Class / Patent application number | Description | Number of patent applications / Date published |
356239100 | Transparent or translucent material | 77 |
20080297784 | Inspection technique for transparent substrates - A method for inspecting a transparent substrate provides an index-matching fluid between an index-matched optical coupler and a surface of the transparent substrate. The method repeats, at two or more positions along the surface of the transparent substrate, steps of illuminating an inspection volume within the transparent substrate by directing a ribbon of light through the optical coupler and into the transparent substrate and detecting scattered light from the inspection volume at a detector that is optically conjugate with the inspection volume. | 12-04-2008 |
20080316476 | System and Device for the Optical Inspection of Glass Panels - A system for the optical inspection of glass panels ( | 12-25-2008 |
20090097019 | OPTICAL DEVICE FOR DETECTING LIVE INSECT INFESTATION - The disclosure relates to a detection device for detecting movement of a live insect located within a seed or grain. The device may include a light source with a masking arrangement to block stray light. It may also include a detection region sized to contain at least one seed. Finally, the device may include a detection instrument able to detect changes in light from the light source caused by movement of an insect within the seed. The disclosure also relates to a method of detecting an insect in a seed. First, one may pass light through the seed. Then one may detect light passed through the seed and, based on the light passed through the seed, determine whether or not an insect within the seed is moving. | 04-16-2009 |
20090185179 | GLAZING INSPECTION - A method of inspecting a glazing for faults involves illuminating the glazing with light having a first wavelength to produce a bright-field image, and illuminating the glazing with light having a second wavelength to produce a dark-field image. The bright-field image and dark-field image are captured using a single image capture device. The bright-field and dark-field images may be focussed onto the image capture device by a common lens. In addition, a shadowgraph image may be recorded simultaneously. The inspection method provides an improved fault detection system for glazings, such as automotive glazings. | 07-23-2009 |
20090213366 | METHOD AND APPARATUS FOR DETECTING DEFECTS - A method and apparatus for detecting defects are provided for detecting harmful defects or foreign matter with high sensitivity on an object to be inspected with a transparent film, such as an oxide film, by reducing noise due to a circuit pattern. The apparatus for detecting defects includes a stage part on which a substrate specimen is put and which is arbitrarily movable in each of the X-Y-Z-θ directions, an illumination system for irradiating the circuit pattern with light from an inclined direction, and an image-forming optical system for forming an image of an irradiated detection area on a detector from the upward and oblique directions. With this arrangement, diffracted light and scattered light caused on the circuit pattern through the illumination by the illumination system is collected. Furthermore, a spatial filter is provided on a Fourier transform surface for blocking the diffracted light from a linear part of the circuit pattern. The scattered and reflected light received by the detector from the specimen is converted into an electrical signal. The converted electrical signal of one chip is compared with that of the other adjacent chip. If these signals are not identical to each other, the foreign matter is determined to exist on the specimen in detection. | 08-27-2009 |
20100296084 | Inspection Systems for Glass Sheets - Glass inspection systems are provided for detecting particles and defects in or on a glass sheet or glass ribbon ( | 11-25-2010 |
20110013181 | DEVICE AND METHOD FOR CONTACTLESS DETECTION OF CHARACTERISTICS OF CONTINUOUSLY DELIVERED TRANSLUCENT PRODUCTS - An apparatus for contactless detection of characteristics of continuously conveyed, translucent products includes first and second transmitting units each having an independent light source to generate high-intensity light radiation to illuminate the product, a light-converting element to form a planar light field from the light radiation and a focusing element to form a line of light running transversely to a direction of conveying of the products from the planar light field. A receiving unit has a detection device to pick up the light radiation transflected by the product. Shading elements are arranged respectively between the transmitting units and the receiving unit. The first transmitting unit is arranged in front of the receiving unit in the direction of conveying of the products and the second transmitting unit is arranged behind the receiving unit in the direction of conveying. | 01-20-2011 |
20110058161 | Method and Device for the Detection of Defects in an Object - A method for detecting defects in an object includes a step of locally illuminating the object by radiating in light having a wavelength to which the object is transparent. Multiply reflected components of the incident light are detected while the detection of directly transmitted components of the incident light is at least partly avoided and the detection of singly reflected components of the incident light is at least partly avoided. Defects are identified by evaluating intensity differences in the detected components of the incident light. There is also disclosed a device for carrying out the method. | 03-10-2011 |
20110075140 | GLASS HANDLING AND PROCESSING SYSTEM - Systems, methods and apparatus relate to handling and processing glass, such as glass for use in liquid crystal displays, involving a measurement device, such as a distortion gauge, residing in an environmentally controlled measurement room, and a cassette loading device for storage and conveyance of glass between the measurement device and other components of a glass handling and processing system residing with the cassette loading device in a preparation room. A mail-slot opening may be present in a wall separating the measurement room from the preparation room. A gauge conveyor may convey glass between the cassette loading device and the measurement device. A distortion gauge may measure a reference value of the product glass with respect to reference marks on a glass reference plate of the distortion gauge. Other examples of a measurement device include a warp gauge, a stress gauge, a thickness gauge, and a compaction gauge. | 03-31-2011 |
20120019817 | INSPECTION APPARATUS AND INSPECTION METHOD - According to one embodiment, an inspection apparatus includes a first monochromatic body disposed behind an inspection target including a transparent member or a semitransparent member, relative to an observation position which deviates from a normal direction of the inspection target, a light source configured to illuminate the inspection target and disposed at such a position in front of the inspection target that an image of the light source is not reflected on the inspection target which is observed at the observation position, and a second monochromatic body disposed at such a position in front of the inspection target that an image of the second monochromatic body is reflected on the inspection target which is observed at the observation position. | 01-26-2012 |
20120147365 | Apparatus for Inspecting an Illumination Device - The present invention provides an apparatus for inspecting an illumination device where the illumination device allows light from one or more light sources to be emitted to the outside through a number of optical sheets layered on top of each other. The apparatus is provided with: a work stage on which an illumination device is placed; a work frame for fixing the position of the illumination device placed on the work stage; and a pressure reducing apparatus for making the pressure in the space inside the illumination device lower than the pressure in the space outside the apparatus for inspecting an illumination device when turned on during the inspection, wherein the work frame has an opening through which light from the illumination device is emitted and makes contact with the outer periphery of the illumination device and the work stage, respectively, through annular form during the inspection. | 06-14-2012 |
20130033706 | Visual Inspection Apparatus For Glass Substrate Of Liquid Crystal Display And Inspection Method Thereof - Disclosed is a visual inspection apparatus for a glass substrate of a liquid crystal display, comprising an inspection platform and at least two slide rails. The glass substrate for inspection is fixedly located on an inspection platform main body. The slide rails are installed at two adjacent sides of the main body leastwise. Length directions of the slide rails are parallel with a level of the main body. The lengths of the two adjacent slide rails are mutually perpendicular; the visual inspection apparatus further comprises a coordinate reader. The coordinate reader is slidably jointed to the slide rails and employed to cross above the level of the main body to form a locating point. An inspector reads a coordinate of the locating point to acquire a corresponding coordinate of the glass substrate. The present invention also provides an inspection method for a glass substrate of a liquid crystal display. | 02-07-2013 |
20130242295 | Illumination System with Time Multiplexed Sources for Reticle Inspection - The disclosure is directed to a system and method of providing illumination for reticle inspection. According to various embodiments of the disclosure, a multiplexing mirror system receives pulses of illumination from a plurality of illumination sources and directs the pulses of illumination along an illumination path to a plurality of field mirror facets. The field mirror facets receive at least a portion of illumination from the illumination path and direct at least a portion of the illumination to a plurality of pupil mirror facets. The pupil mirror facets receive at least a portion of illumination reflected from the field mirror facets and direct the portion of illumination along a delivery path to a reticle for imaging and/or defect inspection. | 09-19-2013 |
20130250288 | GLASS SUBSTRATE INSPECTION DEVICE AND INSPECTION METHOD THEREOF - The present invention provides a glass substrate inspection device and an inspection method that are applicable to inspect if breaking exists in a glass substrate deposited in a cartridge. The inspection device includes at least one detector assembly and at least one processing unit. The detector assembly includes a light-transmitting element located at one side of the glass substrate and two light-receiving elements respectively located at two sides of the glass substrate. The processing unit determines if difference of brightness detected by the two light-receiving elements is within a predetermined range, whereby breaking is determined existing in the glass substrate when the difference of brightness is not within the predetermined range. With this arrangement, the present invention can reduce or prevent a broken glass substrate from entering a display panel manufacture line. | 09-26-2013 |
20140185040 | MOTHER GLASS INSPECTION DEVICE AND MOTHER GLASS INSPECTION METHOD - The present invention provides a mother glass inspection device and a mother glass inspection method. The inspection device includes: a main body, a platform mounted on the main body, a light absorption layer formed on a top surface of the platform, a laser transmitter mounted on the main body and opposing the platform, and an image sensor arranged above the platform to correspond to the laser transmitter. The platform supports a piece of mother glass to be laid flat thereon. The mother glass inspection device adopts a flat-laying type platform to support a piece of mother glass and provides a light absorption layer on the platform so as to eliminate fault inspection result of the image sensor caused by light reflection by stains present on the back side of the mother glass. | 07-03-2014 |
20140300893 | ILLUMINATION APPARATUS AND INSPECTION APPARATUS - An illumination apparatus comprising, a light source that emits a laser beam, a lens array on which the laser beam is illuminated, a plurality of element lenses having a diameter greater than or equal to the laser beam are arranged in the lens array, the lens array being rotatable around an optical axis of the laser beam, wherein the two lens arrays are arrayed in an optical axis direction of the laser beam, and | 10-09-2014 |
20140347657 | ILLUMINATION SYSTEM FOR DETECTING THE DEFECT IN A TRANSPARENT SUBSTRATE AND A DETECTION SYSTEM INCLUDING THE SAME - An illumination device for providing near isotropic illumination, and particularly an illumination system for detecting the defect in a transparent substrate and a detection system including the same are presented, An illumination system includes: an illumination system for detecting the defect in a transparent substrate, including light source receptacle in bar shape; first spot light sources, each emitting a respective first light, the respective first lights being substantially parallel to each other and the first spot light sources being arranged to a first line of spot light sources along the longitudinal direction of the receptacle; and second spot light sources, each emitting a respective second light, the respective second lights being substantially parallel to each other and the second spot light sources being arranged to a second line of spot light sources along the longitudinal direction of the receptacle. | 11-27-2014 |
20150308943 | GLASS SHEET ACQUISITION AND POSITIONING MECHANISM FOR AN INLINE SYSTEM FOR MEASURING THE OPTICAL CHARACTERISTICS OF A GLASS SHEET - A glass sheet acquisition and positioning mechanism and associated method are utilized in an in-line glass sheet optical inspection system. The mechanism includes an exterior support frame mounted in proximity to one of the glass sheet processing system conveyors, and an interior support frame operably connected to the exterior support frame such that the interior support frame may be selectively positioned from its first orientation to a second orientation whereby the retained glass sheet is positioned between the camera and the screen at a preselected position. The interior support frame is also operably connected to the exterior support frame to provide for positioning of the interior support frame to a third orientation in which the glass sheet is released from the interior support frame for continued movement on the conveyor. An in-line glass sheet optical inspection system incorporating the glass sheet acquisition and positioning mechanism is also disclosed. | 10-29-2015 |
20160103081 | METHOD AND DEVICE FOR OPTICALLY INSPECTING FAULTS - In a method for optically checking a large-area three-dimensional object an illumination surface of parallel light beams is generated using a light source, a large-area three-dimensional object is partly or completely illuminated by the illumination surface, and a change of the parallel light beams of the illumination surface through the object is detected, wherein a projection surface is arranged on an object face opposite the light source, and the object shadow cast on the projection surface by the illumination surface is detected using an optical detection device. The strip-shaped light curtain is produced with a Fresnel lens. The shadow is detected using an optical lens system or a CCD camera. The dimensions of the object parallel to the projection surface are ascertained and compared with specified reference values. The projection surface is an opaque panel made of a translucent material or a surface-treated glass pane. | 04-14-2016 |
20160161555 | DETECTING APPARATUS AND DETECTING METHOD - The present invention provides a detecting apparatus and a detecting method. The detecting apparatus comprises: a base, a light source module, an image generating unit and a detecting unit. The light source module is configured to generate detecting light and cause the detecting light to irradiate towards the image generating unit after passing through an area of a shorting bar circuit in a panel. The image generating unit is configured to receive the detecting light irradiating thereon, and generate a detecting image of the area of the shorting bar circuit. The detecting unit is configured to detect whether the shorting bar circuit in the panel is cut off based on the detecting image. As the detecting light passing through the panel lasts for a longer time and is of higher brightness, the detecting image generated by the image generating unit is clearer. | 06-09-2016 |
20160178535 | Inspection Device And Method | 06-23-2016 |
20160178536 | SHEET MEMBER CONVEYANCE DEVICE, SHEET MEMBER SUPPORT DEVICE, SHEET MEMBER INSPECTION DEVICE, AND SHEET MEMBER CONVEYANCE METHOD | 06-23-2016 |
20190145907 | METHOD AND DEVICE DETERMINING SOILING OF A SHIELD | 05-16-2019 |
356239200 | Optical element (e.g., contact lens, prism, filter, lens, etc.) | 20 |
20080204740 | Distortion measurement imaging system - A distortion measurement and inspection system is presented. In one embodiment, a vision system is implemented. The vision system performs dual focal plane imaging where simultaneous imaging of two focal planes is simultaneously performed on a sample substrate and a reference substrate to determine distortion. In addition, a highly reflective background is implemented to provide for more resolution during distortion measurement. | 08-28-2008 |
20080212085 | METHOD OF EVALUATING NON-LINEAR OPTICAL CRYSTAL AND DEVICE THEREFOR, AND WAVELENGTH CONVERSION METHOD AND DEVICE THEREFOR - A method of evaluating a non-linear optical crystal used for non-linear wavelength conversion of laser beam which enables the non-linear optical crystal to be evaluated before the crystal is actually used as a wavelength conversion element in order for the crystal to be constantly used for an extended time with a high conversion efficiency retained and without lowering in output when non-linear optical crystals for various non-linear wavelength conversions such as a CLBO crystal are used to convert laser beams, wherein the non-linear optical crystal is moved to changed a laser beam incident position to detect the output of a laser beam emitted from the non-linear optical crystal for each changing position. | 09-04-2008 |
20090015825 | Apparatus and method for inspecting liquid crystal display - A method of inspecting a liquid crystal display panel includes providing a liquid crystal display panel to be inspected, turning on a backlight unit that is disposed under the liquid crystal display panel to emit light toward the liquid crystal panel, driving the liquid crystal display panel by applying test signals to the liquid crystal display panel on a predetermined period, detecting defects by taking an image of the liquid crystal display panel on a period shorter than the driving period of the liquid crystal display panel, and detecting defects created in the liquid crystal display panel, which blink in accordance with a period of the test signals of the liquid crystal display panel. | 01-15-2009 |
20090153849 | PLATE INSPECTION SYSTEM AND PLATE INSPECTION METHOD - A plate inspection system and a plate inspection method with which irregularities in phase difference caused in a retardation layer can be efficiently detected. The inspection system is for inspecting a plate to be inspected having a retardation layer | 06-18-2009 |
20090161099 | Bubble Removal System - A bubble removal system includes an inspection cell configured to receive an ophthalmic device and a volume of working fluid. The system also includes a vacuum device configured to form a substantially fluid-tight seal with the inspection cell and to direct a negative pressure to the volume of working fluid and the ophthalmic device within the inspection cell. | 06-25-2009 |
20090185180 | Method for determining spherical aberration - The present invention relates to a method and a device for determining spherical aberration occurring during reading from and/or writing to optical recording media. According to the invention, a method for determining spherical aberration includes the steps of:
| 07-23-2009 |
20090219521 | Inspection apparatus for liquid crystal display device and inspection method using the same - An inspection apparatus and inspection method for liquid crystal display devices are disclosed, wherein a final inspection for completely manufactured liquid crystal display devices is performed using a visual-light inspection apparatus, whereby high productivity due to improved inspection accuracy and reduced inspection time can be accomplished. With the inspection apparatus and inspection method, defects of a plurality of glass panels can be automatically inspected based on analyzed information of an entire screen of each glass panel using a plurality of vision cameras, whereby improved inspection accuracy and improved product quality can be accomplished and reduced inspection time can result in improved productivity of liquid crystal display devices. Further, by quantifying screen defects of the plurality of glass panels, defects of glass panels due to failures of manufacturing processes or design failures and other problems attendant on the defects can be prevented. | 09-03-2009 |
20090262341 | AUTOMATED DISPLAY QUALITY MEASUREMENT DEVICE - A method and apparatus for automating a quality assurance test conducted on display devices used for diagnostic imaging. In one embodiment, the apparatus includes an automated mechanical system for scanning a light meter over a test pattern displayed on a display device. In another embodiment, the method comprises an automated method of comparing the measured data from the light meter with an ideal image. In another embodiment, the method comprises obtaining a digital image of the test pattern displayed on the display device, and the digital image is compared with an ideal image. | 10-22-2009 |
20090310129 | Drying Nozzle - A drying nozzle ( | 12-17-2009 |
20090316144 | DEVICE FOR DETECTING THE CONDITION OF AN OPTICAL FILTER AND ILLUMINATION DEVICE - A device for detecting the condition of an optical filter which is arranged in the optical path of a light source so as to cut light of a specific wavelength from the light emitted by the light source. A detection light source outputs a detection light beam which passes through the optical filter so that the detection light beam crosses the optical path. A photoreceptor element receives the detection light beam which has passed through the optical filter. A detection processor detects the condition of the optical filter in accordance with the intensity of the detection light beam received by the photoreceptor element. | 12-24-2009 |
20100039639 | DEVICE AND SYSTEM FOR EVALUATING A LENS FOR AN ELECTRONIC DEVICE - The disclosure relates to a system and device for evaluating imperfections in a lens for a display for an electronic device. The evaluation device comprises: a substrate; and a pattern imposed on the substrate. The pattern comprises a series of lines in a grid imposed on the substrate wherein when the pattern is viewed through the lens, the series of lines having thickness of between approximately 10 and approximately 150 microns, spaced in intervals between approximately 20 microns and approximately 300 microns from center to center, the pattern is distorted around an area where a defect is present in the lens. With the device, the lens is identifiable as being defective if the pattern appears as a moiré distortion in the area when viewed through the lens. | 02-18-2010 |
20100045975 | SYSTEMS AND METHODS FOR DETECTING DEFECTS IN CERAMIC FILTER BODIES | 02-25-2010 |
20100053604 | BROKEN SCREEN DETECTOR - Systems and methods that facilitate the detection of a broken or damaged screen in a laser PTV due to impact or shock through the measure or monitoring of continuity or resistivity of a conductive trace applied to the screen. In one embodiment, a screen damage detection system comprises a clear conductive trace applied to the display screen preferably in a serpentine configuration. Damage to the screen is detected when the hole or crack in the screen is sufficiently large to open the conductive trace. In another embodiment, a damage detection system comprises a clear resistive film applied to the screen. The resistance is measured in the X and Y axis to detect changes in the resistance of the coating due to a crack or hole in the screen and disable the laser through a laser enable output signal when a change in resistance greater than a predetermined value is detected. | 03-04-2010 |
20100085562 | Prismatic Lock And Key Security - Methods and apparatus for lock and key security, the lock including a light receptacle, a scatter pattern detecting module, and a locking mechanism, the key including a light source and a prism, the lock and key security including receiving, in the light receptacle of the lock, light transmitted by the light source in the key through the prism; identifying, by the scatter pattern detecting module, a scatter pattern of the received light; comparing, by the scatter pattern detecting module, the scatter pattern to a unique preauthorized pattern for operating the lock; if the scatter pattern matches the unique preauthorized pattern, switching, by the scatter pattern detecting module, the current locking state of the locking mechanism; and if the scatter pattern does not match the unique preauthorized pattern, maintaining the current locking state of the locking mechanism. | 04-08-2010 |
20100165333 | LAMINATED FILM DEFECT INSPECTION METHOD AND LAMINATED FILM DEFECT INSPECTION DEVICE - A first inspection process of inspecting presence of a defect on a front surface of a film body with a protective film separated therefrom; a separator removing process of separating a separator from the inspected laminated film; a second inspection process of inspecting presence of the defect in the film body in a vertical attitude while introducing the film body with the separator separated and removed therefrom to a film travel path directed in a vertical direction, and storing detection data; a separator laminating process and a protective film laminating process of laminating a separator and a protective film to a back surface and a front surface of the inspected film body, respectively; and a film collecting process of winding up the inspected laminated film laminated with the protective film and the separator are provided. | 07-01-2010 |
20100283999 | LENS IMAGE SENSING APPARATUS - A light beam (L) from a light source is reflected by a half mirror ( | 11-11-2010 |
20110090492 | Method of evaluating defects in a material transparent to electromagnetic radiation, especially for optical applications, apparatus for performing said method, and materials selected thereby - The method of evaluating an optical defect in a transparent material includes irradiating the material with light to produce scattered light from the defect, rotating the material about a rotation axis passing through the defect, measuring scattered light intensity at a scattering angle (θ | 04-21-2011 |
20120320374 | METHOD OF IMAGING AND INSPECTING THE EDGE OF AN OPHTHALMIC LENS - Systems for producing images of the edges of silicone hydrogel ophthalmic lenses are disclosed. | 12-20-2012 |
20140354985 | DETECTION SYSTEM AND DETECTION METHOD - A detection method and a detection system for detecting surface abnormalities of a first lens and a second lens of an optical-electrical lens unit are provided. The first lens and the second lens are respectively protruded from two adjacent surfaces of the optical-electrical lens unit. The detection system includes a first detecting element configured to capture the image of the first lens, a second detecting element configured to capture the image of the second lens, a processing device configured to calculate whether the second lens is not oriented toward the second detecting element, and send moving instructions to a control device to control the optical-electrical lens unit to move to a predetermined position, and detect the surface abnormalities of the optical-electrical lens unit based on the captured images. | 12-04-2014 |
20140368815 | GLASS PANEL STOCKING SYSTEM AND STOCKING METHOD - The present invention provides a glass panel stocking system and a stocking method. The stocking system includes a loading and unloading port and a crane. The loading and unloading port functions to receive a cassette that contains glass panels to position thereon. The crane functions to move a cassette that contains glass panels. The crane includes a chassis, a carrying fork mounted on the chassis and movable for extension and retraction with respect to the chassis, and a mapping bar mounted on the chassis and located above the carrying fork. The carrying fork functions to carry the cassette that contains the glass panels and move the cassette that contains the glass panels to the mapping bar so that the mapping bar is allowed to carry out inspection and counting of the glass panels received in the cassette that contains the glass panels. | 12-18-2014 |
356239300 | Patterned surface | 7 |
20090174880 | INSPECTION APPARATUS AND METHOD - An optical plate having an exit pupil array or a lens array aligned at a predetermined pitch is disposed at the front of a display. A test pattern is supplied to the display to light a pixel corresponding to the predetermined pitch. A first optical element transmits a light from an inspection position of the optical plate. A second optical element coaxially disposed on the first optical element, focuses the light from the first optical element. An image from the light focused at the second optical element is obtained. A three-dimensional position at the inspection position of the optical plate relative to the display or a predetermined period of the optical plate is calculated from a position and a period of luminance distribution of the image, and a distance between the optical plate and the first optical element. Whether the three-dimensional position or the predetermined period is within a threshold is inspected. | 07-09-2009 |
20120307236 | METHOD AND DEVICE FOR DETECTING CRACKS IN SEMICONDUCTOR SUBSTRATES - The invention relates to a method and an apparatus for detecting cracks in semiconductor substrates, such as silicon wafers and solar cells. The method and apparatus are based on the detection of light deflected at a crack. | 12-06-2012 |
20120314212 | INSPECTION DEVICE FOR BONDED WAFER USING LASER - Disclosed is a device for inspecting a bonded wafer using laser, which has a simple structure to facilitate an operation of the device and can detect an interface defect of the bonded wafer economically and highly reliably. To this end, the device for inspecting the bonded wafer using laser includes a laser unit, a laser diffusion unit, and a detection unit. If the device of inspecting the bonded wafer using laser according to the present invention is used, it is possible to advantageously inspect a wafer interface at a magnification desired by an inspector. In addition, the device has a simple structure, and thus it is advantageously easy to operate the device. | 12-13-2012 |
20130083321 | APPARATUS FOR EUV IMAGING AND METHODS OF USING SAME - One embodiment relates to an apparatus that includes an illumination source ( | 04-04-2013 |
20140168643 | METHOD FOR INSPECTING DEFECTS OF OPTICAL LAYER ELEMENTS OF A DISPLAY DEVICE - Disclosed is a method for inspecting defects of optical layer elements of a display device. The method includes steps of: scanning a selected optical layer element of the display device by a scanning light beam at a predetermined scan angle, wherein the optical layer element is selected from a polarizing layer, a filter layer, an alignment layer, a liquid crystal layer, a thin film transistor substrate layer, a light diffusion layer, a light guide layer, or a combination thereof; retrieving a light pattern generated by scanning the selected optical layer element; generating an inspecting result information according to the light pattern in relation to the selected optical layer element; and analyzing the optical layer element regarding defect conditions according to the inspecting result information. | 06-19-2014 |
20150077742 | SYSTEM AND METHOD FOR DECORATION INSPECTION ON TRANSPARENT MEDIA - There is provided a system for inspecting an edge area of a transparent media, the transparent media having a decoration on a surface, the system includes: an illuminator to direct light to the transparent media for inspection, wherein the illuminator directs light to the transparent media at an oblique angle relative to a surface of the transparent media which is opposite the surface with the decoration; an optical element to capture light transmitted through the transparent media; and a sensor to obtain an image from the light captured by the optical element. There is also provided a method for inspecting an edge area of a transparent media, where the transparent media has a decoration on a surface. | 03-19-2015 |
20160153918 | OPTICAL INSPECTING APPARATUS | 06-02-2016 |
356239400 | Containers (e.g., bottles) | 15 |
20080212086 | Packaging Material Inspection Machine - A machine for optically inspecting a transparent or semi-transparent workpiece composed of a material having a known, predetermined optical absorption property, that includes a light energy transmitting module having at least one light energy transmitting element disposed therein for transmitting light energy at a frequency tuned to the known, predetermined absorption property and along a predetermined axis, a support for securely engaging the workpiece and positioning it in the path of the predetermined axis, and a light energy collection module having a filter in tune with the known, predetermined absorption property and at least one light energy sensor contained therein, wherein the support is positioned between the light energy transmitting module and the light energy collection module. | 09-04-2008 |
20080273197 | Machine for inspecting glass containers - A machine for distinguishing blisters from checks on the finish of a glass container. The center of each captured object in an array is determined by a controller which determines the object centers in a plurality of adjacent bands. The band having the most object centers is determined and the objects in the band having the most object centers are deleted from the rest of the bands. The control repeatedly determines the band of the rest of the bands having the most object centers and deletes the objects in the band of the rest of the bands having the most object centers from the remainder of the bands until the objects in each band are unique. The maximum separation of objects in each band is defined and checks will be differentiated from blisters based on this separation. | 11-06-2008 |
20100039640 | Illumination method and device for determining the presence of defects on the surface of a container collar - The invention relates to an illumination device for a control station for determining the presence of defects on the image of the surface(s) of the collar of a transparent or translucent container. The inventive device comprises at least one illumination system quasi-constantly illuminating each point of a surface encompassing the collar surface(s) according to the totality or parts of incidences included in at least one part of a 2π-steradian solid angle and means for blocking at least one part of light beams which illuminate outside of the surface(s) of the collar and can bring about stray reflections in the collar image. | 02-18-2010 |
20100225908 | INSPECTION APPARATUS FOR CONTAINERS - An inspection apparatus for containers, comprising a first illumination device which directs light having first characteristic properties onto the base of the container, a second illumination device which directs light having second characteristic properties, which differ at least partially from the first characteristic properties, onto the base of the container, and at least one image recording device which receives at least a portion of the light directed onto the base of the container and transmitted by the latter. At least the second illumination device illuminates the base of the container in an indirect manner. | 09-09-2010 |
20110102782 | INSPECTION DEVICE WITH ROTATABLE LIGHTING ELEMENT HOUSING - The invention relates to an inspection device for monitoring containers, particularly bottles, comprising at least one transport path for supplying and removing the containers, a lighting unit, and optical measuring unit, and a control unit, wherein the lighting unit is surrounded by a transparent hollow body mounted in a rotatable fashion about the central axis, and the hollow body may be driven by a motor, either directly or via appropriate operative connections. Ideally, the hollow body is a tube made of a material or mixture of materials that is transparent to rays in the optically visible wavelength range, in the infrared range, and/or in the ultraviolet range, wherein the material is at least partially transparent to said rays. | 05-05-2011 |
20110102783 | EMPTY BOTTLE INSPECTION - The invention relates to an inspection apparatus ( | 05-05-2011 |
20110181874 | BOTTLE SEAM AND EMBOSSING ALIGNMENT - The invention relates to a registration system ( | 07-28-2011 |
20130107249 | Container Inspection Apparatus and Method | 05-02-2013 |
20130120746 | DETECTION SYSTEM AND INSPECTION METHOD FOR BOTTLE SEAM AND EMBOSSING ALIGNMENT - “A system for detecting features on a container wall includes an optical assembly comprising a camera, and an illuminating unit having light sources arranged on conductive tracks. Viewed in a vertical direction of the unit, the light sources are in vertical columns to project a strip-shaped beam onto a container-wall region. When viewed axially, the light sources are arranged on the conductive track one above the other without offset. Each column of light sources is actuated to project a light pattern on the container-wall region that can be variably adjusted as a function of surface properties of the container-wall region. The illuminating unit has first and second light source sets in corresponding adjacent vertical columns. Each light source set has one or more light sources. Adjustment is effected by concurrently switching the first and second light source sets between an on-state and an-off state.” | 05-16-2013 |
20130162986 | DEVICE AND METHOD FOR DETECTION OF DEFECTS IN VITREOUS BODIES - The invention relates to a device for detection of glass container defects comprising a cold light source for emitting a light spectrum with limited infrared portion and optical means for directing the cold light through one or more glass containers to be observed. | 06-27-2013 |
20140043604 | INSPECTION DEVICE AND METHOD FOR A SINGLE-DOSE CASING FOR A SUBSTANTIALLY TRANSPARENT CONTAINER FOR A SUBSTANTIALLY TRANSPARENT LIQUID - An inspection assembly for inspecting an at least partially transparent single-dose casing of the envelope type, in which there is arranged a substantially transparent container for containing a substantially transparent liquid. The assembly includes a substantially point-like light source and a diffusive screen. The container is provided between the light source and the diffusive screen, which is a side of the casing itself, in order to project onto the screen a profile of luminous intensity that is recorded. | 02-13-2014 |
20140268123 | Container Inspection - Method and apparatus for detecting commercial variations in at least a portion of an at least partially transparent container. A light pattern in an angular domain is established from signals generated by a plurality of light sensors, wherein a point in the light pattern is generated by a signal from a corresponding portion of the light sensors and represents a light intensity corresponding to a particular reflection angle of a light ray reflected off the container. Different types of commercial variations in the container can be differentiated by analyzing the light pattern in the angular domain. | 09-18-2014 |
20150369754 | CONTAINER HANDLING DEVICE FOR HANDLING CONTAINERS, SUCH AS BOTTLES OR SIMILAR CONTAINERS DESIGNED TO HOLD A BEVERAGE OR A SIMILAR PRODUCT - A container handling device for handling containers, such as bottles or similar containers designed to hold a beverage or a similar product. The abstract of the disclosure is submitted herewith as required by 37 C.F.R. §1.72(b). As stated in 37 C.F.R. §1.72(b): A brief abstract of the technical disclosure in the specification must commence on a separate sheet, preferably following the claims, under the heading “Abstract of the Disclosure.” The purpose of the abstract is to enable the Patent and Trademark Office and the public generally to determine quickly from a cursory inspection the nature and gist of the technical disclosure. The abstract shall not be used for interpreting the scope of the claims. Therefore, any statements made relating to the abstract are not intended to limit the claims in any manner and should not be interpreted as limiting the claims in any manner. | 12-24-2015 |
20160077020 | METHOD AND DEVICE FOR OBSERVING AND ANALYSING OPTICAL SINGULARITIES IN GLASS CONTAINERS - The invention relates to a method of observing and analyzing optical singularities, the method consisting in:
| 03-17-2016 |
20190145904 | METHOD AND SYSTEM OF CHECKING A FACILITY FOR THE OPTICAL INSPECTION OF GLASS CONTAINERS | 05-16-2019 |
356239700 | Surface condition | 12 |
20080204741 | Method for quantifying defects in a transparent substrate - Disclosed is a method for the detection and quantification of defects in transparent substrates and, more particularly, in glass sheets. The method comprises providing a transparent planar substrate having a top surface and a bottom surface. The surface topography of at least a portion of the top surface of the provide transparent planar substrate is measured to obtain a three dimensional top surface profile having a sub-nanometer level of precision. From the three dimensional surface profile measurement, the existence of one or more surface variations in the three dimensional surface profile having an amplitude greater than a predetermined tolerance can be identified and/or quantified. | 08-28-2008 |
20080231847 | OPTOELECTRONIC SENSOR DEVICE - An optoelectronic sensor device is described for recording of soiling on a transparent cover, with at least one light source that emits at least two light beams, a test surface arranged in the cover, having a concave surface exposed to environmental effects, through which the light beams emerge and reenter, as well as at least one receiver that measure the radiation powers of the light beams, on which the light beams are imaged independently of each other after reentry. The test surface has at least two areas with different microstructurings, in which a first microstructuring is designed, so that a liquid applied to the area provided with the first microstructuring is held together drop-like, and a second microstructuring is designed, so that a liquid applied to the area provided with the second microstructuring is distributed film-like, in which at least a first light beam emerges and reenters through the first area and at least a second light beam emerges and reenters through the second area, so that by comparison of the radiation powers of the two light beams, a conclusion can be drawn concerning the transparency of the cover exposed to soiling. In addition a method is described for determination of the transparency of soiling by a transparent surface exposed to environmental effects. | 09-25-2008 |
20090086197 | INSPECTION APPARATUS - In order to realize an inspection with higher accuracy of an excrescence adhering to a front or rear surface of an inspection subject, the present invention provides an inspection apparatus including, a stage allowing an inspection subject to be mounted thereonto, an illumination unit for emitting diffused light to the inspection subject, an imaging unit disposed to face the illumination unit with the inspection subject interposed therebetween, for taking the diffused light that is emitted from the illumination unit and is transmitted through the inspection subject, a first refracting member disposed between the inspection subject and the illumination unit, and the first refracting member having a first convex surface to face the illumination unit, a second refracting member disposed between the illumination unit and the first refracting member, and the second refracting member having a second convex surface to face the first convex surface, and a processing unit inspecting the inspection subject based on a resulting image that is taken by the imaging unit. | 04-02-2009 |
20090237654 | APPARATUS FOR MEASURING DEFECTS IN A GLASS SHEET - A method of measuring the topography of a large, thin, non-flat specular substrate in a production environment with minimal movement of a majority of the measurement apparatus. A gimbal-mounted reflecting element is used to steer a short coherence length probe beam such that the probe beam is substantially perpendicular to a local surface of the substrate. The probe beam and the reference beam are combined and the resulting interference pattern used to characterize defects on the local surface. | 09-24-2009 |
20140160472 | APPARATUS AND METHOD FOR INSPECTING MATTER AND USE THEREOF FOR SORTING RECYCLABLE MATTER - An apparatus and a method for inspecting matter and the use thereof for sorting recyclable material including transparent material are disclosed. The apparatus comprises a lighting unit for projecting a concentrated diffused lighting onto the matter to generate a specular reflected light beam representative of the inspected matter. The apparatus comprises an imaging unit mounted according to a given imaging angle with respect to the projected concentrated diffused lighting for imaging the specular reflected light beam to provide image data representative of the inspected matter. The apparatus comprises an analyzing unit for analyzing the image data and providing matter characterization data based on the specular reflected light beam representative of the inspected matter. | 06-12-2014 |
20140307255 | MULTI-SURFACE SCATTERED RADIATION DIFFERENTIATION - An optical inspector includes a radiating source, a time varying beam reflector, a telecentric scan lens, a first and second waveplate, a polarizing beam splitter, a first detector, a focusing lens, a blocker, and a second detector. The radiating source irradiates the first waveplate generating circularly polarized source beam that irradiates a first position of on the time varying beam reflector with a source beam. The time varying beam reflector directs the source beam to the telecentric scan lens, which in turn directs the source beam to a sample. Reflected radiation from a sample is directed to the second waveplate generating linearly polarized beam that irradiates the polarizing beam splitter which directs a portion of the reflected radiation to the first detector. Scattered radiation from the sample is directed by the focusing lens to the second detector. Contemporaneous measurements by the first and second detectors are compared to differentiate. | 10-16-2014 |
20160161423 | METHOD AND DEVICE FOR DETECTING DEFECTS IN COILS OF BRITTLE OR FRACTURE-PRONE MATERIAL WHICH IS AT LEAST PARTIALLY TRANSPARENT, AND USE OF SAID METHOD AND DEVICE - A method and a device are provided for detecting defects in coils, such as rollable ultra-thin glass, rollable glass films, rollable laminated ultra-thin glasses or films, rollable solar cells, and rollable organic light emitting diodes (OLEDs). | 06-09-2016 |
356239800 | Detection of an object or particle on surface | 5 |
20080278718 | DEFECT INSPECTION METHOD AND APPARATUS FOR TRANSPARENT PLATE-LIKE MEMBERS - A conventional problem in which inspection performance deteriorates as a transparent plate material becomes larger is solved. | 11-13-2008 |
20100265497 | Method and Apparatus for Residue Detection in the Edge Deleted Area of a Substrate - Apparatus and methods for detecting residue on a glass substrate and method of use are disclosed. The apparatus comprises a substrate support, a sensor, a controller and a peripheral device in communication with the controller. The apparatus measures the height or thickness of a main surface and an edge delete surface of a substrate to determine if film residue is present on the edge delete surface. | 10-21-2010 |
20140218725 | Inspecting Device for Detecting Appearance of Debris on a Surface of a Glass Substrate, Inspecting Apparatus and Method for Conducting Inspection - The present invention discloses an inspecting device for detecting whether there is an appearance of debris on a surface of a glass substrate, including a laser unit, a platform, and an image sensor unit. The suface of the platform is coated with a light-absorbing material so as to absorb laser beams penetrating through the glass substrate to prevent the image sensor unit from receiving the reflected laser beam from the underside of the glass substrate. Besides, the present invention discloses an inspecting apparatus for detecting whether there is an appearance of debris on a surface of a glass substrate, using the inspecting device given above, and a method for conducting inspection. The inspecting device features a simplified configuration; the method is easy to operate; and the device can effectively prevent the backgrotmd interference from the underside of glass substrates when determining whether there is an appearance of debris on top surfaces of glass substrates. The device prevents mistakes in detecting glass substrates; and the device improves the accuracy rate of inspection. | 08-07-2014 |
20150330913 | SCANNER AUTOMATIC DIRTY/CLEAN WINDOW DETECTION - An image from a window of a scanner is taken and analyzed to determine whether the image is relevant to dirt or debris on the window. When the image is relevant to dirt or debris, the size and amount of the dirt or debris is compared to a threshold and when the threshold is exceeded an alert is raised to have the window cleaned of the dirt or debris. | 11-19-2015 |
20150346109 | METHOD FOR PARTICLE DETECTION ON FLEXIBLE SUBSTRATES - Methods for detection of particulate on thin, flexible substrates wherein the substrate is positioned in a bend comprising an apex line. The apex line is illuminated by grazing angle illumination, and light from the illumination scattered by the particulate is captured by a detection apparatus. | 12-03-2015 |