METHOD AND APPARATUS FOR TESTING A SEMICONDUCTOR DEVICEAANM Shao; Jhih JieAACI Toufen TownshipAACO TWAAGP Shao; Jhih Jie Toufen Township TWAANM Huang; Szu-ChiaAACI Hsinchu CityAACO TWAAGP Huang; Szu-Chia Hsinchu City TWAANM Chung; Tang-HsuanAACI Kaohsiung CityAACO TWAAGP Chung; Tang-Hsuan Kaohsiung City TWAANM Tseng; Huan ChiAACI Hsinchu CityAACO TWAAGP Tseng; Huan Chi Hsinchu City TW - diagram, schematic, and image 12
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