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Verify signal

Subclass of:

365 - Static information storage and retrieval

365185010 - FLOATING GATE

365185180 - Particular biasing

365185200 - Reference signal (e.g., dummy cell)

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DocumentTitleDate
20130044548FLASH MEMORY AND MEMORY CELL PROGRAMMING METHOD THEREOF - A flash memory and a memory cell programming method thereof are provided. The programming method includes the following steps. A preset programming voltage is applied to a memory cell to program the memory cell. A first verify voltage is applied to the memory cell to detect a programming result of the memory cell. A programming voltage applied on the memory cell is adjusted according to the programming result of the memory cell.02-21-2013
201300280273D SEMICONDUCTOR MEMORY DEVICE - A 3D semiconductor memory device including a plurality of memory cell strings, includes a substrate and a channel that extends from the substrate. Memory cells may be disposed in layers in which the diameter of the channel varies. A programming verification operation may be carried out in a sequence whereby memory cells more likely to fail in programming are verified before attempting to verify memory cells that are less likely to fail programming. In an exemplary embodiment, the verification operation is performed on a memory cell disposed in a layer associated with a larger-diameter channel before performing the verification on a memory cell disposed in a layer associated with a smaller-diameter channel. In an exemplary embodiment, if a verification process detects a programming failure, the verification of subsequent memory cells is cancelled.01-31-2013
20110194355VERIFY WHILE WRITE SCHEME FOR NON-VOLATILE MEMORY CELL - A verify while write (VWW) scheme for a non-volatile memory (NVM) cell is provided. The VWW scheme conducts simultaneous write and verify operation by sensing the memory cell current during the write pulse at exactly the same write bias condition in contrast to the “verify+retry-write” write algorithm in the prior art. The VWW scheme removes the iterative “verify and then retry-write” to save both control timing and power consumed in these iterations. Instead, the VWW scheme is composed of single write pulse only in the entire algorithm with exact write pulse width trimmed automatically for multiple memory cells undergoing parallel writing within one write command assertion. Faster write speed, more power efficient write operation and higher reliability of non-volatile semiconductor memory cell are thus achieved with the VWW scheme in this present disclosure.08-11-2011
20090122616NON-VOLATILE MEMORY DEVICE AND METHOD OF CONTROLLING A BULK VOLTAGE THEREOF - A threshold voltage of a non-volatile memory device is compensated by a voltage supplier and a controller. The voltage supplier supplies a set voltage to a bulk of a memory cell array, including memory cells, at the time of a read operation of the memory cells. The controller controls the voltage supplier to set and supply a bulk voltage depending on a threshold voltage change of the memory cells.05-14-2009
20130077408NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A nonvolatile semiconductor memory device according to the embodiment comprises a memory cell array including plural memory cells operative to store data nonvolatilely in accordance with plural different threshold voltages; and a control unit operative to, in data write to the memory cell, execute write loops having a program operation for changing the threshold voltage of the memory cell and a verify operation for detecting the threshold voltage of the memory cell after the program operation, the control unit, in data write for changing one threshold voltage of the plural threshold voltages, executing the verify operation, when the number of write loops to the memory cell becomes more than a certain defined number, using a condition that can pass the verify operation easier than that when the number of write loops is equal to or less than the certain defined number.03-28-2013
20130077409NONVOLATILE SEMICONDUCTOR STORAGE DEVICE - A nonvolatile semiconductor storage device according to an embodiment includes: a memory cell array including plural memory cells; and a control circuit that repeatedly performs a write loop including a program operation and a verify operation in data write performed to the memory cell, the verify operation including a preverify step to check whether a threshold voltage of the memory cell transitions to a preverify voltage, and a real verify step to check whether the threshold voltage of the memory cell transitions to the real verify voltage, the write loop including one or at least two verify operations corresponding to pieces of the data, the control circuit performing the write loop in which the preverify step of the verify operation corresponding to a first data is omitted after obtaining a first condition.03-28-2013
20130077410CLOCK SYNCHRONIZED NON-VOLATILE MEMORY DEVICE - A nonvolatile memory apparatus including a control circuit, plural terminals having clock, command and other terminals, data and command registers, and plural nonvolatile memory cells. The clock terminal receives a clock signal and the command terminal receives commands including read and program commands. The data register receives from and outputs data to outside. The control circuit reads operation steps from memory used to control the apparatus. The control circuit, responsive to the read command, controls reading data from the memory cells, storing read data to the data register, and outputting read data via the other terminal, not the command terminal, based on the clock signal. The control circuit, responsive to the program command, controls receiving data via the other terminal, not the command terminal, based on the clock signal, storing received data to the data register and writing received data to the memory cells.03-28-2013
20130077407NONVOLATILE MEMORY DEVICE, PROGRAM METHOD THEREOF, AND DATA PROCESSING SYSTEM INCLUDING THE SAME - A program method of a nonvolatile memory device includes a pre-program verify step for verifying a threshold voltage of a selected memory cell; a step of setting a bit line voltage of the selected memory cell according to the threshold voltage of the selected memory cell which is determined through the pre-program verify step; a step of applying a program voltage to the selected memory cell set with the bit line voltage; and a post-program verify step for verifying a programmed state of the selected memory cell applied with the program voltage.03-28-2013
20130033938NONVOLATLE MEMORY DEVICE AND RELATED PROGRAMMING METHOD - A nonvolatile memory device is programmed by performing a plurality of program loops each comprising applying a program voltage to a selected wordline to change a threshold voltage of a selected memory cell, and applying a verification voltage to the selected wordline to verify a program state of the selected memory cell. In each program loop, the nonvolatile memory device determines a program condition and increments the program voltage by an amount determined according to the program condition.02-07-2013
20130033937METHODS FOR PROGRAM VERIFYING A MEMORY CELL AND MEMORY DEVICES CONFIGURED TO PERFORM THE SAME - A method for program verify is disclosed, such as one in which a threshold voltage of a memory cell that has been biased with a programming voltage can be determined and its relationship with multiple program verify voltage ranges can be determined. The program verify voltage range in which the threshold voltage is located determines the subsequent bit line voltage. The subsequent bit line voltage may be less than a previous bit line voltage used to program the memory cell.02-07-2013
20100046303PROGRAM-VERIFY METHOD - Methods and devices are disclosed, some such methods comprising applying a verify pass-through voltage to unselected select lines of the floating-gate memory array that is greater than a read pass-through voltage applied to the unselected select lines. Other methods involve utilizing a cell current for reading a value from one or more memory cells in program-verify operations that is lower than a cell current for reading the value from the one or more memory cells in read operations.02-25-2010
20130088924NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF DATA WRITE THEREIN - A bit line is electrically connected to one end of a current path of a memory cell. A word line is commonly connected to the memory cells arranged in a direction intersecting the bit line. A control circuit executes a write operation for applying a write voltage to the word line so shift a threshold voltage of the memory cell to be data written that the threshold voltage of the memory cell to be data written reaches a certain threshold voltage. During the write operation, the control circuit, while applying a gradually rising write voltage to the word line, gradually changes a voltage applied to the bit line based on a relationship between the threshold voltage of the memory cell to be written and a number of times of the write voltage applications.04-11-2013
20090168541ELECTRICAL ERASABLE PROGRAMMABLE MEMORY TRANSCONDUCTANCE TESTING - A test method determines if an array of a Flash EEPROM circuit has a bit cell with a transconductance (gm) that is deficient. The method preconditions all bit cells of the array to a particular programmed state and then determines whether any of the bit cells exhibit undesirable operating characteristics by reading each bit cell to determine whether its transconductance is less than desirable.07-02-2009
20090154252SEMICONDUCTOR MEMORY DEVICE CAPABLE OF SHORTENING ERASE TIME - In a memory cell array, a plurality of memory cells connected to a plurality of word lines and a plurality of bit lines are arranged in a matrix. A control circuit controls the potentials of said plurality of word lines and said plurality of bit lines. In an erase operation, the control circuit erases an n number of memory cells (n is a natural number equal to or larger than 2) of said plurality of memory cells at the same time using a first erase voltage, carries out a verify operation using a first verify level, finds the number of cells k (k≦n) exceeding the first verify level, determines a second erase voltage according to the number k, and carries out an erase operation again using the second erase voltage.06-18-2009
20090154251ALGORITHM FOR CHARGE LOSS REDUCTION AND Vt DISTRIBUTION IMPROVEMENT - Methods and systems for accurately programming or erasing one or more memory cells on a selected wordline of a memory device are provided. In one embodiment, the memory device comprises a memory array, a threshold voltage measuring component configured to measure a threshold voltage of each memory cell on the selected wordline of the memory array, and an average threshold voltage determining component configured to determine an average threshold voltage result uniquely associated with the selected wordline, based on the measured threshold voltages. The memory device is configured to program one or more of the memory cells to a predefined program level relative to the determined average threshold voltage, or to erase memory cells of the selected wordline to the determined average threshold voltage. The method is particularly useful for multi-level flash memory cells to reduce charge loss while improving data reliability and Vt distributions of the programmed element states.06-18-2009
20090154250METHOD FOR READING NONVOLATILE MEMORY AT POWER-ON STAGE - A method for reading data in a nonvolatile memory at a power-on stage is provided and includes the following steps. Firstly, the data are read through a reference voltage. Next, a failure number is counted when reading the data has a fail result. Next, the reference voltage is adjusted when the failure number reaches a predetermined number. The effect effectively and exactly reading configuration information at a power-on stage is accomplished through the method.06-18-2009
20100329031METHOD OF OPERATING NONVOLATILE MEMORY DEVICE - A method of operating a nonvolatile memory device includes precharging bit lines coupled to strings, supplying a first verification voltage to a selected word line and supplying a pass voltage to word lines other than the selected word line, supplying a first sense pulse to switching elements coupled between the bit lines and sense nodes and detecting memory cells, each having a threshold voltage higher than the first verification voltage, supplying a second verification voltage higher than the first verification voltage to the selected word line and supplying the pass voltage to the word lines other than the selected word line, and supplying a second sense pulse to the switching elements and detecting memory cells, each having a threshold voltage higher than the second verification voltage.12-30-2010
20100329027NONVOLATILE MEMORY DEVICE AND METHOD OF OPERATING THE SAME - A nonvolatile memory device includes a control unit configured to output operation signals, including an operation command signal, a source address, a destination address, and a data signal, to each of a number of memory chips in order to operate the memory chips, a command decoder configured to decode the command signal and generate operation command information, a source address controller configured to generate source address information based on the source address, a destination address controller configured to generate destination address information based on the destination address, a chip controller configured to generate a command enable signal based on the operation command information, the source address information, and the destination address information, and a data controller configured to operate a memory cell array in response to the data signal and the command enable signal.12-30-2010
20130070532NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A nonvolatile semiconductor memory device according to an embodiment includes a control unit configured to perform a control of repeating a program operation, and a step-up operation, the program operation being an operation of applying a program pulse voltage to a selected memory cell and applying an intermediate voltage less than the program pulse voltage to first and second non-selected memory cells adjacent to the selected memory cell, and the step-up operation being an operation of increasing the program pulse voltage by a first step-up value. For a first period, the control unit maintains the intermediate voltage to be a constant value. For a second period, the control unit controls the step-up operation such that the intermediate voltage is increased by a second step-up value, and determines the first step-up value on the basis of the second step-up value.03-21-2013
20100103742METHOD OF OPERATING NONVOLATILE MEMORY DEVICE AND MEMORY SYSTEM - A method of operating a nonvolatile memory device includes; performing a verification operation on memory cells while controlling a verification voltage until the memory cells are verification-passed, controlling a level of a bias voltage to be applied to the memory cells according to a level of the verification voltage when the memory cells are verification-passed, and applying the bias voltage to the memory cells.04-29-2010
20090303800NON-VOLATILE MEMORY CONTROL CIRCUIT - An efficient erasure is performed. The voltage of a source line SL is manipulated in units of a sector comprising a plurality of memory cells. An erase command is received for the desired memory cells to be erased in a plurality of word line WL units arranged within a sector and all data within the sector, which includes the desired memory cells to be erased, is saved in a separate memory. Erasure is then performed for the entire sector, and among the saved data the data outside the desired memory cells to be erased is returned to the memory cells.12-10-2009
20090303799NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE AND ERASING METHOD THEREOF - A non-volatile semiconductor memory device including a NAND cell unit with a plurality of electrically rewritable and non-volatile memory cells connected in series, one end thereof being coupled to a bit line via a first select gate transistor while the other end is coupled to a source line via a second select gate transistor, wherein the memory device has an erase-verify mode for verifying an erase state of the memory cells in the NAND cell unit, the erase-verify mode including two verify-read operations adapted according to cell ranges to be erase-verified in the NAND cell unit.12-10-2009
20120218827MEMORY APPARATUS AND METHOD FOR CONTROLLING ERASE OPERATION OF THE SAME - An erase operation of a memory apparatus is controlled by, inter alia, selecting one or more memory cell blocks to be erased among a plurality of memory cell blocks, performing an erase operation on the selected one or more memory cell blocks in response to an erase command, performing a first soft program operation on the selected one or more memory cell blocks if the erase operation is determined as passed, and performing a second soft program operation on the selected one or more memory cell blocks if the first soft program operation is determined as passed.08-30-2012
20110007571NONVOLATILE MEMORY DEVICES AND PROGRAM METHODS THEREOF IN WHICH A TARGET VERIFY OPERATION AND A PRE-PASS VERIFY OPERATION ARE PERFORMED SIMULTANEOUSLY USING A COMMON VERIFY VOLTAGE - Provided are nonvolatile memory devices and program methods thereof. A nonvolatile memory device provides a program voltage to a selected word line and performs a program verify operation. The nonvolatile memory device controls a bit line voltage of the next program loop according to the program verification result. In the program verification operation, a target verify voltage is used as a pre-verify voltage. The nonvolatile memory device controls the bit line voltage of the next program loop according to the program verification result, thus making it possible to reduce the threshold voltage distribution of a memory cell. Also, the nonvolatile memory device uses the target verify voltage as the pre-verify voltage, thus making it possible to increase the program verification speed.01-13-2011
20130058170NONVOLATILE SEMICONDUCTOR STORAGE DEVICE - A nonvolatile semiconductor storage device according to an embodiment includes a drive circuit. A voltage applied to a dummy wire connected to a first dummy cell adjacent to a memory string is defined as a first dummy wire voltage, a voltage applied to a selection wire connected to a first memory cell adjacent to the first dummy cell is defined as a first selection wire voltage, and a voltage applied to a selection wire connected to a second memory cell adjacent to the first memory cell is defined as a second selection wire voltage. When the second selection wire voltage is lower than the first dummy wire voltage in an erase operation, the drive circuit controls voltages so that a difference between the first dummy wire voltage and the second selection wire voltage is less than a difference between the first dummy wire voltage and the first selection wire voltage.03-07-2013
20130058171SEMICONDUCTOR STORAGE DEVICE - A semiconductor storage device has a plurality of memory cells each having a control gate that are formed on a well. The semiconductor storage device has a control circuit that applies a voltage to the well and the control gates.03-07-2013
20110013461NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE - For data erase from an electrically erasable and programmable non-volatile memory cell, the following operations are performed: an erase operation to apply an erase pulse voltage to a memory cell for data erase, an erase verify operation to verify whether data erase is completed, and a step-up operation to increase the erase pulse voltage by a certain step-up voltage if data erase is not completed. A control unit controls voltages so that at least a first erase pulse voltage initially generated in the erase operation has a longer rise time than that of a second erase pulse voltage generated subsequent to the first erase pulse voltage.01-20-2011
20120224432OVER-ERASE VERIFICATION AND REPAIR METHODS FOR FLASH MEMORY - Over-erase verification and repair methods for a flash memory. The flash memory is an NOR type stack flash. The disclosed method performs an over-erased column verification test on a sector of the NOR type stack flash column by column. An over-erased column repair process is individually performed on the columns which do not pass the over-erased column verification test. For the columns processed by the over-erased column repair process but still incapable of passing the over-erased column verification test, an over-erased bit verification test is performed on each bit thereof. The bits incapable of passing the over-erased bit verification test are further processed by an over-erased repair process individually.09-06-2012
20090231927METHOD OF TESTING A NON-VOLATILE MEMORY DEVICE - A method of testing a non-volatile memory device on a wafer is disclosed. The method includes performing an erase operation and a first verify operation about every memory cell in the non-volatile memory device, storing data of a first latch in a page buffer for storing result in accordance with the first verify operation in a second latch, and setting the data of the first latch to data indicating pass of the verifying, and performing a soft program and a second verify operation about every memory cell.09-17-2009
20090040836NAND flash memory device and method of programming the same - Provided are a NAND flash memory device and a method of programming the same. The NAND flash memory device may include a cell array including a plurality of pages; a page buffer storing program data of the pages; a data storage circuit providing program verification data to the page buffer; and a control unit. The control unit may program the pages and verify the pages using the program verification data following the programming of at least two of the pages.02-12-2009
20090010071NONVOLATILE MEMORY DEVICE AND ERASING METHOD - Disclosed is an erasing method for a nonvolatile memory device that includes erasing selected memory cells and erase-verifying the selected memory cells after increasing their threshold voltage by application of a negative bulk bias voltage.01-08-2009
20090010070Method of writing to non-volatile semiconductor memory device storing information depending on variation in level of threshold voltage - In a flash memory, after an initial write operation ends, each bit line associated with a memory cell subjected to a write is precharged and each bit line associated with a memory cell that is not subjected to the write is discharged and verified to detect a memory cell low in threshold voltage and a memory cell thus detected is subjected to an additional write. The verification can be verified without being affected by a current flowing through the memory cell that is not subjected to the write. All memory cells can have their respective threshold voltages set accurately.01-08-2009
20120113725NONVOLATILE MEMORY DEVICE AND METHOD OF PROGRAMMING THE DEVICE - A nonvolatile memory device and a method of programming the device includes storing first data in first main and sub-registers and storing second data in second main and sub-registers, performing first program and verification operations on first memory cells based on the first data stored in the first main register, storing a result of the first verification operation in the first main register, performing a second program operation on second memory cells based on the second data stored in the second main register, changing the result of the first verification operation, stored in the first main register, into the first data stored in the first sub-register, performing an additional verification operation on the first memory cells on which the first verification operation has been completed, storing a result of the additional verification operation in the first main register, and performing a second verification operation on the second memory cells.05-10-2012
20120113724SEMICONDUCTOR MEMORY - According to one embodiment, a semiconductor memory includes a memory cell array including a plurality of memory cells, a sense amplifier circuit holding a verification result for the memory cells and including sense units, the sense units of each column block being connected in common to a first signal line, and a detecting circuit including a detecting unit. The detecting unit includes a first latch circuit which holds failure information in the memory cell arrays, and a second latch circuit which includes a first input terminal connected to the first signal line, a second input terminal connected to the first latch circuit, and a first output terminal connected to a second signal line.05-10-2012
20120236657NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE ADAPTED TO STORE A MULTI-VALUED DATA IN A SINGLE MEMORY CELL - A non-volatile semiconductor memory device includes an electrically data rewritable non-volatile semiconductor memory cell and a write circuit for writing data in the memory cell, the write circuit writing a data in the memory cells by supplying a write voltage Vpgm and a write control voltage VBL to the memory cell, continuing the writing of the data in the memory cell by changing the value of the write control voltage VBL in response to an advent of a first write state of the memory cell and inhibiting any operation of writing a data to the memory cell by further changing the value of the write control voltage VBL to Vdd in response to an advent of a second write state of the memory cell.09-20-2012
20120236656APPARATUS AND METHOD FOR DETERMINING A READ LEVEL OF A MEMORY CELL BASED ON CYCLE INFORMATION - Disclosed is an apparatus and method for determining a read level voltage to apply to a block of memory cells in a non-volatile memory circuit. A prediction value is compared to a prediction indicator to determine whether a new read level voltage to be applied to read the memory cells should be estimated. If a new read level should be estimated the new read level is calculated as a function of an initial read level and a dwell time and a number of program/erase cycles. A controller provides one or more programming commands representative of the new read level voltage to the memory circuit to read the cells.09-20-2012
20130163344PROGRAMMING TO MITIGATE MEMORY CELL PERFORMANCE DIFFERENCES - Methods for programming and memory devices are disclosed. In one such method for programming, a first programming voltage applied to control gates of a group of memory cells generates a maximum threshold voltage of the group of memory cell threshold voltages. A voltage difference between the maximum threshold voltage and a maximum target voltage is used as a gate step voltage for a second programming voltage. Fast and slow programming memory cells are determined from the distribution resulting from the second programming voltage. An effective gate voltage applied to the control gates of the fast programming memory cells is less than an effective gate voltage applied to the control gates of the slow programming memory cells during the third programming voltage.06-27-2013
20120287722DYNAMIC DATA CACHES, DECODERS AND DECODING METHODS - Examples described include dynamic data caches (DDCs), decoders and decoding methods that may fit into a smaller width area. The DDCs, decoders and decoding method may be used in flash memory devices. A single column select line may be provided to select a plurality of cached bytes, while a second select line selects a byte of the selected plurality. The column select line may be routed parallel to bit lines carrying data, while the second select line may be routed perpendicular to the bit lines.11-15-2012
20090207665NON-VOLATILE ONE TIME PROGRAMMABLE MEMORY - A verify operation is performed on the one time programmable memory block to determine if it has been programmed. If any bits have been programmed, further programming or erasing is inhibited. In another embodiment, the memory block can be programmed and erased until a predetermined page or lock bit in the block is programmed. Once that page/bit is programmed, the one time programmable memory block is locked against further programming or erasing.08-20-2009
20090310422NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE - A controller repeats an erase operation, an erase verify operation, and a step-up operation. A first storage unit stores a value of an erase start voltage applied first as an erase voltage when a series of erase operations are executed. A second storage unit stores a value of an erase completion voltage which is an erase voltage when erasure of data is finished in the erase operation and the erase verify operation. A first comparator compares the erase completion voltage with the erase start voltage each time the erase operation is executed. When the first comparator determines that the erase completion voltage is larger than the erase start voltage, a counter counts up a count value. When the count value becomes larger than a predetermined value, a second comparator updates a value of the erase start voltage stored in the first storage unit.12-17-2009
20090310423METHOD OF PROGRAMMING AND ERASING A NON-VOLATILE MEMORY ARRAY - A method of processing an array of non-volatile memory cells to program or erase the same, by applying a voltage to the same through a program and verify pulse application circuit. The process includes a first step of selecting a voltage to be applied. Then, the maximum number of memory cells that can be processed simultaneously is determined, based on the selected voltage and characteristics of the memory cells and the circuit. The array is divided into processing groups, each group having a number of cells less than or equal to the maximum determined number. Finally, the voltage is applied to the cells.12-17-2009
20110128791Method and Apparatus of Performing an Erase Operation on a Memory Integrated Circuit - Various discussed approaches include an improved grouping of edge word lines and center word lines of an erase group during erase verify and erase sub-operations of an erase operation. In another approach, changed voltage levels of edge word lines to address the over-erase issue of the erase group, and also improve erase time performance. Another approach uses dummy word lines.06-02-2011
20120294091METHOD FOR OPERATING NON-VOLATILE MEMORY DEVICE - A method for operating a non-volatile memory device which includes a plurality of memory cells serially coupled between a source selection transistor and a drain selection transistor, a first dummy memory cell coupled between the source selection transistor and the memory cells, and a second dummy memory cell coupled between the drain selection transistor and the memory cells includes applying a verification voltage to a gate of a selected memory cell, applying a first voltage to gates of unselected memory cells, and applying a second voltage that is lower than the first voltage to a gate of at least one of the first dummy memory cell and the second dummy memory cell, during a program verification operation.11-22-2012
20110141818Nonvolatile Memory and Method for Compensating During Programming for Perturbing Charges of Neighboring Cells - Shifts in the apparent charge stored on a charge storing element of a non-volatile memory cell can occur because of the coupling of an electric field based on the charge stored in adjacent charge storing elements. To compensate for this coupling, the programming process for a given memory cell can take into account the target programmed state of one or more adjacent memory cell. The amount of programming is verified after each programming pulse and the standard verify level for the programming cell is dependent on the target state. The verify level is further offset lower dependent on the amount of perturbation from neighboring cells, determinable by their target states. The verify level is preferably virtually offset by biasing adjacent word lines instead of actually offsetting the standard verify level. For soft-programming erased cells, neighboring cells on both adjacent word lines are taken into account.06-16-2011
20120008411MEMORY APPARATUS INCLUDING PROGRAMMABLE NON-VOLATILE MULTI-BIT MEMORY CELL, AND APPARATUS AND METHOD FOR DEMARCATING MEMORY STATES OF THE CELL - Memory states of a multi-bit memory cell are demarcated by generating read reference signals having levels that constitute boundaries of the memory states. The read reference signals may be dependent upon the levels of programming reference signals used for controlling the programming of the memory cell. The memory cell can thus be programmed without reading out its memory state during the programming process, with programming margins being assured by the dependence of the read reference signals on the programming reference signals. Both sets of reference signals may be generated by reference cells which track variations in the operating characteristics of the memory cell with changes in conditions, such as temperature and system voltages, to enhance the reliability of memory programming and readout.01-12-2012
20100008151METHODS OF DETECTING A SHIFT IN THE THRESHOLD VOLTAGE FOR A NONVOLATILE MEMORY CELL - A nonvolatile memory device is operated by programming sample data in the memory device for verification using verify voltage levels derived from an ideal verify voltage Vv associated with a particular temperature range, performing read verify operations on the sample data using the verify voltage Vv associated with the temperature range; and determining a temperature compensation parameter Nc based on results of the read verify operations.01-14-2010
20100034026ERASE METHOD AND NON-VOLATILE SEMICONDUCTOR MEMORY - An erase method for a non-volatile memory device having a defined erase unit divided into first and second inner erase units includes; applying an erase voltage to at least one of the first and second inner erase units in accordance with respective states of corresponding first and second fail flags, after applying the erase voltage to the at least one of the first and second inner erase units, performing an erase verification on the at least one of the first and second inner erase units, and updating the at least one of the first and second fail flags in accordance with erase verification results.02-11-2010
20090290427METHOD OF ERASING A NONVOLATILE MEMORY DEVICE - The present invention relates to a method of erasing a nonvolatile memory device. According to an aspect of the present invention, an erase operation is performed on a selected memory block. The bit lines of the memory block are precharged, and a change of a voltage level of the bit lines is verified according to an erase state of the memory cells. A data read operation is performed on a first bit line according to a voltage level of the first bit line. A data read operation is performed on a second bit line according to a voltage level of the second bit line. The data read operation is performed on the second bit line after the data read operation is performed on the first bit line. An erase verify result is then determined according to the data read operation result.11-26-2009
20110170360METHOD OF PROGRAMMING NONVOLATILE MEMORY DEVICE - A method of programming a nonvolatile memory device comprises a bit line voltage set-up step of receiving a program command and data to be programmed and setting up a voltage of a selected bit line according to a state of program data; a program step of supplying a program voltage to a word line selected for a program in response to a control signal for setting up the program voltage, supplying a first pass voltage to unselected word lines, and then performing the program; and a program verification step of, in response to a control signal which is subsequent to the control signal for setting up the program voltage and is used to set a verification voltage, performing a program verification operation by supplying the verification voltage to the selected word line.07-14-2011
20090141559VERIFYING AN ERASE THRESHOLD IN A MEMORY DEVICE - In one or more embodiments, a memory device is disclosed as having an erase verify operation that includes a negative bias on the p-well in which the memory cell or cells being erased are formed. After an erase pulse is applied to the selected cells to be erased, the p-well is biased with the negative voltage and the erase verify operation is performed to determine the erased state of the cell(s).06-04-2009
20100124126ERASE VOLTAGE REDUCTION IN A NON-VOLATILE MEMORY DEVICE - In erasing a memory block of memory cells, a semiconductor tub that contains a memory block to be erased can be biased with a high, positive voltage. The control gates of the memory cells that make up the memory block can be biased with a negative voltage. An erase verification can then be performed to determine if the memory block has been successfully erased. If the memory block has not been erased, the erase operation of biasing the tub with the positive voltage and the control gates with the negative voltage can be repeated until the erase verification is successful.05-20-2010
20110261626SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SAME - A semiconductor memory device includes a memory block comprising cell strings each of which includes a plurality of memory cells, a current measurement circuit measure a current flowing through a selected bit line coupled to a selected cell string when a data read operation or a program verification operation is performed, and a logic group configured to change a read voltage, a program verification voltage, or a pass voltage in response to the measured current.10-27-2011
20090244979ERASE DEGRADATION REDUCTION IN NON-VOLATILE MEMORY - Methods for erasing a memory device and memory systems are provided, such as those including a non-volatile memory device is erased by using an intermediate erase step prior to a normal erase step. The intermediate erase step is comprised of an erase pulse voltage, applied to the semiconductor well of the selected memory block of memory cells, while edge rows of memory cells are biased at a low positive voltage (e.g., 0.8-2V). An erase verify operation is then performed. If the selected memory block is not erased, a normal memory erase step is then performed in which the same erase pulse voltage is used but all of the rows are biased at ground potential as in a normal erase step. If the memory block is still fails the erase verify operation, the erase pulse voltage is increased and the process repeated.10-01-2009
20100265772NAND MEMORY DEVICE AND PROGRAMMING METHODS - A NAND Flash memory device is described that can reduce bit line coupling and floating gate coupling during program and verify operations. Consecutive bit lines of an array row are concurrently programmed as a common page. Floating gate coupling during programming can therefore be reduced. Multiple verify operations are performed on separate bit lines of the page. Bit line coupling can therefore be reduced.10-21-2010
20120294092OPERATING METHOD OF NONVOLATILE MEMORY DEVICE AND OPERATING METHOD OF MEMORY SYSTEM INCLUDING NONVOLATILE MEMORY DEVICE - A nonvolatile memory device includes a plurality of memory cells and a plurality of monitor cells. The method of operating the device includes erasing the plurality of memory cells and the plurality of monitor cells, programming at least one first memory cell among the plurality of memory cells to a first program state, programming at least one first monitor cell among the plurality of monitor cells to the first program state, and refreshing data stored in the plurality of memory cells according to a result read from the at least one first monitor cell during a read operation of the at least one first monitor cell.11-22-2012
20090231928NON-VOLATILE SEMICONDUCTOR MEMORY WITH PAGE ERASE - In a nonvolatile memory, less than a full block may be erased as one or more pages. A select voltage is applied through pass transistors to each of plural selected wordlines and an unselect voltage is applied through pass transistor to each of plural unselected wordlines of a selected block. A substrate voltage is applied to the substrate of the selected block. A common select voltage may be applied to each selected wordline and the common unselect voltage may be applied to each unselected wordline. Select and unselect voltages may be applied to any of the wordlines of a select block. A page erase verify operation may be applied to a block having plural erased pages and plural nonerased pages.09-17-2009
20090067255NONVOLATILE SEMICONDUCTOR MEMORY INCLUDING MEMORY CELL FOR STORING MULTILEVEL DATA HAVING TWO OR MORE VALUES - A write controller performs verification for checking whether each memory cell is on a predetermined verification level. For a memory cell to be written to a voltage level higher than the predetermined verification level, the write controller stores, in first and second latch circuits, the number of times of write to be performed by a write voltage after the verification. Whenever write is performed by the write voltage, the write controller updates the number of times of write stored in the first and second latch circuits. After write is performed the number of times of write by the write voltage, the write controller performs write by an intermediate voltage lower than the write voltage.03-12-2009
20090141560FLASH MEMORY DEVICE AND PROGRAMMING METHOD THEREOF - A flash memory device includes a memory cell array including a plurality of memory cells, a page buffer unit including a plurality of page buffers connected to bit lines of the memory cell array, a data line mux unit connected between the page buffer unit and a data line and configured to receive verification data through a page buffer during a verify operation. The flash memory device also includes a fail bit counter unit for counting the verification data, comparing counted fail bits and the number of ECC allowed bits, and outputting a pass or fail signal of a program operation according to the comparison result.06-04-2009
20120106260SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SAME - A method of operating a semiconductor memory device includes performing a first program operation in order to raise threshold voltages of memory cells, performing a program verification operation for detecting fast program memory cells, each having a threshold voltage risen higher than a first sub-verification voltage from a second sub-verification voltage or lower, by using a target verification voltage and the first sub-verification voltage and the second sub-verification voltage which are sequentially lower than the target verification voltage, and performing a second program operation under a condition that an increment of each of threshold voltages of memory cells, which is lower than the target verification voltage, is greater than an increment of the threshold voltage of each of the fast program memory cells.05-03-2012
20090279363METHOD AND SYSTEM FOR MINIMIZING NUMBER OF PROGRAMMING PULSES USED TO PROGRAM ROWS OF NON-VOLATILE MEMORY CELLS - A flash memory device programs cells in each row in a manner that minimizes the number of programming pulses that must be applied to the cells during programming. The flash memory device includes a pseudo pass circuit that determines the number of data errors in each of a plurality of subsets of data that has been programmed in the row. The size of each subset corresponds to the number of read data bits coupled from the memory device, which are simultaneously applied to error checking and correcting circuitry. During iterative programming of a row of cells, the pseudo pass circuit indicates a pseudo pass condition to terminate further programming of the row if none of the subsets of data have a number of data errors that exceeds the number of data errors that can be corrected by the error checking and correcting circuitry.11-12-2009
20090290428READ/VERIFICATION REFERENCE VOLTAGE SUPPLY UNIT OF NONVOLATILE MEMORY DEVICE - A verification reference voltage supply unit includes a reference voltage supply unit, a temperature-dependent voltage supply unit, and an amplification unit. The reference voltage supply unit is configured to supply a first reference voltage and a second reference voltage, each of which is configured to maintain a constant value irrespective of a temperature variation. The temperature-dependent voltage supply unit is configured to receive the first reference voltage and generate a temperature-dependent voltage having a voltage level that increases in proportion to a temperature increase. The amplification unit is configured to amplify the temperature-dependent voltage and the second reference voltage and generate a verification reference voltage.11-26-2009
20090273982SEMICONDUCTOR MEMORY DEVICE, SEMICONDUCTOR DEVICE, AND DATA WRITE METHOD - A semiconductor memory device includes an output buffer which outputs an enable signal which makes an external memory device operable, an address buffer which generates an address at which data is held in the external memory device, an input buffer which receives the data held at the address from the external memory device, and a write data buffer which holds the data received by the input buffer, and writes the data in a plurality of memory cells at once. Whenever the write data buffer writes data, the input buffer receives, from the external memory, the data having a size which is written in the memory cells at once.11-05-2009
20090279364METHOD OF PROGRAMMING IN A FLASH MEMORY DEVICE - A method of programming a flash memory device includes programming a first memory cell coupled to an even bit line by applying a first program voltage to a word line, and verifying whether the first memory cell is programmed through a first verifying voltage. The first program voltage that is repeatedly increased by a step voltage when the first memory cell is not programmed. A second memory cell coupled to an odd bit line is programmed by applying the first program voltage to the word line. Whether the second memory cell is programmed is verified using a second verifying voltage that is higher than the first verifying voltage. The second memory cell is programmed using a program voltage that is repeatedly increased by the step voltage when the second memory cell is not programmed.11-12-2009
20090285029HIGH-SPEED VERIFIABLE SEMICONDUCTOR MEMORY DEVICE - A memory cell stores several data using n (n: natural number more than 1) threshold voltages. A voltage supply circuit supplies a predetermined voltage to a gate of the memory cell in a verify operation of verifying whether or not the memory cell reaches a predetermined threshold voltage. A detection circuit connected to one terminal of the memory cell charges one terminal of the memory cell to a predetermined potential. The detection circuit detects the voltage of one terminal of the memory cell based on a first detection timing, and further, detects the voltage of one terminal of the memory cell based on a second detection timing.11-19-2009
20100277985Verification Method for Nonvolatile Semiconductor Memory Device - The present invention provides nonvolatile semiconductor memory devices which operate with low power consumption. In a nonvolatile semiconductor memory device, a plurality of nonvolatile memory elements are connected in series. The plurality of nonvolatile memory elements include a semiconductor layer including a channel forming region and a control gate provided to overlap with the channel forming region. Operations of write, erase, a first read, and a second read in a verify operation of data to the nonvolatile memory elements, are conducted by changing voltage to the control gates of the nonvolatile memory elements. The second read in the verify operation after erase operation is conducted by changing only one of a potential of the control gate of a nonvolatile memory element which are selected from the plurality of nonvolatile memory elements, and as the potential, a potential different from a potential of the first read is used.11-04-2010
20100284227METHOD OF OPERATING NONVOLATILE MEMORY DEVICE - A method of operating a nonvolatile memory device includes determining whether a program operation is performed on even memory cells coupled to even bit lines of a selected page, setting a coupling resistance value between odd bit lines of the selected page and page buffers depending on whether the program operation for the even memory cells is performed, performing a program operation on the odd memory cells coupled to the odd bit lines, and coupling the odd bit line to the page buffer based on the set coupling resistance value and performing an verification operation for verifying whether threshold voltages of the odd memory cells on which the program operation is performed are a target voltage or more.11-11-2010
20090003078Program-verify method - Methods and devices are disclosed, such methods comprising applying a verify pass-through voltage to unselected select lines of the floating-gate memory array that is greater than a read pass-through voltage applied to the unselected select lines. Other methods involve utilizing a cell current for reading a value from one or more memory cells in program-verify operations that is lower than a cell current for reading value from one or more memory cells in read operations.01-01-2009
20080232171Phase change memory with program/verify function - A phase change memory includes a plurality of cells for storing data in the form of respective resistance levels, addressing circuits for addressing cells to be programmed, and the resistance levels are determined from comparison of cell currents of addressed cells with a reference current. A reference generator provides the sense amplifier with the reference current. The reference generator is provided with a reference select circuit to select the reference current from a plurality of verify currents based on program data to be stored in the cell.09-25-2008
20080273395Expanded programming window for non-volatile multilevel memory cells - Embodiments of the present disclosure provide methods, devices, modules, and systems for utilizing an expanded programming window for non-volatile multilevel memory cells. One method includes associating a different logical state with each of a number of different threshold voltage (Vt) distributions. In various embodiments, at least two Vt distributions include negative Vt levels. The method includes applying a read voltage to a word line of a selected cell while applying a pass voltage to word lines of unselected cells, applying a boost voltage to a source line coupled to the selected cell, applying a voltage greater than the boost voltage to a bit line of the selected cell, and sensing a current variation of the bit line in response to the selected cell changing from a non-conducting state to a conducting state.11-06-2008
20080291739METHODS OF PROGRAMMING NON-VOLATILE SEMICONDUCTOR MEMORY DEVICES USING DIFFERENT PROGRAM VERIFICATION OPERATIONS AND RELATED DEVICES - A method of programming a non-volatile memory device includes receiving data to be programmed into memory cells of the memory device, programming the memory cells with the data, and selectively performing one of a plurality of program verify operations based on a current program loop number to determine whether the memory cells have been successfully programmed. For example, one of a wired-OR pass/fail check operation and a Y-scan pass/fail check operation may be performed according to the current program loop number. Related methods and devices are also discussed.11-27-2008
20080304326METHOD OF ERASING IN NON-VOLATILE MEMORY DEVICE - An erasing method of post-programming in a nonvolatile memory device. The method includes post-programming dummy memory cells; verifying whether threshold voltages of the dummy memory cells are greater than or equal to a first voltage; post-programming normal memory cells; and verifying whether threshold voltages of the normal memory cells are greater than or equal to a second voltage. The first voltage is different from the second voltage.12-11-2008
20080212374Novel Multi-State Memory - Maximized multi-state compaction and more tolerance in memory state behavior is achieved through a flexible, self-consistent and self-adapting mode of detection, covering a wide dynamic range. For high density multi-state encoding, this approach borders on full analog treatment, dictating analog techniques including A to D type conversion to reconstruct and process the data. In accordance with the teachings of this invention, the memory array is read with high fidelity, not to provide actual final digital data, but rather to provide raw data accurately reflecting the analog storage state, which information is sent to a memory controller for analysis and detection of the actual final digital data.09-04-2008
20110267893NON-VOLATILE SEMICONDUCTOR MEMORY AND MEMORY SYSTEM - A non-volatile semiconductor memory determines that a given memory cell in an array is at a predetermined threshold voltage in a determination circuit by comparing a current of the memory cell with a reference current in a sense amplifier circuit. A reference current generation circuit includes a current variable device adjusting the reference current. A current adjustment amount calculator receives address information of the memory cell of which threshold voltage is determined and calculates a current adjustment amount corresponding to the address information. The current variable device adjusts the reference current based on the calculated current adjustment amount. Therefore, even when characteristics of interconnects coupled to the sense amplifier circuit, the target memory cell, and the sense amplifier vary, an offset amount between an actual threshold and an apparent threshold is eliminated to reduce electric stress applied to the memory cell in a rewrite operation.11-03-2011
20110205805NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND MEMORY SYSTEM - A semiconductor memory device executes a writing operation based on a first bit assignment pattern at the time of writing. The first bit assignment pattern is created such that pieces of x-bit data assigned to adjacent threshold distributions have only a one-bit difference therebetween and an alignment of data on the same digit of 208-25-2011
20080205159VERIFICATION PROCESS OF A FLASH MEMORY - A verification process is disclosed for verifying correctness of a data status of a flash memory after data of the flash memory is altered. The flash memory has a plurality of memory cells array and a volatile memory. The verification process includes reading memory-cell verification data stored in the volatile memory, wherein the memory-cell verification data is for indicating a previous verification result of each memory cell is ‘success’ or ‘failure’; and performing a verification procedure on the memory cells failed in previous verification according to the memory-cell verification data, but not on the remained memory cells successful in previous verification.08-28-2008
20110205806SEMICONDUCTOR MEMORY DEVICE - According to one embodiment, a semiconductor memory device includes memory cells, holding circuits, and a logical gate chain. The memory cells are associated with columns. The holding circuits are associated with the columns and capable of holding first information indicating whether associated one of the columns is a verify-failed column or not. The logical gate chain includes a plurality of first logical gates associated with the columns and connected in series. Each of the first logical gates outputs a logical level to a next-stage first logical gate in a series connection. The logical level indicates whether the verify-failed column exists or not based on the first information in associated one of the holding circuit. The content indicated by the logical level output from each of the first logical gates is inverted using one of the first logical gates associated with the verify-failed column as a border.08-25-2011
20100271883METHOD OF ERASING IN NON-VOLATILE MEMORY DEVICE - An erasing method in a nonvolatile memory device is disclosed. The method includes post-programming dummy memory cells; verifying whether threshold voltages of the dummy memory cells are greater than or equal to a first voltage; post-programming normal memory cells; and verifying whether threshold voltages of the normal memory cells are greater than or equal to a second voltage. The first voltage is different from the second voltage, and the post-programming of the dummy memory cells comprises: applying a program voltage to a plurality of dummy word lines coupled to the dummy memory cells to post-program the dummy memory cells; and applying a pass voltage to a plurality of normal word lines coupled to the normal memory cells so that the normal memory cells are not post-programmed.10-28-2010
20090180329PROGRAM METHOD OF NONVOLATILE MEMORY DEVICE - According to an aspect of a program method of a nonvolatile memory device, a first program operation for programming a first data stored in a first latch may be performed and a cache program signal may be input for inputting a second data to be programmed subsequently. When the cache program signal is input, a determination is made as to whether a first program verify operation is being performed, and if so, the verify operation is stopped, the second data is input, and the first program verify operation is restarted.07-16-2009
20110188320MEMORY DEVICES AND METHODS OF THEIR OPERATION INCLUDING SELECTIVE COMPACTION VERIFY OPERATIONS - Memory devices and methods of their operation, where following an erasure of a string of memory cells, a selective compaction verify operation is performed on one or more, but less than all, of the memory cells of the string, and, if the selective compaction verify operation indicates compaction is desired, a soft programming pulse is applied to one or more of the memory cells of the string.08-04-2011
20110188319NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND NONVOLATILE SEMICONDUCTOR MEMORY SYSTEM - A nonvolatile semiconductor memory device and a nonvolatile memory system having a unit which suppresses erroneous reading of a nonvolatile semiconductor memory device of a multi-level memory system are provided. In the nonvolatile semiconductor memory device and the nonvolatile memory system of the multi-level memory system, a first verify voltage is used when data is written before a packaging process, and the verify voltage is switched to a second verify voltage lower than the first verify voltage when data is written after the packaging process.08-04-2011
20110188318Flash Memory Device and a Method of Verifying the Same - Provided are a flash memory device and a method of verifying the same. The flash memory device includes: a memory cell for storing data; a sense amplifier for reading information of the memory cell; a load current input device for providing a load current to the sense amplifier; and a control circuit for controlling the load current input device to provide a load current during a memory cell reading operation, verifying the memory cell by using a program verify voltage if the memory cell is a programmed memory cell, and verifying the memory cell by using a compensated erase verify voltage if the memory cell is an erased memory cell.08-04-2011
20110188317NON-VOLATILE MEMORY WITH FAST BINARY PROGRAMMING AND REDUCED POWER CONSUMPTION - In a non-volatile storage system, the time needed to perform a programming operation is reduced by minimizing data transfers between sense modules and a managing circuit. A sense module is associated with each storage element. Based on write data, a data node in the sense module is initialized to “0” for a storage element which is to remain in an erased state, and to “1” for a storage element which is to be programmed to a programmed state, then flipped to “0” when programmed is completed. The managing circuit is relieved of the need to access the write data to determine whether a “0” represents a storage element for which programming is completed. Power consumption can also be reduced by keeping a bit line voltage high between a verify phase of one program-verify iteration and a program phase of a next program-verify iteration.08-04-2011
20110205807SEMICONDUCTOR MEMORY DEVICE AND DATA WRITE METHOD THEREOF - A semiconductor memory device includes a control circuit. The control circuit executes control to perform a verify operation with respect to only a lowest threshold voltage level of a memory cell at a time of a data write operation, and to skip the verify operation with respect to the other threshold voltage levels. The control circuit determines whether a verify pass bit number of the lowest threshold voltage level, which is counted by a bit scan circuit, is a prescribed bit number or more, and the control circuit further executes control, if the verify pass bit number is the prescribed bit number or more, to perform the verify operation with respect to only the lowest threshold voltage level and a threshold voltage level that is higher than the lowest threshold voltage level, and to skip the verify operation with respect to the other threshold voltage levels.08-25-2011
20120287721Programming Method for Nonvolatile Semiconductor Memory Device - A method for programming a plurality of memory cells of a nonvolatile semiconductor memory device comprises the steps of: sequentially performing a plurality of divide-by-2 operations on the plurality of memory cells; generating a plurality of reduced groups from the memory cells after each of the divide-by-2 operations is performed; sequentially programming the memory cells of each reduced group; generating a final group after a final divide-by-2 operation is performed; programming the memory cells of the final group; and verifying whether the memory cells of the final group are completely programmed. The memory cells of the final group are composed of all the memory cells of the nonvolatile semiconductor memory device and the verifying step is only performed after the step of programming the memory cells of the final group.11-15-2012
20110222354METHOD AND SYSTEM FOR MINIMIZING NUMBER OF PROGRAMMING PULSES USED TO PROGRAM ROWS OF NON-VOLATILE MEMORY CELLS - A flash memory device programs cells in each row in a manner that minimizes the number of programming pulses that must be applied to the cells during programming. The flash memory device includes a pseudo pass circuit that determines the number of data errors in each of a plurality of subsets of data that has been programmed in the row. The size of each subset corresponds to the number of read data bits coupled from the memory device, which are simultaneously applied to error checking and correcting circuitry. During iterative programming of a row of cells, the pseudo pass circuit indicates a pseudo pass condition to terminate further programming of the row if none of the subsets of data have a number of data errors that exceeds the number of data errors that can be corrected by the error checking and correcting circuitry.09-15-2011
20130121082METHOD OF OPERATING NONVOLATILE MEMORY DEVICE - A method of operating a nonvolatile memory device includes determining whether a program operation is performed on even memory cells coupled to even bit lines of a selected page, setting a coupling resistance value between odd bit lines of the selected page and page buffers depending on whether the program operation for the even memory cells is performed, performing a program operation on the odd memory cells coupled to the odd bit lines, and coupling the odd bit line to the page buffer based on the set coupling resistance value and performing an verification operation for verifying whether threshold voltages of the odd memory cells on which the program operation is performed are a target voltage or more.05-16-2013
20130121083NON-VOLATILE MEMORY DEVICE, METHOD OF OPERATING THE SAME, AND ELECTRONIC DEVICE HAVING THE SAME - In one embodiment, the method includes detecting a noise level of a common source line, and adjusting a frequency of program-verify operations on a memory cell during a programming loop based on the detected noise level.05-16-2013
20110141819SEGMENTED BITSCAN FOR VERIFICATION OF PROGRAMMING - A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.06-16-2011
20110141817SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR CONTROLLING THE SAME - According to one embodiment, a semiconductor memory device includes a plurality of memory cells, and a plurality of latch circuits. The memory cells are associated with columns and are capable of storing data. The latch circuits are associated with the columns and are capable of storing write data and/or read data for the columns. The latch circuits are selectively activated, and activated latch circuits are capable of receiving and/or outputting data.06-16-2011
20090097325PROGRAMMING METHOD OF A NON-VOLATILE MEMORY DEVICE - In a programming method of a non-volatile memory device, a program operation is performed by applying a program voltage to a selected word line and a first pass voltage to unselected word lines. The first pass voltage shifts to a second pass voltage having a level lower than that of the first pass voltage. A verify operation is performed by applying a verify voltage to the selected word line. The verify voltage has a level lower than that of the second pass voltage.04-16-2009
20090244980Method for reducing lateral movement of charges and memory device thereof - Provided is a method and device for reducing lateral movement of charges. The method may include pre-programming at least one memory cell that is in an erased state by applying a pre-programming voltage to the at least one memory cell to have a narrower distribution of threshold voltages than the at least one erased state memory cell and verifying that the pre-programmed memory cell is in the pre-programmed state using a negative effective verifying voltage.10-01-2009
20090316488MEMORY SELF-TEST CIRCUIT, SEMICONDUCTOR DEVICE AND IC CARD INCLUDING THE SAME, AND MEMORY SELF-TEST METHOD - In a semiconductor device, a self-test circuit includes a write part for writing data in a given address of a special region of a nonvolatile memory; a read part for reading the written data from the given address; a verify part for determining whether or not the written data accords with the read data; and a decision part for determining soundness of the nonvolatile memory on the basis of a result of determination made by the verify part. In the case where the written data accords with the read data, the decision part determines that the nonvolatile memory is sound, and in the case where the data do not accord with each other, it determines that the nonvolatile memory is unsound.12-24-2009
20090251971NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE AND MEMORY SYSTEM - According to an aspect of the invention, a non-volatile semiconductor storage device includes: a memory cell array including memory strings, each of the memory strings having: a first end; a second end; and a plurality of memory cells connected in series between the first end and the second end, the memory cells being categorized into memory cell groups; a first end that is one end of the memory string; and a second end that is the other end of the memory string; first selection transistors connected to the respective first ends of the memory strings; a plurality of second selection transistors connected to the respective second ends of the memory strings; bit lines connected to the respective second selection transistors; word lines connected to the memory cells; and a control circuit configured to apply different control voltages to the respective word lines.10-08-2009
20100157687Method for Erasing a Flash Memory Cell or an Array of Such Cells Having Improved Erase Coupling Ratio - A flash memory cell is of the type having a substrate of a first conductivity type having a first region of a second conductivity type at a first end, and a second region of the second conductivity type at a second end, spaced apart from the first end, with a channel region between the first end and the second end. The flash memory cell has a plurality of stacked pairs of floating gates and control gates with the floating gates positioned over portions of the channel region and are insulated therefrom, and each control gate over a floating gate and insulated therefrom. The flash memory cell further has a plurality of erase gates over the channel region which are insulated therefrom, with an erase gate between each pair of stacked pair of floating gate and control gate. In a method of erasing the flash memory cell, a pulse of a first positive voltage is applied to alternating erase gates (“first alternating gates”). In addition, a ground voltage is applied to erase gates other than the first alternating gates (“second alternating gates”). In a second method to erase the flash memory cell, a pulse of a first positive voltage is applied to the first alternating gates and a negative voltage is applied to the second alternating gates and to all control gates.06-24-2010
20100002522Nonvolatile Memory Device for Preventing Program Disturbance and Method of Programming the Nonvolatile Memory Device - A nonvolatile memory device for preventing program disturbances includes a memory cell array block, a word line driver, and a well bias control unit. The memory cell array block includes at least one cell string having a plurality of memory cells serially connected to a bit line and alternately connected to even word lines and odd word lines. After a program verification, the word line driver drives the even word lines with a first voltage and then the odd word lines with the first voltage to drop the even word line to a voltage lower than the first voltage. The well bias control unit floats a bias of a p-well formed by high voltage NMOS transistors that apply corresponding driving voltages to the even word lines and the odd word lines according to an operation mode of a program operation, a read operation, and an erase operation.01-07-2010
20090290426CHARGE LOSS COMPENSATION DURING PROGRAMMING OF A MEMORY DEVICE - In programming a selected word line of memory cells, a first program verify or read operation is performed, after one page of a selected word line is programmed, in order to determine a first quantity of memory cells that have been programmed to a predetermined reference point in the programmed first page distribution. Prior to programming the second page of the selected word line, a second program verify or read operation is performed to determine a second quantity of cells that are still at the reference point. The difference between the first and second quantities is an indication of the quantity of cells that experienced quick charge loss. The difference is used to determine an adjustment voltage for the second page verification operation after programming of the second page.11-26-2009
20100188904MEMORY VOLTAGE CYCLE ADJUSTMENT - The present disclosure includes various method, device, system, and module embodiments for memory cycle voltage adjustment. One such method embodiment includes counting a number of process cycles performed on a first memory block in a memory device. This method embodiment also includes adjusting at least one program voltage, from an initial program voltage to an adjusted voltage, in response to the counted number of process cycles.07-29-2010
20100259994FLASH MEMORY AND DATA ERASING METHOD OF THE SAME - When data erasure of a flash memory is interrupted and restarted from the interrupted point, time required for the data erasure is shortened. A flash memory includes a memory cell(s), a verification circuit, and a power supply circuit. The verification circuit measures a threshold voltage of the memory cell(s) by verifying an erasure state of the memory cell(s). The power supply circuit applies, to the memory cell(s), one or more pulse voltages whose initial pulse voltage has a strength that corresponds to the measured threshold voltage.10-14-2010
20100188903METHOD OF OPERATING NONVOLATILE MEMORY DEVICE - A method of operating a nonvolatile memory device includes performing a first program operation and a first verification operation on memory cells until a cell, having a threshold voltage higher than a first reference voltage, occurs and, when a cell having the threshold voltage higher than the first reference voltage occurs, performing a second program operation and performing a second verification operation using a second reference voltage higher than the first reference voltage.07-29-2010
20090316487Apparatus and method for inhibiting excess leakage current in unselected nonvolatile memory cells in an array - An apparatus and method for operating an array of NOR connected flash nonvolatile memory cells erases the array in increments of a page, block, sector, or the entire array while minimizing sub-threshold leakage current through unselected nonvolatile memory cells. The apparatus has a row decoder circuit and a source decoder circuit for selecting the nonvolatile memory cells for providing biasing conditions for reading, programming, verifying, and erasing the selected nonvolatile memory cells while minimizing sub-threshold leakage current through unselected nonvolatile memory cells.12-24-2009
20100214849PAGE BUFFER CIRCUIT OF NONVOLATILE MEMORY DEVICE AND METHOD OF OPERATING THE SAME - The page buffer of a nonvolatile memory device utilizing a double verification method using first and second verification voltages when performing a program verification operation includes a first latch unit including a first latch configured to store input data and results of a program operation and a first verification operation using the first verification voltage, and a second latch unit including a second latch configured to have a higher latch trip point than the first latch and to store a result of a second verification operation using the second verification voltage, which is less than the first verification voltage, when the first verification operation is performed.08-26-2010
20090073772PROGRAM METHOD WITH OPTIMIZED VOLTAGE LEVEL FOR FLASH MEMORY - A non-volatile memory device and programming process is described that increases the programming voltage of successive programming cycles in relation to the percentage of the data bits that failed programming verification during the previous programming cycle and were not correctly programmed into the memory array. This allows for a faster on average program operation and a more accurate match of the subsequent increase in the programming voltage to the non-volatile memory device, the specific region or row being programmed and any changes due to device wear. In one embodiment of the present invention the manufacturing process/design and/or specific memory device is characterized by generating a failed bit percentage to programming voltage increase profile to set the desired programming voltage delta/increase. In another embodiment of the present invention, methods and apparatus are related for the programming of data into non-volatile memory devices and, in particular, NAND and NOR architecture Flash memory.03-19-2009
20090073771Non-Volatile Memory and Method for Biasing Adjacent Word Line for Verify During Programming - Various programming techniques for nonvolatile memory involve programming a memory cell relative to a target threshold level. The process includes initially programming relative to a first verify level short of the target threshold level by a predetermined offset. Later, the programming is completed relative to the target verify level. For verifying with the first verify level, a virtual first verify level is effectively used where the target threshold level is used on a selected word line and a bias voltage is used on an adjacent unselected word line. Thus, the verify level in a first programming pass or programming phase is preferably virtually offset by biasing one or more adjacent word line instead of actually offsetting the standard verify level in order to avoid verifying at low levels.03-19-2009
20090073770Independent Bi-Directional Margin Control Per Level And Independently Expandable Reference Cell Levels For Flash Memory Sensing - A memory system includes reference level generators that may provide programmable margins, and programmable verify voltage levels. The reference levels may be shifted within a range of voltages with varying differences between reference voltage levels and with different margins and verify levels.03-19-2009
20120033502METHOD OF READING DATA IN NON-VOLATILE MEMORY DEVICE, AND DEVICE THEREOF - A method of reading data in a non-volatile memory device. The method includes reading a plurality of memory cells of a first page in a memory cell array using a first read level, reading a plurality of memory cells of a second page adjacent to the memory cells of the first page using a second read level, determining whether a state of each memory cell of the first page has been changed based on the first read level to verify a threshold voltage of each memory cell of the second page based on the second read level, and revising the state of each memory cell of the second page according to a result of the determination.02-09-2012
20110032768ERASE DEGRADATION REDUCTION IN NON-VOLATILE MEMORY - Methods for erasing a memory device and memory systems are provided, such as those including a non-volatile memory device is erased by using an intermediate erase step prior to a normal erase step. The intermediate erase step is comprised of an erase pulse voltage, applied to the semiconductor well of the selected memory block of memory cells, while edge rows of memory cells are biased at a low positive voltage (e.g., 0.2-2V). An erase verify operation is then performed. If the selected memory block is not erased, a normal memory erase step is then performed in which the same erase pulse voltage is used but all of the rows are biased at ground potential as in a normal erase step. If the memory block is still fails the erase verify operation, the erase pulse voltage is increased and the process repeated.02-10-2011
20090185428OPERATING METHOD OF MULTI-LEVEL MEMORY CELL - An operating method of a memory cell is described, wherein the memory cell has a plurality of threshold voltages. The operating method includes programming the cell from an initial state to a programmed state. The initial state is an erased state having a threshold voltage between the lowest threshold voltage and the highest one among the plurality of threshold voltages.07-23-2009
20090080264SEMICONDUCTOR INTEGRATED CIRCUIT ADAPTED TO OUTPUT PASS/FAIL RESULTS OF INTERNAL OPERATIONS - In a semiconductor integrated circuit, an internal circuit is capable of executing a first operation and a second operation concurrently, and an output circuit outputs to the outside of the semiconductor integrated circuit information indicating whether or not the first operation is being executed and information indicating whether or not the second operation is executable.03-26-2009
20100302865NONVOLATILE MEMORY DEVICE AND METHOD OF OPERATING THE SAME - A nonvolatile memory device comprises a memory cell array comprising memory cells, an operation voltage generation unit configured to generate a first pass voltage when a verification voltage for a memory cell to be programmed is higher than a reference voltage and to generate a second pass voltage lower than the first pass voltage when the verification voltage for the memory cell to be programmed is lower than the reference voltage, a high voltage switch unit configured to transfer the first or second pass voltage to global word lines other than a selected global word line and to transfer the verification voltage to the selected global word line of the global word lines, and a block selection unit coupled between the global word lines and word lines and configured to transfer the verification voltage and the first or second pass voltage to the word lines.12-02-2010
20110242903SEMICONDUCTOR MEMORY DEVICE CAPABLE OF SHORTENIN ERASE TIME - In a memory cell array, a plurality of memory cells connected to a plurality of word lines and a plurality of bit lines are arranged in a matrix. A control circuit controls the potentials of said plurality of word lines and said plurality of bit lines. In an erase operation, the control circuit erases an n number of memory cells (n is a natural number equal to or larger than 2) of said plurality of memory cells at the same time using a first erase voltage, carries out a verify operation using a first verify level, finds the number of cells k (k≦n) exceeding the first verify level, determines a second erase voltage according to the number k, and carries out an erase operation again using the second erase voltage.10-06-2011
20090141561METHOD OF OPERATING A NON-VOLATILE MEMORY DEVICE - In a method of operating a non-volatile memory device subdivided verifications are performed by increasing verify voltages. Accordingly, threshold voltage distributions of memory cells can be narrowed and, therefore, the program performance of a flash memory device can be improved.06-04-2009
20130148433OPERATING METHOD IN A NON-VOLATILE MEMORY DEVICE - A method of verifying a non-volatile memory device includes precharging a bit line to a high level through a sensing node by applying a first voltage to a bit line select transistor coupled between the bit line and the sensing node; applying a verifying voltage to a plurality of word lines; disconnecting the bit line from the sensing node; and coupling the bit line to the sensing node by applying a second voltage to the bit line select transistor so as to detect a level of the bit line, the second voltage being smaller than the first voltage, wherein, a difference between the first voltage and the second voltage in a verifying operation is higher than a difference between a first voltage and a second voltage that are used in a read operation.06-13-2013
20100182844OPERATING METHOD USED IN READ OR VERIFICATION METHOD OF NONVOLATILE MEMORY DEVICE - In an operating method in a read or verification operation of a nonvolatile memory device, selected bit lines are precharged to a logic high level and, at the same time, unselected bit lines are discharged to a logic low level. The selected and unselected bit lines are connected to respective memory cell strings and, concurrently, word lines are supplied with a pass voltage. The connection between the selected and unselected bit lines and the respective memory cell strings is shut off and, concurrently, a selected word line is supplied with a ground voltage. The selected and unselected bit lines and the respective memory cell strings are coupled together and, concurrently, a selected word line is supplied with a reference voltage and an unselected word line is supplied with the pass voltage.07-22-2010
20090067254NON-VOLATILE MEMORY DEVICE AND A METHOD OF PROGRAMMING A MULTI LEVEL CELL IN THE SAME - A method of programming a multi level cell in a non-volatile memory device includes providing different data to main cells and indicator cells. The main cells and indicator cells have different threshold voltages in accordance with the data. A program operation is performed on a main cell and an indicator cell. A first verifying operation is performed based on a first verifying voltage of the main cell and the indicator cell. The program operation and the first verifying operation are performed repeatedly until a threshold voltage of a first cell of the indicator cells is higher than the first verifying voltage. A second verifying operation is performed on the main cell based on a second verifying voltage when the threshold voltage of the first cell is higher than the first verifying voltage.03-12-2009
20110122706OPERATING METHOD IN A NON-VOLATILE MEMORY DEVICE - A method of verifying a non-volatile memory device to increase the read margin even though a negative verifying voltage is not applied is disclosed. The method of verifying a non-volatile memory device includes coupling a cell string to a bit line precharged to a high level through a sensing node, the cell string being provided between a common source line and the bit line; applying a verifying voltage to a plurality of word lines associated with the cell string; disconnecting the bit line from the sensing node; coupling the common source line to the cell string while the verifying voltage is applied to the word lines, wherein the common source line is applied with a bias voltage higher than a ground voltage; and coupling the bit line to the sensing node so as to detect a level of the bit line.05-26-2011
20090323432NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A nonvolatile semiconductor memory device includes a memory cell which stores data and which is capable of being rewritten electrically, a bit line which is connected electrically to one end of a current path of the memory cell, a control circuit which carries out a verify operation to check a write result after data is written to the memory cell, and a voltage setting circuit which sets a charging voltage for the bit line in a verify operation and a read operation and makes a charging voltage in a read operation higher than a charging voltage in a verify operation.12-31-2009
20090323431NON-VOLATILE MEMORY DEVICE AND PROGRAM METHOD THEREOF - A method of programming a non-volatile memory device employing program loops. Each program loop comprises a programming operation and a subsequent plurality of verifying operations. The method includes preventing the next program loop based on the results of performing the plurality of verifying operations of a current program loop each verifying operation verifying whether the selected memory cell transistors are program-passed. The decision to re-program may be based on a program pass number of the memory cell transistors obtained as a result of the plurality of verifying operations of the current program loop.12-31-2009
20090016117HIGH-SPEED VERIFIABLE SEMICONDUCTOR MEMORY DEVICE - A memory cell stores several data using n (n: natural number more than 1) threshold voltages. A voltage supply circuit supplies a predetermined voltage to a gate of the memory cell in a verify operation of verifying whether or not the memory cell reaches a predetermined threshold voltage. A detection circuit connected to one terminal of the memory cell charges one terminal of the memory cell to a predetermined potential. The detection circuit detects the voltage of one terminal of the memory cell based on a first detection timing, and further, detects the voltage of one terminal of the memory cell based on a second detection timing.01-15-2009
20090016116Method of Programming and Erasing a Non-Volatile Memory Array - A method of processing an array of non-volatile memory cells to program or erase the same, by applying a voltage to the same through a program and verify pulse application circuit. The process includes a first step of selecting a voltage to be applied. Then, the maximum number of memory cells that can be processed simultaneously is determined, based on the selected voltage and characteristics of the memory cells and the circuit. The array is divided into processing groups, each group having a number of cells less than or equal to the maximum determined number. Finally, the voltage is applied to the cells.01-15-2009
20100039864METHODS OF ERASE VERIFICATION FOR A FLASH MEMORY DEVICE - Methods and apparatus are disclosed, such as those involving a flash memory device that includes a memory block. The memory block includes a plurality of data lines extending substantially parallel to one another, and a plurality of memory cells. One such method includes erasing the memory cells; and performing erase verification on the memory cells. The erase verification includes determining one memory cell by one memory cell whether the individual memory cells coupled to one of the data lines have been erased. The method can also include performing a re-erase operation that selectively re-erases unerased memory cells based at least partly on the result of the erase verification.02-18-2010
20090034340NON-VOLATILE MEMORY CONTROL DEVICE - A memory controller outputs an additional writing instruction to one of a plurality of non-volatile memories arbitrarily selected via a writing instruction output unit when a signal which rejects a writing operation is not outputted from writing controllers of the plurality of non-volatile memories for a certain period of time, and outputs a temporary writing instruction to another non-volatile memory at least once via the writing instruction output unit by the time when the additional writing operation is completed in the arbitrary non-volatile memory.02-05-2009
20110176369ERASE VERIFICATION METHOD OF FLASH MEMORY APPARATUS - A suitable erase verification (ERSV) method of a flash memory apparatus is provided, which is different from the conventional ERSV method. That is, by managing the ERSV operation on the flash memory after at least once of erase operation, a flash memory controller in the flash memory apparatus selectively assigns at least one of de-selected sectors instead of all of the de-selected sectors to perform the ERSV. Therefore, by managing the ERSV operation on the flash memory, the time for the ERSV operation thereon is reduced.07-21-2011
20090213661NON-VOLATILE MEMORY DEVICE ADAPTED TO REDUCE COUPLING EFFECT BETWEEN STORAGE ELEMENTS AND RELATED METHODS - A non-volatile semiconductor memory device comprises first and second sub-memory arrays and a strapping line disposed between the first and second sub-memory arrays. A programming operation of the first sub-memory array is performed by simultaneously applying a programming voltage to odd and even bit lines connected to memory cells within the first sub-memory array.08-27-2009
20110075489NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE - Two or more writing prohibition voltages are applied to bit lines connected to memory cell transistors corresponding to the writing voltage of word lines in a writing operation to write data in the memory cell transistors, while increasing the writing voltage of the word line in a stepwise. Two or more selection gate line voltages, corresponding to the writing prohibition voltages applied to the bit lines, are applied to the gates of selection gate transistors.03-31-2011
20110069557NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE - A non-volatile semiconductor storage device according to one aspect has a memory cell array, a first wiring, a second wiring, and a control circuit. The control circuit is configured to, at the time of the write operation, control the write operation in each of the memory strings such that a memory cell positioned closer to the second wiring is subject to the write operation earlier, and the write operation sequentially proceeds to farther memory cells. On the other hand, the control circuit is also configured to, at the time of the read operation, apply a higher voltage to gates of unselected memory cells as a selected memory cell is located at a region closer to the first wiring.03-24-2011
20100246273NONVOLATILE MEMORY DEVICE AND METHOD OF PROGRAMMING THE DEVICE - A nonvolatile memory device and a method of programming the device includes storing first data in first main and sub-registers and storing second data in second main and sub-registers, performing first program and verification operations on first memory cells based on the first data stored in the first main register, storing a result of the first verification operation in the first main register, performing a second program operation on second memory cells based on the second data stored in the second main register, changing the result of the first verification operation, stored in the first main register, into the first data stored in the first sub-register, performing an additional verification operation on the first memory cells on which the first verification operation has been completed, storing a result of the additional verification operation in the first main register, and performing a second verification operation on the second memory cells.09-30-2010
20100259993SEMICONDUCTOR MEMORY DEVICE AND RELATED METHOD OF PROGRAMMING - A method of programming a nonvolatile memory device comprises applying a program voltage to a selected wordline to program selected memory cells, and performing a verify operation by applying a verify voltage to the selected wordline to determine the programming status of the selected memory cells. The verify operation applies the verify voltage to the selected wordline at least two different times to divide the selected memory cells into at least three regions corresponding to different threshold voltage ranges.10-14-2010
20100002523Flash Memory Devices that Utilize Age-Based Verify Voltages to Increase Data Reliability and Methods of Operating Same - Disclosed is a method of verifying a programmed condition of a flash memory device, being comprised of: determining a level of an additional verifying voltage in response to the number of programming/erasing cycles of memory cells; conducting a verifying operation to programmed memory cells with an initial verifying voltage lower than the additional verifying voltage; and selectively conducting an additional verifying operation with the additional verifying voltage to the program-verified memory cells in response to the number of programming/erasing cycles.01-07-2010
20110157998SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SAME - A method of operating a semiconductor memory device comprises performing a third program such that threshold voltages of third memory cells, from among memory cells of a selected page, are higher than a third level, after the third program loop is completed, performing a second program loop such that threshold voltages of second memory cells, from among the memory cells, are lower than the third level, but higher than a second level, and after the second program loop is completed, performing a first program loop such that threshold voltages of first memory cells, from among the memory cells, are lower than the second level, but higher than a first level.06-30-2011
20080247241SENSING IN NON-VOLATILE STORAGE USING PULLDOWN TO REGULATED SOURCE VOLTAGE TO REMOVE SYSTEM NOISE - A pull down circuit pulls a bit line voltage to a regulated source voltage in a non-volatile storage device during a sense operation such as a verify operation which occurs during programming. The storage device may include NAND strings which have associated bit lines and sense components, and a common source line. When a selected storage element of a NAND string has been programmed to its intended state, the bit line is locked out during subsequent verify operations which occur for other NAND strings which are not yet locked out. The pull down device is coupled to each bit line and to the common source line, whose voltage is regulated at a positive DC level, to prevent coupling of system power bus (V10-09-2008
20120269001NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE - A non-volatile semiconductor memory device according to one embodiment of the present invention includes a memory cell array and a control unit. The control unit is configured to control a repeat of an erase operation, an erase verify operation, and a step-up operation. The control unit is configured to perform a soft-programming operation of setting the memory cells from an over-erased state to a first threshold voltage distribution state when, in a series of erase operations, the number of erase voltage applications is more than a first number and less than a second number (the first number10-25-2012
20080198662DYNAMIC VERIFY BASED ON THRESHOLD VOLTAGE DISTRIBUTION - After erasing a plurality of non-volatile storage elements, a soft programming process is performed to tighten the erase threshold distribution for the non-volatile storage elements. During the soft programming process, the system identifies the number of programming pulses needed for a first set of the non-volatile storage elements to complete the soft programming and the number of programming pulses needed for the all but a last set of non-volatile storage elements to complete soft programming. These two numbers are used to characterize the threshold distribution of the non-volatile storage elements. This characterization of the threshold distribution and the program pulse step size are used to limit the number of verify pulses used during subsequent programming.08-21-2008
20120243331SEMICONDUCTOR MEMORY DEVICE - According to one embodiment, a semiconductor memory device includes a cell array, a voltage generator, and a controller. The memory cells are formed along rows and columns. The voltage generator generates a write voltage and a verify voltage. The voltage generator transfers a first voltage to the memory cell having a threshold voltage lower than the verify voltage. The voltage generator transfers a second voltage lower than the first voltage. The controller causes the voltage generator to transfer the verify voltage to the memory cell and to terminate a write operation. The controller performs the writing at least twice.09-27-2012
20120243329MEMORY SYSTEM - According to one embodiment, there is provided memory system including a non-volatile memory device, a monitoring unit, and a changing unit. The non-volatile memory device stores data. The monitoring unit monitors a characteristic of the non-volatile memory device when writing and erasing processes are performed to write and erase the data to and from the non-volatile memory device. The changing unit changes at least one of a value of a writing start voltage and an increase width of a writing voltage in the writing process in accordance with the monitored characteristic so that a time for the writing process is substantially identical to a target value. The writing process is a process in which a writing operation and a verification operation are alternately repeated.09-27-2012
20120243330NONVOLATILE SEMICONDUCTOR STORAGE DEVICE - A nonvolatile semiconductor storage device according to an embodiment includes an erase circuit executing an erase sequence, wherein in the erase sequence, the erase circuit executes: an erase operation to change a selection memory cell group to an erased state, after the erase operation, a soft program operation on the selection memory cell group to solve over-erased state, and after the soft program operation, a first soft program verification operation performed on at least one partial selection memory cell group of a first partial selection memory cell group and a second partial selection memory cell group so as to confirm whether the partial selection memory cell group includes a predetermined number of memory cells or more that have threshold values equal to or more than a predetermined first threshold value, and after the first soft program verification operation.09-27-2012
20100309727METHOD OF OPERATING MEMORY DEVICE HAVING PAGE BUFFER - A method of verifying data in a memory device having a page buffer for performing a program operation, a verifying operation and a read operation, includes: storing data to be programmed in a multi level cell of a first latching circuit in the page buffer; storing reference data set for the verifying operation in a second latching circuit; programming the data stored in the first latching circuit to the multi level cell; and verifying the programming of the data through a first node or a second node in the second latching circuit in accordance with a verifying voltage.12-09-2010
20110007572NAND FLASH MEMORY - A NAND flash memory has memory cell transistors which data is written into. If number of times the program operation has been executed is not equal to the prescribed upper limit number of times, then the program voltage is set so as to be raised by a first potential difference and then the program operation and the verify operation are executed again, and01-13-2011
20080205160Non-volatile memory devices and operating methods thereof - Non-volatile memory devices and operating methods thereof are provided. In an operating method, a first operation is performed by applying a first voltage to at least one word line. The first operation includes one of a programming or erasing operation. The first operation is verified by applying a verify voltage to each of the at least one word lines. The voltage level of each verify voltage is determined according to position information of a corresponding one of the at least one word lines.08-28-2008
20110164458HIGH-SPEED VERIFIABLE SEMICONDUCTOR MEMORY DEVICE - A memory cell stores several data using n (n: natural number more than 1) threshold voltages. A voltage supply circuit supplies a predetermined voltage to a gate of the memory cell in a verify operation of verifying whether or not the memory cell reaches a predetermined threshold voltage. A detection circuit connected to one terminal of the memory cell charges one terminal of the memory cell to a predetermined potential. The detection circuit detects the voltage of one terminal of the memory cell based on a first detection timing, and further, detects the voltage of one terminal of the memory cell based on a second detection timing.07-07-2011
20110255345PROGRAMMING NON-VOLATILE STORAGE INCLUDNG REDUCING IMPACT FROM OTHER MEMORY CELLS - A system for programming non-volatile storage is proposed that reduces the impact of interference from the boosting of neighbors. Memory cells are divided into two or more groups. In one example, the memory cells are divided into odd and even memory cells; however, other groupings can also be used. Prior to a first trigger, a first group of memory cells are programmed together with a second group of memory cells using a programming signal that increases over time. Subsequent to the first trigger and prior to a second trigger, the first group of memory cells are programmed separately from the second group of memory cells using a programming signal that has been lowered in magnitude in response to the first trigger. Subsequent to the second trigger, the first group of memory cells are programmed together with the second group of memory cells with the programming signal being raised in response to the second trigger. Before and after both triggers, the first group of memory cells are verified together with the second group of memory cells.10-20-2011
20100329032METHOD OF PROGRAMMING NONVOLATILE MEMORY DEVICE - A nonvolatile memory device has memory cells coupled to bit lines and word lines and page buffers each coupled to one or more of the bit lines. Program and verification operations are performed on a first logical page from among first and second logical pages included in memory cells selected for a program operation. Data are loaded which will be programmed into the second logical page into first to third latches of a selected page buffer, coupled to the selected memory cells, from among the page buffers. A data setting operation is performed. The second logical page is programmed so that a distribution of threshold voltages of the selected memory cells has one of first to fourth threshold voltage distributions according to states of the data of the first to third latches and performing verification operations for the first to fourth threshold voltage distributions.12-30-2010
20100329030NONVOLATILE MEMORY DEVICE AND METHOD OF PROGRAMMING THE SAME - In a nonvolatile memory device, a cache program operation for the next data is performed in a first latch, and a verification program operation for the current data is performed using a second latch. Thus, data collision can be avoided and execution time can be reduced.12-30-2010
20100329029PAGE BUFFER, NONVOLATILE SEMICONDUCTOR MEMORY DEVICE HAVING THE SAME, AND PROGRAM AND DATA VERIFICATION METHOD - A page buffer includes a sense latch, a data latch and a page buffer controller. The sense latch is connected to a bit line, and is configured to set stored data in response to a sense latch control signal, and to change the stored data in response to a signal applied to the bit line in a data verification operation. The data latch is configured to store multi-bit data to be programmed in a program operation, and to set stored data in response to a data latch control signal in the data verification operation. The page buffer controller is configured to control the bit line in accordance with the multi-bit data stored in the data latch in the program operation, and to output the sense latch control signal and the data latch control signal in accordance with the multi-bit data stored in the data latch in response to a control signal in the data verification operation.12-30-2010
20100329028METHOD OF PERFORMING PROGRAM VERIFICATION OPERATION USING PAGE BUFFER OF NONVOLATILE MEMORY DEVICE - A method of performing a program verification operation in a nonvolatile memory device includes storing program data, programmed into a selected memory cell of a memory cell block, in a page buffer which is coupled to a bit line of the memory cell block via a sense node, controlling a voltage level of the sense node in response to a value of the program data, changing the voltage level of the sense node in response to a program state of the selected memory cell coupled to the bit line, and performing a program verification operation on the selected memory cell by sensing the voltage level of the sense node.12-30-2010
20110069556NAND FLASH MEMORY - A NAND flash memory has a memory cell transistor, the memory cell transistor including a charge storage layer formed over a well of a semiconductor substrate surface via a first insulation film and insulated from surroundings, and a control gate provided over the charge storage layer via a second insulation film, the memory cell transistor storing information according to a threshold voltage which depends on a charge quantity retained by the charge storage layer; and a control circuit which controls operation of the memory cell transistor by controlling a voltage applied to the control gate and a voltage applied to the well.03-24-2011
20110134704NONVOLATILE MEMORY DEVICE AND METHOD OF OPERATING THE SAME - A nonvolatile memory device includes a cell string, including a drain select transistor coupled to a bit line, a source select transistor coupled to a common source line, and memory cells coupled in series between the drain select transistor and the source select transistor, a latch unit, including a first latch for storing a detection result of a threshold voltage of a second memory cell adjacent to a first memory cell selected from among the memory cells and a second latch for storing a detection result of a threshold voltage of the first memory cell, and a first reset unit electrically coupled between the first and second latches and configured to reset the second latch, during a time in which a read operation is performed on the first memory cell, in response to a first reset signal and the detection result stored in the first latch.06-09-2011
20110080791NONVOLATILE MEMORY DEVICE AND RELATED METHOD OF OPERATION - A method of programming a nonvolatile memory device comprises programming memory cells by performing a plurality of program loops with bitline precharging inactivated during program verification operations of some of the program loops, and with bitline precharging activated during program verification operations of some of the program loops.04-07-2011
20080219057Non-Volatile Memory With Cache Page Copy - A non-volatile memory and methods includes cached page copying using a minimum number of data latches for each memory cell. Multi-bit data is read in parallel from each memory cell of a group associated with a first word line. The read data is organized into multiple data-groups for shuttling out of the memory group-by-group according to a predetermined order for data-processing. Modified data are returned for updating the respective data group. The predetermined order is such that as more of the data groups are processed and available for programming, more of the higher programmed states are decodable. An adaptive full-sequence programming is performed concurrently with the processing. The programming copies the read data to another group of memory cells associated with a second word line, typically in a different erase block and preferably compensated for perturbative effects due to a word line adjacent the first word line.09-11-2008
20100214850SEMICONDUCTOR MEMORY DEVICE AND METHOD OF ERASING DATA THEREIN - A semiconductor memory device includes a memory cell array of NAND cell units. The NAND cell unit includes a plurality of electrically erasable programmable nonvolatile memory cells connected serially, and a first and a second selection transistor provided to connect both ends of the memory cells to a bit line and a source line, respectively. The semiconductor memory device also includes dummy cells inserted in the NAND cell unit adjacent to the first and second selection transistors, respectively. The dummy cells in the NAND cell unit are erased simultaneously with the memory cells under a weaker erase potential condition than that for the memory cells and set in a higher threshold distribution than an erased state of the memory cells.08-26-2010
20100195403ERASE VERIFY IN MEMORY DEVICES - In one or more embodiments, methods for erasing memory devices, and a memory system are disclosed, one such method comprising determining which cells of a sample are not erased, either directly or indirectly. The number of unerased cells in the sample can be compared to a threshold. An erase operation can be performed on the memory block responsive to the comparison until the number of unerased cells is less than the threshold.08-05-2010
20090175087METHOD OF VERIFYING PROGRAMMING OPERATION OF FLASH MEMORY DEVICE - A method is provided for verifying a programming operation of a flash memory device. The flash memory device includes at least one memory string in which a string selection transistor, multiple memory cells and a ground selection transistor are connected in series, and the programming operation is performed with respect to a selected memory cell in the memory string. The method includes applying a voltage, obtained by adding a threshold voltage of the string selection transistor to a power supply voltage, to a string selection line connected to the string selection transistor; applying a ground voltage to wordlines connected to each of the memory cells and a ground selection line connected to the ground selection transistor; precharging a bitline connected to the memory string to the power supply voltage; and determining whether a programming operation of the selected memory cell is complete.07-09-2009
20100027350FLASH MEMORY PROGRAMMING AND VERIFICATION WITH REDUCED LEAKAGE CURRENT - A flash memory system configured in accordance with an example embodiment of the invention employs a virtual ground array architecture. During programming operations, target memory cells are biased with a positive source bias voltage to reduce or eliminate leakage current that might otherwise conduct through the target memory cells. A positive source bias voltage may also be applied to target memory cells during verification operations (program verify, soft program verify, erase verify) to reduce or eliminate leakage current that might otherwise introduce errors in the verification operations.02-04-2010
20110216602FLASH MEMORY DEVICES WITH SELECTIVE BIT LINE DISCHARGE PATHS AND METHODS OF OPERATING THE SAME - Provided is a flash memory device that can include a memory cell configured to store data, a local bit line that is connected to the memory cell, a global bit line that is connected to the local bit line, a discharge transistor that is connected to the global bit line, and that is configured to selectively connect the global bit line to a reference level responsive to a discharge control signal, and a discharge control circuit, that is connected to the discharge transistor via the discharge control signal, and that is configured to selectively disable the discharge transistor during an erase interval occurring before a verify interval of an erase verification operation carried out by the flash memory device.09-08-2011
20110051524Method and apparatus for operation of a NAND-like dual charge retaining transistor NOR flash memory device - A method and apparatus for operation for the NAND-like dual charge retaining transistor NOR flash memory cells begins by erasing, verifying over-erasing the threshold voltage level of the erased charge retaining transistors to an erased threshold voltage level. Then method progresses by programming one of two charge retaining transistors of the NAND-like dual charge retaining transistor NOR flash memory cells to a first programmed threshold voltage level, and programming the other of the two charge retaining transistors of the NAND-like dual charge retaining transistor NOR flash memory cells to the first programmed threshold voltage level or to a second programmed threshold voltage level. Combinations of the erased threshold voltage level and the first and second programmed threshold voltage levels determine an internal data state of the NAND-like dual charge retaining transistor NOR flash memory cells which are then decoded to ascertain the external data logical state.03-03-2011
20110051523SMALL UNIT INTERNAL VERIFY READ IN A MEMORY DEVICE - Methods for small unit internal verify read operation and a memory device are disclosed. In one such method, expected data is programmed into a grouping of columns of memory cells (e.g., memory block). Mask data is loaded into a third dynamic data cache of three dynamic data caches. The expected data is loaded into a second data cache. After a read operation of programmed columns of memory cells, the read data is compared to the expected data and error bit indicators are stored in the second data cache in the error bit locations. The second data cache is masked with the mask data so that only those error bits that are unmasked are counted. If the number of unmasked error bit indicators is greater than a threshold, the memory block is marked as unusable.03-03-2011
20090097326NAND FLASH MEMORY DEVICE HAVING DUMMY MEMORY CELLS AND METHODS OF OPERATING SAME - A NAND flash memory device includes a control circuit configured to apply, during a program operation, a first word line voltage to non-selected ones of a plurality of serially-connected memory cells, a second word line voltage greater than the first word line voltage to a selected one of the plurality of memory cells, and a third word line voltage lower than the first word line voltage to a dummy memory cell connected in series with the plurality of memory cells. In other embodiments, a control circuit is configured to program a dummy memory cell before and/or after each erase operation on a plurality of memory cells connected in series therewith. In still other embodiments, a control circuit is configured to forego erasure of a dummy memory cell while erasing a plurality of memory cells connected in series therewith.04-16-2009
20120307565METHOD FOR OPERATING NON-VOLATILE MEMORY DEVICE - A method for operating a non-volatile memory device includes performing an erase operation onto a memory block including a plurality of memory cells, and performing a first soft program operation onto all the memory cells of a string, after the erase operation, grouping word lines of the string into a plurality of word line groups, and performing a second soft program operation onto memory cells coupled with the word lines of each word line group.12-06-2012
20110085385Nonvolatile Memory Devices Having Dummy Cell and Bias Methods Thereof - Provided are nonvolatile memory devices and methods of operating thereof. The nonvolatile memory devices include: dummy cells connected to a dummy bit line; and a dummy bit line bias circuit providing a dummy bit line voltage to the dummy bit line during a program operation, wherein, due to the dummy bit line voltage, at least one of the dummy cells is programmed with a threshold voltage lower than the top programmed state and higher than an erased state during the program operation.04-14-2011
20120206977SEMICONDUCTOR MEMORY SYSTEM CAPABLE OF SUPPRESSING CONSUMPTION CURRENT - According to one embodiment, a semiconductor memory system includes a first semiconductor memory device, a second semiconductor memory device, and a wiring line. The wiring line is connected between the first semiconductor memory device and the second semiconductor memory device. When one of the first and second semiconductor memory devices discharges electric charge, the other of the first and second semiconductor memory devices receives the discharged electric charge through the wiring line.08-16-2012
20120063234MEMORY SYSTEM HAVING NONVOLATILE SEMICONDUCTOR MEMORIES - According to one embodiment, a memory system includes a first nonvolatile semiconductor memory, a second nonvolatile semiconductor memory and a controller. The first memory has memory cells and executes a first operation that is at least one of write, read, and erase operations with respect to the memory cells. The first operation includes a first sub-operation and a second-sub operation that consume a current which is equal to or higher than a predetermined current. The second memory has memory cells and executes a second operation that is at least one of write, read, and erase operations with respect to the memory cells. The second operation includes a third sub-operation and a fourth sub-operation that consume a current which is equal to or higher than the predetermined current. The controller controls the first operation and the second operation of the first memory and the second memory.03-15-2012
20120063233EEPROM-based, data-oriented combo NVM design - A nonvolatile memory device has a combination of FLOTOX EEPROM nonvolatile memory arrays. Each FLOTOX-based nonvolatile memory array is formed of FLOTOX-based nonvolatile memory cells that include at least one floating gate tunneling oxide transistor such that a coupling ratio of the control gate to the floating gate of the floating gate tunneling oxide transistor is from approximately 60% to approximately 70% and a coupling ratio of the floating gate to the drain region of the floating gate tunneling oxide transistor is maintained as a constant of is from approximately 10% to approximately 20% and such that a channel length of the channel region is decreased such that during the programming procedure a negative programming voltage level is applied to the control gate and a moderate positive programming voltage level is applied to the drain region to prevent the moderate positive programming voltage level from exceeding a drain-to-source breakdown voltage.03-15-2012
20120206976SEMICONDUCTOR STORAGE DEVICE - A memory includes a sense amplifier connected to one or more of bit lines and configured to sense data stored in the memory cells; and a word line driver configured to control a voltage of one or more of word lines. The memory cells constitute a memory block. The memory cells constitute a memory block being a unit of memory cells on which a data erasing operation is performed. A controller changes an erase condition during the data erasing operation performed on the memory block or a verify condition for a verify check of verifying whether the data has been erased from the memory cells in the memory block, in proportion to a ratio of number of predetermined logical value data to the data in the memory block or the page before the data erasing operation.08-16-2012
20110158000SEMICONDUCTOR MEMORY DEVICE AND METHOD OF PROGRAMMING THE SAME - A semiconductor memory device includes a voltage generator configured to supply a program voltage, a sub-verification voltage, or a target verification voltage to memory cells selected during a program operation, page buffers configured to latch first data according to results from comparing threshold voltages of the selected memory cells with the sub-verification voltage and latch second data according to results from comparing the threshold voltages of the memory cells with the target verification voltage, a sub-pass check circuit configured to output a sub-pass signal in response to the first data outputted from the page buffers, a main pass check circuit configured to output a main pass signal in response to the second data outputted from the page buffers, and a control circuit configured to control whether the voltage generator supplies the sub-verification voltage and the target verification voltage in response to the sub-pass signal and the main pass signal.06-30-2011
20110157999METHOD OF OPERATING SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device is operated by reading data stored in LSB and MSB pages of a first word line in response to a read command and storing the read data in first and second latches of a page buffer, outputting the data stored in the first latch externally and transferring the data, stored in the second latch, to a third latch of the page buffer, resetting the first and second latches, reading data stored in LSB and MSB pages of a second word line, and storing the read data in the first and second latches, and sequentially outputting the data stored in the first latch and the data stored in the third latch, resetting the third latch, and then transferring the data stored in the second latch to the third latch.06-30-2011
20110157997NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE, METHOD OF READING DATA THEREFROM, AND SEMICONDUCTOR DEVICE - A control circuit is configured to performs, in a write operation to a memory cell and a verify operation for verifying a threshold voltage of the memory cell, a voltage control to provide the memory cell with threshold voltage distributions. The circuit is configured to apply, in a read operation from the memory cell, to a selected memory cell a read voltage between the lower and upper limits of the threshold voltage distributions, and apply to an unselected memory cell a first read-pass voltage higher than the upper limit of a first threshold voltage distribution that is the maximum distribution of the threshold voltage distributions. The circuit is configured to apply, at least during a verify operation in a first write operation conducted before a second write operation that completes writing to the first threshold voltage distribution, a second read-pass voltage lower than the first read-pass voltage to the unselected memory cell, and apply to the semiconductor layer and the source-line a positive voltage.06-30-2011
20120044771METHOD OF PROGRAMMING NON-VOLATILE MEMORY DEVICE AND APPARATUSES FOR PERFORMING THE METHOD - A non-volatile memory device is provided. The non-volatile memory device includes a cell string including a plurality of non-volatile memory cells; and an operation control block configured to supply a program voltage to a word line connected to a selected non-volatile memory cell among the plurality of non-volatile memory cells during a program operation, configured to supply a first negative voltage to the word line during a detrapping operation, and configured to supply a second negative voltage as a verify voltage to the word line during a program verify operation.02-23-2012
20120002483Non-Volatile Memory And Method With Reduced Neighboring Field Errors - A memory device and a method thereof allow programming and sensing a plurality of memory cells in parallel in order to minimize errors caused by coupling from fields of neighboring cells and to improve performance. The memory device and method have the plurality of memory cells linked by the same word line and a read/write circuit is coupled to each memory cells in a contiguous manner. Thus, a memory cell and its neighbors are programmed together and the field environment for each memory cell relative to its neighbors during programming and subsequent reading is less varying. This improves performance and reduces errors caused by coupling from fields of neighboring cells, as compared to conventional architectures and methods in which cells on even columns are programmed independently of cells in odd columns.01-05-2012
20120002482CHARGE EQUILIBRIUM ACCELERATION IN A FLOATING GATE MEMORY DEVICE VIA A REVERSE FIELD PULSE - Methods for accelerating charge equilibrium in a non-volatile memory device using floating gate memory cells are disclosed. Memory devices and storage systems using charge equilibrium acceleration are also disclosed. In one such method, a programming pulse is applied to the word line to change an amount of charge stored on the floating gate of the memory cells being programmed. A reverse field pulse is then applied to the memory cell using only voltages greater than or equal to about 0 volts. The reverse field pulse accelerates charge equilibrium by moving any electrons trapped in the insulating oxide layers to a stable location so that the threshold voltage is stabilized. After the reverse field pulse, a program verify operation is performed and additional programming pulses and reverse field pulses are applied as needed to properly program the memory cell.01-05-2012
20120008412NONVOLATILE MEMORY DEVICE AND METHOD OF ERASING THE SAME - A method of erasing a nonvolatile memory device includes the steps of supplying an erase voltage to the P well of a semiconductor substrate having a memory cell block disposed therein; performing a first erase verification operation for verifying the erase state of memory cells coupled to the even bit lines of the memory cell block; making a determination of success or failure for the first erase verification operation; and if, as a result of the determination for the first erase verification operation, all the memory cells coupled to the even bit lines are determined to be erased, performing a second erase verification operation for verifying the erase state of memory cells coupled to odd bit lines of the memory cell block.01-12-2012
20100202214VERIFYING AN ERASE THRESHOLD IN A MEMORY DEVICE - In one or more embodiments, a memory device is disclosed as having an erase verify operation that includes a negative bias on the p-well in which the memory cell or cells being erased are formed. After an erase pulse is applied to the selected cells to be erased, the p-well is biased with the negative voltage and the erase verify operation is performed to determine the erased state of the cell(s).08-12-2010
20120206975SEMICONDUCTOR MEMORY APPARATUS AND DATA ERASING METHOD - A data erasing method of a semiconductor memory apparatus may include: if any one threshold voltage of a plurality of memory cells, for which an erase operation has been performed using an erase voltage pulse, is higher than an erase verification voltage, increasing a voltage level of the erase verification voltage applied to a plurality of word lines of the plurality of memory cells until the threshold voltage of the plurality of memory cells is lower than the erase verification voltage, and increasing a voltage level of the erase voltage pulse by an increased voltage level of the erase verification voltage and applying the erase voltage pulse to the plurality of memory cells.08-16-2012
20120106261SYSTEMS AND METHODS FOR ERASING A MEMORY - Methods of erasing a memory, methods of operating a memory, memory devices, and systems. In one such method, an erase block is erased to an intermediate erase voltage before it is erased to a final erase voltage, such as to tighten an erase distribution. Faster erasing cells have their erasing throttled using a positive bias on their access line once a particular number of cells coupled to the access line are erased to the intermediate erase voltage.05-03-2012
20120170376SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF - A semiconductor memory device includes a plurality of memory cells, including an N well formed within a P type region and a P well formed within the N well, a peripheral circuit configured to perform a program, program verify, read, erase, or erase verify operation on memory cells selected from among the memory cells, a voltage supply circuit configured to generate a positive voltage and a negative voltage for the program, program verify, read, erase, or erase verify operation, and a control circuit configured to control the peripheral circuit and the voltage supply circuit so that the program, program verify, read, erase, or erase verify operation is performed and, when the program verify and read operations are performed, different voltage is supplied to the P well and the N well.07-05-2012
20120155186SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SAME - A semiconductor memory device operate during a program verification operation to apply a read voltage to a word line and a pre-charge voltage to a bit line in order to provide output data. A number of fail cells is determined in view of the output data, wherein the number of fail cells is directly related to an increase in voltage on a common source line (CSL) connected to memory cells providing the output data. During a subsequent program verification operation, the level of at least one of the read voltage and the pre-charge voltage is adjusted in response to the number of fail cells.06-21-2012
20120106259Adaptive Control of Programming Currents for Memory Cells - A method includes performing a first programming operation on a plurality of memory cells in a same programming cycle; and performing a verification operation on the plurality of memory cells to find failed memory cells in the plurality of memory cells, wherein the failed memory cells are not successfully programmed in the first programming operation; and performing a second programming operation on the failed memory cells. Passed memory cells successfully programmed in the first programming operation are not programmed in the second programming operation.05-03-2012
20120127803NONVOLATILE SEMICONDUCTOR STORAGE DEVICE - A nonvolatile semiconductor storage device including a NAND cell unit having a first and a second select gate transistor, a plurality of memory cell transistors series connected between the first and second select gate transistors that are coupled to corresponding word lines, and a peripheral circuit erase verifying the NAND cell unit by turning on the first and second select gate transistors, applying a predetermined voltage level on the source line, making a voltage level applied on one or more of the word lines coupled to the memory cell transistors relatively closer to the second select gate transistor larger than that applied on one or more of the word lines coupled to the memory cell transistors relatively closer to the first select gate transistor, and verifying data erase of the memory cell transistors.05-24-2012
20100172188METHOD FOR CONDUCTING OVER-ERASE CORRECTION - A method for conducting an over-erase correction comprises the steps of: conducting a first erase and verification operation; using an FN soft program to correct over-erased cells if bit line leakage is found after the first erase and verification operation; conducting a second erase and verification operation; and using a hot carrier HC soft program to correct over-erased cells if bit line leakage is found after the second erase and verification operation.07-08-2010
20110032770High Temperature Methods for Enhancing Retention Characteristics of Memory Devices - Methods are described for improving the retention of a memory device by execution of a retention improvement procedure. The retention improvement procedure comprises a baking process of the memory device in a high temperature environment, a verifying process of the memory device that checks the logic state of memory cells, and a reprogramming process to program the memory device once again by programming memory cells in a 0-state to a high-Vt state. The baking step of placing the memory device in a high temperature environment causes a charge loss by expelling shallow trapped charges, resulting in the improvement of retention reliability.02-10-2011
20110032769SYSTEM FOR VERIFYING NON-VOLATILE STORAGE USING DIFFERENT VOLTAGES - When performing a data sensing operation, including a verify operation during programming of non-volatile storage elements (or, in some cases, during a read operation after programming), a first voltage is used for unselected word lines that have been subjected to a programming operation and a second voltage is used for unselected word lines that have not been subjected to a programming operation. In some embodiments, the second voltage is lower than the first voltage.02-10-2011
20110032767SEMICONDUCTOR MEMORY, SYSTEM, AND METHOD OF CONTROLLING SEMICONDUCTOR MEMORY - A semiconductor memory includes: a non-volatile memory cell including a floating gate and a memory transistor; a state machine that generates a normal program signal for performing a normal program operation and a verify signal for performing a verify operation and generates a soft program signal for performing a soft program operation when detecting a fail in the verify operation after the normal program operation, whether a threshold voltage of the memory transistor reaches a value being checked in the verify operation; a voltage generating circuit that generates a normal program voltage and a verify voltage based on the normal program signal and the verify signal and generates a soft program voltage based on the soft program signal; and a determination circuit that detects a pass when the threshold voltage reaches the value and detects the fail when the threshold voltage does not reach the value.02-10-2011
20100091573Nonvolatile Memory And Method With Reduced Program Verify By Ignoring Fastest And/Or Slowest Programming Bits - A group of non-volatile memory cells are programmed in a programming pass by a series of incremental programming pulses where each pulse is followed by a program-verify and possibly program-inhibition step. Performance is improved during the programming pass by delayed starting and prematurely terminating the various verify levels that demarcate the multiple memory states. This amounts to skipping the verifying and inhibiting steps of the fastest and slowest programming (fringe) cells of the group. A reference pulse is established when the fastest cells have all been program-verified relative to a first verify level. The starting of what verify level at what pulse will then be delayed relative to the reference pulse. Verifying stops for a given verify level when only a predetermined number of cells remain unverified relative to that given level. Any errors arising from over- or under-programming of the fringe cells are corrected by an error correction code.04-15-2010
20120120731SEMICONDUCTOR MEMORY DEVICE AND RELATED METHOD OF PROGRAMMING - A method of programming a nonvolatile memory device comprises applying a program voltage to a selected wordline to program selected memory cells, and performing a verify operation by applying a verify voltage to the selected wordline to determine the programming status of the selected memory cells. The verify operation applies the verify voltage to the selected wordline at least two different times to divide the selected memory cells into at least three regions corresponding to different threshold voltage ranges.05-17-2012
20120120730METHOD AND APPARATUS FOR ADJUSTING MAXIMUM VERIFY TIME IN NONVOLATILE MEMORY DEVICE - A nonvolatile memory device is programmed by decoding a received address, determining whether the received address is a first type of page address or a second type of page address, adjusting a maximum verify time of a program loop used to verify a program state of page data according to the determined type of page address, and performing a verify operation during the adjusted maximum verify time.05-17-2012
20120120732NONVOLATILE MEMORY DEVICE AND READ METHOD THEREOF - A nonvolatile memory device has improved reliability by compensating a threshold voltage of a flash memory cell. A nonvolatile memory device includes a memory cell array and a voltage generator for supplying a select read voltage to a select word line and an unselect read voltage to unselected word lines when a read operation is performed, and supplying a verify voltage to a select word line and the unselect read voltage to unselected word lines when a program operation is performed. The voltage generator supplies a first unselect read voltage to at least one between an upper word line and a lower word line adjacent to the select word line when the program operation is performed, and supplies a second unselected read voltage to at least one between the upper word line and the lower word line adjacent to the select word line when the read operation is performed.05-17-2012
20100290292SEMICONDUCTOR DEVICE - The present invention provides a semiconductor device having a nonvolatile memory function capable of shortening an erase time and executing data access efficiently. When, under the control of a command register/control circuit, an erase voltage is applied to an embedded erase gate wiring disposed in a memory cell boundary region, and an electrical charge is transferred between a floating gate and an embedded erase gate to thereby perform an erase operation, a read selection voltage is applied to a memory gate line and an assist gate line during the application of the erase voltage to thereby carry out the reading of data.11-18-2010
20120314504SEMICONDUCTOR MEMORY DEVICE - According to one embodiment, a semiconductor memory device includes units each including memory cells, a data bus connected to each of the units and having data lines, holding circuits configured to hold fail information supplied from the unit through the data bus as a verify result after writing data, and provided in association with the data lines, respectively, daisy chain circuits configured to shift a flag includes a logical sum of the fail information held in the holding circuits, and provided in association with the data lines, respectively, and a search circuit configured to search for fail bits in the units based on the flag.12-13-2012
20120127802NON-VOLATILE MEMORY DEVICE, METHOD OF OPERATING THE SAME, AND ELECTRONIC DEVICE HAVING THE SAME - In one embodiment, the method includes receiving an operation command, detecting a noise level of a common source line, and adjusting a number of times to perform an operation on a memory cell in response to the operation command based on the detected noise level.05-24-2012
20120163096NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR CONTROLLING THE SAME - During data read process, a control circuit gives a read voltage to a selected word line connected to a selected memory cell, and gives read pass voltages, for turning on memory cells, to unselected word lines connected to unselected memory cells. The control circuit respectively gives a first read pass voltage, a second read pass voltage, and a third read pass voltage to a first unselected word line adjacent to the selected word line at a side of at least one of a bit line and a source line, a second unselected word line adjacent to the first unselected word line at a side opposite to the selected word line, and a third unselected word line adjacent to the second unselected word line at a side opposite to the selected word line. The second read pass voltage is higher than the third read pass voltage.06-28-2012
20120163095SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device includes a plurality of bit lines connected to memory cells; a sense amplifier connected to the plurality of bit lines; a memory unit configured to hold failure data of the bit lines; and a controller configured to perform control such that if it is judged that there is a failure in a second bit line adjacent to a first bit line selected in writing data on the basis of the failure data for the bit lines, the potential of the second bit line is set to a first potential in at least any one of programming and verification.06-28-2012
20100195405SEGMENTED BITSCAN FOR VERIFICATION OF PROGRAMMING - A set non-volatile storage elements are subjected to a programming process in order to store a set of data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Decisions about whether to continue programming or whether the programming is successful are made based on whether overlapping groups of the non-volatile storage elements have less than a threshold number of non-volatile storage elements that are not properly programmed.08-05-2010
20100195404Method and apparatus for management of over-erasure in NAND-based NOR-type Flash Memory - A method and apparatus for operating an array block of dual charge retaining transistor NOR flash memory cells by erasing the dual charge retaining transistor NOR flash memory cells to set their threshold voltage levels to prevent leakage current from corrupting data during a read operation. Erasure of the array block of NOR flash memory cells begins by selecting one of block section of the array block and erasing, erase verifying, over-erase verifying, and programming iteratively until the charge retaining transistors have their threshold voltages between the lower limit and the upper limit of the first program state. Other block sections are iteratively selected and erased, erased verified, over-erase verified, and programmed repeatedly until the charge retaining transistors have their threshold voltages between the lower limit and the upper limit of the first program state until the entire block has been erased and reprogrammed to a positive threshold level.08-05-2010
20090059674STORAGE APPARATUS, CONTROLLER AND CONTROL METHOD - Proposed is a highly reliable storage apparatus with fast access speed and low power consumption, as well as a controller and control method for controlling such a storage apparatus. This storage apparatus is equipped with a flash memory that provides a storage extent for storing data, a disk-shaped memory device with more data write cycles than the flash memory, and a cache memory with faster access speed than the flash memory. Data provided from a host system is stored in the cache memory, this data is read from the cache memory at a prescribed timing, data read from the cache memory is stored in the disk-shaped memory device, and, when a prescribed condition is satisfied, this data is read from the disk-shaped memory device, and the data read from the disk-shaped memory device is stored in the flash memory.03-05-2009
20120250419METHOD OF CONTROLLING NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - In one embodiment, method of controlling a semiconductor nonvolatile memory device includes determining data written to an adjacent memory cell which is adjacent to a selection memory cell in memory cells configured as a matrix, the selection memory being selected by a program operation for writing the data to the selection memory, and writing the data to the selection memory with controlling an amount of charges injected into the selection memory based on a result of determining the data.10-04-2012
20120250420NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE - A control circuit performs a read operation of reading data held in a memory-cell by supplying a selected word-line with a read voltage that is a voltage between the lower limit and the upper limit of a plurality of threshold-voltage distributions provided to the memory-cell. The control circuit also performs a verify operation of determining whether a write operation is completed by supplying a selected word-line with a verify voltage higher than the read voltage to read the memory cell. The control circuit then performs a data variation determination operation of determining whether the memory-cells connected to a selected word-line each have a threshold voltage equal to or less than a certain value to determine, from among the plurality of memory cells connected to the selected word-line, whether the number of memory cells where data variation has occurred is not less than a certain number.10-04-2012
20120075933PROGRAMMING A MEMORY DEVICE TO INCREASE DATA RELIABILITY - Methods for programming a memory array, memory devices, and memory systems are disclosed. In one such method, the target reliability of the data to be programmed is determined. The relative reliability of different groups of memory cells of the memory array is determined. The data is programmed into the group of memory cells of the array having a relative reliability corresponding to the target reliability.03-29-2012
20120176844READ CONDITIONS FOR A NON-VOLATILE MEMORY (NVM) - A method and memory are provided for determining a read reference level for a plurality of non-volatile memory cells. The method includes: performing a program operation of the plurality of non-volatile memory cells; determining a program level of a least programmed memory cell of the plurality of memory cells; performing an erase operation of the plurality of non-volatile memory cells; determining an erase level of a least erased memory cell of the plurality of memory cells; determining an operating window between the program level and the erase level; and setting the read reference level to be a predetermined offset from the erase level if the operating window is determined to compare favorably to a predetermined value. The memory includes registers for storing the program level and the erase level.07-12-2012
20100008150NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND METHOD OF ERASE VERIFYING THE SAME - A nonvolatile semiconductor storage device including a NAND cell unit having a first and a second select gate transistor, a plurality of memory cell transistors series connected between the first and second select gate transistors that are coupled to corresponding word lines, and a peripheral circuit erase verifying the NAND cell unit by turning on the first and second select gate transistors, applying a predetermined voltage level on the source line, detecting a voltage level of the bit line at once under a state where a voltage level applied on one or more of the word lines coupled to the memory cell transistors relatively closer to the second select gate transistor is arranged higher than that applied on one or more of the word lines coupled to the memory cell transistors relatively closer to the first select gate transistor, and verifying data erase based on the detected voltage.01-14-2010
20100008149FLASH MEMORY DEVICE AND PROGRAMMING METHOD THEREOF - A programming method of a flash memory device having memory cells, and a flash memory device to perform the method, including programming selected memory cells according to loaded data, sensing states of the programmed memory cells and firstly latching the sensed states, and determining whether a program-inhibited memory cell among the selected memory cells has been programmed, with reference to the loaded data and the latched states, before determining whether the selected memory cells have been properly programmed.01-14-2010
20090034339NON-VOLATILE MEMORY HAVING A DYNAMICALLY ADJUSTABLE SOFT PROGRAM VERIFY VOLTAGE LEVEL AND METHOD THEREFOR - An erase operation in a non-volatile memory includes selecting a block on which to perform an erase operation, erasing the selected block, receiving test data corresponding to the selected block, determining a soft program verify voltage level based on the test data, and soft programming the erased selected block using the soft program verify voltage level. A non-volatile memory includes a plurality of blocks, a test block which stores test data corresponding to each of the plurality of blocks, and a flash control coupled to the plurality of blocks and the test block, the flash control determining a soft program verify voltage level for a particular block of the plurality of blocks based on the test data for the particular block when the particular block is being soft programmed.02-05-2009
20120257456SEMICONDUCTOR MEMORY DEVICE AND DATA WRITE METHOD THEREOF - A semiconductor memory device includes a control circuit. The control circuit executes control to perform a verify operation with respect to only a lowest threshold voltage level of a memory cell at a time of a data write operation, and to skip the verify operation with respect to the other threshold voltage levels. The control circuit determines whether a verify pass bit number of the lowest threshold voltage level, which is counted by a bit scan circuit, is a prescribed bit number or more, and the control circuit further executes control, if the verify pass bit number is the prescribed bit number or more, to perform the verify operation with respect to only the lowest threshold voltage level and a threshold voltage level that is higher than the lowest threshold voltage level, and to skip the verify operation with respect to the other threshold voltage levels.10-11-2012
20120081971E/P DURABILITY BY USING A SUB-RANGE OF A FULL PROGRAMMING RANGE - A NAND Flash memory controller is used to perform an erase operation on a NAND Flash memory chip including to a cell on the NAND Flash memory chip; the cell is configured to store a first number of bits. It is determined whether the erase operation performed on the NAND Flash memory chip is successful. In the event it is determined that the erase operation performed on the NAND Flash memory chip is unsuccessful, the number of bits stored by the cell is reduced from the first number of bits to a second number of bits; the second number of bits is strictly less than the first number of bits.04-05-2012
20120230115HIGH-SPEED VERIFIABLE SEMICONDUCTOR MEMORY DEVICE - A memory cell stores several data using n (n: natural number more than 1) threshold voltages. A voltage supply circuit supplies a predetermined voltage to a gate of the memory cell in a verify operation of verifying whether or not the memory cell reaches a predetermined threshold voltage. A detection circuit connected to one terminal of the memory cell charges one terminal of the memory cell to a predetermined potential. The detection circuit detects the voltage of one terminal of the memory cell based on a first detection timing, and further, detects the voltage of one terminal of the memory cell based on a second detection timing.09-13-2012
20120230114SEMICONDUCTOR DEVICE AND METHOD OF DRIVING SEMICONDUCTOR DEVICE - An object is to provide a semiconductor device to reduce variation in the threshold voltages of memory cells after writing, reduce the operation voltage, or increase the storage capacity. The semiconductor device includes memory cells each including a transistor including an oxide semiconductor, a driver circuit that drives the memory cells, a potential generating circuit that generates potentials supplied to the driver circuit, and a write completion detecting circuit that detects all at once whether rewriting of data into the memory cells is completed or not. The driver circuit includes a data buffer, a writing circuit that writes one potential of the potentials into each of the memory cells as data, a reading circuit that reads the data written into the memory cells, and a verifying circuit that verifies whether the read data agrees with the data held in the data buffer or not.09-13-2012
20110122707PAGE BUFFER CIRCUIT, NONVOLATILE MEMORY DEVICE INCLUDING THE PAGE BUFFER CIRCUIT, AND METHOD OF OPERATING THE NONVOLATILE MEMORY DEVICE - A page buffer circuit comprises a bit line selection unit, a latch unit, and a bit line control unit. The bit line selection unit is configured to select a bit line coupled to memory cells. The latch unit comprises a plurality of latch circuits. The plurality of latch circuits is coupled to a sense node and configured to latch data to be programmed into the memory cells or store data from the memory cells. The bit line control unit is coupled to the sense node and configured to temporarily charge a voltage of the selected bit line in response to charge and transfer control signals or transfer the charged voltage to the selected bit line.05-26-2011
20080298133PROGRAM VERIFYING METHOD AND PROGRAMMING METHOD OF FLASH MEMORY DEVICE - A duel program verify operation is performed using first and second verify voltages. In order to reduce the width of a threshold voltage distribution during an incremental step pulse program implementation, data of a corresponding memory cell are verified twice using the first verify voltage and the second verify voltage. During a second verify operation using the second verify voltage, a sensing current is adjusted by controlling voltages applied as a bit line select signal and an evaluation time period. Therefore, the threshold voltage of the memory cell can be measured higher or lower than its actual value and the width of a threshold voltage distribution is reduced.12-04-2008
20120320683COMPENSATING FOR COUPLING DURING PROGRAMMING - Shifts in the apparent charge stored on a floating gate (or other charge storing element) of a non-volatile memory cell can occur because of the coupling of an electric field based on the charge stored in adjacent floating gates (or other adjacent charge storing elements). To compensate for this coupling, the read or programming process for a given memory cell can take into account the programmed state of an adjacent memory cell. To determine whether compensation is needed, a process can be performed that includes sensing information about the programmed state of an adjacent memory cell (e.g., on an adjacent bit line or other location).12-20-2012
20120320682Semiconductor Memory System Including A Plurality Of Semiconductor Memory Devices - A communication line is connected to first and second chips, and held at a first signal level. A monitor circuit changes a signal level of the communication line from the first signal to a second signal level while one of the first and second chips uses a current larger than a reference current. When the signal level of the communication line is the second signal level, the other of the first and second chips is controlled to a wait state that does not transfer to an operating state of using a current larger than the reference current.12-20-2012
20120327718SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF - An operating method of a semiconductor memory device includes performing a first LSB program loop for storing first LSB data in first memory cells of a word line, performing a second LSB program loop for storing second LSB data in second memory cells of the selected word line and for detecting over-erased memory cells having threshold voltages lower than an over-erase reference voltage of a negative potential to raise the threshold voltages to be higher than the over-erase reference voltage, performing a first MSB program loop for storing first MSB data in the first memory cells, and performing a second MSB program loop for storing second MSB data in the second memory cells.12-27-2012
20110038215NON-VOLATILE MEMORY DEVICE AND OPERATING METHOD OF THE SAME - A method for operating a non-volatile memory device includes counting the number of consecutive verify operations performed without a precharge, sensing a temperature, and when the number of verify operations exceeds a set value of verify operations, controlling a level of a sensing bias voltage based on the sensed temperature.02-17-2011
20120269003DATA DECISION METHOD AND MEMORY - A data decision method including checking whether threshold voltages of a plurality of memory cells are greater than a first verification voltage, checking whether the threshold voltages of the plurality of memory cells are greater than a second verification voltage, wherein the second verification voltage is greater than the first verification voltage, and checking threshold voltages of memory cells adjacent to memory cells having threshold voltages greater than the first verification voltage and lower than the second verification voltage among the plurality of memory cells.10-25-2012
20120269000NON-VOLATILE MEMORY DEVICE AND PROGRAM METHOD THEREOF - A method for programming a non-volatile memory device including a plurality of memory cells includes verifying whether the memory cells are programmed or not by applying a program verification bias voltage, which is calculated and stored during an initialization operation preformed before the programming of the memory cells, after a program voltage is applied to word lines of the memory cells.10-25-2012
20120269004MULTIPLE LEVEL PROGRAM VERIFY IN A MEMORY DEVICE - A series of programming pulses are applied to a memory cell to be programmed. A program verify pulse, at an initial program verify voltage, is applied to the memory cell after each programming pulse. The initial program verify voltage is a verify voltage that has been increased by a quick charge loss voltage. The quick charge loss voltage is subtracted from the initial program verify voltage after either a programming pulse has reached a certain reference voltage or a quantity of programming pulses has reached a pulse count threshold.10-25-2012
20120269002PROGRAMMING METHOD FOR NONVOLATILE MEMORY DEVICE - A method of programming memory cells (transistors) of a nonvolatile memory device from a first set of (previous) logic states to a second set of (final) logic states. The method includes applying program voltages to selected memory transistors; and applying a pre-verification voltage and a target verification voltage for verifying the current logic state of the selected memory transistors. The voltage interval between logic states of the second set of logic states is less than the voltage interval between logic states of the first set of logic states. A target verification voltage for verifying a first memory transistor is at one logic state of the second set is used as a pre-verification voltage for verifying that a second memory transistor to be programmed to higher logic state of the second set.10-25-2012
20110235432METHOD OF ERASING IN NON-VOLATILE MEMORY DEVICE - An erasing method of post-programming in a nonvolatile memory device. The method includes post-programming dummy memory cells; verifying whether threshold voltages of the dummy memory cells are greater than or equal to a first voltage; post-programming normal memory cells; and verifying whether threshold voltages of the normal memory cells are greater than or equal to a second voltage. The first voltage is different from the second voltage.09-29-2011
20110235431NONVOLATILE SEMICONDUCTOR MEMORY AND METHOD OF OPERATING THE SAME - According to one embodiment, a nonvolatile semiconductor memory includes memory cells arranged in a memory cell array in the form of a matrix, the memory cell storing data having two or more levels associated with two or more threshold levels, respectively, a buffer circuit including latch circuits and sense amplifier circuits, each latch circuit and each sense amplifier being associated with each column in the memory cell array, and a control circuit configured to control operations of the memory cells and the buffer circuit, the control circuit executing data writing with respect to the memory cells and first verification using judgment information indicative of a result of the data writing in a write sequence with respect to data from the outside. The judgment information is assigned to two or more threshold levels, which are not adjacent to each other, in common.09-29-2011
20100232231SEMICONDUCTOR NONVOLATILE MEMORY DEVICE - An operation scheme for operating stably a semiconductor nonvolatile memory device is provided.09-16-2010
20100232230NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE - When data is written to a memory cell transistor, a write controller controls in such a manner that a verification operation subsequent to a program operation is carried out while a program voltage is increased stepwise for each program operation. The write controller controls in such a manner that a verification operation subsequent to a program operation by which a threshold voltage of a memory cell transistor to be written has become equal to or higher than a verification level for the first time is carried out twice or more at the same verification level, verification operations of the second and subsequent times are carried out after a second program operation which is carried out with the memory cell transistor set in an unselected state.09-16-2010
20120140570EEPROM with Increased Reading Speed - In an EEPROM consisting of a NAND cell in which a plurality of memory cells are connected in series, the control gate voltage V06-07-2012
20120087193FLASH MULTI-LEVEL THRESHOLD DISTRIBUTION SCHEME - A threshold voltage distribution scheme for multi-level Flash cells where an erase threshold voltage and at least one programmed threshold voltage lie in an erase voltage domain. Having at least one programmed threshold voltage in the erase voltage domain reduces the Vread voltage level to minimize read disturb effects, while extending the life span of the multi-level Flash cells as the threshold voltage distance between programmed states is maximized. The erase voltage domain can be less than 0V while a program voltage domain is greater than 0V. Accordingly, circuits for program verifying and reading multi-level Flash cells having a programmed threshold voltage in the erase voltage domain and the program voltage domain use negative and positive high voltages.04-12-2012
20130010541NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A nonvolatile semiconductor memory device includes a memory cell which stores data and which is capable of being rewritten electrically, a bit line which is connected electrically to one end of a current path of the memory cell, a control circuit which carries out a verify operation to check a write result after data is written to the memory cell, and a voltage setting circuit which sets a charging voltage for the bit line in a verify operation and a read operation and makes a charging voltage in a read operation higher than a charging voltage in a verify operation.01-10-2013
20130016565NONVOLATILE MEMORY DEVICE, METHOD OF OPERATING THE SAME AND ELECTRONIC DEVICE INCLUDING THE SAMEAANM Park; Jae-WooAACI Suwon-siAACO KRAAGP Park; Jae-Woo Suwon-si KRAANM Im; Jung-NoAACI Gunpo-siAACO KRAAGP Im; Jung-No Gunpo-si KR - A nonvolatile memory device and a method of operating the same are provided. The method includes performing a plurality of program operations on a plurality of memory cells each to be programmed to one of a plurality of program states, performing a program-verify operation on programmed memory cells associated with each of the plurality of program states, the program-verify operation comprises, selecting one of the plurality of offsets based on a noise level of a common source line associated with a programmed memory cell, using the selected offset to select one of a first verify voltage and a second verify voltage higher than the first verify voltage, and verifying a program state of the programmed memory cell using the first verify voltage and the second verify voltage.01-17-2013
20130016566DETECTING THE COMPLETION OF PROGRAMMING FOR NON-VOLATILE STORAGE - A set of non-volatile storage elements are subjected to a programming process in order to store data. During the programming process, one or more verification operations are performed to determine whether the non-volatile storage elements have reached their target condition to store the appropriate data. Programming can be stopped when all non-volatile storage elements have reached their target level or when the number of non-volatile storage elements that have not reached their target level is less than a number or memory cells that can be corrected using an error correction process during a read operation (or other operation). The number of non-volatile storage elements that have not reached their target level can be estimated by counting the number of non-volatile storage elements that have not reached a condition that is different (e.g., lower) than the target level.01-17-2013
20110158001PROGRAMMING METHOD FOR NONVOLATILE MEMORY DEVICE - A programming method for a nonvolatile memory device includes inputting least significant bit (LSB) data and most significant bit (MSB) data to each of different latches of a page buffer and in the state in which the LSB data and the MSB data have been inputted to the page buffer, performing a programming operation until threshold voltages of selected memory cells reach a target voltage on the basis of the LSB data and the MSB data.06-30-2011
20120243333APPARATUS COMPARING VERIFIED DATA TO ORIGINAL DATA IN THE PROGRAMMING OF MEMORY CELLS - Apparatus configured to perform a programming operation on a row of memory cells in response to original data, and further configured to perform a comparison of verified data of the row of memory cells to the original data following success of the programming of the row of memory cells.09-27-2012
20120243332Non-Volatile Memory and Method with Power-Saving Read and Program-Verify Operations - A non-volatile memory device capable of reading and writing a large number of memory cells with multiple read/write circuits in parallel has features to reduce power consumption during read, and program/verify operations. A read or program verify operation includes one or more sensing cycles relative to one or more demarcation threshold voltages to determine a memory state. In one aspect, selective memory cells among the group being sensed in parallel have their conduction currents turned off when they are determined to be in a state not relevant to the current sensing cycle. In another aspect, a power-consuming period is minimized by preemptively starting any operations that would prolong the period. In a program/verify operation cells not to be programmed have their bit lines charged up in the program phase. Power is saved when a set of these bit lines avoids re-charging at every passing of a program phase.09-27-2012
20120243328NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND DATA ERASE METHOD OF THE SAME - According to one embodiment, a nonvolatile semiconductor memory device includes a memory cell array includes a plurality of pages formed in a common semiconductor region, each of the pages includes a plurality of electrically programmable memory cells, a control circuit configured to performs an erase operation for a selected page, and a verification circuit configured to verify a threshold value of the memory cell array after the erase operation. The verification circuit uses a first erase verification voltage when verifying the selected page, and a second erase verification voltage different from the first erase verification voltage when verifying an unselected page.09-27-2012
20080247240ERASE VERIFYING METHOD OF NAND FLASH MEMORY DEVICE - In an erase verifying method of a NAND flash memory device, a power supply voltage (Vcc) is applied to a second bit line while precharging a first bit line to a first positive voltage. Select transistors are turned on, and a ground voltage is applied to word lines of memory cell transistors. A second positive voltage is applied to source lines to which sources of the select transistors and the memory cell transistors are connected. An erased state of the memory cell transistor is verified according to whether charges accumulated in the first bit line are discharged.10-09-2008
20080239826Semiconductor memory device capable of achieving narrower distribution width of threshold voltages of memory cells and method of data write in the same - When a data write sequence is started, initially, write data is latched in a data latch circuit corresponding to one memory mat. Then, a program pulse is applied to the memory mat, and data read from a memory cell, which is a data write target bit in the memory mat, is performed. Thereafter, verify determination of the memory mat is performed. After a verify operation for the memory mat is completed, a program pulse is applied to another memory mat, and a verify operation for another memory mat is performed.10-02-2008
20080232172FLASH MEMORY DEVICE AND METHOD OF CONTROLLING PROGRAM VOLTAGE - A memory cell array of a NAND flash memory device includes memory cells connected to bit lines and word lines. A page buffer unit includes cell program test circuits configured to program data into a selected memory cell or read data from the memory cell. An IO controller includes a program confirm decision circuit for outputting a cell program confirmation signal when a cell is programmed. A voltage providing unit changes a step of a program voltage according to the cell program confirmation signal and provides the program voltage.09-25-2008
20080225598Flash memory and method for checking status register by block unit - Provided is a test method of a NAND flash memory. The method includes programming a page of a selected memory block in the flash memory; accumulating a program result of the page; and repeating the programming of other pages and the accumulating of the program result of the other pages until all pages in the selected memory block are programmed.09-18-2008
20080225597METHOD OF DETECTING AN UNDER PROGRAM CELL IN A NON-VOLATILE MEMORY DEVICE AND METHOD OF PROGRAMMING THE UNDER PROGRAM CELL USING THE SAME - A method of detecting an under program cell includes detecting second memory cells of programmed first memory cells. A threshold voltage of the second memory cell is higher than a first verifying voltage. A third memory cell is detected in the second memory cells. A threshold voltage of the third memory cell is smaller than a second verifying voltage. A method of programming a cell in a non-volatile memory device includes performing an program operation on selected memory cells. First memory cells are detected in the memory cells on which the program operation is performed. A threshold voltage of the first memory cell is higher than a first verifying voltage. An under program cell is detected in the first memory cells. A threshold voltage of the under program cell is smaller than a second verifying voltage. The under program cell is then programmed.09-18-2008
20080225596HIGH ACCURACY ADAPTIVE PROGRAMMING - Flash memory devices have a plurality of memory cells that can be erased and programmed. Performing a voltage verification check allows a for an appropriate state-change voltage to be applied to the flash memory device. The appropriate state-change voltage is determined though accessing a look-up table. Using an appropriate state-change voltage allows a cell to operate with more overall programming cycles.09-18-2008
20130114345NONVOLATILE MEMORY DEVICE AND DRIVING METHOD THEREOF - According to example embodiments, a nonvolatile memory device includes a plurality of strings having a plurality of serially-connected selection transistors and a plurality of memory cells connected in series to one end of the serially-connected selection transistors. A control logic is configured to perform a program operation for setting a threshold voltage of at least one of the serially-connected selection transistors.05-09-2013
20130100745Method and Apparatus of Performing An Erase Operation On A Memory Integrated Circuit - Various discussed approaches include an improved grouping of edge word lines and center word lines of an erase group during erase verify and erase sub-operations of an erase operation. In another approach, changed voltage levels of edge word lines to address the over-erase issue of the erase group, and also improve erase time performance. Another approach uses dummy word lines.04-25-2013
20110273935MITIGATING CHANNEL COUPLING EFFECTS DURING SENSING OF NON-VOLATILE STORAGE ELEMENTS - Channel coupling effects during verify and read of non-volatile storage are mitigated by matching the amount of channel coupling that occurs during read with channel coupling that occurred during verify. All bit lines may be read together during both verify and read. In one embodiment, first bias conditions are established on bit lines when verifying each of a plurality of programmed states. A separate set of first bias conditions may be established when verifying each state. Biasing a bit line may be based on the state to which a non-volatile storage elements on the bit line is being programmed. A separate set of second bias conditions are established for each state being read. The second bias conditions for a given state substantially match the first bias conditions for the given state.11-10-2011
20130128672PROGRAM METHOD AND FLASH MEMORY USING THE SAME - A program method, applied in a flash memory, includes the following steps. Firstly, a first memory sector and a second memory sector are selected, wherein the first and the second memory sectors respectively correspond to a first word line and a second word line. Next, a first operation phase and a second operation phase are determined. Then, the first word line is biased with a first setup voltage, and the second word line is driven in one of a program operation and a program-verification operation, in the first operation phase. After that, the second word line is biased with a second setup voltage, and the first word line is driven in the other one of the program operation and the program-verification operation in the second operation phase.05-23-2013
20100277984NONVOLATILE SEMICONDUCTOR MEMORY - In an EEPROM consisting of a NAND cell in which a plurality of memory cells are connected in series, the control gate voltage V11-04-2010
20110211396NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND OPERATION METHOD THEREOF - The erase operation of a nonvolatile semiconductor memory is executed by a method including applying an erase pulse to a data erase area in a memory cell array, determining whether the threshold voltage of a memory cell arranged in the data erase area reaches an erase level and outputting a verify result, and determining whether a new erase pulse is applied or a state is shifted to a wait state based on the verify result. The new erase pulse is applied when the threshold voltage does not reach the erase level and the application of the new erase pulse is prohibited and the wait operation is performed when the threshold voltage reaches the erase level.09-01-2011
20130148434SEMICONDUCTOR MEMORY DEVICE AND DATA WRITE METHOD THEREOF - A semiconductor memory device includes a control circuit. The control circuit executes control to perform a verify operation with respect to only a lowest threshold voltage level of a memory cell at a time of a data write operation, and to skip the verify operation with respect to the other threshold voltage levels. The control circuit determines whether a verify pass bit number of the lowest threshold voltage level, which is counted by a bit scan circuit, is a prescribed bit number or more, and the control circuit further executes control, if the verify pass bit number is the prescribed bit number or more, to perform the verify operation with respect to only the lowest threshold voltage level and a threshold voltage level that is higher than the lowest threshold voltage level, and to skip the verify operation with respect to the other threshold voltage levels.06-13-2013
20110235433VERIFYING AN ERASE THRESHOLD IN A MEMORY DEVICE - In one or more embodiments, a memory device is disclosed as having an erase verify operation that includes a negative bias on the p-well in which the memory cell or cells being erased are formed. After an erase pulse is applied to the selected cells to be erased, the p-well is biased with the negative voltage and the erase verify operation is performed to determine the erased state of the cell(s).09-29-2011
20100284226VOLTAGE GENERATION CIRCUIT AND NONVOLATILE MEMORY DEVICE INCLUDING THE SAME - A voltage generation circuit for providing a read or verification voltage of a nonvolatile memory device includes a first voltage generation unit configured to output a first voltage using a first reference voltage, a bouncing compensation unit configured to change the first voltage using a first control signal, the first voltage, and a voltage of a global source line when a read or verification operation is performed on the nonvolatile memory device, and to output a changed first voltage as a second voltage, a second reference voltage generation unit configured to generate a second reference voltage, and an amplification unit configured to amplify a difference between the second voltage and the second reference voltage according to a set resistance ratio and to output a result of the amplification as a third voltage.11-11-2010
20120257455NONVOLATILE MEMORY DEVICES AND METHODS OF OPERATING NONVOLATILE MEMORY DEVICES - Methods of operating nonvolatile memory devices including a plurality of cell strings each having at least one ground selection transistor, a plurality of memory cells, and at least one string selection transistor, the operating methods including receiving a command and an address, determining a voltage applying time in response to the input command and address, and applying a specific voltage to memory cells of cell strings corresponding to the input address during the determined voltage applying time.10-11-2012
20100302864METHOD OF OPERATING NONVOLATILE MEMORY DEVICE - A method of operating a nonvolatile memory device includes performing a reset operation for setting a level of a program voltage to a first level, performing a program operation and a verification operation on memory cells included in a first page of a first memory block while raising the program voltage from the first level, storing a level of the program voltage, supplied to the first page when memory cells programmed to have threshold voltages with at least a verification voltage are detected during the verification operation, as a second level, while raising the program voltage from the second level, performing the program operation and the verification operation on each of second to last pages of the first memory block, and after completing the program operation for the first memory block, performing the reset operation for setting the level of the program voltage to the first level.12-02-2010
20100315880METHOD OF OPERATING NONVOLATILE MEMORY DEVICE - A nonvolatile memory device is operated by, inter alia, performing a program operation on memory cells belonging to a page selected from among a plurality of pages, performing a verification operation on the programmed memory cells, loading a start loop value of a fail bit count set to the selected page, from among start loop values of fail bit counts set to the respective pages, and if a loop value of the program operation is greater than or equal to the start loop value, counting a number of fail bits included in data of the programmed memory cells detected in the verification operation.12-16-2010
20100315879PAGE BUFFER OF NONVOLATILE MEMORY DEVICE AND METHOD OF PERFORMING PROGRAM VERIFICATION OPERATION USING THE SAME - A page buffer of a nonvolatile memory device comprises a sense unit coupled between the sense node and the bit lines of a memory cell array, comprising a number of memory cells, and configured to precharge the bit lines to different voltage levels in response to a page buffer sense signal of a first or second voltage level, a MUX unit configured to output the page buffer sense signal of the first or second voltage level in response to a control signal according to a value of program data, a flag latch configured to temporarily store the program data and to output the control signal to the MUX unit, and a main latch configured to sense the voltage levels of the bit lines via the sense node and to perform a program verification operation.12-16-2010
20130155775METHOD OF OPERATING SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device is operated by reading data stored in LSB and MSB pages of a first word line in response to a read command and storing the read data in first and second latches of a page buffer, outputting the data stored in the first latch externally and transferring the data, stored in the second latch, to a third latch of the page buffer, resetting the first and second latches, reading data stored in LSB and MSB pages of a second word line, and storing the read data in the first and second latches, and sequentially outputting the data stored in the first latch and the data stored in the third latch, resetting the third latch, and then transferring the data stored in the second latch to the third latch.06-20-2013
20130182508SEMICONDUCTOR DEVICE FOR ACCELERATING ERASE VERIFICATION PROCESS AND METHOD THEREFOR - A semiconductor device and a method for accelerating erase verification process thereof are introduced, in which a correction unit of erase verification is connected between broken bit lines of the semiconductor device and a page buffer. Grounding switches in the correction unit of erase verification are allowed to connect the broken bit lines to ground during an erase verification process by means of a specific circuit arrangement with respect to the broken lines. Thereby, the earth voltage is received, and further, that the broken bit lines pass the erase verification is identified by the page buffer, further saving time consumed in repeated verifications in the conventional technology significantly.07-18-2013
20130182509NEW 1T1b AND 2T2b FLASH-BASED, DATA-ORIENTED EEPROM DESIGN - An one-transistor-one-bit (1T1b) Flash-based EEPROM cell is provided along with improved key operation schemes including applying a negative word line voltage and a reduced bit line voltage for perform erase operation, which drastically reduces the high voltage stress on each cell for enhancing the Program/Erase cycles while reducing cell size. An array made by the 1T1b Flash-based EEPROM cells can be operated with Half-page or Full-page divided programming and pre-charging period for each program cycle. Utilizing PGM buffer made of Vdd devices in the cell array further save silicon area. Additionally, a two-transistor-two-bit (2T2b) EEPROM cell derived from the 1T1b cell is disclosed with additional cell size reduction but with the operation of program and erase the same as that for the 1T1b cells with benefits of no process change but much enhanced storage density, superior Program/Erase endurance cycle, and capability for operating in high temperature environment.07-18-2013
20110305091SEMICONDUCTOR MEMORY DEVICE AND RELATED METHODS FOR PERFORMING READ AND VERIFICATION OPERATIONS - A semiconductor memory device comprises a memory cell array configured to store data, a sensing unit configured to perform a read operation the memory cell array by sensing a bitline in a plurality of reading steps in response to a single read command, and a sensing time controller configured to generate a control signal to control a variable reading time for each reading step of the sensing unit.12-15-2011
20110310673MULTI-PAGE PROGRAM METHOD, NON-VOLATILE MEMORY DEVICE USING THE SAME, AND DATA STORAGE SYSTEM INCLUDING THE SAME - A method of programming a non-volatile memory device including a plurality of strings arranged in rows and columns comprises activating all or a part of selection lines in one column at the same time depending upon data to be programmed, driving a bit line corresponding to the one column with a bit line program voltage, and repeating the activating and the driving until bit lines corresponding to the columns are all driven.12-22-2011
20130188426NONVOLATILE MEMORY DEVICE, NONVOLATILE MEMORY SYSTEM, PROGRAM METHOD THEREOF, AND OPERATION METHOD OF CONTROLLER CONTROLLING THE SAME - According to example embodiments, a nonvolatile memory device includes a first memory cell configured to store a first data pattern, a second memory cell configured to be programmed using a program voltage, and a coupling program control unit. The coupling program control unit may be configured to perform a verification operation for verifying whether the first memory cell is programmed with the first data pattern. The verification operation may provide to the first memory cell a verification voltage corresponding to the first data pattern. The coupling program control unit may be configured to end programming the second memory cell when the verification operation on the first memory cell indicates a pass.07-25-2013
20120294093SEMICONDUCTOR DEVICE AND OPERATING METHOD THEREOF - An operating method of a semiconductor device includes precharging bit lines corresponding to selected memory cells, supplying a first verify voltage to a word line coupled to the selected memory cells and outputting programming states of the selected memory cells to the bit lines during a first time period, sensing potentials of the bit lines that have the programming states of the selected memory cells outputted to the bit lines during the first time period, supplying a first target voltage higher than the first verify voltage to the word line and outputting programming states of the selected memory cells to the bit lines during a second time period shorter than the first time period, and sensing potentials of the bit lines that have the programming states of the selected memory cells outputted to the bit lines during the second time period.11-22-2012
20130201764NON-VOLATILE MEMORY PROGRAMMING - Some embodiments include a memory device and a method of programming memory cells of the memory device. One such method includes applying different voltages to data lines associated with different memory cells based on threshold voltages of the memory cells in an erased state. Other embodiments including additional memory devices and methods are described.08-08-2013
20120069677NONVOLATILE MEMORY DEVICE AND ERASURE METHOD THEREOF - A method in performing an erasure operation of a nonvolatile memory device includes a step of performing a block erasure operation wherein a plurality of memory cells in a selected block are erased at once, a step of selecting an over-programmed memory cell having a threshold voltage higher than an upper bound verification voltage, and a step of erasing selectively the over-programmed memory cell.03-22-2012

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