Class / Patent application number | Description | Number of patent applications / Date published |
378079000 | Analyte support | 13 |
20090010388 | MICROPLATE AND METHODS OF USING THE SAME - Microplates having a body defining a plurality of wells, wherein the wells have at least one bottom portion configured to allow the sample to be analyzed by various methods in situ with minimized background interference in the data obtained, and methods of using the same, are disclosed. The improved microplate may also have wells having certain shapes and/or sizes to allow the sample to be analyzed with minimized background interference in the data obtained. A system for obtaining high-quality XRPD or Raman data is also disclosed. | 01-08-2009 |
20090262895 | X-ray diffractometer for mechanically correlated movement of the source, detector, and sample position - An X-ray diffractometer ( | 10-22-2009 |
20130182824 | SAMPLE ANALYSIS SYSTEM - A hair sample analysis system; said system comprising multiple sample arrays located within a container, an automated drive mechanism for removing an individual array from said container and for urging a. hair sample of said sample array to a first approximate location, and a monitoring and control system, for adjustment of said drive mechanism to locate said hair sample into substantial coincidence with an X-ray diffraction beam; locating said sample in substantial coincidence with said X-ray diffraction beam; irradiating said sample with said beam for a predetermined time; receiving and storing for analysis data derived from said step of irradiating said hair sample; repeating said steps for a consecutive one of said hair 5 samples from said sample array; returning said sample array to its original location in said container and removing another array from said sample container and repeating said steps for consecutive arrays. | 07-18-2013 |
20130243159 | MICRODIFFRACTION - A method of X-ray diffraction illuminates a beam ( | 09-19-2013 |
20130336454 | X-RAY ANALYSIS APPARATUS AND METHOD OF X-RAY ANALYSIS - An X-ray analysis apparatus includes: an X-ray source that emits an X-ray irradiating a specimen; a specimen holding unit that holds the specimen; and an X-ray detecting unit that detects the X-ray diffracted by the specimen; wherein the specimen holding unit includes a second φ-axis rotating stage rotating the specimen about a φ-axis, a first φ-axis rotating stage rotating the entirety of the second φ-axis rotating stage about the φ-axis, the second φ-axis rotating stage being disposed on the first φ-axis rotating stage, a φ-axis rotating stage that rotates the entirety of the first φ-axis rotating stage about a φ-axis, an ω-axis rotating stage that rotates the entirety of the χ-axis rotating stage about an ω-axis, and a 2θ-axis rotating stage rotating the X-ray detecting unit about the 2θ-axis, wherein the second φ-axis rotating stage unit rotates at a speed higher than that of the first φ-axis rotating stage. | 12-19-2013 |
20150146861 | X-RAY DIFFRACTION APPARATUS AND METHOD OF MEASURING X-RAY DIFFRACTION - There is provided an X-ray diffraction apparatus configured to irradiate a sample S on a sample stage with X-rays generated from an X-ray source and detect the X-rays diffracted by a sample using a detector, including a virtual mask setting section and a signal processing section. The detector outputs detection signals according to intensity of the X-rays received by detection elements, for each of the plurality of detection elements forming a detection surface. The virtual mask setting section is capable of setting a virtual mask on the detection surface of the detector, and setting at least an opening dimension of the virtual mask as an opening condition of the virtual mask independently in an X direction and a Y direction. The signal processing section processes the detection signals outputted from the detector according to the opening condition of the virtual mask set in the virtual mask setting section. | 05-28-2015 |
378080000 | With environmental control | 3 |
20120155612 | LOW-BACKGROUND SCATTERING X-RAY DIFFRACTOMETER DEVICES, SYSTEMS, AND METHODS - The disclosure relates to devices for creating a low-background scattering environment proximate to the stage of an x-ray diffractometer, x-ray diffractometer systems comprising the same, and methods for collecting x-ray diffraction data. | 06-21-2012 |
20120275567 | SAMPLE COOLING APPARATUS FOR X-RAY DIFFRACTOMETER AND X-RAY DIFFRACTOMETER - The sample cooling apparatus is used in an X-ray diffractometer for rotating a sample supported by a sample rod about an ω axis, directing X-rays thereto, and detecting X-rays deflected from the sample using an X-ray detector. The apparatus has a nozzle for blowing a cooling gas on the sample; and a gas-suctioning device for suctioning, via an aperture, gas that has passed over the sample. The sample rod moves when rotated about the ω axis forming a conical surface having the sample as a vertex. The nozzle is provided so that the extension direction of the sample rod and the direction of the blown gas form an acute angle of 90° or less. The gas-suctioning device suctions the gas so the path of gas having contacted the sample rod bends when the extension direction of the sample rod and the blown direction of the gas form an acute angle. | 11-01-2012 |
20150071409 | Temperature Control Chamber for Compact X-Ray Machine - A sample temperature control chamber is described for a benchtop X-ray machine and/or full-protection X-ray machine, which comprises (a) a first chamber part ( | 03-12-2015 |
378081000 | Goniometer | 4 |
20100046708 | GONIOMETER - The invention relates to a goniometer and a method for measuring stresses and characterizing microstructure of particles. The goniometer comprises a base ( | 02-25-2010 |
20130039470 | SAMPLE PLATE FOR AN X-RAY POWDER DIFFRACTION APPARATUS - A sample plate for use in an X-ray powder diffraction apparatus, the sample plate comprising a body having an exterior circumference which rotatable about a central axis, and a self contained rotating mechanism for rotating a sample holder containing a powder about a longitudinal axis, wherein the longitudinal axis intersects central axis; and wherein rotation about the central axis and rotation about the longitudinal axis occur simultaneously. | 02-14-2013 |
20130039471 | Detection of Wafer-Edge Defects - Apparatus for inspection of a disk, which includes a crystalline material and has first and second sides. The apparatus includes an X-ray source, which is configured to direct a beam of X-rays to impinge on an area of the first side of the disk. An X-ray detector is positioned to receive and form input images of the X-rays that are diffracted from the area of the first side of the disk in a reflective mode. A motion assembly is configured to rotate the disk relative to the X-ray source and detector so that the area scans over a circumferential path in proximity to an edge of the disk. A processor is configured to process the input images formed by the X-ray detector along the circumferential path so as to generate a composite output image indicative of defects along the edge of the disk. | 02-14-2013 |
20140119512 | X-RAY DETECTOR AND X-RAY DIFFRACTION DEVICE - A silicon strip detector having a first X-ray detection unit having plural strips arranged in parallel to one another in a first direction, and a second X-ray detection unit having plural strips arranged in parallel to one another in a second direction orthogonal to the first direction is used as an X-ray detector. The X-ray detector is mounted in an X-ray diffraction device while the first direction is matched with the tangential direction of 2θ-rotation, and the second direction is matched with the tangential direction of χ-rotation for executing in-plane diffraction measurement. | 05-01-2014 |