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Manufacturing or product inspection

Subclass of:

382 - Image analysis

382100000 - APPLICATIONS

Patent class list (only not empty are listed)

Deeper subclasses:

Class / Patent application numberDescriptionNumber of patent applications / Date published
382145000 Inspection of semiconductor device or printed circuit board 397
382144000 Mask inspection (e.g., semiconductor photomask) 111
382152000 Tool, workpiece, or mechanical component inspection 34
382143000 Inspection of packaged consumer goods 7
382142000 Bottle inspection 6
Entries
DocumentTitleDate
20110002527BOARD INSPECTION APPARATUS AND METHOD - An inspection method includes photographing a measurement target to acquire image data for each pixel of the measurement target, acquiring height data for each pixel of the measurement target, acquiring visibility data for each pixel of the measurement target, multiplying the acquired image data by at least one of the height data and the visibility data for each pixel to produce a result value, and setting a terminal area by using the produced result value. Thus, the terminal area may be accurately determined.01-06-2011
20130028503CONDUCTIVE FILM MANUFACTURING METHOD, CONDUCTIVE FILM, AND RECORDING MEDIUM - Disclosed is a method for manufacturing a conductive film in which a mesh pattern comprising a wire material is provided on a base material. Also disclosed are a conductive film and a recording medium. Image data representing a mesh pattern is created on the basis of a plurality of selected positions. On the basis of said image data, an evaluation value which quantifies noise characteristics of the mesh pattern is computed. On the basis of the computed evaluation value and prescribed evaluation conditions, one image datum is chosen as an output image datum.01-31-2013
20130028504PARTS MANIPULATION, INSPECTION, AND REPLACEMENT - Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconductor fab plant. A machine-vision system for inspecting devices includes a flipper mechanism. After being inspected at a first station, a tray-transfer device moves the tray from the first inspection station to a flipper mechanism. The flipper mechanism includes two jaws, a mover, and a rotator. The flipper mechanism turns the devices over and places the devices in a second tray so that another surface of the device can be inspected. A second tray-transfer device moves the second tray from the flipper to a second inspection station. The mover of the flipper mechanism removes the tray from the first inspection surface and places a tray at the second inspection surface.01-31-2013
20100027869Optical Carriage Structure of Inspection Apparatus and its Inspection Method - An optical carriage structure of the inspection apparatus and its inspection method are disclosed herein. A plurality of CCD arrays configured at different heights in the optical carriage are utilized, so as a plurality of individual images can be simultaneously captured in one scanning step to obtain a preferred inspection image for image comparison; therefore, precise inspection can be effectively achieved. Furthermore, those CCD arrays are configured at different heights and have enlarged focusing ranges, and the depth of field is thus enhanced.02-04-2010
20100021040PATTERN EVALUATION APPARATUS AND PATTERN EVALUATION METHOD - A method of evaluating a pattern includes: generating a first reference pattern as evaluation reference of an inspection pattern; varying a process parameter for manufacturing the first reference pattern and generating a variation pattern group comprising patterns varied in shape from the first reference pattern according to varied process parameters; defining a second reference pattern as reference in calculating a shape variation amount in the variation pattern group; obtaining coordinates of edge points of the second reference pattern and the variation pattern group; conducting association between the edge points of the second reference pattern and of the variation pattern group; calculating a shape variation amount in the variation pattern group; adding the calculated shape variation amount to information of the edge points of the second reference pattern; and conducting matching between the inspection pattern and the second reference pattern with the shape variation amount being added.01-28-2010
20090080759SYSTEMS AND METHODS FOR CREATING PERSISTENT DATA FOR A WAFER AND FOR USING PERSISTENT DATA FOR INSPECTION-RELATED FUNCTIONS - Various systems and methods for creating persistent data for a wafer and using persistent data for inspection-related functions are provided. One system includes a set of processor nodes coupled to a detector of an inspection system. Each of the processor nodes is configured to receive a portion of image data generated by the detector during scanning of a wafer. The system also includes an array of storage media separately coupled to each of the processor nodes. The processor nodes are configured to send all of the image data or a selected portion of the image data received by the processor nodes to the arrays of storage media such that all of the image data or the selected portion of the image data generated by the detector during the scanning of the wafer is stored in the arrays of the storage media.03-26-2009
20090154789SYSTEM AND METHOD FOR DETECTING OPTICAL DEFECTS - A system and method for detecting optical defects on a surface of a transparent or semi-transparent structure, tube or article is provided. Defects are identified and analyzed by using a digital camera to capture an image of a target having a pattern of light and dark areas through a portion of the article. The images are processed to enhance the visibility of the defects, and the distribution of the defects as function of their location on the surface of the article is determined. This determination is used as part of a statistical process control method for controlling the level of defects present on the surface of the article.06-18-2009
20090067701SYSTEM AND METHOD FOR DETECTING BLEMISHES ON SURFACE OF OBJECT - A system for detecting blemishes on a surface of an object includes at least an image capturing apparatus, at least a light source assembly, and a data processing device. The image capturing apparatus is configured for an image of a surface of an object and acquiring a brightness value of each of pixels of the image. The light source assembly is configured for light the surface. The data processing device is electrically connected to the image capturing apparatus and configured for calculating sum of all of the brightness value to obtain a mean value of the brightness values, comparing the brightness value of each pixel with the mean value and marking the pixels as a blemish whose brightness value is greater than the mean value. The system and method avoid errors that may otherwise occur due to the interference of noise, and avoid the subjective factors of viewers.03-12-2009
20090123056METHOD OF INSPECTING GRANULAR MATERIAL AND INSPECTION DEVICE FOR CONDUCTING THAT METHOD - A method of inspecting granular material and an inspection device for conducting that method, wherein agents (05-14-2009
20100074511MASK INSPECTION APPARATUS, AND EXPOSURE METHOD AND MASK INSPECTION METHOD USING THE SAME - The present invention provides a mask inspection apparatus and method capable of inspecting masks used in double patterning with satisfactory accuracy.03-25-2010
20130077849METHOD FOR INSPECTING MEASUREMENT OBJECT - An inspection method for inspecting a device mounted on a substrate, includes generating a shape template of the device, acquiring height information of each pixel by projecting grating pattern light onto the substrate through a projecting section, generating a contrast map corresponding to the height information of each pixel, and comparing the contrast map with the shape template. Thus, a measurement object may be exactly extracted.03-28-2013
20100046827APPARATUS AND SYSTEMS FOR COUNTING CORN SILKS OR OTHER PLURAL ELONGATED STRANDS AND USE OF THE COUNT FOR CHARACTERIZING THE STRANDS OR THEIR ORIGIN - Apparatus and systems for relatively high throughput counting of elongated strands including silks of a plant are disclosed. One apparatus or system includes segregating similar sized pieces of silks from a section of the plant's silk brush using a tool adapted to obtain uniform samples and system quantitatively counting the pieces by automation. The automated system can be a digital image of the pieces distributed across or above a surface, and image analysis to derive a count of individual pieces. An alternative automated system moves the pieces sequentially and substantially singulated past a detector.02-25-2010
20100046826METHOD AND SYSTEM FOR USE IN INSPECTING AND/OR REMOVING UNSUITABLE OBJECTS FROM A STREAM OF PRODUCTS AND A SORTING APPARATUS IMPLEMENTING THE SAME - Disclosed is a method and system for inspecting and sorting unsuitable or irregular objects in a stream of products, the system includes means for scanning the stream of products along a scan line. The scan line is formed by means of at least one light source directing light along the scan line, and means for detecting light beams reemitted by the product stream upon scanning. The scanning means includes a focusing means for concentrating the light in at least one dimension. The detecting means includes a focusing means for forming an image in an image plane. The detecting means is oriented towards the scan line such that points on the scan line form a projected scan line in the image plane and the image substantially located in the image plane is substantially focused in at least one dimension by the focusing means. The detecting means also includes a spatial filtering means that filters the image in substantially the direction perpendicular to the direction of the projected scan line.02-25-2010
20130034293SYSTEM FOR DEFECT DETECTION AND REPAIR - A system for identifying a repair cut location for a defect in a liquid crystal device includes receiving an input image, a defect mask image, and a landmark structure image. The system determines a repair cut location, based upon the input image, the defect mask image, and the landmark structure image, for a liquid crystal device proximate the defect. The determination may be based upon a type of said defect, a cause of said defect, a position of said defect, and a spatial relationship of the defect and a structure of the landmark image.02-07-2013
20130034294Method for the Linear Structuring of a Coated Substrate for the Production of Thin-Film Solar Cell Modules - Method for the linear structuring of a coated substrate for producing thin-film solar cell modules in which tracks are introduced in an upper structure plane so as to be adapted to the path of existing tracks in a lower structure plane in that a structuring tool is controlled in y direction by means of a control quantity which is derived from image recordings of the existing tracks, and the substrate is moved back and forth under the structuring tool. The image recordings for acquiring existing tracks are carried out only during the forward passes. The generation of tracks takes place during the forward passes and backward passes.02-07-2013
20130039563METHOD OF GENERATING INSPECTION PROGRAM - A method of generating an inspection program that does not have a gerber file is shown. To generate the inspection program, a first image information is acquired by scanning a bare board, a second image information is acquired by scanning a solder-pasted board that solder is pasted on a pad area of the bare board, and by analyzing the first image information and the second image information an inspection program is generated. The first image information and the second image information may include at least one of a two-dimensional image information and a three-dimensional image information. The step for generating an inspection program calculates a difference between the first image information and the second image information, after extracting a position and a size of an area in which the difference occurs, then generates the inspection program by using the extracted information. Therefore, a bare board and a solder-pasted board may be each inspected and the accurate position and size of the solder pasted area may be extracted through analyzing the acquired two-dimensional image information or a three-dimensional image information differences.02-14-2013
20090169092Quality Validation Method - A quality validation method to improve inspection and validation processes by increasing their quality, efficiency, and positive impact. This method automatically prompts operators at one or more validation stations to follow a validation path comprising one or more validation items configurable by part number. It allows for automatic or manual feedback on the result of each item checked, the ability to enforce a particular pack-out consist based upon user provided specifications, and the ability of historically storing inspection results comprising container, part and inspection item information and results. It additionally provides an easily accessible interface to configure validation items and areas by part number, configure validation paths comprising of a variable quantity and order of validation items, and obtain information in a variety of useful formats.07-02-2009
20090169091Method for performing a quality control on the processing of products and device applied thereby - Method for performing a quality control of a processed product, characterised in that it mainly consists in first storing images of a product (07-02-2009
20100104172METHOD AND SYSTEM FOR CALCULATING WEIGHT OF VARIABLE SHAPE PRODUCT MANUFACTURED FROM PRODUCT BLANK - A computerized system, method, and computer-readable media implementing a method for determining a weight of a product, and optionally its shipping weight and postage are described. A product having a variable shape in two dimensions wherein the shape is defined in the two dimensions by a set of cutlines is manufactured from a product blank of known weight. The weight of the product is determined from the number of pixels in a scaled image of the cutlines, the image having the same aspect ratio as the product blank. The weight of the product blank and the ratio of the pixels corresponding to product surface area relative to the total number of pixels in the image are used to calculated the actual weight of the product.04-29-2010
20100040278APPARATUS AND METHOD FOR THE AUTOMATED MARKING OF DEFECTS ON WEBS OF MATERIAL - A system for the characterization of webs that permits the identification of anomalous regions on the web to be performed at a first time and place, and permits the localization and marking of actual defects to be performed at a second time and place.02-18-2010
20120183199SUBSTRATE IDENTIFICATION AND TRACKING THROUGH SURFACE REFLECTANCE - A method of identifying individual silicon substrates, and particularly solar cells, is disclosed. Every solar cell possesses a unique set of optical properties. The method identifies these properties and stores them in a database, where they can be associated to a particular solar cell. Unlike conventional tracking techniques, the present method requires no dedicated space on the surface of the silicon substrate. This method allows substrates to be tracked through the manufacturing process, as well as throughout the life of the substrate.07-19-2012
20130044936System and Method for Identifying Defects in a Material - Described are computer-based methods and apparatuses, including computer program products, for identifying defects in a material. A set of features is identified based on an image of a material, wherein each feature in the set of features is a candidate portion of a defect in the material. A set of chained features is selected based on the set of features, wherein each chained feature comprises one or more features that represent candidate portions of a same defect in the material. A defect in the material is identified based on the set of chained features and the image.02-21-2013
20130083990Using Videogrammetry to Fabricate Parts - According to various embodiments, a stream of image frames depicting a structure in a scene are obtained. The stream of image frames may comprise first image frames from a first imaging device and second image frames from a second imaging device. Using the first image frames and the second image frames, a wireframe of at least a portion of the structure is generated. From the wireframe, as-built dimensions may be identified, materials estimates may be determined, and/or data for a fabrication device may be generated, for example.04-04-2013
20130083991PROCESS FOR PRODUCING AND DELIVERING MATCHING COLOR COATING AND USE THEREOF - The present invention is directed to a process for repairing one or more defects of a target coating of a vehicle. The process can repair target coatings at a repair facility using matching coating compositions provided from a supply center, where the matching coating compositions can be produced according to target repair data transmitted from one or more repair facilities to the supply center. The present invention is also directed to a system for repairing one or more defects of a target coating of a vehicle. The system can comprise one or more supply centers and one or more repair facilities.04-04-2013
20100092068DEVICE FOR DETERMINING THE POSITION AND/OR THE TRANSVERSE DIMENSION OF A DRILL HOLE IN A PRESENTATION LENS FOR RIMLESS EYEGLASSES - The device includes: bearing element (04-15-2010
20130051652Method and Device for the Automatic Inspection of a Cable Spool - Method for detecting and evaluating the protrusions that appear on cords coming from a twisting/rubberizing process, by the digital processing of the image of a layer of cord formed by a number of turns wound around the core of a spool (02-28-2013
20130071006Image Analysis of Processor Device Features - A method includes receiving an image of a scan area that includes a feature of interest, receiving and analyzing a design specification for features in the scan area, generating an intensity graph corresponding to a portion of the image, calculating with a processor, slopes of portions of the intensity graph to identify the feature of interest, applying portions of the design specification to the intensity graph to identify peaks that correspond to edges of the feature of interest, applying a logical function to the identified peaks to calculate a distance between the identified peaks, determining whether the calculated distance is within tolerances of the design specification, and outputting an error indication to a display responsive to determining that the calculated distance is not within tolerances of the design specification.03-21-2013
20090092310SYSTEM AND METHOD FOR PRECISION FIT ARTIFICIAL FINGERNAILS - A system and method for creating precision fit artificial fingernails is disclosed. Specifically, a system is disclosed that utilizes a scanned and digitized nail surface to form a precision fit three dimensional digitized artificial nail object that can be used to direct a machining device that either creates an artificial fingernail from blank stock, or to machine a custom mold that can be used to make multiple artificial fingernails having the same shape.04-09-2009
20110013823Method of Evaluation by Comparison of an Acquired Image with a Reference Image - A method for evaluating the surfaces of a tire, said surfaces being molded with rigid elements, wherein a collection of N images of a given zone of the tire is constituted based on the images originating from one or more tires, each of the images of the collection being constituted by the values of physical magnitudes measured by a sensor sensitive to the reflection of the light at each of the points with coordinates i, j of said surface, and then the images of said collection are made to correspond by superposition, and the image of the zone of a tire from said collection to be evaluated is compared with a reference image. The value of the physical magnitudes of the reference image is calculated based on the value of each of these physical magnitudes measured on the N images of said collection.01-20-2011
20090268957DEVICE FOR MEASURING THE THICKNESS OF PRINTED PRODUCTS - An apparatus for measuring a thickness of a printed product conveyed in a conveying direction at a conveying speed. The apparatus includes a conveying device having a guide arrangement along which the printed product is conveyed at the conveying speed in the conveying direction, the guide arrangement including a measuring region that extends in the conveying direction of the guide arrangement. The apparatus further includes a measuring element operative to act on printed sheets of the printed product to measure the thickness of the printed product while the printed product is conveyed across the measuring region and through a measuring gap located between the measuring element and the guide arrangement. The measuring element is arranged to move toward the guide arrangement with a process timing and to move synchronously with the printed product at the conveying speed across the measuring region of the guide arrangement. The apparatus additionally includes an evaluation unit connected to the measuring element.10-29-2009
20130101204GENERATING A COMPOSITE SCORE FOR A POSSIBLE PALLET IN AN IMAGE SCENE - A method is provided for evaluating a possible pallet object in a gray scale image including one or more pallets. The method may comprise: generating, by a computer, a first confidence score Score04-25-2013
20100046825AUTHENTICATION AND ANTICOUNTERFEITING METHODS AND DEVICES - Methods and devices for marking objects include the use of a dimensionally hierarchical series of submicron sized features to emboss, mold, and/or print markings into objects. The markings may include security features, codes, numbers, symbols, signs and any combinations thereof. The markings may be used for identification, authentication or attribution of the item.02-25-2010
20090010524METHODS AND APPARATUS FOR DETECTION OF FLUORESCENTLY LABELED MATERIALS - Fluorescently marked targets bind to a substrate 01-08-2009
20090010523METHOD OF INSPECTING OUTER WALL OF HONEYCOMB STRUCTURE BODY - There is disclosed a method of inspecting the outer wall of a honeycomb structure body which can be performed without relying on human sensory functions and in which a defect detection level and an inspection time per honeycomb structure body are constant, so that stable inspection can be performed. In a method of inspecting the outer wall of a honeycomb structure body 01-08-2009
20090010522Optically Measuring Interior Cavities - A method of measuring the three-dimensional volume or perimeter shape of an interior cavity includes the steps of collecting a first optical slice of data that represents a partial volume or perimeter shape of the interior cavity, collecting additional optical slices of data that represents a partial volume or perimeter shape of the interior cavity, and combining the first optical slice of data and the additional optical slices of data to calculate of the three-dimensional volume or perimeter shape of the interior cavity.01-08-2009
20090010521SYSTEM AND METHOD FOR DETERMINING WHETHER THERE IS AN ANOMALY IN DATA - A system and method for identifying objects of interest in image data is provided. The present invention utilizes principles of Iterative Transformational Divergence in which objects in images, when subjected to special transformations, will exhibit radically different responses based on the physical, chemical, or numerical properties of the object or its representation (such as images), combined with machine learning capabilities. Using the system and methods of the present invention, certain objects that appear indistinguishable from other objects to the eye or computer recognition systems, or are otherwise almost identical, generate radically different and statistically significant differences in the image describers (metrics) that can be easily measured.01-08-2009
20110019902PHOTOGRAMMETRIC METHODS AND APPARATUS FOR MEASUREMENT OF ELECTRICAL EQUIPMENT - A method is disclosed comprising: imaging a feature of a component of an electrical power transmission system for example in combination with a reference component or feature of known dimensions, the reference component or feature comprising a reference, to produce one or more images; analyzing the one or more images with a photogrammetry algorithm to measure the feature of the component; and placing a protector at least partially over the component, the protector being selected to fit the component based on the measurement of the feature. In some embodiments the method may further comprise making the protector based on the measurement of the feature. A method is also disclosed comprising: remotely placing a reference object into a position that is inside a safe Limit of Approach and in the vicinity of a feature of a component of an energized live electrical power transmission system, the reference object comprising a reference; imaging a combination of the reference and the feature of the component to produce one or more images; and analyzing the one or more images with a photogrammetry algorithm to measure the feature of the component.01-27-2011
20090136115DEVICE AND METHOD FOR INSPECTING RECHARGEABLE BATTERY CONNECTION STRUCTURE - An inspection apparatus for inspecting a rechargeable battery electrode plate-connected structure to check whether electrode plates are properly connected to a current collector plate by filters. The apparatus includes an imaging device arranged on one side of the rechargeable battery electrode plate-connected structure, a first lighting device which illuminates the rechargeable battery electrode plate-connected structure at the same side of the rechargeable battery electrode plate-connected structure as the first lighting device, a second lighting device which illuminates the rechargeable battery electrode plate-connected structure from the opposite side of the rechargeable battery electrode plate-connected structure, and an inspection circuit connected to the imaging device which inspects the connection state of the fillets by analyzing a front lighting image captured by the imaging device when only the first lighting device emits light and a back lighting image captured when only the second lighting device emits light.05-28-2009
20110091093METHOD OF APPEARANCE DEFORMATION INDEXING - A method to detect and rank appearance distortions includes creating virtual models of a reference panel and a processed panel, including a first reference patch and the processed panel, respectively. Projecting a first simulated light pattern on the reference panel and the processed panel, and viewing the first reference patch and the first processed patch from a first viewpoint with respect to the first simulated light pattern. The method compares a first reference reflection at the first reference patch with a first processed reflection at the first processed patch, and creates a first index value from optical variations between the appearance of the reference and processed reflections. The first index value is output in a computer readable format. The method may compare the first index value to a predetermined index value and determine whether the processed panel is within an acceptable appearance quality threshold.04-21-2011
20130163849APPARATUS AND METHOD FOR AUTOMATIC INSPECTION OF THROUGH-HOLES OF A COMPONENT - An apparatus and a method for automatic inspection of through-holes of a component is provided. The proposed apparatus includes an imaging module, an image processing module and an analysis module. The imaging module generates a thermographic image of the component by passing a medium through the through-holes and capturing infra-red radiation emitted from the component while the medium is flowing through the through-holes. The image processing module fits the thermographic image on a digital image obtained from geometrical data of the component. The image processing module is further masks the fitted thermographic image using a digital image mask to extract regions corresponding to through-holes in the thermographic image. The digital image mask is computed based on a determination of positions of through-holes on the digital image. The analysis module evaluates the masked thermographic image to determine an irregularity or blockage in one or more of the through-holes.06-27-2013
20130163847Method and Apparatus for Locating Objects - Disclosed are methods and apparatus for automatic optoelectronic detection and inspection of objects, based on capturing digital images of a two-dimensional field of view in which an object to be detected or inspected may be located, analyzing the images, and making and reporting decisions on the status of the object. Decisions are based on evidence obtained from a plurality of images for which the object is located in the field of view, generally corresponding to a plurality of viewing perspectives. Evidence that an object is located in the field of view is used for detection, and evidence that the object satisfies appropriate inspection criteria is used for inspection. Methods and apparatus are disclosed for capturing and analyzing images at high speed so that multiple viewing perspectives can be obtained for objects in continuous motion.06-27-2013
20130163848METHOD AND APPARATUS FOR INSPECTION OF COMPONENTS - The quality of a dry film lubricant coating or molybdenum based undercoat coating provided on the root of a gas turbine fan blade is determined by a method which includes providing an image of the coating taken under controlled conditions which include diffusing light through a translucent screen. The difference between an RGB value of a group of pixels from the image compared with a known RGB value is determined and used to calculate the quality of the coating.06-27-2013
20090141963METHOD AND APPARATUS FOR MEASURING DEPOSITION OF PARTICULATE CONTAMINANTS IN PULP AND PAPER SLURRIES - A method and an apparatus for measuring the depositability of particulate contaminants present in a pulp or paper mill fluid stream and evaluating interactions of such particulate contaminants with other contaminants collects the particulate contaminants on a suitable substrate, such as a plastic film coated with an adhesive or coated with organic contaminate, placed in contact with the pulp or paper mill fluid stream for at least five minutes up to several hours. The amount of contaminants collected on the substrate is quantified and evaluated by taking one or more scanned images of the substrate with a resolution of at least 2,000 dots per inch (DPI) and analyzing the scanned images with image analysis technique.06-04-2009
20090087080VISION INSPECTION SYSTEM AND METHOD FOR INSPECTING WORKPIECE USING THE SAME - A vision inspection system and a workpiece inspection method are used in inspecting a workpiece. The vision inspection system includes a level block having an upper surface whose opposite end regions are defined as a first position and a second position. A first transfer device has a table for supporting the workpiece. The first transfer device is installed on the upper surface of the level block for rectilinearly moving the table between the first position and the second position. A camera is arranged above the level block for taking an image of the workpiece to output image data. A second transfer device is installed on the upper surface of the level block for rectilinearly moving the camera between the first position and the second position. A computer is connected to the first transfer means, the camera and the second transfer means to control them in a specified manner.04-02-2009
20120106824Methods and Systems Involving Measuring Complex Dimensions of Silicon Devices - A method for measuring a dimension of a device includes receiving an image of a portion of the device, receiving a first offset value and a second offset value, processing the image to define a least one graph of a line of pixels, the at least one graph including the brightness level of each pixel in a line of pixels, identifying a location of a first peak and a second peak in the graph, defining a first exclusion area boundary, defining a second exclusion area boundary, setting the brightness level of the pixels between the first exclusion area boundary and the second exclusion area boundary to zero, identifying a first portion of the feature of interest and a second portion of the feature of interest, and measuring a distance between the first portion of the feature of interest and the second portion of the feature of interest.05-03-2012
20110135187PHOTOVOLTAIC CELL MANUFACTURING METHOD AND PHOTOVOLTAIC CELL MANUFACTURING APPARATUS - A photovoltaic cell manufacturing method includes: detecting a structural defect existing in compartment elements; obtaining an image by capturing a region including the structural defect and the scribe line with a predetermined definition; specifying first number of pixels on the image, the first number of pixels corresponding to a distance between the scribe lines adjacent to each other or corresponding to a width of the scribe line; referring to an actual value indicating the distance between the scribe lines adjacent to each other or indicating the width of the scribe line, the distance being preliminarily stored, and the width of the scribe line being preliminarily stored; calculating an actual size of one pixel on the image by comparing the first number of pixels with the actual value; specifying second number of pixels on the image, the second number of pixels corresponding to the distance between the structural defect and the scribe line; comparing the second number of pixels with the actual size of one pixel, thereby calculating defect position information; and electrically separating the structural defect by irradiation with the laser light based on the defect position information.06-09-2011
20090202135Defect Detection Apparatus, Defect Detection Method and Computer Program - There are provided a defect detection apparatus, a defect detection method, and a computer program, which are capable of setting an appropriate reference line with respect to a plurality of edge points, to accurately detect a defect based upon a difference of each edge point, and in which a plurality of edge points are detected from an image including an edge of the object, a representative edge point representing the edge points present within a reference range having a prescribed width is calculated in each shifted position of the reference range while the reference range is sequentially shifted, residuals between a plurality of calculated representative edge points and corresponding edge points are calculated, a position and a size of the defect are specified based upon the calculated residuals, and the residuals are weighted and a representative edge point is repeatedly calculated, to obtain an apparent approximate curve (representative-edge-point sequence).08-13-2009
20110293166METHOD AND SYSTEM FOR DETERMINING THE QUALITY OF PHARMACEUTIAL PRODUCTS - Thermographic imaging is used to monitor quality parameters of pharmaceutical products (12-01-2011
20080310701Method and Apparatus for Visually Inspecting an Object - A method comprises projecting a light and shade pattern defined by preset optic parameters through a body, detecting an image of the light and shade pattern through the body to obtain a detected image, processing the detected image to highlight any irregularities of the light and shade pattern in the detected image; an apparatus comprises a light-source for projecting a light and shade pattern defined by preset optic parameters through a body, an image-detecting device for detecting an image of the light and shade pattern through the body to obtain a detected image and a processing device for processing the detected image in such a way as to highlight any irregularities of the light and shade pattern in the detected image.12-18-2008
20100034455SOLAR BATTERY MODULE EVALUATION APPARATUS, SOLAR BATTERY MODULE EVALUATING METHOD, AND SOLAR BATTERY MODULE MANUFACTURING METHOD - Management of a manufacturing process also in assembling a solar battery module is facilitated. A solar battery module evaluation apparatus includes a power supply unit, a camera, and a processing unit. The power supply unit supplies electric power. The processing unit outputs pattern information indicating whether a solar battery module is defective or not, based on data of an image picked up by the camera, the image being an optical image that appears as a result of supply of electric power to the solar battery module for light emission through electroluminescence phenomenon.02-11-2010
20100027871Method and system for inspection of tube width of heat exchanger - An appearance inspection method and system of a core of a heat exchanger provided with fins and tubes including identifying a region in which an image of a single tube is captured, performing averaging and dynamic binarization of the image data in this region to extract only the image of the tube, dividing this region into a plurality of blocks, finding the smallest rectangle surrounding a tube at each divided block to find a width dimension of the tube, comparing the tube width dimension at each block found with a predetermined threshold value, and judging a part as good when all of the tube width dimensions at the blocks are the predetermined threshold value or less.02-04-2010
20100027870METHOD FOR MEASURING COATING APPEARANCE AND THE USE THEREOF - The present invention is directed to a method for obtaining appearance characteristics of a target coating containing effect pigments. The present invention is also directed to a method for comparing appearances of two or more coatings by comparing the appearance characteristics. The present invention is further directed to a system for obtaining appearance characteristics of one or more coatings and comparing said coating appearances.02-04-2010
20100027872Method and system for inspection of tube width of heat exchanger - A method and system for appearance inspection of a core of a heat exchanger provided with fins and tubes, performing averaging and dynamic binarization on the imaging data to extract an image of only a tube, then calculating, with respect to the extracted tube image, a center axis across a long direction of the tube comprised of the center coordinates of the tube width direction, comparing the discovered center axis with a reference value to find the maximum displacement across the long direction of the tube, and judging the tube is a defect when the maximum displacement is greater than a predetermined threshold.02-04-2010
20090245615VISUAL INSPECTION SYSTEM - This solution relates to machine vision computing environments, and more specifically relates to a system and method for selectively accelerating the execution of image processing applications using a cell computing system. The invention provides a high performance machine vision system over the prior art and provides a method for executing image processing applications on a Cell and BPE3 image processing system. Moreover, implementations of the invention provide a machine vision system and method for distributing and managing the execution of image processing applications at a fine-grained level via a PCIe connected system. The hybrid system is replaced with the BPE3 and the switch is also eliminated from the prior in order to meet over 1 GB processing requirement.10-01-2009
20110262026INSPECTION APPARATUS AND DEFECT DETECTION METHOD USING THE SAME - An inspection apparatus includes: a feature detection section for detecting first feature portions of at least two objects among a plurality of objects from images based on a first condition; a feature discrimination section for discriminating a first feature portion of a first object and a first feature portion of a second object based on the first feature portions of the at least two objects; a defect detection section for detecting a first defect portion of the first object and a first defect portion of the second object based on the first feature portions of the first object and the second object; and a display section for displaying information indicative of the first defect portion of the first object and information indicative of the first defect portion of the second object together with the images.10-27-2011
20090148030METHOD AND SYSTEM FOR DETERMINING CUMULATIVE FOREIGN OBJECT CHARACTERISTICS OF A COMPOSITE STRUCTURE - Method and system for determining cumulative foreign object characteristics during fabrication of a composite structure. Images of sequential segments of a composite structure may be recorded during placement of the composite structure. The recorded images may be analyzed for detecting foreign objects on the composite structure. Cumulative foreign object characteristics of the foreign objects detected on the composite structure may be determined, and the cumulative foreign object characteristics may be provided to a user.06-11-2009
20090190825Performance Analyses of Micromirror Devices - The invention provides a method and apparatus for evaluating the product quality and performances of micromirror array devices through measurements of the electromechanical responses of the individual micromirrors to the driving forces of electric fields. The electromechanical responses of the micromirrors according to the present invention are described in terms of the rotational angles associated with the operational states, such as the ON and OFF state angles of the ON and OFF state when the micromirror array device is operated in the binary-state mode, and the response speed (i.e. the time interval required for a micromirror device to transit form one state to another) of the individual micromirrors to the driving fields.07-30-2009
20090190824Inspection apparatus and inspection method - An inspection apparatus according to the present invention comprises: a one-dimensional imaging unit for imaging a workpiece which is a three-dimensionally shaped test object; a first lens for causing light incident thereon from the test object to emerge as converging light; and a second lens, disposed between the first lens and the one-dimensional imaging unit, for focusing the light emerging from the first lens, wherein a chief ray of a bundle of rays incident on the first lens from the test object is parallel to the optical axis of the first lens, and the light containing the chief ray, incident from the test object, is focused through the first lens and the second lens onto the one-dimensional imaging unit for imaging.07-30-2009
20090097736Method and Apparatus for Approving Color Samples - A color approval system that facilitates the use of electronic color submissions. The electronic color submissions contain reflectance values for a physical color sample to be submitted for approval. The system includes a data storage area accessible by a submitter of the electronic color sample and a reviewer of the color sample. The submitter upload the submission to the data storage area, from which the reviewer retrieves the submission and replies with an acceptance or rejection, typically via email. The system provides tools for the analysis of the electronic color sample and automatic formation of acceptances and rejections.04-16-2009
20090148031SURFACE INSPECTION APPARATUS - A surface inspection apparatus, which includes a detecting device of scanning a surface of an inspection object with an inspection light and outputting a signal corresponding to a light amount of refection light from the surface, generates a two-dimensional image of the surface of the inspection object on the basis of the output signal of the detecting device (S06-11-2009
20080310700Article Visual Inspection Apparatus - An article visual inspection apparatus capable of detecting that the surface conditions of an article are so inferior as to render the article unusable as a product and rejecting the same as a defective article by inspecting the article for external defects, occurring on the surface of the article, such as streaks, dice marks and rough surfaces of an aluminum extruded shape. The visual inspection apparatus comprises an imaging device (12-18-2008
20080273790MEASUREMENT DEVICE FOR MEASURING THE PARAMETERS OF A BLADE ROTOR AND MEASUREMENT PROCESS FOR MEASURING WITH SAID DEVICE - The invention relates to a measurement device for measuring the parameters of a blade rotor and a measurement process for measuring with said device, consisting of an element (11-06-2008
20100014745INSPECTING METHOD AND INSPECTING EQUIPMENT - An inspecting method and an inspecting equipment including a dividing unit, a determining unit, a transferring unit and an inspecting unit for inspecting a disk are provided. The inspecting method includes the following steps. First, a plane is divided into several zones with equal area. Next, several measuring locations are determined within these zones. Next, these measuring locations are transferred into several sets of measuring locations corresponding to the disk through a coordinate transfer. Then, the disk is inspected according to these sets of measuring locations.01-21-2010
20100119142Monitoring Multiple Similar Objects Using Image Templates - Computer-readable media having corresponding apparatus embodies instructions executable by a computer to perform a method comprising: capturing, with a first camera, a first image of a first one of a plurality of similar objects each having a common feature; generating an image template file based on the first image, wherein the image template file identifies a location of the feature of the first one of the plurality of similar objects in the first image; capturing, with a second camera, a second image of a second one of the plurality of similar objects; and controlling the second camera based on the second image and the image template file.05-13-2010
20100086192PRODUCT IDENTIFICATION USING IMAGE ANALYSIS AND USER INTERACTION - An apparatus, system, and method are disclosed for product identification using image analysis and user interaction. The method may include comparing a retail product image to a plurality of candidate retail product images. In addition, the method may include generating a candidate product set containing candidate retail product images satisfying image comparison criteria. The method may determine one or more product identity queries configured to solicit additional product identity information from a user. In addition, the product identity queries may eliminate one or more members of the candidate product set. The method may query the user with these inquiries and determine a product match based on the user's response. Therefore a user may obtain information about a product using only a picture and a user's knowledge of the product.04-08-2010
20100086193Making sealant containing twist-on wire connectors - A system and a method of identifying, accepting or rejecting faulty sealant containing twist-on wire connectors wherein an image sensor generates an output image signal of a partly assembled twist-on wire connector or an assembled twist-on wire connector and compares the output image signal to a reference image signal to identify or reject a twist-on wire connector if the output image signal of the twist-on wire connector is outside an acceptable range and accept the twist-on wire connector if the output image signal is within the acceptable range.04-08-2010
20100098319METHOD AND SYSTEM FOR THE PRODUCTION OF VARIABLE-DIMENSIONAL PRINTED SUBSTRATES - A method and system for generating a customized, printed, three-dimensional object accesses a data record for a selected recipient and prints objects on a substrate based on the data record. The method and system then generates die lines based on the data record, and finishes the substrate by cutting, perforating, creasing, folding or otherwise finishing the substrate along the die lines to yield a customized, three-dimensional printed object.04-22-2010
20090087079DEFECT DETECTING APPARATUS AND METHOD - A front side surface of a cover glass of a solid state imaging device is focused, and a front side image is captured. Next, a rear side surface of the cover glass is focused, and a rear side image is captured. The front side image and the rear side image are combined with each other to create a composite image. A first threshold value is set for each pixel in the composite image by dynamic thresholding. An image composed of pixels whose gray values exceed the first threshold value is identified as a defect candidate image. The maximum gray value of the defect candidate image is multiplied by a constant rate to set a second threshold value. An image composed of pixels whose gray value is less than the second threshold value is eliminated as a blurred image from the defect candidate image. Thereby, only a spot defect image, an allowable defect image, and a stain defect image remain in the composite image.04-02-2009
20090087078DISPLAY TESTING APPARATUS AND METHOD - A display testing method applied on an apparatus is provided, the apparatus being connected with an image capturing device. The method includes: controlling the image capturing device to capture and store images of displays to be tested; determining a first vertex of a test area on the captured image, determining a test area according to the determined first vertex; and testing parameters of the display according to the test area.04-02-2009
20090074285Surface inspection device - A surface inspection device, including an illumination light source that irradiates a surface of a wafer with an inspection illumination light; a camera that receives a scattered light from the wafer irradiate with the inspection illumination light, and captures an image of the surface; a display device that displays the image of the wafer surface captured by an image sensing element of the camera; and an image expansion processing device that expands a portion having a high luminance in the image of the surface of the wafer captured by the image sensing element and causes the display device to display the expanded image.03-19-2009
20100266193ELECTRONIC PART RECOGNITION APPARATUS AND CHIP MOUNTER HAVING THE SAME - An electronic part recognition apparatus and a chip mounter having the same are provided. The apparatus includes a part conveyor unit for moving an electronic part along a path and mounting the part at a mounting position, a position recognition portion for continuously recognizing position information of the part conveyor unit moving along the path, a controller for receiving the position information from the position recognition portion and generating a photographing signal, and an image processing unit for receiving the photographing signal from the controller and time-exposing the part to light to photograph an image of the part when the part is located at a part recognition region while the conveyor unit moves. The apparatus can capture an image of an part suctioned by a nozzle installed in a head of a chip mounter and moved without stoppage of the head to recognize a state of the suctioned electronic part.10-21-2010
20100098320METHOD AND DEVICE FOR INSPECTING PATTERNED MEDIUM - An inspection region is specified using the design information to perform region division for measurement through a scatterometry method. The obtained detection data is classified by pattern into a periodic region and a non-periodic region. A spectroscopic characteristic is detected by an optical sensor to extract features. The extracted features are compared with features stored in a feature map database for each region to evaluate a state of a patterned medium.04-22-2010
20090279773IMAGING APPARATUS AND METHOD - Apparatus for inspecting an article comprising: a controller configured to generate a drive signal having a periodic amplitude variation; a source, the source being operable by the controller to emit a source beam thereby to irradiate an article, the source beam comprising a beam of electromagnetic radiation having a periodic amplitude variation corresponding to that of the drive signal; and a detector, the detector being configured to detect a portion of the source beam that has been transmitted through at least a portion of the article, and to generate a detector signal having an amplitude variation corresponding to the amplitude variation of said portion of the source beam, the controller being further configured to generate a difference value corresponding to a difference between the amplitude of the detector signal and the amplitude of a reference signal.11-12-2009
20120106825Dimple position dectection device and dimple position detecting method for disk drive suspension - A dimple position detection device for detecting a position of a dimple formed on a load beam is provided with an illumination device, imaging device, and image processing section. The illumination device directs illumination light toward the dimple. The imaging device receives reflected light from the dimple. The image processing section binarizes an image obtained by the imaging device. The image processing section maximizes a binarization level, binarizes the reflected light image, determines whether an area of a light spot region or on-region above the binarization level has a predetermined value, reduces the binarization level when the area of the light spot region is less than the predetermined value, and calculates the gravitational position of the light spot region with the predetermined value reached by the light spot region area.05-03-2012
20090161941Mixed Injection Inspection System - Provided is a system for reducing burden on an inspector by making it possible to evaluate the operation of a mixed injection worker which is difficult to evaluate numerically at a place remote from the mixed injection work place. Provided is a mixed injection inspection system for inspecting a mixed injection work for mixing an injection drug by an inspector different from a mixed injection worker, the mixed injection inspection system including: a mixed injection work photographing device provided in a mixed injection work place and used to photograph the mixed injection work; an inspector side mixed injection work monitor provided in a place remote from the mixed injection work place and used to display the mixed injection work photographed by the mixed injection work photographing device; an inspector side input device provided in a place remote from the mixed injection work place and used to input instructions for the worker working at the mixed injection work place; and a mixed injection worker side display means for displaying to the mixed injection worker what has been input by the inspector side input device.06-25-2009
20100124369METHODS AND APPARATUS FOR MEASURING 3D DIMENSIONS ON 2D IMAGES - A method for determining 3D distances on a 2D pixelized image of a part or object includes acquiring a real 2D pixelized image of the object, creating a simulated image of the object using the 3D CAD model and the 2D pixelized image, determining a specified cost function comparing the simulated image with the real 2D pixilated image and repositioning the simulated image in accordance with iterated adjustments of a relative position between the CAD model and the XID pixilated image to change the simulated image until the specified cost function is below a specified value. Then, the workstation is used to generate a 3D distance scale matrix using the repositioned simulated image, and to measure and display distances between selected pixels on a surface of the real image using 2D distances on the 2D pixelized image of the object and the 3D distance scale matrix.05-20-2010
20100124370PATTERN SHAPE INSPECTION METHOD AND APPARATUS THEREOF - This invention relates to a pattern shape inspection method and an apparatus thereof for conducting a first step of irradiating wideband illuminating light which contains far ultraviolet light to a sample from a perpendicular direction, inspecting a shape of the pattern based on a spectral waveform of reflecting light detected from the sample, and detecting an edge roughness of the pattern based on the spectral waveform of the reflecting light detected from the sample, and a second step of irradiating a laser beam to the sample from an oblique direction, and detecting the edge roughness of the pattern based on scattered light detected from the sample.05-20-2010
20110170763RAPID COLOR VERIFICATION SYSTEM USING DIGITAL IMAGING AND CURVE COMPARISON ALGORITHM - A system for monitoring paint color across regions of a vehicle and for identifying color mismatches and for dynamically determining the acceptability of an identified mismatch is disclosed. The system includes a vehicle image acquisition array of one or more digital cameras for digitally scanning selected regions of the vehicle and an image analyzer connected to the vehicle image acquisition system. The image analyzer is initially programmed with upper and lower standard confidence color curves. The image analyzer includes software programmed with an analysis algorithm to convert an image of one of the scanned regions acquired by the vehicle image acquisition array into a standard image format from which actual individual color curves are extracted and to compare the extracted color curves against the standard confidence color curves to determine whether or not the extracted color curves fall within the upper and lower standard confidence color curves by establishing a percentage match for one of the scanned regions. The initially programmed upper and lower standard confidence color curves may be adjusted during color testing based upon accumulated extracted color curves of the selected regions.07-14-2011
20110170762OPTICAL WEB-BASED DEFECT DETECTION USING INTRASENSOR UNIFORMITY CORRECTION - Techniques are described in which an image capture device captures image data from web material. The image data comprises pixel values for the cross-web field of view of the image capture device. An analysis computer includes a computer-readable medium that stores parameters for a plurality of different normalization algorithms to normalize a cross-web background signal for the image capture device to a common desired value. The computer-readable medium further stores coefficients specifying a weighting for each of the plurality of normalization algorithms. The analysis computer computes a normalized value for each of the pixels of the image data as a weighted summation of results from application of at least two of the pixel normalization algorithms using the stored parameters.07-14-2011
20090279774ACOUSTOGRAPHIC DIAGNOSIS OF ABNORMALITIES - An arrangement and method are provided for acoustographic diagnosis of abnormalities of a product, such as motor vehicle, that includes associating psychoacoustic vector beam data with a three-dimensional graphic surface model, and analyzing the three-dimensional graphic surface model to identify at least a portion thereof associated with unacceptable psychoacoustic levels.11-12-2009
20090279772Method and System for Identifying Defects in NDT Image Data - An anomaly detection method includes acquiring image data corresponding to nondestructive testing (NDT) of a scanned object. The NDT image data comprises at least one inspection test image of the scanned object and multiple reference images for the scanned object. The anomaly detection method further includes generating an anomaly detection model based on a statistical analysis of one or more image features in the reference images for the scanned object and identifying one or more defects in the inspection test image, based on the anomaly detection model.11-12-2009
20110200246 Method of Measuring Overlay Error and a Device Manufacturing Method - The overlay error of a target in a scribelane is measured. The overlay error of the required feature in the chip area may differ from this due to, for example, different responses to the exposure process. A model is used to simulate these differences and thus a more accurate measurement of the overlay error of the feature determined.08-18-2011
20110200245INTEGRATION OF MANUFACTURING CONTROL FUNCTIONS USING A MULTI-FUNCTIONAL VISION SYSTEM - A manufacturing control system comprises a vision system for viewing operations within a manufacturing area and for producing vision data representing the viewed operations. A systems control analyzes the vision data, and controls at least two control functions related to the manufacturing operations based on the analyzed vision data.08-18-2011
20100128968SYSTEM AND A METHOD FOR INSEPCTING AN OBJECT - An inspection method and an inspection system, the inspection system includes: (i) a first group of sensors, for sensing light components of a first light band of an image of an area of an inspected object, and for generating first detection signals reflecting sensed light components of the first light band; (ii) a second group of sensors, for sensing light components of a second light band of the image of the area of the inspected object, wherein the second light band differs from the first light band, and for generating second detection signals reflecting sensed light components of the second light band; (iii) optics, for projecting the image of the area of the inspected object towards the first group of sensors and towards the second array of sensors; and (iv) a processing unit, coupled to the first and second group of sensors, for detecting defects based on the first or second detection signals.05-27-2010
20100061619METHOD AND DEVICE FOR THE RECOGNITION OF AN AUTHENTICATING MARK ON AN ENVELOPED SURFACE OF AN OBJECT - A method for the recognition of an authenticating mark on the surface of a packaging foil or an article by visual and/or electronic recognition through an envelope, where ultrasonic or X-ray techniques are performed. The authenticating mark includes at least one embossed authenticating mark having finest structures in the micrometer range, and the surface of the packaging foil or of the area of the article in which the authenticating mark is embossed being metallized or made of metal.03-11-2010
20100128966PATTERN SHAPE EVALUATION METHOD AND PATTERN SHAPE EVALUATION APPARATUS UTILIZING THE SAME - The present invention provides a pattern shape evaluation method that can securely decide whether patterns are connected or disconnected and, further, evaluate a pattern shape qualitatively.05-27-2010
20080240540APPEARANCE MANIFOLDS FOR MODELING TIME-VARIANT APPEARANCE OF MATERIALS - A method for modeling a time-variant appearance of a material is described. A sample analysis of a material sample is performed, wherein the sample analysis orders surface points of the material sample with respect to weathering from data captured at a single instant in time. An appearance synthesis using the sample analysis is performed, wherein the appearance synthesis generates a time-variant sequence of frames for weathering an object.10-02-2008
20080240543Calibration and normalization method for biosensors - Calibration and normalization methods for a grating-based sensor design are disclosed. The sensor may be constructed in a manner optimized for both label-free and luminescence, e.g. fluorescence, amplification detection in a single device. Such a sensor, based on grating or another periodical structure with appropriate coating, dramatically increases the diversity of applications and allows realizing novel concepts that provide qualitative and quantitative information/data for each location or capture element in the sensor surface. The invention takes advantage of these different modes to carry out a quality control (QC) step and a calibration of each individual location of the sensor. Thus, the assay data can be flagged according to their quality and local density variations, batch variations and variations in the printed deposition of probes or the materials to the surface can be compensated.10-02-2008
20080240541Automatic optical inspection system and method - An automatic optical inspection system includes a rotary device for driving an object to rotate. At least one line-scan camera is implemented for generating two-dimensional planar images of cylindrical surfaces of the object. A device for detecting defects is operable to generate the two-dimensional planar images of the cylindrical surfaces of the object according to a normalized grayscale absolute difference inspection method.10-02-2008
20090034827Inspection device, inspection method, method of manufacturing color filter, and computer-readable storage medium containing inspection device control program - An inspection device of the present invention includes: a linear irregularity detecting section for detecting linear irregularities individually in an image L of dots on a substrate being inspected by projecting light from a first direction and in an image R of the dots by projecting light from a second direction, which differs from the first direction; a specific-cycle irregularity extracting section for extracting linear irregularities detected at predetermined intervals T in the individual mages L and R, the intervals being taken vertical to the linear irregularities on the substrate; and a detection-target-irregularity extracting section for extracting a linear irregularity detected in both the images L and R as a detection-target linear irregularity. The device therefore is capable of detecting only linear irregularities of a specific cycle which are caused by the presence of dots having irregular thickness when compared to a dot with normal thickness.02-05-2009
20100128967Hands-free Inspection Systems - An inspection system comprising one or more foot switches, one or more data sources and computer software for the purpose of reducing manual procedures in an inspection process. Said inspection system is interfaced to a host computer and an inspection apparatus such that information regarding inspection of articles- or features-of-interest can be recorded in an inspection report. Said inspection system data sources may include, but are not limited to, position determination devices, information reading devices, voice input devices in combination with voice recording or voice recognition software, image capture devices and/or their associated software, and foot switches. Said computer software being a standalone application, with or without associated files, or a file executed by a separate software application, again, with or without associated files.05-27-2010
20090169093PATTERN INSPECTION METHOD AND ITS APPARATUS - In a pattern inspection apparatus for comparing images of corresponding areas of two patterns, which are formed so as to be identical, so as to judge that a non-coincident part of the images is a defect, the influence of unevenness in brightness of patterns caused by a difference of thickness or the like is reduced, whereby highly sensitive pattern inspection is realized. In addition, high-speed pattern inspection can be carried out without changing the image comparison algorithm. For this purpose, the pattern inspection apparatus operates to perform comparison processing of images in parallel in plural areas. Further, the pattern inspection apparatus operates to convert gradation of an image signal among compared images using different plural processing units such that, even in the case in which a difference of brightness occurs in an identical pattern among images, a defect can be detected correctly.07-02-2009
20120294506METHOD AND DEVICE FOR INSPECTING A TRAVELING WIRE CABLE - A wire cable is exposed to flashes and the exposed image is detected on at least one lay length or a multiple of the lay length and monitored for changes in the image. Preferably, the respective repetition of the same outer stranded wire of the traveling wire cable is detected in the same location and every repetition or every other repetition or every third repetition is used for triggering the flash. In another embodiment, a picture is taken of a large portion of the wire cable using a specialized camera and the image is split up, into recurring units of length that correspond to the size of a lay length or a multiple of the lay length and the successive units of length are compared and inspected for changes in the image.11-22-2012
20100215246System and method for monitoring and visualizing the output of a production process - A system for monitoring and visualizing the output of a production process, whose output materials or items are inspected by one or more inspection units, may include a communication module to receive data from the one or more inspection units. The received data may be associated with a measured or extrapolated value of at least one parameter of the inspected materials or items. A comparator module may compare at least one of the measured or extrapolated values against a corresponding stored value to determine a difference value, and a visualization module may generate an image representing the inspected items or materials. An area or section of the image corresponding to an area or section of the item or material associated with the at least one of the measured or extrapolated values which was compared to the stored value may be visually coded to indicate a corresponding difference value.08-26-2010
20100278415METHOD AND SYSTEM FOR PRODUCING FORMATTED INFORMATION RELATED TO DEFECTS OF APPLIANCES - The method and a system for producing formatted information related to defects of appliances of a chain of appliances. To produce the formatted information related to the defects of an image-capture appliance of the chain, the method includes a first calculation algorithm with which there can be chosen, within a set of parameterizable transformation models, within a set of parameterizable reverse transformation models, within a set of synthesis images, within a set of reference scenes, and within a set of transformed images: a reference scene, and/or a transformed image, and/or a parameterizable transformation model with which a reference image of the reference scene can be transformed to the transformed image, and/or a parameterizable reverse transformation model, with which the transformed image can be transformed to the reference image, and/or a synthesis image obtained from the reference scene and/or obtained from the said reference image. The formatted information is at least partly composed of the parameters of the chosen parameterizable transformation model and/or of the parameters of the said chosen parameterizable reverse transformation model.11-04-2010
20080285840Defect inspection apparatus performing defect inspection by image analysis - A defect inspection apparatus obtains a color image signal of an inspection target. Based on a plurality of signal components forming this color image signal, a plurality of analysis images are obtained. Defect detection of an inspection target is implemented for each of the a plurality of analysis images. A differential is detected for a defect nomination detected for each of the analysis images, and thereby whether a plurality of defects exist or not in successive defect positions of the inspection target is determined.11-20-2008
20090097735SAMPLE INSPECTION, MEASURING METHOD AND CHARGED PARTICLE BEAM APPARATUS - An image for measuring a pattern or an image for making positioning for measurement is formed by scanning a sample with a focused electron beam and an estimation value of the image is compared with an image estimation value of a previously gotten reference image, so that focusing of the electron beam is performed again when it is judged that the formed image does not satisfy a predetermined condition by the comparison with the reference image.04-16-2009
20100142797Method and Apparatus for Utilizing Representational Images in Commercial and Other Activities - In a method and apparatus for an object using a representational image, positioning the object at a predetermined position relative to the representational image, illuminating the representational image, presenting information from the representational image to an operator, at least one of controlling the illuminating of the representational image and presenting of information from the representational image to an operator, using a processing arrangement, and processing the object using the information obtained from the representational image.06-10-2010
20100142798NON-CONTACT MEASUREMENT APPARATUS AND METHOD - A non-contact method and apparatus for inspecting an object. At least one first image of the object on which an optical pattern is projected, taken from a first perspective is obtained. At least one second image of the object on which an optical pattern is projected, taken from a second perspective that is different to the first perspective is obtained. At least one common object feature in each of the at least one first and second images is then determined on the basis of an irregularity in the optical pattern as imaged in the at least one first and second images.06-10-2010
20100142796Inspection method and apparatus for substrate - An inspection method and apparatus for a substrate are provided. The inspection apparatus includes an optical unit generating a light illuminating the substrate to generate an image, a sensor array receiving the image having a light wave comprising a wave-band within a range between 700 nm to 1500 nm, and an image processing unit capturing the image.06-10-2010
20110268343METHOD FOR THE NONDESTRUCTIVE TESTING OF PIPES - The invention relates to a method for the nondestructive testing of pipes made of ferromagnetic steel for flaws by means of stray flux, wherein the pipe is magnetized by a constant field and the discontinuities present in the near-surface region of the outer or inner surface of the pipe cause magnetic stray fluxes, which exit the pipe surface and are detected by probes of a test unit each for longitudinal and/or transversal flaw testing, wherein the association of the detected amplitude signals is performed on the basis of the amplitude height and/or the frequency spectrum with respect to an external or internal flaw via defined flaw thresholds respectively. To this end, prior to associating the detected amplitude signals to an external or internal flaw, the angular position of the flaw relative to the respective magnetic field direction is determined, and a correction of the signals is carried out via a previously determined correction factor for amplitudes and/or frequencies of a perpendicular angular position.11-03-2011
20090180679METHOD AND APPARATUS FOR PARTS MANIPULATION, INSPECTION, AND REPLACEMENT - Improved method and apparatus for machine vision. One embodiment provides automated imaging and analysis, optionally including Scheimpflug's condition on the pattern projector, telecentric imaging and projecting, an IR filter, a mask to constrain observed illumination, and/or a sine-wave projection pattern for more accurate results. Another embodiment provides circuitry for a machine-vision system. Another embodiment provides a machine-vision system, optionally including accommodation of random orientation of parts in trays, irregular location of features being inspected, crossed pattern projectors and detectors for shadow reduction, detection of substrate warpage as well as ball-top coplanarity, two discrete shutters (or flash brightnesses) interleaved (long shutter for dark features, short shutter for bright features). Another embodiment provides parts inspection, optionally including a tray elevator that lifts trays to an inspection surface, moves trays in short tray dimension, provides first tray inspection at a major surface of the elevator, and/or provides a tray flipper.07-16-2009
20090129662SHAPE INSPECTION APPARATUS, SHAPE INSPECTION METHOD AND COMPUTER READABLE MEDIUM - A shape inspection apparatus includes a shape display unit that displays a three-dimensional shape specified by three dimensional shape data on a screen; a direction designating unit that specifies a drawing direction in molding the three-dimensional shape on the screen; a face designating unit that specifies one face of a protruding or recessed shape portion of the three-dimensional shape on the screen; a dimension calculating unit that calculates a shape dimensional value of the shape portion based on the specified drawing direction and the specified one face; and a determination unit that determines whether or not the shape portion having the shape dimensional value satisfies a shape condition by comparing the calculated shape dimensional value with a standard value.05-21-2009
20110206269METHODS OF EVALUATING THE QUALITY OF TWO-DIMENSIONAL MATRIX DOT-PEENED MARKS ON OBJECTS AND MARK VERIFICATION SYSTEMS - Methods and mark verification systems for evaluating the quality of a two-dimensional matrix dot peen mark on an object are provided. An exemplary embodiment of the methods includes scanning a two-dimensional matrix dot peen mark disposed on a surface of an object with a laser displacement sensor to generate three-dimensional scanned data for the mark, the mark including a plurality of dots disposed in a plurality of rows and columns on the surface; and determining whether the mark passes a verification test based on the scanned data.08-25-2011
20090161940SYSTEM AND METHOD FOR ANALYZING IMPURITIES OF AN OBJECT - A computer-implemented method for analyzing impurities of an object is provided. The method includes selecting a region from an image of the object, pre-treating the region to calculate a threshold, processing the region and deleting the points from an outer layer of the region. The method further includes setting a starting point and search directions, determining a point before a first boundary point as an origin of the region and searching the next boundary points if the first boundary point has been searched. The method also includes searching all the boundary points in the region, forming an impurity if the last boundary point coincides with the first boundary point, seed filling the impurity and calculating an area value, and comparing the area value with an allowable area value to determine whether the impurity satisfies impurity specifications.06-25-2009
20090141964APPEARANCE INSPECTION APPARATUS, APPEARANCE INSPECTION SYSTEM, AND APPEARANCE INSPECTION APPEARANCE - An appearance inspection apparatus, wherein an image inspection result based on a result of image-taking and image-analyzing a product to be inspected can be displayed with superposed on a visual field of an inspector inspecting the product to be inspected with an eye and in a position corresponding to an image in which the inspector is observing the product to be inspected is provided. An appearance inspection method includes: performing image inspection of a product to be inspected by image-taking the product to be inspected and image-analyzing the product to be inspected in an image-treating section. An inspector is capable of inspecting the product to be inspected with an eye in the state that a result of the image inspection is displayed with superposed on a visual field of an inspector inspecting the product to be inspected with an eye and in a position corresponding to an image in which the inspector is observing the product to be inspected.06-04-2009
20090136114MULTI-MODALITY INSPECTION METHOD WITH DATA VALIDATION AND DATA FUSION - An inspection method is provided and includes acquiring at least one inspection data set. Each inspection data set comprises inspection data for a component. The inspection method further includes mapping the inspection data set onto a three-dimensional (3D) model of the component, to generate a 3D inspection model for the component, and validating the inspection data against the 3D model of the component using at least one validation criterion. A multi-modality inspection method is also provided and includes acquiring multiple inspection data sets corresponding to multiple inspection modalities for a component and fusing the inspection data sets to form a fused data set. The multi-modality inspection method further includes mapping the fused data set onto a 3D model of the component to generate a 3D multi-modality inspection model for the component.05-28-2009
20120070063INSPECTION METHOD AND INSPECTION APPARATUS - The application relates to a method of inspecting an object and an inspection apparatus. The object has a plurality of features and the method includes the step of identifying a current primary feature on the object. Once the current primary feature has been selected, one or more additional features are selected, each of the one or more additional features selected having at least one common attribute with the current primary feature. The method also includes the step of capturing an image of the selected features on an image capture module.03-22-2012
20090003682Pattern inspection method and its apparatus - In a pattern inspection apparatus for comparing images of corresponding areas of two patterns, which are formed so as to be identical, so as to judge that a non-coincident part of the images is a defect, the influence of unevenness in brightness of patterns caused by a difference of thickness or the like is reduced, whereby highly sensitive pattern inspection is realized. In addition, high-speed pattern inspection can be carried out without changing the image comparison algorithm. For this purpose, the pattern inspection apparatus operates to perform comparison processing of images in parallel in plural areas. Further, the pattern inspection apparatus operates to convert gradation of an image signal among compared images using different plural processing units such that, even in the case in which a difference of brightness occurs in an identical pattern among images, a defect can be detected correctly.01-01-2009
20090252401Methods, Objects and Apparatus Employing Machine Readable Data - The present invention relates generally to steganography and data hiding. One claim recites an object including: electronic processing circuitry having an operating or performance metric associated therewith; and steganographic indicia carried by the object, the steganographic indicia is usable as an index to verify the operating or performance metric. Another claim recites an apparatus including: electronic memory; and machine-readable indicia usable as a registry index including data that provides an indication regarding an expected capacity of the electronic memory. Other combinations are described and claimed as well.10-08-2009
20090202134PRINT INSPECTING APPARATUS - A print inspecting apparatus capable of identifying a page of a form corresponding to a clipped image without requiring a special barcode or printing, is provided. A print inspecting apparatus 08-13-2009
20090052764System and Method for Detecting Foreign Objects in a Product - The present invention relates to a system for detecting a change in material composition in a product. The system comprises a microwave transmitter emitting a microwave signal at a predetermined microwave frequency composition, and an ultrasonic transmitter emitting an ultrasound signal at a predetermined ultrasound frequency composition into at least a part of said product to create a density displacement within the product. The system further comprises means to receive a microwave signal and/or an ultrasonic signal having passed through at least a part of said product, means to measure the attenuation and/or runtime between each emitted signal and each received signal, respectively, under the influence of the created density displacement, and means to compare the measured attenuation and/or runtime with a previously determined attenuation and/or runtime to determine a change in material composition. The invention further relates to a method for detecting a possible change in material composition in a product.02-26-2009
20090232383Method and Device for Inspecting a Traveling Wire Cable - In a first embodiment, a picture is taken of the traveling wire cable in a stationary position at intervals that are equal to the ratio produced from the lay length or a multiple of the lay length and the travel speed of the wire cable, at least op one lay length or the above-mentioned multiple of the lay length, and the successive images are compared on at least one lay length or the above-mentioned multiple of the lay length and are monitored for changes in the image which are indicative of damages. In a second embodiment, the wire cable is instead of taking pictures exposed to flashes and the exposed image is detected on at least one lay length or the above-mentioned multiple of the lay length and monitored for changes in the image. Preferably, the respective repetition of the same outer stranded wire of the traveling wire cable is detected in the same location and every repetition or every other repetition or every third repetition is used for triggering the taking of a picture or for triggering the flash. In a third embodiment, a picture is taken of a large portion of the wire cable using a specialized camera and the image is split up into recurring units of length that correspond to the size of a lay length or a multiple of the lay length and the successive units of length are compared and inspected for changes in the image.09-17-2009
20110222754SEQUENTIAL APPROACH FOR AUTOMATIC DEFECT RECOGNITION - A method of automatic defect recognition includes receiving a initial set of inspection image data of a scanned object from a scanning machine; applying a first image analysis algorithm to this set of inspection image data; then removing from the set of inspection image data any defect-free image regions, so as to retain a set of analyzed inspection image data; applying an additional image analysis algorithm(s) to the set of analyzed inspection image data, wherein the additional algorithm(s) has a higher computational cost than the first image analysis algorithm; and based on the applying of the additional image analysis algorithm(s), removing from the first set of inspection image data a second set of defect-free image regions, thereby retaining a set of twice-analyzed inspection image data.09-15-2011
20090202133APPARATUS AND METHOD FOR GENERATING A TWO-DIMENSIONAL REPRESENTATION OF AN OBJECT PORTION ARBITRARILY ARRANGED WITHIN AN OBJECT - For generating a two-dimensional representation of an object portion arbitrarily arranged within an object, a first image comprising the object, and subsequently a second image comprising the object are generated by means of an imaging device while the object and the imaging device are moving relative to each other. By means of a signal processor, information about a position and a shape of the object portion of interest within the object and its relative motion is received so as to combine, on the basis of the information received, image portions, within the first and second images, which are associated with the object portion of interest.08-13-2009
20110222755DEVICE, METHOD AND COMPUTER READABLE MEDIUM FOR EVALUATING SHAPE OF OPTICAL ELEMENT - A method for evaluating a shape of an optical element, including: executing polynomial approximation to obtain a deviation shape of a testing surface of an optical element with respect to an ideal surface; calculating an evaluation shape by extracting a rotationally symmetric irregularity component of the deviation shape from a result of the polynomial approximation; adding a 209-15-2011
20090245616Method and apparatus for visiometric in-line product inspection - A method and an apparatus for grouping individual products such as industrially baked products that travel past a visiometry station into lots for counting them. In a viewing zone of a conveyor belt, a laser triangulation visiometry system is used. The method and apparatus also uses a signal processor associated with the camera that deduces from the images acquired thereby at least one piece of information on the location of the products on the conveyor belt as well as height information thereon. This information is then used by the signal processor to automatically distinguish between the presence of a product and the presence of contaminating material (for example flour or chocolate particles) on the conveyor belt and to distinguish the presence of several partially or fully overlapping products from the presence of a single product on said conveyor belt. Preferably, two cameras are disposed symmetrically relative to a laser plane substantially perpendicular to the plane of the viewing zone.10-01-2009
20090245614METHOD AND APPARATUS FOR DETECTING DEFECTS USING STRUCTURED LIGHT - An improved method and apparatus for detecting problems with fit and finish of manufactured articles is presented which uses structured light. Two or more structured light images acquired from opposing directions is used to measure the fit of mating surfaces while avoiding false positives caused by small defects near the seam.10-01-2009
20090257643METHOD AND SYSTEM FOR REMOTE REWORK IMAGING FOR PART INCONSISTENCIES - A system and method for remote rework imaging a part for an inconsistency is provided. The part is scanned with a nondestructive inspection device. An image of a part inconsistency is communicated from the nondestructive inspection device to a programmable device. The image of the part inconsistency is viewed with the programmable device. The image of the part inconsistency is edited with the programmable device using an input device in communication with the programmable device. The edited image is communicated from the programmable device to a visible light projector. The edited image is projected onto the part inconsistency using the visible light projector.10-15-2009
20100150425METHOD FOR OPERATING AND/OR MONITORING A FIELD DEVICE, AND CORRESPONDING FIELD DEVICE - The invention relates to a method for servicing and/or monitoring a field device (06-17-2010
20090252400METHOD FOR MOUNTING ELECTRONIC COMPONENT - In order to recognize grid-like reference marks on a jig plate positioned in a mounting area by means of a substrate recognizing camera respectively, to obtain a positional shift amount of a mounting head with respect to XY coordinates on an apparatus of each of the reference marks, and to correct a mounting position, thereby carrying out a mounting operation, a jig component positioned and mounted sequentially on each of the reference marks formed on the jig plate by means of a nozzle head is recognized by the substrate recognizing camera, a shift amount of XY coordinates acquired by the camera recognition of the jig component from XY coordinates on the apparatus of the corresponding reference mark is obtained as corrected data on the nozzle head with respect to the reference mark, and a correction is carried out based on the corrected data when an electronic component is to be mounted on a substrate by means of the nozzle head.10-08-2009
20100158343SYSTEM AND METHOD FOR FAST APPROXIMATE FOCUS - Fast approximate focus operations providing an approximately focused image that is sufficiently focused to support certain subsequent inspection operations. The operations are particularly advantageous when used to provide images for successive inspection operations that predominate when inspecting planar workpieces. Improved inspection throughput is provided because, in contrast to conventional autofocus operations, the fast approximate focus operations do not acquire an image stack during a run mode as a basis for determining a best focused image. Rather, during learn mode, a representative feature-specific focus curve and a focus threshold value are determined and used during run mode to provide an approximately focused image that reliably supports certain inspection operations. In one embodiment, an acceptable approximately focused inspection image is provided within a limit of two focus adjustment moves that provide two corresponding images. The adjustment moves are based on the representative feature-specific focus curve provided in learn mode.06-24-2010
20100014746INTERACTIVE USER INTERFACES AND METHODS FOR VIEWING LINE TEMPERATURE PROFILES OF THERMAL IMAGES - An interactive graphical user interface includes a moveable pointer, which may be activated to select points of a computer-generated thermal image of an object, as the pointer is moved over a display of the image, so that line temperature profiles, which correspond to predetermined lines extending through the selected points, may be viewed, for example, on a line temperature profile chart of the interface, for each selected point as the pointer is moved. Each predetermined line extends between the corresponding selected point and another, predetermined, point of the image. The other predetermined point may either coincide with an origin of an x-axis or a y-axis of an orthogonal coordinate system, in which the image is aligned, or may be any other point of the thermal image, for example, one that is pre-selected by a user, with the moveable pointer.01-21-2010
20090245617System and method for processing image data - Embodiments of the present invention recite a system for providing product consulting using a transmitted image. In one embodiment, the present invention comprises an image capture device for capturing an image of a user and a reference color set. In embodiments of the present invention, the image capture device does not require a provided infrastructure when capturing the image. The system further comprises a categorizing system for determining at least one data category from data comprising the image. A result generator generates a result based upon the determining of the categorizing system. The system further comprises a result reporting system for conveying the product consultation to the user when the result is conveyed.10-01-2009
20100177952DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD - A defect inspection method includes: acquiring an image of an inspection pattern obtained by an imaging device, detecting an edge of the inspection pattern in the image, dividing the image into an inspection region and a non-inspection region, using the detected edge as a boundary thereof, performing image processing only on the inspection region to determine the intensity value distribution in the image, and detecting a defect in the inspection pattern based on the obtained intensity value distribution.07-15-2010
20100177951METHOD AND APPARATUS FOR SCANNING SUBSTRATES - A method and apparatus for scanning and acquiring 3D profile line data of an object, illustratively for use in an optical inspection system. A 3D scanning subsystem is provided in relative movement to the object being scanned. The subsystem is capable of simultaneously scanning different regions of the object with different exposure lengths.07-15-2010
20100239155 ABNORMALITY DETECTING APPARATUS FOR DETECTING ABNORMALITY AT INTERFACE PORTION OF CONTACT ARM - An abnormality detecting apparatus includes an imaging device for obtaining image data of a TIM, a failure detecting section for detecting appearance failures of the TIM on the basis of the image data of the TIM obtained by the imaging device, and a determining device for determining whether an abnormality occurs at the TIM on the basis of a detection result by the failure detecting section.09-23-2010
20100226561PARAMETER DETERMINATION ASSISTING DEVICE AND PARAMETER DETERMINATION ASSISTING PROGRAM - This invention provides a parameter determination assisting device and a parameter determination assisting program enabling a more rapid and easy determination of a parameter to be set in a processing device, which obtains a processing result by performing a process using a set of parameters defined in advance on image data obtained by imaging a measuring target object. A user can easily select an optimum parameter set when a determination result and a statistical output are displayed in a list for each of a plurality of trial parameter candidates. For instance, while trial numbers “2”, “4”, and “5”, in which the number of false detections is zero, can perform a stable process, the parameter set of the trial number “2” is comprehensively assumed as optimum since the trial number “2” can perform the process in the shortest processing time length.09-09-2010
20100226560Method for detecting defects in a plastic fuel bank by radiography - Method for detecting defects in a plastic vehicle tank equipped with internal accessories located inside the tank. The method comprises at least the following steps: a) providing the tank equipped with said internal accessories; b) making a digitized X-ray image of said tank; c) providing a reference image of said tank; d) comparing the digitized X-ray image and the reference image by means of a computer vision software; e) deciding on the presence of defects when differences exist between the digitized X-ray image and the reference image.09-09-2010
20100239154INFORMATION PROCESSING APPARATUS AND METHOD - An information processing apparatus for selecting, from a plurality of feature amounts that are extracted from input data items, feature amounts that are to be used to classify the input data items is provided. The information processing apparatus includes generating means for generating a plurality of combinations by generating combinations of feature amounts that are selected from the plurality of feature amounts; first calculating means for calculating, for each of the plurality of combinations, a first evaluation value for evaluating a suitability for classification of the input data items; and second calculating means for obtaining, on the basis of the first evaluation values, for each of the plurality of feature amounts, a second evaluation value for evaluating a suitability for classification of the input data items.09-23-2010
20100014747Stent Inspection System - Apparatus, systems, and methods for inspecting longitudinal surfaces and sidewalls of cut tubes are disclosed. In some embodiments, the apparatus includes a line camera, the line camera being configured to capture images of longitudinal surfaces of the cut tubes, an area camera joined with the line camera, the area camera being configured to capture images of sidewalls of the cut tubes, a mandrel and drive, a multi-axis motion stage, a vertical motion stage, and a rotating motion stage. In some embodiments, the system includes a camera module, a tube positioning module, a motion control module, and an analysis module. In some embodiments, the method includes positioning a line and area cameras, moving the cut tubes, capturing images of the longitudinal surfaces and sidewalls of the cut tubes, providing comparable images of a template cut tube, and comparing the images of the cut tubes to those of the template cut tube.01-21-2010
20110026804Detection of Textural Defects Using a One Class Support Vector Machine - Method for detecting textural defects in an image. The image, which may have an irregular visual texture, may be received. The image may be decomposed into a plurality of subbands. The image may be portioned into a plurality of partitions. A plurality of grey-level co-occurrence matrices (GLCMs) may be determined for each partition. A plurality of second-order statistical attributes may be extracted for each GLCM. A feature vector may be constructed for each partition, where the feature vector includes the second order statistical attributes for each GLCM for the partition. Each partition may be classified based on the feature vector for the respective partition. Classification of the partitions may utilize a one-class support vector machine, and may determine if a defect is present in the image.02-03-2011
20110026805IMAGE PROCESSING APPARATUS AND IMAGE PROCESSING METHOD - An image processing apparatus includes: an image extracting section that extracts a template image from blade images which form a streaming video obtained by capturing blades periodically arrayed in a jet engine; an image comparing section that compares the blade images with the template image; an image selecting section that selects an image as a record image from the blade images based on a result of the image comparison of the image comparing section; and a display section that displays the surface shape of the blade calculated based on the record image.02-03-2011
20100220918INSPECTION APPARATUS AND INSPECTION METHOD - Aims to provide an inspection apparatus which precisely detects an amount of misalignment of a component mounted on a panel through an adhesive which contains conductive particles. The inspection apparatus includes: an infrared-light illuminator (09-02-2010
20130129183Image Processing Apparatus And Image Processing Method - Provided is an image processing apparatus capable of viewing even a characteristic portion of an inspection object even if partial image data of the inspection object is used for inspection. The image processing apparatus includes: an imaging portion for imaging an inspection object; a compression processing portion for executing compression processing on image data captured by the imaging portion, to generate compressed image data; and an image processing portion for executing image processing for an inspection. The image processing portion generates partial image data as part of the captured image data, and accepts a selection of any of the compressed image data and the partial image data as the image data for use in the image processing. The image processing portion executes the image processing for the inspection by use of the compressed image data or the partial image data, the selection of which has been accepted.05-23-2013
20130129184METHODS AND SYSTEMS FOR DIMENSIONAL INSPECTION OF COMPENSATED HARDWARE - A manufacturing method is adapted for materials that are susceptible to deformation during the manufacturing process, such as composite parts that change shape during curing. The method includes modifying a part design to compensate for changes in the shape of the part that occur during a curing phase of the manufacturing process. A manufacturing mold is created according to the modified part design, then a part is formed in the mold and cured in the mold. While the part is still in the mold after the curing phase, the part is finished according to the modified part design wherein excess material is removed and apertures are created. While the part is still in the mold after the finishing phase, the finished part is inspected using automated inspection equipment to confirm that the finished part conforms to the modified part design.05-23-2013
20130129185METHOD FOR DETECTING OPTICAL DEFECTS IN TRANSPARENCIES - A method of detecting optical defects in a transparency may comprise the steps of providing a digital image of the transparency having a plurality of image pixels and detecting at least one candidate defect. The candidate defect may be detected by determining a grayscale intensity of each one of the image pixels and calculating an intensity gradient across adjacent pairs of the image pixels. Each image pixel may be assigned a gradient value comprising a maximum of the absolute value of the intensity gradients associated with the image pixel. A gradient image may be constructed comprising the gradient values assigned to corresponding ones of the image pixels. Image pixels may be identified as candidate pixels if such image pixels have a gradient value exceeding a gradient threshold. The candidate pixels may comprise the optical defect.05-23-2013
20130129186DETECTION OF NON-COMPLIANCE PATTERNS IN PRESCRIBED MEDICATION DOSES - Apparatus for detecting non-compliance patterns on a series of used blister sheets previously returned by the same patient, reads a code (05-23-2013
20130129187PERSISTENT FEATURE DETECTION - Methods are presented for improved detection of persistent or systematic defects induced during the manufacture of a product. In particular, the methods are directed to the detection of defects induced systematically in the manufacture of photovoltaic cells and modules. Images acquired from a number of samples are combined, enhancing the systematic defects and suppressing random features such as variations in material quality. Once a systematic defect is identified, steps can be taken to locate and rectify its cause.05-23-2013
20090028418SYSTEM AND METHOD FOR INSPECTING ELECTRONIC DEVICE - The invention discloses a method for inspecting an electronic device to reduce the consumption of testers' labor and time and testers' erroneous or careless judgment, and increase the test efficiency and reliability. Furthermore, the method of the invention can help to maintain or modify the test standard immediately and feedback the condition of the electronic device to the production line. The method of the invention includes the steps of: (A) storing a plurality of standard parameters related to the electronic device; (B) measuring a plurality of inspecting parameters, wherein each inspecting parameter corresponds to one of the standard parameters; (C) comparing each of the inspecting parameters with the corresponded standard parameter and setting a processing status of the electronic device according to a first criterion; and (D) receiving the comparison results of step (C) and generating an adjusting information according to the comparison results.01-29-2009
20100303334PATTERN INSPECTION APPARATUS AND METHOD - A fine pattern, such as a semiconductor integrated circuit (LSI), a liquid crystal panel, and a photomask (reticle) for the semiconductor or the liquid crystal panel, which are fabricated based on data for fabricating the fine pattern such as design data is inspected by a pattern inspection apparatus. The pattern inspection apparatus for inspecting a pattern to-be-inspected uses an image of the pattern to-be-inspected and data for fabricating the pattern to-be-inspected. The pattern inspection apparatus includes a reference pattern generation device configured to generate a reference pattern represented by one or more lines from the data, an image generation device configured to generate the image of the pattern to-be-inspected, a detecting device configured to detect an edge of the image of the pattern to-be-inspected, and an inspection device configured to inspect the pattern to-be-inspected by comparing edges of the image of the pattern to-be-inspected with the one or more lines of the reference pattern.12-02-2010
20110243423SYSTEM AND METHOD FOR INSPECTING ELECTRICAL STIMULATION LEADS - In one embodiment, a method of inspecting a lead body comprising a plurality of wire conductors helically wound in groups separated by respective gaps, the system comprises: providing a lead body comprising a plurality of wire conductors, helically wound in groups separated by respective gaps, in transparent insulative material, in a channel of a fixture; providing a sensor module; scanning the sensor module along a substantial length of the lead body to obtain image, interferometric, or other data of the lead body; electronically processing the data to calculate respective distances from given turns within a group of the wire conductors from an other sheath of the lead body; determining whether the calculated respective distances correspond to expected values within defined tolerances; and generating an inspection report for the lead body based on the determining.10-06-2011
20110019903Method for Processing a Three-Dimensional Image of the Surface of a Tire so That It Can be Used to Inspect the Said Surface - Method for inspecting a zone of the surface of a tire, said surface comprising markings in relief, wherein the three-dimensional profile of the surface to be inspected is determined, characteristic points on the surface to be inspected are located and these points are matched with the corresponding points originating from the three-dimensional data of a reference surface, so as to create a set of pairs of matched points, in an iterative manner, a first affine transformation function is sought, applied to the characteristic points of the reference surface, so that the value representing the sum of the distances between each of the characteristic points of the reference surface, which points are transformed with the aid of said first transformation function, and the points of the surface to be inspected that are matched with them, is minimal, and said first transformation function is applied to all of the points of the reference surface in order to obtain a transformed reference surface.01-27-2011
20110033103Glass Container Stress Measurement Using Fluorescence - An apparatus and method for measurement of the stress in and thickness of the walls of glass containers is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in glass containers. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of the side walls of glass containers throughout the circumference of the glass containers. The apparatus and method are adapted for large scale glass container manufacturing, and are capable of high speed measurement of the stress in and the thickness of the side walls of glass containers.02-10-2011
20090196486Automatic Method and System for Visual Inspection of Railway Infrastructure - The present invention relates to a visual inspection system and method for the maintenance of infrastructures, in particular railway infrastructures. It is a system able to operate in real time, wholly automatically, for the automatic detection of the presence/absence of characterizing members of the infrastructure itself, for example the coupling locks fastening the rails to the sleepers.08-06-2009
20120243770PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD - In accordance with an embodiment, a pattern inspection method includes: applying a light generated from a light source to the same region of a substrate in which an inspection target pattern is formed; guiding, imaging and then detecting a reflected light from the substrate, and acquiring a detection signal for each of a plurality of different wavelengths; and adding the detection signals of the different wavelengths in association with an incident position of an imaging surface to generate added image data including information on a wavelength and signal intensity, judging, by the added image data, whether the inspection target pattern has any defect, and when judging that the inspection target pattern has a defect, detecting the position of the defect in a direction perpendicular to the substrate.09-27-2012
20100040277PANEL INSPECTION DEVICE AND INSPECTION METHOD OF PANEL - A panel inspection device and inspection method is provide. At least an image capturing element is disposed above or below a spacing between a first conveyer and a second conveyer. During a panel is conveyed from the first conveyer to the second conveyer, the image capturing element captures the image of the panel as the panel passes through the spacing.02-18-2010
20090028419METHOD FOR MANUFACTURING PLASMA DISPLAY PANEL, INSPECTION METHOD FOR INSPECTING PHOSPOR LAYER AND INSPECTION APPARATUS FOR INSPECTING PHOSPHOR LAYER - A phosphor paste is applied to inner surfaces of a cell. Then, a conveyer moves a substrate relative to a CCD camera at a constant speed. Simultaneously, two LEDs radiate visible light onto a portion, to be inspected, of the substrate. The visible light is light configured to have a wavelength so as to be able to prevent the phosphor of the phosphor paste from being excited and emitting light and reflected by a liquid surface of the phosphor paste to produce reflected light. Thereafter, the CCD camera captures an image of the phosphor paste and a data processor processes the received image data, and determines whether a phosphor layer formed by drying the phosphor paste will normally be formed, prior to formation of phosphor layer.01-29-2009
20090028417FIDUCIAL MARKING FOR MULTI-UNIT PROCESS SPATIAL SYNCHRONIZATION - A device for applying fiducial marks to a web for spatially synchronizing data from a plurality of processes is described. The device includes a fiducial mark reader to read fiducial marks of at least two formats on a web of material, a fiducial mark writer to write fiducial marks of at least two formats on the web, and an encoder to measure distance along the web. The device may provide several advantages. For example, the device may apply fiducial marks to a web that indicate the process line that applied the fiducial mark to the web or the date on which the fiducial mark was applied.01-29-2009
20090028416MULTI-UNIT PROCESS SPATIAL SYNCHRONIZATION - A conversion control system is described for spatially synchronizing data gathered from a plurality of operations performed on a web. The conversion control system applies a set of fiducial marks to a web, performs a plurality of operations on the web, generates a first and a second set of digital information for first and second operations, respectively, in accordance with respective first and second coordinate systems using the set of fiducial marks such that the each of the sets of digital information includes position data for respective first and second sets of regions on the web. The conversion control system may then register the position data of the first set of regions and the position data for the second set of regions to produce aggregate data and outputting a conversion control plan.01-29-2009
20110150316Can Seam Inspection - A method of determining integrity of a can seam including disposing the can seam between an X-ray source and an X-ray detector, exposing an overlap region of the can seam to radiation from the source, and determining an indication of integrity of the overlap region from a measure of variation in radiation intensity readings taken by the detector over a series of circumferential intervals of the can seam.06-23-2011
20110150315Replacement of Build to Order Parts with Post Configured Images in any Manufacturing Environment - An embedded imaging system for addressing burn rack time issues. The embedded imaging system focuses on flexibility, control, and the ability to run without manufacturer specific IT capabilities (which allows the use of the embedded imaging system at outside manufacturing facilities).06-23-2011
20100310149DEVICE AND METHOD FOR DETECTING THE JOINTED PARTS OF STRIP IN AN ENDLESS HOT ROLLING PROCESS - There are provided a device and method for detecting joint parts of a steel strip in an endless hot rolling process. The device for detecting joint parts of a steel strip in an endless hot rolling process includes an image signal collection block receiving image signals, each having information on gray level pixels of a steel strip, from a charge coupled device (CCD) camera; an edge line detection block receiving the image signals from the image signal collection block to detect an edge line of the steel strip; a profile calculation block receiving information on the detection of the edge line from the edge line detection block to calculate the sum of gray levels up to an edge line of the steel strip in a traverse direction of the steel strip when the edge line is detected by the edge line detection block; a joint part judgement block receiving information on the sum of the gray levels, which shows a current profile value, from the profile calculation block to judge the edge line as a joint part when a ratio of a mean value of the current profile and a mean value of the previous profile is less than a predetermined value; and an output block receiving information on the judgement of the edge line as the joint part from the joint part judgement block to output a joint part-detecting signal when the edge line is judged to be a joint part.12-09-2010
20100260410Closed-Loop Process Control for Electron Beam Freeform Fabrication and Deposition Processes - A closed-loop control method for an electron beam freeform fabrication (EBF10-14-2010
20100296721INSPECTION APPARATUS AND INSPECTION METHOD - An object of the present invention is to provide an inspection apparatus and an inspection method for precisely detecting an amount of misalignment of a component mounted on a panel through an adhesive which contains conductive particles. An inspection apparatus according to an implementation of the present invention detects an amount of misalignment, from a predetermined mounting position, of a component mounted on a surface of a panel through an ACF. The inspection apparatus includes: an infrared light illuminator which illuminates with an infrared light a panel recognition mark and a component recognition mark, the panel recognition mark being formed on the surface of the panel, and the component recognition mark being formed on a surface of the component; an IR camera which is provided opposite the infrared light illuminator in relation to the panel, and captures an image of the panel recognition mark and an image of the component recognition mark which are illuminated with the infrared light; and an amount of misalignment calculation unit which calculates, using the images captured by the IR camera, an amount of misalignment in a positional relationship between the panel recognition mark and the component recognition mark from a predetermined positional relationship, and an optical axis of the infrared light illuminator is inclined with respect to a normal found on the surfaces of the panel or the component.11-25-2010
20100260409IMAGING MEASUREMENT SYSTEM WITH PERIODIC PATTERN ILLUMINATION AND TDI - A patterned TDI sensor comprising an array of pixels having respective sensitivities to light that varies according to a periodic pattern across said array of pixels, for high throughput applications of imaging and measurement with patterned illumination such as structured illumination, Moire techniques, 3D imaging and 3D metrology. An object is measured by scanning the object with illumination that varies periodically across the object, imaging the object with a patterned TDI sensor having a repetition length matched with the repetition length of the illumination and analyzing the output signal of the TDI sensor to extract information such as height or image of the object.10-14-2010
20100098321TEMPERATURE MEASURING DEVICE AND TEMPERATURE MEASURING METHOD - Feature points (04-22-2010
20110211747APPARATUS AND METHOD FOR THE AUTOMATED MARKING OF DEFECTS ON WEBS OF MATERIAL - A system for the characterization of webs that permits the identification of anomalous regions on the web to be performed at a first time and place, and permits the localization and marking of actual defects to be performed at a second time and place.09-01-2011
20110150317SYSTEM AND METHOD FOR AUTOMATICALLY MEASURING ANTENNA CHARACTERISTICS - An apparatus for automatically measuring characteristics of an antenna recognizes an object of the antenna based on an antenna image received from an external image capturing device, and extracts a parameter by using the recognized object of the antenna. The apparatus then authentically controls the position and direction of the image capturing device and an antenna characteristic measurement instrument by using the extracted parameter to thus automatically measure the characteristics of the antenna.06-23-2011
20090022392Method and Apparatus for Utilizing Representational Images in Commercial and Other Activities - In a method and apparatus for an object using a representational image, positioning the object at a predetermined position relative to the representational image, illuminating the representational image, presenting information from the representational image to an operator, at least one of controlling the illuminating of the representational image and presenting of information from the representational image to an operator, using a processing arrangement, and processing the object using the information obtained from the representational image.01-22-2009
20090022391Method and Product for Detecting Abnormalities - A new method for processing image data in order to detect abnormalities in a web is provided. The web is monitored by at least one camera, whereby an image comprising of plurality of pixels is generated. The data of the image is stored in a memory. Image data is filtered by a processor by creating a filtered image data by weighting the image data and at least one of earlier image data and earlier filtered image data; and combining the weighted image data and at least one of the weighted earlier image data and the weighted earlier filtered image data; and controlling filtering by at least one nonlinear algorithm; and thresholding the created filtered image data.01-22-2009
20080247630Defect inspecting apparatus and defect-inspecting method - An image pickup section 10-09-2008
20090297017HIGH RESOLUTION MULTIMODAL IMAGING FOR NON-DESTRUCTIVE EVALUATION OF POLYSILICON SOLAR CELLS - A non-destructive evaluation system for evaluating an article such as a test sample, the system comprising: 12-03-2009
20080304734Alignment correction prio to image sampling in inspection systems - A method and apparatus, and variations of each, for inspecting a wafer defining at least one die thereon is disclosed. The present invention first obtains the electronic image equivalent of two die, and then determines the x and y offset between those electronic images. Prior to inspection for defects, those two electronic images are aligned by adjusting the x and y positions of one electronic image of one die with respect to the electronic image of the other die. Once that is accomplished, the those electronic images are compared to detect any defects that may exist on one of the die.12-11-2008
20080310702Defect inspection device and defect inspection method - In an apparatus for photographing an image of a product to judge whether or not a defect is present, a manufacturing desirable image is formed from data acquired when the product was designed, which could be obtained if no defect was present when the product was photographed, an inspection portion where a defect may occur is selected from the formed manufacturing desirable image, a defect pattern is superimposed on the selected inspection portion so as to form a template equipped with the defect pattern. The image of the product is photographed, a template matching operation is carried out as a template having the defect pattern, and judgement is made whether or not a defect is present based upon a matched evaluation value. As a result, the judgement for judging whether or not the defect is present can be directly carried out based upon the evaluation value.12-18-2008
20080267487Process and System for Analysing Deformations in Motor Vehicles - Process for identifying, analysing and estimating deformations particularly in motor vehicles and wherein the following steps are provided in the so called manual selection mode: providing a database of sample vehicle images, that is not damaged vehicles calling up a sample vehicle image corresponding to the damaged vehicle in a vehicle image memory from a database of sample vehicle images displaying said image on a monitor selecting regions corresponding to damaged or deformed regions of the damaged vehicle, on the displayed vehicle image by inputting graphic and/or alphanumeric commands by means of graphic and/or alphanumeric command input means. by inputting graphic and/or alphanumeric commands by means of graphic and/or alphanumeric command input means entering in the work program alternatively or in combination a quality and/or quantitative estimation degree of the deformation depth proportional to the deformation gravity. computing perimeter. area and/or volume and/or identifying the locution in space of the damage on vehicle by means of algorithms implemented by the work program.10-30-2008
20110255768Method and System for Automated Ball-Grid Array Void Quantification - A method and system for identifying voids in solder balls in a ball-grid array (BGA) using an image of the BGA include localizing an image of a solder ball on the BGA image, the solder ball image having a radius and having multiple points each having an image intensity, and producing a void-free model image of the solder ball based on the radius of the solder ball image, the void-free model image having multiple points each having an image intensity. The method and system also include computing a difference between the image intensities of the points of the solder ball image and the image intensities of the points of the void-free model image to produce a residual image, and identifying a void using the residual image.10-20-2011
20080205742Generation of randomly structured forms - A computer system and method for generating a plurality of unique, randomly structured forms, such as invoices, that may be populated with data to produce test forms for testing automatic document processing systems. The forms may have major blocks such as a header, a body and a footer, and the major blocks may have randomly selected sizes. For each block, the locations of data fields and the ordering of the data fields within the block are defined randomly, the data locations within the fields and the data formats are randomly defined, and a blank image and an XML file of the randomly structured form are produced. The forms generated may be populated with data for the testing document processing system.08-28-2008
20110164806METHOD AND SYSTEM FOR LOW COST INSPECTION - A method for macro inspection, the method includes: (i) concurrently illuminating a current group of spaced apart object sub areas; wherein light reflected in a specular manner from a certain object sub area of the current group of object sub areas is expected to be detected by a certain sensor element of a current group of spaced apart sensor elements that correspond to the current group of spaced apart object sub areas; wherein the object sub areas are spaced apart so as to reduce a probability of a detection of non-specular light from the object; wherein each image sub area comprises multiple pixels; (ii) obtaining image information from the current group of spaced apart sensor elements; and (iii) processing at least a portion of the image information to provide an inspection result.07-07-2011
20100329539SYSTEM AND METHOD FOR INSPECTING A COMPOSITE COMPONENT - The present disclosure includes a system for inspecting a manufactured composite component. In some embodiments, the system includes an inspection assembly having master camera assembly and a slave camera assembly. The master camera assembly and the slave camera assembly each include a machine vision camera and a lighting system. The lighting assembly may include back lights and spot lights. In some embodiments, the master camera and the slave camera are each connected to a telecentric lens. The composite component is inspected by moving it through the inspection assembly, taking images, and processing the images to measure features on the component.12-30-2010
20100329538Cell Feature Extraction and Labeling Thereof - Embodiments of the present invention determine the surface profile of certain classes of work surface. More specifically, embodiments of the invention measure the three-dimensional locus of points that define the “virtual” continuous surface fitted to the ends of the walls of a cellular core.12-30-2010
20110255769MACHINE PERFORMANCE TESTING METHOD AND DEVICE - A transparent panel is used to acquire a test sample from a machine to be tested; where the test sample includes at least one object placed on the transparent panel by the machine to be tested. A scanning device is used to scan the transparent panel to obtain image data and a computing device is used to determine the operation accuracy of the machine to be tested according to the image data from the scanning device. These devices may be used for machine performance testing and acquiring an image of the test sample.10-20-2011
20090202132CABINET DOOR FINISH REPLICATION SYSTEM - Cabinet doors are compared to color samples as a quality control check on the colors of the manufacture doors. The color samples are obtained by selecting doors which have acceptable color, and capturing those images into a computer readable format. These captured images may then be printed, stored, transmitted, etc.08-13-2009
20110096978Off-Axis Sheet-Handling Apparatus and Technique for Transmission-Mode Measurements - An apparatus (04-28-2011
20110052039METHOD AND APPARATUS FOR INSPECTING APPEARANCE OF LONG-LENGTH OBJECTS - An apparatus for inspecting appearance of long-length object takes images of lighted line every predetermined timing while making the hose move in the long-length direction. By this, the contours of the hose are taken continuously and correctly over the length direction of the hose (H). The height direction position data of the lighted line corresponding to each of the width direction position of the hose are extracted, and the height direction position data are subtracted by the base data provided so as to correspond to each of the width direction position. Thus, the arc shape of the outer surface of the hose is canceled from the height direction position data. Also, the height direction position data of each taken image which are given the subtracting is put in image-taking order, and an inspection image is made on the basis of the predetermined color03-03-2011
20110188731METHOD AND APPARATUS FOR DETECTING SURFACE UNEVENNESS OF OBJECT UNDER INSPECTION - Minute surface unevenness formed on the surface of an object under inspection is detected, thereby improving the accuracy of an appearance inspection. A target surface in the sidewall region (08-04-2011
20110188730SYSTEM AND METHOD FOR VERIFYING MANUFACTURING CONSISTENCY OF MANUFACTURED ITEMS - In a method and system for verifying manufacturing consistency of manufactured items, N point clouds of the manufactured items are read. A first point cloud is selected from the N point clouds, and each point of the first point cloud is projected onto a predetermined ideal outline for obtaining a nearest point in the ideal outline of each point of the first point cloud. Intersections of the N point clouds and each line formed by a point in the first point cloud and the nearest point of the point are further determined, and a vertical distance between each of the intersections and the ideal outline is calculated for obtaining a deviation value of each of the intersections. At least one outline is fitted according to the deviation values of each of the intersections and the at least one fitted outline is output to a display device.08-04-2011
20100021041PATTERN DEFECT INSPECTION METHOD AND APPARATUS - The pattern defect inspection apparatus is operable to detect defects by comparing a detection image, which is obtained through scanning by an image sensor those patterns that have the identical shape and are continuously disposed on the object under tested at equal intervals in row and column directions, with a reference image obtained by scanning neighboring identical shape patterns in the row and column directions. This apparatus has a unit for generating an average reference image by statistical computation processing from the images of identical shape patterns lying next to the detection image including at least eight nearest chips on the up-and-down and right-and-left sides and at diagonal positions with the detection image being intermediately situated. The apparatus also includes a unit that detects a defect by comparing the detection image to the average reference image thus generated.01-28-2010
20090080760ANTI-COUNTERFEITING MARK AND METHODS - An anti-counterfeiting mark is formed on a surface of an object, preferably by engraving with a laser at the point of manufacture. The mark includes a padlock symbol visible to a person without magnification for informing the person that anti-counterfeiting techniques are in use. The mark also includes a microscopic pattern. Preferably, the microscopic pattern is varied from object to object for uniqueness. The microscopic pattern must be magnified to properly discern its intricacies. The mark further includes a bar code containing data relating to the microscopic pattern. The microscopic pattern may be compared against the data stored by the bar code to verify authenticity.03-26-2009
20110116704High-Resolution Large-Field Scanning Inspection System For Extruded Ceramic Honeycomb Structures - A high-resolution, large-field scanning inspection system for inspecting extruded ceramic honeycomb structures is disclosed. The system allows for inspecting cells at an endface of a cellular ceramic substrate by capturing, along an optical axis, line images of illuminated cells as a line illumination scans over at least a portion of the plurality of cells. The inspection method includes centering the line illumination on the optical axis to make the line illumination normally incident upon the endface. The inspection method also includes forming from the line images a composite image of the cells, and determining from the composite image at least one parameter of at least one cell.05-19-2011
20110091094METHOD OF TESTING THE INTEGRITY OF SPIRAL WOUND MODULES - Methods for testing the integrity of spiral wound modules including the introduction of pressurized gas within a sealed permeate collection tube and the detection of gas exiting at least one of the scroll faces of the module. The location(s) of gas exiting the scroll face can be correlated to defects in the module. In preferred embodiments, the subject test methods are non-destructive and can be applied to modules in either a dry or wet condition.04-21-2011
20110064297MONITORING APPARATUS, MONITORING METHOD, INSPECTING APPARATUS AND INSPECTING METHOD - An inspecting apparatus according to the present invention has: an imaging section 03-17-2011
20090263005IMPURITY MEASURING METHOD AND DEVICE - An impurity measuring device includes a table (T) on which a sample (S) is to be placed with its fracture surface (h) facing up, an illuminating means (7) for irradiating the fracture surface (h) with light (L) from a plurality of directions, an image sensing means for sensing an image of the fracture surface (h) irradiated with the light (L), continuous tone color image processing means for processing the sensed image into a continuous tone color image, and a binarizing means for binarizing the continuous tone color image through comparison between the result of the continuous tone color image processing and a threshold value. As the fracture surface (h) is irradiated with the light (L) from the plurality of directions, the image obtained by sensing the image of the fracture surface (h) is free from shading or optical irregularities caused by minute irregularities on the fracture surface (h). Therefore, impurities in the sample (S) can be accurately detected from the fracture surface (h) by subjecting the image to the continuous tone color image processing and binarization.10-22-2009
20110317907Optimized Distribution of Machine Vision Processing - A system and method is provided for remotely analyzing machine vision data. An indication of a choice of vision software is sent from a first computer to a remote second computer. The second computer, using the selected vision software, processes image data to provide a result that is transmitted from the second computer to a designated location.12-29-2011
20110317906AUTOMATICALLY DETERMINING MACHINE VISION TOOL PARAMETERS - A method for automatically determining machine vision tool parameters is presented, including: marking to indicate a desired image result for each image of a plurality of images; selecting a combination of machine vision tool parameters, and running the machine vision tool on the plurality of images using the combination of parameters to provide a computed image result for each image of the plurality of images, each computed image result including a plurality of computed measures; comparing each desired image result with a corresponding computed image result to provide a comparison result vector associated with the combination of machine vision tool parameters, then comparing the comparison result vector associated with the combination of machine vision tool parameters to a previously computed comparison result vector associated with a previous combination of machine vision tool parameters using a result comparison heuristic to determine which combination of machine vision tool parameters is best overall.12-29-2011
20090290781ILLUMINATING DEVICE FOR CYLINDRICAL OBJECTS, SURFACE INSPECTION METHOD IMPLEMENTED THEREWITH AND COMPUTER PROGRAM PRODUCT - An illuminating device is provided that includes, but is not limited to a cylindrical lighting unit with a cylindrical slit diaphragm arranged in the interior thereof. The lighting unit includes, but is not limited to a cylindrical light source with a cylindrical diffusor arranged therein, and the slit diaphragm has a cylinder with axially extending slits that are arranged in such a way that incident beams coupled in perpendicular to the slit diaphragm axis (O) converge in a point (M) that is spaced apart from the cylinder axis in the interior of the slit diaphragm through the slits.11-26-2009
20120207380METHOD FOR ANALYZING THE QUALITY OF A GLAZING UNIT - A method for analyzing quality of a glazing unit including: generating a digital image of a test chart produced in reflection by an outer surface of the glazing, the test chart presenting a pattern composed of a plurality of contrasted elements defining between them interface lines; calculating quantities representative of the glazing from the image generated, the calculation being carried out by a processing unit; and comparing the calculated values for the representative values relative to reference values. The representative quantities are representative of a deformation of the image of the test chart produced in reflection by the outer surface of the glazing.08-16-2012
20120207379Image Inspection Apparatus, Image Inspection Method, And Computer Program - The present invention provides an image inspection apparatus and a method which remove noise even when there is a change in brightness of a multi-valued image, and which inspect a defect, and relates to a computer program. A multi-valued image is acquired, and a reference intensity value based on intensity information for the image is calculated. A difference for each pixel between the intensity value and the reference intensity value is calculated, and a threshold value to track and change in response to a change in the reference intensity value is set and stored. Pixels that have a calculated difference that is larger than the threshold value is extracted, and an aggregate body of pixels based on a connectivity of the intensity value of the extracted pixels is specified, and a characteristic amount using the difference is calculated. A defect is discriminated based on the calculated characteristic amount.08-16-2012
20120057773INSPECTION RECIPE GENERATION AND INSPECTION BASED ON AN INSPECTION RECIPE - System, computer readable medium and method. The system includes (i) a data obtaining module arranged to obtain data about at least one portion of an inspected article; and (ii) a processor arranged to perform at least one processing operation of the data out of: (a) processing the data to provide the inspection recipe; and (b) processing the data, while utilizing the inspection recipe, to detect defects; wherein the inspection recipe comprises multiple zones of multiple types of zones; wherein a zone of a first type of zones differs from a zone of a second type of zone.03-08-2012
20100008560Substrate-check Equipment - A substrate-check equipment has a conveyer, at least two lamps, at least two image acquisition units and a control unit. The conveyer conveys a substrate. The lamps are mounted respectively above and below the conveyer to respectively shine light onto the substrate. Each lamp has an adjusting unit for adjusting intensity of the lamp. The image acquisition units correspond to the lamps and are mounted respectively above and below the conveyer to respectively capture images of the substrate and generate image signals. The control unit is electronically connected to the lamp and the image acquisition units. Emitted light intensity of the lamps is adjusted to ensure consistent image quality and speed up procedures for checking the substrate.01-14-2010
20100232677GLAZING INSPECTION METHOD - Methods of determining the divergence angle between a primary image and a secondary image generated by a glazing are disclosed. In a first method, a glazing is illuminated with a light source and a primary and a secondary image of the light source, generated by the glazing, are captured using an image capture device. The distance between the primary and the secondary image is determined, and the divergence angle determined from this distance. In a second method, the primary and secondary images are viewed on a target marked with a scale indicating the divergence angle. The divergence angle is read from the scale and the positions the primary and secondary image. In this second method, the light source is located at the center of the target. In both methods, the light source comprises at least one light emitting diode. Preferably, the method is used to examine the edge region of a glazing.09-16-2010
20100092069IMAGE PROCESSING METHOD, PAINT INSPECTION METHOD AND PAINT INSPECTION SYSTEM - An image processing method that differentiates image data using an image processing system that includes a processing unit and a storage unit includes: acquiring image data; sequentially picking up pixels one by one at a predetermined pitch from among the pixels that constitute the image data and setting the picked up pixels as reference pixels; setting a close region around each of the reference pixels; calculating an average value of densities of the picked up pixels for each of the close regions; setting a wide region larger than the close region around each of the reference pixels; calculating an average value of densities of the picked up pixels for each of the wide regions; and calculating a difference between the density of each of the reference pixels and a corresponding one of the average values of the densities of the pixels of the wide regions.04-15-2010
20100092067Gem pattern matching algorithm to determine the percentage match of a target gem pattern to a database of gem patterns - A method and gem pattern matching technique to analyze a target gemstone by analyzing a pattern created by transmitting a light source such as a laser beam through the gemstone to create a visual optical pattern and comparing the pattern to a database of known gemstone patterns to determine the percentage likelihood that the target gemstone will match a gemstone in the database. The matching is based on the weight of the heaviest spot in the pattern and its location in the gemstone image and comparing it to the weight and location of the heaviest spots in each gemstone image in the database to determine a percentage matching.04-15-2010
20100246931INSPECTION METHOD - In order to set an inspection area, a measurement target is disposed onto a stage, a reference data of the measurement target is summoned, and a measurement data of the measurement target is acquired. Then, at least one feature object is selected in the measurement data and the reference data of the measurement target, and at least one feature variable for the selected feature object is extracted from each of the reference data and the measurement data. Thereafter, a change amount of the measurement target is produced by using the feature variable and a quantified conversion formula, and the produced change amount is compensated for to set an inspection area. Thus, the distortion of the measurement target is compensated for to correctly set an inspection area.09-30-2010
20100246930INSPECTION APPARATUS AND METHOD USING PENETRATING RADIATION - Products in multiple lanes are passed side-by-side through X-ray inspection apparatus and an image is acquired. Different parts of the image corresponding to the different product lanes are subjected to different numerical processing, so that product anomalies are in each case readily visible or reliably detected using automatic threshold discrimination. The same X-ray power may therefore be used to inspect products having widely different X-ray attenuation characteristics.09-30-2010
20100246929METHOD AND SYSTEM FOR DETERMINING A DEFECT DURING CHARGED PARTICLE BEAM INSPECTION OF A SAMPLE - A method for determining a defect during charged particle beam inspection of a sample locates at least one examination region within a charged particle microscopic image of the sample by making reference to a database graphic of the sample corresponding to the charged particle microscopic image. Each located examination region concerns at least one element of the sample, and each element has at least one characteristic in common. At least one point response value is then generated for each point in the located examination regions. The presence of a defect at the location of the concerned point is then determined by applying at least one decision tree operator to the generated point response values of the concerned point. Applications of the proposed method as a computing agent and a charged particle beam inspection system are also disclosed.09-30-2010
20120213425COMBINING FEATURE BOUNDARIES - A method of forming a combined feature boundary based on boundaries of first and second overlapping features includes dividing the boundaries of the first and second overlapping features into line segments of known shape, identifying crossing points formed by the line segments, calculating parametric coordinates of the crossing points, and determining a sequence of crossing point evaluation based on the parametric coordinates. The method also includes calculating first and second cross products based on the line segments forming first and second crossing points in the determined sequence, and choosing first and second paths of the combined feature boundary according to mathematical signs of the cross products, wherein the combined feature boundary includes the first and second crossing points and portions of at least one of the first and second feature boundaries defining the first and second paths.08-23-2012
20120163698Method for Inspection and Detection of Defects on Surfaces of Disc-Shaped Objects and Computer System with a Software Product for Carrying out the Method06-28-2012
20110182495SYSTEM AND METHOD FOR AUTOMATIC DEFECT RECOGNITION OF AN INSPECTION IMAGE - A method for an anomaly detection method is provided. The method includes acquiring at least one two-dimensional or three-dimensional or n-dimensional inspection test image data of a scanned object. The method further includes partitioning the inspection test image data of the scanned object into multiple sub-regions. The method also includes computing one or more texture metrics for each sub-region. Finally, the method includes discriminating between an anomalous and a non-anomalous region in the scanned object according to one or more values of the computed texture metrics and identifying one or more anomalies in the inspection test image data.07-28-2011
20090148032Alignment Using Moire Patterns - Methods of determining relative spatial parameters between two substrates in a process of alignment are described. Generally, multiple alignment data may be collected from phase information using a pair of alignment marks.06-11-2009
20120076392Fault Detection of a Printed Dot-Pattern Bitmap - Embodiments of the present invention enable fault detection in a printed dot-pattern image. Certain applications of the present invention are its use in various embodiments of a system for inspection of a printed circuit board (“PCB”) substrate. In embodiments, a generated distortion map is based on a comparison of a reconstructed dot-pattern image, a simulated reference bitmap, and an error map representing differences between the reconstructed dot-pattern image and the reference bitmap. In embodiments, the pixels of the distortion map are color coded to identify the locations and types of aberrations that were discovered as a result of the comparison.03-29-2012
20100272346SYSTEM AND METHOD FOR MEASURING FORM AND POSITION TOLERANCES OF AN OBJECT - A method for measuring form and position tolerances of an object receives a preselected feature element to be fitted from an image of a measured object, obtains a reference feature element from an image of a reference object corresponding to the measured object. The method further fits a feature element corresponding to the preselected feature element so as to obtain a fitted feature element, and calculates form and position tolerances between the fitted feature element and the reference feature element thereby generating the form and position tolerances of the measured object.10-28-2010
20090060316Method for Monitoring a Rapidly-Moving Paper Web and Corresponding System - The invention relates to a method for monitoring a rapidly-moving paper web. In the method, images of the rapidly-moving web are taken with cameras at several consecutive positions, of the same cross-direction point of the web. The images are analysed in real time in order to detect deviations, and the position data of the deviations are determined. Each deviation found in the analysis is connected to an event chain in real time using a selected criterion on the basis of the position data of each deviation. Images containing a deviation are shown to the operator immediately as event chains.03-05-2009
20090060315METHOD AND APPARATUS FOR INSPECTING OBJECTS USING MULTIPLE IMAGES HAVING VARYING OPTICAL PROPERTIES - An automated object inspection system is presented. The inspection system includes an imaging system to produce at least two images of said object having different optical properties and an analyzer coupled to the imaging system to receive the images and to perform a variety of inspection operations on said images. The imaging system may produce images of the object under inspection in the visible range having varying exposure values. A vision engine included in the analyzer may combine said images through an algorithmic process into one image having high light dynamic range. Alternatively, the imaging system may produce images of the object in the visible or non-visible electromagnetic range. The analyzer may perform inspection routines on said images. An imaging system capable of producing digital video is presented, wherein each frame of video produced by said camera is composed of multiple images having different optical properties.03-05-2009
20110038526Method and Device for Testing Cigarette Packages Wound with Film - A method for testing moving products having at least two layers, such as cigarette packages wrapped with film, wherein at least one layer of the product, namely an inner layer which is arranged further inwards, is covered at least regionally by at least one, at least partially transparent product layer, namely an outer layer which is arranged further outwards, wherein the outer layer of the product is illuminated under an angle of incidence of about 35°, with light, in which the light that is reflected at this layer comprises at least 70%, at least 90%, or at least 95%, of linearly s-polarized light, the s-polarized component of the light reflected by the outer layer and/or of the light reflected by the inner layer and/or the p-polarized component of the light reflected by the outer layer and/or of the light reflected by the inner layer are recorded in each case using at least one suitable electrooptic recording element in the form of an image or partial image of the product and wherein the recorded s-polarized and/or the recorded p-polarized light component are evaluated in order to be able to draw conclusions relating to features of the outer layer and/or of the inner layer.02-17-2011
20110038525METHOD FOR QUANTIFYING THE MANUFACTURING COMPLEXITY OF ELECTRICAL DESIGNS - A method and system for quantifying manufacturing complexity of electrical designs randomly places simulated defects on image data representing electrical wiring design. The number of distinct features in the image data without the simulated defects and the number of distinct features in the image data with the simulated defects are determined and the differences between the two obtained. The difference number is used as an indication of shorting potential or probability that shorts in the wiring may occur in the electrical wiring design. The simulating of the defects in the image data may be repeated and the difference value from each simulation or run may be used to obtain a statistical average or representative shorting potential or probability for the design.02-17-2011
20120093391METHOD AND SYSTEM FOR REMOTE REWORK IMAGING FOR PART INCONSISTENCIES - A system and method for remote rework imaging a part for an inconsistency is provided. The part is scanned with a nondestructive inspection device. An image of a part inconsistency is communicated from the nondestructive inspection device to a programmable device. The image of the part inconsistency is viewed with the programmable device. The image of the part inconsistency is edited with the programmable device using an input device in communication with the programmable device. The edited image is communicated from the programmable device to a visible light projector. The edited image is projected onto the part inconsistency using the visible light projector.04-19-2012
20100086191EVALUATION OF OPTICAL DISTORTION IN A TRANSPARENCY - A system for evaluating optical distortion in an aircraft transparency, such as a windshield, is disclosed. The system utilizes high resolution digital images (a reference image and a test image) of a test grid structure having a pattern of visible index locations. In one embodiment, the test image is taken through the transparency under test, and the reference image is taken without the transparency. The two images are processed and analyzed by a computing device to determine displacement of each index location, relative to the reference image. The displacement data is further processed to obtain vector divergence field data that represents a quantitative measurement of the optical distortion. The optical distortion measurement data is then rendered in a suitable format that allows the transparency to be rated against certain quality criteria.04-08-2010
20100232678SYSTEM AND METHOD FOR MONITORING OF WELDING STATE - A system and method for monitoring the molten state for enabling a molten state, butting state, or other state of electric-resistance-welded pipe on-line more accurately than in the past are provided. That is, a mirror 09-16-2010
20120087567HARDNESS TESTER - A hardness tester includes a monitor capable of displaying a main screen and assistant screen. A first test location setter sets a coordinate point of an indentation formation location, and stores a setting condition of the set coordinate point and the surface image of a first test specimen. A second test location setter displays the surface image of the first test specimen in the assistant screen when a surface image of a second test specimen is displayed on the main screen, and, when a reference coordinate is set on the surface image of the second test specimen, determines a coordinate point of an indentation formation location based on the set reference coordinate and the setting condition of the coordinate point stored by the first test location setter.04-12-2012
20120087566APPARATUS AND METHOD FOR INSPECTING SURFACE STATE - A surface state inspection apparatus has a lighting device that irradiates an inspection target placed on a stage with light, an imaging device that images the inspection target, and a detection device that detects a surface defect of the inspection target by analyzing a first inspection image obtained by the imaging device. The lighting device is a surface light source that includes a light emission region having a predetermined size and, in the lighting device, portions of light emitted from positions in the light emission region differ from each other in a spectral distribution. The detection device detects a portion in which a hue is different from that of its surrounding portion in the inspection target surface as a flaw. The detection device detects a portion in which the hue is substantially equal to that of its surrounding portion while brightness is different from that of its surrounding portion as a stain.04-12-2012
20130016894METHOD AND SYSTEM FOR CALCULATING WEIGHT OF VARIABLE SHAPE PRODUCT MANUFACTURED FROM PRODUCT BLANK - A computerized system, method, and computer-readable media implementing a method for determining a weight of a product, and optionally its shipping weight and postage are described. A product having a variable shape in two dimensions wherein the shape is defined in the two dimensions by a set of cutlines is manufactured from a product blank of known weight. The weight of the product is determined from the number of pixels in a scaled image of the cutlines, the image having the same aspect ratio as the product blank. The weight of the product blank and the ratio of the pixels to corresponding to product surface area relative to the total number of pixels in the image are used to calculated the actual weight of the product.01-17-2013
20120243771THREE-DIMENSIONAL ULTRASONIC INSPECTION APPARATUS - A three-dimensional ultrasonic inspection apparatus 09-27-2012
20080247631Painting process color compensator - A method and implementing computer system are provided for enabling a user to paint a surface a desired final color while using a paint, the color of which appears in raw form different from the desired final color for the painted surface. In an exemplary embodiment, a tile painting application is illustrated and includes a camera arranged to take an image of a bisque tile. When a user applies a glaze to the tile, the camera-computer system analyzes the glaze color among other factors affecting the painting process and an image showing a final color of the tile after firing is presented on the display of the computer system such that by looking at the computer screen, the user is able to see the actual final color of the tile after firing while applying the initial glaze to the bisque tile before firing.10-09-2008
20080240542DROPLET DETECTION SYSTEM - A system for a droplet detection device to monitor the dispensing operation in an ultra high throughput (uHTS) system. The system includes a microtitre plate with a defined number of wells and well walls, a dispenser for dispensing fluids into the wells, an illuminating sensor to extract image features from the wells and well walls, and a controller for analyzing the extracted image features to determine the presence or absence of the dispensing fluid on the wells and well walls.10-02-2008
20080232670METHOD FOR CALCULATING A BAD-LOT CONTINUITY AND A METHOD FOR FINDING A DEFECTIVE MACHINE USING THE SAME - A method for finding a defective machine comprises the steps of selecting a searching period in which a plurality of wafer lots including good wafer lots and bad wafer lots passes through machines, acquiring a lot-passing information related to the passing sequence of the wafer lots through the machines, calculating a bad-lot continuity by taking the lot-passing information into account, and determining a defective machine by taking the bad-lot continuity into account. The bad-lot continuity is calculated by the steps of determining an impact period based on the aggregation degree of the bad wafer lots, calculating a bad-lot distribution probability in the impact period, and calculating the bad-lot continuity by taking the bad-lot distribution probability into account.09-25-2008
20080226156Defect detection apparatus and defect detection method - A primary defect detecting section performs a primary defect detection process for detecting a severe defect of more than a predetermined size on an inspection object. A secondary defect detecting section performs a secondary defect detection process for detecting a defect on the inspection object using image data of the inspection object. A process controller omits the secondary defect detection process upon detection of the severe defect in the primary defect detection process before starting the secondary defect detection process, or stops the secondary defect detection process upon detection of the severe defect in the primary defect detection process after starting the secondary defect detection process.09-18-2008
20080226155SHEET METAL PROCESSING EXAMINATION - For examining a metal sheet processing operation, a method includes scanning a detection beam along a processed metal sheet by causing a relative movement between the detection beam and the processed metal sheet, during the scanning, determining a position of an edge of the metal sheet hole by monitoring the detection beam, determining, from the determined hole edge position, a geometric configuration of the metal sheet hole, performing a comparison of the determined geometric configuration of the metal sheet hole with a corresponding desired hole configuration; and then sending a signal indicating information about the metal sheet processing operation, based upon the comparison.09-18-2008
20080226154SYSTEMS AND METHODS FOR PRODUCING CARBONACEOUS PASTES USED IN THE PRODUCTION OF CARBON ELECTRODES - Systems and methods for producing a carbonaceous paste are provided. The systems and methods may include a paste control system that obtains an image of the carbonaceous paste and determines whether operational parameters associated with paste production require adjustment. One or more operational variables may be adjusted based on the obtained images to facilitate production of the carbonaceous paste.09-18-2008
20080226153ANALYZING APPARATUS, PROGRAM, DEFECT INSPECTION APPARATUS, DEFECT REVIEW APPARATUS, ANALYSIS SYSTEM, AND ANALYSIS METHOD - In order to allow to easily specify inspection recipe with which defects desired to be detected can be detected efficiently, a defect inspection apparatus performs defect inspection of a substrate in accordance with a plurality of inspection recipes and produces defect information associated with position of defect in the substrate and attribute data of the defect for each of the inspection recipes and a defect review apparatus produces review result information specifying a kind of defect selected from defects contained in the defect information. An analyzing apparatus obtains defect information and review result information and totalizes the number of defects having attribute data similar to attribute data possessed in defects corresponding to kind of defects to be analyzed for each inspection recipe.09-18-2008
20080226152Determining Image Blur in an Imaging System - The invention relates to a method of determining a parameter relating to image blur in an imaging system (IS) comprising the step of illuminating an object having a test pattern (MTP) by means of the imaging system (IS), thereby forming an image of the test pattern. The test pattern (MTP) has a size smaller than the resolution of the imaging system (IS), which makes the image of the test pattern independent of illuminator aberrations. The test pattern (MTP) is an isolated pattern, which causes the image to be free of optical proximity effects. The image is blurred due to stochastic fluctuations in the imaging system and/or in the detector detecting the blurred image. The parameter relating to the image blur is determined from a parameter relating to the shape of the blurred image. According to the invention, resist diffusion and/or focus noise may be characterized. In the method of designing a mask, the parameter relating to the image blur due to diffusion in the resist is taken into account. The computer program according to the invention is able to execute the step of determining the parameter relating to the image blur from a parameter relating to a shape of the blurred image.09-18-2008
20130177232Visual Inspection Device, Visual Inspection Method, And Computer Program - Inputs of a plurality of images constituting a group of images of items regarded as non-defective items are accepted and stored, and a defect threshold for detecting a defective portion of an inspection object and a determination threshold for making a non-defective/defective determination are set based on the plurality of stored images. A defective item image which is an image of an item determined as a defective item is previously stored and when an input of an image newly acquired by capturing an inspection object is accepted, non-defective item learning processing is performed by use of a plurality of stored images including the image whose input has been accepted, to at least reset the defect threshold. A defective portion is re-detected based on the reset defect threshold, to determine whether or not the stored defective item image is an image of a defective item based on the set determination threshold.07-11-2013
20130170731Image Processing Device And Image Processing Method - A reference image to serve as a reference for a non-defective determination is previously stored in association with identification information for identifying an inspection object. An image of the inspection object is displayed side by side with the reference image of corresponding identification information. A drawn position of the reference image and a drawn position of the acquired image are aligned, adjustment is made so as to make brightness of the reference image coincide with brightness of the acquired image, and adjustment is made so as to make a focus on the reference image coincide with a focus on the acquired image. Adjustment is made so as to make a focus of the reference image coincide with a focus of the acquired image.07-04-2013
20130170732MEDICINE PACK INSPECTING SYSTEM - A medicine pack inspecting system includes a packing instruction unit that generates packing instruction information, a tablet packing unit that encloses tablets in a medicine pack, an image capturing unit that generates a medicine pack image, and a tablet inspecting unit that inspects the number of tablets enclosed in the medicine pack by performing pattern matching using the medicine pack image and a tablet pattern shown in the packing instruction information, wherein when the packing instruction information includes information on an irregular shaped tablet, the tablet inspecting unit inspects the number of an irregular shaped tablet by performing pattern matching using an irregular shaped tablet pattern of the irregular shaped tablet and the medicine pack image.07-04-2013
20080219544FACTOR ESTIMATING SUPPORT DEVICE AND METHOD OF CONTROLLING THE SAME, AND FACTOR ESTIMATING SUPPORT PROGRAM - A factor estimating support device supports estimation of factor from a result generated in a production system. In the factor estimating support device, material/environment history data and test history data acquired from the production system, and the causality structure data indicating causality between the plurality of variables are stored in the storage unit, where when determined that the final quality characteristic is abnormal in the final quality abnormal detecting part, determination is made on whether each variable other than the final quality characteristic is abnormal in the variable abnormality detecting part, and the determination result is reflected on a visible image in which the causality structure data is visualized in the visible image creating part.09-11-2008
20130101202IDENTIFYING, EVALUATING AND SELECTING POSSIBLE PALLET BOARD LINES IN AN IMAGE SCENE - A method is provided for determining which of a plurality of possible lines is most likely to be an actual line passing through a possible corner of a pallet. The method may comprise: providing a Ro image comprising pixels valued to generally correspond to an orthogonal distance from an origin point in the Ro image to one or more possible lines in a corresponding grey scale image; providing, using a computer, a location in the Ro image corresponding to a possible pallet corner; defining, using the computer, a plurality of possible lines passing through the possible pallet corner, each of the possible lines being respectively oriented at one angle within a range of angles to an axis of the Ro image; and determining, using the computer, which of the plurality of possible lines is most likely to be the actual line passing through the possible pallet corner.04-25-2013
20130101201IDENTIFYING AND LOCATING POSSIBLE LINES CORRESPONDING TO PALLET STRUCTURE IN AN IMAGE - A computer-implemented method is provided for finding a Ro image providing data corresponding to possible orthogonal distances to possible lines on a pallet in an image. The method comprises: acquiring a grey scale image including one or more pallets; determining, using a computer, a horizontal gradient image by convolving the grey scale image and a first convolution kernel; determining, using the computer, a vertical gradient image by convolving the grey scale image and a second convolution kernel; and determining, using the computer, respective pixel values of a first Ro image providing data corresponding to a possible orthogonal distance from an origin point of the grey scale image to one or more possible lines on one or more possible pallets in the grey scale image.04-25-2013
20130129182Method of Monitoring the Appearance of the Surface of a Tire - Method for detecting an anomaly on the surface of a tire comprising the following steps in the course of which: A—the image of a given anomaly present on the surface of at least one tire is produced, B—with the aid of a collection of filters, a multivariate image of the said surface is constructed in a space of the filters, in which each pixel is represented in the form of a pixel vector, the components of each pixel vector having a value corresponding to the value of this pixel in the image transformed with the aid of each of the filters of the said collection, C—with the aid of a linear function, this multivariate image is transformed from the space of the filters into a spectral space of given dimension whose variables are the filters or combinations of filters of the said collection, so as to form a spectral image, D—a classifier is constructed by determining, for this anomaly, those zones representative of the spectral space which contain, in a statistically representative manner, the points of the spectral image of the said anomaly transformed into the said spectral space.05-23-2013
20110235894METHOD FOR DETECTING OPTICAL DEFECTS IN TRANSPARENCIES - A method of detecting optical defects in a transparency may comprise the steps of providing a digital image of the transparency having a plurality of image pixels and detecting at least one candidate defect. The candidate defect may be detected by determining a grayscale intensity of each one of the image pixels and calculating an intensity gradient across adjacent pairs of the image pixels. Each image pixel may be assigned a gradient value comprising a maximum of the absolute value of the intensity gradients associated with the image pixel. A gradient image may be constructed comprising the gradient values assigned to corresponding ones of the image pixels. Image pixels may be identified as candidate pixels if such image pixels have a gradient value exceeding a gradient threshold. The candidate pixels may comprise the optical defect.09-29-2011
20110249884CHECKING APPARATUS AND METHOD FOR CHECKING HOLES POSITION AND SIZE IN A PLATE - A checking apparatus for checking holes position and size in a plate. The checking apparatus includes a memory, an image obtaining unit and a processor. The memory stores a file. The file records an expected number, size and placement of pixels representing the holes and a pixel value. The image obtaining unit obtains an image of the plate. The processor determines a target region in the image according to the values recorded in the file, scans the target region to obtain the number and placement of pixels representing the hole in the target region with a value equal to a pixel value. In addition, the processor compares the obtained number and placement of pixels representing the hole with the expected number and placement of pixels, and generates a signal to indicate the holes defined in the target region are defective if the obtained number and placement of pixels do not match the expected number and placement of pixels. A method for checking holes position and size in a plate is also disclosed.10-13-2011
20130148875METHODS AND SYSTEMS FOR PROCESSING IMAGES FOR INSPECTION OF AN OBJECT - Methods and systems for processing images are provided. One method includes obtaining a plurality of images corresponding to at least one area of an object and performing a rectification of at least some of the plurality of images using a reference structure. The method also includes performing a gradient vector field analysis on the rectified plurality of images of the object to identify anomaly regions within the object.06-13-2013
20100290694Method and Apparatus for Detecting Defects in Optical Components - A method is disclosed for detecting defects in an optical component to be tested, such as a lens comprising the steps of: providing a structured pattern, recording the reflected or transmitted image of the pattern on the optical component to be tested, phase shifting the pattern and recording again similarly the reflected or transmitted image, calculating the local phase and amplitude images of the optical component to be tested, calculating a model image of a defect free optical component and determining corresponding phase and amplitude images of the defect free model optical component, comparing phase and amplitude images of both optical component to be tested and defect free model optical component, determining suspect zones in the optical component to be tested, and applying a metrics to separate dust and noise from other defects.11-18-2010
20130156292COMPUTING DEVICE AND METHOD FOR EXTRACTING DATA OF PRODUCT FOR USE IN CONSTRUCTION OF POINT CLOUD - In a method for extracting data of a product, an electronic design document related to the product and point cloud created using actual measurements of the product are received. The point cloud includes points of the product. The method aligns the curved surface of the product with the corresponding portion of the point cloud using a best-fit method, creates a maximum space box for a feature element of the product, and deletes points that are not within the maximum space box. According to an average distance between two neighboring points of the point cloud, the maximum space box can be divided into many small space boxes. Using the small space boxes, the points are filtered to form a feature element.06-20-2013
20130188858ULTRASONIC MODELING FOR INSPECTION OF COMPOSITE IRREGULARITIES - A first simulated inspection is conducted to provide a first waveform data set associated with the at least one irregularity parameter. The first simulated inspection is conducted using a first evaluation setting. A first image is produced based on the first waveform set, and it is determined whether a quality of the first image satisfies a predetermined threshold.07-25-2013
20130114878System and Method for Automated Defect Detection Utilizing Prior Data - A system and method for performing automated defect detection by utilizing data from prior inspections is disclosed. The system and method may include providing a image capture device for capturing and transmitting at least one current image of an object and providing a database for storing at least one prior image from prior inspections. The system and method may further include registering the at least one current image with the at least one prior image, comparing the registered at least one current image with the at least one prior image to determine a transformation therebetween and updating the database with the at least one current image.05-09-2013
20120020545COMPONENT PRESENCE/ABSENCE JUDGING APPARATUS AND METHOD - A component presence/absence judging apparatus judges the presence/absence of components through a registration step and an inspection step. The registration step includes an ante-mounting feature acquisition step, a post-mounting feature acquisition step and a classifier configuration step. At the ante-mounting and post-mounting feature acquisition steps, ante-mounting features and post-mounting features are respectively acquired from an ante-mounting image and a post-mounting image taken at each of predetermined places on an ante-mounting board and a post-mounting board. At the classifier configuration step, a classifier is configured by registering the ante-mounting features and the post-mounting features as training data to a support vector machine. Then, at the inspection step, the presence/absence of a component at each of the predetermined places on each post-mounting operation board to be inspected is judged by inputting post-mounting operation features acquired from each of the predetermined places on each post-mounting operation board to the support vector machine configured as the classifier.01-26-2012
20130195345INSPECTING APPARATUS, ROBOT APPARATUS, INSPECTING METHOD, AND INSPECTING PROGRAM - An inspecting apparatus includes an image pickup unit configured to pick up a plurality of images of an inspection target object with different exposure times and generate, image data of an inspection target object image including an inspection region, a weighted-image-data generating unit configured to weight, for each of the image data generated with the exposure times different from one another, data of pixels indicating a region where a difference in gradation of pixel values is relatively large among regions of pixels included in the image data and generate weighted image data, an image-data combining unit configured to generate combined image data obtained by combining the generated respective weighted image data, and a determining unit configured to determine a state of the inspection region on the basis of image data of a reference image set and the generated combined image data.08-01-2013
20130101203IDENTIFYING AND EVALUATING MULTIPLE RECTANGLES THAT MAY CORRESPOND TO A PALLET IN AN IMAGE SCENE - A method is provided for evaluating a possible pallet structure. The method comprises: providing a gray scale image comprising one or more possible lines; providing respective pixel locations in the gray scale image for an estimated upper left corner and an estimated upper right corner; calculating, using a computer, a value h based on the estimated upper left corner location and the estimated upper right corner location; estimating, using the computer, a first hole with a first rectangle having a height h; estimating, using the computer, a second hole with a second rectangle having the height h; and estimating, using the computer, the possible center stringer with a third rectangle having the height h.04-25-2013

Patent applications in class Manufacturing or product inspection

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