Class / Patent application number | Description | Number of patent applications / Date published |
359370000 | Interference | 29 |
20090052019 | IMAGING INTERFEROMETRIC MICROSCOPY - Exemplary embodiments provide an image interferometric microscope (IIM) and methods for image interferometric microscopy. The disclosed IIM can approach the linear systems limits of optical resolution by using a plurality of off-axis illuminations to access high spatial frequencies along with interferometric reintroduction of a zero-order reference beam on the low-NA side of the optical system. In some embodiments, a thin object can be placed normal to the optical axis and the frequency space limit can be extended to about [(1+NA)n/λ], where NA is the numerical-aperture of the objective lens used, n is the refraction index of the transmission medium and A is an optical wavelength. In other embodiments, tilting the object plane can further allow collection of diffraction information up to the material transmission bandpass limited spatial frequency of about 2n/λ. | 02-26-2009 |
20090059360 | SYSTEM AND METHOD FOR SELF-INTERFERENCE FLUORESCENCE MICROSCOPY, AND COMPUTER-ACCESSIBLE MEDIUM ASSOCIATED THEREWITH - Exemplary apparatus and/or method can be provided using which, it is possible to provide information associated with at least one portion of a sample. For example, at least one electro-magnetic radiation received from the at least one portion of the sample can be separated into a plurality of first radiations, one of the first radiations having a phase delay that is different from a phase delay of another of the first radiations. In addition, at least one of the first radiations can be received and separated into second radiations according to wavelengths of the received at least one of the first radiations. Further, it is possible to detect the second radiations and generate information regarding a position of the at least one portion of the sample as a function of at least one characteristic of at least one interference of the first radiations. According to another exemplary embodiment, it is possible to provide system, method and computer accessible medium, in which data associated with first radiations can be obtained, and the information regarding a position of the at least one portion of the sample may be generated. Such information can be generated based on the data by separating second radiations associated with the portion(s) of the sample according to wavelengths of at least one of the second radiations. For example, one of the second radiations can have a phase delay that is different from a phase delay of another one of the second radiations, and the second radiations may be interfering. | 03-05-2009 |
20090097107 | Microscope - The present invention relates to a device for analyzing particles in the nanometer or micrometer range by optical measurement of light irradiated onto the sample containing particles. Accordingly, the device of the present invention can also be referred to as a microscope. The microscope device comprises an arrangement for detection of changes of the optical properties of the sample volume, e.g. changes in absorption and/or in refractive index in space and/or in time, using an interferometer arrangement of a collimated light beam or of split beams ( | 04-16-2009 |
20090296205 | Microscope apparatus - Diffracted light generated by a diffraction grating passes through a tube lens, reflected by a reflection mirror and forms illuminating light in a strip pattern on the surface of a sample. Thus, fluorescence generated by an objective lens from the sample passes through the objective lens, the reflection mirror and a tube lens, and forms an image of the sample on the diffraction grating. When the diffraction grating is removed from an optical system and a dichroic mirror is arranged, instead of the reflection mirror, fluorescence from the sample passes through the dichroic mirror, and forms an image of the sample on an imaging surface of an imaging device by an imaging lens. Thus, a microscope which can be used by being switched from a normal fluorescent microscope and uses the diffracted light is provided. | 12-03-2009 |
20090310214 | STRUCTURAL ILLUMINATION AND EVANESCENT COUPLING FOR THE EXTENSION OF IMAGING INTERFEROMETRIC MICROSCOPY - In accordance with the invention, there are imaging interferometric microscopes and methods for imaging interferometric microscopy using structural illumination and evanescent coupling for the extension of imaging interferometric microscopy. Furthermore, there are coherent anti-Stokes Raman (CARS) microscopes and methods for coherent anti-Stokes Raman (CARS) microscopy, wherein imaging interferometric microscopy techniques are applied to get material dependent spectroscopic information. | 12-17-2009 |
20100053740 | MICROSCOPE - The microscope comprises a first phase-contrast objective including a first phase film shaped like a ring and having a 20-fold magnification or lower, a second phase-contrast objective including a second phase film shaped like a ring and having a 60-fold magnification or higher; and a ring silt shared and used by the first and second phase-contrast objectives. | 03-04-2010 |
20100284065 | MICROSCOPE SYSTEM - A microscope system is characterized in comprising a transmission illumination optical system having a light source ( | 11-11-2010 |
20110075254 | Surface Wave Enabled Darkfield Aperture - Embodiments of the present invention relate to a surface wave enabled darkfield aperture structure comprising an aperture layer, a aperture in the aperture layer and a plurality of grooves around the aperture. The aperture layer has a first and second surface. The plurality of grooves is in the first surface. A surface wave propagates along at least the first surface. The plurality of grooves is configured to generate a darkfield at the aperture by modifying the surface wave to cancel out direct transmission of a uniform incident light field received by the aperture. | 03-31-2011 |
20110211253 | IMAGING INTERFEROMETRIC MICROSCOPY - Exemplary embodiments provide an image interferometric microscope (IIM) and methods for image interferometric microscopy. The disclosed IIM can approach the linear systems limits of optical resolution by using a plurality of off-axis illuminations to access high spatial frequencies along with interferometric reintroduction of a zero-order reference beam on the low-NA side of the optical system. In some embodiments, a thin object can be placed normal to the optical axis and the frequency space limit can be extended to about [(1+NA)n/λ], where NA is the numerical-aperture of the objective lens used, n is the refraction index of the transmission medium and λ is an optical wavelength. In other embodiments, tilting the object plane can further allow collection of diffraction information up to the material transmission bandpass limited spatial frequency of about 2n/λ. | 09-01-2011 |
20120092761 | MICROSCOPE SYSTEM - A microscope system is characterized in comprising a transmission illumination optical system having a light source ( | 04-19-2012 |
20120120485 | INTERFERENCE MICROSCOPE AND MEASURING APPARATUS - In an interference microscope and a measuring device for observing and inspecting the surface and inside of a specimen such as a wafer by applying laser light to the specimen and using an interferometer, a reference optical path for conducting light is provided between a beam splitter and a reference mirror, and a measurement optical path for conducting light is provided between the beam splitter and the specimen, thereby providing an optical path difference between the reference optical path and the measurement optical path. Further, the reference mirror is tilted slightly, thereby forming interference fringes on detection means. It is possible to measure the surface shape of the specimen (measurement object) such as a wafer only by slightly tilting the reference mirror with a simple configuration and locate the accurate coordinate positions of foreign particles and pole pieces. | 05-17-2012 |
20120206797 | OPTICAL CONTACT MICROMETER - Certain examples provide optical contact micrometers and methods of use. An example optical contact micrometer includes a pair of opposable lenses to receive an object and immobilize the object in a position. The example optical contact micrometer includes a pair of opposable mirrors positioned with respect to the pair of lenses to facilitate viewing of the object through the lenses. The example optical contact micrometer includes a microscope to facilitate viewing of the object through the lenses via the mirrors; and an interferometer to obtain one or more measurements of the object. | 08-16-2012 |
20130163076 | TRANSMISSION INTERFERENCE MICROSCOPE - Disclosed is a transmission interference microscope that provides a degree of freedom to a region being observed while obtaining pure transmission information, and obtains highly-accurate interference images at high magnification under optimized radiation conditions. An electron beam emitted from an electron source | 06-27-2013 |
20130242383 | MICROSCOPE PROVIDED WITH PLURAL OPTICAL UNITS - In a microscope having a plurality of optical units each including a filter block between an objective and a tube lens, the optical unit closest to the objective among the plurality of optical units includes a first filter block provided with an optical filter having a first effective diameter. The optical unit closest to the tube lens among the plurality of optical units includes a second filter block provided with an optical filter having a second effective diameter larger than the first effective diameter. | 09-19-2013 |
20140098416 | Arrangement for Generating a Differential Interference Contrast Image - An assembly for the generation of a differential interference contrast image (DIC) of an object in an imaging plane, comprising a radiation source; a Köhler illuminating optical assembly for illuminating the object with light from the radiation source; an objective for imaging the object plane in an imaging plane, wherein the objective is provided with an exit pupil and an entrance pupil, and wherein the entrance pupil of the objective is positioned in the illuminating pupil of the Köhler illuminating optical assembly; and a component for the generation of an interference is characterized in that the component for the generation of an interference is positioned in the exit pupil of the objective, and the component for the generation of an interference is formed by an amplitude filter with an amplitude transmission factor F | 04-10-2014 |
20150077842 | HIGH-RESOLUTION SCANNING MICROSCOPY - A microscope and method for high resolution scanning microscopy of a sample, having: an illumination device for the purpose of illuminating the sample, an imaging device for the purpose of scanning at least one point or linear spot across the sample and of imaging the point or linear spot into a diffraction-limited, static single image below a reproduction scale in a detection plane. A detector device for detecting the single image in the detection plane for various scan positions is also provided. An evaluation device for the purpose of evaluating a diffraction structure of the single image for the scan positions is provided. The detector device has a detector array which has pixels and which is larger than the single image. At least one phase mask with a variable lateral profile of the phase influence is included in or near to the objective pupil, or in a plane which is conjugated to the objective pupil, for generating a spatial distribution of the illumination light and/or the detection light perpendicular to the optical axis, and/or in the direction of the optical axis. | 03-19-2015 |
20150293340 | AUTOFOCUS SYSTEM - An autofocus apparatus is capable of detecting the position of a sample on a microscope. The sample may consist of a specimen mounted between a microscope slide and coverslip or specimens within a well plate. The device tracks the position of a sample by identifying refractive index boundaries through Fresnel reflections. A change in refractive index can correspond to the top and bottom of a coverslip, the top of a slide, the bottom of a well plate or the bottom of a well within a well plate. Using optical coherence tomography (OCT) these reflections are used to form a depth scan of the sample which gives the positions of these surfaces relative to the objective. The device functions as an autofocus system by compensating for any variation of the position of the sample from the focal plane of the objective. | 10-15-2015 |
20150309294 | Single Plane Illumination Microscope - The invention relates to a microscope in which a layer of the sample is illuminated by a plurality of thin strips of light ( | 10-29-2015 |
20160004059 | COHERENT FLUORESCENCE SUPER-RESOLUTION MICROSCOPY - A microscopy system which includes a light source for illuminating a sample; an objective lens for capturing light emitted from the illuminated sample to form a signal beam; and a dispersive optical element through which the signal beam is directed, wherein the dispersive optical element converts the signal beam to a spatially coherent signal beam. | 01-07-2016 |
20160097921 | INNER LAYER MEASUREMENT METHOD AND INNER LAYER MEASUREMENT DEVICE - In an inner layer measurement method, first irradiation light and second irradiation light having a peak wavelength longer than that of the first irradiation light are formed by changing at least one of a position where light emitted from a lamp is transmitted through a short pass filter and a position where light emitted from a lamp is transmitted through a long pass filter. Then, a first XY sectional surface of a semitransparent body is measured by irradiating the first XY sectional surface with the first irradiation light. A second XY sectional surface positioned on a layer deeper than the first XY sectional surface is measured by irradiating the second XY sectional surface with the second irradiation light. Each of the short pass filter and the long pass filter can transmit the light and has properties of changing a cutoff wavelength according to the position where the light is transmitted. | 04-07-2016 |
359371000 | Using polarized light | 9 |
20080304143 | Mini-scope for multi-directional imaging - A mini-scope for multi-directional imaging is disclosed. The mini-scope includes an elongated mini-scoped body. An emissions aperture is disposed on the distal end of the elongated mini-scope body, which can be configured to emit a beam of optical energy propagating through a flexible optical conductor. A selective mirror is also positioned at the distal end of the elongated mini-scope body and is configured to selectively pass or reflect the beam of optical energy based on the optical characteristics of the beam. A SSID is further disposed on the distal end of the elongated mini-scope body for imaging illumination reflected by an external object in response to the beam of optical energy. This illumination is directed to pass through or reflect from the selective mirror to the camera based on optical characteristics of the beam. | 12-11-2008 |
20110134516 | MICROSCOPE SYSTEM - Disclosed herein is a microscope system. The microscope system includes a culture unit for holding and cultivating a specimen while maintaining constant temperature and humidity; a stage for holding the culture unit; a first light-converging optical system for converging illumination light emitted from a light source on the specimen; a second light-converging optical system for converging transmitted light that has passed through the specimen; a transmitted-light pinhole provided at a position optically conjugate to the light-converging position of illumination light on the specimen to cut off part of transmitted light converged by the second light-converging optical system; a transmitted-light detector that detects transmitted light that has passed through the transmitted-light pinhole; a moving system for moving the first and second light-converging optical systems, the transmitted-light pinhole, and the transmitted-light detector and the stage relative to each other; a housing that encloses these components and cuts off external light; and a temperature control unit for controlling temperature in the housing. | 06-09-2011 |
20120019907 | HIGH-RESOLUTION SURFACE PLASMON MICROSCOPE THAT INCLUDES A HETERODYNE FIBER INTERFEROMETER - The present invention relates to a high-resolution surface plasmon microscope including a heterodyne interferometer ( | 01-26-2012 |
20120224257 | MICROSCOPE - A microscope includes a condenser lens that is provided in an illumination light path and in which at least one optical device is insertable into and removable from an illumination light axis for switching an observation method. The microscope also includes a first polarizing plate that is provided in a same light axis as the optical device and is insertable into and removable from the illumination light axis integrally with the optical device, and a second polarizing plate that is provided in the illumination light axis independently from insertion and removal of the optical device into and from the illumination light axis. | 09-06-2012 |
20130155498 | MICROSCOPE APPARATUS FOR PHASE IMAGE ACQUISITION - A microscope apparatus includes a condenser lens to make an illuminating electromagnetic wave relatively homogeneous, a first beam splitter splitting the illuminating electromagnetic wave after the condenser lens, a movable reflector module, a second beam splitter, an objective lens to project the illuminating electromagnetic wave propagating after an object to be observed toward an observing device. The object is loaded between the first beam splitter and the second beam splitter. The microscope apparatus is configured to split the illuminating electromagnetic wave into two paths at the first beam splitter. A first path goes through the first and the second beam splitters, and a second path goes through the movable reflector module to rejoin the first path at the second beam splitter. The microscope apparatus is configured acquire phase images with interferences of the electromagnetic wave from the two paths with at least two distance settings of the movable reflector module. | 06-20-2013 |
20140049815 | MICROSCOPE AND MICROINSEMINATION METHOD USING MICROSCOPE - A microscope includes a light source; a condenser lens irradiating a sample with a light from the light source; an objective facing the condenser lens across the sample; a first polarization plate placed between the light source and the condenser lens; a condenser turret placed between the first polarization plate and the condenser lens and having a plurality of optical elements placed inside; a polarization plate placed on the image side with respect to the objective; and a compensator placed between the first polarization plate and the polarization plate. In the microscope, according to the observation method, an optical element to be placed in an optical path among the plurality of optical elements placed inside the condenser turret is switched by rotation of the condenser turret. | 02-20-2014 |
20140153088 | SLIDER FOR SLIDING INTO THE OBSERVATION BEAM PATH OF A MICROSCOPE - The invention relates to an optical assembly that can be interposed into the observation beam path of a microscope, comprising a first mount. In the first mount, a stack of optical elements for a polarization optical, differential interference contrast method, is arranged to facilitate a first observation method. The stack comprises, inter alia, a polarizer, polarization-optical shearing elements, and an analyzer. The analyzer is arranged in the stack with regard to its polarization direction in a predetermined orientation relative to the polarization direction of the polarizer. The stack of optical elements in the first mount is arranged such as to be interchangeable. Further, the assembly comprises at least one additional mount for receiving optical elements for at least one additional observation method. | 06-05-2014 |
20150085356 | MICROSCOPE APPARATUS AND METHOD FOR PHASE IMAGE ACQUISITION - A microscope apparatus includes an electromagnetic wave source configured to generate an illuminating electromagnetic wave, a first beam splitter configured to split the illuminating electromagnetic wave into a first component along a first path and a second component along a second path, a movable reflector module configured to adjust a portion of the second path, and a second beam splitter configured to recombine the first component and the second component. An observing device is configured to receive the recombined first component and second component and the microscope apparatus is configured acquire a phase image from the observing device based on positioning of the movable reflector module and representative of an electric field distribution near an object located along the first path between the first beam splitter and the second beam splitter. | 03-26-2015 |
20160124202 | THREE-DIMENSIONAL OPTICAL COHERENCE TOMOGRAPHY APPARATUS AND ITS APPLICATION - Provided herein are devices and systems that apply full-field optical coherence tomography (OCT) technology to three-dimensional skin tissue imaging. A special designed Mirau type objective and an optical microscope module allowing both OCT mode and orthogonal polarization spectral imaging (OPSI) mode are disclosed. | 05-05-2016 |