Class / Patent application number | Description | Number of patent applications / Date published |
356457000 | Holography | 41 |
20080252898 | METHOD FOR OPTICALLY TESTING SEMICONDUCTOR DEVICES - A method for optically testing semiconductor devices or wafers using a holographic optical interference system with light source providing a light beam of coherent wavelength with a wavelength to which the semiconductor material is transparent, splitting the light beam into a reference beam and an object beam, imposing the object beam on the semiconductor material to generate a reflected object beam reflected from interior structures of the semiconductor material, adjusting the angle of the reference beam relative to the object beam between a plurality of angles with the semiconductor material being a different state for each angle of the reference beam, imposing the reflected object beam and the reference beam onto a detection device to create a plurality of interference patterns, one for each of the reference beam angles, and comparing the interference patterns to one another to determine and display characteristics within the semiconductor material. | 10-16-2008 |
20080285045 | Determining Electric Field Characteristics of Laser Pulses - Various systems and methods for analysis of optical pulses are provided. In one embodiment, an optical system is provided having an optical axis. The optical system includes a two-dimensional diffraction grating positioned along the optical axis, and a spectral filter positioned along the optical axis after the two-dimensional diffraction grating. The spectral filter is angularly offset about a vertical transverse angle associated with the optical system. The diffraction grating is angularly offset about the optical axis relative to the spectral filter, and an optical capture device positioned after the spectral filter. | 11-20-2008 |
20080304075 | INTERFEROMETER FOR OPTICALLY MEASURING AN OBJECT - An interferometer for optically measuring an object ( | 12-11-2008 |
20080309944 | Quantitative phase-contrast digital holography method for the numerical reconstruction of images, and relevant apparatus - The invention concerns a quantitative phase-contrast digital holography method for the numerical reconstruction of images, comprising the following steps: A. acquiring a digital hologram of an investigated object; B. reconstructing the digital hologram in a reconstruction plane; C. reconstructing the complex field for the digital hologram; D. obtaining the phase map starting from the complex field; the method being characterised in that it further comprises the following steps:
| 12-18-2008 |
20090097034 | SYSTEM AND METHOD FOR VISUAL QUALITY CHARACTERIZATION OF HOLOGRAPHIC MATERIALS - Apparatus and method for characterizing perceived visual quality of holographic materials, such as diffraction gratings. A white light source directs a collimated beam onto an embossed material. The first order diffracted light strikes a white background directly in view of a digital camera, which records an image. The image is analyzed to calculate total color intensity of the diffracted light and an estimate of the color distinctness. The data is compared to other samples to determine relative visual quality. | 04-16-2009 |
20090116030 | Fingerprint sensor using a spectral filter and a holographic optical element - In one embodiment, a fingerprint sensing system includes a interference narrow band pass filter, a holographic optical element, a transparent slab stacked together with optical cement. The finger is placed on the filter and illuminated by a narrow band source, the center of its band shifted appropriately with respect to the pass band of the interference filter. A camera on the other side of the slab receives the fingerprint image. The light from the valleys and ridges propagating in the direction of the camera are blocked by the interference filter. The light from the ridges at steep angles are bent by the holographic optical element and then directed towards the lens. This way the ridges are seen by the camera, but not the valleys. In another embodiment, a miniaturized version, the interference filter, a modified holographic optical element, and a blocking filter (if necessary) to block room light can be sequentially attached to the image sensor. In yet another embodiment, the interference filter can be directly coated over an image sensor creating a very simple fingerprint sensor. The principle behind all of the above embodiments is the same, viz: the spectral transmission band of an interference filter shifts with change in the angle of incidence. | 05-07-2009 |
20090128825 | Apparatus and method for dynamic cellular probing and diagnostics using holographic optical forcing array - The present invention utilizes a holographic optical forcing array for dynamic cellular probing and diagnostics. A holographic optical trapping system generates optical forces on objects so that deformations thereof may be quantified. In one embodiment, digital holography is used to generate an interference pattern, and an analysis thereof determines the phase profile which yields a measurement of the objects' shape deformation using only one image. In another embodiment, phase-stepped holography allows the phase profile of an object to be measured using only one image, by using a holographic optical element to make phase-shifted replicas of the beam in space. In another embodiment, the optical forcing array applies optical forces to beads placed on the objects' surface, deforming the objects. The beads' position is determined by applying Mie theory, and analysis thereof yields the three dimensional position of the beads, and a measurement of the deformation displacement on the objects' surface. | 05-21-2009 |
20090207415 | METHOD OF READING INFORMATION FROM A HOLOGRAPHIC DATA STORAGE MEDIUM AND HOLOGRAPHIC DATA READ OUT DEVICE - The present invention relates to a method of reading information from a holographic data storage medium ( | 08-20-2009 |
20090237672 | Method and Apparatus for Interferometrically Measuring the Shape of a Test Object - The invention relates to a method and to an apparatus for interferometrically determining a deviation of an actual shape of an effective reflection surface ( | 09-24-2009 |
20100091292 | HOLOGRAPHIC CONDITION ASSESSMENT SYSTEM FOR A STRUCTURE INCLUDING A SEMICONDUCTOR MATERIAL - An improved condition testing system and method integrated into microelectronic circuits includes a structure including a semiconductor material with a target portion and a second portion for determining the presence and nature of various external (e.g. magnetic field, microwave, bioelectric or incident radiation) or internal stresses (e.g. binary circuit-state or analog signal recognition) or conditions acting upon the material. The target portion has a first feature when at least one of the following occurs: an external force is received by the second portion of the structure and an internal condition occurs in the target portion. The system and method further has a test grating determined and shaped and located to produce a first optical interference pattern when the target portion and the grating are exposed to non-invasive illumination and when the target portion has the first feature. Further implementations use one or more diffraction structures, holograms, or holographic optical elements spaced apart from the circuit or electronic device under test to non-invasively optically test in parallel two or more targeted conditions having a shape, size, structure, intensity or orientation of the stress acting upon the material. | 04-15-2010 |
20100157307 | Sensor and an imaging system for remotely detecting an object - A sensor for remotely detecting an object, the sensor comprising:
| 06-24-2010 |
20100201990 | INTERFEROMETER FOR OPTICALLY MEASURING AN OBJECT - An interferometer for optically measuring an object ( | 08-12-2010 |
20100231918 | Three wavelength quantitative imaging systems - An optical system includes more than two optical interferometers that generate interference phenomena between optical waves to measure a plurality of distances, a plurality of thicknesses, and a plurality of indices of refraction of a sample. An electromagnetic detector receives an output of the optical interferometers to render a magnified image of at least a portion of the sample. A controller reduces or eliminates undesired optical signals through a hierarchical phase unwrapping of the output of the electromagnetic detector. | 09-16-2010 |
20110001980 | OPTICAL PHASE PROCESSING IN A SCATTERING MEDIUM - An optical phase processing system for a scattering medium. A first beam has a direction and a wavefront and the first beam is configured to enter a holographic recording medium. A scattering medium is illuminated by a signal beam generating at least one scattered beam. An interference pattern is recorded from the at least one scattered beam and the first beam. A second beam is generated in a direction opposite to the direction of the first beam, the second beam having a wavefront and a phase substantially opposite to a phase of the wavefront of the first beam, and the second beam is configured to enter the holographic recording medium. The second beam and the interference pattern interact to generate at least one reconstructed beam having a phase substantially opposite to a phase of the at least one scattered beam, and the at least one reconstructed beam is configured to be viewable through the scattering medium. | 01-06-2011 |
20110043816 | Phase Object Identification Device and Method - An object of the invention is to provide a phase object identification device and method which can identify a phase object in a completely different manner from conventional methods for observing or measuring a phase object. | 02-24-2011 |
20110122415 | METHOD FOR OPTICALLY ENHANCED HOLOGRAHIC INTERFEROMETRIC TESTING FOR TEST AND EVALUATION OF SEMICONDUCTOR DEVICES AND MATERIALS - Improved methods and systems for inspection imaging for holographic or interferometric semiconductor test and evaluation through all phases of manufacture. Specifically, systems and methods for extending the range of optical holographic interferometric inspection for evaluating microelectronic devices and the interplay of electromagnetic signals and dynamic stresses to the semiconductor material are provided in which an enhanced imaging method provides continuous and varying magnification over a plurality of interleaved optical pathways and imaging devices. Analysis of one or more holographic interference patterns displays internal and external stresses and the various effects of such stresses upon the operating characteristics of features within the feature or interior structures or internal surfaces of the semiconductor material or wafer. | 05-26-2011 |
20110122416 | TURBIDITY SUPPRESSION BY OPTICAL PHASE CONJUGATION USING A SPATIAL LIGHT MODULATOR - A detector of light transmitted through a turbid medium, comprising: one or more Digital Optical Phase Conjugation (DOPC) devices, wherein the DOPC devices include (1) a sensor for detecting input light that has been transmitted through the turbid medium and inputted on the sensor; and (2) a spatial light modulator (SLM) for outputting, in response to the input light detected by the sensor, output light that is an optical phase conjugate of the input light. | 05-26-2011 |
20110222068 | NEAR REAL TIME OPTICAL PHASE CONJUGATION - An optical system and associated method enable near real time optical phase conjugation. In the method, a translucent medium is illuminated by a sample illumination beam. Light scattered by the medium is directed to an electronic image sensor while a reference beam is also directed to the electronic image sensor. The scattered light and the reference beam form an interference pattern at the electronic image sensor. A digital representation of the interference pattern is recorded using the electronic image sensor, and the characteristics of a conjugate of the sample beam are computed from the numerical representation. A conjugate beam having the computed characteristics is generated using a configurable optical element and directed back to the translucent medium. The generation of the conjugate beam may be accomplished using a spatial light modulator. | 09-15-2011 |
20110242543 | INTERFEROMETRIC SYSTEMS HAVING REFLECTIVE CHAMBERS AND RELATED METHODS - Disclosed herein are interferometric systems having reflective chambers and related methods. According to an aspect, an interferometric system may include a light source for generating an illumination beam that propagates towards a sample. A sample holder may hold the sample and include a partially reflective cover for allowing a first portion of the illumination beam to pass therethrough to interact with the sample to produce a sample beam that propagates substantially along an optical axis. The cover may be oriented at an angle for reflecting a second portion of the illumination beam to produce a reference beam that propagates at a predetermined angle with respect to the optical axis. An imaging module may redirect the reference beam towards the optical axis at a detection plane. A detector may intercept the sample and reference beams and may generate a holographic representation of the sample based on the beams. | 10-06-2011 |
20110255093 | INTERFEROMETRIC SYSTEM WITH SPATIAL CARRIER FREQUENCY CAPABLE OF IMAGING IN POLYCHROMATIC RADIATION - In the interferometric system, the image plane is imaged by an output imaging setup via a transmission system of reflectors to the output plane and a reflection type diffraction grating is located in the image plane of an imaging setup of a reference branch. The transmission systems of reflectors are adjusted so that axes of both branches coincide at an entrance to the output plane and parallel with a normal line of the output plane, and an axial beam, diffracted by the reflection type diffraction grating at an angle α, enters into the output plane at an angle β, and the relation between angle β and α is sin(β)=sin(α)/m, where m is a magnification of the output imaging setup. The system enables the achievement of a holographic imaging of an object by low-coherence waves. Incoherent waves allow the imaging of objects immersed in scattering media. | 10-20-2011 |
20120069345 | METHOD AND APPARATUS FOR RETRIEVAL OF AMPLITUDE AND PHASE OF NONLINEAR ELECTROMAGNETIC WAVES - The present invention discloses a method and its associated apparatus to retrieve the amplitude and, especially, the phase of nonlinear electromagnetic waves. The application field of the present invention is optical imaging. A sample is probed by coherent electromagnetic radiation, and by a nonlinear interaction such as harmonic generation a nonlinear object wave is emitted. A nonlinear reference wave is generated by interaction of the same nature with the coherent electromagnetic radiation, and an interference between the nonlinear object wave and the nonlinear reference wave is sensed by a detector array. As an example, the technique makes possible real-time nanometric localization and tracking of nonlinear field emitters, such as, but not limited to, nanoparticles. | 03-22-2012 |
20120127473 | OPTICALLY ENHANCED HOLOGRAPHIC INTERFEROMETRIC TESTING METHODS FOR THE DEVELOPMENT AND EVALUATION OF SEMICONDUCTOR DEVICES, MATERIALS, WAFERS, AND FOR MONITORING ALL PHASES OF DEVELOPMENT AND MANUFACTURE - Improved methods and systems for inspection imaging for holographic or interferometric semiconductor test and evaluation through all phases of device development and manufacture. Specifically, systems and methods are disclosed for extending the range of optical holographic interferometric inspection for testing and evaluating microelectronic devices and determining the interplay of electromagnetic signals and dynamic stresses to the semiconductor material are provided in which an enhanced imaging method provides continuous and varying the magnification of the optical holographic interferometric images over a plurality of interleaved optical pathways and imaging devices. Analysis of one or more holographic interference patterns displays internal and external stresses and the various effects of such stresses upon the operating characteristics of features within the features, interior structures or within the internal surfaces of the semiconductor device at any stage of development or manufacture. | 05-24-2012 |
20130003073 | OPTICAL SYSTEM FOR A HOLOGRAPHIC MICROSCOPE - An optical system for a holographic microscope includes: a light source configured to emit a light beam; a grating configured to split the light beam into a reference beam and an object beam; a lens unit configured to irradiate a sample by the reference and object beams split by the grating; a spatial filter including a first region for the reference beam and a second region for the object beam; and a detector configured to detect an interference pattern caused by the reference and object beams. | 01-03-2013 |
20130057869 | COMPLEX INDEX REFRACTION TOMOGRAPHY WITH SUB LAMBDA/6-RESOLUTION - The present invention discloses a method to improve the image resolution of a microscope. This improvement is based on the mathematical processing of the complex field computed from the measurements with a microscope of the wave emitted or scattered by the specimen. This wave is, in a preferred embodiment, electromagnetic or optical for an optical microscope, but can be also of different kind like acoustical or matter waves. The disclosed invention makes use of the quantitative phase microscopy techniques known in the sate of the art or to be invented. In a preferred embodiment, the complex field provided by Digital Holographic Microscopy (DHM), but any kind of microscopy derived from quantitative phase microscopy: modified DIC, Shack-Hartmann wavefront analyzer or any analyzer derived from a similar principle, such as multi-level lateral shearing interferometers or common-path interferometers, or devices that convert stacks of intensity images (transport if intensity techniques: TIT) into quantitative phase image can be used, provided that they deliver a comprehensive measure of the complex scattered wavefield. The hereby-disclosed method delivers superresolution microscopic images of the specimen, i.e. images with a resolution beyond the Rayleigh limit of the microscope. It is shown that the limit of resolution with coherent illumination can be improved by a factor of 6 at least. It is taught that the gain in resolution arises from the mathematical digital processing of the phase as well as of the amplitude of the complex field scattered by the observed specimen. In a first embodiment, the invention teaches how the experimental observation of systematically occurring phase singularities in phase imaging of sub-Rayleigh distanced objects can be exploited to relate the locus of the phase singularities to the sub-Rayleigh distance of point sources, not resolved in usual diffraction limited microscopy. In a second, preferred embodiment, the disclosed method teaches how the image resolution is improved by complex deconvolution. Accessing the object's scattered complex field—containing the information coded in the phase—and deconvolving it with the reconstructed complex transfer function (CTF) is at the basis of the disclosed method. In a third, preferred embodiment, it is taught how the concept of “Synthetic Coherent Transfer Function” (SCTF), based on Debye scalar or Vector model includes experimental parameters of MO and how the experimental Amplitude Point Spread Functions (APSF) are used for the SCTF determination. It is also taught how to derive APSF from the measurement of the complex field scattered by a nanohole in a metallic film. In a fourth embodiment, the invention teaches how the limit of resolution can be extended to a limit of λ/6 or smaller based angular scanning. In a fifth embodiment, the invention teaches how the presented method can generalized to a tomographic approach that ultimately results in super-resolved 3D refractive index reconstruction. | 03-07-2013 |
20130070251 | Systems and Methods of Dual-Plane Digital Holographic Microscopy - An embodiment of the disclosed DHM system includes a light source configured to emit coherent optical waves, a first optical Fourier element configured to Fourier transform the optical waves from the object area, wherein the Fourier transform occurs at a Fourier plane and the optical waves from the object area includes directly transmitted waves and diffracted waves, a phase modulator at the Fourier plane configured to introduce a phase delay between the directly transmitted waves and the diffracted waves, a second optical Fourier element configured to receive the directly transmitted waves and the diffracted waves from the phase modulator and to inversely Fourier transform the directly transmitted waves and the diffracted waves to provide interfered optical waves, and at least one imaging device configured to record the interfered optical waves at two image planes to generate a first interferogram and a second interferogram. | 03-21-2013 |
20130286403 | INTERFEROMETRIC METHOD AND DIGITAL HOLOGRAPHIC MICROSCOPE - An interferometric method for detecting information about a sample includes emitting a laser beam; splitting the laser beam into a reference beam and an object beam; transmitting the object beam through the sample in an incident angle; combining the reference beam with the object beam passed through the sample to form an interference pattern; detecting the interference pattern, and non-linearly scanning the object beam in order to detect a plurality of interference patterns. | 10-31-2013 |
20130308135 | OPTICAL METHOD FOR CHARACTERISING TRANSPARENT PARTICLES - The present invention is related to a method for characterising transparent objects ( | 11-21-2013 |
20140132960 | Near-Null Compensator and Figure Metrology Apparatus for Measuring Aspheric Surfaces by Subaperture Stitching and Measuring Method Thereof - A variable near-null compensator for measuring aspheric surfaces by subaperture stitching includes a pair of counter-rotating CGH phase plates, each of the phase plates having a phase function including two terms Z5 and Z7 of Zernike polynomials. The phase plates are mounted on a pair of precision rotary center-through tables, wherein rotational axes of the pair of precision rotary center-through tables coincide with the optical axes of the phase plates. A figure metrology apparatus includes a wavefront interferometer, the test mirror mount, the near-null compensator and the mechanical adjustment components therefor. The optical axis of the near-null compensator coincides with the optical axis of the interferometer. A method for measuring aspheric surfaces by subaperture stitching includes the steps of mounting the test mirror, measuring the subapertures with the figure metrology apparatus, and finally processing the data by stitching. | 05-15-2014 |
20140333935 | TRACKING AND CHARACTERIZING PARTICLES WITH HOLOGRAPHIC VIDEO MICROSCOPY - In-line holography to create images of a specimen, such as one or more particles dispersed in a transparent medium. Analyzing these images with results from light scattering theory yields the particles' sizes with nanometer resolution, their refractive indexes to within one part in a thousand, and their three dimensional positions with nanometer resolution. This procedure can rapidly and directly characterize mechanical, optical and chemical properties of the specimen and its medium. | 11-13-2014 |
20150062587 | HOLOGRAPHIC MICROREFRACTOMETER - An in-line holographic microscope is used for measurements of micrometer-scale particles and associated suspending fluid medium containing the particles. The system yields heterodyne scattering patterns that may be interpreted with Lorenz-Mie theory to obtain precise time-resolved information on the refractive index of the suspending medium for determining chemical composition, concentrations and makeup thereof. This approach can perform spatially resolved refractometry with measurements on calibrated refractive index standards and monitor chemical concentration in a microfluidic channel. Using commercially available colloidal spheres as probe particles and a standard video camera for detection yields volumetric refractive index measurements with a resolution of 2×10 | 03-05-2015 |
20150085291 | Compact Self-Contained Holographic and Interferometric Apparatus - A compact, self-contained holographic and interferometric apparatus and methods for eliminating vibration, including methods for eliminating relative displacement and vibration errors present in object and reference beam paths, are disclosed. The self-contained apparatus ( | 03-26-2015 |
20150292858 | DIGITAL OFF-AXIS HETERODYNE HOLOGRAPHIC INTERFEROMETRY - The invention relates to a digital holography method for detecting the vibration amplitude of an object ( | 10-15-2015 |
20180024008 | OPTICAL SYSTEM PHASE ACQUISITION METHOD AND OPTICAL SYSTEM EVALUATION METHOD | 01-25-2018 |
356458000 | For optical configuration | 8 |
20080291458 | Holographic interferometry for non-destructive testing of power sources - The present invention is connected with the holographic interferometry method and device that provides, to a very high precision, the reconstructing the original waveform of light emitted or reflected by an object. This method allows image resolution close to that of the wavelength of the light being used. The non-destructive method of holographic interferometry coupled with impulse heating of the test article to allow observation of its dynamic response to operating conditions, as described herein, is one of the most effective non-contact automated quality control methods available. | 11-27-2008 |
20090231593 | Method of aligning an optical system - A method of manufacturing an optical system having plural optical elements mounted relative to each other on a mounting structure of the optical system comprises disposing the optical system in a beam path of an interferometer apparatus having an interferometer optics and a selectable hologram for shaping a beam of measuring light to be incident on surfaces of the optical elements of the optical system; selecting a first hologram of the interferometer apparatus and recording at least one first interference pattern generated by measuring light reflected from a surface of a first optical element; selecting a second hologram of the interferometer apparatus, wherein the second hologram is different from the first hologram, and recording at least one second interference pattern generated by measuring light reflected from a surface of a second optical element, which is different from the first optical element; and adjusting a position of the first optical element relative to the second optical element on the mounting structure based upon the first interference pattern and the second interference pattern. | 09-17-2009 |
20100060897 | METHOD AND APPARATUS FOR ANALYSIS OF A SAMPLE OF CELLS - A non-destructive method and device for analyzing a sample comprising transparent living and/or dead cells, by 5 means of a digital holographic microscope, where the sample ( | 03-11-2010 |
20100165348 | RECONSTRUCTION OF NONLINEAR WAVE PROPAGATION - Disclosed are systems and methods for characterizing a nonlinear propagation environment by numerically propagating a measured output waveform resulting from a known input waveform. The numerical propagation reconstructs the input waveform, and in the process, the nonlinear environment is characterized. In certain embodiments, knowledge of the characterized nonlinear environment facilitates determination of an unknown input based on a measured output. Similarly, knowledge of the characterized nonlinear environment also facilitates formation of a desired output based on a configurable input. In both situations, the input thus characterized and the output thus obtained include features that would normally be lost in linear propagations. Such features can include evanescent waves and peripheral waves, such that an image thus obtained are inherently wide-angle, farfield form of microscopy. | 07-01-2010 |
20140022553 | Method and Arrangement for Short Coherence Holography - The invention relates to a method and arrangement for short coherence holography for distance measurement, for profile detection and/or for 3D detection of one or more object elements and/or object areas and/or objects or for readout of holographic volume memories with a holographic interferometer and with at least one short coherence light source. For each optically detected object element in the hologram the holographic interferometer has an optical path difference clearly unequal to zero. At least one spectrally integrally detecting, rastered detector is arranged. The short coherence light source with frequency comb is designed with the optical delay length Y1. Detected holograms are digitally reconstructed. Relative distances of object elements are digitally calculated from the hologram reconstructions, so that a 3D point cloud of object elements and/or object areas and/or objects is produced. Data can be read out optically in parallelised form from holographic volume memories or three-dimensionally structured signatures. | 01-23-2014 |
20150300803 | Three-Dimensional Shape Measuring Device, Method for Acquiring Hologram Image, and Method for Measuring Three-Dimensional Shape - [Problem] To provide a low-cost, high-precision three-dimensional shape measuring device using vibration-resistant phase shift digital holography. | 10-22-2015 |
20160131882 | COMMON-MODE DIGITAL HOLOGRAPHIC MICROSCOPE - A digital holographic microscope including a single mode fiber collimated light source which provides illumination for both the ‘science’ and ‘reference’ arms, a pair of microscope objectives located side-by side, and illuminated by the common beam, a relay lens whose center is between the two objectives, and a focal plane element where the interference pattern is measured. A lens-less digital holographic microscope and a reflective digital holographic microscope are also disclosed. | 05-12-2016 |
20160195479 | MULTIPLE BEAM TRANSMISSION INTERFEROMETRIC TESTING METHODS FOR THE DEVELOPMENT AND EVALUATION OF SUBWAVELENGTH SIZED FEATURES WITHIN SEMICONDUCTOR AND ANISOTROPIC DEVICES | 07-07-2016 |