Class / Patent application number | Description | Number of patent applications / Date published |
324750150 | With identification on device under test (DUT) | 9 |
20110227593 | SEMICONDUCTOR DEVICE AND TEST APPARATUS INCLUDING THE SAME - A semiconductor device and a test apparatus including the same, the semiconductor device including a command distributor receiving a serial command that is synchronized with a first clock signal and converting the serial command into a parallel command, a command decoder receiving the parallel command and generating a pattern sequence based on the parallel command, and a signal generator receiving the pattern sequence and generating operating signals synchronized with a second clock signal, wherein a frequency of the first clock signal is less than a frequency of the second clock signal. | 09-22-2011 |
20110309851 | Tagging of Functional Blocks of a Semiconductor Component on a Wafer - Methods and apparatus are disclosed to simultaneously, wirelessly test semiconductor components formed on a semiconductor wafer. The semiconductor components transmit respective outcomes of a self-contained testing operation to wireless automatic test equipment via a common communication channel. Multiple receiving antennas observe the outcomes from multiple directions in three dimensional space. The wireless automatic test equipment determines whether one or more of the semiconductor components operate as expected and, optionally, may use properties of the three dimensional space to determine a location of one or more of the semiconductor components. The wireless testing equipment may additionally determine performance of the semiconductor components by detecting infrared energy emitted, transmitted, and/or reflected by the semiconductor wafer before, during, and/or after a self-contained testing operation. | 12-22-2011 |
20110309852 | Simultaneously Tagging of Semiconductor Components on a Wafer - Methods and apparatus are disclosed to simultaneously, wirelessly test semiconductor components formed on a semiconductor wafer. The semiconductor components transmit respective outcomes of a self-contained testing operation to wireless automatic test equipment via a common communication channel. Multiple receiving antennas observe the outcomes from multiple directions in three dimensional space. The wireless automatic test equipment determines whether one or more of the semiconductor components operate as expected and, optionally, may use properties of the three dimensional space to determine a location of one or more of the semiconductor components. The wireless testing equipment may additionally determine performance of the semiconductor components by detecting infrared energy emitted, transmitted, and/or reflected by the semiconductor wafer before, during, and/or after a self-contained testing operation. | 12-22-2011 |
20120007624 | SEMICONDUCTOR SYSTEM AND DEVICE FOR IDENTIFYING STACKED CHIPS AND METHOD THEREOF - A semiconductor system for identifying stacked chips includes a first semiconductor chip and a plurality of second semiconductor chips. The first semiconductor chip generates a plurality of counter codes by using an internal clock or an external input clock and transmits slave address signals and the counter codes through a through-chip via. The second semiconductor chips are given corresponding identifications (IDs) by latching the counter codes for a predetermined delay time, compare the latched counter codes with the slave address signals, and communicate data with the first semiconductor chip through the through-chip via according to the comparison result. | 01-12-2012 |
20120153977 | TEST APPARATUS - To prevent an excessive current from flowing through a device under test. A test apparatus that tests a device under test, comprising a power supply section that generates a power supply voltage to be supplied to the device under test; an inductive load section that is provided in a path leading from the power supply section to the device under test; a first semiconductor switch that is provided in the path leading from the inductive load section to the device under test and is connected in parallel with the device under test; and a control section that turns the first semiconductor switch ON when supply of the power supply voltage to the device under test is stopped. | 06-21-2012 |
20130141128 | TEST DEVICE AND TEST METHOD FOR TESTING ELECTRONIC DEVICES - A test method includes: generating a start command in responses to a user input; testing each of the electronic devices in responses to the start command, and generating a test result for each of the electronic devices; obtaining a unique identifier of each of the electronic devices; obtaining the test result of each electronic device and generating a test file corresponding to each of the electronic device to record the test result; naming the test file according to the unique identifier of the corresponding electronic device; obtaining the test files, identifying the test files according to the test file name and determining whether each of the electronic devices are running in a normal state by analyzing the test result recorded in the test file. A test device using the above method is also described. | 06-06-2013 |
20130222002 | CABLE WITH WIRE DISCONNECTION DETECTION FUNCTION - A cable with a wire disconnection detection function includes a detecting wire including a conductor formed by twisting a plurality of strands, and a detected wire including a conductor formed by twisting a plurality of the strands. A twist pitch of the conductor of the detecting wire is longer than that of the conductor of the detected wire. | 08-29-2013 |
20140197857 | SYSTEM AND METHOD FOR A REMOTE CONTROL TESTER - A system and method for testing remote controls. A number of remote controls are identified. The remote controls are received on a tray of a remote control tester. The tray is positioned for testing. The number of remote controls are tested within the tray utilizing the remote control tester in response to identifying the number of remote controls. | 07-17-2014 |
20180024188 | HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP STRUCTURES | 01-25-2018 |