Class / Patent application number | Description | Number of patent applications / Date published |
324760010 | Test of liquid crystal device | 46 |
20100301891 | LIQUID CRYSTAL DISPLAY, TESTING METHOD THEREOF AND MANUFACTURING METHOD THEREOF - A test method of a liquid crystal display device includes driving pixel electrodes through a plurality of switching elements by applying a first test signal to a first pad and a second test signal to a second pad, and cutting a connection between a driving signal wire and a first display signal wire. The liquid crystal display device includes a first display signal wire having a plurality of a first display signal lines, a second display signal wire having a plurality of a second display signal lines that cross the first display signal lines, a plurality of switching elements each of which is connected to both of one of the first display signal lines, pixel electrodes connected to the switching elements, and a driving signal wire including first and second pads respectively connected to the first display signal wire at a near end thereof and at an intermediate portion thereof. | 12-02-2010 |
20110025363 | METHOD AND DEVICE FOR DETECTING FOREIGN PARTICLE IN LIQUID CRYSTAL DISPLAY PANEL - A method for detecting a foreign particle trapped between substrates of a liquid crystal display panel, by which a potential short caused by the particle can be made into a short with reliability, and thus it is possible to make a display defect manifest itself that is caused by the particle. The method is for detecting the presence of a foreign particle trapped between flexible substrates ( | 02-03-2011 |
20110057679 | LIQUID CRYSTAL DISPLAY DEVICE WITH DATA SWITCHING THIN FILM TRANSISTOR FOR INSPECTION AND INSPECTION METHOD THEREOF - A liquid crystal display device includes a pixel matrix where a plurality of gate lines and a plurality of data lines cross each other and a plurality of liquid crystal cells are arranged, first data switching thin film transistors respectively connected to data lines of a first group of the data lines, and second data switching thin film transistors respectively connected to data lines of a second group of the data lines. | 03-10-2011 |
20110057680 | ACTIVE DEVICE ARRAY AND TESTING METHOD - An active device array includes a plurality of scan lines, a plurality of data lines, a plurality of pixel structures, a first testing circuit, a second testing circuit, a third testing circuit and a fourth testing circuit. Each of the pixel structures is connected to one of the scan lines and one of the data lines. The first testing circuit is electrically connected to the odd scan lines; the second testing circuit is electrically connected to the (4n+1)th scan lines wherein n is zero or a positive integer; the third testing circuit is electrically connected to the even scan lines; the fourth testing circuit is electrically connected to the (4n+2)th scan lines. | 03-10-2011 |
20110260746 | BUILT-IN SELF-TEST CIRCUIT FOR LIQUID CRYSTAL DISPLAY SOURCE DRIVER - A built-in self-test (BIST) circuit for a liquid crystal display (LCD) source driver includes at least one digital-to-analog converter (DAC) and at least one buffer coupled to the respective DAC, wherein the buffer is reconfigurable as a comparator. A first input signal and a second input signal are coupled to the comparator. The first input signal is a predetermined reference voltage level. The second input signal is a test offset voltage in a test range. | 10-27-2011 |
20120062263 | TEST METHOD OF LIQUID CRYSTAL DISPLAY PANEL - A test method of a liquid crystal display panel is provided. The liquid crystal display panel includes a plurality of pixels and a testing pad. The pixels are disposed at intersections between a first, a second, and a third data lines and a plurality of scan lines. In the test method, each of the scan lines is driven to connect liquid crystal capacitors of the pixels to the first, the second, and the third data lines. A first and a second test voltages are respectively supplied to the first and the second data lines, wherein the first test voltage is not equal to the second test voltage. The first data line is floated. The floated first data line is measured through the testing pad to determine whether the liquid crystal capacitors of the pixels electrically connected to the first and the second data lines are electrically connected with each other. | 03-15-2012 |
20120062264 | TEST DEVICE - A testing device suitable for a testing apparatus with light inspection of a display panel is provided, in which the testing device includes a main part and two contact parts. The testing device is fixed to the testing apparatus with light inspection by the main part. Two contact parts are respectively extended from two ends of the main part along a first direction, and each of the contact parts has a plurality of tips. The tips of each contact part have different heights. Besides, a testing apparatus is also provided. Therefore, the abovementioned testing device and the testing apparatus are able to drastically extend the user lifetime, improve the inspection accuracy and save cost. | 03-15-2012 |
20120105092 | DEFECT INSPECTING APPARATUS AND DEFECT INSPECTING METHOD - An evaluation apparatus includes a lighting control section for lighting a liquid crystal display panel including switch-type touch sensors, a pressing section for pressing the liquid crystal display panel that is being lit, and a sensor data acquisition section for acquiring outputs from touch sensors disposed within a region of the liquid crystal display panel that is pressed by the pressing section. The pressing section is made of a material having transparency. With this apparatus, it is possible to inspect switch-type touch sensors of a liquid crystal display panel for defects by checking a display state in a region to which a load is being applied. | 05-03-2012 |
20130027074 | Voltage Test devices Used in LCD Panels and a System Thereof - A voltage test device used in liquid crystal display (LCD) panels, including test solder pads and test lines, is proposed. The test solder pads are connected to an LCD panel through the test lines. Each of the test lines includes a switch test line and a signal-inputting test line. The voltage test device further includes a first connector. The switch test line includes a first portion of the switch test line and a second portion of the switch test line. The first portion of the switch test line is connected to the second portion of the switch test line through the first connector. The first connector is used for preventing the electric current in excess of a predetermined threshold from flowing inside the LCD panel. Meanwhile, a voltage testing system used in LCD panels is proposed. | 01-31-2013 |
20130076386 | Virtual Load Board And Test System And Test Method for Liquid Crystal Display Control Board - A virtual load board includes a connection port, a conversion circuit, and an indication unit, wherein the connection port comprises at least one terminal. The terminal receives an output voltage from the liquid crystal display control board. The conversion circuit converts the output voltage into an operating voltage for the indication unit and supplies the operating voltage to the indication unit. A test system and a test method for liquid crystal display control board are also provided. With the above-discussed arrangement, the virtual load board replaces a liquid crystal display panel to carry out a reliability test of the liquid crystal display control board, and has the advantages of small volume and low cost and can be accommodated, together with the liquid crystal display control board, in reliability test equipment in order to carry out a reliability test of the liquid crystal display control board in a specific environment. | 03-28-2013 |
20130285693 | DETECTING METHOD AND DETECTING DEVICE OF ABNORMALITY OF DIFFERENTIAL SIGNAL RECEIVING TERMINAL OF LIQUID CRYSTAL DISPLAYING MODULE - A detecting method of abnormality of a differential signal receiving terminal of a liquid crystal displaying module, including: inputting high level signals to LVDS | 10-31-2013 |
20130321020 | Method for Detecting Liquid Crystal Display Panel and Detecting System - The present provide a technical solution by introducing a method of detecting a liquid crystal display panel, characterized in that the method includes a) providing an all-connection lit-up fixture having a plurality of probes. And b) performing a lit-up test by establishing an electrical coupling between the probes and a plurality of contacts on the liquid crystal display panel. By this arrangement. the liquid crystal display panel can be readily pin-pointed the defects after the shorting bar is cut off as the fixture provided can readily restore the lit-up test Accordingly, the capability of lit-up test is therefore enhanced. | 12-05-2013 |
20130335113 | METHOD FOR IMPROVED TESTING OF TRANSISTOR ARRAYS - An electronic test system to evaluate the pixel and array properties of active-matrix displays that use charge or current sensitive circuits attached to the array data lines is described. Leakage-current, charging time, and other metrics can be measured for all pixels in the array without electrical or optical connection to the interior of the array. Charge or current sensitive amplifiers and selected voltage drivers may be used in conjunction with variable timing and voltages to determine individual transistor properties over an entire array in just a few seconds. Signals to be measured may be injected in several ways. Ultimately, an output signal for each pixel is measured. Thus, based on the output signal, the charging time or current, the leakage time or current, and other pixel or transistor parameters may be characterized for the entire array. | 12-19-2013 |
20140055161 | METHOD FOR DETECTING CROSSTALK OF LIQUID CRYSTAL DISPLAY PANEL - An embodiment of the present invention discloses a method for detecting crosstalk of a liquid crystal display panel, involving detection on a liquid crystal display panel for defect of special crosstalk of the liquid crystal display panel. The method comprises: inputting signals into the liquid crystal display panel to be detected so that a detection pattern is displayed on the liquid crystal display panel to be detected; a gray-scale value for all the pixels in an intermediate region is 0; in other regions a gray-scale value for all the pixels in first pixel groups is the same, a color and gray-scale value for all the pixels in second pixel groups are the same, and the gray-scale value for all the pixels in the second pixel groups differs from that for all the pixels in the first pixel groups; the first pixel groups and the second pixel groups are same in shape, and both are distributed alternatively in both transverse and longitudinal directions in the other regions. | 02-27-2014 |
20140139254 | Method of Testing LCD Panel - A method for testing an LCD panel is proposed. The method includes: dividing a scanning period into a first sub-period and a second sub-period; in the first sub-period, inputting a first scanning signal to a first set of scan lines, inputting a first testing signal to a first set of data lines, and inputting a second testing signal to a second set of data lines; and in the second sub-period, inputting a second scanning signal to a second set of scan lines, inputting a first scanning signal to a first set of scan lines, inputting a second testing signal to a first set of data lines, and inputting a first testing signal to a second set of data lines. By using the procedure, the present invention uses the testing method in the cell process to test the image blur phenomenon. This can improve the testing ability and raise the yield. | 05-22-2014 |
20140139255 | DISPLAY PANEL AND METHOD OF DETECTING DEFECTS THEREOF - A display panel includes a first substrate, a plurality of pixel units, a plurality of first signal lines, a first testing line and a second testing line. The first signal lines are disposed on a peripheral area and electrically connected to corresponding pixel units. The first signal lines include a plurality of first sets of signal lines and a plurality of second sets of signal lines alternatively arranged. The first and second sets of signal lines are formed on different layers. The first testing line is electrically connected to the first sets of signal lines. The second testing line is electrically connected to the second sets of signal lines. | 05-22-2014 |
20140159762 | TEST APPARATUS FOR LIQUID CRYSTAL MODULE - An embodiment of the present invention provides a test apparatus for a liquid crystal module, comprising: a light up module, being configured for being coupled to the liquid crystal module to be tested for lighting up the liquid crystal module, and providing a test image to the liquid crystal module; a flickering degree obtaining module, being configured for obtaining a flickering degree of the liquid crystal module; a voltage module, being configured for being coupled to the liquid crystal module to be tested, and supplying a voltage to the liquid crystal module; a control module, being respectively coupled to the flickering degree obtaining module and the voltage module, and being configured for controlling the voltage module to output the voltage and receiving the flickering degree of the liquid crystal module in association with the corresponding voltage obtained by the flickering degree obtaining module. | 06-12-2014 |
20140361805 | TESTING CIRCUITS OF LIQUID CRYSTAL DISPLAY AND THE TESTING METHOD THEREOF - A device and method for testing a display panel are disclosed. The display panel includes a plurality of pixels arranged in a matrix. Each of the pixels is controlled by a charging gate line and a sharing gate line. The testing circuit includes a first, second, third data testing pad electrically coupling a plurality of red, green, and blue sub-pixels respectively, and k gate testing pad. The sharing gate line of m-th sub-pixel row electrically connects to the charging gate line of (m+2n)-th sub-pixel row, wherein m is a positive integer, and n is the positive integer not less than 2. A row number of the sub-pixel row is divided by k to obtain a remainder q. The q-th gate testing pad electrically connects to the charging gate lines coupled with the sub-pixel row, and k and q are positive integers. And 2n is not divisible by k. | 12-11-2014 |
20150145549 | TESTING DEVICE AND TESTING METHOD - The present invention provides a testing device and a testing method. The testing method comprises: providing a testing device; bonding at least one connecting terminal of the testing device to signal lines of the display panel; and inputting test signals to the signal lines of the display panel through at least one test contact of the testing device. In the present invention, it is not required to arrange shorting bars on the display panel. | 05-28-2015 |
20150339959 | PANEL FUNCTION TEST CIRCUIT, DISPLAY PANEL, AND METHODS FOR FUNCTION TEST AND ELECTROSTATIC PROTECTION - A panel function test circuit is able to perform a function test when a display panel is in a first state and is able to perform electrostatic protection when the display panel is in a second state, whereby the display panel requires fewer components and less wiring space. | 11-26-2015 |
20150362562 | TESTING SYSTEM FOR BACKLIGHT SOURCE - A testing system for a backlight source is provided. The testing system comprises: a power module; a first ON/OFF module; a second ON/OFF module, wherein a circuit is formed by the power module, the first ON/OFF module, and the second ON/OFF module; and a control module electrically connected to the first ON/OFF module and the second ON/OFF module respectively. The second ON/OFF module is arranged to be electrically connected in parallel with the backlight source. The control module is configured such that when receiving a control signal, the control module controls the first ON/OFF module to switch to an ON state from an OFF state, and after a predetermined time delay, the control module controls the second ON/OFF module to switch to an OFF state from an ON state so as to connect the backlight source into the circuit. | 12-17-2015 |
20160042677 | Liquid Crystal Display Device And Method For Testing Pixels Of The Same - A liquid crystal display (LCD) device and a method for testing pixels of the LCD device are disclosed, in which pixels adjacent to each other vertically are arranged in a display area to share a gate line and an auto probe test pattern of the pixels is arranged in a non-display area. The LCD device comprises a plurality of pixels arranged in a display area; and a test pattern arranged in a non-display area, for supplying a test signal to each of the plurality of pixels, wherein two pixels, which are adjacent to each other vertically, among the plurality of pixels, share a single gate line and receive data voltages from different data lines different from each other, and the test pattern includes at least one data shorting bar and at least one switching unit to supply the test signal to each of the plurality of pixels per color. | 02-11-2016 |
20160049104 | METHOD FOR DETECTING DISCONNECTION OF GATE LINE AND DETECTION APPARATUS - A detecting method and a detecting apparatus for detection of a gate line disconnection. The gate line disconnection detecting method includes step 1: providing a first unit ( | 02-18-2016 |
20160086528 | LIQUID DISPLAY PANEL AND METHOD FOR DETECTING ELECTRIC POTENTIAL GENERATED BY IONS BETWEEN LIQUID CRYSTAL LAYER AND ALIGNMENT FILM - A liquid display panel is disclosed, which comprises: a first substrate; a second substrate; a first electrode and a second electrode disposed between the first substrate and the second substrate, wherein the first electrode and the second electrode have different electric potentials; a first alignment film disposed between the first electrode and the second electrode; and a liquid crystal layer disposed between the first substrate and the second substrate, wherein when a working frequency of the liquid crystal display panel is N Hz, ionic electric potentials of the liquid crystal layer and the first alignment film satisfy the following Equation (I): | 03-24-2016 |
20160180754 | ARRAY SUBSTRATE, LIQUID CRYSTAL DISPLAY PANEL, AND DETECTING METHOD OF LIQUID CRYSTAL DISPLAY PANEL | 06-23-2016 |
20160195740 | LIQUID CRYSTAL DISPLAY | 07-07-2016 |
20160252756 | PERIPHERAL TEST CIRCUIT OF DISPLAY ARRAY SUBSTRATE AND LIQUID CRYSTAL DISPLAY PANEL | 09-01-2016 |
324760020 | Thin film transistor type (TFT) | 19 |
20110018571 | CHIP ON GLASS TYPE LCD DEVICE AND INSPECTING METHOD OF THE SAME - A COG type LCD device includes a first substrate including a display area and first, second, third and fourth non-display areas, gate and data lines in the display area on the first substrate and defining pixel regions, switching thin film transistor at each crossing portion of the gate and data lines and connected to the gate and data lines, a pixel electrode in each pixel region and connected to the thin film transistor, first testing thin film transistors in the second non-display area connected to the data lines and spaced apart from each other with a constant interval therebetween, first, second and third data testing lines connected to one ends of the data lines through the first testing thin film transistors, first, second and third data testing pads connected to the first, second and third data testing lines, respectively, data link lines in the first non-display area and connected to another ends of the data lines, second testing thin film transistors in the first non-display area and connected to the data link lines, gate link lines connected to the gate lines, third testing thin film transistors connected to the gate link lines, gate testing lines connected to the gate lines through the third testing thin film transistors, gate testing pads connected to the gate testing lines, a common testing line and a common pad in the non-display area, a second substrate spaced apart from the first substrate, a color filter layer and a common electrode sequentially formed on the second substrate, wherein the common electrode is connected to the common testing line, and a liquid crystal layer between the first and second substrates, wherein a driving IC is attached in the first non-display area. | 01-27-2011 |
20110121854 | Physical Property Measuring Method for TFT Liquid Crystal Panel and Physical Property Measuring Apparatus for TFT Liquid Crystal Panel - There is provided a physical property measuring method for a TFT liquid crystal panel, includes an impedance setting step of setting the impedance between the source and drain of a TFT of the TFT liquid crystal panel to be less than or equal to a predetermined value, a voltage application step of applying a voltage that cyclically varies to a liquid crystal layer of the TFT liquid crystal panel. And the method further includes a physical property measuring step of measuring a transient current flowing through the liquid crystal layer to which the voltage that cyclically varies is applied in the voltage application step to measure physical properties of the liquid crystal layer. | 05-26-2011 |
20120007628 | METHOD FOR CHECKING ALIGNMENT ACCURACY OF A THIN FILM TRANSISTOR - A method for checking alignment accuracy of a thin film transistor includes providing a substrate, forming a first conductive layer on the substrate, performing a first patterning process to form a gate electrode of a thin film transistor and a first terminal and a second terminal of a testing device, forming a first insulating layer covering the first terminal, the second terminal and the gate electrode on the substrate, forming a contact hole substantially corresponding to the first terminal and the second terminal in the first insulating layer, forming a pixel electrode and a connecting electrode of the testing device in the first contact hole, and performing a close/open circuit test. When the first terminal, the connecting electrode and the second terminal construct a close circuit, alignment accuracy is confirmed. When the first terminal, the connecting electrode and the second terminal construct an open circuit, alignment inaccuracy is confirmed. | 01-12-2012 |
20120119776 | TEST CIRCUIT AND TEST METHOD FOR DETECTING ELECTRICAL DEFECT IN TFT-LCD - The present disclosure discloses a test circuit and a test method for detecting a TFT-LCD electrical defect, which relates to the field of liquid crystal display and is able to distinguish effectively between a capacitive defect and a TFT defect. The test circuit for detecting a TFT-LCD electrical defect includes: a test apparatus connected with the input terminals of a first reference voltage and a second reference voltage corresponding to the same gray scale, the test apparatus controls the output terminals of the first reference voltage and the second reference voltage to output a constant voltage to a data line. The present disclosure can be applied to a liquid crystal display. | 05-17-2012 |
20130009661 | TESTING CIRCUIT FOR PSVA AND ARRAY - The present invention relates to a field of LCD technology, especially to a testing circuit for PSVA and array. The testing circuit for PSVA and array has gate signal lines, data signal lines, a first solder pad and thin-film transistors. Extension lines of the gate signal lines and the data signal lines are each connected to a drain of a corresponding one of the thin-film transistors. Sources of the thin-film transistors corresponding to the data signal lines are connected to each other and connected to the first solder pad. Gates of the thin-film transistors corresponding to the data signal lines are connected to a transfer structure on a substrate. Sources and gates of the thin-film transistors corresponding to the gate signal lines are connected to each other and connected to the transfer structure. Comparing with conventional testing circuit for PSVA and array, techniques provided by the present invention effectively reduces the number of solder pads at glass edges and simplifies complexity of overall circuit. | 01-10-2013 |
20130135003 | Test Connector, Transmission Wire, Test System and Using Method - The present invention discloses a test connector, a transmission wire, a test system, and a using method. A test connector for a low voltage differential signal transmission wire comprises a signal wire interface matching with the low voltage differential signal transmission wire, and a PCB interface matching with a PCB plate to be tested, and the signal wire interface is electrically connected with the PCB interface. In the present invention, the test connector is inserted or pulled instead of a low voltage differential signal transmission (LVDS) connection; when damaged, only the test connector needs to be replaced, and the service life of the low voltage differential signal transmission (LVDS) wire is extended greatly. Because the cost of the test connector is only less than 10% of that of the LVDS wire, loss cost can be reduced. | 05-30-2013 |
20130307575 | SWITCH CONTROL UNIT, TEST APPARATUS AND METHOD FOR LIQUID CRYSTAL CELL - The present invention discloses a switch control unit, a test apparatus and method for a liquid crystal cell. The switch control unit controls a signal input to the liquid crystal display driver and controls the output of the signal from the liquid crystal display driver accordingly, and includes a control signal generator and a switch module. The test apparatus for the liquid crystal cell comprises: a switch control unit connected with a gate driver, for controlling ON and OFF of a signal input to the gate driver and controlling ON and OFF of a gate scan signal accordingly. The test method for the liquid crystal cell comprises: inputting a test signal; controlling ON and OFF of a gate scan signal by controlling ON and OFF of a signal input to a gate driver so as to determine the badness positions on a screen. | 11-21-2013 |
20140070835 | TFT-LCD array substrate and test method for the same - The present invention discloses a TFT-LCD array substrate comprising a display area comprising a plurality of data lines and a plurality of gate lines; a peripheral area located at a periphery of the display area and provided with a first test short bar provided with a plurality of data test lines for transmitting a test signal for the data lines in the display area, and a second test short bar provided with a gate test line for transmitting a test signal for the gate lines in the display area; and a connecting device comprising a first connection layer and a second connection and provided at a connection location between one of the data test lines in the first test short bar and one of the data lines in the display area, or provided at a connection location between the gate test line in the second test short bar and one of the gate lines in the display area. The present invention also provides a corresponding test method. The present invention can achieve testing the TFT-LCD array substrate twice. | 03-13-2014 |
20140139256 | DETECTING DEVICE AND METHOD FOR LIQUID CRYSTAL PANEL - A detecting device for detecting a liquid crystal panel is provided. The detecting device includes a first detecting unit connected to data lines on the liquid crystal panel, a second detecting unit connected to scanning lines on the liquid crystal panel, and a signal generator connected to the first detecting unit and the second detecting unit; both the first detecting unit and the second detecting unit comprise a line area and connecting ports arranged on one side of the line area and connected to the signal generator; a plurality of lines are arranged on the line area, the lines having the same properties are connected together with one ends thereof respectively connected to the connecting ports and the other ends thereof connected to the corresponding signal lines arranged on the liquid crystal panel. | 05-22-2014 |
20140145744 | DISPLAY PANEL AND TESTING METHOD THEREOF - A display panel and a testing method of the display panel are provided. The display panel has a display region and a non-display region and includes a first substrate, a second substrate, and a display medium. The display panel further includes scan lines, data lines, pixel units, at least one testing line, and at least one testing pad. The scan lines and the data lines are located on the first substrate within the display region. The pixel units are located on the first substrate within the display region. Each pixel unit electrically connects one of the scan lines and one of the data lines. The testing line is located on the first substrate within the non-display region, crosses over the scan lines, and is insulated from the scan lines. The testing pad is located on the first substrate within the non-display region and electrically connected to the testing line. | 05-29-2014 |
20140203835 | THIN FILM TRANSISTOR SUBSTRATE, METHOD OF INSPECTING THE SAME, AND DISPLAY DEVICE INCLUDING THE SAME - A thin film transistor substrate, includes: pixels disposed in a display area of the thin film transistor substrate and connected to gate lines and data lines; gate pad parts connected to first ends of the gate lines; first test transistors each being connected to a second end of a corresponding gate line of the gate lines; data pad parts connected to first ends of the data lines; and second test transistors each being connected to a second end of a corresponding data line of the data lines. The gate pad parts, the data pad parts, the first test transistors, and the second test transistors are disposed in a non-display area of the thin film transistor substrate. The first test transistors are configured to be switched to receive a first inspection signal and the second test transistors are configured to be switched to receive a second inspection signal. | 07-24-2014 |
20140375347 | LINE DETECTING APPARATUS AND METHOD FOR ARRAY SUBSTRATE - A line detecting apparatus and a line detecting method for an array substrate relates to the field of line detecting technology. The detecting method comprises: arranging an input terminal sensor ( | 12-25-2014 |
20150015296 | TEST STRUCTURE, ARRAY SUBSTRATE HAVING THE SAME AND METHOD OF MEASURING SHEET RESISTANCE USING THE SAME - A test structure includes a terminal pattern, a first extending part, a second extending part and a measuring part. The terminal pattern includes a first terminal part, a second terminal part, a third terminal part and a fourth terminal part sequentially disposed and spaced apart from each other in a first direction. The first extending part is connected to the first terminal part and the second terminal part. The first extending part extends in a second direction crossing the first direction. The second extending part is connected to the third terminal part and the fourth terminal part. The second extending part extends in the second direction. The measuring part partially overlaps the first extending part and the second extending part. | 01-15-2015 |
20150097592 | DIRECT TESTING FOR PERIPHERAL CIRCUITS IN FLAT PANEL DEVICES - A method of testing a flat panel display including an array of pixels and a peripheral circuit configured to provide signals to the pixels is disclosed. The method includes applying at least one test signal to the peripheral circuit, acquiring one or more voltage images of the peripheral circuit, and detecting a defect in the peripheral circuit based on the acquired voltage images. | 04-09-2015 |
20150109018 | LIQUID CRYSTAL DISPLAY AND METHOD FOR TESTING LIQUID CRYSTAL DISPLAY - A liquid crystal display and a method for testing the liquid crystal display are disclosed. The liquid crystal display includes a TFT substrate including M scan lines and N data lines, a drive power line, and a switch unit adapted to connect the drive power line to the M scan lines under control of a control signal during a detection of a source of Mura of the liquid crystal display. The testing method includes: applying the control signal to the switch unit; applying a data signal to the N data lines; determining the source of the Mura of the liquid crystal display according to a current brightness of the liquid crystal display; and stopping applying the control signal to the switch unit. | 04-23-2015 |
20160041412 | LIQUID CRYSTAL PANEL TEST CIRCUIT - The present invention provides a liquid crystal panel test circuit, comprising a plurality of gate welding portions ( | 02-11-2016 |
20160063937 | ARRAY SUBSTRATE, DISPLAY PANEL AND DISPLAY DEVICE - The invention discloses an array substrate, a display panel and a display device, and belongs to the field of array substrate test technology, which can solve the problem that the performance of the thin film transistor at the display region of the array substrate in an ADS mode cannot be accurately tested. The array substrate in the invention comprises a plurality of pixel units, each of which comprises a pixel electrode, an insulating layer above the pixel electrode, and a common electrode above the insulating layer, wherein at least one of the pixel units is a test pixel unit, wherein an opening is provided in the insulating layer of the test pixel unit to be above the pixel electrode and separated from the common electrode. The display panel and the display device in the invention comprise the above array substrate. | 03-03-2016 |
20160148549 | LIQUID CRYSTAL DISPLAY APPARATUS - A liquid crystal display apparatus includes a collective drive lighting inspection signal input wire that electrically connects a collective drive lighting inspection terminal to a plurality of gate wires and a plurality of source wires. The collective drive lighting inspection signal input wire includes a first wire corresponding to the gate wires and a second wire corresponding to the source wires. The first wire and the second wire each include a connection wire and a lead-out wire. The connection wire includes branch points connected to each of the plurality of gate wires or each of the plurality of source wires. The lead-out wire is led out from the connection wire to the collective drive lighting inspection terminal. The lead-out wire included in the first wire or the second wire includes a high-resistance region having a resistivity greater than a resistivity of the connection wire connected to the lead-out wire. | 05-26-2016 |
20160163244 | Array Substrate and Detecting Method for an Array Substrate - Embodiments of the invention provide an array substrate and a detecting method for an array substrate. The array substrate comprises a plurality of signal lines and a repairing line intersecting with and isolated from the signal lines. The detecting method comprises applying a first detection signal to the plurality of signal lines; and applying a second detection signal different from the first detection signal to the repairing line, in the case that the first detection signal is applied to the plurality of signal lines. | 06-09-2016 |