Class / Patent application number | Description | Number of patent applications / Date published |
356453000 | Polarization | 22 |
20090073449 | Application of digital light processor in scanning spectrometer and imaging ellipsometer and the like systems - Application of digital light processor (DLP) systems in monochromator, spectrophotometer or the like systems to mediate selection of individual wavelengths, and/or to image elected regions of a sample in an imaging ellipsometer, imaging polarimeter, imaging reflectometer, imaging spectrophotometer, and/or to provide chopped beams. | 03-19-2009 |
20090168070 | METHOD AND DEVICE FOR MEASURING THE SPECTRAL PHASE OR THE COMBINED SPECTRAL AND SPATIAL PHASES OF ULTRA SHORT LIGHT PULSES - The method and device for measuring the spectral phase or combined spectral and spatial phases of ultra short light pulses, consisting of performing:
| 07-02-2009 |
20090257064 | Optical Absorption Spectrometer and Method for Measuring Concentration of a Substance - An optical absorption spectrometer is provided for determining the concentration of a substance within a sample. The optical absorption spectrometer comprises a first radiation source for supplying radiation to the sample to be measured; at least one cavity for containing the sample during measurement; and a detector assembly for detecting radiation transmitted along first and second optical paths through the sample, the length of the first optical path being greater than that of the second optical path. | 10-15-2009 |
20100290055 | SYSTEMS FOR MEASURING ELECTRO-OPTIC AND THERMO-OPTIC COEFFICIENTS BY USING INTERFERENCE FRINGE MEASUREMENT, AND METHODS OF MEASURING ELECTRO-OPTIC AND THERMO-OPTIC COEFFICIENTS BY USING THE SYSTEMS - Measuring of an electro-optic coefficient and a thermo-optic coefficient of an optical device and an optical material, and more specifically, to measurement systems and methods of evaluating the electro-optic and thermo-optic coefficients by using interference fringe measurement techniques, wherein those optical characteristics can be precisely measured over a wide wavelength intended without using a complicated measuring equipment. The system for measuring an electro-optic coefficient includes: a light source for outputting an optical beam of multi-wavelengths, an optical interferometer including an optical beam splitter for dividing the optical beam received from the light source into two separate beams, a reference arm for receiving any one of the divided optical beams, a sample arm for receiving the other of the divided optical beams and applying a voltage to an optical sample to be measured by being connected to the optical sample, and an optical beam combiner for combining and mutually interfering optical beams that are output through the reference arm and the sample arm, and an optical spectrum analyzing device for receiving the mutually interfered optical beam from the optical interferometer and analyzing a spectrum of the mutually interfered optical beam. | 11-18-2010 |
20110001979 | TWO-PHOTON-ABSORPTION MAGNETO-OPTIC DISPERSION SPECTROMETER - A tunable optical spectrometer is disclosed that includes a medium configured to perform polarization rotation within a frequency band on a linearly polarized test beam, wherein the medium is circularly birefringent, and wherein the polarization rotation is achieved based on two-photon-absorption. The medium includes a gaseous substance, a reference laser beam of circular polarization and a longitudinal magnetic field. The test beam propagates through the medium twice, once in the same direction as the magnetic field, and once in the opposite direction of the magnetic field. The test beam undergoes polarization rotation an amount that depends upon the frequency of the test beam. | 01-06-2011 |
20110075151 | INTERFEROMETRIC DEFECT DETECTION AND CLASSIFICATION - Systems and methods for using common-path interferometric imaging for defect detection and classification are described. An illumination source generates and directs coherent light toward the sample. An optical imaging system collects light reflected or transmitted from the sample including a scattered component and a specular component that is predominantly undiffracted by the sample. A variable phase controlling system is used to adjust the relative phase of the scattered component and the specular component so as to change the way they interfere at the image plane. The resultant signal is compared to a reference signal for the same location on the sample and a difference above threshold is considered to be a defect. The process is repeated multiple times each with a different relative phase shift and each defect location and the difference signals are stored in memory. This data is then used to calculate an amplitude and phase for each defect, which can be used for defect detection and classification. This method is expected to detect much smaller defects than current inspection systems and to find defects that are transparent to these systems. | 03-31-2011 |
20110122414 | OFFICIAL SYSTEM FOR ILLUMINATING A MEASURED OBJECT AND INTERFEROMETRIC SYSTEM FOR MEASURING SURFACES OF A MEASURED OBJECT - An interferometric system for measuring surfaces of a measured object using an optical system. The optical system has a beam splitter, which directs measuring beams in a first beam path and measuring beams in a second beam path onto the surfaces of the measured object with the aid of two mirrors. The beam paths which are formed by the light beams which are reflected on the surfaces at least partially overlap in an area having identical beam direction. In this manner, measured surfaces of the measured object are at least partially imaged on an identically irradiated surface of a detector, such as an image recorder. | 05-26-2011 |
20110216324 | SPECTRAL IMAGING CAMERA AND APPLICATIONS - There is provided a method for analyzing optical properties of an object, including utilizing a light illumination having a plurality of amplitudes, phases and polarizations of a plurality of wavelengths impinging from the object, obtaining modified illuminations corresponding to the light illumination, applying a modification to the light illumination thereby obtaining a modified light illumination, analyzing the modified light illumination, obtaining a plurality of amplitudes, phases and polarizations maps of the plurality of wavelengths, and employing the plurality of amplitudes, phases and polarizations maps for obtaining output representing the object's optical properties. An apparatus for analyzing optical properties of an object is also provided. | 09-08-2011 |
20120147379 | Smart Optical Material Characterization System and Method - Disclosed is a system and method for characterizing optical materials, using steps and equipment for generating a coherent laser light, filtering the light to remove high order spatial components, collecting the filtered light and forming a parallel light beam, splitting the parallel beam into a first direction and a second direction wherein the parallel beam travelling in the second direction travels toward the material sample so that the parallel beam passes through the sample, applying various physical quantities to the sample, reflecting the beam travelling in the first direction to produce a first reflected beam, reflecting the beam that passes through the sample to produce a second reflected beam that travels back through the sample, combining the second reflected beam after it travels back though the sample with the first reflected beam, sensing the light beam produced by combining the first and second reflected beams, and processing the sensed beam to determine sample characteristics and properties. | 06-14-2012 |
20120262720 | OPTICAL COHERENCE TOMOGRAPHY IMAGING SYSTEM - An optical coherence tomography (OCT) imaging system is disclosed. In an embodiment of the invention, an OCT imaging system may include (a) multiple scan geometries, including a lateral scan of a beam perpendicular to the scan direction and a rotating scan where the beam is perpendicular to a curved surface (such as the front of the eye), and (b) a low coherence interferometry engine based on spectral domain interferometry, with a spectrometer capable of ultra deep imaging. | 10-18-2012 |
20120268745 | ULTRA-COMPACT SNAPSHOT IMAGING FOURIER TRANSFORM SPECTROMETER - Snapshot imaging Fourier transform spectrometers include a lens array that produces sub-images that are directed through a birefringent interferometer in orthogonal polarization eigenstates that acquire an optical path difference. Interference patterns based on this OPD can be Fourier transformed to obtain a spectral image. In some examples, polarizing gratings provide a spatial heterodyne frequency and offset the spectra. | 10-25-2012 |
20120293805 | INTERFERENCE MEASURING APPARATUS AND MEASURING METHOD THEREOF - An interference measuring apparatus comprises a light source module, a beam splitter, a first lens module, a reflecting module, a second lens module, and a detection device. A light beam generated from the light source module can be projected on the beam splitter. The beam splitter splits the light beam to generate a first light beam and a second light beam. The first light beam passes through the first lens module and then projects onto the reflecting module, and the second light beam passes through the second lens module and projects onto an object. Furthermore, the first light beam and the second light beam are reflected by the reflecting module and the object, respectively, then both the first light beam and the second light beam are leaded to the detection device to form an interference pattern for obtaining the contours and internal cross-sectional image of the object. | 11-22-2012 |
20130155412 | SPECTRUM DETECTING DEVICE AND METHOD FOR OPERATION - A spectrum detecting device including a laser apparatus, an optical splitting apparatus, an optical gate, a first polarizer, a second polarizer, and an optical analysis apparatus is provided. The optical splitting apparatus splits the laser beam providing from the laser apparatus into a first and a second light beam, and the second light beam is transmitted to a sample to produce a spectral signal. The optical gate activated by the first light beam is disposed between the optical analysis apparatus and the sample. The first polarizer is disposed between the sample and the optical gate, and the second polarizer is disposed between the optical gate and the optical analysis apparatus. The spectral signal passes through the first polarizer, the optical gate, and the second polarizer to be transmitted and received to the optical analysis apparatus when the optical gate is activated and turned on in a predetermined time period. | 06-20-2013 |
20130229662 | CHROMATIC DISPERSION MEASUREMENT DEVICE AND CHROMATIC DISPERSION MEASUREMENT METHOD USING THE SAME - Provided is a chromatic dispersion measurement device including a light branching unit that divides a incident measured light signal into a first measured light signal and a second measured light signal and causes a frequency difference between the first measured light signal and the second measured light signal when the signals are output, an optical phase shifter provided in either one of the first branch path and the second branch path having a polarization maintaining characteristic and periodically changing a phase α | 09-05-2013 |
20130329228 | PHASE-LOCKED DELAY DEVICE INCLUDING AN OPTICAL WEDGE PAIR - A phase-locked delay device, including: an input port configured to receive an input electromagnetic radiation pulse; said input pulse being to be propagated along a propagation direction and having a first linear polarization different from both a first direction, which is orthogonal to the propagation direction, and a second direction, which is orthogonal to the first direction and the propagation direction; an adjustable Babinet-Soleil module optically coupled to said input port, having a first polarization direction parallel to said first direction. The adjustable Babinet-Soleil module is structured to: provide from the input pulse a first pulse polarized along the first direction and a second pulse collinear to said first pulse and polarized along the second direction, and introduce an adjustable group delay between the first pulse and the second pulse ranging from a minim value ΔT | 12-12-2013 |
20140055788 | Method and Apparatus for Angular-Resolved Spectroscopic Lithography Characterization - An apparatus and method to determine a property of a substrate by measuring, in the pupil plane of a high numerical aperture lens, an angle-resolved spectrum as a result of radiation being reflected off the substrate. The property may be angle and wavelength dependent and may include the intensity of TM- and TE-polarized radiation and their relative phase difference. | 02-27-2014 |
20140185052 | FOURIER-TRANSFORM SPECTROMETER AND METHOD - The present invention is related to a Fourier-transform spectrometer arrangement comprising a first polarizer, a birefringent plate, a pair of birefringent wedges, a second polarizer, a photo detector, and a control unit. According to the invention, the cross sections of the two birefringent wedges of the birefringent wedge pair are similar triangles, the first wedge is fixed, the second wedge is capable of linearly movement along the side, the optic axes of the pair of birefringent wedges are parallel to each other and orthogonal to the optic axis of the birefringent plate, the polarization of the first polarizer is in 45 degrees with the optical axis of the birefringent plate, the polarization of the first polarizer is also in 45 degrees with the optical axis of the pair of birefringent wedges, the polarization of the second polarizer is parallel, or orthogonal, to the polarization of the first polarizer. | 07-03-2014 |
20150062586 | SYSTEM FOR PERFORMING OPTICAL SPECTROSCOPY INCLUDING INTERFEROMETER - A system for performing optical spectroscopy measurements includes a light source for generating an input optical beam and an interferometer. The interferometer includes a beam splitter that splits the input optical beam into first and second light beams; a first light path that directs the first light beam through a sample containing an analyte to a first output port; and a second light path that directs the second light beam to the first output port. At least one of the first and second light paths adjusts a relative phase of a corresponding one of the first and second light beams, so that the first and second light beams are out of phase at the first output port, substantially canceling background light and outputting sample light corresponding to a portion of the first light signal absorbed by the sample in the sample cell. A detection system detects the output sample light. | 03-05-2015 |
20150355027 | HYPERSPECTRAL IMAGING - Described herein is a hyperspectral imaging system in which a polarising beam splitter, a Wollaston prism, an optical system, and a plane mirror are arranged on an optical axis of the imaging system. An imaging detector is provided on which radiation is focused by an imaging lens. The Wollaston prism is imaged on itself by the optical system and the plane mirror so that translation of the Wollaston prism in a direction parallel to a virtual split plane of the prism effectively provides an optical path length difference that is the same for all points in the object field. | 12-10-2015 |
20160097678 | Spectral Imaging Camera and Applications - There is provided a method for analyzing optical properties of an object, including utilizing a light illumination having a plurality of amplitudes, phases and polarizations of a plurality of wavelengths impinging from the object, obtaining modified illuminations corresponding to the light illumination, applying a modification to the light illumination thereby obtaining a modified light illumination, analyzing the modified light illumination, obtaining a plurality of amplitudes, phases and polarizations maps of the plurality of wavelengths, and employing the plurality of amplitudes, phases and polarizations maps for obtaining output representing the object's optical properties. An apparatus for analyzing optical properties of an object is also provided. | 04-07-2016 |
20160116271 | MULTI-FUNCTIONED OPTICAL MEASUREMENT DEVICE AND METHOD FOR OPTICALLY MEASURING A PLURALITY OF PARAMETERS - The conventional white-light interferometer, confocal microscope, and ellipsometer are integrated as one device set in a functional sense, and the geometrical parameters conventionally measured may be deduced on the integrated device. Thus, the advantages and efficacies of equipment cost saving, on-line measuring, rapid monitoring, reduced manufacturing time, and reduced possibility of object damage during the manufacturing process may be secured, compared with the prior art. | 04-28-2016 |
20160187256 | PLASMONIC INTERFEROMETER SENSOR - An optical device includes a transparent substrate and a conductive layer disposed over an upper surface of the transparent substrate. The conductive layer defines at least one groove inwardly extending from an upper surface and includes an aperture that is spaced apart from the at least one groove. An interface between the upper surface of the conductive layer and an ambient medium defines an optical branch along which surface plasmon polariton modes are excited in response to at least partially coherent light being received by the optical device. | 06-30-2016 |