projection line, of an optical axis of the slit beam, to the inspecting object; a spatial filter that shields or transmits reflected and scattered light of the inspecting object according to a difference in distribution of orientation; and a detection optical system that detects the reflected and scattered light transmitted through the spatial filter by image sensors. Moreover, the illumination optical system illuminates the inspecting object with another slit beam from a direction opposite to an incident direction of the slit beam on a plane. | 04-29-2010 |
Masaaki Ito, Tokyo JP
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20090161943 | INSPECTION APPARATUS AND INSPECTION METHOD - The invention is directed to find a false defect from defect candidates and obtain a threshold with which the false defect can be eliminated by the smallest number of review times. Defect candidates are reviewed and selected as a defect or a false defect. By deleting a defect candidate having a characteristic quantity equal to or less than that of the false defect from a map or displaying it in another sign, the false defect can be determined visually. Since the defect candidate having the characteristic quantity equal to or less than that of the selected false defect is deleted from the map or displayed in another sign, the defect candidates unnecessary to set a threshold are not reviewed. The number of defect candidates to be reviewed can be largely reduced as compared with that in the conventional technique. Further, by repeating the above work, the threshold is automatically calculated, and an inspection result map with the threshold is displayed, so that a re-inspection is unnecessary. | 06-25-2009 |
20090247251 | Game device and program - A game device for performing a game in which, when a first-choice display object is freely chosen via a pointing operation undertaken by a player from among a large number of display objects, a second-choice object is then required to be determined as a correct choice, comprises determining means for determining whether or not the display object of interest has been chosen on the basis of the position coordinates from input means and a choice determination range and correcting means for performing, when the correct second-choice object has been determined, correction processing for changing the size of a choice determination range for the display object of interest used for the determination processing so that the choice determination range for a correct choice display object becomes relatively larger than the choice determination range for an incorrect choice display object. | 10-01-2009 |
20130100446 | INSPECTION APPARATUS AND INSPECTION METHOD - The invention is directed to find a false defect from defect candidates and obtain a threshold with which the false defect can be eliminated by the smallest number of review times. Defect candidates are reviewed and selected as a defect or a false defect. By deleting a defect candidate having a characteristic quantity equal to or less than that of the false defect from a map or displaying it in another sign, the false defect can be determined visually. Since the defect candidate having the characteristic quantity equal to or less than that of the selected false defect is deleted from the map or displayed in another sign, the defect candidates unnecessary to set a threshold are not reviewed. The number of defect candidates to be reviewed can be largely reduced as compared with that in the conventional technique. Further, by repeating the above work, the threshold is automatically calculated, and an inspection result map with the threshold is displayed, so that a re-inspection is unnecessary. | 04-25-2013 |
20140198321 | SURFACE SHAPE MEASURING APPARATUS - In related art, consideration is not given to that a spatial distribution of scattered light changes in various direction such as forward/backward/sideways according to a difference in micro roughness. Particularly, although a step-terrace structure appearing on an epitaxial growth wafer produces anisotropy in the scattered light distribution, consideration is not given to this point in the related art. The invention includes a process in which light is illuminated to a sample surface, plural detection optical systems mutually different in directions of optical axes detect a spatial distribution of scattered light, and a spatial frequency spectrum of the sample surface is calculated. | 07-17-2014 |
20140375988 | SURFACE MEASUREMENT DEVICE - In conventional technologies in surface measurement and defect inspection, considerations are not made for the following points: (1) coarseness of resolution of spatial frequency; (2) variation of detection signal resulting from anisotropy of microroughness; and (3) variation of background signal resulting from anisotropy of microroughness. The present invention is characterized by acquiring a feature quantity about the anisotropy of the microroughness of the substrate surface. Further, the present invention is characterized by acquiring a surface state in consideration of the anisotropy of the microroughness of the substrate surface. Further the present invention is characterized by detecting a defect over the substrate in consideration of the anisotropy of the microroughness of the substrate surface. | 12-25-2014 |
20150109435 | INSPECTION APPARATUS - When a size of a block on a wafer is equal to or smaller than an optical resolution of imaging optics, room for improvement in a signal-to-noise ratio has not been sufficiently considered in a conventional technique. One feature of the defect determination of the present invention is to include a filter processing for setting a predetermined partial area serving as a predetermined matrix for a first difference image, scanning the first difference image in the partial area, and outputting a second difference image, and a first threshold processing using a first threshold value for the second difference image. As a result, highly sensitive defect detection can be achieved. | 04-23-2015 |
20150131087 | INSPECTION SYSTEM - To improve sensitivity of a defect inspection, it is required to decrease influence of excessive diffraction from a spatial filter. Further, it is preferable to secure signal intensity from defects and particles as much as possible, while the influence of the excessive diffraction is decreased as much as possible. The present invention is characterized in setting a width of a spatial filter surface such that an unnecessary image caused by diffraction, that is, an intensity of the excessive diffraction is sufficiently small with respect to an intensity of a desired image. In the present invention, an SN ratio that is an index for deciding a width of the spatial filter is calculated from a region subjected to the influence of the excessive diffraction in an inspection image, and a width of a shield unit of the spatial filter is set so as to maximize the SN ratio. | 05-14-2015 |
Masaaki Ito, Hitachinaka JP
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20090202138 | INSPECTION APPARATUS - The present invention provides an inspection apparatus having a high throughput and high sensitivity with respect to a number of various manufacturing processes and defects of interest in inspection of a specimen such as a semiconductor wafer on which a pattern is formed. The apparatus illuminates with light the specimen having the pattern formed thereon, forms an image of the specimen on an image sensor through a reflective optics, and determines the existence/nonexistence of a defect. The reflective optics has a conjugate pair of Fourier transform optics. An aberration of the reflective optics is corrected off-axis. The reflective optics has a field of view in non-straight-line slit form on the specimen surface. Also, the optics is of a reflection type, includes a conjugate pair of Fourier transform optics and has a field of view in non-straight-line slit form. An optimum wavelength band is selected according to the specimen (FIG. | 08-13-2009 |
20110141272 | APPARATUS AND METHOD FOR INSPECTING AN OBJECT SURFACE DEFECT - Disclosed is an apparatus having a light source of a deep ultraviolet ray for detecting a small foreign matter or pattern defect, which may arise during a process for manufacturing a semiconductor device or the like, in high resolution. The apparatus comprises a means for detecting a damage on an optical system due to a wavelength reduction thereby to save a damaged portion, and a means for comparing an optical system arrangement with that at the manufacturing time and detecting the abnormality thereof, to thereby make a correction, so that the apparatus can inspect the defect on an object substrate stably at a high speed and in high sensitivity. Also disclosed is a method for the stable inspection. The apparatus is provided, in the optical path of the optical system, with a means for detecting the intensity and the convergent state of an illumination light, and a means for detecting the abnormality of the optics system and for saving an abnormal portion from alignment with an optical axis. The apparatus is constituted such that the optical system is adjusted to make corrections for the optical conditions at the manufacturing time, thereby to elongate the lifetime of the optical system in the inspecting apparatus and to detect the small defect stably. | 06-16-2011 |
20110221886 | PATTERN DEFECT INSPECTING APPARATUS AND METHOD - In recent years, a wafer inspection time in semiconductor manufacturing processes is being required to be reduced for reduction in manufacturing time and for early detection of yield reduction factors. To meet this requirement, there is a need to reduce the time required for inspection parameter setup, as well as the time actually required for inspection. Based on the speed or position change information relating to a transport system | 09-15-2011 |
20120327415 | DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD - The present invention provides a defect inspection apparatus having high sensitivity and high throughput capabilities in defect inspection of a sample on which a pattern is formed, such as a semiconductor wafer. | 12-27-2012 |
20130250297 | INSPECTION APPARATUS AND INSPECTION SYSTEM - Disclosed here is a macro inspection apparatus for a sample such as a semiconductor wafer having a pattern formed thereon, the apparatus being capable of detecting abnormalities in dimension and size with high sensitivity. | 09-26-2013 |
20130286191 | INSPECTION APPARATUS - In a defect inspecting apparatus, the strength of a fatal defect signal decreases due to miniaturization. Thus, in order to assure a high SN ratio, it is necessary to reduce noises caused by scattered light from a wafer. Roughness of a pattern edge and surface roughness which serve as a scattered-light source are spread over the entire wafer. The present invention has discovered the fact that reduction of an illuminated area is a technique effective for decreasing noises. That is to say, the present invention has discovered the fact that creation of an illuminated area having a spot shape and reduction of the dimension of a spot beam are effective. A plurality of temporally and spatially divided spot beams are radiated to the wafer serving as a sample. | 10-31-2013 |
20140002810 | INSPECTION APPARATUS | 01-02-2014 |
Masaaki Ito, Kyoto-Shi JP
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20090155881 | CELL-FREE PROTEIN SYNTHESIS METHOD AND CELL-FREE PROTEIN SYNTHESIS REACTION SOLUTION USING ADENOSINE 3',5'-BISPHOSPHATE - The present invention provides a method of conducting cell-free protein synthesis by conveniently suppressing mRNA degradation, and a reaction solution enabling cell-free protein synthesis by conveniently suppressing mRNA degradation. A cell-free protein synthesis method using a cell-free protein synthesis reaction solution containing at least an extract liquid derived from a living cell, a potassium salt, a magnesium salt, adenosine triphosphate, guanosine triphosphate, creatine phosphate, creatine kinase, amino acid, a tRNA, an mRNA, a buffer, and adenosine 3′,5′-bisphosphate. | 06-18-2009 |
Masaaki Ito, Hiroshima JP
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20090062525 | METHOD OF ADJUSTING THE DEGREE OF SUBSTITUTION WITH ACETYL GROUP OF CELLULOSE ACETATE - A process for adjusting an intermolecular or intramolecular degree of acetyl substitution of cellulose acetate is disclosed. The process comprises ripening cellulose acetate in the presence of a catalyst, an acetyl donor, and water or an alcohol. The amount of water and the alcohol is in the range of 0.1 to 10 mol % based on the amount of the acetyl donor. | 03-05-2009 |
20110166340 | Process for adjusting degree of acetyl substitution of cellulose acetate - A process for adjusting an intermolecular or intramolecular degree of acetyl substitution of cellulose acetate is disclosed. The process comprises ripening cellulose acetate in the presence of a catalyst, an acetyl donor, and water or an alcohol. The amount of water and the alcohol is in the range of 0.1 to 10 mol % based on the amount of the acetyl donor. | 07-07-2011 |
Masaaki Ito, Ina-Shi JP
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20080225425 | Electro-optical device and electronic apparatus - The invention provides a heat dissipater such as a heat dissipation member that dissipates heat of an integrated circuit that is formed on a flexible substrate such as a flexible printed circuit board. The heat dissipater according to an aspect of the invention includes; a main body section that is formed in the shape of a hollow sleeve in such a manner that the flexible substrate can be inserted through and inserted inside the main body section; and an adhering section that is formed on an inner surface of the main body section in such a manner that the main body section and the integrated circuit are adhered to each other via the adhering section. | 09-18-2008 |
Masaaki Ito, Osaka JP
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20080221311 | Preparation method of insect cell extract solution for cell-free protein synthesis, the insect cell extract solution and cell-free synthesis method of protein using the insect cell extract solution - The present invention provides a preparation method of an insect cell extract solution for cell-free protein synthesis, the insect cell extract solution, a protein synthesis method in a cell-free system, which uses the insect cell extract solution, and a kit for cell-free protein synthesis containing the insect cell extract solution. The extract solution is easily prepared by the method of the present invention and can synthesize a higher amount of protein than by extract solutions prepared by conventional methods. | 09-11-2008 |
20160061402 | LIGHTING APPARATUS AND MOTOR VEHICLE - A lighting apparatus includes: a first light source that emits a first light; a first lens that allows the first light to pass through and exit from a first exit face of the first lens; a second light source that emits a second light; and a second lens that is smaller than the first lens and allows the second light to pass through and exit from a second exit face of the second lens. When viewed from the first exit face side: (i) the first exit face has a recess that is recessed inward from a periphery of the first exit face; and (ii) the second exit face is at least partially disposed in the recess. | 03-03-2016 |
Masaaki Ito, Chiba JP
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20110237942 | BIOIMAGING METHOD USING NEAR-INFRARED (NIR) FLUORESCENT MATERIAL - This invention provides a novel bioimaging technique that can achieve a deep observation depth and a novel method for marking a lesion that allows clear recognition of the lesion from outside a living body. This invention also provides a bioimaging marker comprising a fluorescent material obtained by doping a ceramic with rare earths and the like and a bioimaging technique comprising detecting near-infrared fluorescence that can sufficiently penetrate a living body generated upon excitation of the marker with near-infrared excitation light. | 09-29-2011 |
Masaaki Ito, Nagoya-Shi JP
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20120321996 | CATALYST CARRYING FINE METAL PARTICLES AND USE THEREOF - The production method according to the present invention includes a process for producing fine particles formed of a non-precious metal; a process for forming a shell of a precious metal on the respective surfaces of the fine particles of the non-precious metal; and a process for collecting a catalyst from a fluid reaction mixture. A fine metal particle-carrying catalyst prepared by such a production method includes fine non-precious metal particles as the cores thereby reducing the usage of a precious metal to achieve suppression of a cost increase. Since it includes a shell portion formed of a precious metal, it exhibits excellent catalytic activity. | 12-20-2012 |
Masaaki Ito, Himeji-Shi JP
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20130030208 | DIHYDROXYPROPYLAMIDE-MODIFIED POLYSILOXANE COMPOUND - A modified polysiloxane compound is represented by following Formula (1), in which R | 01-31-2013 |
20150326147 | ELASTIC BODY FOR ACTUATOR, AND PIEZOELECTRIC ACTUATOR - An elastic member | 11-12-2015 |
20150329754 | LIQUID COMPOSITION - Provided is a liquid composition that places a low burden on the environment and has such properties as to thicken or gelate upon the application of strain. The liquid composition according to the present invention contains components (A), (B), (C), and (D). The component (A) is an N-methyl-N-(2,3-dihydroxypropyl) fatty amide represented by Formula (1). The component (B) is an N-methyl-N-(2-hydroxypropyl) fatty amide ester represented by Formula (2). The component (C) is an oily substance. The component (D) is water. Formulae (1) and (2) are expressed as follows: | 11-19-2015 |
Masaaki Ito, Sagamihara-City JP
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20130294583 | X-Ray Collimator - An X-ray collimator for controlling an X-ray radiation field, having a lower base member, a pair of regulating members, a pair of surrounding members having substantially U-shaped forms in planar view, N columnar members surrounded by the pair of surrounding members (where N is 4, 6, or 8), a guiding member, a pair of moving members moving parallel to the opposed surfaces of the regulating members, an upper base member, a first motor for horizontally moving the pair of moving members, and a second motor for moving the columnar members. The first motor is driven to horizontally move the pair of moving members over the same distance in opposite directions. The second motor is configured to move one of the columnar members along an internal surface of the surrounding member surrounding the columnar member, thereby moving the other N−1 columnar members sequentially. | 11-07-2013 |
Masaaki Ito, Minato-Ku, Tokyo JP
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20150354947 | Surface Measurement Apparatus - Patent Document 1 discloses height measurement using an atomic force microscope (AFM) as means for measuring micro roughness. However, since it takes time for this measurement, it is difficult to apply a single display to inspection of all wafers and the entire surface thereof in an in-line manner. The invention provides a technique that estimates micro roughness from a total sum of detection signals from plural detection systems and signal ratios, using a light scattering method. The technique rotates and translates a wafer at high speed to measure the entire surface of the wafer with high throughput. Further, the relationship between the micro roughness and the intensity of scattered light varies according to a material of the wafer and a film thickness thereof. Further, calibration of an apparatus is also necessary. In consideration of this point, the invention provides a technique that has a function of correcting an optically acquired detection result using a sample which is substantially the same as a measurement target and makes the optically acquired detection result come close to a result measured by an apparatus (for example, an AFM) using a different measurement principle. | 12-10-2015 |
Masaaki Ito, Susono-Shi JP
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20150357100 | NANOCOMPOSITE MAGNET AND METHOD OF PRODUCING THE SAME - A nanocomposite magnet includes grains including a shell of a Re-TM-B phase and a core of a TM or TM-B phase. Re is a rare earth element, and TM is a transition metal. | 12-10-2015 |
20160071635 | MAGNETIC COMPOUND AND METHOD OF PRODUCING THE SAME - Provided is a magnetic compound represented by the formula (R | 03-10-2016 |
Masaaki Ito, Ube-Shi JP
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20150376160 | HALOGEN-SUBSTITUTED HETEROCYCLIC COMPOUND - A novel α-halogen-substituted thiophene compound or a pharmacologically acceptable salt thereof, which has a potent LPA receptor-antagonist activity and is useful as a medicament is provided. | 12-31-2015 |
Masaaki Ito, Nagoya-City JP
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20160061758 | THERMAL SHOCK RESISTANCE TESTING METHOD AND THERMAL SHOCK RESISTANCE TESTING APPARATUS - A ceramic body is heated to a predetermined temperature by using a furnace, and a cooling gas is ejected toward a first end face of the ceramic body so that the first end face of the ceramic body is cooled. At this time, the temperature of the first end face of the ceramic body is measured by a radiation thermometer provided on the same side from which the cooling gas is ejected, and the internal temperature is measured by a thermocouple provided in the ceramic body. Thereafter, a thermal shock resistance test in which actual use conditions are simulated is performed by obtaining the temperature gradient of the ceramic body from measurement results of the temperature of the first end face of the ceramic body and the internal temperature and checking the absence or presence of cracks that occurs to the ceramic body. | 03-03-2016 |
Masaaki Ito, Susono-Shi, Shizuoka JP
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20160141083 | RARE-EARTH MAGNET AND METHOD FOR MANUFACTURING SAME - To provide a rare earth magnet ensuring excellent magnetic anisotropy while reducing the amount of Nd, etc., and a manufacturing method thereof. | 05-19-2016 |