25th week of 2011 patent applcation highlights part 25 |
Patent application number | Title | Published |
20110148369 | Device and Method for Converting a Potential - A potential converter device with a first storage capacitor implemented to be supplied with energy from an energy source to acquire a first potential form at the first storage capacitor, and a second storage capacitor implemented to be supplied with energy from the first storage capacitor to acquire a second potential form at the second storage capacitor. The potential converter device further has a converter electrically connected between the first and second storage capacitors and implemented to execute an energy transmission from the first storage capacitor to the second storage capacitor if the first potential form reaches a first potential threshold value and until the first potential form reaches a second potential threshold value, wherein the first potential threshold value is greater regarding its magnitude than the second potential threshold value. | 2011-06-23 |
20110148370 | VOLTAGE CONVERSION APPARATUS AND ELECTRICAL LOAD DRIVING APPARATUS - The present invention is related to a voltage conversion apparatus having a first loop circuit and a second loop circuit which share an inductance component, in which a current passes through the first and second loop circuits alternately in accordance with ON/OFF operation of a first switching element provided in the first loop circuit, characterized in that a direction of a magnetic field through the first loop circuit generated at the ON operation of the first switching element in the first loop circuit is the same as a direction of a magnetic field through the second loop circuit generated at the OFF operation of the first switching element in the first loop circuit subsequent to the ON operation. | 2011-06-23 |
20110148371 | SWITCHED-MODE POWER SUPPLY - A switched-mode power supply (SMPS) uses an equivalent inductor of bonding wire(s) and lead frame(s) to replace a traditional external inductor. A current-controlled pulse width modulation (PWM) modulator and a current-controlled pulse frequency modulation (PFM) modulator are optionally employed for high frequency switching, so as to mate a low inductance value of the bonding wire(s) and lead frame(s) and achieve reduced cost, low power consumption and low complexity. | 2011-06-23 |
20110148372 | SWITCHING VOLTAGE REGULATOR AND RELATED FEED-FORWARD CONTROL METHOD - A method of controlling a pulse width modulated (PWM) voltage regulator including a control circuit of a power stage, and a circuit configured to determine a duration of charge phases and further configured to receive a charge signal and to generate a logic command may include controlling, using the control circuit, switches of the power stage as a function of the logic command at an end of a charge phase and at a start of a discharge phase of an output capacitance. The method may also include generating the charge signal to be one of enabled and disabled during charge phases and another of enabled and disabled during discharge phases, and delaying, at each PWM cycle, the logic command with respect to a previous PWM cycle to compensate at least one of a phase and a frequency difference between each PWM cycle and a reference clock signal. | 2011-06-23 |
20110148373 | CONTINUOUSLY SWITCHING BUCK-BOOST CONTROL - A buck-boost converter with a switch controller may cause switches A, B, C, and/or D to cyclically close such that switches B and C are closed during at least one interval of each cycle during both the buck and boost modes of operation. The switch controller may in addition or instead cause switches A, B, C, and/or D to cyclically close based on a control signal such that switches A and D are closed during an interval of each cycle and such that these intervals are never both simultaneously modulated by a small change in the control signal during any mode of operation. | 2011-06-23 |
20110148374 | CONTROL MULTIPLEXOR FOR A SWITCH MODE POWER SUPPLY - A digital circuit directs operation of a pulse width modulation or pulse frequency modulation controller varying its control between closed loop and open loop topology. An exemplary control plant could embody a step-down switch mode power supply providing a precise sequence of voltages or currents to any of a variety of loads such as the core voltage of a semiconductor unique compared to its input/output ring voltage. A state machine monitors pulse width or pulse frequency from the pulse width modulation or pulse frequency modulation controller, respectively, while either type of controller operates in its closed loop topology, to determine if the present power state of the system matches the predicted load as characterized from a predetermined model used in conjunction with design automation tools. The state machine averages pulse widths or pulse frequencies monitored in the closed loop topology. If the average deviates from the predicted pulse width or pulse frequency for the present power state, the state machine updates a corresponding value in a table of pulse width or pulse frequency values from which an open loop controller applying pulse width modulation or pulse frequency modulation, respectively, generates a near critical damped step response during system power state transitions or maintains a maximally flat voltage during system current transients. | 2011-06-23 |
20110148375 | Power amplifying circuit, DC-DC converter, peak holding circuit, and output voltage control circuit including the peak holding circuit - A power amplifying circuit includes a first field effect transistor and a second field effect transistor that are connected in series, are interposed between a high potential power line and a low potential power line, and drive a load; a predriver that generates, in response to an input signal, gate voltages applied to the first field effect transistor and the second field effect transistor respectively; and a variable power source that supplies source voltages to the high potential power line and the low potential power line respectively, and is configured to control the source voltages. | 2011-06-23 |
20110148376 | MOSFET WITH GATE PULL-DOWN - A MOSFET main switch transistor has a pull-down FET coupled between a drain thereof and the gate of the main switch transistor. A gate of the pull-down FET is coupled to the drain of the main switch transistor by a capacitor and is connected to a source thereof by a resistor. The pull-down FET is operated by capacitive coupling to the voltage drop across the main switch and can be used to hold the gate of the main switch transistor at or near its source potential to avoid or reduce unintentional turn-on of the main switch transistor by the Miller effect. | 2011-06-23 |
20110148377 | POWER SUPPLY CONVERTER AND METHOD - A power supply converter and a method for adjusting a threshold voltage in the power supply converter. The circuit includes first and second switches having current conducting terminals commonly connected together to form a node. An energy storage element may be connected to the node and a zero current detection comparator may be connected to the node. A first voltage may be provided at the control terminal of the first switch that turns it off. After the first switch is off, determining whether the first switch turned off before or after the current in the energy storage element has reached zero. This may be accomplished by determining whether the voltage at the first node is positive or negative. If the voltage at the first node is negative, the threshold voltage is increased and if the voltage at the first node is positive the threshold voltage is decreased. | 2011-06-23 |
20110148378 | ALGORITHMIC APPROACH TO PWM SMPS CURRENT SENSING AND SYSTEM VALIDATION - A power supply current monitor comprising a processor operable to monitor a pulsed voltage signal generated by a power supply and generate an alert when a pulse width for the pulsed voltage signal is outside an expected pulse width range; wherein the pulse width is dependent on an amount of current being supplied to a load by the power supply. | 2011-06-23 |
20110148379 | CLEAN TRANSITION BETWEEN CCM AND DCM IN VALLEY CURRENT MODE CONTROL OF DC-TO-DC CONVERTER - A valley current mode DC-to-DC converter may include an electronic control system configured to cause the DC-to-DC converter to operate under a continuous current mode and a discontinuous current mode. The electronic control system may include a current sensing system configured to sense current traveling through an inductance, a dual threshold generator configured to generate a first and a different second threshold, and a comparator system configured to compare current sensed by the current sensing system with the first threshold when the DC-to-DC converter is operating in the continuous current mode and with the second threshold when the DC-to-DC converter is operating in the discontinuous current mode. | 2011-06-23 |
20110148380 | CIRCUIT AND METHOD FOR ADJUSTING AN OFFSET OUTPUT CURRENT FOR AN INPUT CURRENT AMPLIFIER - A circuit and a method for correcting an offset is provided that includes a current amplifier and an adjusting circuit for correcting an offset of an output current of the current amplifier. Wherein the adjusting circuit has a controlled current source, an output of the controlled current source is connected to the current amplifier for impressing an output current of the controlled current source in the current amplifier, an input of the controlled current source to form a regulation element of a control loop is connected by a first switching device of the adjusting circuit to an output of the current amplifier and to form a holding element is disconnected from the output of the current amplifier by the first switching device. The controlled current source, acting as a regulation element in the control loop, is set up to regulate the offset to a minimum by setting of a current value of the output current, and the controlled current source, acting as a holding element, is set up to hold the current value, associated with the minimum, of the output current. | 2011-06-23 |
20110148381 | CONVERTER WITH CROSSOVER FREQUENCY RESPONSIVE TO SWITCHING FREQUENCY - A power converter constituted of: a reference source; a clock generator exhibiting a variable frequency output, the value of the frequency of the variable frequency output responsive to an input signal; and an error amplifier in communication with the reference source, the error amplifier exhibiting a gain whose value is responsive to the input signal. Preferably the error amplifier is a transconductance amplifier. In one embodiment the power converter further exhibits a current squarer, arranged to produce a squared value of the input signal and provide the squared value to the transconductance amplifier. | 2011-06-23 |
20110148382 | Start-Up Supply - In one embodiment, an apparatus includes a transistor having a gate, a drain, and a source. The drain is coupled to receive an AC power supply signal. A component is coupled between an output node and the gate of the transistor. The component couples an output voltage from the output node to charge a gate-source capacitor during a first portion of the AC power supply signal. The transistor is configured to turn on during a second portion of the AC power supply signal to send a charge to the output node where the charge is used to power a circuit of a power supply. | 2011-06-23 |
20110148383 | POWER MANAGEMENT CONTROL SYSTEM AND METHOD - A power management system includes a sensor to detect current output from a battery, a first comparator to compare the battery current to a first reference value, and a burst controller to perform a first power control operation based on said comparison. The power control operation reduces power consumed by the battery in order to cause the battery current to fall below the first reference value. This may be accomplished by reducing or shutting down power to one or more functions or features of a host system that includes or is coupled to receive power from the battery. The host system may include or correspond to a mobile phone and/or any of a number of other electronic devices. | 2011-06-23 |
20110148384 | CIRCUIT FOR GENERATING BOOSTED VOLTAGE AND METHOD FOR OPERATING THE SAME - A boosted voltage generation circuit may include: a boosting circuit configured to boost an input voltage based on a boosting rate and output a boosted voltage, a boosting rate setting unit configured to receive a feedback on a level of the input voltage and set a boosting rate, and an input voltage level setting unit configured to set the level of the input voltage in response to a target level of the boosted voltage and the boosting rate. | 2011-06-23 |
20110148385 | SELECTIVELY ACTIVATED THREE-STATE CHARGE PUMP - This document discusses, among other things, a device for providing a DC output voltage, including a first output voltage and a second output voltage, from an input voltage. The device can include a first voltage regulator configured to provide the first output voltage when the input voltage is below a threshold voltage, and a charge pump configured to provide the second output voltage from the first output voltage in a two-state mode when the input voltage is below the threshold voltage, and to provide the first output voltage and the second output voltage in a three-state mode when the input voltage is above the threshold voltage. | 2011-06-23 |
20110148386 | FAST RECOVERY VOLTAGE REGULATOR - This document discusses, among other things, a voltage regulator having a plurality of switching devices, coupled in parallel, and configured to selectively provide a variable available drive current using a comparison of a regulated Dc output voltage to at least one reference voltage. | 2011-06-23 |
20110148387 | SWITCH MODE REGULATOR - A switch mode regulator is provided comprising: a first switch for controlling a current supply to an output inductor of the regulator; a second switch for selectively providing a conductive path to ground for current flowing through the output inductor; and an inverting amplifier having an input connected to an output of the first switch and an output connected to a control input of the second switch. The switch mode regulator may alternatively comprise: a first switch for controlling a current supply to an input inductor of the regulator; a second switch for selectively providing a conductive path to a load for current flowing through the input inductor; and an inverting amplifier having an input connected to an output of the first switch and an output connected to a control input of the second switch. | 2011-06-23 |
20110148388 | RADIATION TOLERANT CIRCUIT FOR MINIMIZING THE DEPENDENCE OF A PRECISION VOLTAGE REFERENCE FROM GROUND BOUNCE AND SIGNAL GLITCH - A radiation-hardened reference circuit includes a precision voltage reference circuit for generating a current-controlling voltage at first and second terminals, a driver circuit for receiving the current-controlling voltage at first and second terminals and for generating an output reference voltage, and a differential sampling circuit having first and second input terminals coupled to the first and second terminals of the voltage reference circuit, and first and second output terminals coupled to the first and second terminals of the driver circuit. | 2011-06-23 |
20110148389 | STABLE VOLTAGE REFERENCE CIRCUITS WITH COMPENSATION FOR NON-NEGLIGIBLE INPUT CURRENT AND METHODS THEREOF - A voltage reference circuit includes three or more current mirrors, an operational amplifier, a voltage buffer, two or more diodes, and one or more resistors. The operational amplifier has two inputs separately coupled to an output of two of the three or more current mirrors and an output coupled to the three current mirrors. The voltage buffer has an input coupled to an output of the other one of the three or more current mirrors and another input coupled to an output of the voltage buffer. Each of the diodes is coupled between the output of the two of the three or more current mirrors and one of ground and a negative supply. The one or more resistors are coupled to an output of one or more of the three or more current mirrors to tune effects of input current and establish a first set absolute voltage and temperature coefficient on a voltage reference. | 2011-06-23 |
20110148390 | APPLIANCE HAVING A USER GRACE PERIOD FOR REINITIATING OPERATING WHEN IN DEMAND RESPONSE ENERGY MODE - An energy consuming device comprises a power consuming feature/function and a controller operatively connected to the power consuming feature/function. The controller is configured to operate the device including the power consuming feature/function in one of a plurality of operating modes, including at least a normal operating mode during an associated off-peak demand period of an associated energy supplying utility and an energy savings mode during an associated peak demand period of the associated energy supplying utility. The controller is configured to provide a user a grace period during the associated peak demand period to allow the user to change the operating mode of the power consuming feature/function from the energy savings mode to another operating mode including the normal operating mode thereby allowing additional use of the power consuming feature/function during the associated peak demand period. | 2011-06-23 |
20110148391 | VARIOUS METHODS AND APPARATUSES FOR AN INTEGRATED ZIG-ZAG TRANSFORMER - A method, apparatus, and system in which a neutral deriving transformer incorporates a zig-zag transformer configuration is provided. A zig-zag transformer provides an electrical load with a neutral wire. The zig-zag transformer may be electrically connected downstream of a main AC voltage step-down transformer. Additionally, three phase AC voltage lines can be routed to the zig-zag transformer such that the zig-zag transformer comprises a neutral deriving transformer that electrically connects to a ground conductor. The neutral deriving transformer might not be electrically connected to a neutral conductor of the main voltage step-down transformer. The zig-zag transformer can phase shift each winding by approximately 120 degrees and may derive a neutral for at least one single phase load connected to the zig-zag transformer and one of the three phase AC lines in order to provide a common neutral point that takes the place of a neutral cable that connects back to the main AC voltage step-down transformer. | 2011-06-23 |
20110148392 | MECHANICAL SUPPORT DEVICE AND A MEASURING DEVICE WITH A MECHANICAL SUPPORT DEVICE - The invention relates to a mechanical support device ( | 2011-06-23 |
20110148393 | SYSTEM AND DEVICE FOR MEASURING VOLTAGE IN A CONDUCTOR - A system and device for measuring voltage in a conductor having a voltage provides a first electrode surrounding and spaced from the conductor, and a second electrode surrounding and spaced from both the conductor and the first electrode such that there is no contact between the conductor and the electrodes or between the first and second electrodes. The first electrode is connected to a first input of a differential amplifier circuit and the second electrode is connected to the other input of the differential amplifier circuit. The output of the differential amplifier circuit provides a voltage signal in proportion to the voltage of the conductor, thus providing a non-contact means for measuring the voltage of a conductor without requiring a connection to ground while simultaneously providing a high level of rejection of external interference. | 2011-06-23 |
20110148394 | Fluid Conductivity Sensor for Actuating and Testing an Electroexploding Device - Disclosed is an apparatus for sensing the electrical conductivity of fluid wherein when electrodes of the apparatus are exposed to fluid. When the electrodes are exposed to a fluid with a predetermined salinity, a voltage is developed on a capacitor which in turn fires a load, such as a resistive bridge wire. Also disclosed is a testing circuit, whereby the integrity of the circuit can be ascertained without the necessity of actually firing the circuit. | 2011-06-23 |
20110148395 | OVER-VOLTAGE AND OVER-TEMPERATURE DETECTING CIRCUIT - An over-voltage and over-temperature detecting circuit includes a voltage-limiting circuit, a temperature sensing circuit, a current source, a first comparing circuit and a second comparing circuit. The equivalent resistance of the temperature sensing circuit varies with the temperature. The current source provides a first current to a detecting terminal, so that a detecting voltage is generated at the detecting terminal. By comparing the magnitude of the detecting voltage with the first reference voltage value, the first comparing circuit generates a corresponding temperature status signal. By comparing the magnitude of the detecting voltage with the second reference voltage value, the second comparing circuit generates a corresponding voltage status signal. If the temperature exceeds the temperature upper limit, the temperature status signal is in an enabling status. If the first voltage exceeds the voltage upper limit, the voltage status signal is in an enabling status. | 2011-06-23 |
20110148396 | SYSTEMS AND METHODS FOR COMPREHENSIVE TIRE PRESSURE MONITORING AND WHEEL SPEED DETECTION - Systems and methods facilitate the monitoring of tire pressure, the detection/determination of wheel speed, or a combination thereof. A system is provided comprising a hub cap, a target coupled to the hub cap, and at least two displacement sensors configured to measure a displacement between each displacement sensor and the target. The target has a variable thickness, and the target comprises a hollow vessel in fluid communication with a tire. | 2011-06-23 |
20110148397 | LENGTH MEASUREMENT APPARATUS - A length measurement apparatus ( | 2011-06-23 |
20110148398 | Gear position detection device - The present invention discloses a gear position detection device, comprising: a gear lever capable of being shifted into different gear positions; a shaft connected to and driven by the gear lever; a first detector and a second detector symmetrically arranged at both sides of the shaft, the first detector for outputting a first output signal value G | 2011-06-23 |
20110148399 | ENCODER USING MAGNET DROP OUT FEATURE FOR THEFT DETECTION - An encoder to be mounted to a shaft extending from a piston meter configured to compute a volume of distributed fluid includes a magnet affixed to the shaft via a floating magnet holder, a magnetic sensor configured to sense the flux density and direction of a magnetic field created by the magnet and to output a signal indicating the flux density and direction of the magnetic field to a printed circuit board, and the printed circuit board configured to output a signal indicating the volume of distributed fluid if the encoder has not been tampered with and configured to output an error signal if the encoder has been tampered with. | 2011-06-23 |
20110148400 | POSITION SENSOR FOR MRT DETECTION - Allows the specificity of an automatic MRT detection to be increased in a simple manner. This is achieved using an automatically calibrating position sensor, so that the user does not have to perform additional calibration of this sensor. Incorrect sensor calibrations are thus eliminated as well. | 2011-06-23 |
20110148401 | DEVICE FOR LOCATING WHETHER A WHEEL-TIRE ASSEMBLY IS POSITIONED ON THE RIGHT OR THE LEFT OF A VEHICLE - A self-contained device intended to be carried by a wheel-tire assembly in order to locate whether the assembly is positioned on the right side or on the left side of a vehicle is described. The device includes two magnetic sensors with axes of maximum sensitivity, the sensors providing two periodic signals that are phase shifted relative to one another. Each signal is representative of variations in the magnitude of the magnetic field detected by the sensor during a revolution of the wheel-tire assembly. The device also includes a processing unit programmed to determine, from the phase shift between the two periodic signals, a direction in which the wheel-tire assembly is rotating and to deduce, from this direction of rotation and from a direction of travel of the vehicle, whether the wheel-tire assembly is located on the right side or on the left side. The two magnetic sensors are intended to be positioned on the wheel-tire assembly at distinct azimuthal locations. A filtering element of the device is designed to eliminate components of the two periodic signals having frequencies that are below or equal to a given frequency. | 2011-06-23 |
20110148402 | INSPECTION MODE SWITCHING CIRCUIT - An eddy current probe testing apparatus structured to operate concurrently in a driver pick-up mode and said impedance mode is provided. The eddy current probe has two coils. The eddy current probe testing apparatus also includes a signal producing device, an output device, and a switch assembly. The switch assembly is structured to switch how an input signal from the signal producing device is provided to the two coils. | 2011-06-23 |
20110148403 | Magneto-electric sensor with injected up-conversion or down-conversion - A method includes generating an electrical signal representing a magnetic field using a magnetic field sensor having alternating layers of magneto-strictive material and piezo-electric material. The method also includes performing up-conversion or down-conversion so that the electrical signal representing the magnetic field has a higher or lower frequency than a frequency of the magnetic field. The up-conversion or down-conversion is performed before the magnetic field is converted into the electrical signal. The up-conversion or down-conversion could be performed by repeatedly sensitizing and desensitizing the magnetic field sensor. This could be done using a permanent magnet and an electromagnet, an electromagnet without a permanent magnet, or a movable permanent magnet. The up-conversion or down-conversion could also be performed by chopping the magnetic field. The chopping could involve intermittently shielding the magnetic field sensor from the magnetic field or moving the magnetic field sensor with respect to the magnetic field. | 2011-06-23 |
20110148404 | METHOD AND APPARATUS FOR EVALUATING LENGTH OF DEFECT IN EDDY CURRENT TESTING - The surface length of a metal subject to be inspected is evaluated by detecting an eddy current without using a combination of a scale and visual or liquid penetrant inspection. An exciting coil and a detecting coil are scanned above the subject in a length direction. An eddy current detector measures an output voltage corresponding to scanning positions based on an output from the detecting coil. Based on an output voltage distribution curve indicating a distribution of output voltages corresponding to the scanning positions, position information is extracted corresponding to values which are within a differential voltage range and lower by 12 dB than a maximum value of the output voltages on the left and right sides of the distribution. A distance between the positions included in the extracted information is calculated to evaluate the length of a slit which is a defect present on the subject surface. | 2011-06-23 |
20110148405 | MAGNETISM MEASURING METHOD AND DEVICE - A magnetism measuring method includes magnetizing a magnetic material with a direct current to a rotational magnetization region, performing an alternate current excitation in a direction having a component orthogonal to a direction of the direct current magnetization, and measuring a component of an alternate current magnetic field generated by an interaction with the magnetic material in a direction orthogonal to the direction of the direct current magnetization. | 2011-06-23 |
20110148406 | DEVICE FOR DETECTING DAMAGE OF A TEST SPECIMEN MADE OF FERROMAGNETIC MATERIAL - The device comprises a magnetization unit, which generates a constant magnetic field, to which the test specimen ( | 2011-06-23 |
20110148407 | ASSEMBLY STRUCTURE OF CURRENT DETECTION DEVICE - An assembling structure is provided which is capable of greatly reducing the material cost, is easy-to-assemble, and can be made smaller. The sensor body is provided on a lower face with a protrusion, which comes into contact with an upper face of the busbar when the sensor body is mounted on the busbar. The busbar is provided with a through-hole passing through the busbar in a vertical direction. A leading end of the protrusion, which passes through the through-hole when the sensor body is mounted on the busbar, is heat-fused and adheres to the circumference of the through-hole. | 2011-06-23 |
20110148408 | MEASURING APPARATUS FOR MEASURING MAGNETIC PROPERTIES, AND METHOD FOR PRODUCING SUCH A MEASURING APPARATUS - Measuring apparatus for measuring magnetic properties of the area surrounding the measuring apparatus with a sensor row comprising at least two magnetoresistive sensor elements, which are arranged in a row that extends in a row direction, and a supporting field apparatus with generates a magnetic supporting field having a magnetic field component which points in the row direction and the field strength of which vanes in the row direction, wherein this field strength profile in the row direction does not have a zero crossing and/or a maximum or minimum on at least two sensor edges of the sensor elements which for the sensor row, which sensor edges are arranged after one another in the row direction. | 2011-06-23 |
20110148409 | SYSTEM AND METHOD FOR MEASURING THE SHAPE OF AN OBJECT USING A MAGNETIC INDUCTION RADIO SENSOR - A system and method for measuring the shape of an object using a magnetic induction radio sensor involves at least partially enclosing the object with a magnetic loop antenna of the magnetic induction radio sensor, where the inductance of the magnetic loop antenna depends on the shape of the object, and providing a particular capacitance at an antenna matching circuit coupled to the magnetic loop antenna in response to the inductance of the magnetic loop antenna such that the magnetic loop antenna and the antenna matching circuit form a resonant circuit and the resonant circuit has a fixed resonant frequency, where the particular capacitance is used to measure the shape of the object. | 2011-06-23 |
20110148410 | Method for data acquisition acceleration in magnetic resonance imaging (MRI) using receiver coil arrays and non-linear phase distributions - A method for accelerating data acquisition in MRI with N-dimensional spatial encoding has a first method step in which a transverse magnetization within an imaged object volume is prepared having a non-linear phase distribution. Primary spatial encoding is thereby effected through application of switched magnetic fields. Two or more RF receivers are used to simultaneously record MR signals originating from the imaged object volume, wherein, for each RF receiver, an N-dimensional data matrix is recorded which is undersampled by a factor R | 2011-06-23 |
20110148411 | SAR DOSIMETER FOR RF POWER DEPOSITION IN MRI AND METHODS AND SYSTEMS RELATED THERETO - Featured is a dosimeter device that measures SAR deposited by RF power deposition during MRI of a specimen. Such a dosimeter device includes a transducer that is configured to present a load to the MRI scanner in which the transducer is located and to provide an output representative of signals induced in the transducer. The transducer also is configured so that the presented load is substantially equivalent to another load which would be presented by the specimen during MRI of the specimen. Such a transducer also is configured so as to generate an MRI signal that is sufficient to allow the MRI scanner to adjust the RF power to a value substantially equal to that of the specimen. Also featured are methods for measuring SAR deposited by RF power deposition and apparatuses or system embodying such a dosimeter device. | 2011-06-23 |
20110148412 | MAGNETIC RESONANCE IMAGING APPARATUS AND MAGNETIC RESONANCE IMAGING METHOD - According to one embodiment, an MRI apparatus includes a calculation unit and an imaging unit. The calculation unit calculates “a value of a parameter having an upper limit” for “a plurality of patterns of scan orders for a plurality of scan operations for an object” respectively. The imaging unit generates image data for each of the scan operations by performing the plurality of scan operations based on a result of the calculation. | 2011-06-23 |
20110148413 | MAGNETIC RESONANCE IMAGING APPARATUS - A magnetic resonance imaging apparatus according to an embodiment includes a data gathering unit and an image generating unit, the data gathering unit gathers magnetic resonance data in a non-contrast manner by applying a first readout gradient pulse having a zero-order moment of 0 and a second readout gradient pulse having a zero-order moment of 0 and a first-order moment of a value different from a value of a first-order moment of the first readout gradient pulse to a region of interest including a fluid in motion, and the image generating unit periodically arranges first magnetic resonance data read out with the first readout gradient pulse and second magnetic resonance data read out with the second readout gradient pulse in at least one of a phase encoding direction and a slice encoding direction in a k-space to generate k-space data and reconstructs the k-space data to generate an image in which a fluid image and a static part image surrounding the fluid are spatially separated from each other. | 2011-06-23 |
20110148414 | MAGNETIC RESONANCE IMAGING OF SINGLE DOMAIN NANOPARTICLES - A method and system are disclosed for gathering information about an object including single domain particles which have a diameter in the range of about 5 to 80 nm. In one aspect, a method includes generating a static magnetic field of less than about 0.1 Tesla on the object and generating an RF energy, pulsed or continuous wave, so as to generate electron paramagnetic resonance of the single domain particles. The method also includes detecting the electron paramagnetic resonance of the single domain particles in the form of an image of the object. The single domain particles may have a predetermined diameter and a predetermined saturation magnetization and the applied magnetic field may be such that the single domain particles reach a magnetization being at least about 10% of the saturation magnetization. The method may be used for detecting tags in an object and for activating tags. | 2011-06-23 |
20110148415 | APPARATUS AND METHOD FOR DECOUPLING MR COILS - An apparatus includes a first RF coil integrated into a first printed circuit board (PCB) and a second RF coil integrated into the first PCB. The apparatus also includes a tuning member positioned adjacently to the first PCB and inductively coupled to the first and second RF coils, the tuning member configured to minimize a mutual inductance formed between the first and second RF coils via modification of a coupling constant between the first and second RF coils. | 2011-06-23 |
20110148416 | APPARATUS AND METHOD TO IMPROVE MAGNET STABILITY IN AN MRI SYSTEM - An MRI apparatus and method comprises an MRI system having a plurality of gradient coils positioned about a bore of a magnet, and an RF transceiver system and an RF switch controlled by a pulse module to transmit RF signals to an RF coil assembly to acquire MR images. The magnet comprises a main coil former and a shield coil former arranged radially around the bore of the magnet, wherein a radius of the shield coil former is greater than a radius of the main coil former. The magnet also includes at least one main coil affixed to the main coil former, at least one shield coil affixed to the shield coil former, and at least one structural member affixed to the main coil former and to the shield coil former to provide structural support and enable longitudinal alignment adjustment between the main coil former and the shield coil former. | 2011-06-23 |
20110148417 | SUPERCONDUCTING MAGNET COIL INTERFACE AND METHOD PROVIDING COIL STABILITY - A superconducting magnet coil interface and method providing coil stability are provided. A superconducting coil arrangement includes a superconducting coil and a thermal interface coupled to the superconducting coil. The thermal interface is configured to intercept frictional heat before reaching the superconducting coil. The superconducting coil arrangement further includes a plurality of channels extending within at least a portion of the thermal interface and towards the superconducting coil. The plurality of channels are configured to receive therein a cooling liquid. | 2011-06-23 |
20110148418 | RF Power Splitter for Magnetic Resonance System - A radio frequency transmission system for a magnetic resonance system includes a radio frequency power amplifier ( | 2011-06-23 |
20110148419 | APPARATUS AND METHOD FOR DETECTING UNDERGROUND OBJECTS - A wearable apparatus for detecting an underground object includes: a signal transmitter configured to transmit a predetermined signal in a predetermined direction; a reception detection sensor configured to receive a reflected wave corresponding to the transmitted signal; a wireless reception unit configured to restore the received reflected wave to a received signal; and an acknowledgement signal processing unit configured to analyze whether the underground object exists or not, based on the restored received signal, and generate first and second acknowledgement signals depending on whether the underground object exists or not. | 2011-06-23 |
20110148420 | SERVICE TEE MARKER FIXTURE - A service tee marker fixture comprises a disk marker and a cylindrical attachment sleeve fastened concentrically to the disk marker and constructed of a flexible material which provides a releasable friction fit with a service tee cap. For certain sleeve materials a stiffener plate is used to secure an end portion of sleeve adjacent to the disk marker. Detents are formed inside the attachment sleeve to grip matching ribs on the cap. An integrally formed inwardly-extending annular flange at an open end of the sleeve helps retain the sleeve on the cap. When installed the wire coil is horizontal and the marker shields the tee, and is further centered over a centerline of the main pipe. A novel method is also disclosed for using the service tee marker fixtures to survey and locate service line end points. | 2011-06-23 |
20110148421 | Bucking Coil and B-Field Measurement System And Apparatus for Time Domain Electromagnetic Measurements - According to one example embodiment is a time domain electromagnetic (TDEM) geophysical survey system for producing a B-field measurement, comprising: a transmitter coil; a bucking coil positioned in a substantially concentric and coplanar orientation relative to the transmitter coil; a receiver coil positioned in a substantially concentric and coplanar orientation relative to the bucking coil; an electrical current source connected to the transmitter coil and bucking coil for applying a periodic current thereto; and a data collection system configured to receive a magnetic field time-derivative signal dB/dt from the receiver coil and integrate the magnetic field time-derivative signal dB/dt to generate, a magnetic B-field measurement, the transmitter coil, bucking coil and receiver coil being positioned relative to each other such that, at the location of the receiver coil, a magnetic field generated by the bucking coil has a cancelling effect on a primary magnetic field generated by the transmitter coil. | 2011-06-23 |
20110148422 | Lamp With Metering Device - A generator generates electricity by non-combustion means. A battery stores the generated electricity. An electrical appliance is powered by the stored electricity. A metering device tallies an operating parameter indicative of the amount of electrical energy consumed by the appliance. A housing supports the generator, the battery, the appliance and the metering device. A device, including the generator, the battery, the metering device and the housing, is manually portable. | 2011-06-23 |
20110148423 | PROTECTIVE DEVICE WITH AUTOMATED SELF-TEST - The present invention is directed to an electrical wiring device that includes at least one sensor that provides a sensor output signal corresponding to electrical perturbations propagating on the plurality of line terminals or the plurality of load terminals. A protective circuit assembly configured to detect a fault condition when the sensor output signal substantially corresponds to at least one predetermined fault criterion and generate a trip actuation signal in response thereto. A solenoid coil is configured to generate a trip actuation force in response to the trip actuation signal. A circuit interrupter assembly includes movable contacts configured to be driven into a tripped state in response to the trip actuation force. An automatic fault simulation circuit is configured to generate a self-test signal without execution of software code. The self-test signal is generated such that it is sensed by the at least one sensor if the at least one sensor is operational. An end-of-life detection circuit is coupled to the protective circuit assembly. The end-of-life detection circuit is configured to monitor the protective circuit assembly without execution of software code. The end-of-life detection circuit is configured to substantially inhibit the trip actuation force when the protective circuit assembly detects the fault condition and generates the trip actuation signal in response to the self-test signal. The end-of-life detection circuit is configured to generate an end-of-life response if the protective circuit assembly does not respond to the self-test signal within a predetermined period of time. | 2011-06-23 |
20110148424 | APPARATUS FOR ESTIMATING BATTERY STATE OF HEALTH - An apparatus for estimating state-of-health (SOH) of a battery is disclosed, which comprises: a measurement unit, for measuring a working current, a working voltage and a working temperature of the battery; an observer unit, for observing voltages at an output end and RC parallel circuits of the battery; an adaptive algorithm unit, for updating parameters of the battery; an internal voltage estimation unit, for estimating the internal voltages of the RC parallel circuits; an open-circuit voltage (OCV) estimation unit, for estimating static open-circuit voltage of the battery; a SOH estimation unit, for estimating an SOH of the battery; and a state-of-charge (SOC) estimation unit, for estimating a SOC of the battery. | 2011-06-23 |
20110148425 | SYSTEMS AND METHODS FOR DETECTING AN OPEN CELL TAP IN A BATTERY PACK - A method is provided for detecting an open cell tap condition in a battery pack. The method includes: applying a detection voltage across an electrical impedance that is coupled to a measurement node, where the detection voltage exceeds voltage measures at a node disposed between serially coupled battery cells of the battery pack and the measurement node is coupled by a circuit path to said node; measuring the voltage at the measurement node while the detection voltage is being applied; and detecting a break in the circuit path when the voltage measured at the measurement node is substantially equal to the detection voltage. | 2011-06-23 |
20110148426 | BATTERY SYSTEM AND METHOD FOR DETECTING INTERNAL SHORT CIRCUIT IN BATTERY SYSTEM - A battery system includes a battery pack, a detecting portion, a storage portion, and a determining portion. The battery pack | 2011-06-23 |
20110148427 | TRIBOCHARGE TEST FIXTURE - A fixture can include a test fixture that holds an object whose electrostatic charge characteristics are to be measured, means for moving a piece of rubbing material into contact with the object, and means for rubbing a surface of the object. A method for measuring the electrostatic charge characteristics of an object using a test fixture can include: placing the object in the test fixture, moving a piece of rubbing material into contact with the object and rubbing a surface of the object with the piece of rubbing material for a period of time. The rubbing causes an electrostatic charge to be built up on the surface of the object. The electrostatic charge characteristics of the object can be measured and the measured electrostatic charge characteristics of the object can be displayed. | 2011-06-23 |
20110148428 | METHOD FOR MONITORING INSULATION FAULTS IN AN ELECTRIC NETWORK AND VEHICLE COMPRISING AN INSULATION FAULT MONITOR - A method for monitoring an insulation fault in an electric network with at least one electric power system supplying electric power to one or more electric loads, and at least one insulation resistance monitor is provided, wherein the at least one electric power system includes at least one electrical power source, and wherein the at least one insulation resistance monitor monitors an insulation resistance between terminal leads of the at least one electric power source and at least one reference potential. The steps are performed of disconnecting the at least one electric power source from the one or more loads by opening each terminal lead; measuring the insulation resistance between the electric circuit of at least one electrical power source and the reference potential; measuring the insulation resistance for the total electric network; closing the second terminal lead with the first terminal lead open; and measuring the insulation resistance for the total electric network. | 2011-06-23 |
20110148429 | DC Testing Integrated Circuits - In accordance with some embodiments, voltage testing, including input and output voltage levels, may be tested in an integrated circuit without using an external tester in some embodiments. In some cases, active loads may be provided on chip for DC testing. In addition, a comparator may be used to compare an input voltage on an interconnection to a reference voltage to determine whether the voltage levels are correct and the extent to which the voltage levels exceed the designer's specification. | 2011-06-23 |
20110148430 | METHOD AND APPARATUS FOR FAULT IDENTIFICATION IN A POWER TANSMISSION LINE - A method and apparatus for fault identification in a transmission line are provided. The method may include measuring at an end of the transmission line when the transmission line has a fault to obtain a measured signal g(t), comparing the measured signal g(t) with a predefined standard signal f(t), the predefined standard signal f(t) having beat frequency characteristic; and identifying that the fault is a transient fault if the measured signal g(t) matches the predefined standard signal f(t) according to a result of the comparison, or the fault is a permanent fault if the measured signal g(t) does not match the predefined standard signal f(t) according to the result of the comparison. | 2011-06-23 |
20110148431 | PROPERTY MONITORING APPARATUS FOR CURRENT TRANSFORMER OR ELECTRIC TRANSFORMER - The invention provides a property monitoring apparatus comprising a test current output circuit capable of varying an output current, a test current value computing means for computing a current value of a test current output from the test current output circuit, a test current control means for performing feedback control of the test current value computed via the test current value computing means to a target value, a measurement current detection circuit for measuring an output current value of the current transformer or the voltage transformer when the test current controlled to the target value via the test current control means is supplied, for storing a relationship between the output current value of the current transformer or the voltage transformer and the test current value for each target value by varying the target value of the test current via a predetermined pattern, and computing a correction coefficient for correcting a property of the current transformer or the voltage transformer based on the stored relationship. | 2011-06-23 |
20110148432 | METHOD AND DEVICE FOR CHECKING THE ELECTRICAL INSULATION AS WELL AS A METHOD AND SYSTEM FOR PRODUCING PHOTOVOLTAIC MODULES - An electrical insulation test as well as the production of photovoltaic modules, especially of thin-film photovoltaic modules, provides a current-conducting component disposed on a panel-shaped substrate, which are insulated electrically in the area of the module edge. In order to simplify testing of the insulation of such photovoltaic modules, it is proposed that, during the production of the photovoltaic module, testing of the electrical insulation takes place, for which, through the use of a mechanical contacting device a test voltage is applied between the module edge on the one hand and the electrical connections of the photovoltaic module, which are remote from the module edge, lead to the outside, on the other hand. | 2011-06-23 |
20110148433 | HIGH-VOLTAGE TRANSFORMER - A high-voltage transformer for providing an alternating voltage in the kV range, comprising at least one secondary winding wound on a coil carrying body surrounding a transformer core, and an insulation housing encapsulating the secondary winding is provided to electrically insulate the secondary winding. Said insulation housing is walled by the coil carrying body carrying the secondary winding and by an enveloping body made of plastic and enveloping the secondary winding so that an annular gap is formed, wherein the annular gap between the secondary winding and the enveloping body is filled with an insulating fluid. The annular gap has a gap width of less than or equal to 20 mm viewed in the cross-section, and the enveloping body has a wall thickness of less than or equal to 20 mm, wherein the plastic is polypropylene, and a separate expansion volume is not provided for the insulating fluid. | 2011-06-23 |
20110148434 | SYSTEM AND METHOD FOR DISTORTION ANALYSIS - A method, circuit and system for determining at least one of an amplitude and a relative phase of a signal under test. A reference signal is generated based, at least in part, upon the at least one of the amplitude and the relative phase of the signal under test. The reference signal is combined with the signal under test to generate a residual signal indicative of a distortion within the signal under test. The residual signal is measured. | 2011-06-23 |
20110148435 | TRANSCAPACITIVE SENSOR DEVICES WITH OHMIC SEAMS - A transcapacitive sensing device has and ohmic seam which sections a plurality of transmitter electrodes and also sections a plurality of receiver electrodes. A processing system is communicatively coupled with the transmitter electrodes and the receiver electrodes and configured to: transmit a first transmitter signal with a first transmitter electrode disposed on a first side of the ohmic seam; transmit a second transmitter signal with a second transmitter electrode disposed on a second side of the ohmic seam; receive a first response corresponding to said first transmitter signal with a first receiver electrode disposed on the first side of the ohmic seam; and receive a second response corresponding to said second transmitter signal with a second receiver electrode disposed on the second side of the ohmic seam. | 2011-06-23 |
20110148436 | SYSTEM AND METHOD FOR DETERMINING A NUMBER OF OBJECTS IN A CAPACITIVE SENSING REGION USING SIGNAL GROUPING - An input device and method are provided that facilitate improved usability. The input device comprises an array of capacitive sensing electrodes and a processing system. The processing system is configured to receive sensing signals from the capacitive sensing electrodes and generate a plurality of sensing values, each of the plurality of sensing values corresponding to a sensing electrode in the first array of capacitive sensing electrodes. The processing system is further configured to produce a plurality of positional values corresponding to a plurality of groups of electrodes in the first array of capacitive sensing electrodes; analyze the plurality of positional values to determine if one or more clusters exist in the plurality of positional values; and determine a number of objects in the sensing region from the determined one or more clusters in the plurality of positional values. | 2011-06-23 |
20110148437 | Nailer With Integrated Stud Finder - A nailer incorporates an integrated stud finder for sensing when a stud is present. The nailer has a work contact element and a magazine for storing nails. The stud finder includes a sensor plate coupled to the work contact element of a nailer and a stud sensing circuit coupled to the sensor plate. The stud sensing circuit is provided for reading a capacitance level and for determining whether the sensor plate is positioned adjacent a stud based upon the capacitance level that is read. The stud finder also includes at least one signaling device coupled to the sensor plate for signaling to a user when a stud is present. The sensor plate is coupled to a no mar tip that is tethered to the nailer. A storage post for storing the no mar tip is positioned on the magazine for storing the no mar tip when not in use. | 2011-06-23 |
20110148438 | SYSTEM AND METHOD FOR DETERMINING A NUMBER OF OBJECTS IN A CAPACITIVE SENSING REGION USING A SHAPE FACTOR - An input device and method are provided that facilitate improved usability. The input device comprises an array of capacitive sensing electrodes and a processing system. The processing system is configured to receive sensing signals from the capacitive sensing electrodes and generate a plurality of sensing values. The processing system is further configured to calculate a sensing profile from the sensing values, calculate a profile span from the sensing values, and determine a shape factor from the sensing profile and the profile span. Finally, the processing system is configured to determine a number of objects in the sensing region from the determined shape factor. Thus, the sensor device facilitates the determination of the number of objects in the sensing region. | 2011-06-23 |
20110148439 | CAPACITANCE DISCRIMINATION CIRCUIT AND TOUCH SWITCH EQUIPPED WITH THE SAME - In some embodiments, a capacitance discrimination circuit includes first and second capacitors, a comparator configured to compare a first voltage of the first capacitor and a second voltage of the second capacitor, a counter circuit configured to perform a count operation based on a comparison result of the comparator, a charge circuit configured to charge the first and second capacitors, and a control circuit configured to control the charge circuit so as to charge either the first capacitor or the second capacitor based on the comparison result of the comparator. The capacitance discrimination of the first and second capacitors is performed based on count values of the counter circuit. The capacitance discrimination circuit preferably includes a discharge circuit to discharge electric charges stored in the first and second capacitors in accordance with a discharge signal from the control circuit. | 2011-06-23 |
20110148440 | PARASITIC CAPACITANCE CANCELLATION IN CAPACITIVE MEASUREMENT APPLICATIONS - An integrated circuit for compensating for parasitic capacitance in a capacitive measuring apparatus wherein a capacitance measurement is done by repeatedly transferring charge from a capacitor to be measured to a reference capacitor. | 2011-06-23 |
20110148441 | Quantum computing device and using method thereof - With a simple circuit configuration which does not conduct high frequency signal processing, a quantum computing device, a quantum bit readout processing unit of the quantum computing device, and a quantum bit readout processing method are provided. By controlling a quantum bit structure, which is formed with a counter electrode coupling with a quantum box electrode through a first tunnel barrier, with a gate voltage, a Cooper-pair extracted from the quantum box electrode after computation is accumulated in a trap electrode coupling with the quantum bit structure by sandwiching a second tunnel barrier. By coupling the trap electrode and an island electrode of a readout single electron transistor through a static capacitance, a change of electric charge in the trap electrode is read out as a direct current value of the single electron transistor. | 2011-06-23 |
20110148442 | MONITORING A SUSPENSION AND TRACTION MEANS OF AN ELEVATOR SYSTEM - A monitoring device for a suspension-and-traction apparatus of an elevator system that includes at least one electrically conductive cord contains a measurement apparatus for determining a resulting resistance. The measurement apparatus is connected to the cord with contacting elements contacting opposite ends of cord. Damage to the suspension-and-traction apparatus is detected by a contact point that can register protruding conductive parts of the cord and, in another embodiment, the contacting elements each contain a plurality of mutually differing resistance elements such that each of at least two electrically conductive cords of the suspension-and-traction apparatus is connected to the monitoring device through two of the resistance elements. | 2011-06-23 |
20110148443 | METHOD AND EQUIPMENT FOR MONITORING THE CURRENT DRAINED BY THE GROUNDING ELECTRODE IN ELECTRIC IMPEDANCE TOMOGRAPHY - There are disclosed a method and an equipment for monitoring the current drained by the grounding electrode in an electric impedance tomography system, the said grounding electrode ( | 2011-06-23 |
20110148444 | CIRCUIT FOR TESTING INTERNAL VOLTAGE OF SEMICONDUCTOR MEMORY APPARATUS - An internal voltage test circuit of a semiconductor memory apparatus includes a comparing unit for comparing a level of internal voltage with a level of external voltage to output a comparison result as an output signal during a test mode, and an output selecting unit for outputting the output signal to a data output pad during the test mode, and outputting a data signal to the data output pad during a normal operation mode. | 2011-06-23 |
20110148445 | Testing Circuit and Method - A test interface circuit operates with different types of core circuits. As consistent with various embodiments, the test interface circuit includes a test input register (TIR) configured to select an operating mode and a plurality of test point registers (TPRs). Each TPR is configured to control signals passed from the input port to a mixed-signal core circuit, responsive to the received test input signals and the operating mode selected by a TIR. In a static mode, each TPR provides serial access to digital inputs and outputs of a mixed-signal core circuit. In a bypass mode, each TPR bypasses TPR slices to preserve test time in response to the TPR being chained to other ones of the TPRs during integration of at least two mixed-signal cores. | 2011-06-23 |
20110148446 | CAPACITIVE OPENS TESTING IN LOW SIGNAL ENVIRONMENTS - An improved system for capacitive testing electrical connections in a low signal environment. The system includes features that increase sensitivity of a capacitive probe. One feature is a spacer positioned to allow the probe to be partially inserted into the component without contacting the pins. The spacer may be a collar on the probe that contacts the housing of the component, contacts the substrate of the circuit assembly, or both. In some other embodiments, the spacer may be a riser extending beyond the surface of the sense plate that contacts the component, a riser portion of the component, or a combination of both. The spacer improves sensitivity by establishing a small gap between a sense plate of the probe and pins under test without risk of damage to the pins. A second feature is a guard plate of the probe with reduced capacitance to a sense plate of the probe. Reducing capacitance also increases the sensitivity of the probe. | 2011-06-23 |
20110148447 | MULTILAYER CERAMIC SUBSTRATE AND PROBE BOARD USING PILLAR-TYPE CONDUCTOR AND FABRICATING METHODS OF THE SAME - There are provided a multilayer ceramic substrate and a probe board formed using a pillar-type conductor formed by including preparing a ceramic sheet having at least one through hole; filling the inside of the through hole with a conductive material; firing the ceramic sheet so that the conductive material is fired to form a pillar-type conductor; and removing the ceramic sheet so that the pillar-type conductor remains, and fabricating methods of the same. The multilayer ceramic substrate and the probe board use the pillar-type conductor that can fill the unfilled region formed within the ceramic sintered body, such that the electrical characteristics and surface flatness thereof are improved. In addition, the multilayer ceramic substrate and the probe board formed by using the pillar-type conductor with the improved adhesion and electrical characteristics between the ceramic sintered body and the connecting pad, and the fabricating methods of the same are provided. | 2011-06-23 |
20110148448 | LOADED PRINTED CIRCUIT BOARD TEST FIXTURE AND METHOD FOR MANUFACTURING THE SAME - A test fixture for testing loaded printed circuit boards having a plurality of test points having a probe plate including an array of widely spaced high force spring test probes in compliant contact with solid translator pins located in a translator fixture removably positioned over the probe plate. The test fixture includes optimization software wherein translation of the test signals are optimized by providing the shortest interconnect distance in the x-y plane between the test points on the printed circuit board and the test probes in the probe plate. The fixture further includes an unpowered opens device for testing components on the loaded printed circuit board. | 2011-06-23 |
20110148449 | CANTILEVER PROBE STRUCTURE FOR A PROBE CARD ASSEMBLY - A probe for a probe card assembly includes a beam and a fulcrum element. The fulcrum element is positioned between a base end portion of the beam and a tip end portion of the beam and is adapted for contact with the beam such that the beam is cantilevered by the fulcrum. | 2011-06-23 |
20110148450 | LOW CAPACITANCE PROBE FOR TESTING CIRCUIT ASSEMBLY - An improved system for capacitive testing electrical connections in a low signal environment. The system includes features that increase sensitivity of a capacitive probe. One feature is a spacer positioned to allow the probe to be partially inserted into the component without contacting the pins. The spacer may be a collar on the probe that contacts the housing of the component, contacts the substrate of the circuit assembly, or both. In some other embodiments, the spacer may be a riser extending beyond the surface of the sense plate that contacts the component, a riser portion of the component, or a combination of both. The spacer improves sensitivity by establishing a small gap between a sense plate of the probe and pins under test without risk of damage to the pins. | 2011-06-23 |
20110148451 | WIRING BOARD FOR TESTING LOADED PRINTED CIRCUIT BOARD - A wiring board for transmission of test signals between test point locations on a circuit board under test and an external analyzer having compliant contacts making electrical contact with a pad positioned on a conductive surface circuit layer having a trace extending to a second pad having a hole for receipt of an interface pin electrically connected to the external analyzer. | 2011-06-23 |
20110148452 | Systems, Circuits, and Methods For Monitoring Solar Cells of an Adaptive Solar Power System - A back sheet comprises an interconnect circuit coupling a plurality of solar cell tiles. A tiled solar cell, comprising a solar cell and encapsulating and glass layers, is inserted into the solar cell tiles. Each solar cell is individually addressable through the use of the interconnect circuit. As such, each solar cell may be individually monitored through the utilization of the interconnect circuit of the back sheet. | 2011-06-23 |
20110148453 | INSPCTING APPARATUS FOR PHOTOVOLTAIC DEVICES - Provided is an inspecting apparatus for inspecting a photovoltaic devices by applying a current to the photovoltaic devices in a forward direction to make the photovoltaic devices emit EL light which is simple in structure and capable of shortening inspection time in inspecting a defect from a photographed image with a perfect resolution. | 2011-06-23 |
20110148454 | SEMICONDUCTOR WAFER, SEMICONDUCTOR CIRCUIT, SUBSTRATE FOR TESTING AND TEST SYSTEM - A test system includes a test substrate that transmits/receives signals to/from a semiconductor wafer, and a control apparatus to control the test substrate. The semiconductor wafer includes an external terminal coupled to an external measurement circuit, a plurality of selecting wiring lines provided to receive/transmit signals to/from the corresponding the measuring points, and a selecting section that selects one of the selecting wiring lines and that allows signal transmission between the corresponding measuring point and the external terminal through the selected selecting wiring line. The test substrate includes a measurement circuit that is coupled to the external terminal of the semiconductor wafer and that measures an electrical characteristic of a signal transmitted through the selecting wiring line selected by the selecting section, and a control section that controls which one of the measurement wiring lines is to be selected by the selecting section in the semiconductor wafer. | 2011-06-23 |
20110148455 | METHOD FOR MEASURING CURRENT, METHOD FOR INSPECTING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AND TEST ELEMENT GROUP - An object is to provide a current measurement method which enables a minute current to be measured. To achieve this, the value of a current flowing through an electrical element is not directly measured, but is calculated from a change in potential observed in a predetermined period. The detection of a minute current can be achieved by a measurement method including the steps of applying a predetermined potential to a first terminal of an electrical element comprising the first terminal and a second terminal; measuring an amount of change in potential of a node connected to the second terminal; and calculating, from the amount of change in potential, a value of a current flowing between the first terminal and the second terminal of the electrical element. | 2011-06-23 |
20110148456 | Method and Device for Measuring Inter-chip Signals - A method and device for measuring a signal of a die to be placed within a package is disclosed. At least one die as a Device Under Test (DUT) is mounted on a substrate and a chip-type measurement instrument is mounted on the substrate, or embedded into the substrate, wherein the instrument analyzes and/or processes the signal of the DUT and may provide stimulus signal to the DUT. The substrate having the DUT and the measurement instrument is mounted on a circuit board that has plural electrodes to be connected to the signal paths of the DUT and the instrument. An electrode is coupled to a standard interface port to provide the signal of the chip-type instrument to an external instrument. | 2011-06-23 |
20110148457 | PROTECTING ELECTRONIC SYSTEMS FROM COUNTERFEITING AND REVERSE-ENGINEERING - An exemplary embodiment provides an efficient solution for protecting electronic systems from counterfeiting and reverse-engineering. The exemplary embodiment may determine the operation of an electronic system by control logic. The control logic may be implemented by finite state machines (FSMs). The exemplary embodiment makes the behavior of the FSMs partially reconfigurable and hiding the configuration data in a secure memory device. With the configuration data stored in a secure memory device, the exemplary embodiment obfuscates the behavior of the FSMs both from the standpoint of the foundry as well as from adversaries. | 2011-06-23 |
20110148458 | MAGNETORESISTIVE ELEMENT, LOGIC GATE AND METHOD OF OPERATING LOGIC GATE - A logic gate | 2011-06-23 |
20110148459 | DYNAMIC PHASE ALIGNMENT - Embodiments of the present disclosure provide methods and integrate circuits with dynamic phase alignment between an input data signal and a clock signal. In some embodiments, a sampling window of the input data signal may be determined and timing of the input data signal may be adjusted to enable the input data signal to be sampled within the sampling window. Other embodiments may be disclosed and claimed. | 2011-06-23 |
20110148460 | RECONFIGURABLE SEQUENCER STRUCTURE - A cell element field for data processing, having function cell means for execution of algebraic and/or logic functions and memory cell means for receiving, storing and/or outputting information is described. Function cell-memory cell combinations are formed in which a control connection leads from the function cell means to the memory cell means. | 2011-06-23 |
20110148461 | METHOD AND DEVICE FOR GENERATING AND SUPPLYING CONFIGURATION DATA FOR AND/OR TO A PROGRAMMABLE, INTEGRATED LOGIC CIRCUIT - In a method for the supply of encoded configuration data ( | 2011-06-23 |
20110148462 | Post-Programming Functional Verification for Programable Integrated Circuits - Techniques and technology are provided to enable the testing of a programmable integrated circuit from within the programmable integrated circuit itself. In various implementations of the invention, a hardware verification module is added to the programmable integrated circuit by the manufacturer. Once the programmable integrated circuit is programmed to have a desired functionality, the hardware verification module may be activated and used to apply tests and receive responses from the programmable integrated circuit to verify its functionality. | 2011-06-23 |
20110148463 | NON-VOLATILE LATCH CIRCUIT AND LOGIC CIRCUIT, AND SEMICONDUCTOR DEVICE USING THE SAME - A novel non-volatile latch circuit and a semiconductor device using the non-volatile latch circuit are provided. The latch circuit has a loop structure in which an output of a first element is electrically connected to an input of a second element and an output of the second element is electrically connected to an input of the first element through a second transistor. A transistor using an oxide semiconductor as a semiconductor material of a channel formation region is used as a switching element, and a capacitor is provided to be electrically connected to a source electrode or a drain electrode of the transistor, whereby data of the latch circuit can be retained, and a non-volatile latch circuit can thus be formed. | 2011-06-23 |
20110148464 | SEMICONDUCTOR DEVICE - A semiconductor device includes a first input buffer adjusting a logic threshold voltage, a first replica circuit, a first reference voltage generating circuit, and a first comparator circuit. The first replica circuit is identical in circuit configuration to the first input buffer. The first replica circuit has an input and an output connected to the input. The first replica circuit generates the logic threshold voltage as an output voltage. The first reference voltage generating circuit generates a first reference voltage. The first comparator circuit compares the logic threshold voltage as an output voltage of the first replica circuit to the first reference voltage to generate a first threshold adjustment signal. The first comparator circuit supplies the first threshold adjustment signal to the first input buffer and the first replica circuit. The first threshold adjustment signal allows the first input buffer to adjust the logic threshold voltage. | 2011-06-23 |
20110148465 | MERGED PROGRAMMABLE OUTPUT DRIVER - Embodiments provide input/output devices having programmable logic that is programmable to operate input/output devices in one of two drive modes. In various embodiments, to operate an input/output device in a first drive mode, logic circuitry is programmable to couple a reference voltage to a gate of a transistor element of an output driver. In various embodiments, to operate an input/output device in a second drive mode, the logic circuitry is programmable to couple a bias voltage to the gate of the transistor element of the output driver. In various embodiments, the logic circuitry may also be programmable to couple one of a plurality of data inputs to the output driver to operate an input/output device in either a single-ended mode or a differential mode. | 2011-06-23 |
20110148466 | LOGIC-CELL-COMPATIBLE DECOUPLING CAPACITOR - An integrated circuit containing CMOS logic gates and a logic-cell-compatible decoupling capacitor adjacent to the logic gates, in which the decoupling capacitor includes p+/n and n+/p capacitors, resistors between 1 and 1000 ohms connecting the capacitors to Vdd and Vss buses, and gate elements which have widths and spacings similar to the adjacent logic gates. A process of forming an integrated circuit containing CMOS logic gates and a logic-cell-compatible decoupling capacitor adjacent to the logic gates, in which the decoupling capacitor includes p+/n and n+/p capacitors, resistors between 1 and 1000 ohms connecting the capacitors to Vdd and Vss buses, and gate elements which have widths and spacings similar to the adjacent logic gates. | 2011-06-23 |
20110148467 | PHASE-DETECTOR FOR DETECTING PHASE DIFFERENCE OF [PI]2N - A basic symmetric Π/2 phase-detector receives four control signals that control a differential current at the detector's output. Each respective control signal is a linear combination of a respective pair of signals chosen from a first input signal, its logic complement, a second input signal and the logic complement of the latter. Operation is based on time-averaging the differential current, the result being zero at a phase difference of Π/2. By means of adding one or more additional current sources to the output, controlled by one or more of the control signals, the basic operation is skewed. The time-averaged output current is now made zero only at a value of the phase difference different from Π/2. In an embodiment with uniform current sources and resistors, the modified detector is configured for a phase difference of Π/2 | 2011-06-23 |
20110148468 | THRESHOLD COMPARATOR WITH HYSTERESIS AND METHOD FOR PERFORMING THRESHOLD COMPARISON WITH HYSTERESIS - A threshold comparator with hysteresis includes a comparator circuit, having a first input, for receiving an input voltage, a second input, and an output, which supplies an output voltage having a first value and a second value. A current generator, controlled by the output voltage, supplies a current to the first input in the presence selectively of one between the first value and second value of the output voltage. A selector circuit connects the second input of the comparator circuit to a first reference voltage source, which supplies a first reference voltage, in response to first edges of the output voltage, and to a second reference voltage source, which supplies a second reference voltage, in response to second edges of the output voltage, opposite to the first edges. | 2011-06-23 |