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Performance monitoring

Subclass of:

700 - Data processing: generic control systems or specific applications

700090000 - SPECIFIC APPLICATION, APPARATUS OR PROCESS

700095000 - Product assembly or manufacturing

Patent class list (only not empty are listed)

Deeper subclasses:

Class / Patent application numberDescriptionNumber of patent applications / Date published
700109000 Quality control 261
700111000 Worker or work station efficiency 7
Entries
DocumentTitleDate
20100161103METHOD AND SYSTEM FOR ADVANCED PROCESS CONTROL IN AN ETCH SYSTEM BY GAS FLOW CONTROL ON THE BASIS OF CD MEASUREMENTS - By controlling the flow rate of one or more gaseous components of an etch ambient during the formation of metal lines and vias on the basis of feedback measurement data from critical dimensions, process variations may be reduced, thereby enhancing performance and reliability of the respective metallization structure.06-24-2010
20110196528HISTORIANS EMBEDDED IN INDUSTRIAL UNITS - Systems and methods that provide a historian integrated as part of an industrial unit and/or product manufactured by the industrial process. A historian integrated as part of the industrial unit itself, can increase data resolution and supply immediate and real time data regarding the industrial unit's operation—while mitigating short comings of conventional PC historians. Moreover, a locator component can detect embedded historians that are distributed on the back plane of an industrial network, and integrated as part thereof.08-11-2011
20110202162Substrate processing apparatus - A substrate processing apparatus includes a display unit having an operation screen, a first control section that transmits a control instruction for processing a substrate and a second control section that performs control according to the control instruction from the first control section. The first control section has a screen file that stores screen data in which the first row is settable as item data for a data number, a data name or the like, a parameter file that stores parameter data corresponding to the item data at least, and a display control section that displays the monitor screen by executing the screen file and placing the screen data on the operation screen as a monitor screen and executing the parameter file, searching through the parameter file based on the data number and placing the parameter data corresponding to the item data.08-18-2011
20110202161SECURING A HAZARDOUS AREA IN THE REGIN SURROUNDING THE AUTOMATIC LOADING OF RRELS ON A REEL CHANGER - A hazardous area in the region surrounding a reel transport of a reel changer is secured. A contactless protective device is located at the access boundaries of the region. This protective device can be deactivated for feeding and/or removing a known object and comprises an evaluation unit. The protective device is configured as a light curtain that is comprised of a plurality of light beams that run in parallel to each other. The evaluation unit includes an assembly for detecting the sequence of the interruption of the light beams during the feeding and/or the removal of an object. Based on the detected sequence of interruption of the light beams, a known object, that is permitted to access the hazardous area, is detected. The protective device is deactivated in this situation. Securing the hazardous area further includes the provision of a second contactless protective device that is permanently active.08-18-2011
20100076584SAMPLING INSPECTION METHOD - A sampling inspection method is provided. The sampling inspection method is adapted for a multi-product production line including a plurality of tools. The sampling inspection method includes the steps of: providing a tool record, which records a sampling data of each of the tools; then checking each sampling data recorded in the tool record, and finding out at least one unsampled tool from the tools; then defining a plurality of product lots as being performed with process operations by at least one of the at least one unsampled tool; and determining at least one of the product lots for performing a sampling inspection.03-25-2010
20120245724PASSIVE RESONATOR, A SYSTEM INCORPORATING THE PASSIVE RESONATOR FOR REAL-TIME INTRA-PROCESS MONITORING AND CONTROL AND AN ASSOCIATED METHOD - Disclosed is a resonator made up of three sections (i.e., first, second and third sections) of a semiconductor layer. The second section has an end abutting the first section, a middle portion (i.e., an inductor portion) coiled around the first section and another end abutting the third section. The first and third sections exhibit a higher capacitance to the wafer substrate than the second section. Also disclosed are a process control system and method that incorporate one or more of these resonators. Specifically, during processing by a processing tool, wireless interrogation unit(s) detect the frequency response of resonator(s) in response to an applied stimulus. The detected frequency response is measured and used as the basis for making real-time adjustments to input settings on the processing tool (e.g., as the basis for making real-time adjustments to the temperature setting(s) of an anneal chamber).09-27-2012
20130138236TRAJECTORY CONTROL DEVICE - A trajectory control device controlling a trajectory of a movable portion includes a servo-system response-trajectory calculation unit that computes a servo-system response trajectory based on a position command of each movable axis, a shape-feature determination unit that outputs a shape feature amount including information of a position of a boundary point in a path shape and a running direction near the boundary point based on a determination from the position command whether the shape of the commanded path is straight or curved line, a position-vector correction unit that corrects a position vector based on the position command, the servo-system response trajectory and the shape feature amount, and outputs a corrected position command, and servo control units that control a motor of each movable axis by outputting a motor drive torque so that a position of each movable axis follows the corrected position command.05-30-2013
20090157213METHOD AND SYSTEM FOR MONITORING BATCH PRODUCT MANUFACTURING - A system and method for monitoring product through a batch manufacturing plant is provided. The system includes, a parallel flow mode when product flows concurrently from at least two units to a single unit; and a serial flow mode where product flows from one unit to another at a given time, wherein the batch manufacturing plant is modeled based on the parallel and serial flow modes. A lot association is built based on product flow and a parent/child record is created for lot association. The system also includes a data collection system that collects phase information for every unit and a procedure identifier is used to create a batch identifier, where a batch identifier is associated with each lot on each unit through which product is flowing to and/or from at a given time.06-18-2009
20090326700Method for monitoring the physical state of a hot-rolled sheet or hot-rolled strip while controlling a plate rolling train for working a hot-rolled sheet or hot-rolled strip - A method of monitoring the physical state of a hot-rolled sheet or hot-rolled strip while controlling a plate rolling train for the reversing working a hot-rolled sheet or hot-rolled strip is disclosed. For the reversing rolling of the hot-rolled sheet or hot-rolled strip a rolling stand is provided. At a starting point, an initial state of the hot-rolled sheet or hot-rolled strip in a model is determined, from which state at least one physical state variable is derived. Further, a cyclical updating of the state during the working of the hot-rolled sheet by using the model of the hot-rolled sheet or hot-rolled strip and the plate rolling train is provided, wherein monitoring of the path of the hot-rolled sheet or hot-rolled strip and operating parameters influencing and/or reproducing the state are taken into account.12-31-2009
20100268366Diagnosis System - According to an exemplary embodiment of the present invention, a diagnosis system for detecting a state of emergency during assembly of a fuselage (10-21-2010
20130073071LASER CUTTING - Laser cutting systems and methods are described herein. One or more systems include a laser generating component, an optical component, a fixture for holding a support with a part positioned on the support, and a control mechanism for adjusting at least one of the laser generating component, the optical component, and the fixture such that a ratio of a laser energy applied to the part and a part material thickness is maintained within a predetermined acceptable range at each point along a cut path to cut through the part while maintaining the integrity of the support. Other systems and methods are disclosed herein.03-21-2013
20090069922PROCESSING SYSTEM AND METHOD - A method and computer program product for monitoring one or more processes occurring during a first portion of a multi-portion recipe being executed on a processing device to obtain data concerning at least of portion of the one or more processes. At least a portion of the data is stored. The availability of the at least a portion of the data is enabled to one or more processes occurring during a second portion of the multi-portion recipe.03-12-2009
20120226374MACHINE TOOL CONTROL METHOD AND MACHINE TOOL CONTROL DEVICE - Natural vibrations of a workpiece to be obtained before and after machining of the workpiece are first input (Step S09-06-2012
20110022214Method for Monitoring Operation Behaviour of a Component of an Industrial Plant - A method for monitoring operation behaviour of a component of an industrial plant is provided. Parameter identifiers of operation parameters of the industrial plant are read from an element of a control system of the plant. Some of these parameter identifiers are selected and the selected parameter identifiers are forwarded to an element of the control system. Further, a time of a specified operation of the component is defined and behaviour of the selected parameters of the component in the defined time is used as guide model for monitoring selected parameters of the component during component operation.01-27-2011
20120095584METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND APPARATUS FOR MANUFACTURING SAME - A method for manufacturing a semiconductor device includes: irradiating a growth substrate with laser light to focus the laser light into a prescribed position inside a crystal for a semiconductor device or inside the growth substrate, the crystal for the semiconductor device being formed on a first major surface of the growth substrate; moving the laser light in a direction parallel to the first major surface; and peeling off a thin layer including the crystal for the semiconductor device from the growth substrate, a wavelength of the laser light being longer than an absorption end wavelength of the crystal for the semiconductor device or the growth substrate, the laser light being irradiated inside a crystal for the semiconductor device or inside the growth substrate.04-19-2012
20100063611SYSTEMS AND METHODS FOR REAL TIME CLASSIFICATION AND PERFORMANCE MONITORING OF BATCH PROCESSES - Systems and methods (03-11-2010
20100017008SYSTEMS AND METHODS FOR OFFLINE AND/OR ONLINE BATCH MONITORING USING DECOMPOSITION AND SIGNAL APPROXIMATION APPROACHES01-21-2010
20110282479SEWING MACHINE AND NON-TRANSITORY COMPUTER-READABLE MEDIUM STORING SEWING MACHINE CONTROL PROGRAM - A sewing machine includes a needle bar to a lower end of which a needle can be attached, a needle plate in which a needle hole is provided, an image capture device that generates, as captured image data, data that describe a captured image of a sewing object being positioned between the needle bar and the needle plate, a marker data generation device that generates, as marker data, data that describe a setting marker, the setting marker indicating a pattern position and a pattern angle, a composite image data generation device that generates, as composite image data, data that describe a composite image based on the captured image data and the marker data, and a display control device that, based on the composite image data, causes the composite image to be displayed on a screen.11-17-2011
20110301740SYSTEM AND METHOD FOR MANUFACTURING A LENS, SUCH AS AN OPHTHALMIC LENS - A system and method for manufacturing an ophthalmic lens is described. In some examples, the system applies a back surface to a lens blank that includes an aspherical curve having two radii of curvature. In some examples, a back surface of a peripheral portion of the lens follows the curvature of a front surface of the lens in order to establish a rounded, non-sharp edge to a lens blank used during the manufacturing process of a prescription eyeglass lens.12-08-2011
20110301739CONTROL SYSTEM OF SUBSTRATE PROCESSING APPARATUS, COLLECTING UNIT, SUBSTRATE PROCESSING APPARATUS AND CONTROL METHOD OF THE SUBSTRATE PROCESSING APPARATUS - There is provided a control system of a substrate processing apparatus, comprising: a collecting unit for collecting data from each component that constitutes a substrate processing apparatus, the collecting unit further comprising at least: a buffer for temporarily storing collected data; and a sorting part for rearranging the collected data, based on time data attached to the collected data.12-08-2011
20120109355SUBSTRATE PROCESSING SYSTEM - Embodiments of the present invention provide an apparatus and method for processing substrates in a processing system that has an increased system throughput, improved system uptime, and improved device yield performance, while maintaining a repeatable and accurate substrate processing. The system may include multiple processing nests laterally positionable by use of a planar motor via multiple planar movers controlled by a system controller. A substrate supported by each processing nest may be angularly positionable by a rotary actuator. The system may be used in screen printing, ink jet printing, thermal processing, device testing, and material removal processes, among others.05-03-2012
20110270431WELL PRODUCTION SHUT DOWN - A system for controlling production shut down of an underwater fluid production well, the well having a sensor for producing an output signal indicative of the state of the well and a valve which is actuable to shut down production activity of the well, comprises means for receiving the output signal; and a processor for processing the received signal to determine if a shut down is required and outputting a shut down signal to the valve; wherein the receiving means and processor are located at the well.11-03-2011
20120109354TILTING-TYPE AUTOMATIC MOLTEN METAL POURING METHOD, TILTING CONTROL SYSTEM, AND STORAGE MEDIUM HAVING TILTING CONTROL PROGRAM STORED THEREIN - A method of automatically pouring molten metal from a ladle into a mold by tilting the ladle. In the method, the height of molten metal located above a molten metal outlet and the weight of molten metal flowing out of the ladle are estimated using an expanded Kalman filter on the basis of: the weight of the molten metal flowing out of the ladle, said weight being measured using a load cell; the voltage inputted to a servo motor; the angle of tilt of the ladle measured by a rotary encoder; and the position of the ladle in the lifting and lowering direction thereof. The sum of the weight of the molten metal flowing out of the ladle when the ladle is tilted rearward, said weight being estimated from the angle of tilt of the ladle and the height of the molten metal located above the molten metal outlet estimated by the expanded Kalman filter, and the weight of the molten metal flowing out of the ladle estimated by the expanded Kalman filter are estimated as the final weight of outflowing molten metal. The estimated final weight of outflowing molten metal is determined whether or not to be greater than or equal to a specific weight of outflow, and the operation of rearward tilting of the ladle is started on the basis of the result of the determination.05-03-2012
20110137447METHOD FOR OPERATING AN INDUSTRIAL SYSTEM - The present invention relates to a method for operating an industrial system, wherein the system comprises at least one line (06-09-2011
20100280645METHOD AND MEANS FOR MANUFACTURING PRODUCTS - Method for manufacturing one or more products, comprising operation of two or more processes which are or are suspected to be subject to mutual disturbance, wherein either a process which is or which is suspected to be subject to disturb one or more of the remaining process or processes, or a process which is or which is suspected to be subject to be disturbed by one or more of the remaining processes or processes, causes an interruption or modification of the operation of the relevant remaining process or processes during a state of such potential disturbance.11-04-2010
20080208380MANUFACTURING STATION WITH IMPROVED CONTROLLER - A manufacturing station comprises a tool which performs a manufacturing operation on a part, a controller programmed by a product line which controls the tool to determine that the operation is carried out, which receives information about the manufacturing operation and communicates information about the operation, and an interface between the tool and the controller, wherein the controller is configurable to one of a multiple of manufacturing operations which correspond to the product line of the controller.08-28-2008
20090112346Method and System for Adaptive Equipment Notifications - The present invention improves on existing Equipment Fault Detection and Classification (FDC) and Equipment Automation methods and systems. Its novelty is in a new method and system to provide adaptive notifications based on the basic capability to detect interruptions and out-of-process-spec conditions at automated manufacturing or processing equipment through the existing methods of prior art. The reality of adaptive notifications is very important in order to manage the complexity of automated production environments, such as in the semiconductor and chemical industries, power generation utilities, durable goods manufacturing and food processing industry. The method and system described in the present invention result in actionable equipment notifications, which is a key differentiator. Existing methods of prior art frequently generate large quantities of data requiring further analysis before an action can be determined, and thereby consuming valuable production time.04-30-2009
20120290117VIBRATION COMPENSATION DURING TRIM AND FORM AND MARKING - A method for forming indicia on a semiconductor device package, such as laser marked or ink stamp marked indicia. The method can be performed on an apparatus, such as a production apparatus, which forms the indicia as well as performs semiconductor device trim and form operations. An embodiment of the present teachings ensures that the indicia marking process at a laser marking station does not occur simultaneously with the device trim and form operations at a trim and form station. Trim and form operations, particularly using a ram press, can impose vibrations on the laser marking station. Ensuring that laser marking does not occur simultaneously with trim and form operations removes the negative effects of vibration on the laser marking station.11-15-2012
20090143890SUBSTRATE PROCESSING APPARATUS, PROGRAM, STORAGE MEDIUM AND CONDITIONING NECESSITY DETERMINING METHOD - A control unit of a substrate processing apparatus controls a process to be performed in a chamber. The process includes a step of performing a preceding first process; a step of performing a subsequent second process after performing the first process; a step of determining whether to perform an inter-process conditioning, for arranging the environment in the chamber, during a period between the end of the first process and the start of the second process, based on information on the first process and information on the second process; and a step of performing the inter-process conditioning prior to the second process when it is determined in the determining step that the inter-process conditioning is to be performed.06-04-2009
20090118856Status indication method and status indication system - Embodiments of the present invention provide a method and system for solving a location designation problem to give specific instructions to workers as to where the device that has completed processing is in the production site, and a setup starting time designation problem to give instructions to workers as to when the setup for operation after a test is completed is conducted. One embodiment includes a means for recognizing the processing progress statuses of the devices in the production site, means for indicating the processing progress statuses of the devices, means for predicting the processing completion times of the devices, and means for indicating when a preparation (setup operation) is started for a particular device. A worker receives the processing progress statuses of the respective devices of the respective units from the means for indicating the processing progress statuses of the devices, and records the time to carry in the works to be placed in the devices to the devices and start placement from the means for indicating when a setup operation is started for a particular device.05-07-2009
20090118855Control Method for a Substrate Processing Apparatus - A substrate processing apparatus is reduced in communication cost and alleviated of the restriction on control site when the maintenance worker staying distant monitors in real-time a status change thereof.05-07-2009
20130218316ENDPOINT DETECTOR FOR A SEMICONDUCTOR PROCESSING STATION AND ASSOCIATED METHODS - A semiconductor processing apparatus includes a semiconductor processing station for a semiconductor wafer, and an endpoint detector associated with the semiconductor processing station. The endpoint detector includes a non-contact probe configured to probe the semiconductor wafer, an optical transmitter configured to transmit an optical signal to the non-contact probe, and an optical receiver configured to receive a reflected optical signal from the non-contact probe. The controller controls the semiconductor processing station based on the reflected optical signal.08-22-2013
20090143889Equipment operating status tracking system - An equipment operating status tracking system is provided, which may include a graphical user interface (GUI), a processor, and a computer-readable medium operatively coupled to the processor. The computer-readable medium may include a memory in which are stored instructions for receiving operating status data for at least one piece of equipment and automatically, initially categorizing any downtime in the operating status data as uncharacterized. The computer-readable medium may include instructions for displaying at least some of the operating status data, including the uncharacterized downtime, to a user authorized to characterize downtime. Further, the computer-readable medium may include instructions for receiving input from the authorized user to characterize the downtime by selecting from a plurality of characterization categories, each category being indicative of a different cause of downtime. In addition, the computer-readable medium may further include instructions for displaying the characterized downtime.06-04-2009
20090326699SYSTEM AND METHOD FOR MONITORING COMPLETED MANUFACTURING OPERATIONS - An electronic torque wrench having a flexible head provides accurate torque measurements irrespective of the angular position of the head relative to a handle on which the force is applied. The head includes first and second portions connected by at least three pivotal links. One of the links is used to react against the entire torque applied to the handle, regardless of the pivotal position of the handle. An electronic strain gauge on the torque-reacting link provides a measurement of the torque applied to the fastener.12-31-2009
20110224819METHOD FOR CONTROLLING CRITICAL DIMENSION IN SEMICONDUCTOR PRODUCTION PROCESS, AND SEMICONDUCTOR MANUFACTURING LINE SUPPORTING THE SAME - A critical dimension controlling method in a semiconductor production process includes determining whether a model is to undergo a discontinuous production process when a run is inserted in a semiconductor manufacturing line, applying an offset for said model or a common offset for a model group including said model according to the determination, executing a production process in dependence upon a process variation along with the offset for the model or the common offset for the model group, and measuring an actual critical dimension in the production process. The offset for the model is calculated based on a previously measured actual critical dimension, and the calculated offset for the model is applied to the calculation of the common offset for the model group.09-15-2011
20090198365COMPUTER PROGRAM PRODUCT, APPARATUS AND SYSTEM FOR MANAGING A MANUAL ASSEMBLY SEQUENCE - A computer program product, apparatus and system are disclosed for managing a manual assembly sequence by electronically referencing unique identifiers associated with physical components to be assembled in the sequence. Certain embodiments facilitate management of an assembly of a consumer product. In one embodiment, RFID tags are used as unique identifiers. Such embodiments may use RFID tags to determine the presence of the components before each assembly step in the assembly sequence and to determine that the components are being assembled in sequence. Other embodiments determine whether the components are properly assembled after being assembled, that the distance between the components falls within a predetermined range, and/or that the components for an assembly steps is properly orientation with respect to other components.08-06-2009
20110144790Thermal Sensing for Material Processing Assemblies - Various embodiments of thermal sensing systems and methods for monitoring thermal conditions in such material processing assemblies are described. The thermal sensing systems include a sensor cable that incorporates or is coupled to one or more thermal sensors. The sensor cable is positioned in the assembly and the thermal sensors provide temperature measurements. In various embodiments, the sensor cable and thermal sensors may be optical or electrical devices.06-16-2011
20100063609Multi-Spindle Phase Controlled Machining - A method of controlling a multiple spindle machine includes measuring the motor currents provided to a first spindle and a second spindle over a period of time, establishing an amount of time between impacts on a workpiece of a cutting tooth of the first spindle relative to a cutting tooth of the second spindle based on the measured motor currents of the first spindle and the second spindle, determining an angle to shift the second spindle relative to the first spindle, and increasing or decreasing the amount of time between impacts to obtain the determined shift angle for the second spindle.03-11-2010
20100161102Method of providing an identifiable powder amount and method of manufacturing an object - In a method of providing a material amount for a generative manufacturing method, a three-dimensional object (06-24-2010
20090299514FITTING ASSEMBLY EVALUATING APPARATUS AND METHODS - Methods and apparatus for evaluating characteristics of components of a mechanically attached connection are disclosed. Characteristics that may be evaluated include, but are not limited to, the position of a conduit gripping device on a conduit, an amount of axial compression or stroke of the conduit gripping device, and an amount of clamping force applied to the conduit gripping device as the conduit gripping device is axially compressed or stroked.12-03-2009
20120197426SYSTEM AND METHOD FOR GENERATING INDICES TO QUANTIFY OPERATING TRANSITION PERFORMANCE OF A CONTINUOUS PROCESS - A system and method for generating indices to quantify operating transition performance of a continuous process, such as a sheet forming process, includes a computer system that is configured to generate a normalized overall transition performance index. The overall transition performance index is formed from a plurality of individual parameter indices associated with specific production components or portions of the process line. As such, the individual parameter indices allow a user of the system to readily identify the particular portion of the continuous process line that is performing below desired levels. In addition, because the overall transition performance index is normalized, it enables comparison of the operating transition performance of multiple process lines.08-02-2012
20100161101RETRIEVING AND NAVIGATING THROUGH MANUFACTURING DATA FROM RELATIONAL AND TIME-SERIES SYSTEMS BY ABSTRACTING THE SOURCE SYSTEMS INTO A SET OF NAMED ENTITIES - A software agent is described that receives an information request to retrieve information based on a name defined by a configured manufacturing data model. The agent serves the request by relating data coming from one or multiple backend systems and adding contextual data (Metadata). A result set is prepared to correspond to the format and filtering criteria defined in the information request, and the agent produces a response in a normalized format. The response contains the requested data and metadata used for navigation and contextualization purposes. The response in the normalized format is transmitted by the agent synchronously or asynchronously based on criteria specified in the request.06-24-2010
20100228373VERSION CONTROL FOR OBJECTS IN A PROCESS PLANT CONFIGURATION SYSTEM - A version control system helps to keep track of versions of process plant items that may represent, or be capable of representing, entities in a process plant. The process plant items may comprise, for example, module objects which may be capable of specifically representing process entities of the process plant. These module objects may be created from module class objects which may be capable of generically representing process entities of the process plant. Version data is stored and associated with a module object. The version data may comprise data indicative of a version of a module class object that was used to create the module object. The version data may also comprise data indicative of a version of the module object. Configuration systems, version control systems, viewing systems, debugging systems, run-time monitoring systems, asset management systems, etc., may examine or permit viewing of the version control data associated with an item.09-09-2010
20100222912Operating method for an evaluation device for a production machine - During the production of a product by means of a production machine, an evaluation device receives actual states of components of the production machine, detected by sensors at detection times, and/or operating states of a control device of the production machine at the defined detection times. The evaluation device compares the states of each detection time transmitted thereto with pre-defined state combinations and thus determines fulfilled state combinations. For each fulfilled state combination, the evaluation device selects relevant states from the states of the respective detection time transmitted thereto, and corresponding information and the respective detection time are stored with the relevant states such that they are available for other evaluations.09-02-2010
20130144420Systems For Controlling Surface Profiles Of Wafers Sliced In A Wire Saw - Systems are disclosed for controlling the surface profiles of wafers cut in a wire saw machine. The systems and methods described herein are generally operable to alter the nanotopology of wafers sliced from an ingot by controlling the shape of the wafers. The shape of the wafers is altered by changing the temperature and/or flow rate of a temperature-controlling fluid circulated in fluid communication with bearings supporting wire guides of the saw. Different feedback systems can be used to determine the temperature of the fluid necessary to generate wafers having the desired shape and/or nanotopology.06-06-2013
20130144421Systems For Controlling Temperature Of Bearings In A Wire Saw - Systems and are disclosed for controlling the temperature of bearings in a wire saw machine. The systems described herein are generally operable to alter the nanotopology of wafers sliced from an ingot by controlling the shape of the wafers. The shape of the wafers is altered by controlling the temperature of bearings in the wire saw by changing the temperature and/or flow rate of a temperature-controlling fluid circulated in fluid communication with bearings supporting wire guides of the saw. Different feedback systems can be used to determine the temperature of the fluid necessary to generate wafers having the desired shape and/or nanotopology.06-06-2013
20110046770Apparatus for monitoring pharamceutical manufacturing processes - An apparatus for monitoring data generated by a device adapted for use in a pharmaceutical manufacturing environment are described and disclosed herein. The method creates a historic record of the pharmaceutical manufacturing process and provides it to an end user or a plurality of end users. Consequently, the methods provide a means to track the frequency of hazards associated with said device and thereby perform quality control on an integrated level whereby a pharmaceutical manufacturer can ensure data and product integrity and minimize cost.02-24-2011
20100152877COMPONENT MOUNTING METHOD, COMPONENT MOUNTING APPARATUS, METHOD FOR DETERMINING MOUNTING CONDITIONS, AND APPARATUS AND PROGRAM FOR DETERMINING MOUNTING CONDITIONS - A component mounting method for mounting a component on a substrate is used by a component mounter including: a mounting head mounting the component on the substrate; and an inspection head inspecting a surface status of the substrate. The component mounting method includes: repeatedly mounting a component to be mounted on a predetermined substrate by the mounting head; determining whether or not the component to be mounted is a predetermined component; and when the determination is made that the component to be mounted is the predetermined component, performing at least one of (i) inspecting a mounting status of the predetermined component after mounting the predetermined component and (ii) inspecting a status of a mounting surface on which the predetermined component is to be mounted, before mounting the predetermined component.06-17-2010
20110144791ENERGY SAVINGS AND GLOBAL GAS EMISSIONS MONITORING - Methods and apparatus for enhanced control, monitoring and recording of incoming chemical and power use, and emissions of electronic device manufacturing systems are provided. In some embodiments, integrated sub-fab system systems may monitor the energy usage of the sub-fab equipment. The tool can enter many different depths of energy savings modes such as idle (shallow energy savings where production equipment can recover to normal production with no quality or throughput impact in seconds), sleep (deeper energy savings where production equipment can recover in minutes), or hibernate (where production equipment may require hours to recover not to have impact on quality, or throughput) for the system. In some embodiments, the system may monitor and display all gas emissions in a sub-fab as well as the Semi S23 method reporting of CO06-16-2011
20090204249Quality Assurance Method When Operating An Industrial Machine - There is described a method for operating an industrial machine, the latter being e.g. a processing machine, a production machine or a manipulation robot. At least part of the operation of said industrial machine is simulated with the aid of a simulation model and the simulated results and real-time data from the operation of the industrial machine are stored. The simulation can be carried out in the industrial machine and if this is the case a parametric representation of the simulation model can be at least partly produced using a unit for this purpose. To produce said parametric representation, a data-systems connection can be created between the industrial machine and the unit, by means of an Intranet and/or an Internet connection. In addition, the simulation can be carried out in an external simulation unit, the latter having a data-systems connection to the industrial machine by means of an Intranet and/or an Internet connection.08-13-2009
20100063610METHOD OF PROCESS MODULES PERFORMANCE MATCHING - A method and system employing said method for analyzing process module performance in semiconductor manufacturing. The method and system include process modules as part of a process tool. A process initiated in the process module includes steps. Each step includes specified performance parameters. A detection device detects at least one predetermined measurement in the process module. A program and processor generate data about the process module and steps and generates data about the steps and the process module. The program provides statistical analysis of the steps and the environment of the process module using the generated data and the performance parameters. The program determines variations between the process step performance parameters and the generated data about the process steps.03-11-2010
20110178626SUBSTRATE TRANSFER APPARATUS, SUBSTRATE TRANSFER MODULE, SUBSTRATE TRANSFER METHOD AND COMPUTER READABLE STORAGE MEDIUM - Disclosed is a substrate transfer apparatus including a transfer arm of a joint type having an arm portion rotatably connected with a holding portion for holding a substrate, the apparatus including: a heating unit for heating the arm portion; a temperature detection unit for detecting a temperature of the arm portion; and a control unit for heating the arm portion by the heating unit prior to a start of a transfer of the substrate, allowing the transfer of the substrate after a temperature detection value obtained by the temperature detection unit reaches a preset temperature range, and then controlling the heating unit so as to maintain the temperature detection value within the preset temperature range.07-21-2011
20110251712SYSTEM FOR TRACKING SYSTEM PROPERTIES - The invention relates to a device for actively tracking specific data on systems or the components of a metallurgical system, characterized in that at least one readable and writable memory medium for the specific data is fixedly connected to each component, and the specific data are modifiable periodically and/or on the basis of input. In addition, the invention relates to a metallurgical system, in particular an integrated foundry or a mini-mill, comprising at least one device according to the invention. Finally, the invention relates to the use of at least one device according to the invention in an electric steel mill or a converter steel mill and/or in systems of secondary metallurgy and/or in casting plants, in particular continuous casting machines, and/or in molten steel transport units and/or in furnace systerms and/or in hot and cold rolling mills and/or in rolled stock treatment systems, in particular strip treatment systems.10-13-2011
20110077764COMPUTER PROGRAM PRODUCTS FOR PACKAGING APPARATUS WITH INTERCHANGEABLE HORNS - Computer program products are configured to allow dual operational modes of packaging systems to produce encased products using interchangeable first or second horns.03-31-2011
20110082580VACUUM PUMPING SYSTEMS - The present invention relates to a vacuum pumping system (04-07-2011
20100332010SEASONING PLASMA PROCESSING SYSTEMS - A system for facilitating seasoning a plasma processing chamber. The system includes a computer-readable medium storing a chamber seasoning program (or CS program). The CS program includes code for receiving a first plurality of values and a second plurality of values of a set of parameters related to operation of the plasma processing chamber. The CS program includes code for ascertaining, using the first plurality of values and the second plurality of values, whether current values of the parameters have stabilized. The CS program also includes code for determining, using the second plurality of values but not the first plurality of values, whether the current values of parameters have stabilized within a predetermined range. The system may also include circuit hardware for performing one or more tasks associated with the CS program.12-30-2010
20100004774System For Real-Time Surveillance Of Production Facility And Environmental Conditions - A real-time surveillance system of the present invention comprises a plurality of machine surveillance controllers for surveying a specific production line, the operation real time data of the production lines are collected and are transmitted via a communication interface to a server for showing on a surveillance display, so that a remote manager can effectively manage the operation state of production lines in order to achieve the purposes of reducing labor and manufacturing costs, upgrading production efficiency and improving product quality. The machine surveillance controllers are serially connected to simplify the communication cable connection in the production lines in order to facilitate the maintenance of production facility.01-07-2010
20120203370MANUFACTURING METHOD AND MANUFACTURING SYSTEM FOR PRODUCT - Manufacturing condition data stored in a storage unit of a saving device is transmitted to a control device placed in an area different from an area where the saving device is placed. The transmitted manufacturing condition data is stored in a storage unit of the control device. A manufacturing device is controlled based on the manufacturing condition data stored in the storage unit to manufacture a product. Process data for the manufacturing condition data is transmitted and stored in the storage unit. After the step of manufacturing the product, the manufacturing condition data is erased from the storage unit. The process data is transmitted to the saving device. The transmitted process data is stored in the storage unit. After the process data is transmitted to the saving device, the process data is erased from the storage unit.08-09-2012
20120203369MANUFACTURING EXECUTION SYSTEM (MES) INCLUDING A WAFER SAMPLING ENGINE (WSE) FOR A SEMICONDUCTOR MANUFACTURING PROCESS - A method of sampling semiconductor wafers includes passing a lot of semiconductor wafers into a semiconductor processing tool, processing a first portion of the lot in one process chamber of the semiconductor processing tool and a second portion of the lot in another process chamber of the semiconductor processing tool to produce processed semiconductor wafers, and initiating a wafer sampling engine to select at least one of the processed semiconductor wafers for sampling. The wafer sampling engine computes a long term process capability index for the processing tool and a short term process performance index for at least one of the processing tool and process chamber, identifies at least one desired sampling measurement type, selects the at least one of the processed semiconductor wafers for sampling, and collects the desired measurement types from the at least one of the processed semiconductor wafers selected for sampling.08-09-2012
20110160893APPLICATIONS OF SONAR-BASED VF/GVF METERING TO INDUSTRIAL PROCESSING - The present invention provides a new and unique processor module that features one or more modules configured to respond to one or more input signals containing information about a volumetric flow of a fluid having minerals and varying amounts of entrained gas flowing in a pipe and being processed in a processing stage of a mineral extraction processing system for extracting a mineral from ore, and also configured to provide one or more output signals containing information about operations of the processing stage of the mineral extraction processing system that is not substantially affected by the varying amounts of entrained gas in the fluid flowing in the pipe. The one or more output signals may be used to control the operations of the processing stage. The one or more input signals may be based at least partly on a speed of sound measurement, including a SONAR-based entrained gas measurement to determine the amount of entrained air in conjunction with a density measurement of the fluid flowing in the pipe.06-30-2011
20090138116SYSTEM FOR RELIABLE COLLABORATIVE ASSEMBLY AND MAINTENANCE OF COMPLEX SYSTEMS - A system and method of tracking location and orientation of power tools utilized in the assembly and maintenance of complex systems is disclosed. The system can facilitate collaboration between maintenance and alert maintenance personnel to complete complex system activities.05-28-2009
20120065762Methods For Selecting Transportation Parameters For A Manufacturing Facility - Methods for selecting transportation parameters for transporting parts from at least one point of part supply to at least one point of part demand in a manufacturing facility include determining a physical relationship between the at least one point of part supply and the at least one point of part demand, selecting a transportation route type from a preselected group of transportation route types based at least in part on the physical relationship, selecting an automated guided carrier type from a preselected group of automated guided carrier types based at least in part on the transportation route type, determining a need for traffic control based at least in part on the transportation route type, and if it is determined traffic control is needed, selecting a traffic control type from a preselected group of traffic control types based at least in part on the transportation route type.03-15-2012
20100305739SYSTEMS AND METHODS FOR CONTROLLING PHASING OF ADVANCING SUBSTRATES IN ABSORBENT ARTICLE CONVERTING LINES - The present disclosure relates to systems and processes for controlling the relative positions or phasing of advancing substrates and/or components in absorbent article converting lines. The systems and methods may utilize feedback from technologies, such as vision systems, sensors, remote input and output stations, and controllers with synchronized embedded clocks to accurately correlate component placement detections and placement control on an absorbent article converting process. The systems and methods may accurately apply the use of precision clock synchronization for both instrumentation and control system devices on a non-deterministic communications network. In turn, the clock synchronized control and instrumentation network may be used to control the substrate position. As such, the controller may be programmed to the relative positions of substrates and components along the converting line without having to account for undeterminable delays.12-02-2010
20110022212BOTTLENECK DEVICE EXTRACTING METHOD AND BOTTLENECK DEVICE EXTRACTING ASSISTANCE DEVICE - A method and system of specifying a device of root cause of impeding the productivity in consideration of even mutual influence among processes of production fluctuation with respect to the subject of specifying a device in which productive capacity is reduced due to a problem that the productive capacity of device is changed due to Production that one machine works for multiple process and a problem that the productive capacity of device is changed due to High product mix and low product volume production. A measure for changing productive capacity of devices intentionally and simulating influence to the whole production system, a measure for measuring mutual influence among processes of production fluctuation produced by the simulation and a measure for specifying a device of root cause of impeding the productivity on the basis of the measured result are provided.01-27-2011
20110022213DETECTING DEVICE AND DETECTING METHOD - A detecting device for preventing a substrate from being scratched by an apparatus and a detecting method using the same is provided. The device comprises a detecting substrate, a controlling module, a transmitting module and a monitoring module. The controlling module detects a position information of a contact point between the apparatus and the detecting substrate and transmits the position information to the transmitting module. The transmitting module transmits the position information received from the controlling module to the monitoring module. The monitoring module determines the coordinates of the contact point between the apparatus and the detecting substrate according to the position information. The detecting substrate can be employed to simulate the substrate used in the real manufacture process of the TFT-LCD so that the apparatus in each step can be detected before the real manufacture process is performed. Thus, the apparatus can be adjusted before the real manufacture process is performed, and therefore the substrate can be effectively prevented from being scratched by the apparatuses in the real manufacture process.01-27-2011
20110022211COOKING METHODS AND A COOKING APPARATUS FOR USE WITH SAME - The present invention relates to a cooking control method performed by a cooking apparatus for a food item. The method comprises obtaining a unique identifier and cooking data for the food item, and checking for a record of the unique identifier in a memory of the cooking apparatus. If a record of the unique identifier is located in the memory, then the cooking apparatus will not cook the food item. Otherwise a cooking process based on the cooking data to cook the food item is performed. Accordingly, cooking data for a given instance of a food item can only be used once in order to activate a cooking process performed by the cooking apparatus. The present invention also features product recall as well as the ability to track food item sales via a cooking data communications system.01-27-2011
20110137446PLASMA PROCESSING SYSTEM CONTROL BASED ON RF VOLTAGE - A method for controlling a plasma processing system using wafer bias information derived from RF voltage information is proposed. The RF voltage is processed via an analog or digital methodology to obtain peak voltage information at least for each of the fundamental frequencies and the broadband frequency. The peak voltage information is then employed to derive the wafer bias information to serve as a feedback or control signal to hardware/software of the plasma processing system.06-09-2011
20090292385AUTOMATED THROUGHPUT CONTROL SYSTEM AND METHOD OF OPERATING THE SAME - An automated throughput control system and method is provided. By gathering tool specific information of a plurality of process tools on entity level, appropriate throughput related performance characteristics may be calculated with high statistical significance during moderately short time intervals. Moreover, the performance characteristics obtained from tool information may be compared to reference data, for instance provided by dynamic simulation calculations, to identify high, as well as low, performing equipment on the basis of standard process control mechanisms.11-26-2009
20100023152Wireless manufacturing line control - This device is a wireless tool monitor assembly line interface. The current embodiment of this new tool monitor has the ability to communicate with multiple different tool types. Pneumatic, electric, click based torque tools, and strain gauge torque transducers can all be outfitted with a radio. Once outfitted with a radio, and programmed to communicate with a common protocol, all of these devices can communicate with the tool monitor. The device is especially useful with a plurality of wireless qualifiers for monitoring and controlling a plurality of wireless tools wherein the wireless qualifiers are configured to send wireless signals to the wireless interface: a plurality of wireless tools configured to send wireless signals to the wireless qualifiers; and a wireless self-contained internal power supply located in the transducer housing.01-28-2010
20110218661METHOD FOR INDIVIDUAL TRACKING OF METALLIC HOLLOW BODIES - The invention relates to a method for the individual tracking of metallic hollow bodies, in particular hot-fabricated steel tubes, wherein following a final step of hot-work the individual tube is provided with a distinctive identification on the tube circumference, which is read in the feed region to the subsequent manufacturing or test stations automatically as a video image during transport and independently from the direction of transport. According to the invention, the labeling of the tube circumference is carried out in at least two segment-like sections, the tube circumference being divided, wherein the labeling is carried out in segments with a rotation of less than 360 DEG of the numbering unit and the segments comprise an axial offset relative to the longitudinal axis of the tube, which is greater than the width of the data matrix code.09-08-2011
20110118863METHODS AND APPARATUS FOR CONTROLLING A PLASMA PROCESSING SYSTEM - A method and apparatus for compensating a bias voltage at the wafer by measuring RF voltage signals in RF driven plasma including at least an electrostatic, chuck (ESC), a capacitive divider, a signal processing and signal conditioning network is disclosed. The bias compensation device includes a capacitive divider to detect the RF voltage at the ESC, a signal conditioning network for the purpose of filtering specific RF signals of interests, and a signal processing unit for computing the DC wafer potential from the filtered RF signals.05-19-2011
20090248188SMART MACHINE TOOL LUBRICATION SYSTEM - A smart machine tool lubrication system monitors the distance traveled by a motion component in a machine tool. A predetermined amount of lubricant is dispensed at a lubrication point of the motion component when the monitored distance exceeds a first threshold value. The smart machine tool lubrication system may further monitor the duration of time the motion component is in motion and dispense the predetermined amount of lubricant with the monitored duration of time exceeds a second threshold value.10-01-2009
20120150332Systems and Methods for Controlling Registration of Advancing Substrates in Absorbent Article Converting Lines - The present disclosure relates to systems and processes for controlling the registration of advancing substrates in absorbent article converting lines. The systems and methods may utilize feedback from technologies, such as vision systems, sensors, remote input and output stations, and controllers with synchronized embedded clocks to accurately correlate registration feature detections and substrate speed control on an absorbent article converting process. The systems and methods may accurately apply the use of precision clock synchronization for both instrumentation and control system devices on a non-deterministic communications network. In turn, the clock synchronized control and instrumentation network may be used to control the substrate speed. As such, the controller may be programmed to track registration features on substrates and components along the converting line without having to account for undeterminable delays.06-14-2012
20120150331Systems and Methods for Controlling Phasing of Advancing Substrates in Absorbent Article Converting Lines - The present disclosure relates to systems and processes for controlling the relative positions or phasing of advancing substrates and/or components in absorbent article converting lines. The systems and methods may utilize feedback from technologies, such as vision systems, sensors, remote input and output stations, and controllers with synchronized embedded clocks to accurately correlate component placement detections and placement control on an absorbent article converting process. The systems and methods may accurately apply the use of precision clock synchronization for both instrumentation and control system devices on a non-deterministic communications network. In turn, the clock synchronized control and instrumentation network may be used to control the substrate position. As such, the controller may be programmed to the relative positions of substrates and components along the converting line without having to account for undeterminable delays.06-14-2012
20120310402CONTROL APPARATUS AND METHOD FOR CONTROLLING A PRINTED-PRODUCT PROCESSING SYSTEM - For controlling a printed product processing system (12-06-2012
20100292825PROCESS CONTROL OF AN INDUSTRIAL PLANT11-18-2010
20120010743STATISTICAL ANALYSIS METHOD AND SUBSTRATE PROCESS SYSTEM - A data analyzing method includes receiving monitor data from the substrate processing apparatus; producing representative value data based on the monitor data; associating apparatus condition information indicating a condition of the substrate processing apparatus at the time of production of the monitor data, with the representative value data; storing the representative value data and the apparatus condition information associated with the representative value data and in a database; retrieving the representative value data and the apparatus condition information associated with the representative value data from the database; comparing an exclusion parameter with the retrieved apparatus condition information, the exclusion parameter including information indicating whether the retrieved representative value data should be included in analysis processing targets; and determining whether the retrieved representative value data should be included in the analysis processing targets, based on the comparison result.01-12-2012
20110166689CONCRETE MATERIAL DISPENSING SYSTEM - A control system for a concrete plant adds intelligent capabilities in the concrete plant that may enhance safety, localize control of the concrete plant, and assist with troubleshooting. The control system may also enhance accuracy for determining an amount of mixed concrete dispensed, or amounts of concrete ingredients to dispense, and may eliminate the need for equipment used to verify the amount of mixed concrete or concrete ingredients dispensed.07-07-2011
20120016508SEMICONDUCTOR FABRICATION APPARATUS AND TEMPERATURE ADJUSTMENT METHOD - A semiconductor fabrication apparatus includes a semiconductor wafer mounting table having a cavity therein; and a nozzle which jets a liquefied temperature adjustment medium having a temperature equal to or less than a targeted temperature to an inner wall of the cavity in order to adjust a temperature of the semiconductor wafer mounting table to the targeted temperature. The semiconductor fabrication apparatus further includes a pressure detecting unit for detecting an internal pressure of the cavity; and a vacuum pump which discharges gas within the cavity such that a pressure detected by the pressure detecting unit becomes equal to or more than a saturated vapor pressure related to the temperature of the temperature adjustment medium jetted from the nozzle and equal to or less than a saturated vapor pressure related to the targeted temperature.01-19-2012
20120022679ADVANCED PROCESS CONTROL OPTIMIZATION - A method for automatic process control (APC) performance monitoring may include, but is not limited to: computing one or more APC performance indicators for one or more production lots of semiconductor devices; and displaying a mapping of the one or more APC performance indicators to the one or more production lots of semiconductor devices.01-26-2012
20100228372PER-STATION START TIME CONSTRAINT - A per-station start time scheduler identifies a station that is unavailable to perform a task over a time interval. The scheduler identifies a plurality of stations and a start time of a task. The scheduler monitors each of the plurality of stations using a station time constraint corresponding to the task. Upon detecting that a station is unavailable to perform a task over a time interval, the scheduler sends a notification specifying the station that is unavailable to perform the task.09-09-2010
20080294280PROCESSING CONDITION DETERMINING METHOD AND APPARATUS, DISPLAY METHOD AND APPARATUS, PROCESSING APPARATUS, MEASUREMENT APPARATUS AND EXPOSURE APPARATUS, SUBSTRATE PROCESSING SYSTEM, AND PROGRAM AND INFORMATION RECORDING MEDIUM - In a first process, a process A, an actually measured transfer position measured by a measurement/inspection instrument is indicated by a black circle. A targeted transfer position indicated by x in a process B is located at the same position as the black circle. Assuming that the weights in the subsequent processes are the same, a targeted transfer position X11-27-2008
20120065763SUBSTRATE PROCESSING SYSTEM, SUBSTRATE PROCESSING APPARATUS AND DISPLAY METHOD OF SUBSTRATE PROCESSING APPARATUS - Provided are a substrate processing apparatus, a display method thereof, and a substrate processing system capable of detecting any change in the condition of each component of a substrate processing apparatus. In the substrate processing system including the substrate processing apparatus for processing a substrate and a group management apparatus connected thereto, the substrate processing apparatus is configured to acquire monitor data representing at least the condition of each component of the substrate processing apparatus, aggregate a plurality of the monitor data to generate package data including at least one of a maximum value, an average value, and a minimum value of the monitor data, and transmit the package data to the group management apparatus. The group management apparatus is configured to receive the package data from the substrate processing apparatus and readably store the same therein.03-15-2012
20120072001REMOTE MONITORING AND CONTROL OF A THREE-DIMENSIONAL OBJECT IN A FABRICATION APPARATUS - A three-dimensional object fabrication apparatus. A housing encloses a work area. An interface is provided in the housing permit a processor within the housing to receive digital data defining geometry for a three-dimensional object to be fabricated. A fabrication mechanism forms a portion of the object by addition of material substantially consistent with the digital data for a corresponding portion of the geometry received by the processor. A camera to images a portion of the fabrication process, e.g., molding or assembly. The images are transmitted via an interface over a wide area network to permit a user to monitor the process imaged. A user interface is provided to permit the user to send commands to the fabrication apparatus from various devices that access the wide area network.03-22-2012
20120158168SYSTEM AND METHOD FOR DETERMINING WHETHER AN ULTRASONIC HORN IS ALIGNED WITH AN ANVIL - A system and a method for determining whether an ultrasonic horn is aligned with an anvil of an ultrasonic welding system are provided. The first and second accelerometer sensors generate first and second signals indicative of first and second accelerations of first and second positions on a bracket coupled to the anvil when the ultrasonic horn is vibrating and contacting the anvil. The system further includes a microprocessor that receives the first and second signals. The microprocessor determines a difference between an amplitude of the first signal at a first time and an amplitude of the second signal at the first time. The microprocessor stores a first identifier value in a memory device indicating that the ultrasonic horn is aligned with the anvil if the difference between the amplitude of the first signal and the amplitude of the second signal is less than or equal to a threshold value.06-21-2012
20110066274MANUFACTURING SYSTEM PERFORMANCE ANALYSIS TOOL SOFTWARE ARCHITECTURE - A method for analyzing performance of a manufacturing system includes constructing a descriptive representation of the manufacturing system, selectively binding the descriptive representation to an analytical module using a software isolation layer, invoking the analytical module, and utilizing an output of the analytical module using an end-user application program configured to utilize the output.03-17-2011
20110035041Systems and methods for feed control of rolled stock raw materials - System and method for controlling the feed of a raw material disposed on a roll into a continuous or semi-continuous production process are provided. According to the disclosure, a user-defined amount of remnant material that is desirably left on the core of a roll of material when the roll is to be considered is depleted is provided as a process input, and a system according to the disclosure repeatedly evaluates and relates the stop length of material that passes through a process when a production line is stopped, the remnant material amount, and the amount of material currently present on a roll at various times during unwinding of the roll during process operation. Use of a system and/or method as provided enables operators of processes using rolled stock as a raw material to achieve heretofore un-attainably small amounts of scrap generation due to remnant material left on the roll's core.02-10-2011
20110106288SYSTEM FOR USE IN PERFORMANCE OF INJECTION MOLDING OPERATIONS - There is provided a system for use in performance of injection molding operations, wherein the system can include a plurality of injection molding assembly components. In one embodiment, the system can be operative so that various information respecting components of the system can be recorded within a component database. The component database can be a computer implemented database and in one embodiment can be utilized to output information that indicates past and/or present conditions prevailing within the system.05-05-2011
20100094448METHOD AND SYSTEM FOR CONTROLLING SEMICONDUCTOR MANUFACTURING EQUIPMENT - A method for controlling semiconductor manufacturing equipment in a waiting mode, comprising: 04-15-2010
20120221138METAL ORGANIC CHEMICAL VAPOR DEPOSITION DEVICE AND TEMPERATURE CONTROL METHOD THEREFOR - The present invention provides a metal organic chemical vapor deposition device and a temperature control method therefor. The device comprises: a chamber; a susceptor which is installed inside the chamber to allow rotation therein, wherein at least one substrate is settled thereon; a plurality of heaters which heat the susceptor, wherein the temperature is independently controlled; a gas sprayer which is positioned in the upper part of the susceptor, and sprays gases of group III and V toward the susceptor; a plurality of temperature detection sensors which are positioned in the upper part of the susceptor, and measure the temperature of heating regions heated by each heater; and a controller which retains temperature setting values necessary for the heating regions, and controls the temperature of the heating regions by comparing sensing temperature values detected by each temperature detection sensor with the setting values necessary for the heating regions. According to the present invention, the metal organic chemical vapor deposition device and the temperature control method therefor can uniformly apply necessary temperature ramping to the entire substrates during process by effectively adjusting the temperature conditions essential for every epitaxial process in the metal organic chemical vapor deposition device, which carries out the process by changing the temperature up to 1200° C. from room temperature. Therefore, the invention improves process efficiency and deposition uniformity.08-30-2012
20120130525ADAPTIVE AND AUTOMATIC DETERMINATION OF SYSTEM PARAMETERS - A MIMO optimizer is used to identify tunable process parameters for processing equipment.05-24-2012
20120215338SUBSTRATE CARTRIDGE, SUBSTRATE-PROCESSING APPARATUS, SUBSTRATE-PROCESSING SYSTEM, SUBSTRATE-PROCESSING METHOD, CONTROL APPARATUS, AND METHOD OF MANUFACTURING DISPLAY ELEMENT - A substrate cartridge includes a cartridge main body that houses a substrate and an information-maintaining section that is housed in the cartridge main body and maintains information that includes at least specification information of specification values of the substrate housed in the cartridge main body.08-23-2012
20100174394APPARATUS FOR THE REMOVAL OF BOTTLES OR CONTAINERS FROM A BOTTLE OR CONTAINER CLEANING ARRANGEMENT IN A BOTTLE OR CONTAINER FILLING PLANT - An apparatus for the removal of bottles or containers from a bottle or container cleaning arrangement in a bottle or container filling plant. The abstract of the disclosure is submitted herewith as required by 37 C.F.R. §1.72(b). As stated in 37 C.F.R. §1.72(b): A brief abstract of the technical disclosure in the specification must commence on a separate sheet, preferably following the claims, under the heading “Abstract of the Disclosure.” The purpose of the abstract is to enable the Patent and Trademark Office and the public generally to determine quickly from a cursory inspection the nature and gist of the technical disclosure. The abstract shall not be used for interpreting the scope of the claims. Therefore, any statements made relating to the abstract are not intended to limit the claims in any manner and should not be interpreted as limiting the claims in any manner.07-08-2010
20100298964APPARATUS AND METHOD FOR NON-CONTACT SENSING OF TRANSPARENT ARTICLES - A laser-based displacement detector is used to detect cosmetic coatings applied to one surface of the transparent article and thereby determine which side is uppermost when loaded into the laser processing system. In particular, articles that are transparent to visible light and are particularly difficult to orient properly in laser processing systems are oriented using a laser-based displacement detector in conjunction with a partial coating on the article.11-25-2010
20100298963DEVICE AND METHOD FOR TRACKING THE MOVEMENT OF A TOOL OF A HANDLING UNIT - A description is given of a device (11-25-2010
20120221137MACHINE TOOL COMPRISING A DEVICE FOR COLLISION MONITORING - A numerically controlled machine tool for machining a workpiece is provided. The machine tool includes a work spindle, at least one feed axis, and a device for collision monitoring on said machine tool, wherein the device for collision monitoring includes a collision sensor mounted on a machine part of the machine tool, collision detection means for detecting a collision of machine parts of the machine tool when a measuring value detected by the collision sensor exceeds a collision limit value, and signal output means for outputting a stop signal for stopping the at least one work spindle and the at least one feed axis, of the machine tool when the collision detection means detects a collision. The machine tool includes a unit for determining the collision limit value on the machine tool.08-30-2012
20090326701Method and device for adjusting gap dimensions and/or an offset between a vehicle hood and the remaining vehicle body - The invention relates to a method and a device (12-31-2009
20090024238Substrate Processing Apparatus - A substrate processing apparatus includes a display unit having an operation screen, a first control section that transmits a control instruction for processing a substrate and a second control section that performs control according to the control instruction from the first control section. The first control section has a screen file that stores screen data in which the first row is settable as item data for a data number, a data name or the like, a parameter file that stores parameter data corresponding to the item data at least, and a display control section that displays the monitor screen by executing the screen file and placing the screen data on the operation screen as a monitor screen and executing the parameter file, searching through the parameter file based on the data number and placing the parameter data corresponding to the item data.01-22-2009
20120271446NUMERICAL CONTROLLER - When performing the processing while changing the position and the posture of the tool relative to the work, if the speed of the tool tip point relative to the work is regularly controlled while greatly changing the tool posture, the speed of each driving shaft of the machine is increased, whereby the interference may be generated. In order to solve the problem, in the numerical controller which obtains the position of each driving shaft of the machine performing the determination of the feeding speed, the interpolation and the coordinate conversion according to the relative instruction path and the instruction speed of the tool tip point relative to the work instructed to the processing program, when determining the feeding speed, the reference point is provided on the tool or the table, the translation speed of the reference point viewed from the mechanical coordinate system is set to the observation target speed, the reference feeding speed is obtained so that the observation target speed is a predetermined reference speed, and the smaller of the reference feeding speed and the instruction feeding speed is set to the feeding speed.10-25-2012
20120323354Systems and Methods for Making Panels from Sheet Material Using Adaptive Control - A system for forming a building panel of a desired shape includes a shaping machine comprising multiple rollers, wherein the shaping machine is configured to provide a desired shape to a building panel, and wherein the building panel is made from sheet material. A drive system moves the building panel longitudinally along the shaping machine, and a power source provides power to the drive system. As the building panel is moved along the shaping machine, a load sensor detects a load placed on the power source, and an optional speed sensor detects a speed of the building panel. A control system controls the drive system in response to a signal from the load sensor so as to control the load on the power source as the building panel moves along the shaping machine.12-20-2012
20120101619MEASUREMENT METHOD AND MEASUREMENT SYSTEM USING THE SAME - Example embodiments relate to a measurement method of measuring lots with improved process efficiency. The measurement method may include calculating a measurement capability (indicating a degree to which members to be measured may be processed per unit time in a measurement device); allocating the measurement capability according to a processing device and a processing condition; and calculating a measurement ratio of the lots processed by the processing device and the processing condition.04-26-2012
20100168898CONTROL SYSTEM AND METHOD FOR DISPLAY OF INJECTION MOLDING MACHINE - A control system for controlling the display of an injection molding machine (IMM) includes a human machine interface (HMI), a driver, a controller, a timer, and a time display module. The controller controls the driver to drive the IMM to do a plurality of operations. The time display module controls the HMI to display working times of operations that have been done, and the working time of an operation that is in process in the current work cycle. The timer records working time of each operation by starting to time at the beginning of each operation, and stopping timing at the end of each operation.07-01-2010
20080255696Software Factory Health Monitoring - A method, system, and computer-readable medium for maintaining a health of a software factory that creates custom software in a standardized manner is presented. In a preferred embodiment, the method includes the steps of: defining work packets to perform sub-functions of a custom software; tracking a transmission of the work packets to an assembly line in a software factory; monitoring any retrieval of software artifacts that are used to create the work packets; monitoring any on-going changes of work activities that are contained in the work packets; determining if execution of the work packets conforms to governance guidelines for the software factory; monitoring the software factory to ensure that the work packets comply with an architecture of the software factory; tracking quality metrics for an execution of the work packets in an assembly line in the software factory; and transmitting all tracked and monitored information described above to a dashboard.10-16-2008
20080255695METHOD FOR MANAGING WIRELESS DEVICES USING LIFECYCLE ANALYSIS - An improved solution for managing wireless devices that uses lifecycle analysis is provided. In an embodiment of the invention, the method for managing wireless devices includes obtaining data regarding at least one new wireless device; automatically evaluating a feasibility of redeploying at least one of a plurality of pre-existing wireless devices, based on the data regarding the at least one new wireless device; and identifying a distribution for the at least one of the plurality of pre-existing wireless devices, based on the automatically evaluating. In another embodiment, the distribution may include cascading and/or retiring the pre-existing wireless device(s).10-16-2008
20080243287Methods and Apparatuses for Monitoring Steam Turbine Valve Assemblies - The present application provides for apparatuses and methods for monitoring steam turbine valve assemblies. In one embodiment of the present application a method for monitoring valve assemblies is provided. First, the vibration characteristics of at least one valve assembly prior to operation may be measured. Next, the behavior of that valve assembly may be monitored during operation of the valve assembly, then compared to the vibration characteristics determined prior to operation. Comparing the valve assembly behavior monitored during operation to the valve assembly characteristics measured prior to operation may allow for estimating the stress levels experienced by the valve assembly during operation.10-02-2008
20080228304Line Balance Control Method, Line Balance Control Apparatus, and Component Mounting Machine - To provide a line balance control method, a line balance control apparatus, and a component mounting machine, which do not require a higher-level device. A production line 09-18-2008
20130178970METHOD AND SYSTEM FOR PROVIDING MONITORING CHARACTERISTICS IN AN SOA BASED INDUSTRIAL ENVIRONMENT - The invention relates to a method and system for providing monitoring characteristics in an industrial environment on the basis of a service oriented architecture (SOA), for the purpose of allowing monitoring of changes in state of a process and/or of production equipment of an industrial plant. The changes in state are obtained by analyzing feature-based monitoring characteristics provided as a service by components of the industrial plant to be monitored as monitoring components. Service orchestrators generate new model-based monitoring characteristics using physical or logical rules of a process model. The model-based monitoring characteristics are provided as a service and can be provided by means of a service-oriented network for arbitrary linking in a control system comprising a service orchestrator.07-11-2013
20130096710TRACKING SYSTEM AND METHOD FOR SOLAR CELL MANUFACTURING - A system and method of manufacturing solar panels whereby parameters about how each cell, each array and each panel are recorded in a database or electronic memory. The cells, arrays and panels are also provided an identification, such as a bar code, to allow for subsequent retrieval of the parameters. The electronic memory is arranged so that different cells, arrays and panels that share the same parameters can be identified.04-18-2013
20130144419INTEGRATED CIRCUIT MANUFACTURING TOOL CONDITION MONITORING SYSTEM AND METHOD - A system and method for monitoring a process tool of an integrated circuit manufacturing system are disclosed. An exemplary method includes defining zones of an integrated circuit manufacturing process tool; grouping parameters of the integrated circuit manufacturing process tool based on the defined zones; and evaluating a condition of the integrated circuit manufacturing process tool based on the grouped parameters.06-06-2013
20100318212Method for Measuring Thermo-Optically Induced Material Phase-Change Response in a Multiple Layer Thin Film Structure Using Visible and Ultraviolet Spectroscopy - A method and device for facilitating measurement of thermo-optically induced material phase change response in a thin planar or a grating film stack is disclosed. The method may include using small-spot visible and ultraviolet spectra (ellipsometric or reflectance) for measuring a material phase change response. The device may include a measurement system platform, at least one electrical resistor, at least one external electric probe, and ohmic contact circuitry.12-16-2010
20110313558METHODS AND SYSTEMS FOR MONITORING A PARAMETER OF A MEASUREMENT DEVICE DURING POLISHING, DAMAGE TO A SPECIMEN DURING POLISHING, OR A CHARACTERISTIC OF A POLISHING PAD OR TOOL - Methods and systems for monitoring a parameter of a measurement device during polishing, damage to a specimen during polishing, a characteristic of a polishing pad, or a characteristic of a polishing tool are provided. One method includes scanning a specimen with a measurement device during polishing of a specimen to generate output signals at measurement spots on the specimen. The method also includes determining if the output signals are outside of a range of output signals. Output signals outside of the range may indicate that a parameter of the measurement device is out of control limits. In a different embodiment, output signals outside of the range may indicate damage to the specimen. Another method includes scanning a polishing pad with a measurement device to generate output signals at measurement spots on the polishing pad. The method also includes determining a characteristic of the polishing pad from the output signals.12-22-2011
20120029678INDUSTRIAL AUTOMATION INTERFACES INTEGRATED WITH ENTERPRISE MANUFACTURING INTELLIGENCE (EMI) SYSTEMS - A visualization system integrated with an enterprise manufacturing intelligence (EMI) system utilizing preconfigured EMI data models, workflow reports and process event notifications to optimize a manufacturing process. The visualization system and the EMI system exchange data and information providing both systems with a broader process view than either system has independently. The visualization system can specifically target information and action requests to different classes of manufacturing personnel such as operators and engineers. Additionally, the visualization system maintains an audit log of all production identities, raw material usage, and requested corrective actions.02-02-2012
20130211570BUILD UP EDGE MONITORING METHOD - A build up edge monitoring method is provided for performing online real-time detection and suppression of abnormal build up edges of cutters occurred in a CNC manufacturing process. Signal variation analysis and fast Fourier transform are used for analyzing signals and establishing an algorithm of diagnosing build up edges to improve the efficiency and reliability of the cutting abnormality diagnostics. A vibration acceleration signal is captured and filtered to a frequency exceeding 1.1 times of a blade passing frequency, and an occurrence of accumulated chips is determined according to a sudden increase of the vibration acceleration and whether the main vibration frequency of the current vibration signal determined by a fast Fourier transform analysis matches with the frequency of the build up edge characteristic, and a shutdown instruction is issued to a CNC controller to shut down a cutting machine.08-15-2013

Patent applications in class Performance monitoring

Patent applications in all subclasses Performance monitoring