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INTERCONNECTION ARRANGEMENTS

Subclass of:

365 - Static information storage and retrieval

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Class / Patent application numberDescriptionNumber of patent applications / Date published
365072000 Transistors or diodes 126
365066000 Magnetic 7
365064000 Optical 7
365065000 Ferroelectric 2
20100149850NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - According to an aspect of the present invention, there is provided a nonvolatile semiconductor memory device including: a memory cell array including: memory cell blocks each having series-connected memory cells; wordlines; and a bitline pair connected to the memory cell blocks, one functioning as a readout bitline, the other one functioning as a reference bitline; an amplification circuit connected to the bitline pair to amplify a signal difference therebetween; and a reference voltage generation circuit including: a dummy memory cell block that has the same configuration as the memory cell block, that has one terminal connected to a first dummy plate line and that has the other terminal connected to the reference bitline; and a paraelectric capacitor that has one terminal connected to a second dummy plate line and that has the other terminal connected to the reference bitline.06-17-2010
20120230078STORAGE CIRCUIT - A storage circuit includes a volatile storage portion in which storage of a data signal is controlled by a clock signal and an inverted clock signal, and a nonvolatile storage portion in which a data signal supplied to the volatile storage portion can be held even after supply of power supply voltage is stopped. A wiring which supplies a power supply voltage and is connected to a protective circuit provided for a wiring for supplying the clock signal is provided separately from a wiring which supplies a power supply voltage and which is connected to the storage circuit. The timing of stop and restart of supply of the power supply voltage supplied to the wiring which is connected to the protective circuit is different from that of stop and restart of supply of the power supply voltage supplied to the wiring which is connected to the storage circuit.09-13-2012
365071000 Negative resistance 1
20130163304THREE-DIMENSIONAL SEMICONDUCTOR DEVICE AND OPERATING METHOD THEREOF - Provide are a three-dimensional semiconductor device and a method of operating the same. the device may include a substrate, left, center, and right blocks provided on the substrate, and at least one decoding block provided between the left and center blocks and/or between the right and center blocks. The center block comprises first lines arranged to form a plurality of columns and a plurality of layers, and the at least one decoding block comprises a plurality of decoding groups, each of which is configured to selectively connect a corresponding one of the columns of the first lines to one of the left and right blocks.06-27-2013
Entries
DocumentTitleDate
20130044530LAYOUT OF MEMORY CELLS AND INPUT/OUTPUT CIRCUITRY IN A SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device includes a memory cell array divided into a plurality of subarrays arranged in matrix form, the plurality of subarrays making up a plurality of subarray columns, an address pad column formed outside the memory cell array, the address pad column comprising a plurality of address pads that are arranged to be substantially parallel to the subarray columns, a data I/O pad column formed in a middle section of the memory cell array, the data I/O pad column comprising data I/O pads that are arranged to be substantially parallel to the subarray columns, an address input circuit arranged in the middle section of the memory cell array, and a pad input address line formed in a direction substantially perpendicular to the subarray columns on the memory cell array, the pad input address line directly connecting the address pad and the address input circuit.02-21-2013
20100020584High Speed Memory Module - A memory module may include a circuit board connectable to a system memory bus through a plurality of contacts disposed along one edge of the circuit board, the system memory bus having three positions for connecting memory modules. A plurality of memory chips may be mounted on the circuit board. The circuit board may include a plurality of D/Q traces to couple a corresponding plurality of D/Q signals from respective contacts to the plurality of memory chips or to one or more buffer chips that isolate the system memory bus from the memory chips. Each of the plurality of D/Q traces may have a predetermined trace impedance selected to provide a predetermined D/Q signal quality level when the memory module is installed in any of the three positions on the system memory bus and equivalent memory modules are installed in the other two positions.01-28-2010
20090196086HIGH BANDWIDTH CACHE-TO-PROCESSING UNIT COMMUNICATION IN A MULTIPLE PROCESSOR/CACHE SYSTEM - A processor/cache assembly has a processor die coupled to a cache die. The processor die has a plurality of processor units arranged in an array. There is a plurality of processor sets of contact pads on the processor units, one processor set for each processor unit. Similarly, the cache die has a plurality of cache units arranged in an array. There is a plurality of cache sets of contact pads on the cache die, one cache set for each cache unit. Each cache set is in contact with one corresponding processor set.08-06-2009
20130077374STACKED SEMICONDUCTOR APPARATUS, SYSTEM AND METHOD OF FABRICATION - A stacked semiconductor apparatus and method of fabricating same are disclosed. The apparatus includes upper and lower semiconductor devices having a similar pattern of connection elements. When stacked connected the resulting plurality of semiconductor devices includes a serial connection path traversing the stack, and may also include parallel connection paths, back-side mounted large components, and vertical thermal conduits.03-28-2013
20130039112SEMICONDUCTOR DEVICE - In a semiconductor device of a stacked structure type having a control chip and a plurality of controlled chips, wherein the control chip allocates different I/O sets to the respective controlled chips and processes the I/O sets within the same access cycle, the controlled chip close to the control chip and positioned to a lower position in the stacked structure has I/O penetrating through substrate vias connected to penetrating through interconnections. The penetrating through interconnections are extended to an upper one of the controlled chips that not use the penetrating through interconnections and, as a result, all of the penetrating through interconnections have the same lengths as each other.02-14-2013
20130039111CONNECTION AND ADDRESSING OF MULTI-PLANE CROSSPOINT DEVICES - A multi-plane circuit structure has at least a first circuit plane and a second circuit plane, and each circuit plane has a plurality of row wire segments, a plurality of column wire segments, and a plurality of crosspoint devices formed at intersections of the row wire segments and the column wire segments. The row and column wire segments have a segment length for forming a preselected number of crosspoint devices thereon. Each row wire segment in the second circuit plane is connected to a row wire segment in the first circuit plane with no offset in a row direction and in a column direction, and each column wire segment in the second circuit plane is connected to a column wire segment in the first circuit plane with an offset length in both the row direction and the column direction. The offset length corresponds to half of the preselected number of crosspoint devices.02-14-2013
20130033916SEMICONDUCTOR DEVICE HAVING PLURAL CIRCUIT BLOCKS THAT OPERATE THE SAME TIMING - Disclosed herein is a device that includes first and second ports arranged in a first direction and first and second circuits arranged between the first and second ports. The first and second ports are coupled to the first and second circuits, respectively. The first and second circuits include first and second sub circuits that control an operation timing thereof based on a timing signal, respectively. The control signal is transmitted through a control line extending in a second direction. Distances between the control line and the first and second sub circuits in the first direction are the same as each other. A coordinate of the control line in the first direction is different from an intermediate coordinate between coordinates of the first and second ports in the first direction.02-07-2013
20090175062FEEDBACK STRUCTURE FOR AN SRAM CELL - Embodiments of the present disclosure provide a feedback structure, a method of constructing a feedback structure and an integrated circuit employing the feedback structure. In one embodiment, the feedback structure is for use with an integrated circuit and includes a local interconnect configured to electrically connect an output of a CMOS inverter to another circuit in the integrated circuit. Additionally, the feedback structure also includes an interconnect extension to the local interconnect configured to proximately extend along a gate structure of the CMOS inverter to provide a reactive coupling between the output and the gate structure.07-09-2009
201000978354 F2 MEMORY CELL ARRAY - An integrated circuit including a memory cell array comprises active area lines, bitlines, the bitlines being arranged so that an individual one intersects a plurality of the active area lines to form bitline-contacts, respectively, the bitlines being arranged at a bitline pitch, wordlines being arranged so that an individual one of the wordlines intersects a plurality of the active area lines, and an individual one of the wordlines intersects a plurality of the bitlines, the wordlines being arranged at a wordline pitch, wherein neighboring bitline-contacts, each of which is connected to one of the active area lines, are connected with different bitlines, and the bitline pitch is different from the wordline pitch.04-22-2010
20130083585MEMORY DEVICE INTERFACE METHODS, APPARATUS, AND SYSTEMS - Apparatus and systems for memory system are provided. In an example, a memory system can include a plurality of memory dice and an interface chip. The memory dice can include a first memory die including a memory array coupled to through wafer interconnects (TWIs) and a second memory die, wherein the first memory die is stacked over the second memory die. In an example, the interface chip can be coupled to the TWIs and configured to provide memory commands to selected memory addresses within the plurality of memory dice. In an example, the interface chip can be configured to perform DRAM sequencing.04-04-2013
20130083584STUB MINIMIZATION WITH TERMINAL GRIDS OFFSET FROM CENTER OF PACKAGE - A microelectronic package includes a microelectronic element having memory storage array function overlying a first surface of a substrate, the microelectronic element having a plurality of contacts aligned with an aperture in the substrate. First terminals which are configured to carry all address signals transferred to the package can be exposed within a first region of a second substrate surface, the first region disposed between the aperture and a peripheral edge of the substrate. The first terminals may be configured to carry all command signals, bank address signals and command signals transferred to the package, the command signals being write enable, row address strobe, and column address strobe.04-04-2013
20130083583STUB MINIMIZATION FOR MULTI-DIE WIREBOND ASSEMBLIES WITH PARALLEL WINDOWS - A microelectronic package can include a substrate having first and second opposed surfaces and first and second apertures extending between the first and second surfaces, first and second microelectronic elements each having a surface facing the first surface of the substrate, a plurality of terminals exposed at the second surface in a central region thereof, and leads electrically connected between contacts of each microelectronic element and the terminals. The apertures can have first and second parallel axes extending in directions of the lengths of the respective apertures. The central region of the second surface can be disposed between the first and second axes. The terminals can be configured to carry address information usable by circuitry within the microelectronic package to determine an addressable memory location from among all the available addressable memory locations of a memory storage array within the microelectronic elements.04-04-2013
20130083582STUB MINIMIZATION FOR ASSEMBLIES WITHOUT WIREBONDS TO PACKAGE SUBSTRATE - A microelectronic package can include a substrate and a microelectronic element having a face and one or more columns of contacts thereon which face and are joined to corresponding contacts on a surface of the substrate. An axial plane may intersect the face along a line in the first direction and centered relative to the columns of element contacts. Columns of package terminals can extend in the first direction. First terminals in a central region of the second surface can be configured to carry address information usable to determine an addressable memory location within the microelectronic element. The central region may have a width not more than three and one-half times a minimum pitch between the columns of package terminals. The axial plane can intersect the central region.04-04-2013
20090154216Semiconductor memory device and semiconductor device group - A semiconductor device includes a first CMOS inverter, a second CMOS inverter, a first transfer transistor and a second transfer transistor wherein the first and second transfer transistors are formed respectively in first and second device regions defined on a semiconductor device by a device isolation region so as to extend in parallel with each other, the first transfer transistor contacting with a first bit line at a first bit contact region on the first device region, the second transfer transistor contacting with a second bit line at a second bit contact region on the second device region, wherein the first bit contact region is formed in the first device region such that a center of said the bit contact region is offset toward the second device region, and wherein the second bit contact region is formed in the second device region such that a center of the second bit contact region is offset toward the first device region.06-18-2009
20090154215REDUCING NOISE AND DISTURBANCE BETWEEN MEMORY STORAGE ELEMENTS USING ANGLED WORDLINES - Devices and/or methods that facilitate reducing cross-talk noise and/or complementary bit disturb between adjacent storage elements in a memory device are presented. A memory device includes a memory array with wordlines formed in a zig-zag pattern such that each wordline can have segments that are parallel to the x-axis and other segments that are angled from a direction parallel to the x-axis based in part on a predetermined angle. Adjacent storage elements can be positioned at respective ends of an angled segment of a wordline to facilitate increasing the distance between such storage elements, as compared to the distance between storage elements associated with an orthogonal memory array, where the increase in distance can be based in part on the predetermined angle. The size of the memory array can be the same or substantially the same size, as compared to an orthogonal memory array.06-18-2009
20120182780Memory System with Multi-Level Status Signaling and Method for Operating the Same - A memory system includes a status circuit having a common status node electrically connected to a respective status pad of each of a plurality of memory chips. The memory system also includes a plurality of resistors disposed within the status circuit to define a voltage divider network for generating different voltage levels at the common status node. Each of the different voltage levels indicates a particular operational state combination of the plurality of memory chips. Also, each of the plurality of memory chips is either in a first operational state or a second operational state. Additionally, the different voltage levels are distributed within a voltage range extending from a power supply voltage level to a reference ground voltage level.07-19-2012
20120182779SEMICONDUCTOR MEMORY DEVICE - According to one embodiment, a nonvolatile memory device includes a substrate, an interconnect layer, a memory layer, a circuit layer, first and second contact interconnects. The interconnect layer is provided on the substrate and includes first and second interconnects. The memory layer is provided between the substrate and the interconnect layer and includes first and second memory cell array units. The first and second memory cell array units include a plurality of memory cells. The circuit layer is provided between the memory layer and the substrate and includes a first circuit unit. The first contact interconnect is provided between the first and second memory cell array units and electrically connects one end of the first circuit unit to the first interconnect. The second contact interconnect electrically connects a second end of the first circuit unit different from the first end to the second interconnect.07-19-2012
20120182778SEMICONDUCTOR DEVICE INCLUDING PLURAL CHIPS STACKED TO EACH OTHER - Such a device is disclosed that includes a first semiconductor chip including a plurality of first terminals, a plurality of second terminals, and a first circuit coupled between the first and second terminals and configured to control combinations of the first terminals to be electrically connected to the second terminals, and a second semiconductor chip including a plurality of third terminals coupled respectively to the second terminals, an internal circuit, and a second circuit coupled between the third terminals and the internal circuit and configured to activate the internal circuit when a combination of signals appearing at the third terminals indicates a chip selection.07-19-2012
20130070508SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME - According to an embodiment, a method of manufacturing a semiconductor device including a memory array provided on a substrate, and a control circuit provided on a surface of the substrate between the substrate and the memory array, includes steps of forming, in an insulating layer covering a p-type semiconductor region and an n-type semiconductor region of the control circuit, a first contact hole communicating with the p-type semiconductor region; forming a contact plug, in contact with the p-type semiconductor region, within the first contact hole; forming, in the insulating layer, a second contact hole communicating with the n-type semiconductor region; and forming an interconnection contacting the contact plug and the n-type semiconductor region exposed within the second contact hole.03-21-2013
20130070509MEMORY DEVICE HAVING DATA PATHS - Apparatus and methods are disclosed, such as those involving array/port consolidation and/or swapping. One such apparatus includes a plurality of port pads including a plurality of contacts; a plurality of memory arrays; and a plurality of master data lines. Each of the master data lines extends in a space between one of the port pads and a respective one of the memory arrays. Each of the master data lines is electrically connectable to the contacts of a respective one of the port pads. The apparatus further includes a plurality of local data lines, each of which extends over a respective one of the memory arrays. Each of the local data lines is electrically connectable to a respective one of the master data lines. At least one of the local data lines extends over at least two of the memory arrays. This configuration allows memory array consolidation and/or swapping without increasing die space for additional routing and adversely affecting performance of the apparatus.03-21-2013
20130088907TRANSISTOR CIRCUIT LAYOUT STRUCTURE - A transistor circuit layout structure includes a transistor disposed on a substrate and including a source terminal, a drain terminal and a split gate including an independent first block and an independent second block, a bit line disposed on the source terminal and on the drain terminal or embedded in the substrate, a word line disposed on the first block, and a back line disposed on the second block. The horizontal level of the back line is different from that of the bit line and the word line.04-11-2013
20130051110SEMICONDUCTOR APPARATUS - A semiconductor apparatus according to an aspect of the present invention includes first and second bus-interface circuits, a first memory core connected to the first bus-interface circuit through a first data bus, the first memory core being connected to a first access control signal output from the first bus-interface circuit, a second memory core connected to the second bus-interface circuit through a second data bus, and a select circuit that selectively connects one of the first access control signal and a second access control signal output from the second bus-interface circuit to the second memory core.02-28-2013
20090303770Memory chip and semiconductor device - A memory chip is provided, including internal signal/data terminals disposed in a central part of the memory chip and memory cell arrays arranged around the internal terminals to surround the same and electrically connected thereto. A semiconductor device is also provided, having a memory chip and a logic chip stacked with an interposer interposed therebetween. The logic chip has internal signal/data terminals disposed in its central part and electrically connected to the memory chip. The memory chip includes internal signal/data terminals disposed in its central part, and memory arrays arranged around the internal terminals to surround the same and connected thereto. The internal terminals of the logic chip are connected to the internal terminals of the memory chip via through holes (through electrodes) in the interposer.12-10-2009
20090303769ROM ARRAY WITH SHARED BIT-LINES - Electronic apparatus, methods of forming the electronic apparatus, and methods of operating the electronic apparatus include a read only memory having a memory array of bit-lines, where the bit-lines are arranged such that each bit-line has a shared arrangement with one or more other bit-lines of the memory array. Each shared arrangement is structured to operably store a plurality of bits.12-10-2009
20090091964Semiconductor integrated circuit device including static random access memory having diffusion layers for supplying potential to well region - A static random access memory (SRAM) cell includes a first well region of a first conductivity type, a second well region of the first conductivity type, formed in a location different from a location where the first well region is formed, and a third well region of a second conductivity type, which is located between the first well region and the second well region. The memory cell further includes a first tap diffused layer of the first conductivity type for supplying a potential to the first well region, a second tap diffused layer of the first conductivity type for supplying the potential to the second well region, the first and second tap diffused layers being arranged substantially on a diagonal line in the layout of the SRAM cell, and a metal interconnection connected to the first and second tap diffused layers, the metal interconnection passing on the third well region in the SRAM cell.04-09-2009
20090091963MEMORY DEVICE - A first DRAM device comprises a first input connected to a first trace line to receive an address signal and a second input is connected to receive an operating voltage, such as Vdd. A second DRAM device comprises a first input connected to the first trace line to receive the address signal and a second input to receive the operating voltage. A first signal termination structure is connected to the first trace line, wherein the first signal termination structure is to terminate the first trace line to the operating voltage.04-09-2009
20130058148HIGH DENSITY MEMORY MODULES - Solid state memory modules are disclosed having increased density for module size/footprint. Different embodiments also provide for improved interconnect arrangements between the memory modules and the corresponding field programmable gate array (FPGA), micro-processor (μP), or application-specific integrated circuit (ASIC). These interconnects can provide for greater module interconnect flexibility, operating speed and operating efficiency. Some memory module embodiments according to the present invention comprises a plurality of solid state memory devices arranged on a first printed circuit board. A second printed circuit board is on and electrically connected to the first printed circuit board, with the second printed circuit board having a pin-out for direct coupling to a host device.03-07-2013
20130058149MEMORY DEVICES, METHODS OF STORING AND READING DATA, SMM JUNCTIONS, AND METHODS OF PREPARING ALUMINA SUBSTRATES - Various aspects of the invention provide memory devices, methods of storing and reading data, and silver/molecular-layer/metal (SMM) junctions. One aspect of the invention provides a memory device including a plurality of SMM junctions and an electrical structure configured to permit application of electricity across one or more of the plurality of SMM junctions. Another aspect of the invention provides a method of storing data on a memory device including a plurality of SMM junctions. The method includes applying electrical energy across a subset of the SMM junctions to switch the junction to a more conductive state. Another aspect of the invention provides an SMM junction including a silver layer, a copper layer, and a molecular layer positioned between the silver layer and the copper layer.03-07-2013
20090268502Semiconductor device with non-volatile memory and random access memory - A semiconductor device including a large capacity non-volatile memory and at least one random access memory, said the access time of said device being matched to the access time of each random access memory. The semiconductor memory device is comprised of: a non-volatile memory FLASH having a first reading time; a random access memory DRAM having a second reading time which is more than 100 times shorter than the first reading time; a circuit that includes a control circuit connected to both the FLASH and the DRAM and enabled to control accesses to those FLASH and DRAM; and a plurality of I/O terminals connected to the circuit. As a result, FLASH data is transferred to the DRAM before the DRAM is accessed, thereby matching the access time between the FLASH and the DRAM. Data is written back from the DRAM to the FLASH as needed, thereby keeping data matched between the FLASH and the DRAM and storing the data.10-29-2009
20090268501Novel SRAM Cell Array Structure - This invention discloses a static random access memory (SRAM) cell array structure which comprises a first and second bit-line coupled to a column of SRAM cells, the first and second bit-lines being substantially parallel to each other and formed by a first metal layer, and a first conductive line being placed between the first and second bit-lines and spanning across the column of SRAM cells without making conductive coupling thereto, the first conductive line being also formed by the first metal layer.10-29-2009
20090268500WORDLINE RESISTANCE REDUCTION METHOD AND STRUCTURE IN AN INTEGRATED CIRCUIT MEMORY DEVICE - Methods and structures for reducing resistance in wordlines of an integrated circuit memory device are disclosed. In one embodiment, the method includes forming multiple columns of polycrystalline silicon for respective number of wordlines, forming core transistor junctions and periphery transistor junctions associated with the wordlines, performing a salicidation process for the periphery transistor junction and performing a salicidation process for the columns of polycrystalline silicon to from the wordlines with low resistance.10-29-2009
20130063998SYSTEM AND MEMORY MODULE - A system includes: a controller, a first memory module connected to the controller through a first data bus, and a second memory module connected to the controller through a second data bus, wherein the first memory module includes: first and second memory chips; a first data terminal connected to the first data bus, and a first switch unit that electrical connects the first data terminal with either the first memory chip and the second memory chip, and the second module includes: third and fourth memory chips; a second data terminal connected to the second data bus, and a second switch unit that switches over electrical connection of the second data terminal with either the third memory chip or the fourth memory chip.03-14-2013
20090237972MEMORY INCLUDING PERIPHERY CIRCUITRY TO SUPPORT A PORTION OR ALL OF THE MULTIPLE BANKS OF MEMORY CELLS - A memory including periphery circuitry configured to support multiple banks of memory cells. The periphery circuitry includes switches that are set to put the periphery circuitry into a first mode to support a portion of the multiple banks of memory cells and a second mode to support all of the multiple banks of memory cells.09-24-2009
20130163303SEMICONDUCTOR DEVICE HAVING MULTI-LEVEL WIRING STRUCTURE - Disclosed herein is a device that includes a multi-level wiring structure including a first wiring layer and a second wiring layer formed over the first wiring layer; a memory cell array area including a plurality of memory cells, a plurality of sense amplifiers and a plurality of sub amplifiers; a main amplifier area including a plurality of main amplifiers, the memory cell array area and the main amplifier area being arranged in line in a first direction; and a plurality of first I/O lines each connecting an associated one of the sub amplifiers to an associated one of the main amplifiers, each of the first I/O lines including first and second wiring portions that are elongated in the first direction, the first wiring portion being formed as the first wiring layer and the second wiring portion being formed as the second wiring layer.06-27-2013
20120307543SEMICONDUCTOR DEVICE - A semiconductor device including multiple subarrays arrayed in a matrix in the row and column directions, and respectively containing multiple memory cells, bit lines coupled to the memory cells, and precharge circuits (to charge the bit lines; column select signal lines extending in the column direction for selecting subarray columns; main word lines for selecting subarray rows; and precharge signal lines for supplying precharge signals to the precharge circuits; and at least two of the subarrays formed in the row direction or the column direction are controlled by the same logic according to the precharge signal.12-06-2012
20120155142PHASE INTERPOLATORS AND PUSH-PULL BUFFERS - Interpolator systems are described utilizing one or more push-pull buffers to generate output clock signals that may be provided as inputs to a phase interpolator. The more linear slope on the output of the push-pull buffer may improve the linearity of a phase interpolator using the clock signals output from the push-pull buffers.06-21-2012
20110128766Programmable Resistance Memory - A nonvolatile integrated circuit memory includes mode control circuitry that allows it to be configured as any of a plurality of memory types.06-02-2011
20090310396DIGITAL MEMORY WITH CONTROLLABLE INPUT/OUTPUT TERMINALS - Methods and apparatus for controlling an input/output (I/O) driver of an I/O terminal based at least in part on the values being provided to the I/O terminal is disclosed. In various embodiments, a detector is employed. The detector shuts off power to the I/O driver if the digital value being presented is the same as a previously presented digital value.12-17-2009
20120106230SEMICONDUCTOR MEMORY DEVICE - The memory cell array has memory cells each positioned at respective intersections between a plurality of first wirings and a plurality of second wirings. Each of the memory cells has a rectifier element and a variable resistance element connected in series. The resistance element may have at least a first resistance value ant a second resistance value higher than the first resistance value. The contact arrangement portion is formed to arrange a plurality of contacts on a plane. The contacts are connected to the first wirings or the second wirings. The probe can move along the plane to electrically contact with either of the contacts.05-03-2012
201102927083D SEMICONDUCTOR DEVICE - A three-dimensional (3D) semiconductor device may include a stack of chips, including a master chip and one or more slave chips. I/O connections of slave chips need not be connected to channels on a motherboard, and only electrode pads of a master chip may be connected to the channels. Only the master chip may provide a load to the channels. A through-substrate via (TSV) boundary may be set on a data input path, a data output path, an address/command path, and/or a clock path of a semiconductor device in which the same type of semiconductor chips are stacked.12-01-2011
20100254173DISTRIBUTED FLASH MEMORY STORAGE MANAGER SYSTEMS - A flash memory storage system may include several modules of flash memory storage manager circuitry, each having some associated flash memory. The modules may be interconnected via the flash memory storage manager circuitry of the modules. The system may be able to write data to and/or read data from the flash memory associated with various ones of the modules by routing the data through the flash memory storage circuitry of the modules. The system may also be able to relocate data for various reasons using such read and write operations. The flash memory storage circuitry of the modules keeps track of where data actually is in the flash memory.10-07-2010
20100034005SEMICONDUCTOR MEMORY APPARATUS FOR CONTROLLING PADS AND MULTI-CHIP PACKAGE HAVING THE SAME - A semiconductor memory apparatus includes a first pad group located along a first edge of a plurality of banks, a second pad group located along a second edge of the plurality of banks opposite the first pad group, and a pad control section configured to provide first and second bonding signals and to implement control operation in response to a test mode signal and a bonding option signal to selectively employ signals from the first and second pad groups.02-11-2010
20080239783Semiconductor memory devices having strapping contacts - Semiconductor memory devices having strapping contacts with an increased pitch are provided. The semiconductor memory devices include cell regions and strapping regions between adjacent cell regions in a first direction on a semiconductor substrate. Active patterns extend in the first direction throughout the cell regions and strapping regions and are spaced apart from one another in a second direction intersecting the first direction. First interconnection lines extend in the first direction throughout the cell regions and the strapping regions and are spaced apart from one another in the second direction while overlapping with the active patterns. Second interconnection lines extend in the second direction to intersect the active patterns and the first interconnection lines in the cell regions. The second interconnection lines are spaced apart from one another in the first direction. Memory cells are positioned at intersection portions of the first and second interconnection lines in the cell regions. Strapping contacts are in the strapping regions and configured such that the active patterns contact with the first interconnection lines through the strapping contacts.10-02-2008
20080266926TRANSFER OF NON-ASSOCIATED INFORMATION ON FLASH MEMORY DEVICES - Manners for transferring information within a flash memory device across a memory array are described. A controller retrieves information from a storage unit and then a decoder decodes the information. The information is set across a series of bitlines through a pass gate to a second controller. The bitlines are both associated with the storage unit as well as bitlines associated with other storage units. A series of transistors is associated with each bitline. Different transistors are active based on if the bitlines are associated with the currently used storage unit.10-30-2008
20080266927SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND METHOD OF FABRICATING THE SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE - A semiconductor integrated circuit device having a 6F10-30-2008
20090213635SEMICONDUCTOR MEMORY DEVICE HAVING REPLICA CIRCUIT - A semiconductor memory device includes first and second cell arrays which have memory cells arrayed in row and column directions, first and second bit lines which are connected to the memory cells arrayed in the column direction, and first and second sense amplifiers which are connected to the first, second bit lines, respectively. The device also includes first and second dummy cell arrays which have dummy cells arrayed in the row and column directions, a dummy word line which is connected to the dummy cells arrayed in the row direction, first and second dummy bit lines which are connected to the dummy cells arrayed in the column direction and receive an output from the dummy word line, and first and second sense amplifier activation circuits which activate the first, second sense amplifiers in accordance with first and second control signals output from the first and second dummy bit lines, respectively.08-27-2009
20100118582MEMORY MODULE AND MEMORY SYSTEM HAVING THE SAME - A memory module comprises of a plurality of memory chips arranged in a rank and configured to input and output data in response to at least one of a command signal and an address signal. The memory module also comprises of a plurality of chip select pin terminals configured to transfer a plurality of chip select signals provided from an external device to the plurality of memory chips.05-13-2010
20110199805Selective access memory circuit - A selective access memory circuit (SAMC) is described. The SAMC is a class of complex programmable memory device (CPMD) that reconfigures access to memory cells by using gates in an integrated gate array mechanism configured at regular intervals in memory arrays. CPMDs are applied to embedded controllers, microprocessors, DSPs and system on chip (SoC) circuit architectures.08-18-2011
20120294059STACKED MEMORY DEVICES AND MEMORY SYSTEMS INCLUDING THE SAME - At least one example embodiment discloses a stacked memory device including a plurality of stacked memory chips, each of the memory chips including a memory array, a plurality of through silicon vias (TSVs) operatively connected to the plurality of stacked memory chips, micro channels configured to access the memory arrays and at least one circuit in each memory chip, the at least one circuit configured to vary a number of the micro channels accessing the memory array.11-22-2012
20090201712PRESETABLE RAM - A programmable volatile memory cell has a reset device in communication with a bit store. The reset device may produce a high or low logic state within a latch loop when activated by an assertive logic level on a reset line. A set of mask programmable vias may be provided on a single mask layer in a semiconductor fabrication process for the memory cell. A program-selectable one of two sets of vias may communicate with one reset device to the reset line and the other reset device to ground. In this way a single and programmatically determinable logic state may be produced in the memory cell with reset signaling. Otherwise, the memory cell is capable of retaining a logic state according to read/write processes. The memory cell may be implemented in an array where all or some of the cells may be reset at once.08-13-2009
20120106229Semiconductor device - To include stacked plural core chips, each of which includes a first through silicon via for transferring write data and a second through silicon via for transferring read data, and an interface chip commonly connected to the core chips. The interface chip includes a data input/output terminal, an input buffer provided between the data input/output terminal and the first through silicon via, and an output buffer provided between the data input/output terminal and the second through silicon via. With this configuration, the write data and the read data are transferred through the different through silicon vias, whereby the collision of data is not caused even when continuous accesses are made to different ranks.05-03-2012
20120106228METHOD AND APPARATUS FOR OPTIMIZING DRIVER LOAD IN A MEMORY PACKAGE - An apparatus is provided that includes a plurality of array dies and at least two die interconnects. The first die interconnect is in electrical communication with a data port of a first array die and a data port of a second array die and not in electrical communication with data ports of a third array die. The second die interconnect is in electrical communication with a data port of the third array die and not in electrical communication with data ports of the first array die and the second array die. The apparatus includes a control die that includes a first data conduit configured to transmit a data signal to the first die interconnect and not to the second die interconnect, and at least a second data conduit configured to transmit the data signal to the second die interconnect and not to the first die interconnect.05-03-2012
20090109721NONVOLATILE MEMORY ARRAY PARTITIONING ARCHITECTURE AND METHOD TO UTILIZE SINGLE LEVEL CELLS AND MULTI LEVEL CELLS WITHIN SAID ARCHITECTURE. - An apparatus comprising a two or three dimensional array of a plurality of pairs of non-volatile memory (“NVM”) cells coupled to enable program and erase of the NVM cells. The plurality of pairs of NVM cells is electrically connected to word lines and bit lines. Each pair of NVM cells comprises a first memory cell and a second memory cell. The first and second memory cells comprise a first source/drain, a second source/drain, and a control gate. The first source/drain of the first memory cell is connected to one of the bit lines. The second source/drain of the first memory cell is connected to the first source/drain of the second memory cell. The second source/drain of the second memory cell is connected to another one of the bit lines. The control gates of the first and second memory cells are connected to different word lines.04-30-2009
20090285006Semiconductor Memory and Method for Operating a Semiconductor Memory - A semiconductor memory has a plurality of read amplifiers to which a pair each of two complementary bit lines is connected, wherein the semiconductor memory includes at least one switching element each for each bit line, by which at least a partial section of the bit line may be electrically decoupled from the read amplifier, and wherein the semiconductor memory controls the first switching element so that the first switching element, when reading out and/or refreshing any memory cell connected to the bit line, temporarily electrically decouples at least the partial section of the bit line from the read amplifier.11-19-2009
20110170328SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device according to the present invention includes a first wiring region and a second wiring region located adjacent to the first wiring region. First lines located in the first wiring region include a first portion, a first lead portion and first inclined portion. Second lines located in the second wiring region include a second portion, a second lead portion and a second inclined portion. The first and second portions are located in parallel with a same pitch, the first and second lead portions are located with a pitch which is larger than the pitch of the first and second portions, the first and second inclined portions extend the same direction at a predetermined angle.07-14-2011
20090296446SEMICONDUCTOR MEMORY - A semiconductor memory of an aspect of the present invention including a main bit line, a first and second sub-bit line, a first resistive memory element which has a first terminal being connected with the main bit line, a first select transistor which has one end of a first current path being connected with the second terminal of the first resistive memory element and the other end of the first current path being connected with the first sub-bit line, a second resistive memory element which has a third terminal being connected with the main bit line, and a second select transistor which has one end of a second current path being connected with the fourth terminal of the second resistive memory element and the other end of the second current path being connected with the second sub-bit line.12-03-2009
20110199806UNIVERSAL STRUCTURE FOR MEMORY CELL CHARACTERIZATION - An integrated circuit includes a structure, where the structure includes a memory base cell, a first port set, a second port set, and a set of other ports, where the memory base cell includes a first storage node set, a second storage node set, and a set of other nodes, where the set of other nodes includes a first data node for accessing the first storage node set, a first access control node for controlling the access of the first storage node set, a first supply node for supplying the first storage node set, and a second supply node for supplying the second storage node set, where the first and second supply nodes are of the same sinking or sourcing type and are not connected together, where each node in the first storage node set is connected to a port in the first port set, where each node in the second storage node set is connected to a port in the second port set, where each of the other nodes is connected to one of the other ports, and where each of the other ports is connected to one and only one of the other nodes.08-18-2011
20100110749Semiconductor memory device having driver for compensating for parasitic resistance of data input-output pads - A semiconductor memory device that includes a supply voltage pad, a ground voltage pad, and at least two data input/output pads arranged between the supply voltage pad and the ground voltage pad. The semiconductor memory device has a first pull-up driver that is connected to the second data input/output pad located at a first distance from the supply voltage pad, and a first pull-down driver that is connected to the first data input/output pad located at a second distance from the ground voltage pad.05-06-2010
20100061133MEMORY MODULE AND METHOD OF PERFORMING THE SAME - A memory module and a method of performing the same for access of an external electronic device are provided herein. The memory module includes a NAND-type flash memory, a dynamic random access memory (DRAM) unit, and a memory controller. The dynamic random access memory unit which is electrically connected to the NAND-type flash memory includes a dynamic random access memory and an internal power. The memory controller is used for controlling at least one of both the NAND-type flash memory and the dynamic random access memory unit. When the memory module is disconnected with the external electronic device, the internal power of the dynamic random access memory unit powers the dynamic random access memory, actively. Accordingly, data stored in the dynamic random access memory will be retained.03-11-2010
20100142250SEMICONDUCTOR MEMORY AND SYSTEM - A pair of access control circuits having bit line pairs wired corresponds to a same data terminal and is assigned different addresses. During a test mode, a data swap circuit prohibits swapping of connections between a pair of data terminals and a pair of data lines when one of the access control circuits is used, and swaps the connections between a pair of data terminals and a pair of data lines when the other one of the access control circuits is used. Accordingly, it is possible to give a data signal at the same logic level to bit lines with different logics from each other. Stress can be given between a contact arranged between a pair of the access control circuits and bit lines adjacent to both sides of the contact. Consequently, designing of a test pattern can be simplified, and test efficiency can be improved.06-10-2010
20100128508SEMICONDUCTOR MEMORY DEVICE - The memory cell array has memory cells each positioned at respective intersections between a plurality of first wirings and a plurality of second wirings. Each of the memory cells has a rectifier element and a variable resistance element connected in series. The resistance element may have at least a first resistance value and a second resistance value higher than the first resistance value. The contact arrangement portion is formed to arrange a plurality of contacts on a plane. The contacts are connected to the first wirings or the second wirings. The probe can move along the plane to electrically contact with either of the contacts.05-27-2010
20080273366DESIGN STRUCTURE FOR IMPROVED SRAM DEVICE PERFORMANCE THROUGH DOUBLE GATE TOPOLOGY - A design structure embodied in a machine readable medium used in a design process includes a static random access memory (SRAM) device having a pair of cross-coupled, complementary metal oxide semiconductor (CMOS) inverters configured as a storage cell for a bit of data, a first pair of transfer gates configured to couple complementary internal nodes of the storage cell to a corresponding pair of bitlines during a read operation of the device; and a second pair of transfer gates configured to couple the storage cell nodes to the pair of bitlines during a write operation of the device, wherein impedance between the bitlines and the storage cell nodes during the write operation is less than that for the read operation, wherein impedance between the bitlines and the storage cell nodes during the write operation is less than that for the read operation.11-06-2008
20100128509Three-Dimensional Semiconductor Devices and Methods of Operating the Same - Provided are a three-dimensional semiconductor device and a method of operating the same. The three-dimensional semiconductor device includes: a plurality of word line structures on a substrate; active semiconductor patterns between the plurality of word line structures; and information storage elements between the plurality of word line structures and the active semiconductor patterns. Each of the plurality of word line structures includes a plurality of word lines spaced apart from each other and stacked, and the active semiconductor patterns include electrode regions and channel regions, the electrode regions and the channel regions having different conductive types and being alternately arranged.05-27-2010
20080239782SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device includes a bit line which is provided above a semiconductor substrate and runs in a first direction, a source line which is provided above the semiconductor substrate and runs in the first direction, an active area which is provided in the semiconductor substrate and extends in the first direction, first and second selection transistors which are formed on the active area and share a source region electrically connected to the source line, a first memory element having one end electrically connected to a drain region of the first selection transistor and the other end electrically connected to the bit line, and a second memory element having one end electrically connected to a drain region of the second selection transistor and the other end electrically connected to the bit line.10-02-2008
20080205112Apparatus for Hardening a Static Random Access Memory Cell from Single Event Upsets - A single event upset (SEU) hardened memory cell to be utilized in static random access memories is disclosed. The SEU hardened memory cell includes a first inverter and a second inverter connected to each other in a cross-coupled manner. The SEU hardened memory cell also includes a first resistor, a second resistor and a capacitor. The first resistor is connected between an input of the first inverter and an output of the second inverter. The second resistor is connected between an input of the second inverter and an output of the first inverter. The capacitor is connected between an input of the first inverter and an input of the second inverter.08-28-2008
20110007541FLOATING BODY MEMORY CELL SYSTEM AND METHOD OF MANUFACTURE - A plurality of integrated circuit features are provided in the context of an array of memory cells including a plurality of word lines and a plurality of bit lines. Each memory cell includes a floating body or is volatile memory. The aforementioned features may include, among others, an option whereby the foregoing bit lines may be situated below a channel region of corresponding memory cells, etc.01-13-2011
20080212353SRAM design with separated VSS - An array of static random access memory (SRAM) cells arranged in a plurality of rows and a plurality of columns includes a plurality of VSS lines connected to VSS nodes of the SRAM cells, with each VSS line connected to the SRAM cells in a same column. The plurality of VSS lines includes a first VSS line connected to a first column of the SRAM cells; and a second VSS line connected to a second column of the SRAM cells, wherein the first and the second VSS lines are disconnected from each other.09-04-2008
20100142251MEMORY DEVICES HAVING PROGRAMMABLE ELEMENTS WITH ACCURATE OPERATING PARAMETERS STORED THEREON - Techniques are disclosed for reading operating parameters from programmable elements on memory devices to configure a memory system. More specifically, programmable elements, such as antifuses, located on a memory device are programmed during fabrication with measured operating parameters corresponding to the memory device. Operating parameters may include, for example, operating current values, operating voltages, or timing parameters. The memory device may be incorporated into a memory module that is incorporated into a system. Once the memory module is incorporated into a system, the programmable elements may be accessed such that the memory system can be configured to optimally operate in accordance with the operating parameters measured for each memory device in the system.06-10-2010
20100142252RECONFIGURABLE INPUT/OUTPUT IN HIERARCHICAL MEMORY LINK - A memory system and memory module includes a plurality of memory devices, each having a plurality, e.g. four, ports for transmitting and receiving command signals, write data signals and read data signals. One of the memory devices is connected to a host or controller, and the remaining memories are connected together, typically by point-to-point links. When the memory system configuration is such that at least one of the ports in at least one of the memory devices is not used, one or more other ports can use the pins that may otherwise have been used by the unused ports. As a result, a set of reconfigurable, shared pins is defined in which two ports share the pins. The port that is not being used in a particular application for the memory device is not connected to the shared pins, and another port that is being used in the application is connected to the shared pins. This allows for the used of fewer package pins and, consequently, reduced package size.06-10-2010
20100142249NONVOLATILE MEMORY DEVICE USING A VARIABLE RESISTIVE ELEMENT - A nonvolatile memory device includes a plurality of memory banks, each including a plurality of nonvolatile memory cells, write global bit lines shared by the plurality of memory banks, read global bit lines shared by the plurality of memory banks, and a dummy global bit line arranged between the write global bit lines and the read global bit lines, wherein the dummy global bit line is configured and operable to reduce noise affecting a write bit line involved in a write operation or noise affecting a read global bit line involved in a read operation.06-10-2010
20090129137Semiconductor storage device - A semiconductor storage device includes a memory array compartmentalized into first and second regions alternately arranged. The second regions are formed by odd and even columns alternately arranged. The semiconductor storage device includes: a memory mat array arranged in each first region; a sense amp array arranged in each second region; local IO lines arranged in each second region and connected to the sense amp array; main IO lines crossing the first and second regions; and a read/write amplifier arranged in each second region and at an intersection region where the local IO lines cross the main IO lines. The read/write amplifier in an odd column is connected to a local IO line therein and to a local IO line in the next odd column. The read/write amplifier in an even column is connected to a local 10 line therein and to a local IO line in the next even column.05-21-2009
20090185408MEMORY DEVICE, MEMORY SYSTEM AND METHOD FOR DESIGN OF MEMORY DEVICE - A memory device may include, but is not limited to, at least one memory module, and a plurality of lumped constant circuit elements. The at least one memory module is electrically coupled to a transmission system that has a characteristic impedance. The plurality of lumped constant circuit elements with an inductance is placed on the transmission system symmetrically with reference to the at least one memory module. The plurality of lumped constant circuit elements in cooperation with the at least one memory module performs as at least one low-pass filter.07-23-2009
20130121054THREE-DIMENSIONAL INTEGRATED CIRCUIT - A three-dimensional integrated circuit comprising a submicroscale integrated-circuit substrate and n nanoscale layers stacked above the submicroscale integrated-circuit substrate, a nanowire-junction memory element in each of which is independently controlled by two submicroscale subcomponents within the submicroscale integrated-circuit substrate, the first submicroscale subcomponent coupled through a first set of switches to each of the n nanowire-junction memory elements and the second submicroscale subcomponent coupled through a second set of switches to each of the n nanowire-junction memory elements, the total number of switches in the first and second sets of switches less than 2n, and n greater than or equal to 2.05-16-2013
20090086521MULTIPLE ANTIFUSE MEMORY CELLS AND METHODS TO FORM, PROGRAM, AND SENSE THE SAME - Methods are described to fabricate, program, and sense a multilevel one-time-programmable memory cell including a steering element such as a diode and two, three, or more dielectric antifuses in series. The antifuses may be of different thicknesses, or may be formed of dielectric materials having different dielectric constants, or both. The antifuses and programming pulses are selected such that when the cell is programmed, the largest voltage drop in the memory cell is across only one of the antifuses, while the other antifuses allow some leakage current. In some embodiments, the antifuse with the largest voltage drop breaks down, while the other antifuses remain intact. In this way, the antifuses can be broken down individually, so a memory cell having two, three, or more antifuses may achieve any of three, four, or more unique data states.04-02-2009
20130215660VARIABLE RESISTANCE MEMORY DEVICE HAVING EQUAL RESISTANCES BETWEEN SIGNAL PATHS REGARDLESS OF LOCATION OF MEMORY CELLS WITHIN THE MEMORY ARRAY - A memory device including variable resistance elements comprises a plurality of memory cells configured to store data; a first signal transmission/reception unit and a second signal transmission/reception unit configured to transmit a signal to the memory cells or receive a signal from the memory cells; a first transmission line arranged to couple first ends of the memory cells to the first signal transmission/reception unit; and a second transmission line configured to couple second ends of the memory cells to the second signal transmission/reception unit, wherein a first resistance of a first signal path coupled between the first and second signal transmission/reception units through a first memory cell of the memory cells is substantially equal to a second electrical resistance of a second signal path coupled between a second memory cell and the first and second signal transmission/reception units through a second memory cell of the memory cells.08-22-2013
20090080230eDRAM Hierarchical Differential Sense AMP - In an embodiment of the present invention, a hierarchical differential sensing approach is effectuated wherein an array of 1T DRAM cells are organized in rows and columns in which the rows represent words and the columns represent bits of the word, each bit column having more than one pair of balanced, true and complement local bit lines, the local bit lines being connected to a pair of balanced, true and complement global bit lines by way of CMOS transistor switches.03-26-2009
20090080229SINGLE-LAYER METAL CONDUCTORS WITH MULTIPLE THICKNESSES - A pattern that includes trenches of different depths is formed on a substrate using nanoimprint lithography. A subsequent metal deposition forms lines of different thicknesses according to trench depth, from a single metal layer. Vias extending down from lines are also formed from the same layer. Individual bit lines are formed having different thicknesses at different locations.03-26-2009
20090086522ADDRESS LINE WIRING STRUCTURE AND PRINTED WIRING BOARD HAVING SAME - An address signal line having a stub structure connects between at least three memory elements and a data transferring element and transmits address signals for the memory elements. An address terminal of the data transferring element has an impedance lower than a characteristic impedance of the address signal line. A wiring length TL04-02-2009
20090231899PHASE CHANGE RANDOM ACCESS MEMORY AND LAYOUT METHOD OF THE SAME - A phase change random access memory (PRAM) includes a cell array divided into an active region and a dummy active region. A bitline is formed across the active region and the dummy active region and a global wordline is formed in the active region so as to intersect with the bitline. The cell array includes a phase change memory cell formed at an intersection point of the bitline and the global wordline that is electrically connected with the bitline and the global wordline. The cell array further includes a phase change dummy cell formed below the bitline in the dummy active region that is electrically isolated from the bitline. The dummy cell maintains a turn-off state as the dummy cell and the bitline are electrically isolated from each other.09-17-2009
20110228583SEMICONDUCTOR MEMORY DEVICE - According to one embodiment, a semiconductor memory device includes a memory cell array, a first sense amplifier circuit, and a second sense amplifier circuit. The memory cell array includes a plurality of first memory cell units, a plurality of second memory cell units, a plurality of first interconnects, and a plurality of second interconnects. The first sense amplifier circuit is connected to the plurality of first interconnects. The second sense amplifier circuit is connected to the plurality of second interconnects. Heights of upper surfaces of interconnects are equal. At least one of a width of each of the plurality of second interconnects along a second direction perpendicular to the first direction and a thickness of each of the plurality of second interconnects along a third direction perpendicular to the first direction and the second direction is set smaller than each of the plurality of first interconnects, and the first sense amplifier circuit and the second sense amplifier circuit are disposed to face each other across the memory cell array.09-22-2011
20090244950SEMICONDUCTOR MEMORY DEVICE HIGHLY INTEGRATED IN DIRECTION OF COLUMNS - First and second read word lines are provided in each set made of two adjacent rows. First, second, third, and fourth read bit lines are provided in each column. Each of the first and second read word lines is connected to memory cells in a corresponding one of the sets. Each of the first and third read bit lines is connected to a memory cell in one row in each of the sets, out of memory cells in a corresponding one of the columns. Each of the second and fourth read bit lines is connected to a memory cell in the other row in each of the sets, out of the memory cells in the corresponding one of the columns.10-01-2009
20090244949Memory Device and Method Providing Logic Connections for Data Transfer - In an embodiment, a method for transferring data in a memory device is provided. The method may include transferring data from a first memory cell arrangement including a plurality of memory cells to a second memory cell arrangement including a plurality of memory cells via a connecting circuit arrangement coupled to the plurality of memory cell arrangements and providing a plurality of controllable connections via a plurality of connecting circuit terminals, the memory cell arrangements being connected with at least one connecting circuit terminal of the plurality of connecting circuit terminals, wherein the connecting circuit is configured to provide arbitrarily controllable signal flow connections between the plurality of connecting circuit terminals. The data are transferred via a logic connection using the controllable connections. Simultaneously, a further logic connection may be provided to a memory cell arrangement of the memory cell arrangements using the controllable connections.10-01-2009
20090257263Method and Apparatus for Computer Memory - A method and apparatus for forming computer memory 10-15-2009
20100188877Storage device - The object of the invention is to avoid an unselected data line being driven in a memory array composed of memory cells each of which uses a storage element depending upon variable resistance and a selection transistor when the selection transistors in all memory cells on a selected word line conduct. To achieve the object, a source line parallel to a data line is provided, a precharge circuit for equipotentially driving both and a circuit for selectively driving the source line are arranged. Owing to this configuration, a current path is created in only a cell selected by a row decoder and a column decoder and a read-out signal can be generated. Therefore, a lower-power, lower-noise and more highly integrated nonvolatile memory such as a phase change memory can be realized, compared with a conventional type.07-29-2010
20100259964TECHNIQUES FOR PROVIDING A SEMICONDUCTOR MEMORY DEVICE - Techniques for providing a semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as a semiconductor memory device including a plurality of memory cells arranged in an array of rows and columns. Each memory cell may include a first region connected to a source line extending in a first orientation. Each memory cell may also include a second region connected to a bit line extending a second orientation. Each memory cell may further include a body region spaced apart from and capacitively coupled to a word line, wherein the body region is electrically floating and disposed between the first region and the second region. The semiconductor device may also include a first barrier wall extending in the first orientation of the array and a second barrier wall extending in the second orientation of the array and intersecting with the first barrier wall to form a trench region configured to accommodate each of the plurality of memory cells.10-14-2010
20100188878SEMICONDUCTOR DEVICE THAT SUPRESSES MALFUNCTIONS DUE TO VOLTAGE REDUCTION - A semiconductor device includes a first pad that supplies power to sense amplifiers, a second pad that supplies power to a first circuit connected to the sense amplifiers, a third pad that receives a signal input or outputs a signal at a frequency equal to or higher than a first frequency, and a fourth pad that receives a signal input or outputs a signal at a second frequency lower than the first frequency. The first pad is arranged between and adjacent to the second pads respectively, or arranged between and adjacent to the second and fourth pads respectively. Additionally, the first pad is arranged between the third pads, which are respectively arranged on both sides of the first pad, to be adjacent to the second pad so as to hold the second pad or to be adjacent to the fourth pad so as to hold the fourth pad.07-29-2010
20120195090SEMICONDUCTOR DEVICE INCLUDING PLURAL CHIPS STACKED TO EACH OTHER - Such a device is disclosed that includes first and second chips stacked to each other, and a third chip controlling the first and second chips, stacked on the first and second chips, and including first, second and third output circuits. The first output circuit supplies a first command signal to the first chip. The second output circuit supplies the first command signal to the second chip. The third output circuit supplies a second command signal to the first and second chips.08-02-2012
20120195089SEMICONDUCTOR MEMORY CHIP AND MULTI-CHIP PACKAGE USING THE SAME - A semiconductor memory chip includes a first pad unit configured to receive a first data and a first strobe signal, and a first selection transfer unit configured to transfer the first data and the first strobe signal to a first write path circuit in a first mode, and transfer the first data and the first strobe signal to a second write path circuit in a swap mode.08-02-2012
20110058401Semiconductor memory device having pad electrodes arranged in plural rows - To include a first memory cell array area and a second memory cell array area, a peripheral circuit area arranged between these memory cell array areas, a first pad row arranged between the first memory cell array area and the peripheral circuit area, and a second pad row arranged between the second memory cell array area and the peripheral circuit area. No peripheral circuit is arranged substantially between the first memory cell array area and the first pad row as well as between the second memory cell array area and the second pad row. With this arrangement, a memory cell array area and a predetermined pad can be connected within a shorter distance by using a wiring formed in an upper layer that has a lower electrical resistance, and a power potential can be stably supplied to the memory cell array area.03-10-2011
20110128767Memory With Intervening Transistor - Disclosed herein are memory devices and related methods and techniques. A cell in the memory device may be associated with an intervening transistor, the intervening transistor being configured to isolate the cell from adjacent cells under a first operating condition and to provide a current to a bit line associated with the cell under a second operating condition.06-02-2011
20090073739DYNAMIC RECONFIGURATION OF SOLID STATE MEMORY DEVICE TO REPLICATE AND TIME MULTIPLEX DATA OVER MULTIPLE DATA INTERFACES - Multiple interfaces dedicated to individual logic circuits such as memory arrays are capable of being dynamically reconfigured from operating separately and in parallel to operating in a more collective manner to ensure that data associated with all of the logic circuits will be communicated irrespective of a failure in any of the interfaces. Specifically, a plurality of interfaces, each of which being ordinarily configured to communicate data associated with an associated logic circuit in parallel with the other interfaces, may be dynamically reconfigured, e.g., in response to a detected failure in one or more of the interfaces, to communicate data associated with each of the interfaces over each of at least a subset of the interfaces in a time multiplexed and replicated manner.03-19-2009
20120033477MEMORY MODULES HAVING DAISY CHAIN WIRING CONFIGURATIONS AND FILTERS - Examples described include memory units coupled to a controller using a daisy chain wiring configuration. A filter located between a first memory unit and the controller attenuates a particular frequency, which may improve ringback in a signal received at the memory units. In some examples, a quarter-wavelength stub is used to implement the filter. In some examples, signal components at 800 MHz may be attenuated by a stub, which may improve ringback.02-09-2012
20130135917MEMORY SYSTEM AND METHOD USING STACKED MEMORY DEVICE DICE - A method and apparatus for organizing memory for a computer system including a plurality of memory devices 05-30-2013
20100321973MEMORY MODULE, SYSTEM AND METHOD OF MAKING SAME - A memory module, system and method of making the same includes a memory module including a plurality of memory devices having a first portion of memory devices cooperatively forming a first rank of memory devices and a second portion of memory devices cooperatively forming a second rank of memory devices. The first and second portions of memory devices are grouped into a plurality of memory device stacks, wherein each of the plurality of memory device stacks includes at least one of the plurality of memory devices coupled to a first portion of a plurality of DQ signals and at least another one of the plurality of memory devices coupled to a different second portion of the plurality of DQ signals.12-23-2010
20090067210Three dimensional structure memory - A Three-Dimensional Structure (3DS) Memory allows for physical separation of the memory circuits and the control logic circuit onto different layers such that each layer may be separately optimized. One control logic circuit suffices for several memory circuits, reducing cost. Fabrication of 3DS memory involves thinning of the memory circuit to less than 50 μm in thickness and bonding the circuit to a circuit stack while still in wafer substrate form. Fine-grain high density inter-layer vertical bus connections are used. The 3DS memory manufacturing method enables several performance and physical size efficiencies, and is implemented with established semiconductor processing techniques.03-12-2009
20110026295SEMICONDUCTOR MEMORY - To arrange data input/output PADs of a semiconductor memory on a narrower pitch without enhancing a required positional accuracy for a probe in a probe check. A semiconductor memory includes: a memory cell array including memory cells; signal terminals; a power source terminal of a power source supplied to output circuits of the signal terminals; test-purpose signal terminals fewer than the signal terminals; a selection portion which, as data to be written to the memory cells, selects data input from the signal terminals or data input from the test-purpose signal terminals, and repetitively allocates inputs of the test-purpose signal terminals to inputs of the signal terminals based on an arrangement of the signal terminals; and a test-purpose power source terminal connected to the power source terminal, and arrangement intervals of the test-purpose signal terminals and the test-purpose power source terminal are larger than an arrangement interval of the signal terminals.02-03-2011
20110026293SEMICONDUCTOR DEVICE - In a semiconductor device of a stacked structure type having a control chip and a plurality of controlled chips, wherein the control chip allocates different I/O sets to the respective controlled chips and processes the I/O sets within the same access cycle, the controlled chip close to the control chip and positioned to a lower position in the stacked structure has I/O penetrating through substrate vias connected to penetrating through interconnections. The penetrating through interconnections are extended to an upper one of the controlled chips that not use the penetrating through interconnections and, as a result, all of the penetrating through interconnections have the same lengths as each other.02-03-2011
20110019458MEMORY CIRCUITS, SYSTEMS, AND METHODS FOR ROUTING THE MEMORY CIRCUITS - A memory circuit includes a first memory array. The first memory array includes at least one first memory cell for storing a first datum. The at least one first memory cell is coupled with a first word line and a second word line. A second memory array is coupled with the first memory array. The second memory array includes at least one second memory cell for storing a second datum. The at least one second memory cell is coupled with a third word line and a fourth word line. The first word line is coupled with the third word line. The first word line is misaligned from the third word line in a routing direction of the first word line in the first memory array.01-27-2011
20110019457Flash memory - A flash memory includes a controller unit and dies. The dies are connected to a controller unit. Each of the dies includes an upper face and a lower face. Each of the dies includes at least one power supply pad, at least one grounding pad, at least one input/output pad, selection pads and standby/busy pads on each of the upper and lower faces. The power supply pad is connected to the controller unit. The grounding pad is connected to the power supply pad in parallel. The input/output pad is connected to the grounding pad in parallel. The selection pads are connected to the controller unit and connected to one another with a wire that can be cut if so desired. The standby/busy pads are connected to the controller unit and connected to one another with a wire that can be cut if so desired.01-27-2011
20110026294INFORMATION RECORDING AND REPRODUCING DEVICE - According to one embodiment, an information recording and reproducing device includes a first layer, a second layer and a recording layer. The recording layer is provided between the first and second layers and is capable of reversibly transitioning between a first state and a second state with a resistance higher than in the first state. One of the first and second layers includes a resistivity distribution layer perpendicular to a stacking direction of the first and second layers, and the recording layer. The resistivity distribution layer includes a low and a high resistivity portion. Resistivity of the high resistivity portion is higher than resistivity of the low resistivity portion. The low resistivity portion contains a transition element identical to a transition element contained in the high resistivity portion.02-03-2011
20100177546SEMICONDUCTOR DEVICE - A semiconductor device includes a memory cell array area, a peripheral circuit area on a periphery of the memory cell array area, and a boundary area having a specific width between the memory cell array area and the peripheral circuit area, the memory cell array area including a cell area including nonvolatile semiconductor memory cells, linear wirings extending from inside of the cell area to an area outside the cell area, and lower layer wirings in a lower layer than the linear wirings in the boundary area and electrically connected to the linear wirings, and wiring widths of the lower layer wirings being larger than widths of the linear wirings, the peripheral circuit area including a patterns electrically connected to the linear wirings via the lower layer wirings, the boundary area failing to be provided with the linear wirings and a wiring in same layer as the linear wirings.07-15-2010
20110044085Serially Interfaced Random Access Memory - A serially interfaced massively parallel Random Access Memory (RAM) includes a matrix of control logic sections on one integrated circuit die, augmented by a switching matrix with an external interface to multiple high speed serial signaling means. A matrix, of the same dimension, of dense memory element arrays is implemented on a different integrated circuit die. One control logic section die and one or more others containing memory sections are joined by appropriate means to form one integrated circuit stack, implementing a matrix of independent memory units. The switching matrix translates command and data content encoded on the external signaling means bidirectionally between internal data and control signals and connects these signals to the control logic sections. Each independent memory unit ably performs atomic read-alter-writes to enable software mutual exclusion operations (MUTEXes). Each and every matrix may guard against defects by having additional rows and/or columns.02-24-2011
20100220510Optimized Selection of Memory Chips in Multi-Chips Memory Devices - A method includes accepting a definition of a type of multi-unit memory device (09-02-2010
20110085368Non-volatile memory device and method of manufacturing the same - The non-volatile memory device may include a substrate, a plurality of first signal lines on the substrate in a vertical direction, a plurality of memory cells having ends connected to the plurality of first signal lines, a plurality of second signal lines perpendicular to the plurality of first signal lines on the substrate and each connected to other ends of the plurality of memory cells, and a plurality of selection elements on the substrate and connected to at least two of the plurality of first signal lines.04-14-2011
20110085367SWITCHED MEMORY DEVICES - A data storage system includes a plurality of memory devices for storing data. The plurality of memory devices is classified into a plurality of groups of memory devices. A control circuit is adapted to provide concurrent memory access operations to the plurality of memory devices. Each of a plurality of data channels is configured to provide a data path between the control circuit and one of the groups of memory devices. A plurality of switches is configured to connect and disconnect one of the memory devices in a select one of the groups of memory devices to one of the plurality of data channels and concurrently connect and disconnect another of the memory devices in the select group of memory devices to a different one of the plurality of data channels.04-14-2011
20100135057MULTI-PORT MEMORY DEVICE HAVING SERIAL INPUT/OUTPUT INTERFACE - A multi-port memory device includes a first package ball out region in which a plurality of balls for a serial I/O interface part are arranged; and a second package ball out region in which a plurality of balls for a dynamic random access memory (DRAM) part are arranged.06-03-2010
20100135056SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device includes a memory cell array divided into a plurality of subarrays arranged in matrix form, the plurality of subarrays making up a plurality of subarray columns, an address pad column formed outside the memory cell array, the address pad column comprising a plurality of address pads that are arranged to be substantially parallel to the subarray columns, a data I/O pad column formed in a middle section of the memory cell array, the data I/O pad column comprising data I/O pads that are arranged to be substantially parallel to the subarray columns, an address input circuit arranged in the middle section of the memory cell array, and a pad input address line formed in a direction substantially perpendicular to the subarray columns on the memory cell array, the pad input address line directly connecting the address pad and the address input circuit.06-03-2010
20110249483STACKED MEMORY DEVICE HAVING INTER-CHIP CONNECTION UNIT, MEMORY SYSTEM INCLUDING THE SAME, AND METHOD OF COMPENSATING FOR DELAY TIME OF TRANSMISSION LINE - A stacked semiconductor memory device is provided which includes a first memory chip including a first transmission line, a second transmission line, and a logic circuit configured to execute a logic operation on a first signal of the first transmission line and a second signal of the second transmission line. The stacked semiconductor memory device further includes a second memory chip stacked over the first memory chip, an inter-chip connection unit electrically coupled between the second memory chip and the first transmission line of the first memory chip, and a dummy inter-chip connection unit electrically coupled to the second transmission line of the first memory chip and electrically isolated from the second memory chip.10-13-2011
20090027941SEMICONDUCTOR MEMORY DEVICE WITH POWER SUPPLY WIRING ON THE MOST UPPER LAYER - A memory cell array in a semiconductor substrate has a plurality of memory cells arranged in rows and columns. A first circuit is located at one end of the memory cell array in a column direction. A second circuit is located at the other end of the memory cell array in the column direction. A first wire is located above the memory cell array between the first circuit and the second circuit. The first wire is located in a most upper layer in the semiconductor substrate to supply power to the second circuit.01-29-2009
20110069526HIGH PERFORMANCE SOLID-STATE DRIVES AND METHODS THEREFOR - A nonvolatile storage device adapted for use with computers, workstations and other processing apparatuses. The storage device includes a printed circuit board, a nonvolatile memory array comprising at least two sub-arrays that contain nonvolatile solid-state memory devices, and control circuitry for interfacing with the processing apparatus. The control circuitry includes an abstraction layer and at least two memory control units configured to communicate data, address and control signals with the sub-arrays of the memory devices. A bus connects each memory control unit to a corresponding one of the sub-arrays. The control circuitry further includes a crossbar switch that functionally connects each memory control unit to the abstraction layer. The storage device is capable of overcoming limitations of current SSD designs by enabling independent read and write transfers (accesses) to the memory devices of the storage device, including concurrent read and write accesses.03-24-2011
20110069524SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device includes a control circuit. The control circuit applies a first voltage to a selected one of a upper interconnections, applies a second voltage to an unselected one of the upper interconnections, applies a third voltage to a first dummy upper interconnection and independently controls the first to third voltages to be set to different values.03-24-2011
20110069523Semiconductor memory device and multilayered chip semiconductor device - Disclosed here is a semiconductor memory device including: a semiconductor substrate; a plurality of pads formed on the semiconductor substrate and configured to permit data input and output; and a memory core block and an I/O block integrated on the semiconductor substrate. The data items are input and output to and from the plurality of pads at twice a maximum access rate in effect.03-24-2011
20110149629Semiconductor Memory Apparatus and Method of Operating the Same - A semiconductor memory apparatus comprises first and second memory blocks each comprising semiconductor elements coupled to first and second local line groups, a first switching circuit configured to couple a first global line group to the first local line group of the first memory block in response to a block selection signal, a second switching circuit configured to couple a second global line group to the second local line groups of the first and second memory blocks in response to the block selection signal, and a third switching circuit configured to couple the first global line group to the first local line group of the second memory block in response to the block selection signal.06-23-2011
20110249482SEMICONDUCTOR MEMORY DEVICE - According to one embodiment, a semiconductor memory device includes a first active area in a semiconductor substrate, memory cells on the semiconductor substrate, first bit lines, first line, a second line, a third line, and a fourth line. The first line extends in a direction that intersects with the first bit lines and transmits a control potential applied to unselected ones of second bit lines connected to the memory cells. The second line is electrically connected to the first line and extends along the first bit lines. The third line is electrically connected to the second line and extends in a direction that intersects with the first bit lines. The fourth line electrically connects both the third line and portions in the active area corresponding to nodes to which the control potential is applied.10-13-2011
20100259963Data line layouts - A data line layout includes column selection lines arranged in a first direction at a layer on a memory cell array region, and data lines arranged in the first direction at the layer, the data lines being connected between I/O sense amplifiers and I/O pads.10-14-2010
20080247212MEMORY SYSTEM HAVING POINT-TO-POINT (PTP) AND POINT-TO-TWO-POINT (PTTP) LINKS BETWEEN DEVICES - A memory system has first and second primary memories and first and second secondary memories coupled to the first and second primary memories, respectively, the coupling comprising at least one point-to-point connection. A memory module includes at least two of the first and second primary and first and second secondary memories. A first connection element, such as a connector or solder, connects the memory module to a mother board. A second connection element, such as a connector or solder, connects at least one other of the first and second primary and first and second secondary memories to the mother board. At least one of the memories on the first memory module is coupled to at least one of the other memories. The memory system also includes a memory controller which is connected to the primary memories by a point-to-two-point link.10-09-2008
20090021974SEMICONDUCTOR DEVICE - A semiconductor device where multiple chips of identical design can be stacked, and the spacer and interposer eliminated, to improve three-dimensional coupling information transmission capability. A first semiconductor circuit including a three-dimensional coupling circuit (three-dimensional coupling transmission terminal group and three-dimensional coupling receiver terminal group); and a second semiconductor integrated circuit including a three-dimensional coupling circuit and feed-through electrode (power supply via hole and ground via hole); and a third semiconductor integrated circuit including a three-dimensional coupling circuit and feed-through electrode are stacked on the package substrate.01-22-2009
20090021973SEMICONDUCTOR MEMORY DEVICE - Subarrays, which constitute a memory cell array, each include a bit line driving transistor having a drain connected to a bit line, a source is connected to an interconnection having a power supply potential, and a gate is connected to a sub-bit line. The plurality of memory cells are each provided in such away that a gate is connected to a word line, a source is grounded, and whether a drain is connected to the sub-bit line or not is selected in correspondence to data to be stored. Transmission transistors each have a gate connected to the bit line, a source connected to a loading transistor section, and a drain connected to the sub-bit line.01-22-2009
20090097298Integrated Circuit, Memory Cell, Memory Module, Method of Operating an Integrated Circuit, and Method of Manufacturing a Memory Cell - According to one embodiment of the present invention, an integrated circuit includes an arrangement of memory cells. Each memory cell is connected to a programming current path used for programming the memory cell, and a sensing current path used for sensing the memory state of the memory cell. The programming current path and the sensing current path are at least partly separated from each other.04-16-2009
20110255323MEMORY/LOGIC CONJUGATE SYSTEM - There is a problem that a bandwidth bottleneck occurs because a crossbar switch is used to cope with an increase in scale. In an example of a memory/logic conjugate system according to the present invention, a plurality of cluster memory chips each including a plurality of cluster memories 10-20-2011
20100309708SEMICONDUCTOR MEMORY - Borderless contacts for word lines or via contacts for bit lines are formed using interconnect patterns, a part of which is removed. A semiconductor memory includes: a plurality of active regions AA12-09-2010
20120201068STACKED SEMICONDUCTOR DEVICE - A stacked semiconductor device is disclosed that includes a plurality of semiconductor dies. Each die has oppositely disposed first and second surfaces, with pads formed on each of the surfaces. A plurality of through-vias connect respective pads on the first surface to respective pads on the second surface. The through-vias include a first group of through-vias coupled to respective I/O circuitry on the semiconductor die and a second group of through-vias not coupled to I/O circuitry on the semiconductor die. The plurality of semiconductor dies are stacked such that the first group of through-vias in a first one of the plurality of semiconductor dies are aligned with respective ones of at least a portion of the second group of through-vias in a second one of the plurality of semiconductor dies.08-09-2012
20110026292Semiconductor device having hierarchically structured bit lines and system including the same - To include memory mats each including a sense amplifier that amplifies a potential difference between global bit lines, a plurality of hierarchy switches connected to the global bit lines, and a plurality of local bit lines connected to the global bit lines via the hierarchy switches, and a control circuit that activates the hierarchy switches. The control circuit activates hierarchy switches that are located in the same distance from the sense amplifier along the global bit lines. According to the present invention, because there is no difference in the parasitic CR distributed constant regardless of a local bit line to be selected, it is possible to prevent the sensing sensitivity from being degraded.02-03-2011
20110069525NONVOLATILE MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME - According to one embodiment, a nonvolatile memory device includes a memory cell. The memory cell is connected to a first interconnection and a second interconnection and includes a plurality of layers. The plurality of layers includes a memory layer and a carbon nanotube-containing layer which is in contact with the memory layer and contains a plurality of carbon nanotubes.03-24-2011
20110134678Semiconductor device having hierarchical structured bit line - A sense operation with respect to simultaneously-accessed two memory cells is performed by time division by using two sense amplifiers, and thereafter restore operations are performed simultaneously. With this arrangement, it is not necessary to provide switches in the middle of global bit lines, and no problem occurs when performing the restore operation by time division. Further, because a parasitic CR model of a first sense amplifier and that of a second sense amplifier become mutually the same, high sensitivity can be maintained.06-09-2011
20100302830SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device having a number of chips, each of the chips including a chip enable detection unit configured to simultaneously output a first signal and a second signal in response to a chip enable signal, a chip operation detection unit configured to output an operation state signal in response to the first signal, and an internal circuit configured to operate in response to a power source voltage and a control signal in response to the second signal being received.12-02-2010
20110096584SEMICONDUCTOR DEVICE HAVING OPEN BIT LINE ARCHITECTURE - When an I/O number is 8 bit, a semiconductor device includes a first memory mat that is selected when X04-28-2011
20100214814SEMICONDUCTOR MEMORY DEVICE, MEMORY DEVICE SUPPORT AND MEMORY MODULE - In one embodiment, the semiconductor memory device includes at least a first semiconductor memory die, and a surface of the semiconductor memory device includes a plurality of connectors. At least one of the plurality of connectors is electrically connected to the first semiconductor memory die. The plurality of connectors include at least first and second control signal connectors. The first control signal connector is for a first control signal of a first type, the second control signal connector is for a second control signal of the first type, and the first and second control signal connectors are disposed in different areas of the surface. For example, the first type may be a chip select signal, a clock enable signal, or an on die termination enable signal.08-26-2010
20100165694Memory Cell Array - Disclosed is a memory cell array including: word lines and first and second bit lines respectively connected to memory cells, wherein each memory cell includes a MOS transistor and a switching element formed inside a contact hole, the switching element includes first and second conductive layers and a gap in which a resistance value is changed by applying a predetermined voltage, each word line is connected to a gate electrode, each first bit line is connected to a second electrode, each second bit line is connected to the second conductive layer, and data is written by supplying a write voltage to the first bit line connected to the selected memory cell and specifying the word line connected to the memory cell, and data is read by supplying a read voltage to the first bit lines connected to the memory cell and specifying the word line connected to the memory cells.07-01-2010
20100165695Memory Cell Array - Disclosed is a memory cell array including word and first bit lines and second bit lines respectively connected to memory cells, wherein each memory cell includes a MOS transistor and switching element having first and second conductive layers and a gap in which a resistance value changes by applying a predetermined voltage, and data is written by specifying the first bit line to connect it to a ground, specifying the word line and supplying a write voltage to the second bit lines, and read by specifying the first bit line to connect it to the sense amplifier, specifying the word line and supplying a read voltage lower than the write voltage to the second bit lines, and the word line is specified when the word line voltage becomes a gate threshold value voltage or more and a sum of a drive voltage and the gate threshold value voltage or less.07-01-2010
20120206954SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE - There is a need to provide a semiconductor device and an electronic device capable of easily allowing a bypass capacitor to always improve noise suppression on a signal path in order to transmit a reference potential between chips in different power supply noise states. There is provided a specified signal path that connects a control chip and a memory chip mounted on a mounting substrate and transmits a reference potential generated from the control chip. A bypass capacitor is connected to the specified signal path only at a connecting part where a distance from a reference potential pad of the memory chip to the connecting part along the specified signal path is shorter than a distance from a reference potential pad of the control chip to the connecting part along the specified signal path.08-16-2012
20100067280CHARGE MAPPING MEMORY ARRAY FORMED OF MATERIALS WITH MUTABLE ELECTRICAL CHARACTERISTICS - A memory cell array including a data line; a capacitor; and a transistor coupled between the data line and the capacitor. At least one of the capacitor and the transistor includes a material with a mutable electrical characteristic.03-18-2010
20100195364Semiconductor device - The invention provides a semiconductor device having, in each of stacked chip dies, not only vias the number of which corresponds to the number of signals input to and output from a single chip die but also vias the number of which corresponds to the number of signals input to and output from the stacked chip dies, and switches for controlling the input and output to and from the vias. The conduction and non-conduction of the switches are controlled by means of ROMs, whereby signals from the plurality of chip dies stacked can be output in parallel. This eliminates the need of increasing the data transfer speed of each chip die in accordance with the transfer speed of the system.08-05-2010
20100061134MEMORY DEVICE INTERFACE METHODS, APPARATUS, AND SYSTEMS - Apparatus and systems may include a substrate and a first memory device coupled to the substrate using a through wafer interconnect (TWI). An example may include an interface chip having a via to accommodate connection of the memory device to the substrate. Other apparatus, systems, and methods are disclosed.03-11-2010
20110188286ELECTROMECHANICAL MEMORY DEVICES AND METHODS OF MANUFACTURING THE SAME - In a memory device and a method of forming the same, in one embodiment, the memory device comprises a first word line structure on a substrate, the first word line structure extending in a first direction. A bit line is provided over the first word line structure and spaced apart from the first word line by a first gap, the bit line extending in a second direction transverse to the first direction. A second word line structure is provided over the bit line and spaced apart from the bit line by a second gap, the second word line structure extending in the first direction. The bit line is suspended between the first word line structure and the second word line structure such that the bit line deflects to be electrically coupled with a top portion of the first word line structure through the first gap in a first bent position and deflects to be electrically coupled with a bottom portion of the second word line structure through the second gap in a second bent position, and is isolated from the first word line structure and the second word line structure in a rest position.08-04-2011
20110188285PERMANENT SOLID STATE MEMORY - A permanent solid state memory device is disclosed. Recording data in the permanent solid state memory device forms voids in a data layer between a first wire array and a second wire array. Wires of the first wire array extend transversely to wires in the second wire array. The data layer is at least partially conductive such that a voltage applied between a selected first wire in the first wire array and a selected second wire in the second wire array creates a heating current through the data layer at a data point between the first wire and the second wire. The heating current causes a data layer material to melt and recede to form a permanent void. Control elements are operably connected to apply voltages to predetermined combinations of wires to form permanent voids at data points throughout the solid state memory device.08-04-2011
20110164446APPARATUS AND METHODS FOR A PHYSICAL LAYOUT OF SIMULTANEOUSLY SUB-ACCESSIBLE MEMORY MODULES - A layout for simultaneously sub-accessible memory modules is disclosed. In one embodiment, a memory module includes a printed circuit board having a plurality of sectors, each sector being electrically isolated from the other sectors and having a multi-layer structure. At least one memory device is attached to each sector, the memory devices being organized into a plurality of memory ranks. A driver is attached to the printed circuit board and is operatively coupled to the memory ranks. The driver is adapted to be coupled to a memory interface of the computer system. Because the sectors are electrically-isolated from adjacent sectors, the memory ranks are either individually or simultaneously, or both individually and simultaneously accessible by the driver so that one or more memory devices on a particular sector may be accessed at one time. In an alternate embodiment, the printed circuit board includes a driver sector electrically isolated from the other sectors and having a multi-layer structure, the driver being attached to the driver sector.07-07-2011
20090175063SEMICONDUCTOR MEMORY DEVICE INCLUDING MEMORY CELL ARRAY HAVING MEMORY CELLS USING FLOATING BODY TRANSISTORS - A semiconductor memory device includes a memory cell array, which includes a cell array having multiple cell blocks. Each cell block includes source and word lines arranged in one direction, bit lines arranged in a perpendicular direction, and memory cells having corresponding floating bodies. Adjacent memory cells share source or drain regions to form common source or drain regions, respectively. The source regions are arranged in a word line direction and connected to corresponding source lines, and the drain regions are arranged in the bit line direction and connected to corresponding bit lines. Gates of the memory cells are arranged in the word line direction and are connected to form the word lines. The source lines are formed on a layer of the word lines, and the bit lines are formed at a different layer to be insulated from the word and source lines.07-09-2009
20100027309SEMICONDUCTOR MEMORY DEVICE INCLUDING PLURALITY OF MEMORY CHIPS - A semiconductor memory device includes a plurality of memory chips each including a chip identification (ID) generation circuit. The chip ID generation circuits of the respective memory chips are operatively connected together in a cascade configuration, and the chip ID generation circuits are activated in response to application of a power supply voltage the memory device to sequentially generate respective chip ID numbers of the plurality of device chips02-04-2010
20100020585METHODS AND APPARATUS OF STACKING DRAMS - Large capacity memory systems are constructed using stacked memory integrated circuits or chips. The stacked memory chips are constructed in such a way that eliminates problems such as signal integrity while still meeting current and future memory standards.01-28-2010
20120307544SEMICONDUCTOR MEMORY APPARATUS - A semiconductor memory apparatus includes a boundary circuit unit positioned between a low voltage page buffer and a high voltage page buffer and having circuits configured to electrically couple the low voltage page buffer and the high voltage page buffer. The boundary circuit unit includes: a first boundary circuit unit having first and second transistors configured to receive data of a corresponding memory cell area through a signal transmission line selected from a plurality of signal transmission lines extended and arranged along a first direction for each column; a second boundary circuit unit disposed adjacent in the first direction from the first boundary circuit unit and having the plurality of signal transmission lines extended and arranged thereon; and an active region where the first transistor is formed and an active region where the second transistor is formed are isolated from each other.12-06-2012
20110305060WIRING SUBSTRATE IN WHICH EQUAL-LENGTH WIRES ARE FORMED - In a wiring substrate, a double data rate (DDR) memory and a memory controller controlling the DDR memory are mounted. Further, in the wiring substrate, plural equal-length wires connecting the DDR memory and the memory controller are formed. The plural equal-length wires include a differential transmission line, such as a clock wire transmitting a clock signal, which is connected via a common mode choke coil. The differential transmission line may have a wire length shorter than a wire length of another equal-length wire, by a wire length corresponding to delay time of a transmission signal due to the common mode choke coil.12-15-2011
20120039104METHOD AND APPARATUS FOR BURIED WORD LINE FORMATION - An integrated circuit with a memory cell is disclosed. The integrated circuit with a memory cell includes: a word line disposed in a word line trench of a substrate; a bit line disposed below the word line in a bit line trench and extending orthogonal to the word line; and, a separating layer disposed above the bit line in the bit line trench that separates the word line from the bit line; wherein an etching rate of the separating layer approaches that of the substrate.02-16-2012
20120044735STRUCTURES WITH INCREASED PHOTO-ALIGNMENT MARGINS - Methods and structures are provided for increasing alignment margins when contacting pitch multiplied interconnect lines with other conductive features in memory devices. The portions of the lines at the periphery of the memory device are formed at an angle and are widened relative to the portions of the lines in the array region of the memory device. The widened lines allow for an increased margin of error when overlaying other features, such as landing pads, on the lines. The possibility of contacting and causing electrical shorts with adjacent lines is thus minimized. In addition, forming the portions of the lines in the periphery at an angle relative to the portions of the lines in the array regions allows the peripheral portions to be widened while also allowing multiple landing pads to be densely packed at the periphery.02-23-2012
20110063884STRUCTURE AND METHOD FOR BACKING UP AND RESTITUTION OF DATA - A structure and a method for backing up and restitution of data allowing management of a memory space. The backup and restitution structure includes a matrix of connectors distributed in line and in column, on said matrix. Each connector of one line is connected to its two adjacent connectors. Each connector of one column is connected to its two adjacent connectors. Each line of connectors is connected to a memory of the first-in, first-out type, by a connector situated at one end of the line. Each column of connectors is connected to an input and, or output port of a data stream of the structure by a connector situated at one end of the column. Each connector propagates a data stream. An embodiment is suitable for an onboard computing system including a component, associating a computing structure and a memory space produced for example on one electronic circuit board.03-17-2011
20120206953MEMORY EDGE CELL - A circuit comprises a first PMOS transistor, a second PMOS transistor, a first NMOS transistor, a second NMOS transistor, a third NMOS transistor, and a fourth NMOS transistor. The PMOS transistors and the NMOS transistors are configured to provide a first voltage reference node having a first reference voltage and a second voltage reference node having a second reference voltage. The first reference voltage and the second reference voltage serve as a first reference voltage and a second reference voltage for a memory cell, respectively.08-16-2012
20110157950MEMORY CHIPS AND JUDGEMENT CIRCUITS THEREOF - A memory chip is provided. The memory chip operates at modes and includes an option pad and a judgment circuit. The judgment circuit is coupled to the option pad generates a judgment signal according to the current status of the option pad. The judgment signal indicates which mode the memory chip is operating at. The judgment circuit includes a detection unit and a sampling unit. The detection unit is coupled to a first voltage source and the option pad and further controlled by a control signal to generate at least one detection signal according to the current status of the option pad. The sampling unit samples the at least one detection signal after the control signal is asserted to generate the judgment signal. When the control signal is asserted, a level of the at least one detection signal is varied by a voltage provided by the first voltage source.06-30-2011
20110317465Methods and Systems for Reducing Heat Flux in Memory Systems - The memory module includes front and back faces. Multiple devices are disposed on each of the faces. A first control line serially connects a first group of devices on both the front and back faces so that the first group of devices commonly contribute multiple bits to a data bus. A second control line serially connects a second group of devices on both the front and back faces so that the second group of devices commonly contribute multiple bits to a data bus.12-29-2011
20120044734BIT LINE SENSE AMPLIFIER LAYOUT ARRAY, LAYOUT METHOD, AND APPARATUS HAVING THE SAME - A bit line sense amplifier layout array includes N sense amplifier layout regions, which are arranged adjacent each other and have a sense amplifier, respectively. (N+1−i) bit lines and i complementary bit lines are arranged in an i02-23-2012
20120002456METHOD OF ARRANGING PADS IN SEMICONDUCTOR DEVICE, SEMICONDUCTOR MEMORY DEVICE USING THE METHOD, AND PROCESSING SYSTEM HAVING MOUNTED THEREIN THE SEMICONDUCTOR MEMORY DEVICE - A method of arranging pads in a semiconductor memory device, the semiconductor memory device using the method, and a processing system having mounted therein the semiconductor memory device. The method includes classifying pads provided in a memory chip of the semiconductor memory device into monitoring pads configured for a memory chip test on a wafer, a package pads configured for wire connection in a package, and common pads configured for both the memory chip test on the wafer and wire connection in the package and arranging the monitoring pads and the package pads separately in columns on the memory chip.01-05-2012
20090257262DRAM AND MEMORY ARRAY - A dynamic random access memory (DRAM) includes a substrate, a plurality of bit lines, a plurality of word lines, a plurality of recess channels, a plurality of conductive plugs and a plurality of trench capacitors. In the DRAM, the bit lines are disposed on the substrate in a first direction, and the word lines are disposed on the bit lines in a second direction. Each recess channel is in the substrate between two bit lines below the word line, and each conductive plug connects each recess channel and the word lines. Each trench capacitor is disposed in the substrate between two bit lines where the recess channels are not formed. Because the word lines can be electrically connected with the recess channels directly without using an additional chip area, the WL access time can be accelerated without an increase of the chip size.10-15-2009
20120113705CONFIGURABLE INPUTS AND OUTPUTS FOR MEMORY STACKING SYSTEM AND METHOD - Embodiments of the present invention relate to configurable inputs and/or outputs for memory and memory stacking applications in processor-based systems. More specifically, embodiments of the present invention include processor-based systems with volatile-memory having memory devices that include a die having a circuit configured for enablement by a particular signal, an input pin configured to receive the particular signal, and a path selector configured to selectively designate a signal path to the circuit from the input pin.05-10-2012
20120300529SEMICONDUCTOR DEVICE HAVING HIERARCHICALLY STRUCTURED BIT LINES AND SYSTEM INCLUDING THE SAME - A device includes a first sense amplifier array including a plurality of first sense amplifiers arranged in a first direction, each of the first sense amplifiers including first and second nodes, a plurality of first global bit lines extending in a second direction crossing the first direction, the first global bit lines being arranged in the first direction on a left side of the first sense amplifier array so that the first global bit lines being operatively connected to the first node of an associated one of the first sense amplifiers, and a plurality of second global bit lines extending in the second direction, the second global bit lines being arranged in the first direction on a right side of the first sense amplifier array so that the second global bit lines being operatively connected to the second node of the associated one of the first sense amplifiers.11-29-2012
20120106227INTEGRATED CIRCUIT - An integrated circuit includes a normal data storage unit configured to store normal data and output the stored normal data in response to a write command, a read command, and an address signal in a normal operation mode, a test data storage unit configured to store the address signal as test data in response to the write command in a test operation mode, and output the stored test data in response to the read command, and a connection selection unit configured to selectively connect a data input/output terminal of the normal data storage unit or a data output terminal of the test data storage unit to a global line based on whether the integrated circuit is in a first or second one of the normal operation mode and the test operation mode, respectively.05-03-2012
20110103124SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device has: memory blocks; and a local bus connected to the memory blocks. Each memory block has: switches respectively provided between bit line pairs and the local bus and each of which is turned ON in response to a selection signal; a dummy local bus; first and second control circuits. The local bus and the dummy local bus are precharged to a first potential before a read operation. In the read operation, the first control circuit outputs the selection signal to a selected switch to electrically connect a selected bit line pair and the local bus, while the second control circuit supplies a second potential lower than the first potential to the dummy local bus. The first control circuit stops outputting the selection signal when a potential of the dummy local bus is decreased to a predetermined set potential that is between the first and second potentials.05-05-2011
20110103123SEMICONDUCTOR DEVICE - Disclosed is a semiconductor device including: a first switch controlling connection between a first data line pair a second data line pair; a first amplifier connected to the first data line pair; a second switch controlling the connection between the second data line pair and a third data line pair; a second amplifier amplifying data on the second data line pair and delivering the amplified data to the third data line pair; a third amplifier connected to the third data line pair; and a switch control circuit controlling the second switch. Based upon a first control signal that controls precharging and equalization of the first data line pair, the switch control circuit renders the second switch conductive when precharging and equalization of the first data line pair is not carried out, and renders the second switch non-conductive when precharging and equalization of the first data line pair is carried out.05-05-2011
20100091543SEMICONDUCTOR MEMORY APPARATUS INCLUDING A COUPLING CONTROL SECTION - A semiconductor memory apparatus is disclosed having a dual open bit line structure In the dual open bit line structure, bit lines or bit line bars are each arranged side by side in adjoining cell mats. The semiconductor memory apparatus includes a coupling control section connected between at least one pair of adjoining bit lines or at least one pair of adjoining bit line bars and is driven by a bit line equalize signal. The coupling control section prevents a coupling phenomenon from occurring between pairs of bit lines and bit line bars.04-15-2010
20100091542Memory Module Having a Memory Device Configurable to Different Data Pin Configurations - A memory module includes a memory device having a plurality of data pins and conductive lines electrically connected to the plurality of data pins. The memory device is configurable, using at least one input to the memory device, to a data pin configuration selected from among a plurality of different data pin configurations. The plurality of different data pin configurations include a first data pin configuration that uses a first number of data pins of the memory device, and a second data pin configuration that uses a second, different number of data pins.04-15-2010
20120250388VARIABLE MEMORY REFRESH DEVICES AND METHODS - Memory devices and methods are described such as those that monitor and adjust characteristics for various different portions of a given memory device. Examples of different portions include tiles, or arrays, or dies. One memory device and method described includes monitoring and adjusting characteristics of different portions of a 3D stack of memory dies. One characteristic that can be adjusted at multiple selected portions includes refresh rate.10-04-2012
20120127774SEMICONDUCTOR DEVICE AND ELECTRONIC DEVICE - All interface pins for transmitting and receiving a signal having a predetermined function of a semiconductor integrated circuit element are formed on an outer periphery of the semiconductor integrated circuit element along one side of the semiconductor integrated circuit element. The one side of the semiconductor integrated circuit element is adjacent to two of sides of a BGA substrate, the two sides being not parallel to the one side. Of balls provided on the BGA substrate, balls electrically connected to the interface pins for transmitting and receiving a signal having a predetermined function are provided between the one side of the semiconductor integrated circuit element and the two sides of the BGA substrate.05-24-2012
20120134194BRIDGE DEVICE ARCHITECTURE FOR CONNECTING DISCRETE MEMORY DEVICES TO A SYSTEM - A bridge device architecture for connecting discrete memory devices. The bridge device is used in conjunction with a composite memory device including at least one discrete memory device. The bridge device includes a local control interface for connecting to the at least one discrete memory device, a local input/output interface for connecting to the at least one discrete memory device, and a global input/output interface. The global input/output interface receives and provides global memory control signals and also receives and provides write data to and read data from the at least one discrete memory device.05-31-2012
20090059642Memory Controller With Multi-Modal Reference Pad - A memory controller operates in two modes to support different types of memory devices. In a first mode, the memory controller distributes a dedicated reference voltage with each of a plurality of signal bundles to a corresponding plurality of memory devices. The reference voltages are conveyed using pads that are alternatively used for e.g. timing-reference signals in a second mode, so the provision for bundle-specific reference voltages need not increase the number of pads on the memory controller.03-05-2009
20090059641MEMORY DEVICE INTERFACE METHODS, APPARATUS, AND SYSTEMS - Apparatus and systems may include a substrate, an interface chip disposed on the substrate, a first memory die having a plurality of memory arrays disposed on the interface chip, the first memory die coupled to a plurality of through wafer interconnects (TWI), and a second memory die having a plurality of memory arrays disposed on the first memory die, the second memory die including a plurality of vias, wherein the plurality of vias are configured to allow the plurality of TWI to pass through the second memory die. The second memory die may be coupled to a second plurality of TWI. In this way, the interface chip may be used to communicatively couple the first memory die and the second memory die using the first and second plurality of TWI. Other apparatus, systems, and methods are disclosed.03-05-2009
20120212990SEMICONDUCTOR APPARATUS - A semiconductor apparatus includes a multi-chip module which multi-chip module comprises a first and a second chips. The semiconductor apparatus comprises a first data line in the first chip to carry first read data; a first controller, in the first chip, configured to generate first output data on a first output data line in the first chip based on the first read data transmitted from the first data line; a first data transmitter configured to electrically connect the first output data line to the second chip.08-23-2012
20120218805Configurable Memory Array - Embodiments disclosed include a memory array having a plurality of bit lines and a plurality of source lines disposed in columns. A plurality of word lines is disposed in rows. A plurality of storage elements have a first subset of storage elements electrically decoupled from the memory array and a second subset of storage elements coupled to the memory array. The memory array further includes a plurality of bit cells, each including one storage element from the second subset of storage elements coupled to at least two transistors. The bit cells are coupled to the plurality of bit lines and the plurality source lines. Each transistor is coupled to one word line. The memory array can further include logic to select a high performance mode and a high density mode.08-30-2012
20120262976SEMICONDUCTOR STORAGE DEVICE - When plural diffusion layers are shared in order to save an area of a semiconductor integrated circuit, parasitic capacities of wirings coupled to those diffusion layers are changed. Nonetheless, a semiconductor layout balancing capacitive loads of paired wirings coupled to the diffusion layers with each other is provided. The diffusion layers coupled to the respective paired wirings are alternately arranged or staggered to balance the respective capacitive loads of the paired wirings with each other.10-18-2012
20120262977MEMORY MODULES AND MEMORY DEVICES HAVING MEMORY DEVICE STACKS, AND METHOD OF FORMING SAME - A memory module, system and method of forming the same includes a memory module including a plurality of memory devices having a first portion of memory devices cooperatively forming a first rank of memory devices and a second portion of memory devices cooperatively forming a second rank of memory devices. The first and second portions of memory devices are grouped into a plurality of memory device stacks, wherein each of the plurality of memory device stacks includes at least one of the plurality of memory devices coupled to a first portion of a plurality of DQ signals and at least another one of the plurality of memory devices coupled to a different second portion of the plurality of DQ signals.10-18-2012
20120081941SEMICONDUCTOR MEMORY DEVICE HAVING AN ELECTRICALLY FLOATING BODY TRANSISTOR - A semiconductor memory cell is formed in a semiconductor. The semiconductor memory cell includes: a floating body region defining at least a portion of a surface of the semiconductor memory cell, the floating body region having a first conductivity type; and a buried region located within the semiconductor memory cell and located adjacent to the floating body region, wherein the buried region has a second conductivity type.04-05-2012
20120320654SEMICONDUCTOR SYSTEM - A system that includes a first semiconductor chip, a second semiconductor chip, and a controller chip. The first semiconductor chip includes a first terminal, a second terminal, a first circuit electrically coupled to the second terminal, a second circuit electrically coupled to the first terminal and the first circuit, and a third circuit electrically coupled to the second circuit. The second semiconductor chip includes a third terminal, a fourth terminal, a fourth circuit electrically coupled to the fourth terminal, a fifth circuit electrically coupled to the third terminal and the fourth circuit, and a sixth circuit electrically coupled to the fifth circuit.12-20-2012
20120320653SEMICONDUCTOR SYSTEM - A device that includes a first semiconductor chip and a second semiconductor chip. The first semiconductor chip includes a first terminal, a second terminal, a first circuit electrically coupled to the second terminal, a second circuit electrically coupled to the first terminal and the first circuit, and a third circuit electrically coupled to the second circuit. The second semiconductor chip includes a third terminal, a fourth terminal, a fourth circuit electrically coupled to the fourth terminal, a fifth circuit electrically coupled to the third terminal and the fourth circuit, and a sixth circuit electrically coupled to the fifth circuit.12-20-2012
20120320652SEMICONDUCTOR MEMORY DEVICE - According to an embodiment, a semiconductor memory device comprises: a semiconductor substrate; a memory cell array configured having a plurality of memory units, each of the memory units including a plurality of memory cells connected in series, the plurality of memory cells being stacked, the plurality of memory units involving a first memory unit and a second memory unit; and a plurality of bit lines connected to ends of each of the memory units in the memory cell array. The first memory unit and the second memory unit are arranged in a staggered manner by the first memory unit being displaced in a row direction with respect to the second memory unit by an amount less than an arrangement pitch in a row direction of the first memory unit or the second memory unit.12-20-2012
20110038194SEMICONDUCTOR STORAGE DEVICE - According to one embodiment, a semiconductor storage device includes a plurality of parallel first interconnects extending in a first direction, a plurality of parallel second interconnects which extend in a second direction perpendicular to the first direction and which make a two-level crossing with respect to the first interconnects, and memory cell structures provided in regions where the first interconnects and the second interconnects make two-level crossings, the memory cell structures being connected on one end to the first interconnects and connected on the other end to the second interconnects, the memory cell structure including a variable resistive element and a non-ohmic element which are connected in series, wherein the endmost first interconnect is disconnected in at least one portion.02-17-2011
20120268978SEMICONDUCTOR MEMORY DEVICE IN WHICH CAPACITANCE BETWEEN BIT LINES IS REDUCED, AND METHOD OF MANUFACTURING THE SAME - According to one embodiment, a semiconductor memory device includes a plurality of memory cells arranged in a matrix, a plurality of word lines for selecting a plurality of memory cells, and a plurality of bit lines for selecting a plurality of memory cells. Of the plurality of bit lines, first bit lines and second bit lines are arranged in different layers.10-25-2012
20110255324SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE CAPABLE OF SECURING GATE PERFORMANCE AND CHANNEL LENGTH - A semiconductor integrated circuit device includes a semiconductor substrate; a plurality of word lines extending parallel to one another on the semiconductor substrate; a plurality of bit lines extending parallel to one another on the semiconductor substrate, arranged to cross with the word lines, and delimiting a plurality of crossing regions where the word lines intersect the bit lines and a plurality of unit memory cell regions with each cell region bounded by an adjacent pair of the word lines and an adjacent pair of the bit lines; and gate electrodes for the respective unit memory cell regions, each gate electrode electrically connected with any one of a pair of word lines which delimit a corresponding unit memory cell, and formed such that at least a portion of the gate electrode is bent toward a bit line direction.10-20-2011
20110267866EXTENSIBLE THREE DIMENSIONAL CIRCUIT HAVING PARALLEL ARRAY CHANNELS - An extensible three dimensional circuit having parallel array channels includes an access layer and crossbar array layers overlying the access layer and being electrically connected to the access layer. The crossbar array layers include parallel channels, the parallel channels being formed from two classes of vias, the first class being pillar vias connected to relatively short stub lines, and the second class being traveling-line vias connected to long lines that travel away from the via; pillar vias and traveling-line vias being configured to connect to crossing lines such that each crossing point between the lines is uniquely addressed by one pillar via and one traveling-line via. Programmable crosspoint devices are disposed between the crossing lines.11-03-2011
20110305058NONVOLATILE MEMORY DEVICE AND METHOD OF FABRICATING SAME - A nonvolatile memory device includes multiple variable resistive elements formed on a substrate; multiple bit lines formed on the variable resistive elements, extended in a first direction, and separated from each other by a first pitch; multiple circuit word lines formed on the multiple bit lines, extended in a second direction, and separated from each other by a second pitch; and multiple circuit word lines formed on the multiple bit lines, extended in the first direction, and separated from each other by a third pitch, wherein the third pitch of the multiple circuit word lines is larger than the first pitch of the multiple bit lines.12-15-2011
20120327697DISTRIBUTED FLASH MEMORY STORAGE MANAGER SYSTEMS - A flash memory storage system may include several modules of flash memory storage manager circuitry, each having some associated flash memory. The modules may be interconnected via the flash memory storage manager circuitry of the modules. The system may be able to write data to and/or read data from the flash memory associated with various ones of the modules by routing the data through the flash memory storage circuitry of the modules. The system may also be able to relocate data for various reasons using such read and write operations. The flash memory storage circuitry of the modules keeps track of where data actually is in the flash memory.12-27-2012
20120287694THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE - An embodiment is directed to a method of fabricating a semiconductor memory device, the method including preparing a substrate having a cell array region and a contact region, forming a thin film structure on the substrate, including forming sacrificial film patterns isolated horizontally by a lower isolation region, the lower isolation region traversing the cell array region and the contact region, and forming sacrificial films sequentially stacked on the sacrificial film patterns, and forming an opening that penetrates the thin film structure to expose the lower isolation region of the cell array region, the opening being restrictively formed in the cell array region.11-15-2012
20100202182MEMORY DEVICES, SYSTEMS AND METHODS USING MULTIPLE 1/N PAGE ARRAYS AND MULTIPLE WRITE/READ CIRCUITS - A memory device architecture includes N arrays respectively for storing a 1/N of a page and N write/read circuits, where N is a natural number, respectively for writing or reading a 1/N of the page to/from each of the N arrays.08-12-2010
20100202181SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device includes a semiconductor substrate on which memory cells are formed. Interconnects are arranged along a first direction above the semiconductor substrate, and have regular intervals along a second direction perpendicular to the first direction. Interconnect contacts connect the interconnects and the semiconductor substrate, are arranged on three or more rows. The center of each of two of the interconnect contacts which are connected to the interconnects adjacent in the second direction deviate from each other along the first direction.08-12-2010
20130010516MEMORY CHIP WITH MORE THAN ONE TYPE OF MEMORY CELL - A semiconductor memory chip that has word lines driven by respective word line drivers and bit lines to carry signals to respective bit line amplifiers/drivers with memory cells at intersections of the word lines and bit lines memory cells. The semiconductor memory chip including various memory cell types, the type of memory cell at an intersection based on a position of the intersection among the word lines and bit lines.01-10-2013
20130010517SELF-DISABLING CHIP ENABLE INPUT - A multi-die memory package may have separate chip enable inputs for the respective memory dice. Individual chip enable inputs may be separated by other chip connections such as power and ground. The memory dice may include multiple chip enable inputs to allow easy wire bonding of the individual chip enable inputs to a die without requiring any jumpers within the package. Circuitry may be included so that undriven chip enable inputs are masked and driven chip enable inputs may be propagated to the memory die to enable memory accesses while a single chip enable input is only connected to the capacitance of a single bonding pad.01-10-2013
20120147651THREE DIMENSIONAL NON-VOLATILE STORAGE WITH DUAL LAYERS OF SELECT DEVICES - A three-dimensional array adapted for memory elements that reversibly change a level of electrical conductance in response to a voltage difference being applied across them. Memory elements are formed across a plurality of planes positioned different distances above a semiconductor substrate. Bit lines to which the memory elements of all planes are connected are oriented vertically from the substrate and through the plurality of planes.06-14-2012
20110157953MEMORY DEVICE HAVING DATA PATHS - Apparatus and methods are disclosed, such as those involving array/port consolidation and/or swapping. One such apparatus includes a plurality of port pads including a plurality of contacts; a plurality of memory arrays; and a plurality of master data lines. Each of the master data lines extends in a space between one of the port pads and a respective one of the memory arrays. Each of the master data lines is electrically connectable to the contacts of a respective one of the port pads. The apparatus further includes a plurality of local data lines, each of which extends over a respective one of the memory arrays. Each of the local data lines is electrically connectable to a respective one of the master data lines. At least one of the local data lines extends over at least two of the memory arrays. This configuration allows memory array consolidation and/or swapping without increasing die space for additional routing and adversely affecting performance of the apparatus.06-30-2011
20110157952SEMICONDUCTOR MEMORY DEVICE HAVING IMPROVED VOLTAGE TRANSMISSION PATH AND DRIVING METHOD THEREOF - Provided are a semiconductor memory device and a method of driving the device which can improve a noise characteristic of a voltage signal supplied to a memory cell of the device. The semiconductor memory device includes a first semiconductor chip and one or more second semiconductor chips stacked on the first chip. The first chip includes an input/output circuit for sending/receiving a voltage signal, a data signal, and a control signal to/from an outside system. The one or more second semiconductor chips each include a memory cell region for storing data. The second semiconductor chips receive at least one signal through one or more signal paths that are formed outside the input/output circuit of the first chip.06-30-2011
201101579513D CHIP SELECTION FOR SHARED INPUT PACKAGES - A multi-chip package with die having shared input and unique access IDs. A unique first ID is assigned and stored on die in a die lot. A set of die is mounted in a multi-chip package. Free access IDs are assigned by applying a sequence of scan IDs on the shared input. On each die, the scan ID on the shared input is compared with the unique first ID stored on the die. Upon detecting a match, circuitry on the die is enabled for a period of time to write an access ID in nonvolatile memory, whereby one of the die in the multi-chip package is enabled at a time. Also, the shared input is used to write a free access ID in nonvolatile memory on the one enabled die in the set. The unique first IDs can be stored during a wafer level sort process.06-30-2011
20120243285MULTIPLE WRITE DURING SIMULTANEOUS MEMORY ACCESS OF A MULTI-PORT MEMORY DEVICE - A memory system may provide for a successful write of a multi-port memory cell (e.g., dual-port 2WR SRAM cell) when it is simultaneously accessed by more than one port. This multi-port memory cell may include at least two independent accesses to the memory cell, where each access may be controlled by an independent wordline signal. Each port may have an independent pair of bitlines. Multiple write circuitry (e.g., double write circuitry) may enable the write driver to drive the input data to more than one pair of bitlines simultaneously.09-27-2012
20100091544COUPLINGS WITHIN MEMORY DEVICES - A memory device includes a first bit line coupled to a first source/drain region of a first multiplexer gate, a second bit line coupled to a first source/drain region of a second multiplexer gate, and a sensing device having an input coupled to a second source/drain region of the first multiplexer gate and a second source/drain region of the second multiplexer gate. The input of the sensing device is formed at a vertical level that is different than a vertical level at which at least one of the first and second bit lines is formed.04-15-2010
20130170275DUAL PORT SRAM HAVING REDUCED CELL SIZE AND RECTANGULAR SHAPE - A dual port SRAM has two data storage nodes, a true data and complementary data. A first pull down transistor has an active are that forms the drain region of the first transistor and the true data storage node that is physically isolated from all other transistor active areas of the memory cell. A second pull down transistor has an active area that form the drain region of a second transistor that is the complementary data node that is physically isolated from all other transistor active areas of the memory cell.07-04-2013
20110261603INTEGRATED CIRCUIT PACKAGE WITH MULTIPLE DIES AND BUNDLING OF CONTROL SIGNALS - A package includes a first die and a second die, at least one of said first and second dies being a memory. The dies are connected to each other through an interface. The interface is configured to transport a plurality of control signals. The number of control signals is greater than a width of the interface. At least one of the first and second dies performs a configurable grouping so as to provide a plurality of groups of control signals. The signals within a group are transmitted across the interface together.10-27-2011
20130176764SEMICONDUCTOR APPARATUS - A semiconductor apparatus includes a controller, a memory, a normal line, a test line, and a path setting unit. The normal line is provided for communication between the controller and the memory. The test line is provided for a test operation of the memory. The path setting unit connects either the normal line or the test line to the memory according to a type of access mode.07-11-2013
20080219037INTEGRATED CIRCUIT, MEMORY DEVICE, METHOD OF OPERATING AN INTEGRATED CIRCUIT, AND METHOD OF DESIGNING AN INTEGRATED CIRCUIT - An integrated circuit, a memory device, a method of operating an integrated circuit and a method of designing an integrated circuit are provided. An integrated circuit comprises a plurality of logical elements and a bus carrying signals for said plurality of logical elements. The integrated circuit also comprises a routing unit having an input coupled to said bus and a plurality of outputs to route signals received at said input to at least one of said outputs. The integrated circuit also comprises a plurality of lines coupled to said plurality of outputs to conduct said signals from said routing unit to at least one of said plurality of logical elements, wherein at least one of said plurality of lines couples said routing unit to only one of said logical elements.09-11-2008
20130094271CONNECTION OF MULTIPLE SEMICONDUCTOR MEMORY DEVICES WITH CHIP ENABLE FUNCTION - A system comprising a plurality of memory devices coupled by a common bus to a controller has a single serially coupled enable signal per channel. Each memory device or chip comprises a serial enable input and enable output and a register for storing a device identifier, e.g., chip ID. The memory devices are serially coupled by a serial enable link, for assertion of a single enable signal to all devices. This parallel data and serial enable configuration provides reduced per-channel pin count, relative to conventional systems that require a unique enable signal for each device. In operation, commands on the common bus targeting an individual device are asserted by adding an address field comprising a device identifier to each command string, preferably in an initial identification cycle of the command. Methods are also disclosed for initializing the system, comprising assigning device identifiers and obtaining a device count, prior to normal operation.04-18-2013
20130094272DEVICE - A semiconductor device includes a first controlled chip and a control chip stacked therewith. The first controlled chip includes a first circuit outputting a data signal in response to a synchronization signal, an input/output circuit outputting the data signal to a data terminal in synchronization with a delayed synchronization signal, and a replica circuit replicating an output circuit and outputting a replica signal to a first replica terminal in synchronization with the delayed synchronization signal. The control chip includes a first control circuit outputting a synchronization signal and receiving a data signal, a delay adjustment circuit delaying the synchronization signal and outputting the same as a delayed synchronization signal, a phase comparator circuit comparing the phases of the replica signal and the synchronization signal, and a delay control circuit controlling the delay amount of the delay adjustment circuit based on a comparison result of the phase comparator circuit.04-18-2013
20130114323SEMICONDUCTOR DEVICE AND DATA STORAGE APPARATUS - A semiconductor device according to an embodiment includes: a rectangular substrate having a first and a second principal surfaces ; a first semiconductor chip; one or more second semiconductor chips; and one or more third semiconductor chips. The substrate has first connection terminals connected to electrodes of the one or more second semiconductor chips, and third connection terminals electrically connected to the first connection terminals and connected to first electrodes of the first semiconductor chip, on a side of a first edge on the first principal surface. The substrate has second connection terminals connected to second electrodes of the one or more third semiconductor chips, and fourth connection terminals electrically connected to the second connection terminals and connected to electrodes of the first semiconductor chip, on a side of a second edge facing the first edge across the first semiconductor chip on the first principal surface.05-09-2013
20130128648LAYOUTS FOR MEMORY AND LOGIC CIRCUITS IN A SYSTEM-ON-CHIP - An integrated circuit including a plurality of memory circuits and a plurality of logic circuits. The plurality of memory circuits is arranged on a die along a plurality of rows and a plurality of columns. Each memory circuit includes a plurality of memory cells. The plurality of logic circuits is arranged on the die between the plurality of memory circuits along the plurality of rows and the plurality of columns. The plurality of logic circuits is configured to communicate with one or more of the memory circuits.05-23-2013
20100277965Memory System Having Multiple Vias at Junctions Between Traces - An improvement to a memory system having a hierarchical bitline structure wherein traces that form global write lines are connected to each other using junctions that include multiple vias to reduce capacitance and increase yield. At least one of a pair of traces connected by the vias includes a widened portion that provides sufficient overlap with the other trace to allow the two or more vias to be formed between the traces at the overlap. Parallel traces for global write lines that carry a write signal and its inverse may be positioned more than one maximum-density grid space apart to allow the widened portions to be formed between the traces. A global read line that is formed in a different metal layer from the global write line traces may be positioned in a grid space between the global write line traces to reduce the capacitance of this line.11-04-2010
20080205113Inter-transmission multi memory chip, system including the same and associated method - A multi memory chip stacked on a multi core CPU includes a plurality of memories, each memory corresponding to a CPU core from among the CPU cores and being configured to directly transmit data between the other memories of the multi memory chip.08-28-2008
20080198641SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND LAYOUT METHOD THEREOF - A semiconductor integrated circuit device includes a memory macro and M (N is an integer more than 1) passage wirings. The memory macro includes a memory cell array comprising memory cells which are arranged in a matrix, digit line pairs connected with the memory cells and extending in a column direction, and a column peripheral circuit connected with the digit line pairs and comprising a sense amplifier circuit. The M (M is an integer more than 1) passage wirings are arranged to extend in a row direction orthogonal to the digit line pairs. The arrangement of the M passage lines above the column peripheral circuit is forbidden.08-21-2008
20130148400MEMORY DEVICE - According to one embodiment, a memory device includes first to third interconnects, memory cells, and selectors. The first to third interconnects are provided along first to third directions, respectively. The memory cells includes variable resistance layers formed on two side surfaces, facing each other in the first direction, of the third interconnects. The selectors couple the third interconnects with the first interconnects. One of the selectors includes a semiconductor layer provided between associated one of the third interconnects and associated one of the first interconnects, and gates formed on two side surfaces of the semiconductor layer facing each other in the first direction with gate insulating films interposed therebetween.06-13-2013
20130148401SYSTEMS AND METHODS FOR STACKED SEMICONDUCTOR MEMORY DEVICES - Systems and methods are provided for stacked semiconductor memory devices. The stacked semiconductor memory devices can include a nonvolatile memory controller, a number of nonvolatile memory dies arranged in a stacked configuration, and a package substrate. The memory controller and the memory dies can be coupled to each other with vias that extend through the package substrate. A vertical interconnect process may be used to electrically connect the nonvolatile memory dies to each other, as well as other system components. The memory controller may be flip-chip bonded to external circuitry, such as another semiconductor device or a printed circuit board.06-13-2013
20130148402CONTROL SCHEME FOR 3D MEMORY IC - The present invention discloses a control scheme for 3D memory IC that includes a master chip and at least one slave chip. The master chip includes a main memory core, a first local timer, an I/O buffer, a first pad and a second pad. The at least one slave chip is stacked with the master chip. Each of the slave chip includes a slave memory core, a second local timer and a third pad. A first TSV is coupled to the first pad and the third pad. A logic control circuit layer includes a logic control circuit and a fourth pad, and the logic control circuit is coupled to the fourth pad. A second TSV is coupled to the second pad and the fourth pad.06-13-2013
20130148403MEMORY SYSTEM HAVING IMPROVED SIGNAL INTEGRITY - A memory system having improved signal integrity includes a printed circuit board for use in a memory device, N memory semiconductor packages mounted on the printed circuit board, a first switch mounted on the printed circuit board, a controller mounted on the printed circuit board, N first signal lines connecting the semiconductor packages to the first switch such that the semiconductor packages and the first switch are in an N-to-06-13-2013
20100315853SEMICONDUCTOR INTEGRATED CIRCUIT - In a semiconductor integrated circuit including a memory macro, such as a DRAM, an SRAM, a ROM, a flash memory, or the like, and a logic circuit, memory macro test-dedicated pads are provided on the memory macro, whereby an increase in the number of normal pads is reduced or prevented to reduce or prevent an increase in the chip area. Moreover, by fixing arrangement (positions) of the pads provided on the memory macro between memory macros of a plurality of memory macro-including semiconductor integrated circuits, a single common probe card for a single chip can be used for the memory macro-including semiconductor integrated circuits, thereby providing low-cost testing.12-16-2010
20130155752WIRING CONFIGURATION OF A BUS SYSTEM AND POWER WIRES IN A MEMORY CHIP - Devices and circuits for wiring configurations of a bus system and power supply wires in a memory chip with improved power efficiencies. For example, the effective resistance on the power supply wires can be reduced by utilizing non-active bus wires as additional power wires connected in parallel with the other supply wires. Further, these non-active bus wires can reduce or prevent parasitic couplings and cross-talk effects between neighboring sensitive wires, thereby improving the performance of the chip.06-20-2013
20130182485Data Storage and Stackable Configurations - A first memory device and second memory device have a same input/output layout configuration. To form a stack, the second memory device is secured to the first memory device. To facilitate connectivity, the second memory device is rotationally offset with respect to the first memory device in the stack to align outputs of the first memory device with corresponding inputs of the second memory device. The rotational offset of the second memory device with respect to the first memory device aligns one or more outputs of the first memory device with one or more respective inputs of the second memory device. Based on links between outputs and inputs from one memory device to another in the stack, the stack of memory devices can include paths facilitating one or more series connection configurations through the memory devices.07-18-2013
20130182484WORD LINE AND POWER CONDUCTOR WITHIN A METAL LAYER OF A MEMORY CELL - A memory cell 07-18-2013
20120281449SEMICONDUCTOR CHIP, MEMORY CHIP, SEMICONDUCTOR PACKAGE AND MEMORY SYSTEM - A semiconductor chip includes a plurality of signal and power pads; and a plurality of chip selection pads, wherein at least one of the plurality of chip selection pads includes a normal pad and an inverse pad.11-08-2012
20110305059Semiconductor Memory Devices - Semiconductor memory devices include a first storage layer and a second storage layer, each of which includes at least one array, and a control layer for controlling access to the first storage layer and the second storage layer so as to write data to or read data from the array included in the first storage layer or the second storage layer in correspondence to a control signal. A memory capacity of the array included in the first storage layer is different from a memory capacity of the array included in the second storage layer.12-15-2011
20120287695SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device includes a first wiring region and a second wiring region located adjacent to the first wiring region. First lines located in the first wiring region include a first portion, a first lead portion and first inclined portion. Second lines located in the second wiring region include a second portion, a second lead portion and a second inclined portion. The first and second portions are located in parallel with a same pitch, the first and second lead portions are located with a pitch which is larger than the pitch of the first and second portions, the first and second inclined portions extend the same direction at a predetermined angle.11-15-2012
20120008361SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device includes cell gate lines arranged in parallel over a semiconductor substrate, gate lines for select transistors disposed over the semiconductor substrate adjacent to the gate lines of the outermost memory cells, from among the gate lines for the memory cells, and metal lines coupled to the select transistors through contacts.01-12-2012
20120020138TRANSISTOR HAVING AN ADJUSTABLE GATE RESISTANCE AND SEMICONDUCTOR DEVICE COMPRISING THE SAME - A memory device comprises an array of memory cells each capable of storing multiple bits of data. The memory cells are arranged in memory strings that are connected to a common source line. Each memory cell includes a programmable transistor connected in series with a resistance. The transistor includes a gate dielectric that is switchable between a plurality of different resistance values. The threshold voltage of the transistor changes according to the resistance value of the gate dielectric. Memory states of the memory cells can thus be associated with respective resistance values of the dielectric layer of the transistor.01-26-2012
20130194854MEMORY DEVICE COMPRISING PROGRAMMABLE COMMAND-AND-ADDRESS AND/OR DATA INTERFACES - A memory device comprising a programmable command-and-address (CA) interface and/or a programmable data interface is described. In an operational mode, two or more CA interfaces may be active. In another operational mode, at least one, but not all, CA interfaces may be active. In an operational mode, all of the data interfaces may be active. In another operational mode, at least one, but not all, data interfaces may be active. The memory device can include circuitry to select: an operational mode; a sub-mode within an operational mode; one or more CA interfaces as the active CA interface(s); a main CA interface from multiple active CA interfaces; and/or one or more data interfaces as the active data interfaces. The circuitry may perform these selection(s) based on one or more bits in one or more registers and/or one or more signals received on one or more pins.08-01-2013
20130201744DMA ARCHITECTURE FOR NAND-TYPE FLASH MEMORY - A device includes a nonvolatile memory array, a Static Random Access Memory (SRAM) array including a plurality of bit lines, including first and second bit lines paired with each other, and a pad. A first circuit is coupled between the nonvolatile memory array and the first and second bit lines, and interfaces with the SRAM array. A second circuit is coupled between the pad and the first and second bit lines, and interfaces with the SRAM array. A control circuit performs a first operation to access the nonvolatile memory array via the SRAM array and the first and second circuits and performs a second operation by producing an electrical path connecting from the pad to the nonvolatile memory array through at least one of the first and second bit lines of the SRAM array without intervening at least one of the first and second circuits.08-08-2013
201300942733D MEMORY AND DECODING TECHNOLOGIES - A 3D memory device is based on an array of conductive pillars and a plurality of patterned conductor planes including left side and right side conductors adjacent the conductive pillars at left side and right side interface regions. Memory elements in the left side and right side interface regions comprise a programmable transition metal oxide which can be characterized by built-in self-switching behavior, or other programmable resistance material. The conductive pillars can be selected using two-dimensional decoding, and the left side and right side conductors in the plurality of planes can be selected using decoding on a third dimension, combined with left and right side selection.04-18-2013
20130208524MEMORY MODULE FOR HIGH-SPEED OPERATIONS - A memory module includes a plurality of buses. A plurality of memory chips is mounted on a module board and is connected to a first node, a second node, and a plurality of third nodes of the plurality of buses. The first node, the second node, and the third nodes branch off to a first memory chip, a second memory chip, and the third memory chips, respectively. A length of the plurality of buses between the first and second nodes is longer than a length of the plurality of buses between adjacent nodes from among the second node and the third nodes.08-15-2013

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