Class / Patent application number | Description | Number of patent applications / Date published |
702107000 | Circuit tuning (e.g., potentiometer, amplifier) | 34 |
20080215279 | Luminaire control system and method - The present invention provides a system and method for controlling one or more light-emitting elements which are driven by forward currents to generate mixed light for use, for example, through a luminaire. The system has one or more light sensors for acquiring feedback optical sensor data and a user interface for providing reference data representative of a desired mixed light. The system also has a controller for transforming either the sensor data or the reference data into the coordinate space of the other and to determine a difference between the sensor and the reference data in that coordinate space. The controller is configured to adjust the forward currents during operating conditions so that the sensor data matches the setpoint data. The present invention also provides a system and method that can at least partially compensate certain temperature induced effects when transforming the optical sensor or the reference data. | 09-04-2008 |
20080215280 | Apparatus and method for automated adjustment and setting of APD optical receiver operation point - A method for automated calibration of an avalanche photodiode receiver includes measuring two values of avalanche photodiode biases at two successive times, measuring and comparing a bit error rate corresponding to each value. When the bit error rate of the second value is equal to or greater than the bit error rate of the first value, then a third value and a fourth value of avalanche photodiode bias closer together are measured. When the bit error rate of the fourth value is smaller than the bit error rate of the third value, two subsequent values as third value and fourth value are measured, and an optimum avalanche photodiode bias when the bit error rate of the fourth value is equal to the bit error rate of the third value is measured. | 09-04-2008 |
20080221823 | CALIBRATION CIRCUIT FOR CALIBRATING AN ADJUSTABLE CAPACITANCE OF AN INTEGRATED CIRCUIT HAVING A TIME CONSTANT DEPENDING ON SAID CAPACITANCE - A calibration circuit calibrates an adjustable capacitance of a circuit having a time constant depending on the adjustable capacitance. The calibration circuit outputs a calibration signal carrying information for calibrating the capacitor and includes a calibration loop. The calibration circuit includes: a controllable capacitance unit suitable to receive a control signal and including at least one array of switched capacitors that can be activated by the control signal, the unit being such as to output a first signal characterized by a parameter depending on the amount of capacitance of the array activated by the control signal; a comparison unit suitable to receive the first signal to assess whether the parameter meets a preset condition and to output a comparison signal representative of the assessment result; a control and timing logic unit suitable to receive the comparison signal to change this control signal based on the comparison signal, characterized in that the first signal is a logic signal and the parameter is a time parameter of the first signal. | 09-11-2008 |
20080281544 | DEVICE AND METHOD FOR CALIBRATING DATA PROCESSING APPARATUS BY TUNING FIRMWARE TRIM VALUE - A method for calibrating a data processing apparatus to set a target firmware trim value is disclosed. The data processing apparatus is for converting a non-test pattern to a non-test output according to the target firmware trim value under a normal mode. The method includes: driving the data processing apparatus to convert a test pattern into a test output according to a test firmware trim value received under a calibration mode; and analyzing the test output to tune the test firmware trim value outputted to the data processing apparatus, and controlling the data processing apparatus to store a specific test firmware trim value as the target firmware trim value when an analysis result of the test output generated in reference to the specific test firmware trim value indicates that a predetermined criterion is met. | 11-13-2008 |
20080294365 | Eliminating Inline Positional Errors for Four-Point Resistance Measurement - A method for calculating correction factors for reducing positional errors in resistance measurements using a probe having four probe arms includes: positioning the probe anus to contact a test sample; selecting a first set of first and second probe arms and a second set of third and fourth probe arms; applying a first current from the first to the second probe arms of the first set, through the sample; detecting a first voltage between the third and fourth probe arms of the second set; calculating a first resistance as a ratio of the first voltage and the first current; selecting a third set of first and second probe arms including no more than one of the probe arms of the first set, and a fourth set of third and fourth probe arms including no more than one of the probe arms of the second set; applying a second current from the first to the second probe arms of the third set, through the sample; detecting a second voltage at the third and fourth probe arms of the fourth set; calculating a second resistance as a ratio of the second voltage and the second current; and calculating a correction factor based on the first and second resistances. | 11-27-2008 |
20080306703 | Automatic Placement of Measurement Gates - A method and apparatus is provided for setting time positions of measurement gates on a signal under test. Signal transition data is calculated by a processor for multiple signal transitions. Measurement gate start and end positions are set relative to the multiple signal transitions based on the received signal transition data. | 12-11-2008 |
20090063081 | BRIDGE SENSOR CALIBRATION - An integrated circuit chip for calibrating a bridge sensor is described. The integrated circuit (IC) comprises a voltage regulator for providing a voltage to drive the sensor and the integrated circuit; a temperature sensor for measuring a temperature of the environment; a programmable gain amplifier having inputs connected to the sensor for receiving differential outputs of the sensor; a programmable offset generator for performing analog coarse calibration of the bridge sensor offset by providing an offset value to the input of the programmable gain amplifier; an analog multiplex selects either the programmable gain amplifier output or the environment temperature measurement from the temperature sensor as output; a high resolution analog-to-digital converter quantizes the output of the analog multiplex; a processor for performing digital fine calibration by calculating calibration coefficients for a selected set of parameters including the offset of the bridge sensor, temperature coefficients of the bridge sensor sensitivity and nonlinearity of the sensitivity; and a digital memory unit for storing the coarse calibration offset value and the calculated fine calibration coefficients. | 03-05-2009 |
20090093987 | Method for accurate measuring stray capacitance of automatic test equipment and system thereof - A method for measuring accurate stray capacitance of automatic test equipment (ATE) and system thereof are disclosed. The method has several steps, comprising: First of all, an internal circuit is charged and discharged several times by a driver unit; Next, the internal circuit is self-discharged, and values of voltage from V | 04-09-2009 |
20090125269 | CHANNEL RECONFIGURABLE LOGIC ANALYZER - A test and measurement instrument and a method of calibrating the test and measurement instrument including a reference signal generator; multiple input channels; and multiple input circuits. Each input channel is coupled to a corresponding input circuit; and one of the input circuits is coupled to the reference signal generator. | 05-14-2009 |
20090138226 | SYSTEMS AND METHODS FOR MEASURING NON-LINEAR CHARACTERISTICS OF A POWER AMPLIFIER - A method for measuring non-linear characteristics of a power amplifier is described. A calibration waveform is calculated during a testing procedure period. Amplitude characteristics of the calibration waveform at the output of the power amplifier are measured during the testing procedure period. Phase characteristics of the calibration waveform at the output of the power amplifier are measured during the testing procedure period. Pre-distortion techniques are configured based on the amplitude characteristics and the phase characteristics to be used during a normal operation period of a transmitter. | 05-28-2009 |
20100036634 | APPARATUS AND METHOD FOR GENERATING RESISTANCE CALIBRATION CODE IN SEMICONDUCTOR INTEGRATED CIRCUIT - A resistance calibration code generating apparatus includes a code calibration unit configured to calibrate and output code values of a resistance calibration code during predetermined cycles of a calibration clock, which are determined by a code calibration time control command, and a calibration clock generating unit configured to output the calibration clock using a code calibration command. | 02-11-2010 |
20100145651 | SELF-CALIBRATION SYSTEMS AND METHODS - Various embodiments of self-calibration systems and methods are described. One method embodiment, among others, includes imposing an alternate test to components within the device, responsive to the imposition of the alternate test, providing test responses corresponding to the components, and substantially, simultaneously mapping each of the test responses to corresponding specification values of the components. | 06-10-2010 |
20100318310 | Off-Chip Supply Of Calibration Data - The present disclosure relates to off-chip supply of calibration data. | 12-16-2010 |
20100318311 | Driver Calibration Methods and Circuits - Described are amplifiers that facilitate high-speed communication with calibrated drive strength and termination impedance. Drivers and termination elements can be divided into a number N of parallel portions, one or more of which can be disabled and updated without interfering with signal (e.g., clock or data) transmission. Some embodiments identify inactive elements by examining incoming signals. | 12-16-2010 |
20110060544 | Optical fiber current transformer with optical fiber temperature acquisition and temperature compensation - An optical fiber current transformer includes a broadband light source, a depolarizer, a beam splitter, a temperature acquisition unit, a current acquisition unit, a modulation waveform generating unit, a data processing unit and a calculating compensation unit. The broadband light source is connected with the beam splitter by the depolarizer. A first output of the beam splitter is connected with the calculating compensation unit by the temperature acquisition unit. A second output of the beam splitter is connected with the data processing unit by the current acquisition unit. The data processing unit is connected with the calculating compensation unit. The calculating compensation unit is connected with the current acquisition unit by the modulation waveform generating unit. The optical fiber current transformer uses the temperature-current compensation curve in the calculating compensation unit to synchronously process the temperature and current, thereby improving the accuracy of real-time current measurement. | 03-10-2011 |
20110166817 | METHOD FOR CALIBRATING FREQUENCY OF GM-C FILTER AND DEVICES USING THE METHOD - A method of calibrating the frequency of a g | 07-07-2011 |
20110238356 | HIGH-FREQUENCY MEASURING DEVICE AND HIGH-FREQUENCY MEASURING DEVICE CALIBRATION METHOD - A method is provided for calibrating voltage values and current values detected by a high-frequency measuring device. In a first step, a first parameter is calculated based on impedances calculated when the measuring device is connected to a first set of three reference loads and impedances of the first set of three reference loads. In a second step, plasma processing is carried out with the measuring device connected to a load to be measured, and detected voltage and current values are calibrated using the first parameter, and impedances as viewed from a connection point towards the load side are calculated based on the calibrated voltage and current values. In a third step, three impedances that encompass, when displayed on a Smith chart, a narrower range than a range encompassed by the impedances of the first set of three reference loads are determined, where the narrower range includes the impedances calculated in the second step. In a fourth step, a second parameter is calculated based on impedances calculated when the measuring device is connected to a second set of three reference loads respectively having the three impedances and also on impedances of the second set of three reference loads. In a fifth step, the measuring device is connected to the load to be measured, and detected voltage and current values are calibrated using the first parameter and the second parameter. | 09-29-2011 |
20110238357 | Self calibrating cable for a high difinition digital video interface - An HDMI cable may exhibit frequency dependent signal attenuation, inter symbol interference, and inter-pair skew. A boost device integrated with the cable can compensate for such impairments of the cable. A self calibrating cable with a boost device of the embodiment of the invention is described, in which parameters that control the response of the boost device are set optimally in a self-calibrating process comprising looping the boosted cable on itself through a calibration fixture that contains a calibration control device. The boost device includes pattern generators and a sampling circuit. Each high speed channel of the cable is separately tested and calibrated with the help of one of the other channels serving as a sampling channel. | 09-29-2011 |
20110276300 | VOLTAGE MEASUREMENT INSTRUMENT AND METHOD HAVING IMPROVED AUTOMATIC MODE OPERATION - An AC/DC voltage measuring instrument is operable in a DC mode, an AC mode, or an automatic mode. In the DC mode, an input terminal is coupled directly to an analog-to-digital converter, which generates a digital output signal indicative of the amplitude of the received signal. In the AC mode, the input terminal is coupled to an RMS circuit through a capacitor. The RMS circuit generates an output signal having an amplitude indicative of the RMS amplitude of the received signal, and this output signal is coupled to the analog-to-digital converter. In the automatic mode, the input terminal is also coupled to the RMS circuit, but it is coupled to the RMS circuit without being coupled through the capacitor. The input terminal is coupled to the RMS circuit through an amplifier, and a calibration procedure is used to compensate for any offset of the amplifier. | 11-10-2011 |
20120089359 | CALIBRATION DETECTION SYSTEM AND METHOD - An improved calibration detection system for use in calibrating an electronic apparatus includes a processor apparatus, an evaluation apparatus, and a connection apparatus. The connection apparatus includes a plurality of leads and is operated by the processor apparatus to internally switch and connect the various leads with various elements of the evaluation apparatus. By enabling all of the leads to be connected at the outset with the electronic apparatus and by internally switching the connections between the leads and the various elements of the evaluation apparatus, the calibration detection system saves time and avoids error in performing a testing protocol. | 04-12-2012 |
20120095715 | In-Situ RC-Calibration Scheme for Active RC Filter - A method of calibrating a filter includes applying an input signal into the filter to generate an output signal, measuring a phase difference between the input signal and the output signal; determining a leading/lagging status of the phase difference; calculating a capacitor code (CAP_CODE) using the leading/lagging status; and calibrating the capacitor using the CAP_CODE. | 04-19-2012 |
20120109566 | METHOD AND APPARATUS FOR CALIBRATING A TEST SYSTEM FOR MEASURING A DEVICE UNDER TEST - A calibration method for a two-port VNA includes presenting a high reflection calibration standard and measuring reflection data for each of the two ports, calculating a location of the high reflection calibration standard at each of the two ports, presenting a load calibration standard and measuring the reflection characteristic for each of the two ports to provide load data, converting the load data to the time domain to provide time domain impulse response load data, and gating the time domain impulse response load data based on the locations of the high reflection calibration standard at each of two ports. The method further includes reconstructing frequency domain load data from the gated time domain data, connecting the two ports together and determining forward and reverse transmission characteristics, and calculating systematic error coefficients for the VNA based on the reconstructed frequency domain data and the forward and reverse transmission characteristics. | 05-03-2012 |
20120185199 | User-Invoked Calibration of Modular System Using an Embedded Calibration Signal Generator - A user obtains a set of modules, inserts them into slots of a chassis, and interconnects the modules to form a modular instrument. A signal path extends through the modules. To support calibration of the signal path, a first of the modules (or the chassis or a calibration module) includes a calibration signal generator. A computer directs the first module to apply the calibration signal from the generator to the signal path, and measures the power (or amplitude) of the output of the signal path. The computer reads a factory-measured value A of the calibration signal amplitude from a memory of the first module (or the chassis or the calibration module). The value A and the measured output power of the signal path are used to determine a gain of the signal path. The system compensates for that gain when the signal path is used to measure live operational signals. | 07-19-2012 |
20120221278 | CURRENT METER WITH ON BOARD MEMORY - The accuracy and flexibility of a branch circuit monitor is improved by storing specifications, including error correction factors, for a plurality of current transformers in the monitor's memory and enabling current transformers with stored specifications to be selected for use with the monitor. | 08-30-2012 |
20130096864 | APPARATUS FOR CALIBRATING TEST VALUE OF CURRENT - An apparatus is configured for calibrating a test value of an output current of a digital power supply. The power supply has a control chip configured for detecting and outputting the test value of the output current. The apparatus includes a keyboard circuit, a digital potentiometer and a controller. The keyboard circuit is configured for inputting an actual value of the output current. The digital potentiometer is electronically connected to the control chip. The controller receives a test value and the actual value of the output current respectively from the control chip and the keyboard, determines whether the test value is equivalent to the actual value, adjusts the test value of the output current by adjusting an effective resistance of the digital potentiometer until the test value equals the actual value, and outputs the effective resistance of the digital potentiometer when the test value equals the actual value. | 04-18-2013 |
20130226495 | Method and Apparatus for Adaptive Display Calibration - A calibration system may be provided for calibrating displays in electronic devices during manufacturing. The calibration system may include calibration computing equipment and a test chamber having a light sensor. The calibration computing equipment may be configured to operate the light sensor and the display to gather display performance data. The calibration computing equipment may extract display performance statistics from the display performance data and adaptively select and perform display calibration sequences using the display performance statistics. The calibration computing equipment may be configured to determine whether or not to perform display calibration and whether or not to gather additional display performance data based on display performance statistics extracted during a preceding display calibration sequence. The calibration computing equipment may be configured to iteratively and adaptively perform display calibration sequences until a display is successfully calibrated. | 08-29-2013 |
20130226496 | PRECISE CALIBRATION OF ELECTRONIC COMPONENTS - A system for precise calibration of electronic components is disclosed. In an exemplary embodiment, an apparatus for calibrating a tunable component on an integrated circuit chip includes an on-chip reference component configured to generate a first on-chip reference level, an on-chip connector configured to couple to an external test unit component to generate a second on-chip reference level, and an on-chip memory configured to store at least one error adjustment parameter determined from a difference between the first on-chip reference level and the second on-chip reference level, and wherein the at least one error adjustment parameter is configured to calibrate the tunable component to a desired value. | 08-29-2013 |
20130275071 | APPARATUS AND METHODS FOR CALIBRATING ANALOG CIRCUITRY IN AN INTEGRATED CIRCUIT - The present disclosure provides apparatus and methods for the calibration of analog circuitry on an integrated circuit. One embodiment relates to a method of calibrating analog circuitry within an integrated circuit. A microcontroller that is embedded in the integrated circuit is booted up. A reset control signal is sent to reset an analog circuit in the integrated circuit, and a response signal for the analog circuit is monitored by the microcontroller. Based on the response signal, a calibration parameter for the analog circuit is determined, and the analog circuit is configured using the calibration parameter. Other embodiments, aspects and features are also disclosed. | 10-17-2013 |
20140200843 | Apparatus and Methods Thereof for Error Correction in Split Core Current Transformers - Apparatus and methods are provided for electrical parameter measurements at points of interest, such as circuit breakers, machines, and the like. The devices which comprise of components that may require corrections, such as the errors induced by, but not limited to, the use of a split core mounted around a current carrier, and hence calibration coefficients are provided based on test, measurements and/or calculations respective of the devices. These coefficients may be stored in a database for retrieval when calibration of measurements received from a measuring device. In one embodiment at least one of the calibration coefficients is stored on the measuring device. | 07-17-2014 |
20140257735 | CALIBRATION OF MODULAR SYSTEM USING AN EMBEDDED CALIBRATION SIGNAL GENERATOR - A user obtains a set of modules, inserts them into slots of a chassis, and interconnects the modules to form a modular instrument. A signal path extends through the modules. To support calibration of the signal path, a first of the modules (or the chassis or a calibration module) includes a calibration signal generator. A computer directs the first module to apply the calibration signal from the generator to the signal path, and measures the power (or amplitude) of the output of the signal path. The computer reads a factory-measured value A of the calibration signal amplitude from a memory of the first module (or the chassis or the calibration module). The value A and the measured output power of the signal path are used to determine a gain of the signal path. The system compensates for that gain when the signal path is used to measure live operational signals. | 09-11-2014 |
20140316735 | Protection Device and Calibration Method Thereof - The present invention discloses a protection device and a calibration method thereof. The protection device includes a sensing circuit and a detection circuit. The detection circuit includes: a comparing circuit, a setting circuit and an automatic calibration circuit. The comparing circuit is coupled to the sensing circuit and generates a protection signal according to a sensing signal and an offset setting. The setting circuit is coupled to the comparing circuit and generates the offset setting according to a calibration signal. The automatic calibration circuit is coupled between the comparing circuit and the setting circuit, for generating the calibration signal. The automatic calibration circuit automatically sets a protection threshold and stores the calibration signal which corresponds to the protection threshold. | 10-23-2014 |
20150032403 | SYSTEMS AND METHODS MITIGATING TEMPERATURE DEPENDENCE OF CIRCUITRY IN ELECTRONIC DEVICES - Methods and systems for compensating for temperature variation in the performance of electronic circuits and systems are disclosed. In some embodiments, the systems are configured to store compensation parameters determined in calibration, where the compensation parameters are used by the systems to modify performance. In some embodiments, the systems are part of an automatic test equipment (ATE) system. | 01-29-2015 |
20150032404 | METHOD AND DEVICE FOR DETERMINING THE TEMPERATURE CALIBRATION CHARACTERISTIC CURVE OF A SEMICONDUCTOR COMPONENT APPERTAINING TO POWER ELECTRONICS - The invention relates to methods and devices for determining the temperature calibration characteristic curve of a semiconductor component ( | 01-29-2015 |
20160146920 | RF PARAMETER CALIBRATION METHOD - An RF parameter calibration method comprises steps: measuring an open-circuit parameter, a short-circuit parameter and a load parameter of an RF parameter circuit of a tested object; respectively substituting measured values of the open-circuit parameter, the short-circuit parameter and the load parameter into a directivity error equation, a signal source matching error equation, and a reflection path error equation to obtain a directivity error, a signal source matching error, and a reflection path error; substituting the directivity error, the signal source matching error and the reflection path error into an RF parameter equation to work out an actual value of an RF parameter; examining whether the actual value of the RF parameter is smaller than a preset dB value; if yes, undertaking calibration; if no, returning to undertake measurements once again. The present invention can replace the expensive standard calibration kit and achieve more precise parameter calibration. | 05-26-2016 |