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Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g., scanning probe microscopy [spm]

Patent class list (only not empty are listed)

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Class / Patent application numberDescriptionNumber of patent applications / Date published
850021000 PARTICULAR TYPE OF SCANNING PROBE MICROSCOPY [SPM] OR MICROSCOPE; ESSENTIAL COMPONENTS THEREOF 147
850001000 SCANNING OR POSITIONING ARRANGEMENTS, I.E., ARRANGEMENTS FOR ACTIVELY CONTROLLING THE MOVEMENT OR POSITION OF THE PROBE 69
850052000 GENERAL ASPECTS OF SPM PROBES, THEIR MANUFACTURE, OR THEIR RELATED INSTRUMENTATION, INSOFAR AS THEY ARE NOT SPECIALLY ADAPTED TO A SINGLE SPECIFIC SPM TECHNIQUE 61
850005000 MONITORING THE MOVEMENT OR POSITION OF THE PROBE RESPONSIVE TO INTERACTION WITH THE SAMPLE 42
850008000 AUXILIARY MEANS SERVING TO ASSIST OR IMPROVE THE SCANNING PROBE TECHNIQUES OR APPARATUS, E.G., DISPLAY OR DATA PROCESSING DEVICES 28
850019000 CALIBRATION ASPECT, E.G., CALIBRATION OF PROBES 5
20110185458FORCE, PRESSURE, OR STIFFNESS MEASUREMENT OR CALIBRATION USING GRAPHENE OR OTHER SHEET MEMBRANE - Force, pressure, or stiffness measurement or calibration can be provided, such as by using a graphene or other sheet membrane, which can provide a specified number of monolayers suspended over a substantially circular well. In an example, the apparatus can include a substrate, including a substantially circular well. A deformable sheet membrane can be suspended over the well. The membrane can be configured to include a specified integer number of one or more monolayers. A storage medium can comprise accompanying information about the suspended membrane or the substrate that, with a deflection displacement response of the suspended membrane to an applied force or pressure, provides a measurement of the applied force or pressure.07-28-2011
20100192266SYSTEM AND METHOD FOR IMPROVING THE PRECISION OF NANOSCALE FORCE AND DISPLACEMENT MEASUREMENTS - A self-calibrating apparatus comprises a primary device and a test structure fabricated on an integrated circuit chip. The primary device and the test structure have at least one unknown property due to a fabrication process of the integrated circuit chip. An electrical measurand sensor is configured to measure an electrical measurand of the test structure. A controller coupled to the primary device and electrical measurand sensor. The controller is configured to calculate the at least one unknown property of the test structure based on the measured electrical measurand and use the calculated at least one unknown property to calibrate the primary device.07-29-2010
20100223697Systems for assessing and enhancing the performance of scanning probe microscopes by quantifying and enforcing symmetries and periodicities in two dimensions - Scanning probe microscope (SPM) images are enhanced by enforcing one or more symmetries that can be selected based on suitable Fourier coefficient amplitude or phase angle residuals, and/or geometric Akaike information criteria, and/or cross correlation techniques. Alternatively, this selection can be based on prior knowledge of specimen characteristics. In addition, a scanning microscope point spread function is obtained based on the evaluation of a calibration image by enforcing at least one symmetry and can be applied to other image acquisitions.09-02-2010
20100115672SCANNING PROBE EPITAXY - A dual tip probe for scanning probe epitaxy and a method of forming the dual tip probe are disclosed. The dual tip probe includes first and second tips disposed on a cantilever arm. The first and second tips can be a reader tip and a synthesis tip, respectively. The first tip can remain in contact with a substrate during writing and provide in situ characterization of the substrate and or structures written, while the second tip can perform in non-contact mode to write and synthesis nanostructures. This feature can allow the dual tip probe to detect errors in a printed pattern using the first tip and correct the errors using the second tip.05-06-2010
20120317684USING OPTICAL DEFLECTION OF CANTILEVERS FOR ALIGNMENT - A calibration leveling system and method are provided which improve printing and imaging at the nanoscale including improved tip-based deposition and nanolithography. The system can include a scanning probe instrument having a video camera with an adjustable lens. The scanner can be coupled to a one or two dimensional array of cantilevers comprising cantilever tips for imaging or printing. The scanning probe instrument has one or more motors for controlling the scanner in the z-axis. The z-axis motors position the scanner so that the cantilever tips are in a level orientation relative to the surface of a substrate. Once the cantilever tips are level with the substrate, the positions of the z-axis motors can be recorded for future reference.12-13-2012
850062000 APPLICATIONS OF SCANNING-PROBE TECHNIQUES OTHER THAN SPM 3
20090307809SCANNING PROBE MICROSCOPE AND METHOD FOR OPERATING THE SAME - The scanning probe microscope has a primary control loop (12-10-2009
20100100991Charge-Amp Based Piezoelectric Charge Microscopy (CPCM) Reading of Ferroelectric Bit Charge Signal - A device to detect polarization of a ferroelectric material comprises a probe tip, a charge amplifier electrically connected with the probe tip to convert a charge coupled to the probe tip from the ferroelectric material into an output voltage. The ferroelectric material is oscillated at a reference signal so that a charge is coupled to the probe tip and converted to an output voltage by the charge amplifier. A lock-in amplifier that receives the reference voltage and applies the reference voltage to the output voltage to extract a signal output representing the polarization.04-22-2010
20090313731MOLECULAR MANIPULATOR, A METHOD OF MAKING THE SAME, AND A METHOD OF MOVING A NANOSTRUCTURE - A molecular manipulator includes a light-sensitive molecule, including a double bond, which changes a cis-trans configuration of the double bond in response to illumination by light of a selected wavelength, and a probe, for example, a probe of a scanned-proximity probe microscope, to which the light-sensitive molecule is attached. A method of making the molecular manipulator includes covalently bonding the light-sensitive molecule to the probe. A method of moving a nanostructure includes controllably grasping, moving, and releasing the nanostructure with the molecular manipulator.12-17-2009
850063000 SCANNING-PROBE TECHNIQUES OR APPARATUS NOT OTHERWISE PROVIDED FOR 2
20120297510Cleaning Station for Atomic Force Microscope - A cleaning station for thoroughly cleaning the AFM component surfaces that are exposed to fluid during imaging of a sample supported in a fluid medium is disclosed. The cleaning station is designed to selectively expose the AFM component surfaces to cleansing agents, such as soap/detergent and water, plasma cleaning, etc., and cleaning tools, such as brushes, while protecting fluid sensitive components from exposure to the cleansing agents. The preferred embodiments are particularly beneficial for scanners in which the fluid sensitive components (actuator, sensor, connector, etc.) are integrated in the same device to which the cantilever holder is attached.11-22-2012
20090055977SCANNING NANOTUBE PROBE DEVICE AND ASSOCIATED METHOD - A method and device are provided for determining, without contact, the physical and electrical properties of nanotube materials. The device includes a scanning probe configured to generate a signal of certain frequency onto the nanotube material and measure a reflected signal from the nanotube material, and a processor coupled to the scanning probe and configured to determine the physical and electrical properties of the nanotube material from the measured reflected signal. The method includes positioning a scanning probe relative to the nanotube material, generating a signal of certain frequency onto the nanotube material, and measuring a reflected signal from the nanotube material.02-26-2009

Patent applications in class Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g., scanning probe microscopy [spm]

Patent applications in all subclasses Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g., scanning probe microscopy [spm]