SEMICONDUCTOR DEVICE AND TEST METHODAANM Okutsu; AkihikoAACI YokohamaAACO JPAAGP Okutsu; Akihiko Yokohama JPAANM Saito; HitoshiAACI HachiojiAACO JPAAGP Saito; Hitoshi Hachioji JPAANM Okano; YoshiakiAACI ItabashiAACO JPAAGP Okano; Yoshiaki Itabashi JP - diagram, schematic, and image 03
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