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PARTICULAR TYPE OF SCANNING PROBE MICROSCOPY [SPM] OR MICROSCOPE; ESSENTIAL COMPONENTS THEREOF

Subclass of:

850 - Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g., scanning probe microscopy [spm]

Patent class list (only not empty are listed)

Deeper subclasses:

Class / Patent application numberDescriptionNumber of patent applications / Date published
850033000 Atomic Force Microscopy [AFM] or apparatus therefor, e.g., AFM probes 85
850030000 Scanning Near-Field Optical Microscopy [SNOM] or apparatus therefor, e.g., SNOM probes 16
850026000 Scanning Tunnelling Microscopy [STM] or apparatus therefor, e.g., STM probes 11
850046000 Magnetic Force Microscopy [MFM] or apparatus therefor, e.g., MFM probes 8
850022000 Multiple-type SPM, i.e., involving two or more SPM techniques 3
20120204297Scanning Probe Microscope and Method of Observing Sample Using the Same - Optical information and topographic information of the surface of a sample are measured at a nanometer-order resolution and with high reproducibility without damaging a probe and the sample by combining a nanometer-order cylindrical structure with a nanometer-order microstructure to form a plasmon intensifying near-field probe having a nanometer-order optical resolution and by repeating approach/retreat of the probe to/from each measurement point on the sample at a low contact force.08-09-2012
20120198591ROOM TEMPERATURE QUANTUM FIELD EFFECT TRANSISTOR COMPRISING A 2-DIMENSIONAL QUANTUM WIRE ARRAY BASED ON IDEALLY CONDUCTING MOLECULES - One, several or very many parallel quantum wires, e.g. especially 1-dimensional quantum-conducting heavy ion tracks—“true” quantum wires at room temperature—see similarly EP1096569A1 [1] and [2], or also perhaps SWCNTs, vertically directed or also slightly tilted—up to about 45 degrees—arranged in a 2 dimensional plane, which as a 2-dimensional array interconnect the source and drain contacts of the here invented transistor, are modulated with respect to their quantum-mechanical conductivity via the strength of an applied electric or magnetic field [3], which is homogenous or variable in space locally across the 2 dimensional quantum wire array. The I-V curves of such quantum wires are measured via a double resonant tunnelling effect which allows identifying quantum effects at room temperature. A “true” quantum wire is characterized by quantized current steps and sharp current peaks in the I-V (Isd versus Usd, not just Is a versus Ugate) curve. In the ideal case the quantum wires consist of straight polyacetylene-reminiscent molecules of the cumulene form ( . . . ═C═C═C═C═C═C═ . . . ) or of the form ( . . . —C≡C—C≡C—C≡C— . . . ) which are generated by the energy deposition during the single swift (heavy) ions' passage through the insulating DLC-layer. The switching time of the transistor is determined practically solely by the switching time of the magnetic field (time constant of the “magnetic gate”), the ohmic resistance of the source-drain connection via the quantum wire array is in the conducting state practically zero. The controlling “gate”-magnetic field having a component normal to the quantum wires can be generated by a small controlling current through some inductance (embodiment 1, FIG. 08-02-2012
20090205089Method for Examining a Measurement Object, and Apparatus - The invention relates to a method for examining a measurement object (08-13-2009
850050000 Scanning Thermal Microscopy [SThM] or apparatus therefor, e.g., SThM probes 2
20130019352THERMAL PROBEAANM LIU; Bernard HaoChihAACI I ainan CityAACO TWAAGP LIU; Bernard HaoChih I ainan City TWAANM LIAO; Fang-YiAACI Taichung CityAACO TWAAGP LIAO; Fang-Yi Taichung City TWAANM CHEN; Jian-HongAACI Nantou CountyAACO TWAAGP CHEN; Jian-Hong Nantou County TW - A thermal probe includes a support element, a conductive pattern and a tip. The conductive pattern is disposed at the support element and has plural bending portions. The tip has a base and a pinpoint. The base has a first surface and a second surface which is opposite to the first surface. The pinpoint is disposed at the first surface. The second surface is connected with the conductive pattern. The bending portions are contacted with the first surface. The tip of the thermal probe is replaceable, and the user can choose the optimum combination of the tip, conductive pattern and support element according to their needs.01-17-2013
20130019353THERMAL PROBEAANM LIU; Bernard HaoChihAACI Tainan CityAACO TWAAGP LIU; Bernard HaoChih Tainan City TWAANM Liao; Fang-YiAACI Taichung CityAACO TWAAGP Liao; Fang-Yi Taichung City TWAANM Chen; Jian-HongAACI Nantou CountyAACO TWAAGP Chen; Jian-Hong Nantou County TW - A thermal probe includes a support element, a conductive pattern and a tip. The support element has a slit or a through hole and has a first surface and a second surface which is opposite to the first surface. The conductive pattern is disposed at the first surface. The tip has a base and a pinpoint. The pinpoint is disposed at the base and passes through the slit or the through hole and highlights from the first surface. The base is connected with the second surface. The tip of the thermal probe of the invention can be replaced, and user can choose the best combination of the tip, conductive pattern and support element according to their needs.01-17-2013
850043000 Scanning Ion-Conductance Microscopy [SICM] or apparatus therefor, e.g., SICM probes 2
20090260114SCANNING ION CONDUCTANCE MICROSCOPY FOR THE INVESTIGATION OF LIVING CELLS - A method for interrogating a surface using scanning probe microscopy comprises bringing a scanning probe into proximity with the surface and controlling the position of the probe relative to the surface to maintain a constant distance, characterized in that pressure is applied to the surface by a regulated flow of liquid through the probe, with subsequent monitoring of the position of the probe, wherein movement of the probe indicates a consequent movement of the surface.10-15-2009
20110131690Scanning Ion Conductance Microscopy - The subject invention concerns methods for interrogating a surface using scanning ion conductance microscopy (SICM). In one embodiment, a method of the invention comprises the steps of: 06-02-2011
Entries
DocumentTitleDate
20100071098SCANNING PROBE EPITAXY - A dual tip probe for scanning probe epitaxy is disclosed. The dual tip probe includes first and second tips disposed on a cantilever arm. The first and second tips can be a reader tip and a synthesis tip, respectively. The dual tip probe further includes a rib disposed on the cantilever arm between the first and second tips. The dual tip probe can also include a strain gauge disposed along the length of the cantilever arm.03-18-2010
20110004967BAND EXCITATION METHOD APPLICABLE TO SCANNING PROBE MICROSCOPY - Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation). An apparatus includes a band excitation signal generator; a probe coupled to the band excitation signal generator; a detector coupled to the probe; and a relevant dynamic parameter extractor component coupled to the detector, the relevant dynamic parameter extractor including a processor that performs a mathematical transform selected from the group consisting of an integral transform and a discrete transform.01-06-2011
20110296562METHOD AND DEVICE FOR ACQUIRING SIGNALS IN LASER SCANNING MICROSCOPY - A method for acquiring signals in laser scanning microscopy, includes the steps of: moving a focused optical excitation beam relative to an object to be measured so that the focus point of the beam follows a predetermined path in the space of the object; and acquiring optical measurement signals along the path according to at least one acquisition parameter; characterised in that the path of the excitation beam is determined so as to substantially minimise the variations of the optical properties of at least one portion of the environments crossed by the excitation beam between consecutive acquisitions, and in that at least one acquisition parameter among the acquisition parameters is modulated during the movement of the excitation beam. A device for implementing the method is also described.12-01-2011
20100170016RASTER NEAR FIELD MICROSCOPY IN THE MICROWAVE AND TERAHERTZ RANGES WITH A SIGNAL PROCESSING DEVICE INTERGRATED IN THE MEASURING TIP - An imaging microwave probe (07-01-2010
20090205088Optical Scanning Probe - The present invention relates to a scanning probe (08-13-2009
20100017923PREAMPLIFYING CANTILEVER AND APPLICATIONS THEREOF - Aspects of the invention are directed to piezoresponse force analysis of a material. A stimulus signal including a first frequency component is applied to a contact point on the material such that the stimulus signal actuates a portion of the material to experience a motion as a result of a piezoelectric effect. A resonant device is coupled to the contact point such that the resonant device experiences a resonant motion at the first frequency component in response to the motion of the material, the resonant motion having a greater displacement than a displacement of the motion of the material, and is substantially unaffected by mechanical properties of the material at the contact point. The resonant motion of the resonant device is detected and processed to produce a measurement representing the piezoresponse of the material at the contact point.01-21-2010
20090293160Automatic Landing Method and Apparatus for Scanning Probe Microscope Using the Same - Disclosed herein are an automatic landing method for a scanning probe microscope and an automatic landing apparatus using the same. The method comprises irradiating light to a cantilever using a light source; collecting interference fringes generated by the light being diffracted from the edge of the cantilever and then being incident to a surface of the sample; driving the tip in the sample direction until the pattern of the interference fringes reaches a predetermined pattern region (first driving); and driving the tip in the sample direction after the interference fringe pattern reached the predetermined pattern region (second driving). The method in accordance with the present invention is very effective particularly for samples having a large surface area, because it enables automatic landing of a tip according to recognition and selection of an optimal time point for individual landing steps, irrespective of adverse changes in landing conditions, such as surface irregularities of samples. Further, the present invention enables a very inexpensive and effective application of a scanning probe microscope (SPM), because it is possible to achieve rapid and reliable driving of a tip to within an approximate distance of a sample.11-26-2009
20110271412Method for Measuring a Piezoelectric Response by Means of a Scanning Probe Microscope - The piezoelectric response of a sample is measured by applying a scanning probe microscope, whose probe is in contact with the sample The probe is mounted to a cantilever and an actuator is driven by a feedback loop to oscillate at a resonance frequency f. An AC voltage with principally the same frequency f but with a phase (with respect to the oscillation) and/or amplitude varying periodically with a frequency fmod is applied to the probe for generating a piezoelectric response of the sample A lock-in detector measures the spectral components at the frequency fmod of the control signals (K, f) of the feedback loop. These components describe the piezoelectric response and can be recorded as output signals of the device. The method allows a reliable operation of the resonator at its resonance frequency and provides a high sensitivity.11-03-2011
20090265819SENSOR FOR OBSERVATIONS IN LIQUID ENVIRONMENTS AND OBSERVATION APPARATUS FOR USE IN LIQUID ENVIRONMENTS - The sensor has the self-detecting probe including a body portion, an elongated belt-like flexible substrate, connecting members, a resinous portion, and external contacts formed at the ends of the flexible substrate brought out of liquid. The probe further includes a cantilever whose base end is supported to the body portion, a strain resistive element whose resistance value varies according to the amount of displacement of the cantilever, and interconnects electrically connected with the strain resistive element. A probe tip is formed at the front end of the cantilever. The flexible substrate has an interconnect pattern sandwiched between two insulating sheets. The flexible substrate supports the body portion while the cantilever protrudes outwardly. At least one end of the flexible substrate is brought out of liquid. The connecting members connect the interconnects with the interconnect pattern. The interconnects, connecting members, and the portions of the connecting members electrically connected with the interconnect pattern are coated with the resinous portion.10-22-2009
20100017922INTEGRATED SENSING PROBES, METHODS OF FABRICATION THEREOF, AND METHODS OF USE THEREOF - Briefly described, embodiments of this disclosure include integrated sensing probes, sensing systems, methods of detecting a target compound, and the like. One exemplary integrated sensing probe, among others, includes: a substrate, a circular corrugated reflective surface, and a coaxial waveguide structure, wherein the corrugated reflective surface and the coaxial waveguide structure are disposed on the substrate, wherein the coaxial waveguide structure is positioned at the center of the circular corrugated reflective surface.01-21-2010
20110247108Sample inspection apparatuses and sample inspection methods - Sample inspection apparatuses and sample inspection methods which may include scanning a sample at high speed while inducing electrostatic force due to an electric field generated between a probe tip and the sample and generating and displaying a surface topography of the sample from a vibration displacement variation of a cantilever due to the electrostatic force.10-06-2011
20100132076Fluid Delivery for Scanning Probe Microscopy - The following invention pertains to the introduction of a gas (or fluid) around a SPM probe or nanotool™ to control chemical activity e.g. oxygen to promote oxidation, argon to inhibit oxidation or clean dry air (CDA) to inhibit moisture to control static charging due to the action of the probe or nanotools and to provide vacuum at and around the tip and substrate area. The invention can also produce electrical current for use with active electronic devices on, in or near the body of the device. In addition by use of a fluid like water, certain oils, and other liquids in conjunction with specific tip structure either electric discharge machining can be used at the tip area on the tip itself (in conjunction with a form structure on the work piece) or on a work piece beneath the tip to shape, polish and remove material at very small scales (10 microns to 1 nm or less).05-27-2010
20100011471BAND EXCITATION METHOD APPLICABLE TO SCANNING PROBE MICROSCOPY - Methods and apparatus are described for scanning probe microscopy. A method includes generating a band excitation (BE) signal having finite and predefined amplitude and phase spectrum in at least a first predefined frequency band; exciting a probe using the band excitation signal; obtaining data by measuring a response of the probe in at least a second predefined frequency band; and extracting at least one relevant dynamic parameter of the response of the probe in a predefined range including analyzing the obtained data. The BE signal can be synthesized prior to imaging (static band excitation), or adjusted at each pixel or spectroscopy step to accommodate changes in sample properties (adaptive band excitation). An apparatus includes a band excitation signal generator; a probe coupled to the band excitation signal generator; a detector coupled to the probe; and a relevant dynamic parameter extractor component coupled to the detector, the relevant dynamic parameter extractor including a processor that performs a mathematical transform selected from the group consisting of an integral transform and a discrete transform.01-14-2010
20090217426SCANNING MEASUREMENT INSTRUMENT - A scanning measurement instrument is capable of simultaneously achieving both higher accuracy and higher speed in autonomous scanning measurement. The instrument includes a path information holding unit for holding information about the path of the center position of a tip of a scanning probe at past tip center positions with respect to the current tip center position curing autonomous scanning measurement performed with the scanning probe; a path reference direction setting unit for setting an approximate straight line direction of the path as a pith reference direction; a traveling direction setting unit for setting the path reference direction as a traveling direction; a movement control unit for controlling a moving unit such that the scanning probe is moved in the traveling direction; and a normal direction setting unit for setting the normal direction of a measurement surface according to the traveling directior.08-27-2009
20100058499CANTILEVER, CANTILEVER SYSTEM, AND PROBE MICROSCOPE AND ADSORPTION MASS SENSOR INCLUDING THE CANTILEVER SYSTEM - A displacement detection portion is provided in a lever portion of a cantilever or between the lever portion and a main body portion. The displacement detection portion is provided by laminating two conductor electrodes to sandwich an insulating portion. A thickness of the insulating portion (electrode interval) is set to a value capable of detecting a variation in tunnel current due to a change in electrode interval which corresponds to a displacement of the lever portion while a predetermined voltage is applied. When the lever portion is slightly displaced, the interval between the conductor electrodes changes. Therefore, the displacement may be detected as the variation in tunnel current at high resolution with sensitivity of an exponential multiple of the change in interval.03-04-2010
20110072543MODULAR DESIGN OF A SCANNING MICROSCOPE ATTACHMENT AND ACCESSORIES - A modular laser scanning system where the laser scanner and various optical “building blocks” are contained in separate mechanical and optical modules. These modules can be combined to provide flexible systems with unique laser scanning capabilities or combinations of techniques. Additionally, the combining of these modules is achieved through the use of a mechanical and optical coupling standard.03-24-2011
20090138994MEASURING DEVICE WITH DAISY TYPE CANTILEVER WHEEL - A measuring device with a daisy type cantilever wheel enabling easier setting of a measuring head and modification head by rotating the daisy type cantilever wheel, enabling modification, adhesion of a sample, and application of a force to a sample specimen by using centrifugal force, and also enabling an easier measurement of a variation of characteristic vibration frequency and vibration amplitude of a cantilever array is provided.05-28-2009
20110231966SCANNING PROBE MICROSCOPY WITH SPECTROSCOPIC MOLECULAR RECOGNITION - A method for determining chemical characteristics of a sample, the method including directly applying a first acoustic wave at a first frequency to a probe and applying, independent of the directly applying the first acoustic wave, a second acoustic wave at a second frequency to the sample, wherein the first frequency is different than the second frequency and the first acoustic wave and the second acoustic wave are simultaneously applied to the probe and the sample, respectively, and form a coupling. The method further including applying electromagnetic energy to the sample, wherein the electromagnetic energy is absorbed by the sample causing a change in phase of the second acoustic wave. The method further including detecting an effect of the coupling and determining a spectrum of the sample based on the detecting.09-22-2011
20120066800FLUID DELIVERY FOR SCANNING PROBE MICROSCOPY - The following invention pertains to the introduction of a gas (or fluid) around a SPM probe or Nanotool™ to control chemical activity e.g. oxygen to promote oxidation, argon to inhibit oxidation or clean dry air (CDA) to inhibit moisture to control static charging due to the action of the probe or nanotools and to provide vacuum at and around the tip and substrate area. The invention can also produce electrical current for use with active electronic devices on, in or near the body of the device. In addition by use of a fluid like water, certain oils, and other liquids in conjunction with specific tip structure either electric discharge machining can be used at the tip area on the tip itself (in conjunction with a form structure on the work piece) or on a work piece beneath the tip to shape, polish and remove material at very small scales (10 microns to 1 nm or less).03-15-2012
20120304342MEASUREMENT OF THE SURFACE POTENTIAL OF A MATERIAL - During a measurement in KFM mode of the surface potential of a material (P), a detection point (11-29-2012

Patent applications in class PARTICULAR TYPE OF SCANNING PROBE MICROSCOPY [SPM] OR MICROSCOPE; ESSENTIAL COMPONENTS THEREOF

Patent applications in all subclasses PARTICULAR TYPE OF SCANNING PROBE MICROSCOPY [SPM] OR MICROSCOPE; ESSENTIAL COMPONENTS THEREOF