TESTING ELECTRONIC MEMORIES BASED ON FAULT AND TEST ALGORITHM PERIODICITYAANM HAKHUMYAN; AramAACI YerevanAACO AMAAGP HAKHUMYAN; Aram Yerevan AMAANM Harutyunyan; GurgenAACI AbovyanAACO AMAAGP Harutyunyan; Gurgen Abovyan AMAANM Shoukourian; SamvelAACI YerevanAACO AMAAGP Shoukourian; Samvel Yerevan AMAANM Vardanian; ValeryAACI YerevanAACO AMAAGP Vardanian; Valery Yerevan AMAANM Zorian; YervantAACI Santa ClaraAAST CAAACO USAAGP Zorian; Yervant Santa Clara CA US - diagram, schematic, and image 03
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