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Scatter analysis

Subclass of:

378 - X-ray or gamma ray systems or devices

378001000 - SPECIFIC APPLICATION

378070000 - Diffraction, reflection, or scattering analysis

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Deeper subclasses:

Class / Patent application numberDescriptionNumber of patent applications / Date published
378087000 Imaging 56
378088000 Composition analysis 18
378089000 Thickness or density analysis 8
Entries
DocumentTitleDate
20110116600Scanning Systems - The invention provides methods, systems and detector arrangements for scanning an object moving in a first direction that includes the steps of irradiating the object with radiation having a peak energy of at least 900 keV, providing a first detector region having a thickness of at least 2 mm and a second detector region having a thickness of at least 5 mm where the second detector region is arranged to receive radiation that has passed through the first detector region, and detecting the radiation after it has interacted with or passed through the object in order to provide information relating to the object.05-19-2011
20110286577Method for Obtaining a Structure Factor of an Amorphous Material, in Particular Amorphous Glass - An incident X-ray is emitted in a wide angular sector toward an amorphous material specimen which backscatters the X-rays. The method comprises: 11-24-2011
20090147919RADIOGRAPHING APPARATUS AND IMAGE PROCESSING PROGRAM - A radiographing apparatus according to an aspect of the present invention is characterized in that an image processing device comprises an acquisition device which acquires projection data of a first energy spectrum and projection data of a second energy spectrum, and a synthetic image generating device which synthesizes a first image on the basis of the projection data of the first energy spectrum, and a second image on the basis of the projection data of the second energy spectrum according to a predetermined synthetic condition, and generating a synthetic image, and a display device displays the generated synthetic image.06-11-2009
20100135461BIOMETRIC DIAGNOSIS - The invention provides a method of detecting neoplastic or neurological disorders comprising exposing skin or nails to X-ray diffraction and detecting changes in the ultrastructure of the skin or nails, and also provides an instrument when used in the method of detection.06-03-2010
20100150310X-RAY REFLECTOMETRY SYSTEM WITH MULTIPLE SAMPLE HOLDER AND INDIVIDUAL SAMPLE LIFTING MECHANISM - An X-ray reflectometry apparatus comprises an X-ray source (06-17-2010
20100254514DETECTION OF X-RAY SCATTERING - A radiation detecting apparatus includes a collimator and a detector, the collimator having a material for blocking radiation and a region that is a sector of an annulus or multiple regions in a configuration in the shape of a sector of an annulus for allowing transmission of the radiation. The detector is spaced a distance from the collimator such that when a radiation source and sample crystal material are positioned at suitable positions, the radiation is collimated by the collimator and contacts the sample a predetermined distance from the detector at multiple of locations corresponding to the region or regions of the collimator. The Bragg diffracted radiation from the crystal material at two or more and preferably all of the locations overlap at the detector.10-07-2010
20090074141Automated selection of x-ray reflectometry measurement locations - A computer-implemented method for inspection of a sample includes defining a plurality of locations on a surface of the sample, irradiating the surface at each of the locations with a beam of X-rays, and measuring an angular distribution of the X-rays that are emitted from the surface responsively to the beam, so as to produce a respective plurality of X-ray spectra. The X-ray spectra are analyzed to produce respective figures-of-merit indicative of a measurement quality of the X-ray spectra at the respective locations. One or more locations are selected out of the plurality of locations responsively to the figures-of-merit, and a property of the sample is estimated using the X-ray spectra measured at the selected locations.03-19-2009
20090034682ADAPTING A HIGH-PERFORMANCE PULSE PROCESSOR TO AN EXISTING SPECTROMETRY SYSTEM - A method of utilizing the output of a first pulse processor, such as processor designed for use with an SDD, to generate the input signal expected by the second pulse processor, such as an existing processor not designed for use with an SDD. In one embodiment, piled-up pulses which would not be detected as such by the second pulse processor are omitted from the generated input signal. The method generates an output (which then serves as the input signal for the second pulse processor) of the same general form as the ramp signal from a detector with a pulsed-reset preamplifier, but which does not have the same noise characteristics. In addition, the method may alter the timing between the reconstructed steps in the ramp to increase the maximum throughput of the second pulse processor beyond what is normally possible with a direct connection to the associated detector.02-05-2009
20110116599Scanning Systems - The invention provides a method and system for scanning an object comprising providing a first detector region having a thickness of at least 2 mm and a second detector region having a thickness of at least 5 mm wherein the second detector region is arranged to receive radiation that has passed through the first detector region. The method comprises irradiating the object with radiation having a peak energy of at least 1 MeV, and detecting the first profile radiation after it has interacted with or passed through the object in order to provide information relating to the object. Detecting the first profile radiation comprises detecting the first profile radiation at the first detector region, receiving the first profile radiation that has passed through the first detector region at the second detector region, and detecting the first profile radiation at the second detector region. The scanning method further comprises irradiating the object with radiation having a second energy profile, relatively lower than the first energy profile, and having a peak energy of at least 0.5 MeV, detecting the second profile radiation after it has interacted with or passed through the object in order to provide information relating to the object. Detecting the second profile radiation comprises detecting the second profile radiation at the first detector region, receiving the second profile radiation that has passed through the first detector region at the second detector region, and detecting the second profile radiation at the second detector region.05-19-2011
20090213993METHODS AND APPARATUS FOR THE IDENTIFICATION OF MOLECULAR AND CRYSTALLINE MATERIALS BY THE DOPPLER BROADENING OF NUCLEAR STATES BOUND IN MOLECULES, CRYSTALS AND MIXTURES USING NUCLEAR RESONANCE FLUORESCENCE - The broadening of the lines in NRF from an isotope that is part of a material may be due to several causes: the temperature of the material, the molecular structure of the material and the crystalline structure of the material. By measuring the broadening caused by the molecular structure and the crystalline structure the material itself can be identified. The exact energy of the lines in NRF may also depend on the nature of the crystalline and molecular structure of the material. By measuring the changes in the energy of the NRF lines caused by the structure of the material the material itself may be identified. These techniques provide a “fingerprint” of the molecule or crystal that is involved. The fingerprint information may be used to determine a potential threat.08-27-2009
20090213992VERTICAL/HORIZONTAL SMALL ANGLE X-RAY SCATTERING APPARATUS AND METHOD FOR MEASURING SMALL ANGLE X-RAY SCATTERING - A vertical/horizontal small angle X-ray scattering apparatus, for enabling plural numbers of X-ray diffraction measurements, such as, transmission small angle X-ray diffraction, reflection small angle X-ray diffraction, and in-plane X-ray diffraction, etc., comprises an X-ray generating apparatus 08-27-2009
20110249798Scatter Attenuation Tomography using a Monochromatic Radiation Source - A system and methods for characterizing an inspected object on the basis of attenuation between identified regions of scattering and a plurality of detectors. An incident beam of substantially monochromatic penetrating radiation is generated by a source, which may be a radioactive source. The incident beam is characterized by a propagation axis and a source energy. Radiation scattered by the object is detected by means of a plurality of detector elements disposed about the beam of penetrating radiation, each detector element generating a detector signal characterizing a detected energy of scattered radiation. The detector signal provides for determining a displacement for each scattering point of the object relative to a fiducial position on the propagation axis of the incident beam, based upon the detected energy of the scattered radiation. By calculating the attenuation of penetrating radiation between pairs of scattering voxels, a tomographic image is obtained characterizing the three-dimensional distribution of attenuation in the object of one or more energies of penetrating radiation, and thus of material characteristics.10-13-2011
20110150181APPARATUS AND METHODS FOR DETECTOR SCATTER RECOVERY FOR NUCLEAR MEDICINE IMAGING SYSTEMS - Apparatus and methods for detector scatter recovery for positron emission tomography systems are provided. One method includes identifying detected gamma events in different detector units of a nuclear medicine (NM) imaging detector and determining whether the detected gamma events occurred within a predetermined time period and have a summed energy of at least a predetermined level to define gamma events for reconstitution. The method further includes reconstituting the defined gamma events into single valid gamma events.06-23-2011
20100284516TWO DIMENSIONAL SMALL ANGLE X-RAY SCATTERING CAMERA - A two-dimensional x-ray scattering camera includes a source, an optic, a detector, and a pair of collimating blocks. The source emits x-ray beams that are reflected by the optic towards a sample. The detector detects scattering from the sample, the pair of collimating blocks is positioned between the optic and the detector to collimate the beam. A bottom surface of one block is substantially parallel a top surface of the other block, and the blocks are rotatable relative to the beam about a pivot. The system forms a two-dimensional beam that is symmetric about the primary beam axis at the detector position, regardless how the beam is collimated by the collimating blocks. The system therefore eliminates smearing and can be used for anisotropic small angle scattering at high resolution and low Q11-11-2010
20110135060High Energy X-Ray Inspection System Using a Fan-Shaped Beam and Collimated Backscatter Detectors - This invention provides a scanning system for scanning an object in a scanning zone. The scanning system includes both a radiation source arranged to irradiate the object with radiation having a peak energy of at least 900 keV and a scatter detector arranged to detect radiation scattered from the object wherein the radiation source is arranged to irradiate the object over a plurality of regions to be scanned within a single irradiation event. The scatter detector includes a plurality of detection elements, each detection element being arranged to detect scattered radiation from a predefined part of the scanning zone and a signal processor arranged to calculate scatter intensity across the plurality of detector elements.06-09-2011
20090202041COMPTON CAMERA DEVICE - A Compton camera device according to the invention includes first means for reading coordinate data of a scattering point of a quantum ray detected by a pre-stage detector for each Compton scattering event, second means for reading coordinate data of a reaching point of the Compton-scattered quantum ray detected by a post-stage detector for each Compton scattering event, and third means for calculating a measurement accuracy of the scattered quantum ray by the first and second means for each Compton scattering event, calculating a statistical quantity of the quantum ray for each calculated measurement accuracy, and outputting the calculated statistical quantity to image reconstruction means.08-13-2009
20110051894X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD - An X-ray analysis apparatus including: a radiation source configured to irradiate an irradiation point on a sample with radiation; an X-ray detector configured to detect a characteristic X-ray emitted from the sample, and output a signal including energy information about the characteristic X-ray; an analyzer configured to analyze the signal; a sample stage configured to allow placement of the sample thereon; a shifting mechanism being capable of relatively shifting the sample on the sample stage and the radiation source and the X-ray detector with respect to each other; a height measuring mechanism being capable of measuring the height of the irradiation point on the sample; and a controller configured to control the shifting mechanism on the basis of the measured height of the irradiation point on the sample and adjust the distance of the sample with respect to the radiation source and the X-ray detector is used.03-03-2011
20110188632MULTIPLE PLANE MULTI-INVERSE FAN-BEAM DETECTION SYSTEMS AND METHOD FOR USING THE SAME - A detection system includes a multi-focus radiation source configured to generate X-ray radiation and a primary collimator defining a first row of apertures and a second row of apertures. The first row of apertures forms first X-ray beams within a first plane from the X-ray radiation, and the second row of apertures forms second X-ray beams within a second plane from the X-ray radiation. The first plane is different than the second plane. The detection system further includes a scatter detector including a first row of scatter detector elements and a second row of scatter detector elements. The first row of scatter detector elements is configured to detect scattered radiation from the first X-ray beams, and the second row of scatter detector elements is configured to detect scattered radiation from the second X-ray beams.08-04-2011
20120177181RADIOGRAPHIC IMAGING DEVICE AND RADIOGRAPHIC IMAGING SYSTEM - There is provided a radiographic imaging device including: a radiation source that irradiates radiation generated by inverse Compton scattering; a first grating at which first members that diffract or absorb radiation are formed side by side such that pitches thereof are larger where distances from a center position of the radiation irradiated from the radiation source are larger, the first grating diffracting or absorbing radiation irradiated from the radiation source with the first members; a second grating that is disposed at a position at which Talbot interference is produced by the radiation diffracted or absorbed by the first grating, and at which second members that absorb radiation are formed side by side such that pitches thereof are larger where distances from the center position of the radiation irradiated from the radiation source are larger; and a radiation detector that detects radiation that has passed through the second grating.07-12-2012
20130010927FUNCTIONAL AND PHYSICAL IMAGING USING RADIATION - An apparatus to examine a target in a patient includes an x-ray source configured to deliver a first x-ray beam towards the target, a device having an array of openings, the device located at an angle less than 180 degrees relative to a beam path of the first x-ray beam to receive a second x-ray beam resulted from an interaction between the first x-ray beam and the target, and a detector aligned with the device, the detector located at an angle less than 180 degrees relative to the beam path of the first x-ray beam to receive a part of the second x-ray beam from the device that exits through the openings at the device.01-10-2013
20120314842System for Identifying Radiation Zones in X-ray Imaging - A system displays potential radiation zones in an angiography X-ray laboratory during an angiography procedure, for example, and identifies areas of potentially harmful radiation due to X-ray scatter in an imaging room. An input processor receives data identifying an emitted X-ray dose level applied to an area of a patient anatomy. An image data processor determines level of X-ray radiation dose scatter in different regions of an imaging room indicating regions of potentially harmful radiation, by calculating X-ray scatter dose at different distances from an irradiated patient area as being substantially in proportion to the size of the irradiated area and substantially inversely proportional to the square of the distance from the irradiated area. A visual alert system visually identifies areas of a room of potentially harmful radiation in response to the determination.12-13-2012
20090060135X-Ray Tomography Inspection Systems - The present invention is an X-ray scanning system with an X-ray source arranged to generate X-rays from X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, a second set of detectors arranged to detect X-rays scattered within the scanning region, and a processor arranged to process outputs from the detectors to generate image data.03-05-2009
20080212739X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD - In an X-ray analysis apparatus and an X-ray analysis method, a quantitative analysis is stably performed by stably behaving an X-ray source. There are possessed an X-ray tubular bulb irradiating a primary X-ray to a sample, a primary X-ray adjustment mechanism capable of adjusting an intensity of the primary X-ray, an X-ray detector detecting a characteristic X-ray radiated from the sample, thereby outputting a signal including energy informations of the characteristic X-ray and a scattered X-ray, an analyzer analyzing the above signal, and an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector, and capable of adjusting a total intensity of the characteristic X-ray and the scattered x-ray, which are entered to the X-ray detector.09-04-2008
20120321046Integrated Backscatter X-Ray System - The different advantageous embodiments provide a method and apparatus for generating an x-ray beam. The x-ray beam is generated using an x-ray tube. The x-ray tube and a power supply are located inside of a housing connected to a moveable platform. A rotatable wheel connected to the moveable platform is rotated while the x-ray beam is being generated. The rotatable wheel has a number of apertures that allows at least a portion of the x-ray beam to pass through the rotatable wheel as the rotatable wheel rotates.12-20-2012
20120087473SURFACE MICROSTRUCTURE MEASUREMENT METHOD, SURFACE MICROSTRUCTURE MEASUREMENT DATA ANALYSIS METHOD AND X-RAY SCATTERING MEASUREMENT DEVICE - There is provided a surface microstructure measurement method, a surface microstructure measurement data analysis method, and an X-ray scattering measurement device which can accurately measure a microstructure on a surface and which can evaluate a three-dimensional structural feature. In the surface microstructure measurement method, the specimen surface is irradiated with X-ray at a grazing incident angle and a scattering intensity is measured; a specimen model with a microstructure on a surface in which one or more layers is formed in a direction perpendicular to the surface and unit structures are periodically arranged in a direction parallel to the surface within the layers is assumed; a scattering intensity of X-ray scattered by the microstructure is calculated in consideration of effects of refraction and reflection caused by the layer; and the scattering intensity of X-ray calculated by the specimen model is fitted to the measured scattering intensity. Then, as a result of the fitting, an optimum value of a parameter for specifying the shape of the unit structures is determined. Therefore, it is possible to accurately measure a microstructure.04-12-2012
20080253521Compton scattered X-ray visualization, imaging, or information provider with time of flight computation - One aspect relates to locating an at least one scattering event at least partially within an at least some matter of an at least a portion of an individual at least partially by directing an at least one pulse-type applied X-ray at the at least some matter of the at least the portion of the individual to create an at least one corresponding pulse-type Compton scattered X-ray, wherein the locating the at least one scattering event is based at least in part on an at least one time of flight computation derived at least in part from a combination of an at least one applied duration and an at least one scattered duration, wherein the at least one applied duration corresponds to a time for the at least one pulse-type applied X-ray to reach the at least one scattering event within the at least some matter of the at least the portion of the individual, and further wherein the at least one scattered duration corresponds to a time for the at least one corresponding pulse-type Compton scattered X-ray to thereupon travel from the at least one scattering event within the at least some matter of the at least the portion of the individual to be detected.10-16-2008
20080253520Compton scattered X-ray visualization, imaging, or information provider with scattering event locating - One aspect relates to determining a location of an at least one scattering event occurring within an at least some matter of at least a portion of an individual, wherein the determining the location of the the at least one scattering event is based at least in part on a combination of: a relative position and/or angle at which an at least one applied X-ray being applied to the at least some matter of the at least the portion of the individual, an applied energy level of the at least one applied X-ray being applied to the at least some matter of the at least the portion of the individual, a detected location of an at least one scattered X-ray resulting from scattering of the at least one applied X-ray scattering during the at least one scattering event, and a scattered energy level of the at least one scattered X-ray.10-16-2008
20130195248Hand-Held X-Ray Backscatter Imaging Device - Apparatus for imaging items behind a concealing barrier. A source of penetrating radiation is contained entirely within a housing. A spatial modulator forms the penetrating radiation into a beam and sweeps the beam to irradiate an inspected object. A detector generates a scatter signal based on penetrating radiation scattered by contents of the inspected object, and a sensor senses motion relative to a previous position of the apparatus with respect to the inspected object. A processor receives the scatter signal and generates an image of the contents of the inspected object based at least on the scatter signal. The housing may be adapted for singled-handed retention by an operator08-01-2013
20130202089Convertible Scan Panel for X-Ray Inspection - An x-ray inspection system using backscatter of an x-ray beam emitted through a scan panel contiguous with, but of a material distinct from, an enclosure that contains an x-ray source by which the x-ray beam is generated. The scan panel is contoured in such a manner as to be visibly blended with a shape characterizing the enclosure. In some embodiments, the beam traverses multiple scan panels, where one or more of the scan panels may be selected for beam filtration properties. The scan panel may be disposed interior to a sliding door, and may be structured to serve as a scatter shield.08-08-2013

Patent applications in class Scatter analysis

Patent applications in all subclasses Scatter analysis