Class / Patent application number | Description | Number of patent applications / Date published |
356626000 | Cavities | 9 |
20080198389 | Outer and Inner Diameter Measuring Apparatus and Method for Transparent Tube - An outer and inner diameter measuring method for a transparent tube in a non-contact manner includes the steps of irradiating a light having a linear sectional shape, inclined at a pre-determined angle with respect to a plane perpendicular to a length direction of a transparent tube, to the transparent tube; obtaining a light beam pattern formed since the light having a linear sectional shape is intercepted and refracted by the tube; obtaining an inner diameter of the tube by extracting inner diameter information of the tube from the obtained light beam pattern; and obtaining an outer diameter from a light beam pattern refracted by the tube, thereby calculating the outer and inner diameters together. | 08-21-2008 |
20080266577 | Apparatus for Measuring an Internal Dimension of a Well Bore - An apparatus for measuring an internal dimension of a well-bore comprising a tool ( | 10-30-2008 |
20080304085 | Device for inspecting countersunk holes - The invention is a non contact laser inspection self centering device to inspect the counter sink portion of a counter sunk fastener hole on a surface. In detail, the self centering and seating device includes a combination laser transmitter and receiver for transmitting a laser bean across a surface and for receiving the return signal from the surface. A self centering device is attached to the combination laser transmitter and receiver for aligning the laser transmitter with the fastener hole such that the transmitted and received laser beam passes across the center of the counter sink portion of the fastener hole. A computer system is connected to the combination laser transmitter and receiver for analyzing the transmitted and returned laser signal from the surface and determining if the counter sink portion of the hole is within tolerance. | 12-11-2008 |
20100060907 | System and Method for on-machine 3-D depth measurement - The present invention provides a method and system for on-machine 3-D depth measurement. The same image retrieving apparatus measures the first distance for the width of the similar gray-level region of cutting-surface from the first angle, and measures the second distance for the width of the similar gray-level region of cutting-surface from the first angle superimposing the second angle. The width of the similar gray-level region of cutting-surface comprises the cutting-surface and the shadow of the bottom portion of the cutting-surface. And then the cutting-surface depth is calculated according to the first angle, the second angle, the first distance, and the second distance. | 03-11-2010 |
20100284027 | OPTICAL SYSTEM AND METHOD FOR MEASUREMENT OF ONE OR MORE PARAMETERS OF VIA-HOLES - The present invention provides a novel system and method for obtaining at least one of a cross-section profile, depth, width, slope, undercut and other parameters of via-holes by non-destructive technique. The optical system comprises an illumination system for producing at least one light beam and directing it on a sample in a region of the structure containing at least one via-hole; a detection system configured and operable to collect a pattern of light reflected from the illuminated region, the light pattern being indicative of one or more parameters of said via-hole; and, a control system connected to the detection system, the control system comprising a memory utility for storing a predetermined theoretical model comprising data representative of a set of parameters describing via-holes reflected pattern, and a data processing and analyzing utility configured and operable to receive and analyze image data indicative of the detected light pattern and determine one or more parameters of said via-hole. | 11-11-2010 |
20120019839 | Micro Focal-Length Collimation Based Micro-Cavity Measuring Method And Detecting Equipment Thereof - A micro-cavity measuring method and equipment based on micro focal-length collimation are provided. The equipment can be used to measure irregular micro-cavities and “sub-macro” micro-cavities. Wherein a cylindrical or spherical lens with micro focal-length is combined with a fiber probe( | 01-26-2012 |
20120092681 | HOLE INSPECTION - An apparatus is provided for inspecting holes in components. The apparatus includes a telecentric lens system positionable at a near end of a hole with an optical axis of the lens system aligned with the axis of the hole to image the interior of the hole. The apparatus further includes an illumination system for illuminating the interior of the hole. The apparatus further includes a camera arranged to receive an image of the illuminated interior of the hole from the telecentric lens system. The illumination system includes a light source for producing a beam of parallel light, and optics for directing the produced beam through the telecentric lens system along the optical axis thereof, and through the hole. The beam reaches the far end of the hole, and is reflected from a surface located at or adjacent the far end of the hole to illuminate the interior of the hole. | 04-19-2012 |
20140376006 | OPTICAL SYSTEM AND METHOD FOR MEASUREMENT OF ONE OR MORE PARAMETERS OF VIA-HOLES - Obtaining at least one of a cross-section profile, depth, width, slope, undercut and other parameters of via-holes by a non-destructive technique using an optical system having an illumination system for producing at least one light beam and directing it on a sample in a region of the structure containing at least one via-hole, a detection system configured and operable to collect a pattern of light reflected from the illuminated region, the light pattern being indicative of one or more parameters of said via-hole, and, a control system connected to the detection system, the control system comprising a memory utility for storing a predetermined theoretical model comprising data representative of a set of parameters describing via-holes reflected pattern, and a data processing and analyzing utility configured and operable to receive and analyze image data indicative of the detected light pattern and determine one or more parameters of said via-hole. | 12-25-2014 |
20150345935 | METHOD FOR DETERMINING A CLOSED TRAJECTORY BY MEANS OF A LASER AND A LASER LIGHT SENSOR AND APPARATUS FOR DETERMINING A CLOSED TRAJECTORY - The invention relates to a method for determining a closed trajectory curve ( | 12-03-2015 |