Class / Patent application number | Description | Number of patent applications / Date published |
356492000 | For dimensional measurement | 46 |
20080285048 | METHOD AND APPARATUS FOR SIMULTANEOUSLY ACQUIRING INTERFEROGRAMS AND METHOD FOR SOLVING THE PHASE INFORMATION - A method and apparatus for simultaneously acquiring interferograms created with a plurality of different interference conditions are provided in the present invention. In the present invention, an object beam and a reference beam are used to interfere with each other and there are a plurality of sub-fields of interference simultaneously generated. All the sub-fields of interference can be simultaneously acquired by an image acquiring device with single shooting action so as to form the plurality of interferograms. Moreover, the present invention also provides a method for solving the phase information of the object beam from the interferograms formed by the foregoing said method. | 11-20-2008 |
20100067020 | COMPACT HIGH RESOLUTION IMAGING APPARATUS - An optical coherence tomography (OCT) apparatus includes an optical source, an interferometer generating an object beam and a reference beam, a transverse scanner for scanning an object with said object beam, and a processor for generating an OCT image from an OCT signal returned by said interferometer. At least the optical source, the interferometer, and the scanner are mounted on a common translation stage displaceable towards and away from said object. A dynamic focus solution is provided when the scanner and a folded object path are placed on the translation stage. | 03-18-2010 |
20100134801 | SYNCHRONOUS FREQUENCY-SHIFT MECHANISM IN FIZEAU INTERFEROMETER - An optical device for characterizing a test surface combines a Fizeau interferometer with a polarization frequency-shifting element. Two substantially collinear, orthogonally polarized beams having respective frequencies differing by a predetermined frequency shift are generated by the polarization frequency-shifting element and projected into the Fizeau optical cavity to produce a pair of test beams and a pair of reference beams, wherein the beams in each pair have orthogonal polarization states and have frequencies differing by the predetermined frequency shift. A second, substantially equal frequency shift is introduced in the Fizeau cavity on either one of the pairs of test and reference beams, thereby generating a four-beam collinear output that produces an interferogram without tilt or short-coherence light. The invention may also be implemented by reversing the order of the Fizeau cavity and the polarization frequency-shifting element in the optical train. | 06-03-2010 |
20100290060 | SHAPE MEASUREMENT USING MICROCHIP BASED FRINGE PROJECTION - A system for measuring a shape of a target object includes a photonic integrated circuit and a light detector. The photonic integrated circuit includes a phase shifter configured to change a phase difference between a first portion of light and a second portion of light within the phase shifter, and an output element configured to output the light from the phase shifter directly toward the target object. The output element includes a first output waveguide configured to act as a first point source; and a second output waveguide configured to act as a second point source. The light detector is positioned to receive reflected light from the target object. | 11-18-2010 |
20110109914 | METHOD AND APPARATUS FOR POLARIZATION-SENSITIVE OPTICAL COHERENCE TOMOGRAPHY - A method and apparatus for extracting the vector optical properties of biological samples with micron-scale resolution in three dimensions, using polarization-sensitive optical coherence tomography (PS-OCT). The method measures net retardance, net fast axis, and reflectivity. Polarization sensing is accomplished by illuminating the sample with at least three separate polarization states, using consecutive acquisitions of the same pixel, A-scan, or B-scan. The method can be implemented using non-polarization-maintaining fiber and a single detector. This PS-OCT method reported measures fast axis explicitly. In a calibration test of the system, net retardance was measured with an average error of 7.5° (standard deviation) 2.2° over the retardance range 0° to 180°, and fast axis with average error of 4.8° over the range 0° to 180°. | 05-12-2011 |
20110141479 | INTERFEROMETER - An interferometer comprises: a light source; a first polarization beam splitter configured to reflect, as reference light, a first polarization component of light emitted from the light source, and to transmit, as measurement light, a second polarization component of the light emitted from the light source; a birefringent-material element located between the light source and the first polarization beam splitter; and a light-receiving device configured to receive an interfering light generated by interference of the measurement light transmitted through the first polarization beam splitter, reflected by a reflecting surface to be measured, and transmitted through the first polarization beam splitter, with the reference light reflected by the first polarization beam splitter. The interferometer is configured such that the reference light and the measurement light pass through the birefringent-material element between the first polarization beam splitter and the light-receiving device. | 06-16-2011 |
20120002213 | SHAPE DETERMINING DEVICE - An object of the present invention is to measure thickness distribution with precision by using a simple device configuration without being affected by vibrations of a to-be-measured object. In the present invention, for each of the front and the back surfaces of a to-be-measured object | 01-05-2012 |
20120250028 | Optical Buffering Methods, Apparatus, and Systems for Increasing the Repetition Rate of Tunable Light Sources - In one embodiment, the invention relates to an apparatus for increasing the repetition rate in a light source. The apparatus includes a first optical coupler comprising a first arm, a second arm and a third arm; a first mirror in optical communication with the second arm of the first optical coupler; and a first optical delay line having a first end in optical communication with the third arm of the first optical coupler and a second end in optical communication with a second mirror, wherein light entering the first arm of the first optical coupler leaves the first arm of the first optical coupler either delayed by an amount (τ) or substantially undelayed. | 10-04-2012 |
20130033709 | INTERFEROMETRIC POSTURE DETECTION SYSTEM - The general field of the invention is that of optical systems for detection of the orientation of mobile objects in space. The main application is helmet posture detection inside of an aircraft cockpit. The system according to the invention operates by interferometry. It comprises a fixed electro-optical device comprising one or more collimated point-like emission sources and a detection assembly comprising one or more point-like photosensitive detectors. Two or more retro-reflecting devices referred to as “cube corner” are disposed on the mobile object. This system can be completed by optical means operating in polarized light mode allowing the direction of variation of the interference fringes to be determined and by other optical devices allowing an initial orientation to be measured. | 02-07-2013 |
20130242311 | WHITE-LIGHT INTERFEROMETRIC MEASURING DEVICE - A white-light interferometric measuring device includes: a white light source that emits a white light beam; a beam splitter that reflects the white light beam; and an interference objective lens that collects the white light beam having reflected off the beam splitter in the direction of an optical axis and irradiates a measurement workpiece with the white light beam, the interference objective lens generating interference between a measurement light beam obtained by reflection of the white light beam off the measurement workpiece and a reference light beam obtained by branching of the white light beam to be converged on the measurement workpiece. Polarization correcting means that corrects the white light beam to enter the interference objective lens to circularly polarized light is arranged between the white light source and the interference objective lens. | 09-19-2013 |
20140132962 | Position Detector and Light Deflection Apparatus - Position detector for determining the rotation angle position of a rotatably supported object, comprising a light source for producing a light beam, a diffraction grating, a mirror which is connected with the object in a co-rotating manner in such a way that the light beam is reflected therefrom onto the diffraction grating and passes over the diffraction grating during a rotation of the mirror, thereby producing diffraction light, an interference device which is configured such as to be able to bring different diffraction orders of the diffraction light to interference, thereby producing an interference pattern, a light detector by means of which a brightness course, caused by the passing over of the diffraction grating with the reflected light beam, of the interference pattern can be detected, and an evaluation unit by which the rotation angle position of the object can be determined based on the brightness course. | 05-15-2014 |
20160027545 | DRIFT-CORRECTED, HIGH-RESOLUTION OPTICAL TRAP AND HIGH-SENSITIVITY ANGULAR INTERFEROMETER - A drift-adjusted interferometer and optical trap are disclosed that employ two reference beams with an optical property that allows them to be separated from the two trapping beams. The reference and trapping beams are combined collinearly and optically inverted so that each reference beam overlays with the opposite trapping beam. Each pair of beams is then focused on a microsphere and the resulting four back-focal plane interferometry signals are monitored such that the relative motion between a given trapping beam with its overlaid reference beam provides a direct measurement of the physical drift occurring due to mechanical drift of the differential path components. | 01-28-2016 |
356493000 | Displacement or distance | 17 |
20080198387 | OPTICAL AXIS POLARIZATION TYPE LASER INTERFEROMETER - An optical axis polarization type laser interferometer including a reference sphere which forms a reference of measurement, a retro-reflecting means disposed at a measurement object, a laser interference measuring apparatus for outputting a measurement value corresponding to an increase or a decrease in the distance to and from the retro-reflecting means; and a two-axis turning mechanism for turning an emission beam of the corresponding laser interference measuring apparatus centering around the reference sphere, which measures, with the center coordinates of the reference sphere used as the reference, the distance to and from the retro-reflecting means where the optical axes of the emission beam from the laser interference measuring apparatus mounted on the two-axis turning mechanism and a return beam become parallel to each other, wherein the fixing portion of the first axis turning mechanism installed at the base part of the apparatus is disposed at the inner circumference thereof, the reference sphere is placed at the fixing portion thereof, and at the same time, the moving portion of the first axis turning mechanism is placed at the outer circumference of the fixing portion, and the second axis turning mechanism is mounted on the moving portion thereof. Therefore, complexities in mechanism design can be simplified to a large extent with respect to the first axis turning mechanism that composes the two-axis turning mechanism. | 08-21-2008 |
20090091767 | LINEAR DISPLACEMENT AND TILTING ANGLE MEASURING DEVICE - A tilting angle measuring device includes an optical device, a four-quadrant optical detector and a computing unit. By the optical device, a light beam emitted by the coherent light source is processed into a reference beam and a test beam. The four-quadrant optical detector has four photoelectric converting units arranged in an array for respectively receiving the reference and test beams. The computing unit is electrically connected to the four-quadrant optical detector for computing a tilting angle of the object with respect to a predetermined position according to four intensity values of the test beam. | 04-09-2009 |
20100033731 | LASER DISTANCE MEASURING APPARATUS - A laser interferometer ( | 02-11-2010 |
20100067021 | Method of detecting a movement of a measuring probe and measuring instrument - A method of detecting a movement of a measuring probe provided between an objective lens adapted to image an object plane on a predetermined image plane and the object plane is disclosed. Additionally, a measuring instrument comprising an objective lens and a measuring probe is disclosed. An input beam of light is split into a measurement beam and a reference beam. The measurement beam is focused on a reverse focal plane of the objective lens such that the measurement beam is collimated by the objective lens. The collimated measurement beam is reflected at the measuring probe. The reflected measurement beam is directed towards the objective lens such that the objective lens focuses the reflected measurement beam on the reverse focal plane. The reflected measurement beam is collimated. The collimated reference beam and the reference beam are superimposed to form a superimposed beam and an interference between the reflected measurement beam and the reference beam is detected. | 03-18-2010 |
20100231921 | METHODS AND SYSTEMS FOR MEASURING TARGET MOVEMENT WITH AN INTERFEROMETER - Systems and methods are disclosed for an interferometer system. An interferometer system may comprise a plurality of light sources, wherein each light source of the plurality is configured to transmit a source beam. The interferometer system may also include an interferometer including a polarizing beam splitter and a reference reflector. The interferometer is configured to receive the source beam and transmit a measurement beam to a target reflector and a reference beam to the reference reflector. Additionally, the interferometer system may include a plurality of receivers, wherein each receiver of the plurality is associated with a light source and configured to receive a mixed beam comprising a reflected measurement beam and a reflected reference beam. Moreover, the interferometer is configured to receive at least one source beam at an angle with respect to an axis perpendicular to a side of the interferometer configured to receive the source beam. | 09-16-2010 |
20110051146 | INTERFEROMETRIC DISTANCE-MEASURING METHOD WITH DELAYED CHIRP SIGNAL AND SUCH AN APPARATUS - In a distance-measuring method comprising a distance-measuring apparatus having at least one frequency-modulatable laser source for producing chirped laser radiation. The laser radiation has radiation components with opposite chirp as time dependency of the modulated wavelengths, the simultaneous oppositeness of the frequency curve being realized via an optical delay path ( | 03-03-2011 |
20110102805 | MEASURING APPARATUS - The present invention provides a measuring apparatus for measuring an absolute distance between a reference surface and a test surface, including a phase detection unit configured to detect an interference signal between light reflected by the reference surface and light reflected by the test surface, and detect, from the interference signal, a phase corresponding to an optical path length between the reference surface and the test surface, and a processing unit configured to perform processing of obtaining the absolute distance by controlling the phase detection unit so as to detect the phase corresponding to the optical path length between the reference surface and the test surface for each of a first reference wavelength and a second reference wavelength while changing the wavelength of light to be emitted by a first light source continuously from the first reference wavelength to the second reference wavelength. | 05-05-2011 |
20110134434 | METHOD AND SYSTEM FOR POSITIONING BY USING OPTICAL SPECKLE - A method and system for positioning by using optical speckle are disclosed in this invention. A highly coherent laser light irradiates a positioning template in advance to record optical speckles caused by interference by scattered light beams from the positioning template for establishing a speckle database. Furthermore, a reference point is defined to position each recorded speckle. Therefore, a coordinate with respect to the reference point corresponding to a specified speckle can be used to position a target or applied to distance measurement by the speckle database. The precision of the speckles according to the present invention is within several micrometers. Hence, it can provide high precision positioning. | 06-09-2011 |
20120062903 | METHOD AND APPARATUS FOR MEASURING DISPLACEMENT OF A SAMPLE TO BE INSPECTED USING AN INTERFERENCE LIGHT - In a displacement measurement apparatus using light interference, a probe light path is spatially separated from a reference light path. Therefore, when a temperature or refractive index distribution by a fluctuation of air or the like, or a mechanical vibration is generated, an optical path difference fluctuates between both of the optical paths, and a measurement error is generated. In the solution, an optical axis of probe light is brought close to that of reference light by a distance which is not influenced by any disturbance, a sample is irradiated with the probe light, a reference surface is irradiated with the reference light, reflected light beams are allowed to interfere with each other, and a displacement of the sample is obtained from the resultant interference light to thereby prevent the measurement error from being generated by the fluctuation of the optical path difference. | 03-15-2012 |
20120314220 | METHOD AND DEVICE FOR MEASURING MOTION ERROR OF LINEAR STAGE - Measurement of motion errors of a linear stage is performed to enable accurate measurement of motion errors in linear directions and a rotational direction in the linear stage using a diffraction grating. A first beam splitter splits a laser beam emitted from a light emitting unit. A first measurement unit measures a unidirectional linear motion error of the linear stage using one laser beam component split by the first beam splitter and a second measurement unit measures an angular motion error and another unidirectional linear motion of the linear stage error using a diffracted beam component obtained by diffracting another laser beam component split by the first beam splitter through the diffraction grating. A third measurement unit circularly polarizes the beam component diffracted through the diffraction grating to measure a third unidirectional linear motion error of the linear stage. | 12-13-2012 |
20140139846 | INTERFEROMETRIC DISTANCE MEASURING METHOD FOR MEASURING SURFACES, AND SUCH A MEASURING ARRANGEMENT - A distance measuring method for measuring surfaces uses a laser source having a frequency that can be modulated to tune a wavelength of a laser beam in a wavelength range. The laser beam is generated with a coherence length to provide a measuring beam and is emitted at the surface, located within a specified distance range, as a measuring beam. The measuring beam is back-scattered by the surface and is received again and used to interferometrically measure the distance from a reference point to the surface. The specified distance range lies at least partly outside of the coherence length. One portion of the laser beam is temporally delayed with respect to another portion, such that the one optical path difference caused by the delay matches the optical path difference that corresponds to a distance in the specified distance range plus or minus the coherence length of the laser. | 05-22-2014 |
20140185056 | FIBER OPTIC SENSOR FOR POSITION SENSING - A system for sensing the position of a movable object includes a polarization maintaining fiber configured to receive light from a light source; an optical system configured to rotate an angle of polarization of the light by a first predetermined angle; a low birefringence fiber connected to the optical system at a first end and having a mirror connected to a second end configured to reflect the light and rotate the angle of polarization at a second predetermined angle, the second end being configured to overlap a magnetic field of the a magnet attached to the object. The angle of polarization is rotated to a third predetermined angle proportional to at least one of the strength of the magnetic field and an amount of the overlap. The optical system is configured to decompose the third predetermined angle into a first component and a second component. A detector is configured to detect a differential between the first and second components indicative of the amount of the overlap. | 07-03-2014 |
20150300813 | METHOD AND DEVICE FOR LASER-OPTICAL DETECTION OF A SURFACE MOVEMENT OF A SAMPLE - A method for laser-optical detection of a surface movement of a sample ( | 10-22-2015 |
356494000 | Having wavefront division (e.g., by diffraction) | 4 |
20090268210 | Compact Littrow Encoder - A Littrow encoder is disclosed. The encoder includes first and second interferometers and a beam splitter assembly that splits a first instrument light beam into first and second interferometer input beams and directs these beams into the first and second interferometers, respectively. Each interferometer generates a measurement beam and a reference beam and directs the measurement beam toward a grating on a surface from which the measurement beam is diffracted, the measurement beam from the first interferometer striking the surface at a Littrow angle that is the negative of the angle at which the measurement beam from the second interferometers strikes that surface. Each interferometer includes at least one intensity detector that generates a signal related to an intensity of light in a combined light beam that includes the reference and measurement beams from that interferometer. | 10-29-2009 |
20120057171 | SELF-REFERENCING INTERFEROMETER, ALIGNMENT SYSTEM, AND LITHOGRAPHIC APPARATUS - A self-referencing interferometer includes an optical system to split an alignment beam to create a reference beam and a transformed beam. The optical system includes a beam splitter to combine the reference beam and the transformed beam so that the diffraction orders in the reference beam spatially overlap with their respective opposite orders in the transformed beam. A detector system receives the spatially overlapping reference beam and transformed beam from the optical system and determines a position signal. The detector system includes a polarizing system for manipulating the polarization of the beams so that they interfere, and for directing the interfering reference beam and transformed beam to a detector for determining a position signal from the variation of intensity of the interfering beams. | 03-08-2012 |
20150292870 | DISPLACEMENT DETECTING DEVICE - A displacement detecting device includes a light source that performs irradiation with light, a light-beam splitting section, a reflection/transmission section, a phase plate, a transmission-type diffraction grating, a light-beam combining section, a light-receiving section, and a relative position information output unit. The reflection/transmission section transmits or reflects a first light beam, and causes the beam to enter a member to be measured. Furthermore, the reflection/transmission section guides the first light beam to a specific position of the member to be measured in the case where the member to be measured is in a reference position. Moreover, an optical path of the first light beam reflected by the member to be measured again overlaps with an optical path of the first light beam reflected at a specific position of the member to be measured. | 10-15-2015 |
20150354944 | Optical Position Measuring Device - In an optical position measuring device for detecting the relative position of a first measuring standard and a second measuring standard, movable relative to each other along at least one measuring direction, at a splitting grating, a beam bundle emitted by a light source is split up into at least two partial beam bundles. When passing through scanning beam paths, the partial beam bundles undergo different polarization-optical effects. After the differently polarized partial beam bundles are recombined at a combination grating, a plurality of phase-displaced, displacement-dependent scanning signals is able to be generated from the resulting beam bundle. No polarization-optical components are arranged in the scanning beam paths of the partial beam bundles between the splitting and recombination. To generate the different polarization-optical effects on the partial beam bundles, a conically incident illumination beam bundle impinges upon the splitting grating, the incident illumination beam bundle extending in a plane perpendicular to the measuring direction at an angle other than 0°, the plane of incidence being defined by the grating normal to the splitting grating and the direction of incidence of the illumination beam bundle. The scanning beam paths of the partial beam bundles are arranged in mirror symmetry with respect to the plane of incidence between the splitting and recombination. | 12-10-2015 |
356495000 | Contour or profile | 17 |
20090128827 | INTERFEROMETER UTILIZING POLARIZATION SCANNING - In one aspect, the disclosure features methods that include using a microscope to direct light to a test object and to direct the light reflected from the test object to a detector, where the light includes components having orthogonal polarization states, varying an optical path length difference (OPD) between the components of the light, acquiring an interference signal from the detector while varying the OPD between the components, and determining information about the test object based on the acquired interference signal. | 05-21-2009 |
20090153873 | Optical Image Measuring Apparatus - Provided is an optical image measuring apparatus capable of obtaining a high-accuracy image without being influenced by a movement of an object to be measured. Flash light is emitted from a xenon lamp ( | 06-18-2009 |
20090213386 | Apparatus and method for measuring surface topography of an object - An apparatus for measuring surface topography of an object includes an optical arrangement capable of directing a first light beam at a surface of the object, providing a second light beam coherent with and spatially phase-shifted relative to the first light beam, and generating an interference beam from the second light beam and a reflection of the first light beam from the surface of the object. The apparatus further includes at least one line scan sensor for detecting and measuring the interference beam. | 08-27-2009 |
20090273790 | WAVELENGTH-TUNABLE LIGHT GENERATOR AND OPTICAL COHERENCE TOMOGRAPHY DEVICE - The present invention provides an OCT technique that permits tomographic observation of a biological body parts that is difficult to restrain and also provides a tomographic observation technique for the observation of a constrainable part that does not require constraint and remove the burden from biological body. A wavelength-tunable light generator (wavelength-tunable light source) is employed as the light source of the optical coherence tomography device. The wavelength-tunable light generator has a wave number tunable range width of at least 4.7×10 | 11-05-2009 |
20100027028 | Oblique incidence interferometer - An oblique incidence interferometer has favorable measurement accuracy while achieving miniaturization. The oblique incidence interferometer includes a light source that emits coherent light; a beam dividing unit that divides the coherent light from the light source into a measurement beam and a reference beam, polarizing directions of both beams being perpendicular to each other; a first beam folding unit that folds the measurement beam divided by the beam dividing unit to cause the folded measurement beam to be incident on the measurement object surface at a predetermined angle relative to the measurement object surface; a second beam folding unit that folds the measurement beam reflected by the measurement object surface; and a beam combining unit that combines the measurement beam folded by the second beam folding unit with the reference beam. | 02-04-2010 |
20100265515 | MEASUREMENT METHOD, MEASUREMENT APPARATUS, EXPOSURE APPARATUS, AND DEVICE FABRICATION METHOD - A measurement method of measuring a wavefront aberration of an optical system to be measured, comprising a first measurement step of measuring wavefronts of the optical system to be measured with respect to linearly polarized light beams along at least three different azimuths, a first calculation step of calculating a wavefront of the optical system to be measured with respect to non-polarized light and a birefringent characteristic of the optical system to be measured, based on the wavefronts of the optical system to be measured, which are measured in the first measurement step, and a second calculation step of calculating a wavefront of the optical system to be measured with respect to arbitrary polarized light, based on the wavefront and the birefringent characteristic of the optical system to be measured, which are calculated in the first calculation step. | 10-21-2010 |
20100309476 | LINEAR-CARRIER PHASE-MASK INTERFEROMETER - A phase-difference sensor measures the spatially resolved difference in phase between orthogonally polarized reference and test wavefronts. The sensor is constructed as a linear-carrier phase-mask aligned to and imaged on a linear-carrier detector array. Mireau and Fizeau polarization interferometric objectives are implemented with a thin conductive wire grid optically coupled to the objective beam splitter. | 12-09-2010 |
20110122418 | APPARATUS FOR DETERMINING A HEIGHT MAP OF A SURFACE THROUGH BOTH INTERFEROMETRIC AND NON-INTERFEROMETRIC MEASUREMENTS - The invention relates to an apparatus and a method for determining a height map of a surface of an object. The apparatus can include positioning means for the object, a light source, an optical detector for converting the received light into electrical signals, first optics for directing light from the light source to the surface and for directing the light from the surface to the optical detector, a beam splitter located between the first optics and the surface, a reference mirror, second optics located between the beam splitter an the mirror for directing the light from the beam splitter to the mirror and from the mirror to the beam splitter, scanning means, processing means that converts the signal from the optical detector into a height map. The beam splitter can be a polarizing beam splitter. A controllable polarization controller can be located between the light source and the first optics. | 05-26-2011 |
20110286003 | OPTICAL IMAGE MEASURING DEVICE - An optical image measuring device includes: an optical system that generates and detects interference light; an image forming part that forms a tomographic image based on the detection; an alignment part that performs alignment of the optical system with respect to an object; a focusing part that focuses the optical system with respect to the region of interest; a determining part that determines the suitability of the position of the optical system by the alignment part, the suitability of the focus state by the focusing part, and the suitability of the position of the tomographic image in a frame; a control part that, when it is determined that all of the positions of the optical system, position of focus state and the position in said frame are appropriate, controls the optical system and the image forming part, making it possible to obtain the tomographic image of the region of interest. | 11-24-2011 |
20110292402 | INTERFERENCE MEASUREMENT APPARATUS AND METHOD FOR MEASURING INTERFERENCE - An embodiment of the present invention realizes an interference measurement apparatus which can obtain an interference image to be used for obtaining three-dimensional information of a subject which dynamically changes. An interference measurement apparatus of the present invention, which captures an interference image formed by the reference light beam and the object light beam which has reached the image-capturing element via a subject, the interference measurement apparatus includes: a laser light source; a beam splitter which splits a laser beam into a reference light beam and an object light beam; and an image-capturing element; a polarization splitting section which splits the object light beam into two types of object light beams which are different in polarization direction so that an angular difference is caused between respective propagation directions of the two types of object light beams; and a polarizer array device which allows (i) the reference light beam and (ii) the two types of object light beams which have reached the polarizer array device via the subject to pass through the polarizer array device ( | 12-01-2011 |
20120026506 | SYSTEM FOR IN VITRO ANALYSIS OF FLUID DYNAMICS ON CONTACT LENSES VIA PHASE SHIFTING INTERFEROMETRY - A system and method for analyzing the dynamics of fluid layers on contact lenses utilizes phase shifting interferometry to quickly and accurately model the time-evolution of the fluid layers. The system and method are utilized for in vitro studies. | 02-02-2012 |
20120026507 | INTERFEROMETRIC SYSTEM WITH REDUCED VIBRATION SENSITIVITY AND RELATED METHOD - A source module ( | 02-02-2012 |
20140043617 | MEASUREMENT APPARATUS AND MEASUREMENT METHOD - The present invention provides a measurement apparatus which measures a shape of a test object, including a detection unit configured to detect interference light between reference light from a reference surface and test light from the test object, thereby obtaining an interference image, and a processing unit configured to perform processing of obtaining the shape of the test object based on the interference image obtained by the detection unit, wherein in a measurement mode in which the interference image is obtained under a measurement condition that the optical path length difference measurable range is a second range smaller than a first range, the processing unit obtains a second shape of the test object by using data of an obtained first shape, and the interference image obtained by the detection unit in the measurement mode. | 02-13-2014 |
20140285814 | METHOD FOR DETERMINING ROUGHNESS DATA AND/OR TOPOGRAPHY DATA OF SURFACES IN MATERIAL MICROSCOPY - A method for determining roughness data and/or topography data of surfaces in material microscopy, particularly from flat samples, based on a shearing polarization interferometrical sequence with a microscopic “TIC” module (“Total Interference Contrast Module”) of a microscope, wherein the method can be carried out both polychromatically and monochromatically. At least two tilted wave fronts are generated, which after reflection or transmission on a sample generate two images of said sample in the form of fringe patterns, said images being offset relative to one another and interfering with one another, from which roughness values and height topographies of the surface of the sample are determined by application of image evaluation. | 09-25-2014 |
20140320865 | APPARATUS FOR DETECTING A 3D STRUCTURE OF AN OBJECT - An apparatus for detecting a 3D structure of an object. The apparatus has first and second laser emitters which generate laser radiation having first and second wavelengths, respectively, the first wavelength being different from the second wavelength. Optical devices are disclosed, including a beam splitter, which splits the laser radiation of the laser emitters in each case into a reference radiation and an illuminating radiation. The illuminating radiation impinges upon the object to be measured, is reflected by the object as object radiation and interferes with the reference radiation. A detector receives the interference patterns. The laser emitters are located such that the illuminating radiation of the first and second laser emitters impinge upon the object at different angles of incidence. Also discussed is a measuring device which measures the two wavelengths of the laser radiation of the laser emitters and influences the recording of the interference patterns. | 10-30-2014 |
20150015893 | Optical Inspection Apparatus and Method Thereof - An object of the present invention is to provide an optical inspection apparatus that suppresses an influence of quantum noise and obtains superior defect detection performance even when an amount of light is small and a method thereof. | 01-15-2015 |
20160054195 | SYSTEM AND METHODS FOR MEASURING OPHTHALMIC LENS - The system and methods are made to apply interferometry to ophthalmic applications. The system makes use of a low-coherence interferometer to obtain a plurality of measurements of a contacts lens. The system and methods characterizes the surface profile of both surfaces of a contact lens, a thickness profiles, and combines these measurements with an index information to reconstruct a complete model of the contact lens. | 02-25-2016 |