Class / Patent application number | Description | Number of patent applications / Date published |
378073000 | Crystalography | 49 |
20080298551 | Nondestructive analysis method, nondestructive analysis device, and specific object analyzed by the method/device - Non-destructive analysis is carried out by irradiating an object with X-rays, for example, so that the X-rays from the object are incident on an analyzer crystal. The analyzer crystal can be of a transmission-type or a reflection-type. A pre-crystal device is used to make the radiation monochromated and parallelized. Atomic lattice planes of the pre-crystal device are approximately parallel with the atomic lattice planes of the analyzer crystal so as to use the angular analysis capability of the analyzer crystal. The thickness of the analyzer crystal is fixed. For example, for a transmission-type analyzer crystal, the thickness is such that irradiation with monochromatic parallel X-rays in the absence of the object results in a condition in which either one of (a) X-rays along a forward diffraction direction and (b) X-rays along a diffraction direction obtained by dynamical diffraction by the transmission type analyzer crystal have an intensity of nearly zero as compared to the intensity of the other with respect to the monochromatic parallel X-rays. At least one or both of an X-ray dark-field image and an X-ray bright-field are obtained. | 12-04-2008 |
20090080611 | Computer Controllable LED Light Source for Device for Inspecting Microscopic Objects - A device for inspecting microscopic objects. A plurality of LEDS is arranged in an array underneath a lens. Some of the LEDS are lighted and some of the LEDS are unlighted. A computer is in control of the LED array. The computer turns on selected LEDS from the array to form the lighted LEDS. Also, the computer turns off selected LEDS from the array to form the unlighted LEDS. The lighted LEDS form a pattern of lighted LEDS underneath the lens. In a preferred embodiment, the lens is connected to a computer controlled camera and the microscopic objects are microscopic crystals. In another preferred embodiment UV LEDS are utilized and illuminate crystals from above. In another preferred embodiment UV LEDS are utilized to illuminate a loop of a Hampton pin to locate a crystal in the loop of a Hampton pin for the purpose of x-ray crystallography. | 03-26-2009 |
20090103680 | Method Of Generating X-Ray Diffraction Data For Integral Detection Of Twin Defects In Super-Hetero-Epitaxial Materials - A method provides X-ray diffraction data suitable for integral detection of a twin defect in a strained or lattice-matched epitaxial material made from components having crystal structures having symmetry belonging to different space groups. The material is mounted in an X-ray diffraction (XRD) system. In one embodiment, the XRD system's goniometer angle Ω is set equal to (θ | 04-23-2009 |
20090141862 | SLIDING SAMPLE CELL INSERTION AND REMOVAL APPARATUS FOR X-RAY ANALYZER - A sample cell insertion and removal apparatus for an analysis instrument, including a horizontally sliding frame; a sample cell carriage movably mounted to the sliding frame, the sample cell carriage including an area to hold a sample cell; wherein upon sliding into and out of the instrument, the sample cell carriage is moved horizontally and vertically into and out of an analysis position. This instrument may include a radiation shielded enclosure into and out of which the apparatus slides, and an x-ray analysis engine which transmits x-rays upwards towards the sample cell which projects from a bottom of the apparatus. The disclosed sample cell is especially suited for an x-ray analysis engine having a focal spot requiring alignment with the sample in the sample cell. | 06-04-2009 |
20090147918 | METHOD AND SYSTEM FOR CRYSTALLIZATION AND X-RAY DIFFRACTION SCREENING - An integrated fluidic circuit includes a substrate layer and a first structure coupled to the substrate layer and including a plurality of channels. The first structure is configured to provide for flow of one or more materials through the plurality of channels. The integrated fluidic circuit also includes a second structure coupled to the substrate layer. The second structure includes a plurality of control channels configured to receive an actuation pressure. The integrated fluidic circuit is characterized by a thickness of less than 1.5 mm. | 06-11-2009 |
20090161828 | ISOLATED PHOSPHOLIPID-PROTEIN PARTICLES - Systems and methods are provided for producing a protein of interest that is typically not amenable to expression in soluble form in in vitro expression systems. In some aspects, the invention provides methods of synthesizing proteins using in vitro protein synthesis systems that include a scaffold protein such as apolipoprotein or an amphipathic alpha helix containing (“AAHC”) protein, in which higher yields of soluble protein are produced than in the absence of the scaffold protein. The scaffold proteins may be provided in an in vitro protein synthesis system associated with lipid or not associated with lipid. The scaffold protein may be provided as a protein per se or may be encoded by a nucleic acid template and co-expressed with the protein of interest. The invention also provides compositions and kits for synthesis of proteins in soluble form, in which the compositions and kits include cell extracts for protein expression and isolation. | 06-25-2009 |
20100027746 | X-ray diffraction wafer mapping method for rhombohedral super-hetero-epitaxy - A new X-ray diffraction (XRD) method is provided to acquire XY mapping of the distribution of single crystals, poly-crystals, and twin defects across an entire wafer of rhombohedral super-hetero-epitaxial semiconductor material. In one embodiment, the method is performed with a point or line X-ray source with an X-ray incidence angle approximating a normal angle close to 90°, and in which the beam mask is preferably replaced with a crossed slit. While the wafer moves in the X and Y direction, a narrowly defined X-ray source illuminates the sample and the diffracted X-ray beam is monitored by the detector at a predefined angle. Preferably, the untilted, asymmetric scans are of {440} peaks, for twin defect characterization. | 02-04-2010 |
20100322382 | PIN BASE SENSOR FOR HIGH-THROUGHPUT MACROMOLECULAR CRYSTALLOGRAPHY - Sensing methods and a compact, sample holding pin base sensor are provided for detecting if a sample pin is, for example, properly mounted on a goniometer used for automated, high throughput macromolecular crystallography. A first magnet is used for holding a magnetic base; a second magnet is disposed spaced apart from the first magnet. The first magnet and the second magnet have opposite orientation. A Hall-effect switch is located generally centrally between the first magnet and the second magnet. A state of the Hall-effect switch indicates if a sample pin is properly mounted on a mounting member, such as a goniometer. | 12-23-2010 |
20110038457 | X-RAY DIFFRACTION APPARATUS AND TECHNIQUE FOR MEASURING GRAIN ORIENTATION USING X-RAY FOCUSING OPTIC - An x-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An x-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus. | 02-17-2011 |
20110164730 | High-Resolution X-Ray Diffraction Measurement with Enhanced Sensitivity - A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having an epitaxial layer formed thereon, and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including a diffraction peak and fringes due to the epitaxial layer. A characteristic of the fringes is analyzed in order to measure a relaxation of the epitaxial layer. | 07-07-2011 |
20110164731 | Method and composition for crystallizing G protein-coupled receptors - Certain embodiments provide a method for crystallizing a GPCR. The method may employ a fusion protein comprising: a) a first portion of a G-protein coupled receptor (GPCR), where the first portion comprises the TM1, TM2, TM3, TM4 and TM5 regions of the GPCR; b) a stable, folded protein insertion; and c) a second portion of the GPCR, where the second portion comprises the TM6 and TM7 regions of the GPCR. | 07-07-2011 |
20110211674 | GONIOMETER BASE APPARATUS AND METHOD - A goniometer base for X-ray crystallography comprises a magnetic steel part with a cylindrical hole, a compliant cylindrical part that is inserted into this hole, and a cylindrical tube that is press-fit into the hole and holds the compliant part in place, such that when a crystal mounting tool is inserted through the concentric holes in each part, it is positively gripped and held in place at both T=300 K and T=100 K. | 09-01-2011 |
20110317813 | WAVELENGTH-CLASSIFYING TYPE X-RAY DIFFRACTION DEVICE - A wavelength-classifying type X-ray diffraction device bombards a sample with characteristic X-rays generated from an X-ray generation source, and detects characteristic X-rays diffracted by the sample using an X-ray detector. The X-ray generation source is composed of several metals of different atomic number, respective metals generating several characteristic X-rays of different wavelengths. An X-ray detector is composed of several pixels for receiving X-rays and outputting pulse signals corresponding to X-ray wavelengths. Pixels are respectively furnished with classification circuits. The classification circuits classify and output pixel output signals based on each of characteristic X-ray wavelengths. X-ray intensity is detected on a per-wavelength basis in individual pixels | 12-29-2011 |
20120140889 | FAST MEASUREMENT OF X-RAY DIFFRACTION FROM TILTED LAYERS - A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having multiple single-crystal layers, including at least a first layer and a second layer that is formed over and tilted relative to the first layer. The X-rays that are diffracted from each of the first and second layers are sensed simultaneously while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including at least a first diffraction peak due to the first layer and a second diffraction peak due to the second layer. The diffraction spectrum is analyzed so as to identify a characteristic of at least the second layer. | 06-07-2012 |
20120195406 | X-RAY DIFFRACTION APPARATUS - An X-ray shielding member is provided so as to confront an X-ray incident face of a sample, and a gap through which an X-ray emitted from an X-ray source is passed and irradiated to an X-ray incident face of the sample is formed between the X-ray shielding member and the X-ray incident face of the sample. A gap adjusting mechanism for moving the X-ray shielding member is further provided to move the X-ray shielding member in accordance with change of an X-ray incident angle to the sample by a goniometer, whereby the breadth of the gap formed between the X-ray shielding member and the X-ray incident face of the sample can be adjusted. | 08-02-2012 |
20120281813 | Confocal Double Crystal Monochromator - A monochromator is adapted to select at least one band of wavelengths from diverging incident radiation. The apparatus includes a first crystal and a second crystal. A band of emitted wavelengths of the first crystal is adapted to the at least one band of wavelengths. A surface curvature of the first crystal is adapted to focus emitted radiation in a first plane. A band of emitted wavelengths of the second crystal also is adapted to the at least one band of wavelengths. Parallel faces of a lattice structure of the second crystal are oriented at a first predetermined angle from a surface of the second crystal. In another embodiment, an apparatus is adapted to select at least one band of wavelengths from diverging incident synchrotron radiation in a given range of wavelengths with an energy resolution finer than about five parts in 10000 and optical efficiency greater than about 50 percent. | 11-08-2012 |
20120281814 | High-Resolution X-Ray Diffraction Measurement with Enhanced Sensitivity - A method for analysis includes directing a converging beam of X-rays toward a surface of a sample having an epitaxial layer formed thereon, and sensing the X-rays that are diffracted from the sample while resolving the sensed X-rays as a function of angle so as to generate a diffraction spectrum including a diffraction peak and fringes due to the epitaxial layer. A characteristic of the fringes is analyzed in order to measure a relaxation of the epitaxial layer. | 11-08-2012 |
20120328079 | METHODS AND SYSTEMS FOR INSPECTING STRUCTURES FOR CRYSTALLOGRAPHIC IMPERFECTIONS - Embodiments of methods and systems for inspecting a structure for a crystallographic imperfection are provided. In the method, an X-ray wavelength that is particularly susceptible to diffraction by the crystallographic imperfection is identified. Then an X-ray source is provided to emit X-rays in the identified X-ray wavelength. While placing the structure at a sequence of positions relative to the X-ray source, X-rays are directed at the structure in multiple, non-parallel arrays to create sequential patterns of diffracted X-rays. The patterns of diffracted X-rays are digitally captured and communicated to a computer that compares them to locate the crystallographic imperfection. For a surface imperfection, the imperfection may be marked with a target to allow for physical removal. | 12-27-2012 |
20130028385 | Intelligent Machines and Process for Production of Monocrystalline Products with Goniometer Continual Feedback - The invention includes an x-ray goniometer positionable directly adjacent to processing machines used in the cutting, milling, drilling and shaping of crystal boules and crystal ingots, used in conjunction with an adjustable tilt platform capable of pitch, yaw and roll movement, allowing in-situ measurement and automatic adjustment of crystal orientation with respect to the processing machine. The goniometer may be secured to the tool or a portion of the machine which is adjacent the piece to be worked. Various embodiments include an x-ray goniometer and adjustable tilt platform incorporated into a core drilling machine, saw, surface grinder, polishing apparatus, or orientation flat or notch grinder. Incorporating an x-ray goniometer and adjustable tilt platform directly into a crystal processing machine results in a decrease in overall processing time and labor, and a significant increase in precision when processing crystal ingots into a final product, such as a notched wafer. | 01-31-2013 |
20140044237 | Micro-gripper for Automated Sample Harvesting and Analysis - The present invention relates to a micro-gripper comprising tweezers, designed to be used for the harvesting of fragile sub-millimeter samples from their production or storage medium. The tweezers may be equipped with removable soft ending elements to prevent the deterioration of the sample. When coupled to a robotic arm, this micro-gripper allows automated flow of operations in a continuous and automated process, from harvesting to sample preparation and analysis. The present invention is particularly used in X-ray crystallography. | 02-13-2014 |
20140177801 | LABORATORY DIFFRACTION-BASED PHASE CONTRAST IMAGING TECHNIQUE - Embodiments of the disclosure relate to X-ray imaging systems. In one embodiment, the X-ray imaging system features a target configured to receive a focused electron beam from an electron emitter and emit a line source X-ray beam as a result of receiving the focused electron beam; and a monochromator crystal configured to receive the line source X-ray beam from the target and diffract only a portion of the X-rays, wherein the portion of X-rays satisfies the Bragg diffraction condition for the monochromator crystal, and wherein the monochromator crystal is oriented relative to the target such that the portion of the X-rays from the target that satisfy the Bragg condition illuminate an entire length of a surface of the monochromator crystal. | 06-26-2014 |
20140254763 | X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLINE MATERIAL SAMPLE, AND AN X-RAY DIFFRACTION APPARATUS - An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects substantially line-shaped segments from beams diffracted from at least some of the grains. A processing device analyses values received from the X-ray detector and identifies at least the position and the length of the line-shaped segments. The line-shaped segments are paired as originating from diffractions from the same grain and the positions of the paired line-shaped segments are used in determining the crystallographic grain position of this grain within in the polycrystalline material sample. The length of the paired line-shaped segments is used in determining a width of this grain. | 09-11-2014 |
20140307854 | X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLINE MATERIAL SAMPLE, AND AN X-RAY DIFFRACTION APPARATUS - An X-ray diffraction method of mapping grain structures in a polycrystalline material sample, where an X-ray detector detects spots or line-shaped segments from beams diffracted from at least some of the grains. A processing device analyses values received from the X-ray detector and identifies at least the position of the spots or line-shaped segments. The processing device discretizes an initial three-dimensional model of the polycrystalline material sample into voxels and reconstructs the grains in the model by iterative testing associating crystallographic orientations of the voxels to the detected spots or line-shaped segments. | 10-16-2014 |
20140348298 | Method Of Analysing A Sample Of Material By Diffractometry And Associated Diffractometer - A method for analyzing a sample by diffractometry and a diffractometer, where the diffractometer includes a collimated source, a detection collimator, and a spectrometric detector, the detection axis of the detector and the collimator form a diffraction angle with the central axis of an incident beam and an energy spectrum is established for each pixel of the detector. and The measured spectra are readjusted by a change in variable that takes into account the energy of the scattered radiation and the angle of observation. measured The spectra are combined and a check is made on the implementation of at least one multi-material criterion representative of the presence of a plurality of layers of materials and groups of pixels are formed according to the results of this check, where each group corresponds to a single layer of material and the measured spectra obtained for the pixels of the group are combined. | 11-27-2014 |
20150092920 | INTELLIGENT MACHINES AND PROCESS FOR PRODUCTION OF MONOCRYSTALLINE PRODUCTS WITH GONIOMETER CONTINUAL FEEDBACK - The present invention consists of an x-ray goniometer which is positioned directly adjacent to processing machines used in the cutting, milling, drilling and shaping of crystal boules and crystal ingots, used in conjunction with an adjustable tilt platform capable of pitch, yaw and roll movement, to allow in-situ measurement and automatic adjustment of crystal orientation with respect to the processing machine. The goniometer may be secured to either the tool itself or a portion of the machine which is adjacent the piece to be worked. Various embodiments include an x-ray goniometer and adjustable tilt platform incorporated into a core drilling machine, wire saw, surface grinder, polishing apparatus, or orientation flat or notch grinder. Incorporating an x-ray goniometer and adjustable tilt platform directly into a crystal processing machine results in a significant decrease in overall processing time and labor, and a significant increase in precision when processing crystal ingots into a final product, such as a notched wafer. | 04-02-2015 |
20150117611 | SINGLE CRYSTAL QUARTZ CHIPS FOR PROTEIN CRYSTALLIZATION AND X-RAY DIFFRACTION DATA COLLECTION AND RELATED METHODS - A crystallization device for in situ x-ray diffraction of biological samples includes a flat plate made of single crystal quartz, silicon or sapphire and having an array of wells or lanes defined on the plate. The crystallization device may be in the form of a cover slide used with a crystallization plate in a vapor diffusion setup. Also disclosed is a method for preparing biological samples for crystallization and x-ray diffraction, including: obtaining a crystallization device made of single crystal quartz, silicon or sapphire; loading a solution containing biological molecules onto the crystal support device; maintaining the solution in a crystal growth environment to grow crystals of the biological molecules; removing the crystal support device carrying the crystals from the crystal growth environment; exposing the crystals carried on the crystal support device to an X-ray beam; and recording X-ray diffracted by the biological crystals. | 04-30-2015 |
20160069825 | METHOD AND APPARATUS FOR MEASURING SCATTERING INTENSITY DISTRIBUTION - It is an object of the present invention to provide a method and an apparatus for measuring a scattering intensity distribution capable of measuring a scattering intensity distribution in a reciprocal space in a short time. The method or apparatus for measuring a scattering intensity distribution causes X-rays emitted from an X-ray source ( | 03-10-2016 |
20160178540 | X-RAY SURFACE ANALYSIS AND MEASUREMENT APPARATUS | 06-23-2016 |
378074000 | Topography | 10 |
20080273662 | CD-GISAXS System and Method - CD-GISAXS achieves reduced measurement times by increasing throughput using longer wavelength radiation (˜12×, for example) such as x-rays in reflective geometry to increase both the collimation acceptance angle of the incident beams and the scattering signal strength, resulting in a substantial combined throughput gain. This wavelength selection and geometry can result in a dramatic reduction in measurement time. Furthermore, the capabilities of the CD-GISAXS can be extended to meet many of the metrology needs of future generations of semiconductor manufacturing and nanostructure characterization, for example. | 11-06-2008 |
20090034681 | Characterization of Three-Dimensional Distribution of Defects by X-Ray Topography - Provided is a method of determining a three-dimensional distribution of structural defects in a single crystal material, the method comprising: (a) disposing a single crystal sample on a holder, the sample being set to a symmetric reflection in the Bragg Geometry; (b) projecting a beam of incident x-rays on a predetermined crystal plane in the sample and reflecting the x-rays while the sample is azimuthally rotating with respect to an normal axis, the normal axis being perpendicular to the predetermined crystal plane; (c) obtaining geometrical measured values of a two-dimensional configuration of defects on the detector plane of a CCD detector; and (d) determining the three-dimensional distribution of the defects in the sample by formulating a geometrical relation between a three-dimensional configuration of defects on the sample and the geometrical measured values of the two-dimensional configuration of defects on the detector plane. | 02-05-2009 |
20120140890 | X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION MEASUREMENT METHOD - There is provided an X-ray diffraction apparatus comprising an X-ray topography device for providing a spatial geometric correspondence to an X-ray exiting from a planar region of a sample to detect the X-ray as a planar X-ray topograph, and outputting the X-ray topograph as a signal; a two-dimensional imaging device for receiving a light-image of the planar region of the sample and outputting the light-image as a signal specified by planar positional information; and a video-synthesizing arithmetic control device for generating synthesized video data on the basis of an output signal from the X-ray topograph and an output signal from the imaging device. | 06-07-2012 |
20130259200 | X-RAY TOPOGRAPHY APPARATUS - Provided is an X-ray topography apparatus capable of separating a desired characteristic X-ray which enters a sample from an X-ray which is radiated from an X-ray source, and increasing an irradiation region of the desired characteristic X-ray. The X-ray topography apparatus includes: the X-ray source for radiating the X-ray from a fine focal point, the X-ray containing a predetermined characteristic X-ray; an optical system including a multilayer mirror with a graded multilayer spacing which corresponds to the predetermined characteristic X-ray, the optical system being configured to cause the X-ray reflected on the multilayer mirror to enter the sample; and an X-ray detector for detecting a diffracted X-ray. The multilayer mirror includes a curved reflective surface having a parabolic cross section, and the fine focal point of the X-ray source is provided onto a focal point of the curved reflective surface. | 10-03-2013 |
20140192959 | METHOD AND APPARATUS FOR SURFACE MAPPING USING IN-PLANE GRAZING INCIDENCE DIFFRACTION - An apparatus for examining the surface of a crystalline sample uses in-plane grazing incidence diffraction with a position-sensitive detector. The x-ray source illuminates an extended region of the sample and, for crystal sections having the appropriate lattice orientation, an elongated diffraction signal is produced. The relative position of the sample and the x-ray beam may then be changed to illuminate different regions of the sample so that the diffraction signal corresponds to these other regions. By scanning across the entire sample, a spatial profile of the sample surface may be generated. The system may be used to locate crystal boundaries, defects, or the presence of attenuating materials on the sample surface. | 07-10-2014 |
20150146858 | X-RAY TOPOGRAPHY APPARATUS - Disclosed is an X-ray topography apparatus including an X-ray source, a multilayer film mirror, a slit, a two-dimensional X-ray detector, and a sample moving device that sequentially moves the sample to a plurality of step positions. The X-ray source is a minute focal spot. The multilayer film mirror forms monochromatic, collimated, high-intensity X-rays. The direction in which the multilayer film mirror collimates the X-rays coincides with the width direction of the slit. The step size by which the sample is moved is smaller than the width of the slit. The combination of the size of the minute focal spot, the width of the slit, and the intensity of the X-rays that exit out of the multilayer film mirror allows the contrast of an X-ray image produced when the detector receives X-rays for a predetermined period of 1 minute or shorter to be high enough for observation of the X-ray image. | 05-28-2015 |
20150330918 | METHOD OF DETERMINING SURFACE ORIENTATION OF SINGLE CRYSTAL WAFER - Provided is a method of determining a surface orientation of a single crystal wafer. The method of determining a surface orientation of a single crystal wafer using high resolution X-ray rocking curve measurement may determine a surface angle of the wafer and a direction of the surface angle using rocking curve measurement of a high resolution X-ray diffraction method and measuring a misalignment angle formed by a rotation axis of a measuring apparatus and a surface normal of the wafer and an orientation of the misalignment angle. | 11-19-2015 |
20150346121 | INTEGRATED RECIPROCAL SPACE MAPPING FOR SIMULTANEOUS LATTICE PARAMETER REFINEMENT USING A TWO-DIMENSIONAL X-RAY DETECTOR - A method for performing an X-ray diffraction analysis of a crystal sample using a multi-dimensional detector that integrates an X-ray diffraction signal while the position of the sample relative to an X-ray source is changed along a scan direction. The resulting image is compressed along the scan direction, but may be collected very quickly. The capture of both on-axis and off-axis reflections in a single image provides a common spatial frame of reference for comparing the reflections. This may be used in the construction of a reciprocal space map, and is useful for analyzing a sample with multiple crystal layers, such as a crystal substrate with a crystalline film deposited thereupon. | 12-03-2015 |
20150369761 | USING MULTIPLE SOURCES/DETECTORS FOR HIGH-THROUGHPUT X-RAY TOPOGRAPHY MEASUREMENT - An apparatus for X-ray topography includes a source assembly, a detector assembly, a scanning assembly and a processor. The source assembly is configured to direct multiple X-ray beams so as to irradiate multiple respective regions on a sample, wherein the regions partially overlap one another along a first axis of the sample and are offset relative to one another along a second axis of the sample that is orthogonal to the first axis. The detector assembly is configured to detect the X-ray beams diffracted from the sample and to produce respective electrical signals in response to the detected X-ray beams. The scanning assembly is configured to move the sample relative to the source assembly and the detector assembly along the second axis. The processor is configured to identify defects in the sample by processing the electrical signals, which are produced by the detector assembly while the sample is moved. | 12-24-2015 |
20160252469 | ON-LINE COATING ADHESION DETERMINATION APPARATUS OF GALVANNEALED STEEL SHEET, AND GALVANNEALED STEEL SHEET MANUFACTURING LINE | 09-01-2016 |
378075000 | Powder technique | 8 |
20090086910 | X-Ray Diffraction Measuring Apparatus Having Debye-Scherrer Optical System Therein, and an X-ray Diffraction Measuring Method for the Same - An X-ray diffraction measuring apparatus equipped with Debye-Scherrer optical system therein, comprises a means for generating a characteristic X-ray to be irradiated upon a sample to be measured; an X-ray detector means being disposed to surround that sample around; and a focusing means, being disposed between the sample and the X-ray detector means, for collecting an X-ray scattering from the sample covering over a predetermined angle, in a peripheral direction, around the sample, and thereby irradiating it upon the X-ray detector means. | 04-02-2009 |
20110064199 | CRYSTALLITE SIZE ANALYSIS METHOD AND APPARATUS USING POWDER X-RAY DIFFRACTION - A sample is supported on a flat rotary specimen stage and irradiated at an incidence angle θ via a divergence slit with an x-ray beam emitted by an x-ray source, the diffraction beam from the sample is received via a divergence slit and the light-receiving slit by an x-ray detector placed at the position of a diffraction angle | 03-17-2011 |
20120002787 | Method for determining the quantitative composition of a powder sample - A method for automatic determination of the quantitative composition of a powder sample, comprises the following steps: (a) predetermining a list of phases; (b) calculating a theoretical diffraction diagram or theoretical energy-dispersive spectrum; (c) fitting the theoretical diffraction diagram or theoretical energy-dispersive spectrum. In step (a), a list is predetermined which is composed of phases that are actually contained in the powder sample and also phases that are possibly not contained in the powder sample, a threshold value for the phase content is predetermined for each phase, and the following further steps are carried out: (d) elimination of all phases, having phase contents which are below the threshold value, from the list in step (a); (e) repeating steps (b), (c) and (d) with the new list until all phase contents are above their predetermined threshold values; and (f) outputting the composition of the powder sample. This method permits automatic exclusion of amorphous or crystalline phases with phase contents below a user-definable threshold value in profile adjustment methods based on Rietveld or Pawley methods. | 01-05-2012 |
20150010132 | MICROCRYSTAL STRUCTURE ANALYSIS DEVICE, MICROCRYSTAL STRUCTURE ANALYSIS METHOD, AND X-RAY SHIELD DEVICE - A microcrystal structure analysis apparatus, a microcrystal structure analysis method, and an X-ray shielding device are provided which allow a favorable X-ray diffraction image to be obtained even when X rays are applied to a pseudo-single-crystallized sample while the sample is rotated. A microcrystal structure analysis apparatus | 01-08-2015 |
20150146859 | OPTICAL AXIS ADJUSTMENT METHOD FOR X-RAY ANALYZER AND X-RAY ANALYZER - An optical axis adjustment method for an X-ray analyzer. In a 2θ-adjustment step, a 0° position of the rotation of a receiving-side arm and a 0° position of the angle of diffraction 2θ are aligned. In a Zs-axis adjustment step, the position of an incident-side slit along a direction orthogonal to the centerline of the X-rays incident upon a sample from an X-ray source is adjusted. In a θ-adjustment step, the centerline of X-rays incident upon the sample from the X-ray source and the surface of the sample are adjusted so as to be parallel. In the 2θ-adjustment step, the Zs-axis adjustment step, and the θ-adjustment step, the capability for X-ray intensity positional resolution upon a straight line possessed by a one-dimensional X-ray detector is used to perform 2θ-adjustment, Zs-axis adjustment, and θ-adjustment. | 05-28-2015 |
20150146860 | OPTICAL AXIS ADJUSTMENT DEVICE FOR X-RAY ANALYZER - Provided is an optical axis adjustment device for an X-ray analyzer comprising an incident-side arm, a receiving-side arm, an X-ray source, an incident-side slit, and an X-ray detector, wherein the device comprises a shielding strip disposed at a position blocking X-rays received by the X-ray detector from the X-ray source, and a shielding strip-moving device that rotates the shielding strip around the sample axis relative to the optical axis of X-rays reaching the X-ray detector from the X-ray source to two angle positions, and the amount of deviation in parallelism of the surface of a sample with respect to the optical axis of the X-rays is found on the basis of X-ray intensity values found by the X-ray detector for the two angle positions. | 05-28-2015 |
20160069826 | Sample Plate for An X-Ray Powder Diffraction Apparatus - A sample plate for use in an X-ray powder diffraction apparatus, the sample plate comprising a body having an exterior circumference which rotatable about a central axis, and a self contained rotating mechanism for rotating a sample holder containing a powder about a longitudinal axis, wherein the longitudinal axis intersects central axis; and wherein rotation about the central axis and rotation about the longitudinal axis occur simultaneously. | 03-10-2016 |
20160123908 | XRD SAMPLE HANDLING APPARATUS - Disclosed is a sample handling assembly facilitating a sample holding cell used for XRD analysis. The assembly holds the sample cell upright during sample loading and analysis phases. The sample handling assembly is vibrated, partly by a tuning fork, to allow the powder to flow into the sample cell. After the XRD analysis, a rotating arm holding the sample cell is rotated 180° to orient the sample cell completely upside down so that the sample can be emptied. Also disclosed are jets of air that are pulsed onto the sample cell, and/or into the sample cell funnel-tube assembly, to shake and clean the components. | 05-05-2016 |
378076000 | Back reflection | 3 |
20100142679 | BACK-REFLECTION X-RAY CRYSTALLOGRAPHY METHOD AND SYSTEM - Provided is a method and system for back-reflection X-ray diffraction of a specimen that yields the orientation of a crystalline sample in a quick and an automated way. The method includes setting an approximate pre-selected X-ray detector to specimen distance, subjecting the specimen to X-rays, recording the Laue diffraction pattern, calculating the Miller indices of a fraction of the spots in the resulting pattern, averaging the Miller indices, moving a virtual representation of the specimen by a small amount along a line connecting the film to the specimen, changing the film-to-specimen distance, repeating the calculation, averaging and moving in small angular steps until the virtual representation of the specimen has been moved through a small distance range and best fits to the observed data, and determining the optimum film-to-specimen distance resulting in the smallest average Miller index. | 06-10-2010 |
20140185768 | METHOD OF MEASURING SCATTERING OF X-RAYS, ITS APPLICATIONS AND IMPLEMENTATION DEVICE - Method of measuring scattering of X-rays, characterized in that a compound to be analyzed is installed in a receptacle ( | 07-03-2014 |
20150092921 | METHODS AND APPARATUS FOR X-RAY DIFFRACTION - Methods and apparatus are provided for performing back-reflection energy-dispersive X-ray diffraction (XRD). This exhibits extremely low sensitivity to the morphology of the sample under investigation. As a consequence of this insensitivity, unprepared samples can be analysed using this method. For example, in a geological context, whole rock samples become amenable to analysis. A composite diffraction spectrum can be produced using information from different recorded spectra in different energy sub-ranges. The composite spectrum excludes fluorescence signals that would otherwise obscure the diffraction signals. | 04-02-2015 |